A path planning control method and system for substation inspection equipment

By obtaining and evaluating the target data set of inspection equipment and adjusting the inspection path to avoid dynamic obstacles, the problem that inspection equipment in the prior art cannot flexibly avoid dynamic obstacles is solved, and the safety and efficiency of the equipment are improved.

CN119758988AInactive Publication Date: 2025-04-04FANPING BRANCH OF HUANENG GANSU ENERGY DEVELOPMENT CO LTD
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Patent Information

Application Number
CN202411621097.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-14
Publication Date
2025-04-04
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

Existing inspection equipment cannot flexibly avoid dynamic obstacles, resulting in easy collisions and safety hazards.

Method used

By obtaining the target data set of the target inspection object, a comprehensive indicator for evaluating the abnormal movement status of the inspection equipment is determined, and the inspection path is adjusted according to the threshold range to avoid collisions with dynamic obstacles.

Benefits of technology

It improves the safety and flexibility of inspection equipment, avoids collisions with dynamic obstacles, improves inspection efficiency, and reduces the occurrence and scope of accidents.

✦ Generated by Eureka AI based on patent content.

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Patent Text Reader

Abstract

The present invention discloses a path planning control method and system for substation inspection equipment, including: obtaining a target data set of a target inspection object; determining a comprehensive index for evaluating the abnormal movement state of the inspection equipment according to the target data set; determining a threshold range of the comprehensive index, and evaluating the abnormal movement state of the inspection equipment according to the threshold range; and adjusting the inspection path of the inspection equipment according to different abnormal conditions in the abnormal state. The present invention combines measures for predicting potential risk nodes and detecting inspection nodes in real time, fully assisting the inspection equipment to avoid dynamic obstacles with strong activity and suddenness in advance, and effectively improving the safety and inspection efficiency of the inspection equipment.
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Description

Technical Field

[0001] The present invention relates to the technical field of inspection equipment, and in particular to a path planning control method and system for substation inspection equipment. Background Art

[0002] In order to ensure the normal operation of substation equipment and the stability of the power system, on-duty personnel need to conduct regular inspections. With the expansion of the scale and complexity of the power system, manual inspections can no longer meet the safe operation requirements of substations. Therefore, the application of substation inspection equipment came into being.

[0003] However, the existing inspection equipment cannot flexibly avoid dynamic obstacles during the specific inspection process, which causes the inspection equipment to easily collide with the dynamic obstacles when moving towards them, posing certain safety hazards.

[0004] In view of the above problems, the present invention designs a path planning control method and system for substation inspection equipment. By improving and optimizing the control algorithm and obstacle avoidance strategy of the inspection equipment, the safety and flexibility are improved, and the collision between the inspection equipment and dynamic obstacles is avoided. This not only improves the inspection efficiency, but also reduces the occurrence of accidents and the scope of accident impact, thereby ensuring the normal and safe operation of substation equipment. Summary of the invention

[0005] In view of the above-mentioned problems, the present invention is proposed.

[0006] Therefore, the technical problem solved by the present invention is that the control system of the existing inspection equipment is unable to avoid dynamic obstacles in a specific environment in advance.

[0007] To solve the above technical problems, the present invention provides the following technical solutions: a path planning and control method for substation inspection equipment, comprising: obtaining a target data set of a target inspection object; determining a comprehensive indicator for evaluating the abnormal state of movement of the inspection equipment based on the target data set; determining a threshold range for the comprehensive indicator, and evaluating the abnormal state of movement of the inspection equipment based on the threshold range; and adjusting the inspection path of the inspection equipment according to different abnormal conditions in the abnormal state.

[0008] As a preferred solution of the path planning control method of the substation inspection equipment described in the present invention, wherein: the target data set includes environmental data, static obstacle data, and dynamic obstacle data; the target data set is divided into a historical target data set and a real-time target data set.

[0009] As a preferred solution of the path planning control method of the substation inspection equipment of the present invention, wherein: the determination of the comprehensive index for evaluating the abnormal movement state of the inspection equipment comprises the following steps:

[0010] Obtain the values of each environmental parameter in the historical environmental data, establish an environmental data evaluation model, and quantify the first comprehensive impact of the environmental parameters on the movement characteristics of the inspection equipment based on this;

[0011] Obtain the values of each static obstacle parameter in the historical static obstacle data, establish a static obstacle data evaluation model, and quantify the second comprehensive impact of the static obstacle parameters on the movement characteristics of the inspection equipment based on this;

[0012] Obtain the values of each dynamic obstacle parameter in the historical environmental data, establish a dynamic obstacle data evaluation model, and quantify the third comprehensive impact of the dynamic obstacle parameters on the movement characteristics of the inspection equipment based on this;

[0013] Summarize the first comprehensive impact, the second comprehensive impact, and the third comprehensive impact, and perform unified comparison and processing to obtain a comprehensive index for evaluating the abnormal movement state of the inspection equipment.

