Single-tangent-plane near-field antenna testing method and system based on data splicing

Abstract

The invention belongs to the technical field of antenna testing, and provides a single-tangent-plane near-field antenna testing method and system based on data splicing, and the method comprises the steps: obtaining a sampling interval of a to-be-tested antenna; when the to-be-tested antenna is in the unidirectional single-section near-field test scene, performing a first sampling angle single-section near-field test and a second sampling angle single-section near-field test of the to-be-tested antenna based on the acquired sampling interval to obtain first sampling angle single-section near-field sampling data and second sampling angle single-section near-field sampling data; calibrating the obtained first sampling angle single-section near-field sampling data and the second sampling angle single-section near-field sampling data; and performing data splicing on the calibrated first sampling angle single-tangent-plane near-field sampling data and the calibrated second sampling angle single-tangent-plane near-field sampling data to obtain single-tangent-plane near-field sampling data, and completing the single-tangent-plane near-field antenna test based on data splicing.

Description

Technical Field

[0001] The present invention belongs to the technical field of antenna testing, and in particular relates to a single-section near-field antenna testing method and system based on data splicing. Background Art

[0002] The statements in this section merely provide background information related to the present invention and do not necessarily constitute prior art.

[0003] In the near-field test of antennas, a sliding rail spherical near-field test system consisting of an azimuth turntable and an arc-shaped guide rail bracket is one of the common forms; it can realize the traditional spherical near-field test method, which usually requires the stepping and scanning coordination of the turntable and the probe to achieve point-by-point sampling of the entire sphere to obtain near-field data, and then calculate the far-field characteristics; however, this method of sampling the entire sphere point by point is extremely time-consuming, the test efficiency is low, and a large number of sampling points need to be post-processed and analyzed, and the calculation cost is high.

[0004] In practical applications, especially for antennas with high requirements for angle measurement accuracy, it is often necessary to obtain the radiation characteristics of a certain section. However, due to space limitations, the curved rail of the slide-type spherical test system may only cover one side. Therefore, for single-section near-field testing, the probe can only obtain single-side near-field data by scanning and sampling on the curved rail, and cannot obtain complete section data. It may be impossible to perform accurate single-section near-to-far field transformation based on the stationary phase method, affecting the reliability of the test results.

[0005] In order to accurately evaluate the radiation characteristics of antennas, the industry has developed a variety of testing methods. Among them, near-field testing is widely used because of its relatively low requirements for test sites and its ability to effectively avoid external interference. Traditional near-field testing usually requires scanning the plane, cylinder or spherical surface around the antenna to obtain a large amount of data, which is then processed through complex algorithms to obtain the far-field radiation characteristics of the antenna. However, this all-round measurement method is time-consuming and labor-intensive, and has high requirements for test equipment, sites, and environment. Practical applications often only focus on the radiation characteristics of the antenna on a certain section, such as evaluating the radiation directivity of certain specific antennas in the horizontal or vertical plane. Therefore, it is necessary to simplify near-field testing to quickly and efficiently obtain the radiation characteristics of a single section of the antenna. Summary of the invention

[0006] To solve the above problems, the present invention proposes a single-section near-field antenna testing method and system based on data splicing, which is suitable for the testing of a single-sided arc guide rail bracket. By measuring the single-sided near field twice, the obtained data are spliced ​​and calibrated to obtain the complete section near-field data; by performing a single-section near-field to far-field transformation on the section near-field data, accurate section far-field radiation characteristics can be obtained.

[0007] According to some embodiments, a first solution of the present invention provides a single-cut near-field antenna testing method based on data splicing, which adopts the following technical solution:

[0008] A single-section near-field antenna testing method based on data splicing, comprising:

[0009] Obtain the sampling interval of the antenna to be tested;

[0010] When the antenna to be tested is in a unidirectional single-cut plane near-field test scenario, a first sampling angle single-cut plane near-field test and a second sampling angle single-cut plane near-field test are respectively performed on the antenna to be tested based on the acquired sampling interval to obtain first sampling angle single-cut plane near-field sampling data and second sampling angle single-cut plane near-field sampling data;

[0011] The near-field sampling data of a single slice at a first sampling angle and the near-field sampling data of a single slice at a second sampling angle obtained by calibration;

[0012] The calibrated single-cut near-field sampling data of the first sampling angle and the calibrated single-cut near-field sampling data of the second sampling angle are spliced ​​to obtain single-cut near-field sampling data, thereby completing the single-cut near-field antenna test based on data splicing.

