Battery management system test device and battery management system test system

Abstract

The present invention discloses a test device for a battery management system and a test system for a battery management system, the device comprising: a frequency domain conversion module and a frequency domain waveform generator, wherein the frequency domain conversion module is used to convert the received test data in the frequency domain and output the corresponding frequency domain data; the frequency domain waveform generator is used to generate target frequency domain waveform data according to the frequency domain data and waveform instructions, and output the target frequency domain waveform data for testing the battery management system. The present invention can customize the input of various operating condition information by analyzing and operating the test data of the battery management system in the frequency domain, ensure the comprehensiveness of the input operating condition information, and can further simulate various fault conditions of the battery pack under the influence of hardware while intuitively and accurately observing the inconsistency of the battery cells inside the battery pack, thereby improving the accuracy, flexibility and applicability of the battery management system simulation test.

Description

Technical Field

[0001] The present invention relates to the technical field of batteries, and in particular to a test device for a battery management system and a test system for the battery management system. Background Art

[0002] At present, when testing BMS (Battery Management System), a HIL (Hardware-in-the-Loop) test system is usually used for testing. HIL is mainly composed of a power module, a host computer system, a real-time system (intermediate computer), a communication module and a BMS environment under test, and is used to perform simulation testing on the BMS. During the test, a direct injection method is usually used to inject the external characteristic information of the tested single cell or battery pack / pack into the BMS board under test. After the tester determines the operating condition information or customizes the current operating condition, the host computer controls the relevant information to be sent to the battery simulator through the bus. The battery simulator simulates the state of the battery cell according to the relevant information, and simulates the differences of the battery cells in the package through a resistor array, thereby generating external characteristic information of the package and inputting it into the BMS under test.

[0003] However, traditional HIL has limitations when injecting faults into BMS boards, namely, it cannot simultaneously meet the requirements of inputting custom operating condition information and injecting fault effects caused by hardware equipment problems. In other words, there is a problem of missing input operating conditions or the inability to simulate fault simulation under the influence of hardware, which results in incomplete BMS test results, low accuracy and applicability. Summary of the invention

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art.

[0005] To this end, an object of the present invention is to propose a testing device for a battery management system, which can customize the input of various operating condition information by analyzing and operating the test data of the battery management system in the frequency domain, and can further simulate various fault conditions of the battery pack under the influence of hardware while intuitively and accurately observing the inconsistency of the battery cells inside the battery pack, thereby improving the accuracy, flexibility and applicability of the battery management system simulation test.

[0006] To this end, another object of the present invention is to provide a test system for a battery management system.

[0007] In order to achieve the above-mentioned purpose, an embodiment of the first aspect of the present invention proposes a test device for a battery management system, including: a frequency domain conversion module, used to convert the received test data in the frequency domain, and output corresponding frequency domain data, the test data including typical operating condition information transmitted by a host computer and / or external characteristic information of single cells in a battery pack output by a cell simulator; a frequency domain waveform generator, used to generate target frequency domain waveform data according to the frequency domain data and waveform instructions, wherein the waveform instructions include waveform information corresponding to the fault information to be simulated transmitted by the host computer, and the fault information to be simulated includes: the degree of deviation of the single cells in the battery pack and / or fault data information used to simulate hardware fault injection.

[0008] According to the test device of the battery management system of the embodiment of the present invention, by setting a frequency domain conversion module and a frequency domain waveform generator, the typical operating condition information transmitted by the host computer and / or the external characteristic information of the single cell in the battery pack output by the battery cell simulator and other test data can be converted into frequency domain, and fault data can be introduced to perform fault testing, that is, the test data of the battery management system is analyzed and operated in the frequency domain, and the typical operating condition information and the external characteristic information of the single cell in the battery pack output by the battery cell simulator and the like can be input, thereby realizing customized input of various operating condition information to ensure the comprehensiveness of the operating condition information, and while intuitively and accurately observing the inconsistency of the battery cells inside the battery pack, various fault conditions of the battery pack under the influence of hardware can be further simulated, thereby improving the accuracy, flexibility and applicability of the battery management system simulation test.

[0009] In addition, the test device of the battery management system according to the embodiment of the present invention may also have the following additional technical features:

[0010] In some examples, the frequency domain conversion module includes: a data input and output unit, which is used to receive and transmit the test data; a digital-to-analog conversion discrete sampling unit, connected to the data input and output unit, and used to convert the test data into an analog signal; a storage unit, connected to the digital-to-analog conversion discrete sampling unit, and used to store the analog signal; and a frequency domain conversion unit, connected to the storage unit, and used to convert the stored analog signal into the frequency domain data.

[0011] In some examples, the storage unit is used to store the analog signal according to a set data length.

[0012] In some examples, the frequency domain conversion module also includes: a first signal conditioning unit, which is respectively connected to the data input and output unit and the digital-to-analog conversion discrete sampling unit, and is used to adjust the differential voltage corresponding to the test data and transmit the adjusted test data to the digital-to-analog conversion discrete sampling unit.