[0014] As a preferred solution of the path planning control method for the substation inspection equipment according to the present invention, wherein: determine the threshold range of the comprehensive index, and evaluate the abnormal movement state of the inspection equipment according to the threshold range, including the following steps:

[0015] Let the comprehensive index be S;

[0016] Let the threshold range be defined by a first preset threshold T, a second preset threshold U, and zero V;

[0017] When 0 < S < T, the movement of the inspection equipment is an abnormal situation; wherein, the abnormal situation includes ineffective interference, effective interference, and severe interference;

[0018] When 0 < S < T / 2, the inspection equipment is subject to ineffective interference and there is no need to adjust the path planning of the inspection equipment;

[0019] When T / 2 < S < U, the inspection equipment is subject to effective interference, and then adjust the path planning of the inspection equipment;

[0020] When U < S < T, the inspection equipment is subject to severe interference, and the inspection equipment immediately activates an alarm and retreats to a safe position according to the current path planning.

[0021] As a preferred solution of the path planning control method for the substation inspection equipment according to the present invention, wherein: after obtaining the quantization values I1 of the first comprehensive impact, I2 of the second comprehensive impact, and I3 of the third comprehensive impact respectively, further calculate the quantization value S of the comprehensive index; specifically as follows:

[0022] The quantization value I1 of the first comprehensive impact is expressed as:

[0023]

[0024] Wherein, d represents the flatness of the ground; s represents the slope; f represents the friction coefficient; w represents the width of the channel; r represents the turning radius; represents an exponential decay function to truly simulate the impact of the inspection equipment when it is far away from the values ​​of various environmental parameters during movement; I1 represents the cumulative comprehensive impact value of the ground flatness d, slope s and friction coefficient f on the mobile characteristics of the inspection equipment within the range of the turning radius r and on the basis of different channel widths;

[0025] The quantitative value I2 of the second comprehensive impact is expressed as:

[0026]

[0027] in, represents the average value of column diameter; represents the average wall thickness; c max Indicates the maximum volume of the equipment box; represents an exponential decay function to truly simulate the impact of the inspection equipment when it moves away from static obstacles; I2 represents the maximum volume of the equipment box c max Within the range of and wall thickness The cumulative comprehensive impact value on the mobile characteristics of the inspection equipment;

[0028] The quantitative value I3 of the third comprehensive impact is expressed as:

[0029]

[0030] Where p represents the number of dynamic obstacles; q i represents the position coordinates of the i-th dynamic obstacle; r i represents the moving speed of the ith dynamic obstacle; s i Indicates the moving direction of the i-th dynamic obstacle; m i Indicates the ratio of the behavior pattern of the i-th dynamic obstacle to the space occupied; Represents an exponential decay function to realistically simulate the impact on the inspection equipment as it moves away from dynamic obstacles. represents an exponential amplification function to amplify the influence of the behavior pattern of dynamic obstacles on the proportion of space occupied by the inspection equipment during movement; I3 represents the comprehensive influence value of the position coordinates, moving speed, moving direction and behavior pattern of each dynamic obstacle on the movement characteristics of the inspection equipment;

[0031] The expression of the quantitative value S of the comprehensive index is:

[0032]

[0033] Among them, D represents the normalization processing of the influence of dynamic obstacles, expressed as:

[0034]

[0035] Among them, q i represents the position coordinates of the i-th dynamic obstacle; r i represents the moving speed of the i-th dynamic obstacle.

[0036] As a preferred scheme of the path planning control method for the substation inspection equipment described in the present invention, wherein: adjusting the inspection path of the inspection equipment according to different abnormal conditions in the abnormal state includes the following steps:

[0037] When S obtained from the historical target data set satisfies T / 2 < S < U, after summarizing the position coordinates, abnormal duration, and abnormal frequency of each target inspection object when S satisfies T / 2 < S < U, two alternative inspection paths of the original inspection path are preset; among them, the first alternative inspection path follows the principle of comprehensive coverage of the target inspection objects, and the second alternative inspection path follows the principle of prioritizing key target inspection objects;

[0038] The principle of comprehensive coverage means that the inspection equipment shuffles the order of each target inspection object in the original inspection path and inspects them one by one according to the duration difference and frequency difference of the abnormal conditions of each target inspection object;

[0039] The principle of prioritizing key target inspection objects means that according to the duration difference and frequency difference of the abnormal conditions of each target inspection object, only the key target inspection objects in the original inspection path are shuffled and inspected one by one;

[0040] When U < S < T obtained from the historical target data set, a preferred skip selection of the original inspection path is preset.

[0041] As a preferred scheme of the path planning control method for the substation inspection equipment described in the present invention, wherein: after obtaining the target data set of the target inspection object, the following steps are included:

[0042] Obtain environmental data, static obstacle data, and dynamic obstacle data;

[0043] Clean the obtained environmental data, static obstacle data, and dynamic obstacle data, and剔除 invalid data and error data;

[0044] Perform normalization processing on the cleaned environmental data, static obstacle data, and dynamic obstacle data.

[0045] In a second aspect, the present invention further provides a patrol inspection equipment control system, including a data acquisition module, which collects a target data set through a sensor, and the patrol inspection equipment feeds the target data set back to a central processing system for preprocessing;

[0046] Abnormal state evaluation module, the central processing system extracts various values ​​to the abnormal state evaluation module for evaluation and outputs the results;

[0047] Path adjustment module, the central processing system pre-selects the path and adjusts the rules according to the output results.

[0048] In a third aspect, the present invention further provides a computing device, comprising: a memory and a processor;

[0049] The memory is used to store computer executable instructions, and the processor is used to execute the computer executable instructions. When the computer executable instructions are executed by the processor, the steps of the path planning control method of the substation inspection equipment are implemented.