[0013] As a further technical limitation, the transmission coefficient of the antenna to be tested is calculated based on the obtained single-section sampling data, and the invariance of the transmission coefficient with distance is considered. Combined with the obtained single-section near-field sampling data, the single-section near-field and far-field transformation of the antenna to be tested is performed to obtain the single-section far-field data.

[0014] Furthermore, a single-section near-to-far field transformation method based on a stationary phase method is used to approximate the contribution of a stationary point with slow phase change to achieve the single-section near-to-far field transformation of the antenna to be tested.

[0015] As a further technical limitation, when the antenna to be tested is not in a unidirectional single-cut plane near-field test scenario, a first sampling angle bidirectional single-cut plane near-field test of the antenna to be tested is performed.

[0016] As a further technical limitation, in the process of calibrating the first sampling angle single-section near-field sampling data and the second sampling angle single-section near-field sampling data, data calibration is performed based on the sampling data at the common point of the first sampling angle single-section near-field test and the second sampling angle single-section near-field test. During the calibration process, the amplitude and phase of the sampling data are made equal.

[0017] As a further technical limitation, the first sampling angle and the second sampling angle differ by 180° in azimuth.

[0018] According to some embodiments, a second solution of the present invention provides a single-cut near-field antenna test system based on data splicing, which adopts the following technical solution:

[0019] A single-section near-field antenna test system based on data splicing, comprising:

[0020] An acquisition module, configured to acquire a sampling interval of the antenna to be tested;

[0021] A sampling module, which is configured to perform a first sampling angle single-cut plane near-field test and a second sampling angle single-cut plane near-field test of the antenna to be tested based on the acquired sampling interval when the antenna to be tested is in a unidirectional single-cut plane near-field test scenario, and obtain first sampling angle single-cut plane near-field sampling data and second sampling angle single-cut plane near-field sampling data;

[0022] A correction module, configured to calibrate the obtained near-field sampling data of the single-cut plane at the first sampling angle and the near-field sampling data of the single-cut plane at the second sampling angle;

[0023] The test module is configured to perform data splicing on the calibrated first sampling angle single-cut near-field sampling data and the second sampling angle single-cut near-field sampling data to obtain single-cut near-field sampling data, and complete the single-cut near-field antenna test based on data splicing.

[0024] According to some embodiments, a third solution of the present invention provides a computer-readable storage medium, which adopts the following technical solution:

[0025] A computer-readable storage medium stores a program thereon, which, when executed by a processor, implements the steps in a single-cut near-field antenna testing method based on data splicing as described in the first solution of the present invention.

[0026] According to some embodiments, a fourth solution of the present invention provides an electronic device, which adopts the following technical solution:

[0027] An electronic device comprises a memory, a processor and a program stored in the memory and running on the processor, wherein when the processor executes the program, the steps in a single-cut near-field antenna testing method based on data splicing as described in the first scheme of the present invention are implemented.

[0028] According to some embodiments, a fifth solution of the present invention provides a computer program product, which adopts the following technical solution:

[0029] A computer program product includes software codes, wherein the program in the software codes executes the steps in a single-cut near-field antenna testing method based on data splicing as described in the first solution of the present invention.