[0013] In some examples, the frequency domain conversion module further includes: a gain unit, which is connected to the frequency domain conversion unit and is used to amplify the voltage of the frequency domain data output by the frequency domain conversion unit and output the amplified frequency domain data.

[0014] In some examples, it also includes: a time domain conversion module, which is used to perform joint conversion processing on the frequency domain data and the target frequency domain waveform data in the time domain, and output corresponding time domain data.

[0015] In some examples, the time domain conversion module includes: a time domain conversion unit, which is respectively connected to the frequency domain conversion module and the frequency domain waveform generator, and is used to perform time domain conversion on the frequency domain data and the target frequency domain waveform data to obtain analog time domain data; an analog-to-digital conversion discrete sampling unit, which is connected to the time domain conversion unit, and is used to convert the analog time domain data into a digital signal to obtain the time domain data.

[0016] In some examples, the time domain conversion module further includes: a second signal conditioning unit, the second signal conditioning unit is connected to the analog-to-digital conversion discrete sampling unit, and is used to adjust the differential voltage corresponding to the time domain data.

[0017] In some examples, the frequency domain waveform generator is used to: upon receiving the degree of deviation of a single cell in a battery pack in the fault information to be simulated, perform the following actions: superimpose a constant value of a preset frequency on the frequency domain data to simulate DC impedance; and superimpose a preset low-frequency disturbance component in the frequency domain to simulate the phenomenon of waveform superposition due to the disordered frequency domain data caused by the inconsistency of the voltage and temperature of the single cells.

[0018] In some examples, the frequency domain waveform generator is further used to: superimpose the frequency domain data according to the representation of the impedance spectrum in the frequency domain to simulate high-frequency and mid-frequency channel impedance.

[0019] In some examples, the test device of the battery management system further includes: a control module, the control module is connected to the analog-to-digital conversion discrete sampling unit, and the control module is used to control the analog-to-digital conversion discrete sampling unit to perform differential voltage disturbance fault simulation under hardware influence.

[0020] In some examples, the control module is specifically used to control the reference voltage value of the numerical signal output by the analog-to-digital conversion discrete sampling unit to perform fault simulation of a base value offset of a differential voltage signal.

[0021] In some examples, the control module is specifically used to: superimpose noise on the frequency domain data in the frequency domain, and superimpose noise on the digital signal output by the analog-to-digital conversion discrete sampling unit in the time domain, so that the analog-to-digital conversion discrete sampling unit outputs a differential voltage signal with disturbance, thereby realizing disturbance fault simulation of high and low levels within / outside the identification range.

[0022] In some examples, the test device of the battery management system is characterized in that it also includes: a delayed output control module, which is connected to the storage unit and is used to control the output form of the analog signal in the storage unit to realize data information failure simulation under hardware influence.

[0023] In some examples, the delayed output module is specifically used to: upon receiving a data loss command sent by a host computer, control the storage unit to execute a preset action to simulate a bus information data failure caused by the loss of flag bits and data bits in a data frame or due to data tampering.

[0024] In some examples, the preset action includes one of the following: for an analog signal at a preset moment, keeping the analog signal the same as the analog signal at a previous moment; flipping the level of the analog signal; and delaying the output of the analog signal.

[0025] In order to achieve the above-mentioned purpose, an embodiment of the second aspect of the present invention proposes a test system for a battery management system, comprising: a host computer, a mid-level computer, a communication module, a battery management system to be tested, and a test device for the battery management system as described in the above-mentioned embodiment; wherein the host computer, the mid-level computer, the battery management system to be tested, and the test device for the battery management system communicate with each other through the communication module; the host computer is used to provide typical operating condition information; the mid-level computer is used to provide external characteristic information of single cells in the battery pack; the test device of the battery management system is used to perform single cell inconsistency simulation and / or hardware-affected fault injection simulation according to the typical operating condition information and / or a cell simulator, and output the obtained simulation results to the battery management system to be tested for testing it.

[0026] According to the test system of the battery management system of the present invention, by setting a frequency domain conversion module and a frequency domain waveform generator, the typical operating condition information transmitted by the host computer and / or the external characteristic information of the single cell in the battery pack output by the battery cell simulator and other test data can be converted into frequency domain, and fault data can be introduced to perform fault testing, that is, the test data of the battery management system is analyzed and operated in the frequency domain, and the typical operating condition information and the external characteristic information of the single cell in the battery pack output by the battery cell simulator and the like can be input, thereby realizing customized input of various operating condition information to ensure the comprehensiveness of the operating condition information, and while intuitively and accurately observing the inconsistency of the battery cells inside the battery pack, various fault conditions of the battery pack under the influence of hardware can be further simulated, thereby improving the accuracy, flexibility and applicability of the battery management system simulation test.

[0027] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0029] Figure 1 is a structural schematic diagram of a battery management system testing device according to an embodiment of the present invention;

[0030] Figure 2 is a structural schematic diagram of a battery management system testing device according to another embodiment of the present invention;

[0031] Figure 3 FIG. 4 is a schematic diagram of the structure of a test system for a battery management system according to an embodiment of the present invention.