[0050] In a fourth aspect, the present invention further provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, implement the steps of the path planning control method for the substation inspection equipment.

[0051] The beneficial effects of the present invention are as follows: the present invention can not only predict the comprehensive influence of the environmental factors, static obstacle factors and dynamic obstacle factors of each inspection node on the mobile characteristics of the inspection equipment according to the historical data of each inspection node of the substation, and pre-set alternative paths to completely avoid all dynamic obstacles that may have a negative impact on the inspection equipment; it can also detect the comprehensive influence of the environmental factors, static obstacle factors and dynamic obstacle factors of each inspection node on the mobile characteristics of the inspection equipment in real time according to the real-time data of each inspection node of the substation, so that the inspection equipment can urgently avoid sudden dynamic obstacles that have a negative impact on the movement of the inspection equipment; the present invention combines the measures of predicting potential risk nodes and detecting inspection nodes in real time, fully assisting the inspection equipment to avoid dynamic obstacles with strong activity and suddenness in advance, and effectively improving the safety and inspection efficiency of the inspection equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0053] Figure 1An overall flow chart of a path planning control method for substation inspection equipment provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0054] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the drawings of the specification. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary persons in the art without creative work should fall within the scope of protection of the present invention.

[0055] Example 1

[0056] Reference Figure 1 , as an embodiment of the present invention, provides a path planning control method for substation inspection equipment, comprising:

[0057] S1: Obtain a target data set of a target inspection object.

[0058] Furthermore, the target data set includes environmental data, static obstacle data, and dynamic obstacle data; the target data set is divided into a historical target data set and a real-time target data set.

[0059] Furthermore, after obtaining the target data set of the target inspection object, the following steps are included:

[0060] Obtain environmental data, static obstacle data and dynamic obstacle data;

[0061] Clean the acquired environmental data, static obstacle data and dynamic obstacle data, and remove invalid and erroneous data;

[0062] The cleaned environment data, static obstacle data and dynamic obstacle data are normalized.

[0063] In the present invention, the target inspection object refers to the equipment and / or area in the substation that needs to be inspected and evaluated. The specific equipment includes switchgear, transformers, circuit breakers and other electrical equipment in the substation, and the specific area includes the distribution room, cable tunnel and underground passage in the substation. The inspection equipment collects data about the target inspection object through electronic mechanisms such as sensors and cameras, such as the status data and / or operating parameter data of each device and the environmental data and / or safety protection status of each area, to ensure that the operating status of each device in the substation is normal and the operating environment of each device is safe.

[0064] In the present invention, environmental data include the flatness, slope and friction coefficient of the ground, channel width and turning radius; static obstacle data include column diameter, wall thickness and equipment box volume; dynamic obstacle data include the number, position coordinates, moving speed and moving direction of staff and / or cats and / or mice and / or moving machinery and equipment, as well as the proportion of behavior patterns to space occupancy.

[0065] Among them, the flatness, slope and friction coefficient of the ground affect the stability and running speed of the inspection equipment during movement. The width of the channel and the turning radius directly determine whether the inspection equipment can pass through this area smoothly. The diameter of the column, the thickness of the wall and the size of the equipment box affect the spatial layout and the size of the passable space of the channel, which indirectly affects whether the inspection equipment can pass through this area smoothly. The number, position coordinates, moving speed and moving direction of staff and / or animals (cats, mice) and / or moving machinery and equipment will increase the difficulty of smooth passage of the inspection equipment based on the inherent environment and static obstacles. The behavior patterns of different dynamic obstacles not only diversify the size of the space occupied, but also easily lead to friction and collision between the inspection equipment and the obstacles.

[0066] In the present invention, since the inspection equipment will be disturbed by the area where the inspection equipment is located and the ground environment, static obstacles and dynamic obstacles in the inspection area during its movement during inspection, corresponding sensors (laser scanner / rangefinder, ground friction coefficient tester, three-dimensional scanner and thermal imaging camera) are installed near the inspection equipment, in the area where the inspection equipment is located and in other inspection areas to obtain various environmental parameter data, static obstacle parameter data and dynamic obstacle parameter data in real time.

[0067] In the present invention, priority is given to obtaining various parameter data that directly and indirectly affect the mobile characteristics of the inspection equipment, improving the comprehensiveness and accuracy of the abnormal movement state evaluation of the inspection equipment, and directly uploading the corresponding data to the central processing system of the inspection equipment through various sensors for cleaning, screening and normalization, thereby improving the data accuracy and reliability of the target data set, thereby laying a solid foundation for the efficient and accurate calculation of the abnormal movement state evaluation of the inspection equipment, thereby realizing the optimization of the inspection path planning of the inspection equipment and effective obstacle avoidance.

[0068] In the present invention, historical data and real-time data of the target data set are obtained respectively. The former predicts the comprehensive influence of the historical target data set of each target inspection object on the mobile characteristics of the inspection equipment, and pre-sets alternative paths, which helps the inspection equipment to completely avoid all dynamic obstacles that may have a negative impact on the inspection equipment during the inspection process; the latter detects the comprehensive influence of the real-time target data set of each inspection node on the mobile characteristics of the inspection equipment in real time, which helps the inspection equipment to urgently avoid sudden dynamic obstacles that have a negative impact on the movement of the inspection equipment; the combination of the two fully assists the inspection equipment to avoid dynamic obstacles with strong activity and suddenness in advance, effectively improving the safety and inspection efficiency of the inspection equipment.