[0030] Compared with the prior art, the present invention has the following beneficial effects:

[0031] The present invention measures the single-sided near field twice, and splices and calibrates the obtained data to obtain complete section near-field data; performs single-section near-far field transformation on the section near-field data to obtain accurate far-field radiation characteristics of the section; the present invention can significantly improve the test efficiency, and compared with traditional spherical scanning, only two unidirectional single-section near fields need to be measured, which greatly shortens the test time and provides a method for obtaining the far field in real time during the measurement process; the present invention is applied to the test of a single-sided arc guide bracket, and is also applicable to any other forms of spherical test systems and cylindrical test systems, and has a wide range of application and application scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The drawings in the specification that constitute a part of this embodiment are used to provide a further understanding of this embodiment. The schematic embodiments of this embodiment and their descriptions are used to explain this embodiment and do not constitute improper limitations on this embodiment.

[0033] Figure 1 It is a structural schematic diagram of the slide rail test system;

[0034] Figure 2 This is a schematic diagram of spherical near field test;

[0035] Figure 3 This is a flow chart of a single-cut surface near-field antenna testing method based on data splicing in Embodiment 1 of the present invention;

[0036] Figure 4 It is a schematic diagram of the structure of single-section near-field test;

[0037] Figure 5 This is a schematic diagram of the structure of a single-section near-field test after the antenna under test is rotated 180°;

[0038] Figure 6 It is a structural block diagram of a single-section near-field antenna testing system based on data splicing in Embodiment 2 of the present invention. DETAILED DESCRIPTION

[0039] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0040] It should be noted that the following detailed descriptions are exemplary and are intended to provide further explanation of the present application. Unless otherwise specified, all technical and scientific terms used herein have the same meanings as those commonly understood by those skilled in the art to which the present application belongs.

[0041] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit exemplary embodiments according to the present invention. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprising" and / or "including" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0042] In the present invention, terms such as "upper", "lower", "left", "right", "front", "back", "vertical", "horizontal", "side", "bottom", etc. indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings. They are relational words determined only for the convenience of describing the structural relationships of the various parts or elements of the present invention, and do not specifically refer to any part or element in the present invention and should not be understood as limitations on the present invention.

[0043] In the present invention, terms such as "fixed connection", "connected", "connection", etc. should be understood in a broad sense, indicating that it can be fixedly connected, integrally connected or detachably connected; it can be directly connected or indirectly connected through an intermediate medium. For relevant scientific research or technical personnel in this field, the specific meanings of the above terms in the present invention can be determined according to specific circumstances, and they cannot be understood as limitations on the present invention.

[0044] In the absence of conflict, the embodiments of the present invention and the features of the embodiments may be combined with each other.

[0045] Embodiment 1

[0046] Embodiment 1 of the present invention introduces a single-section near-field antenna testing method based on data splicing.

[0047] In the test system composed of a turntable and an arc-shaped guide rail bracket, the traditional spherical near-field test method is usually carried out, which often requires the stepping and scanning of the turntable and the probe to achieve point-by-point sampling of the entire spherical surface to obtain near-field data and then calculate the far-field characteristics. This method of sampling the entire spherical surface point by point is extremely time-consuming, has low test efficiency, and requires post-processing and analysis of a large number of sampling points, which has a high calculation cost.

[0048] However, for the slide rail spherical test system, due to space limitations, the curved rail may only cover one side. Therefore, for single-section near-field testing, the probe can only obtain near-field data on one side by scanning and sampling on the curved rail, and cannot obtain complete section data. It may be impossible to perform accurate single-section near-field to far-field transformation based on the stationary phase method, affecting the reliability of the test results.

[0049] Currently, if Figure 1The slide rail test system shown includes a turntable and an arc-shaped guide rail bracket, which can be used for traditional spherical near-field testing; the antenna to be tested is fixed on the turntable, and the test probe is installed on the arc-shaped guide rail; during the test, the turntable needs to be controlled to rotate so that the antenna to be tested rotates around its own axis and performs azimuth stepping; during the rotation of the turntable, the test probe on the arc-shaped guide rail needs to be controlled to move at the same time so that it scans and samples the antenna at different pitch angles.