[0032] Reference numerals:

[0033] A test device for a battery management system-100; a frequency domain conversion module-110; a frequency domain waveform generator-120; a time domain conversion module-130; a control module-140; a delayed output control module-150; an input and output unit-111; a digital-to-analog conversion discrete sampling unit-112; a storage unit-113; a frequency domain conversion unit-114; a first signal conditioning unit-115; a gain unit-116; a time domain conversion unit-131; an analog-to-digital conversion discrete sampling unit-132; a second signal conditioning unit-133; a test system for a battery management system-10; a host computer-101; a middle computer-102; a communication module-103; and a battery management system to be tested-104. DETAILED DESCRIPTION

[0034] In order to be able to understand the features and technical contents of the embodiments of the present invention in more detail, the implementation of the embodiments of the present invention is described in detail below in conjunction with the accompanying drawings. The attached drawings are for reference only and are not used to limit the embodiments of the present invention. In the following technical description, for the convenience of explanation, a full understanding of the disclosed embodiments is provided through multiple details. However, one or more embodiments can still be implemented without these details. In other cases, to simplify the drawings, well-known structures and devices can be simplified for display.

[0035] Reference below Figure 1-Figure 3 A battery management system testing device 100 and a battery management system testing system 10 according to an embodiment of the present invention are described.

[0036] Figure 1 FIG. 1 is a structural block diagram of a battery management system testing device 100 according to an embodiment of the present invention. Figure 1 As shown, the test device 100 of the battery management system mainly includes: a frequency domain conversion module 110 and a frequency domain waveform generator 120 .

[0037] The frequency domain conversion module 110 is used to convert the received test data in the frequency domain and output the corresponding frequency domain data. The frequency domain data includes the basic external characteristic data of the battery package, and the test data includes the typical operating condition information transmitted by the host computer 101 and / or the external characteristic information of the single cell in the battery package output by the cell simulator.

[0038] Specifically, combined Figure 1 and Figure 3 As shown, during the test of the battery management system, the frequency domain conversion module 110 can receive test data such as typical operating condition information transmitted by the host computer 101 and / or external characteristic information of the single cell in the battery pack output by the battery cell simulator, and perform frequency domain conversion on the received test data, including but not limited to using algorithms such as FFT (Fast Fourier Transform) to convert the received test data into frequency domain data and output it. Among them, the frequency domain data includes basic external characteristic data of the battery pack, such as current, voltage and temperature, etc., and the typical operating condition information includes but is not limited to WLTC (World Light Vehicle Test Cycle), WLTP (World Light Vehicle Test Procedure), UDDS (Urban Dynamometer Driving Schedule), etc.

[0039] The frequency domain waveform generator 120 is used to generate target frequency domain waveform data according to the waveform instruction and the frequency domain data output by the frequency domain conversion module 110, wherein the waveform instruction includes the waveform information corresponding to the fault information to be simulated transmitted by the host computer 101, and the fault information to be simulated includes: the degree of deviation of the single cell in the battery pack and / or the fault data information used to simulate the hardware fault injection. Then, the BMS system can be tested according to the target frequency domain waveform data.

[0040] Specifically, combined Figure 1 and Figure 3 As shown, the frequency domain waveform generator 120 can receive user-defined waveform instructions and frequency domain data output by the frequency domain conversion module 110, analyze the waveform instructions and frequency domain data using internal algorithms and logic, and generate corresponding target frequency domain waveform data based on the analysis results. Specifically, the waveform instructions received by the frequency domain waveform generator 120 include waveform information corresponding to the fault information to be simulated transmitted by the host computer 101, wherein the fault information to be simulated may include the degree of deviation of the single cells in the battery pack, that is, the difference in performance parameters of each single cell in the battery pack, such as inconsistency of capacity, internal resistance, voltage, etc., and may also include fault data information for simulating hardware fault injection, that is, according to the possible fault modes of BMS hardware components (such as sensors, actuators, communication interfaces, etc.), introduce fault data for fault testing.

[0041] Thus, the above-mentioned battery management system test device 100, by setting a frequency domain conversion module 110 and a frequency domain waveform generator 120, can perform frequency domain conversion on test data such as typical operating condition information transmitted by the host computer 101 and / or the external characteristic information of single cells in the battery pack output by the battery cell simulator, and introduce fault data for fault testing, that is, analyze and operate the test data of the battery management system in the frequency domain, and input typical operating condition information and the external characteristic information of single cells in the battery pack output by the battery cell simulator, etc., thereby realizing customized input of various operating condition information to ensure the comprehensiveness of the operating condition information, and can further simulate various fault conditions of the battery pack under the influence of hardware while intuitively and accurately observing the inconsistency of the battery cells inside the battery pack, thereby improving the accuracy, flexibility and applicability of the battery management system simulation test.

[0042] In one embodiment of the present invention, Figure 2As shown, the frequency domain conversion module 110 includes: a data input and output unit 111, which is used to receive and transmit test data; a digital-to-analog conversion discrete sampling unit 112, which is connected to the data input and output unit 111 and is used to convert the test data into an analog signal; a storage unit 113, which is connected to the digital-to-analog conversion discrete sampling unit 112 and is used to store the analog signal; and a frequency domain conversion unit 114, which is connected to the storage unit 113 and is used to convert the stored analog signal into frequency domain data.