[0069] S2: Determine comprehensive indicators for evaluating abnormal movement status of inspection equipment based on the target data set.

[0070] Furthermore, a comprehensive index for evaluating the abnormal movement status of the inspection equipment is determined, including the following steps:

[0071] Obtain the values ​​of various environmental parameters in historical environmental data, establish an environmental data evaluation model, and use it to quantify the first comprehensive impact of environmental parameters on the mobile characteristics of inspection equipment;

[0072] Obtain the values ​​of each static obstacle parameter in the historical static obstacle data, establish a static obstacle data evaluation model, and use it to quantify the second comprehensive impact of the static obstacle parameters on the mobile characteristics of the inspection equipment;

[0073] Obtain the values ​​of each dynamic obstacle parameter in the historical environmental data, establish a dynamic obstacle data evaluation model, and use it to quantify the third comprehensive impact of the dynamic obstacle parameters on the mobile characteristics of the inspection equipment;

[0074] The first comprehensive impact, the second comprehensive impact and the third comprehensive impact are summarized and compared in a unified manner to obtain comprehensive indicators for evaluating the abnormal state of movement of the inspection equipment.

[0075] Furthermore, the quantified value S of the comprehensive index is further calculated based on the quantified value I1 of the first comprehensive impact, the quantified value I2 of the second comprehensive impact, and the quantified value I3 of the third comprehensive impact, and the quantified value S of the comprehensive index is obtained; specifically as follows:

[0076] The quantitative value I1 of the first comprehensive impact is expressed as:

[0077]

[0078] Wherein, d represents the flatness of the ground; s represents the slope; f represents the friction coefficient; w represents the width of the channel; r represents the turning radius; represents an exponential decay function to truly simulate the impact of the inspection equipment when it is far away from the values ​​of various environmental parameters during movement; I1 represents the cumulative comprehensive impact value of the ground flatness d, slope s and friction coefficient f on the mobile characteristics of the inspection equipment within the range of the turning radius r and on the basis of different channel widths;

[0079] The quantitative value I2 of the second comprehensive impact is expressed as:

[0080]

[0081] in, represents the average value of column diameter; represents the average wall thickness; c max Indicates the maximum volume of the equipment box; represents an exponential decay function to truly simulate the impact of the inspection equipment when it moves away from static obstacles; I2 represents the maximum volume of the equipment box c max Within the range of and wall thickness The cumulative comprehensive impact value on the mobile characteristics of the inspection equipment;

[0082] The quantitative value I3 of the third comprehensive impact is expressed as:

[0083]

[0084] Where p represents the number of dynamic obstacles; q i represents the position coordinates of the i-th dynamic obstacle; r i represents the moving speed of the ith dynamic obstacle; s i Indicates the moving direction of the i-th dynamic obstacle;

[0085] m i Indicates the ratio of the behavior pattern of the i-th dynamic obstacle to the space occupied; Represents an exponential decay function to realistically simulate the impact on the inspection equipment as it moves away from dynamic obstacles. represents an exponential amplification function to amplify the influence of the behavior pattern of dynamic obstacles on the proportion of space occupied by the inspection equipment during movement; I3 represents the comprehensive influence value of the position coordinates, moving speed, moving direction and behavior pattern of each dynamic obstacle on the movement characteristics of the inspection equipment;

[0086] The expression of the quantitative value S of the comprehensive index is:

[0087]

[0088] Where D represents the normalization of the impact of dynamic obstacles, expressed as:

[0089]

[0090] Among them, q i represents the position coordinates of the i-th dynamic obstacle; r i Represents the moving speed of the i-th dynamic obstacle;

[0091] In summary, the complete expression of the quantitative value S of the comprehensive index is:

[0092]

[0093] In the expression of the quantitative value I1 of the first comprehensive impact of the present invention, an integral algorithm is used. During the movement of the inspection equipment, various environmental parameters change with the position. The integral algorithm can reflect the comprehensive impact of the dynamic changes of various environmental parameters on the movement characteristics of the inspection equipment, thereby more accurately evaluating the abnormal state of the movement of the inspection equipment.

[0094] Among them, since the turning radius r represents the turning ability of the inspection equipment at a specific location, the turning radius r experienced by the inspection equipment during the actual inspection movement is in dynamic change at any time, so the turning radius r is selected to be integrated in this integral formula; d 2 +s 2 +f 2 The square sum algorithm amplifies the influence of ground flatness d, slope s and friction coefficient f respectively. Since the turning radius r and channel width w are more inclined to environmental conditions among the parameters affecting the mobile characteristics of the inspection equipment, the turning radius r and channel width w are not taken as part of the square sum. 2 +s 2 +f 2 As the numerator and the channel width w as the denominator, the comprehensive influence of the ground flatness d, slope s and friction coefficient f at different channel widths w on the mobile characteristics of the inspection equipment can be obtained. The quantified value I1 of the first comprehensive influence increases with the increase of the ground flatness d, slope s and friction coefficient f, and the quantified value I1 of the first comprehensive influence decreases with the increase of the channel width w. Finally, the exponential decay function introduced This means that as the inspection equipment gradually moves away from the inspection position, the influence of various environmental parameters at the inspection position on the mobile characteristics of the inspection equipment naturally decreases, thereby improving the authenticity of the simulation.