[0050] like Figure 2 In the spherical near field test, the antenna to be tested is located at the origin O of the global coordinate system, and the receiving probe collects the spherical radiation near field w(A, χ, θ, φ) with O as the center and radius A, where χ=0 or π / 2 means that the probe should simultaneously obtain the near field w in two orthogonal polarization directions at each sampling position. θ and w φ .

[0051] The core of traditional spherical near-field testing is the antenna transmission equation, namely:

[0052]

[0053] Among them, P sμn is the probe response constant. In the antenna transmission equation, only the antenna transmission coefficient T smn This parameter characterizes the inherent transmission characteristics of the antenna under test and does not change with the propagation distance. It can be solved according to the probe receiving signal at the position (A, θ, φ), and then the far field of the antenna under test can be reconstructed by utilizing the invariance of this parameter in the near-field and far-field transformation.

[0054] By knowing the near-field data w(A, χ, θ, φ), calculate the far-field E θ (θ,φ),E φ (θ, φ), the specific steps are:

[0055] (1) Calculate the coefficients w of the Fourier expansion of w(A, χ, θ, φ) μ (A, θ, φ):

[0056]

[0057] (2) Calculate w μ The coefficients w of the Fourier expansion of (A, θ, φ) μm (A, θ):

[0058]

[0059] (3) Points calculation

[0060]

[0061] (4) Solve the antenna transmission coefficient T 1mn 、T 2mn :

[0062]

[0063] Probe response constant P sμn (kA) can be expressed as:

[0064]

[0065] (5) Solve to obtain the antenna transmission coefficient T 1mn 、T 2mn Then, extrapolate the far field of the antenna to be tested: E θ (θ,φ),E φ (θ, φ):

[0066]

[0067] Wherein, the far-field range probe response constant is:

[0068]

[0069] The slide rail spherical test system is limited by space, and the curved rail may only cover one side. Therefore, for single-section near-field testing, the probe can only obtain near-field data on one side when scanning and sampling on the curved rail, and cannot obtain complete section data. It may be impossible to perform accurate single-section near-field and far-field transformation based on the stationary phase method, affecting the reliability of the test results.

[0070] Therefore, this embodiment proposes a method such as Figure 3 The single-section near-field antenna test method based on data splicing shown in the figure utilizes two single-sided pitch scans to sample near-field data, and obtains the near-field data of a complete single section by calibrating and pre-processing the two sets of near-field data. Then, the single-section near-to-far-field transformation algorithm is used to extrapolate the far-field radiation characteristics of the section.

[0071] In this embodiment, the sampling interval is calculated according to the working frequency f of the antenna to be tested and the minimum radius r surrounding the antenna to be tested. in, c is the speed of light in vacuum.

[0072] like Figure 4 As shown, the antenna to be tested is fixed on the turntable, and the test probe is installed on the arc-shaped rail and pointed at the antenna to be tested; for the antenna to be tested, the section φ=φ0 of interest is aligned with the direction of the arc-shaped rail to ensure that the probe can scan on this section. The probe is controlled to move on the arc-shaped rail to scan the φ=φ0 surface of the antenna to be tested, and the near field is measured with a sampling interval Δθ Where A is the test radius, p = 0, 1, ..., Np -1, N p is the number of sampling points, and the subscript m represents the generalized near-field component, which can be the θ or φ component.

[0073] When the arc-shaped guide rail only covers one side, the control turntable rotates 180°, such as Figure 5 As shown, align the tangent plane of the antenna to be tested φ=φ0+180° with the direction of the circular arc guide rail and measure p = 0, 1, ..., N p -1. According to the data at the common point θ=0° and The measured data obtained by calibration is made consistent in amplitude, that is,

[0074]

[0075]

[0076] The calibrated data are spliced ​​to obtain the complete single-section near-field sampling data E m (A, θ), that is:

[0077] After splicing, the measurement range of the corresponding pitch angle θ is θ={-(N p -1)Δθ,-(N p -2)Δθ,…,(N p -2)Δθ,(N p -1)Δθ}.

[0078] Calculate the transmission coefficient of the antenna under test in, is the second kind of Hankel function.