[0043] Specifically, the frequency domain conversion module 110 includes a data input and output unit 111 , a digital-to-analog conversion discrete sampling unit 112 , a storage unit 113 and a frequency domain conversion unit 114 . Among them, the data input and output unit 111 is the entrance and exit of the frequency domain conversion module 110, and can communicate with external devices through a communication interface, for example, receiving test data sent by the host computer 101 or other devices through a USB, CAN bus, etc., and transmitting it; the digital-to-analog conversion discrete sampling unit 112 is connected to the data input and output unit 111, and can convert the received test data into an analog signal. It can be understood that the test data is usually a digital signal, such as binary 1 or 0, and the frequency domain conversion can convert the digital signal into an analog signal, such as a numerical value of voltage, current, temperature, etc.; the storage unit 113 is connected to the digital-to-analog conversion discrete sampling unit 112, and can store the analog signal after digital-to-analog conversion and discrete sampling, wherein the storage unit 113 includes but is not limited to a FIFO (First Input First Output, first in, first out) memory; the frequency domain conversion unit 114 is connected to the storage unit 113, and can read the analog signal data from the storage unit 113, and apply the FFT algorithm or other similar frequency domain conversion algorithms to convert the analog signal into frequency domain data.

[0044] In one embodiment of the present invention, the storage unit 113 is used to store the analog signal according to a set data length.

[0045] Specifically, the storage unit 113 can store the analog signal with a set data length to ensure that the storage unit 113 can efficiently manage the storage space and facilitate the processing and analysis of the analog signal. The set data length can be determined according to the specifications of the storage unit 113, including but not limited to setting the data length to be proportional to the specifications. For example, as the specifications of the storage unit 113 increase, the set data length can increase from 1kb to 2kb, etc.

[0046] In one embodiment of the present invention, Figure 2As shown, the frequency domain conversion module 110 also includes: a first signal conditioning unit 115, which is respectively connected to the data input and output unit 111 and the digital-to-analog conversion discrete sampling unit 112, and is used to adjust the differential voltage corresponding to the test data and transmit the adjusted test data to the digital-to-analog conversion discrete sampling unit 112.

[0047] Specifically, the frequency domain conversion module 110 also includes a first signal conditioning unit 115 connected to the data input and output unit 111 and the digital-to-analog conversion discrete sampling unit 112, respectively, for adjusting the differential voltage corresponding to the received test data, including but not limited to amplifying or attenuating the voltage amplitude, and transmitting the adjusted test data to the digital-to-analog conversion discrete sampling unit 112. It can be understood that since the differential voltage range corresponding to the test data that can be recognized by the digital-to-analog conversion discrete sampling unit 112 is different, it is necessary to perform signal conditioning on it, and adjust the differential voltage corresponding to the test data to an appropriate level, that is, convert it into a standard voltage that can be recognized by the digital-to-analog conversion discrete sampling unit 112, so as to ensure that the subsequent digital-to-analog conversion and sampling can be carried out stably.

[0048] In a specific embodiment, the first signal conditioning unit 115 can flexibly configure the adjustment of the differential voltage corresponding to the test data according to the type of the digital-to-analog conversion discrete sampling unit 112, for example, adjusting from 0~3V to 0~5V or 0~6V, so as to facilitate the recognition and adaptation of subsequent modules.

[0049] In one embodiment of the present invention, Figure 2 As shown, the frequency domain conversion module 110 also includes: a gain unit 116, which is connected to the frequency domain conversion unit 114 and is used to amplify the voltage of the frequency domain data output by the frequency domain conversion unit 114, and transmit the amplified frequency domain data to the time domain conversion module 130.

[0050] Specifically, the frequency domain conversion module 110 also includes a gain unit 116 connected to the frequency domain conversion unit 114, which is used to adjust the voltage amplitude of the frequency domain data output by the frequency domain conversion unit 114. Specifically, when the frequency domain conversion unit 114 completes the frequency domain conversion and transmits the frequency domain data to the gain unit 116, the gain unit 116 can use an amplifier circuit to amplify the voltage of the frequency domain data according to a specific working condition or a custom instruction sent by the host computer 101, and output the amplified frequency domain data. Specifically, for example, the amplified frequency domain data can be transmitted to the subsequent time domain conversion module 130.

[0051] In a specific embodiment, the gain unit 116 may amplify the voltage of the frequency domain data by a fixed multiple according to a preset amplification multiple or gain coefficient.

[0052] In one embodiment of the present invention, Figure 2 As shown, the test device of the battery management system further includes a time domain conversion module 130, which is used to perform joint conversion processing on the frequency domain data and the target frequency domain waveform data in the time domain, and output corresponding time domain data.