[0095] In the expression of the quantized value I2 of the second comprehensive impact of the present invention, an integral algorithm is adopted. During the movement of the inspection equipment, the parameters of each static obstacle change with the position due to different layouts. The integral algorithm can reflect the comprehensive impact of the dynamic changes of each static obstacle parameter on the movement characteristics of the inspection equipment, thereby more accurately evaluating the abnormal state of the movement of the inspection equipment.

[0096] Among them, since the volume c of the equipment box is the largest among the static obstacles that the inspection equipment must bypass, and this parameter satisfies the corresponding dynamic changes during the movement of the inspection equipment, the maximum volume c of the equipment box is selected in this integral formula max Perform integration; The average value of the column diameter is magnified using the sum of squares algorithm and the average wall thickness In order to avoid the equipment box volume c affecting the average column diameter and the average wall thickness Relative to the maximum volume of different equipment boxes c max The combined effect on the mobile characteristics of the inspection equipment is that the volume c of the equipment box is not included in the square sum algorithm. The quantitative value I2 of the second comprehensive effect increases with the average value of the column diameter. and the average wall thickness The quantified value of the second comprehensive impact I2 increases with the maximum volume c of the equipment box. max decreases with the increase of; finally, the exponential decay function introduced This means that as the inspection device gradually moves away from the inspection position, the influence of the static obstacle parameters at the inspection position on the movement characteristics of the inspection device naturally decreases, thereby improving the simulation authenticity.

[0097] The average diameter of the column is are all the measured column diameters a1, a2, ...a n The average value of is expressed as:

[0098]

[0099] Where a represents the diameter of the column; n represents the number of columns; i represents the i-th column, and the value range of i is 1, 2, ...n;

[0100] The average wall thickness is are all measured wall thicknesses b1, b2, ... b m The average value of is expressed as:

[0101]

[0102] Where b represents the wall thickness; m represents the number of walls; j represents the jth wall, and the value range of j is 1, 2, ...m;

[0103] Among them, the maximum volume of the equipment box c max It is the maximum value of all measured equipment box volumes c, and its expression is:

[0104] c max =max(L, W, H)

[0105] Wherein, c represents the volume of the equipment box; L represents the length of the equipment box; W represents the width of the equipment box; and H represents the height of the equipment box.

[0106] In the expression of the quantified value I3 of the third comprehensive influence of the present invention, since the number p of dynamic obstacles is a variable, multiple dynamic obstacles may exist at the same position and time at the same time, so the product algorithm is used to reflect the comprehensive influence of all dynamic obstacles at this time and place on the mobile characteristics of the inspection robot;

[0107] Among them, the exponential decay function Select the position coordinates of the i-th dynamic obstacle qi as the numerator, and select the moving speed of the i-th dynamic obstacle r i As the denominator, it reflects the moving speed of the dynamic obstacle relative to the inspection equipment, simulating that as the inspection equipment gradually moves away from the dynamic obstacle, the impact of the dynamic obstacle on the inspection equipment naturally decreases; the exponential amplification function Select the moving direction s of the i-th dynamic obstacle i The ratio m of the behavior pattern of the i-th dynamic obstacle to the space occupied i Multiplication reflects the size of the space occupied by the dynamic obstacle in a specific moving direction, and simulates the gradual increase in the impact of the dynamic obstacle on the inspection equipment as the inspection equipment moves away from the dynamic obstacle.

[0108] The quantitative value of comprehensive indicators In the expression of i and the moving speed r of the i-th dynamic obstacle i The moving direction s relative to the i-th dynamic obstacle i The ratio m of the behavior pattern of the i-th dynamic obstacle to the space occupied i More stable; therefore, when D is the normalized denominator, the position coordinate q of the i-th dynamic obstacle is selected i and the moving speed r of the i-th dynamic obstacle iNormalize the comprehensive impact of dynamic obstacles as representative parameters to avoid the instability of the comprehensive impact of dynamic obstacles leading to inaccurate and unreliable quantization values S of comprehensive indicators; multiplying the quantization values of the three groups of comprehensive impacts can directly reflect the actual change magnitude of the quantization values of each group of comprehensive impacts and the proportion in the quantization value S of the comprehensive indicator, ensuring the accuracy and reliability of the evaluation results of the abnormal state of the inspection equipment movement, and contributing to improving the feasibility of the optimized path planning.

[0109] S3: Determine the threshold range of the comprehensive indicator and evaluate the abnormal state of the inspection equipment movement according to the threshold range.

[0110] Further, determining the threshold range of the comprehensive indicator and evaluating the abnormal state of the inspection equipment movement includes the following steps:

[0111] Let the comprehensive indicator be S;

[0112] Let the threshold range be defined by the first preset threshold T, the second preset threshold U, and zero limit V;

[0113] When 0 < S < T, the movement of the inspection equipment is abnormal; among them, the abnormal situations include invalid interference, effective interference, and severe interference;

[0114] When 0 < S < T / 2, the inspection equipment is subject to invalid interference and there is no need to adjust the path planning of the inspection equipment;

[0115] When T / 2 < S < U, the inspection equipment is subject to effective interference, then adjust the path planning of the inspection equipment;

[0116] When U < S < T, the inspection equipment is subject to severe interference, and the inspection equipment turns on the alarm in real time and retreats to a safe position according to the current path planning.