[0079] Using the distance invariance of the transmission coefficient, the far field of the section is calculated

[0080] The single-section near-field test method proposed in this embodiment is applicable to any form of spherical test system and cylindrical test system. When the machine is limited to scanning only one side in the pitch direction, two pitch scanning sampling and calibration, splicing and post-processing can be performed to obtain complete single-section near-field data, thereby performing single-section near-field and far-field transformation. The data calibration method in this embodiment relies on the calibration of the common point data in the two measurements to make their amplitudes consistent, thereby avoiding measurement errors caused by changes in the polarization direction of the probe relative to the antenna to be measured in the two measurements.

[0081] The data calibration and splicing post-processing method in this embodiment enables the mechanically constrained test system to measure complete single-section near-field data, avoids data loss and is conducive to obtaining near-field data with slow phase change areas. Complete and accurate far-field radiation characteristics can be obtained through a single-section near-to-far-field transformation algorithm based on the stationary phase method.

[0082] This embodiment introduces a single-section near-field antenna testing method based on data splicing, which can be applied to a test system with a single-sided arc guide bracket; simplifies near-field testing, obtains the far-field radiation characteristics of the single section of interest in real time and efficiently, shortens testing time, and improves testing efficiency; it can also be applied to any form of spherical testing system and cylindrical testing system, reduces testing site and space restrictions, and reduces system costs.

[0083] Embodiment 2

[0084] Embodiment 2 of the present invention introduces a single-section near-field antenna testing system based on data splicing.

[0085] like Figure 6 A single-cut surface near-field antenna test system based on data splicing is shown, comprising:

[0086] An acquisition module, configured to acquire a sampling interval of the antenna to be tested;

[0087] A sampling module, which is configured to perform a first sampling angle single-cut plane near-field test and a second sampling angle single-cut plane near-field test of the antenna to be tested based on the acquired sampling interval when the antenna to be tested is in a unidirectional single-cut plane near-field test scenario, and obtain first sampling angle single-cut plane near-field sampling data and second sampling angle single-cut plane near-field sampling data;

[0088] A correction module, configured to calibrate the obtained near-field sampling data of the single-cut plane at the first sampling angle and the near-field sampling data of the single-cut plane at the second sampling angle;

[0089] The test module is configured to perform data splicing on the calibrated first sampling angle single-cut near-field sampling data and the second sampling angle single-cut near-field sampling data to obtain single-cut near-field sampling data, and complete the single-cut near-field antenna test based on data splicing.

[0090] The detailed steps are the same as those of the single-cut near-field antenna testing method based on data splicing provided in Example 1, and will not be repeated here.

[0091] Embodiment 3

[0092] Embodiment 3 of the present invention provides a computer-readable storage medium.

[0093] A computer-readable storage medium stores a program thereon, and when the program is executed by a processor, the program implements the steps in a single-cut near-field antenna testing method based on data splicing as described in Embodiment 1 of the present invention.

[0094] The detailed steps are the same as those of the single-cut near-field antenna testing method based on data splicing provided in Example 1, and will not be repeated here.

[0095] Embodiment 4

[0096] A fourth embodiment of the present invention provides an electronic device.

[0097] An electronic device comprises a memory, a processor and a program stored in the memory and running on the processor, wherein when the processor executes the program, the steps in a single-cut near-field antenna testing method based on data splicing as described in Embodiment 1 of the present invention are implemented.

[0098] The detailed steps are the same as those of the single-cut near-field antenna testing method based on data splicing provided in Example 1, and will not be repeated here.

[0099] Embodiment 5

[0100] Embodiment 5 of the present invention provides a computer program product.

[0101] A computer program product includes software codes, wherein the program in the software codes executes the steps in a single-cut near-field antenna testing method based on data splicing as described in Embodiment 1 of the present invention.

[0102] The detailed steps are the same as those of the single-cut near-field antenna testing method based on data splicing provided in Example 1, and will not be repeated here.

[0103] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes. The schemes in the embodiments of the present invention may be implemented in various computer languages, for example, object-oriented programming language Java and literal scripting language JavaScript, etc.