[0053] Specifically, the time domain conversion module 130 can receive the frequency domain data obtained by processing the frequency domain conversion module 110 and the target frequency domain waveform data generated by the frequency domain waveform generator 120, and perform joint conversion processing, including but not limited to superposition or fusion processing, and output the corresponding time domain data, that is, the time domain conversion module 130 can combine the frequency domain data and the target frequency domain waveform data, convert them into time domain data using built-in algorithms and models, and output the frequency domain data and the target frequency domain waveform data in the time domain to facilitate subsequent BMS system testing, so that the inconsistency of the battery cells inside the battery pack and various fault conditions of the battery pack under the influence of hardware can be intuitively and accurately observed in the frequency domain, and the fault data can be output in the time domain for BMS system testing, which solves the accuracy and inflexibility problems of the current test system.

[0054] That is, in the embodiment of the present invention, normal frequency domain data is obtained based on the frequency domain conversion module 110, for example, including external characteristic data of the battery package; based on the frequency domain waveform generator 120, in the frequency domain, the simulated fault data (that is, the fault information to be simulated, including the degree of deviation of the single battery cells in the battery package and / or the fault data information used to simulate hardware fault injection) is superimposed on the normal frequency domain data to obtain faulty test data, that is, the expected simulated fault waveform, that is, the target frequency domain waveform, is generated in the frequency domain, and then the faulty test data is converted into time domain data for output, so as to facilitate the subsequent injection of the time domain data into the BMS system to check the BMS system feedback, thereby realizing the test.

[0055] In one embodiment of the present invention, Figure 2 As shown, the time domain conversion module 130 includes: a time domain conversion unit 131, which is respectively connected to the frequency domain conversion module 110 and the frequency domain waveform generator 120, and is used to perform time domain conversion on the frequency domain data and the target frequency domain waveform data to obtain analog time domain data; an analog-to-digital conversion discrete sampling unit 132, which is connected to the time domain conversion unit 131, and is used to convert the analog time domain data into a digital signal to obtain time domain data.

[0056] Specifically, the time domain conversion module 130 includes a time domain conversion unit 131 and an analog-to-digital conversion discrete sampling unit 132, wherein the time domain conversion unit 131 is connected to the frequency domain conversion module 110 and the frequency domain waveform generator 120 respectively, and can receive the frequency domain data from the frequency domain conversion module 110 and the target frequency domain waveform data generated by the frequency domain waveform generator 120, and convert the frequency domain data and the target frequency domain waveform data back to the time domain through an internal preset algorithm, including but not limited to using an IFFT (Inverse Fast Fourier Transform) algorithm, etc., so as to obtain analog time domain data, that is, analog signals such as voltage, current, and temperature; the analog-to-digital conversion discrete sampling unit 132 is connected to the time domain conversion unit 131, and can receive the analog time domain data from the time domain conversion unit 131, and convert the analog time domain data into time domain data in the form of a digital signal, that is, a numerical value of voltage, current or temperature represented in binary form.

[0057] In one embodiment of the present invention, Figure 2 As shown, the time domain conversion module 130 further includes: a second signal conditioning unit 133, which is connected to the analog-to-digital conversion discrete sampling unit 132 and is used to adjust the differential voltage corresponding to the time domain data.

[0058] Specifically, the time domain conversion module 130 also includes a second signal conditioning unit 133 connected to the analog-to-digital conversion discrete sampling unit 132, which is used to adjust the differential voltage corresponding to the received time domain data, including but not limited to amplifying or attenuating the voltage amplitude. It can be understood that since the differential voltage range corresponding to the time domain data that can be recognized by the analog-to-digital conversion discrete sampling unit 132 is different, it is necessary to perform signal conditioning to adjust the differential voltage corresponding to the time domain data to an appropriate level, that is, convert it into a standard voltage that can be recognized by the analog-to-digital conversion discrete sampling unit 132, so as to ensure that the subsequent analog-to-digital conversion and sampling can be carried out stably.

[0059] In a specific embodiment, the second signal conditioning unit can flexibly adjust the differential voltage corresponding to the time domain data according to the type of the analog-to-digital conversion discrete sampling unit 132, for example, from 0-3V to 0-5V or 0-6V.

[0060] In one embodiment of the present invention, the frequency domain waveform generator 120 is used to: upon receiving the degree of deviation of a single cell in a battery pack in the fault information to be simulated, perform the following actions: superimpose a constant value of a preset frequency on the frequency domain data (i.e., including basic external characteristic data) to simulate DC impedance; superimpose a preset low-frequency disturbance component in the frequency domain to simulate the phenomenon of waveform superposition due to the disordered frequency domain data caused by the inconsistency of the voltage and temperature of the single cells.

[0061] Specifically, when the frequency domain waveform generator 120 receives the degree of deviation of the single cell in the battery pack in the fault information to be simulated, the frequency domain waveform generator 120 can perform the following actions to simulate the fault condition. First, a constant value of a preset frequency can be superimposed on the basic external characteristic data to simulate the DC impedance, that is, by superimposing the constant value, the performance change of the battery caused by the DC impedance during actual operation can be simulated. Secondly, a preset low-frequency disturbance component can be superimposed in the frequency domain to simulate the frequency domain data change caused by the inconsistency of the voltage and temperature of the single cell, that is, the phenomenon that the frequency domain data is messy and the waveform is superimposed.

