Chip detection system and detection method
Patent Information
- Application Number
- CN202411717280.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-27
- Publication Date
- 2025-04-01
AI Technical Summary
Traditional chip detection methods cannot fully cover the physical defects, microstructure and functional performance of the chip, resulting in insufficient detection accuracy and efficiency, and cannot meet the high quality and high performance requirements of modern electronic devices for GPU chips.
A chip detection system integrating multiple detection modules has been developed, including optical detection module, scanning electron microscope module, functional detection module and data analysis and processing module. Through the combination of these modules, all-round detection and analysis of GPU chips can be achieved.
This system can achieve a comprehensive evaluation of GPU chips, improve detection accuracy and efficiency, observe nano-level structures and defects, and meet the needs of modern electronic devices for high-performance chips.
Smart Images

Figure BDA0005157147550000062 
Figure BDA0005157147550000072 
Figure BDA0005157147550000081
Abstract
Citation Information
Patent Citations
Method for carrying out failure detection on LED (light-emitting diode) chip surface features
CN107727663A
Fault detection device for electronic chip
CN109870463A
Detection system and detection method of chip
CN113871313A
Semiconductor chip testing method for integrated circuit
CN114472226A
Cylindrical pot surface defect detection method and system, controller and industrial personal computer
CN114705686A