[0117] S4: Adjust the inspection path of the inspection equipment according to different abnormal situations in the abnormal state.

[0118] Further, adjusting the inspection path of the inspection equipment according to different abnormal situations in the abnormal state includes the following steps:

[0119] When S obtained according to the historical target dataset is in the range of T / 2 < S < U, then after summarizing the position coordinates, abnormal duration, and abnormal frequency of each target inspection object when S is in the range of T / 2 < S < U, two alternative inspection paths of the original inspection path are preset; among them, the first alternative inspection path follows the principle of comprehensive coverage of the target inspection object, and the second alternative inspection path follows the principle of giving priority to key target inspection objects;

[0120] The principle of comprehensive coverage means that the inspection equipment shuffles the order of each target inspection object in the original inspection path and inspects them one by one according to the time difference and frequency difference of the abnormal conditions of each target inspection object;

[0121] The principle of giving priority to key target inspection objects means that according to the time difference and frequency difference of the abnormal conditions of each target inspection object, only the key target inspection objects in the original inspection path are shuffled and inspected one by one;

[0122] When U < S < T is obtained according to the historical target dataset, the priority skip selection of the original inspection path is preset.

[0123] In the present invention, through the Geographic Information System (GIS) technology, the position coordinates of all target inspection equipment and areas are obtained and a position coordinate database is established, and all target inspection equipment and areas within the range of U < S < T are marked according to the inspection interference level and inspection priority.

[0124] Obtain the abnormal duration of each target inspection equipment and area, including the start time, end time and total duration, analyze the distribution of the abnormal duration, and identify whether there are specific time periods or conditions that cause the increase in the abnormal duration, for example, perform correlation analysis on the abnormal duration with relevant data such as equipment maintenance records and operation logs.

[0125] Summarize the number of abnormalities of each target inspection equipment and area in a fixed time period / day / week / month in a day to obtain the abnormal frequency.

[0126] In the first alternative inspection path of the present invention, according to the abnormal duration and frequency, use a weighted algorithm to rank the priorities of all target inspection equipment and areas to ensure that the target inspection equipment and areas with serious abnormal conditions are inspected first; based on the original inspection path, plan the first alternative inspection path through the shortest path algorithm (such as Dijkstra algorithm) to ensure that all target inspection equipment and areas are covered while reducing the overall inspection distance and time.

[0127] According to S obtained from the real-time target dataset, the inspection equipment can automatically adjust the inspection order dynamically, and the staff can also interfere manually to dynamically adjust the inspection order.

[0128] In the second alternative inspection path of the present invention, if the target inspection equipment and areas with serious abnormal conditions are completely key inspection objects, then while ensuring that the target inspection equipment and areas with serious abnormal conditions are inspected first, consider the priority inspection of the remaining key inspection objects;

[0129] If the target inspection equipment and areas with serious abnormal conditions are completely non-key inspection objects, then give priority to inspecting the key inspection objects;

[0130] If the target inspection equipment and areas with serious abnormalities include key inspection objects and non-key inspection objects, ensure that the key inspection objects with serious abnormalities are inspected first while considering the priority inspection of the remaining key inspection objects;

[0131] A second alternative inspection route is replanned through the shortest path algorithm (such as the Dijkstra algorithm) to ensure that key inspection objects are covered while reducing the overall inspection distance and time.

[0132] In the present invention, two alternative inspection paths can also be used at the same time. The A / B group inspection equipment can perform inspections according to one of the alternative inspection paths respectively. The A / B group inspection equipment can synchronize information in real time and make full use of the time difference and frequency difference of abnormal situations. This not only ensures that the A / B group inspection equipment can accurately avoid obstacles, but also achieves efficient inspection of all target inspection objects and focused inspection of key inspection objects.

[0133] This embodiment also provides a patrol inspection device control system, including: a data acquisition module, which acquires a target data set through a sensor and feeds the acquired target data set back to a central processing system of the patrol inspection device for preprocessing;

[0134] Abnormal state assessment module: the central processing system extracts each target value and transmits it to the abnormal state assessment module for abnormal state assessment and outputs the result;

[0135] Execution module, the central processing system selects the adjustment path in real time according to the output results of the abnormal state evaluation module.

[0136] This embodiment also provides a computing device, including a memory and a processor; the memory is used to store computer executable instructions, and the processor is used to execute computer executable instructions to implement the path planning control method for substation inspection equipment as proposed in the above embodiment.

[0137] This embodiment also provides a storage medium on which a computer program is stored. When the program is executed by a processor, the path planning control method for the substation inspection equipment proposed in the above embodiment is implemented.

[0138] The storage medium proposed in this embodiment and the path planning control method for substation inspection equipment proposed in the above embodiment belong to the same inventive concept. The technical details not described in detail in this embodiment can be referred to the above embodiment, and this embodiment has the same beneficial effects as the above embodiment.