[0104] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0105] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0106] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0107] Although the preferred embodiments of the present invention have been described, those skilled in the art may make other changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0108] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

[0109] The above description is only a preferred embodiment of the present embodiment and is not intended to limit the present embodiment. For those skilled in the art, the present embodiment may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present embodiment shall be included in the protection scope of the present embodiment.

Claims

1. A single-section near-field antenna testing method based on data splicing, characterized in that: include: Obtain the sampling interval of the antenna to be tested; When the antenna to be tested is in a unidirectional single-cut plane near-field test scenario, a first sampling angle single-cut plane near-field test and a second sampling angle single-cut plane near-field test are respectively performed on the antenna to be tested based on the acquired sampling interval to obtain first sampling angle single-cut plane near-field sampling data and second sampling angle single-cut plane near-field sampling data; The near-field sampling data of a single slice at a first sampling angle and the near-field sampling data of a single slice at a second sampling angle obtained by calibration; The calibrated single-cut near-field sampling data of the first sampling angle and the calibrated single-cut near-field sampling data of the second sampling angle are spliced ​​to obtain single-cut near-field sampling data, thereby completing the single-cut near-field antenna test based on data splicing.

2. A single-section near-field antenna testing method based on data splicing as claimed in claim 1, characterized in that: The transmission coefficient of the antenna to be tested is calculated according to the obtained single-section sampling data. Considering the invariance of the transmission coefficient with distance, the single-section near-field transformation of the antenna to be tested is performed in combination with the obtained single-section near-field sampling data to obtain the single-section far-field data.

3. A single-section near-field antenna testing method based on data splicing as claimed in claim 2, characterized in that: The single-section near-to-far field transformation method based on the stationary phase method is adopted, and the single-section near-to-far field transformation of the antenna to be tested is approximately achieved through the contribution of the stationary point with slow phase change.

4. A single-section near-field antenna testing method based on data splicing as claimed in claim 1, characterized in that: When the antenna to be tested is not in a unidirectional single-cut plane near-field test scenario, a first sampling angle bidirectional single-cut plane near-field test of the antenna to be tested is performed.

5. A single-section near-field antenna testing method based on data splicing as claimed in claim 1, characterized in that: In the process of calibrating the obtained first sampling angle single-section near-field sampling data and the second sampling angle single-section near-field sampling data, data calibration is performed based on the sampling data at the common point of the first sampling angle single-section near-field test and the second sampling angle single-section near-field test. During the calibration process, the amplitude and phase of the sampling data are made equal.

6. A single-section near-field antenna testing method based on data splicing as claimed in claim 1, characterized in that: The first sampling angle and the second sampling angle differ by 180 degrees in azimuth.

7. A single-section near-field antenna test system based on data splicing, characterized in that: include: An acquisition module, configured to acquire a sampling interval of the antenna to be tested; A sampling module, which is configured to perform a first sampling angle single-cut plane near-field test and a second sampling angle single-cut plane near-field test of the antenna to be tested based on the acquired sampling interval when the antenna to be tested is in a unidirectional single-cut plane near-field test scenario, and obtain first sampling angle single-cut plane near-field sampling data and second sampling angle single-cut plane near-field sampling data; A correction module, configured to calibrate the obtained near-field sampling data of the single-cut plane at the first sampling angle and the near-field sampling data of the single-cut plane at the second sampling angle; The test module is configured to perform data splicing on the calibrated first sampling angle single-cut near-field sampling data and the second sampling angle single-cut near-field sampling data to obtain single-cut near-field sampling data, and complete the single-cut near-field antenna test based on data splicing.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the steps of a single-cut near-field antenna testing method based on data splicing as described in any one of claims 1-6 are implemented.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the program, the steps of a single-cut near-field antenna testing method based on data splicing as described in any one of claims 1-6 are implemented.

10. A computer program product comprising software code, characterized in that The program in the software code executes the steps of a single-cut near-field antenna testing method based on data splicing as described in any one of claims 1-6.

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