[0062] In a specific embodiment, the preset frequency superimposed on the basic external characteristic data may be a constant value of 0, and the preset low-frequency disturbance component may be an empirical formula or a user-defined mathematical expression.

[0063] In one embodiment of the present invention, the frequency domain waveform generator 120 is further used to superimpose frequency domain data (including basic external characteristic data) according to the frequency domain representation of the impedance spectrum to simulate high-frequency and mid-frequency channel impedance.

[0064] Specifically, the frequency domain waveform generator 120 can perform superposition processing on the basic external characteristic data according to the frequency domain representation of the impedance spectrum to accurately simulate the high-frequency and medium-frequency channel impedances. That is, the frequency domain waveform generator 120 can generate corresponding waveform signals according to the impedance characteristics of the high-frequency and medium-frequency bands in the impedance spectrum, and superimpose them on the basic external characteristic data to obtain frequency domain data containing high-frequency and medium-frequency channel impedance effects, thereby realizing the simulation of high-frequency and medium-frequency channel impedances.

[0065] In one embodiment of the present invention, Figure 2 As shown, the test device 100 of the battery management system also includes: a control module 140, which is connected to the analog-to-digital conversion discrete sampling unit 132, and the control module 140 is used to control the analog-to-digital conversion discrete sampling unit 132 to perform differential voltage disturbance fault simulation under hardware influence.

[0066] Specifically, the test device 100 of the battery management system also includes a control module 140 connected to the analog-to-digital conversion discrete sampling unit 132, which is used to send a control instruction to the analog-to-digital conversion discrete sampling unit 132, and accurately control the analog-to-digital conversion discrete sampling unit 132, so as to realize the simulation of differential voltage disturbance fault under the influence of hardware. Specifically, the control module 140 can simulate different degrees of differential voltage disturbance faults caused by hardware problems by adjusting the parameters of the analog-to-digital conversion discrete sampling unit 132.

[0067] In a specific embodiment, the control instruction may be a preset program.

[0068] In one embodiment of the present invention, the control module 140 is specifically used to control the reference voltage value of the numerical signal output by the analog-to-digital conversion discrete sampling unit 132 to perform fault simulation of the base value offset of the differential voltage signal.

[0069] Specifically, during the simulation process, the control module 140 can send a control instruction to the analog-to-digital conversion discrete sampling unit 132, directly or indirectly instructing the analog-to-digital conversion discrete sampling unit 132 to change the reference voltage value of the output numerical signal, including increasing or decreasing the reference voltage value, that is, the analog-to-digital conversion discrete sampling unit 132 can analyze and process the numerical signal of a specific reference voltage value, change its reference voltage value, so that the base value of the differential voltage signal is shifted accordingly, thereby simulating the voltage deviation that may occur during an actual hardware failure.

[0070] In one embodiment of the present invention, the control module 140 is specifically used to: superimpose noise on the frequency domain data in the frequency domain, and superimpose noise on the digital signal output by the analog-to-digital conversion discrete sampling unit 132 in the time domain, so that the analog-to-digital conversion discrete sampling unit 132 outputs a differential voltage signal with disturbance, thereby realizing disturbance fault simulation of high and low levels within / outside the identification range.

[0071] Specifically, during the simulation process, the control module 140 can first superimpose noise on the frequency domain data in the frequency domain, that is, add noise or interference signals to the frequency domain data, and then superimpose noise on the digital signal output by the analog-to-digital conversion discrete sampling unit 132 in the time domain, so that the analog-to-digital conversion discrete sampling unit 132 outputs a differential voltage signal with disturbance, thereby realizing the disturbance fault simulation of high and low levels within / outside the recognition range. It can be understood that the high and low level disturbances can be reflected by the differential voltage signal after superimposing the noise, that is, by superimposing the noise in the frequency domain and the time domain, the control module 140 can make the differential voltage signal output by the analog-to-digital conversion discrete sampling unit 132 change, for example, if it exceeds the standard range, it can simulate a fault with too high a level, and if it is below the standard range, it can simulate a fault with too low a level.

[0072] In one embodiment of the present invention, Figure 2 As shown, the test device 100 of the battery management system is characterized in that it also includes: a delayed output control module 150, which is connected to the storage unit 113 and is used to control the output form of the analog signal in the storage unit 113 to realize data information fault simulation under the influence of hardware.

[0073] Specifically, the test device 100 of the battery management system also includes a delayed output control module 150 connected to the storage unit 113, which is used to accurately control the output form of the analog signal in the storage unit 113 according to the fault simulation parameters and strategies preset in the simulation test, so as to realize the data information fault simulation under the influence of hardware. Specifically, the delayed output control module 150 can control the output time of the analog signal in the storage unit 113, including but not limited to controlling the analog signal in the storage unit 113 to be delayed for a certain period of time before output, simulating the delay phenomenon in the data transmission process, thereby realizing the data information fault simulation under the influence of hardware.