[0139] From the above description of the embodiments, those skilled in the art can clearly understand that the present invention can be implemented by means of software and necessary general-purpose hardware. Of course, it can also be implemented by hardware, but in many cases, the former is a better implementation. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as a floppy disk, read-only memory (ROM), random access memory (RAM), flash memory, hard disk, or optical disc of a computer, etc., including several instructions for causing a computer device (which can be a personal computer, server, or network device, etc.) to execute the methods of various embodiments of the present invention.

[0140] Embodiment 2

[0141] The following is an embodiment of the present invention, which provides a path planning control method for a substation inspection device. In order to verify the beneficial effects of the present invention, scientific demonstration is carried out through simulation experiments.

[0142] According to the historical target data set (environmental data, static obstacle data, and dynamic obstacle data) inside a certain substation, an inspection comprehensive area for simulation experiments is established. Through simulation experiments for evaluating the abnormal movement states of the inspection device for each test inspection object, the experiment selects multiple test inspection objects including switchgear, transformers, circuit breakers, distribution rooms, cable tunnels, underground passages, lightning rods, relays, current transformers, and voltage transformers. Among each test inspection object, various environmental parameters, various static obstacle parameters, and various dynamic obstacle parameters are simulated. Among them, in the same test inspection object, different dynamic obstacle parameters are simulated for multiple experiments and the corresponding comprehensive index data are recorded, as shown in the following table.

[0143]

[0144]

[0145]

[0146]

[0147] It can be seen from the data table that the first preset threshold T in the threshold range can be set to 1, and the second preset threshold can be set to 0.95;

[0148] When 0 < S < T, that is, 0 < S < 1, the movement of the inspection device is an abnormal situation; among them, the abnormal situation includes invalid interference, valid interference, and severe interference;

[0149] When 0 < S < T / 2, that is, 0 < S < 0.5, the inspection device is subject to ineffective interference and there is no need to adjust the path planning of the inspection device;

[0150] When T / 2 < S < U, that is, 0.5 < S < 0.95, the inspection device is subject to effective interference, and the path planning of the inspection device is adjusted;

[0151] When U < S < T, that is, 0.95 < S < 1, the inspection device is subject to severe interference, and the inspection device turns on the alarm in real time and retreats to a safe position according to the current path planning.

[0152] In the simulated comprehensive inspection area, by further extracting the occurrence duration and occurrence frequency when the movement of the inspection device is effectively interfered with among different test inspection objects, as shown in the following table.

[0153]

[0154]

[0155] It can be seen from the data that in the same target inspection object within a day, there are mainly two time periods when the movement of the inspection device is effectively interfered with. Since the maximum duration of a single anomaly is 60 minutes, this value is used as the obstacle avoidance standard, that is, within this time range, both Group A and Group B of the inspection devices try to avoid the relevant target inspection objects as much as possible;

[0156] Among them, since the management and maintenance team of the actual substation will determine the inspection priority of the daily target inspection objects according to the specific situation of the equipment, operation history, maintenance records, and risk assessment, when the inspection devices in Group A inspect along the first alternative inspection path according to the priority of the anomaly severity, the inspection devices in Group B can inspect in turn according to the inspection priority of the target inspection objects determined within the substation on the same day. When a key target inspection object to be inspected is within the range of effective interference with the movement of the inspection device, the inspection of the next key target inspection object is prioritized.

[0157] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present invention can be modified or equivalently replaced without departing from the spirit and scope of the technical solutions of the present invention, and they should all be covered within the scope of the claims of the present invention.

Claims

1. A path planning control method for substation inspection equipment, characterized in that: Including: Obtain the target data set of the target inspection object; Determine a comprehensive index for evaluating the abnormal movement state of the inspection device according to the target data set; Determine the threshold range of the comprehensive index, and evaluate the abnormal movement state of the inspection device according to the threshold range; Adjust the inspection path of the inspection device according to different abnormal situations in the abnormal state.

2. The path planning control method for a substation inspection device according to claim 1, characterized in that: The target data set includes environmental data, static obstacle data, and dynamic obstacle data; The target data set is divided into a historical target data set and a real-time target data set.

3. The path planning control method for a substation inspection device according to claim 2, characterized in that: Determining the comprehensive index for evaluating the abnormal movement state of the inspection device includes the following steps: Obtain each environmental parameter value in the historical environmental data, establish an environmental data evaluation model, and quantify the first comprehensive influence of the environmental parameters on the movement characteristics of the inspection device; Obtain each static obstacle parameter value in the historical static obstacle data, establish a static obstacle data evaluation model, and quantify the second comprehensive influence of the static obstacle parameters on the movement characteristics of the inspection device; Obtain each dynamic obstacle parameter value in the historical environmental data, establish a dynamic obstacle data evaluation model, and quantify the third comprehensive influence of the dynamic obstacle parameters on the movement characteristics of the inspection device; 汇总 the first comprehensive influence, the second comprehensive influence, and the third comprehensive influence, and perform unified comparison processing to obtain a comprehensive index for evaluating the abnormal movement state of the inspection device. (The Chinese character "汇总" here should be "Summarize" in English, but it seems there is a formatting issue in the original text where this part might be incomplete or incorrect. For the purpose of translation, we just follow the text as it is.) 4. The path planning control method for a substation inspection device according to claim 3, characterized in that: Determining the threshold range of the comprehensive index and evaluating the abnormal movement state of the inspection device according to the threshold range includes the following steps: Let the comprehensive index be S; Let the threshold range be defined by a first preset threshold T, a second preset threshold U, and zero limit V; When 0 < S < T, the movement of the inspection device is an abnormal situation; among them, the abnormal situation includes ineffective interference, effective interference, and severe interference; When 0 < S < T / 2, the inspection device is subject to ineffective interference, and there is no need to adjust the path planning of the inspection device; When T / 2 < S < U, the inspection device is subject to effective interference, and the path planning of the inspection device is adjusted; When U < S < T, the inspection device is subject to severe interference, and the inspection device turns on the alarm in real time and retreats to a safe position according to the current path planning.