[0074] In one embodiment of the present invention, the delayed output module is specifically used to: upon receiving a data loss command sent by the host computer 101, control the storage unit 113 to execute a preset action to simulate a bus information data failure caused by the loss of flag bits and data bits in the data frame or by data tampering.

[0075] Specifically, during the simulation test, the delay output module can communicate with the host computer 101 and receive a data loss command sent from the host computer 101, including but not limited to specific parameters and requirements for simulating data loss or tampering. After receiving the data loss command from the host computer 101, the delay output module can parse the command to determine the type of simulated data loss or tampering, such as the loss of a specific flag bit or data bit in a data frame, or the location of tampered data, and then control the storage unit 113 connected thereto to perform a preset action to simulate a bus information data failure caused by the loss of flag bits and data bits in a data frame or by data tampering.

[0076] In one embodiment of the present invention, the preset action includes one of the following: for an analog signal at a preset moment, keeping the analog signal the same as the analog signal at a previous moment; flipping the level of the analog signal; and delaying the output of the analog signal.

[0077] Specifically, the preset actions performed by the delayed output module to control the storage unit 113 include one of the following: for the analog signal at a preset moment, the delayed output module can choose to keep the analog signal the same as the analog signal at the previous moment without making any changes, so that the analog signal is in an unupdated state to simulate a data stagnation fault state; flip the level of the analog signal, that is, the high level of the analog signal is converted to a low level, or the low level of the analog signal is converted to a high level, for example, 1 becomes 0, or 0 becomes 1, to simulate a data inversion fault state; delay the output of the analog signal, that is, after the delayed output module receives the analog signal from the storage unit 113, it does not output it immediately, but waits for a preset delay time before outputting it, wherein the delay time can be fixed or random to simulate different levels of transmission delays.

[0078] In summary, according to the test device 100 of the battery management system according to the embodiment of the present invention, by setting the frequency domain conversion module 110 and the frequency domain waveform generator 120, the typical operating condition information transmitted by the host computer 101 and / or the external characteristic information of the single cell in the battery pack output by the battery cell simulator can be converted into the frequency domain, and the typical operating condition information and the external characteristic information of the single cell in the battery pack output by the battery cell simulator can be input, thereby realizing customized input of various operating condition information to ensure the comprehensiveness of the operating condition information, so that the inconsistency of the battery cells inside the battery pack can be observed intuitively and accurately in the frequency domain, and various fault conditions of the battery pack under the influence of hardware can also be simulated, thereby improving the accuracy, flexibility and applicability of the battery management system simulation test.

[0079] A further embodiment of the present invention provides a test system 10 for a battery management system.

[0080] In some embodiments, in combination Figure 3 As shown, the test system 10 of the battery management system includes: a host computer 101, a middle computer 102, a communication module 103, a battery management system to be tested 104 and a test device 100 of the battery management system as in the above-mentioned embodiment; wherein, the host computer 101, the middle computer 102, the battery management system to be tested 104 and the test device 100 of the battery management system communicate with each other through the communication module 103; the host computer 101 is used to provide typical operating condition information; the middle computer 102 is used to provide external characteristic information of single cells in the battery pack; the test device 100 of the battery management system is used to perform single cell inconsistency simulation and / or hardware-affected fault injection simulation according to typical operating condition information and / or a cell simulator, and output the obtained simulation results to the battery management system 104 to be tested for testing it.

[0081] According to the test system 10 of the battery management system of the present invention, by setting the test device 100 of the battery management system, that is, by setting the frequency domain conversion module 110 and the frequency domain waveform generator 120, the typical operating condition information transmitted by the host computer 101 and / or the test data such as the external characteristic information of the single cell in the battery pack output by the battery cell simulator can be converted into the frequency domain, and fault data can be introduced to perform fault testing, that is, the test data of the battery management system is analyzed and operated in the frequency domain, and the typical operating condition information and the external characteristic information of the single cell in the battery pack output by the battery cell simulator can be input, thereby realizing customized input of various operating condition information to ensure the comprehensiveness of the operating condition information, and can further simulate various fault conditions of the battery pack under the influence of hardware while intuitively and accurately observing the inconsistency of the battery cells inside the battery pack, thereby improving the accuracy, flexibility and applicability of the battery management system simulation test.

[0082] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example.

[0083] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A test device for a battery management system, characterized in that: include: A frequency domain conversion module, used to convert the received test data in the frequency domain and output corresponding frequency domain data, wherein the test data includes typical operating condition information transmitted by the host computer and / or external characteristic information of a single cell in the battery pack output by the cell simulator; A frequency domain waveform generator is used to generate target frequency domain waveform data according to the frequency domain data and waveform instructions, wherein the waveform instructions include waveform information corresponding to the fault information to be simulated transmitted by the host computer, and the fault information to be simulated includes: the degree of deviation of the single cells in the battery pack and / or the fault data information used to simulate hardware fault injection.