5. The path planning control method for a substation inspection device according to claim 4, characterized in that: The quantified value S of the comprehensive index is further calculated after obtaining the quantified value I1 of the first comprehensive influence, the quantified value I2 of the second comprehensive influence, and the quantified value I3 of the third comprehensive influence; specifically as follows: The quantified value I1 of the first comprehensive influence is expressed as: Wherein, d represents the flatness of the ground; s represents the slope; f represents the friction coefficient; w represents the width of the channel; r represents the turning radius; represents an exponential decay function to truly simulate the impact of the inspection equipment when it is far away from the values ​​of various environmental parameters during movement; I1 represents the cumulative comprehensive impact value of the ground flatness d, slope s and friction coefficient f on the mobile characteristics of the inspection equipment within the range of the turning radius r and on the basis of different channel widths; The quantified value I2 of the second comprehensive influence is expressed as: in, represents the average value of column diameter; represents the average wall thickness; c max Indicates the maximum volume of the equipment box; represents an exponential decay function to truly simulate the impact of the inspection equipment when it moves away from static obstacles; I2 represents the maximum volume of the equipment box c max Within the range of and wall thickness The cumulative comprehensive impact value on the mobile characteristics of the inspection equipment; The quantified value I3 of the third comprehensive influence is expressed as: Where p represents the number of dynamic obstacles; q i Represents the position coordinates of the i-th dynamic obstacle; r i represents the moving speed of the ith dynamic obstacle; s i Indicates the moving direction of the i-th dynamic obstacle; m i Indicates the ratio of the behavior pattern of the i-th dynamic obstacle to the space occupied; Represents an exponential decay function to realistically simulate the impact on the inspection equipment as it moves away from dynamic obstacles. represents an exponential amplification function to amplify the influence of the behavior pattern of dynamic obstacles on the proportion of space occupied by the inspection equipment during movement; I3 represents the comprehensive influence value of the position coordinates, moving speed, moving direction and behavior pattern of each dynamic obstacle on the movement characteristics of the inspection equipment; The complete expression of the quantified value S of the comprehensive index is: Among them, D represents the normalization process of the influence of dynamic obstacles, expressed as: Among them, q i represents the position coordinates of the i-th dynamic obstacle; r i Represents the moving speed of the i-th dynamic obstacle.

6. The path planning control method of the substation inspection equipment according to claim 5, characterized in that: Adjusting the inspection path of the inspection equipment according to different abnormal conditions in the abnormal state includes the following steps: When S obtained according to the historical target data set is in T / 2 < S < U, after summarizing the position coordinates, abnormal duration, and abnormal frequency of each target inspection object when S is in T / 2 < S < U, two alternative inspection paths of the original inspection path are preset; among them, the first alternative inspection path follows the principle of comprehensive coverage of the target inspection object, and the second alternative inspection path follows the principle of prioritizing key target inspection objects; The principle of comprehensive coverage means that the inspection equipment shuffles the order of each target inspection object in the original inspection path and inspects them one by one according to the duration difference and frequency difference of the abnormal conditions of each target inspection object; The principle of prioritizing key target inspection objects means that according to the duration difference and frequency difference of the abnormal conditions of each target inspection object, only the key target inspection objects in the original inspection path are shuffled and inspected one by one; When S obtained according to the historical target data set is in 0 < S < T / 2, a priority skip selection of the original inspection path is preset.

7. The path planning control method of the substation inspection equipment according to claim 6, characterized in that: After obtaining the target data set of the target inspection object, it includes the following steps: Obtain environmental data, static obstacle data, and dynamic obstacle data; Clean the obtained environmental data, static obstacle data, and dynamic obstacle data, and剔除 invalid data and error data; Perform normalization processing on the cleaned environmental data, static obstacle data, and dynamic obstacle data.

8. A fast-response inspection equipment centralized control system using the method as claimed in any one of claims 1 to 7, characterized in that: Including, The data acquisition module collects the target data set through sensors and feeds the collected target data set back to the central processing system of the inspection equipment for preprocessing; The abnormal state evaluation module extracts each target value by the central processing system and transmits it to the abnormal state evaluation module for abnormal state evaluation and outputs the result; The execution module, the central processing system selects and adjusts the path in real time according to the output result of the abnormal state evaluation module.

9. A computing device comprising: Memory and processor; The memory is used to store computer-executable instructions, and the processor is used to execute the computer-executable instructions. When the computer-executable instructions are executed by the processor, the steps of the method described in any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium stores computer-executable instructions. When the computer-executable instructions are executed by a processor, the steps of the method described in any one of claims 1 to 7 are implemented.

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