2. The battery management system testing device according to claim 1, characterized in that: The frequency domain conversion module comprises: A data input and output unit, the data input and output unit is used to receive and transmit the test data; A digital-to-analog conversion discrete sampling unit, connected to the data input and output unit, for converting the test data into an analog signal; A storage unit, connected to the digital-to-analog conversion discrete sampling unit, and used to store the analog signal; A frequency domain conversion unit is connected to the storage unit and is used to convert the stored analog signal into the frequency domain data.

3. The battery management system testing device according to claim 2, characterized in that: The storage unit is used to store the analog signal according to a set data length.

4. The battery management system testing device according to claim 2, characterized in that: The frequency domain conversion module further includes: The first signal conditioning unit is connected to the data input-output unit and the digital-to-analog conversion discrete sampling unit respectively, and is used to adjust the differential voltage corresponding to the test data and transmit the adjusted test data to the digital-to-analog conversion discrete sampling unit.

5. The battery management system testing device according to claim 2, characterized in that: The frequency domain conversion module further includes: A gain unit, the gain unit is connected to the frequency domain conversion unit, and is used to amplify the voltage of the frequency domain data output by the frequency domain conversion unit, and output the amplified frequency domain data.

6. The battery management system testing device according to claim 1, characterized in that: Also includes: The time domain conversion module is used to perform joint conversion processing on the frequency domain data and the target frequency domain waveform data in the time domain, and output corresponding time domain data.

7. The battery management system testing device according to claim 6, characterized in that: The time domain conversion module comprises: A time domain conversion unit, the time domain conversion unit is connected to the frequency domain conversion module and the frequency domain waveform generator respectively, and is used to perform time domain conversion on the frequency domain data and the target frequency domain waveform data to obtain simulated time domain data; The analog-to-digital conversion discrete sampling unit is connected to the time domain conversion unit and is used to convert the analog time domain data into a digital signal to obtain the time domain data.

8. The battery management system testing device according to claim 7, characterized in that: The time domain conversion module further includes: A second signal conditioning unit, the second signal conditioning unit is connected to the analog-to-digital conversion discrete sampling unit, and is used to adjust the differential voltage corresponding to the time domain data.

9. The battery management system testing device according to claim 1, characterized in that: The frequency domain waveform generator is used to: When receiving the deviation degree of the single cell in the battery pack in the fault information to be simulated, the following actions are performed: superimposing a constant value of a preset frequency on the frequency domain data to simulate a DC impedance; A preset low-frequency disturbance component is superimposed in the frequency domain to simulate the phenomenon of chaotic frequency domain data and waveform superposition caused by the inconsistency of the voltage and temperature of the single battery cells.

10. The battery management system testing device according to claim 9, characterized in that: The frequency domain waveform generator is also used for: The frequency domain data are superimposed according to the representation of the impedance spectrum in the frequency domain to simulate the high frequency and mid-frequency channel impedances.

11. The battery management system testing device according to claim 7, characterized in that: Also includes: A control module is connected to the analog-to-digital conversion discrete sampling unit, and is used to control the analog-to-digital conversion discrete sampling unit to perform differential voltage disturbance fault simulation under hardware influence.

12. The battery management system testing device according to claim 11, characterized in that: The control module is specifically used for: The reference voltage value of the numerical signal output by the analog-to-digital conversion discrete sampling unit is controlled to perform fault simulation of the base value deviation of the differential voltage signal.

13. The test device for a battery management system according to claim 11, characterized in that: The control module is specifically used for: The frequency domain data is superimposed with noise in the frequency domain, and the digital signal output by the analog-to-digital conversion discrete sampling unit is superimposed with noise in the time domain, so that the analog-to-digital conversion discrete sampling unit outputs a differential voltage signal with disturbance, thereby realizing disturbance fault simulation of high and low levels within / outside the recognition range.

14. The test device for a battery management system according to claim 2, characterized in that: Also includes: A delayed output control module is connected to the storage unit and is used to control the output form of the analog signal in the storage unit to realize data information fault simulation under the influence of hardware.

15. The battery management system testing device according to claim 14, characterized in that: The delayed output module is specifically used for: After receiving the data loss command sent by the host computer, the storage unit is controlled to execute a preset action to simulate a bus information data failure caused by the loss of the flag bit and the data bit in the data frame or by data tampering.

16. The test device for a battery management system according to claim 15, characterized in that: The preset action includes one of the following: For an analog signal at a preset moment, keep the analog signal the same as the analog signal at a previous moment; Flipping the level of the analog signal; The analog signal is output with a delay.

17. A battery management system testing system, characterized in that: include: A host computer, a middle computer, a communication module, a battery management system to be tested, and a test device for the battery management system as claimed in any one of claims 1 to 16; Wherein, the host computer, the intermediate computer, the battery management system to be tested and the test device of the battery management system communicate with each other through the communication module; The host computer is used to provide typical working condition information; The intermediate unit is used to provide external characteristic information of the single cells in the battery pack; The testing device of the battery management system is used to perform single cell inconsistency simulation and / or hardware-affected fault injection simulation according to the typical operating condition information and / or the battery cell simulator, and output the obtained simulation results to the battery management system to be tested for testing it.

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