Fault data analysis method and device, equipment and storage medium

Abstract

The invention discloses a fault data analysis method, device and equipment and a storage medium, and the method comprises the steps: obtaining a plurality of environment data sets before and after a specific fault, and judging whether the specific fault occurs for the first time or not; if yes, storing the plurality of environment data sets to a first position, and if not, storing the plurality of environment data sets to a second position; and copying the data stored in the position to a random access memory, and performing fault analysis by reading the data of the random access memory. According to the method, the fault occurrence reason can be comprehensively analyzed, an immediate writing mode is adopted, data storage failure is avoided, analysis is convenient, and the applicability is high.

Description

Technical Field

[0001] The present invention relates to the technical field of vehicle fault analysis, and in particular to a fault data analysis method, device, equipment and storage medium. Background Art

[0002] With the increase of electronic components in new energy vehicles, there are more and more types of faults that may occur in vehicles, and the occurrence of a fault may be affected by multiple factors. Under this premise, it becomes more difficult to locate the cause of the fault, and fault data is particularly important for fault cause analysis.

[0003] The prior art uses the 19 service in UDS to record the data at the time of the fault occurrence to troubleshoot the car fault. However, the disadvantage is that the 19 service can only record the data at the current time of the fault occurrence, without the data before and after the fault occurs. The maturity of the fault generally has a debounce time, and the data before and after the fault occurs are also very meaningful for reference. Only the current time data is not conducive to fault cause analysis.

[0004] Therefore, how to comprehensively analyze the cause of the failure is a technical problem that urgently needs to be solved. Summary of the invention

[0005] The main purpose of the present invention is to provide a fault data analysis method, device, equipment and storage medium, which can comprehensively analyze the cause of the fault, and adopt an immediate writing method to avoid data storage failure and make the analysis convenient and highly applicable.

[0006] In a first aspect, the present application provides a fault data analysis method, wherein the method comprises the steps of:

[0007] Acquire multiple environmental data groups before and after a specific fault occurs, and determine whether the specific fault occurs for the first time;

[0008] If yes, then store the plurality of environmental data sets to the first location, if no, then store the plurality of environmental data sets to the second location;

[0009] The data stored in the location is copied to a random access memory, and the fault analysis is performed by reading the data in the random access memory.

[0010] In combination with the above-mentioned first aspect, as an optional implementation method, when a specific fault occurs, the index number corresponding to the current fault is recorded, and multiple environmental arrays before and after the preset time of the index number and the environmental array at the current time are frozen to obtain multiple environmental data groups before and after the occurrence of the specific fault, wherein the specific faults include: ECU overvoltage fault, ECU undervoltage fault, hardware overcurrent fault, motor overspeed fault, bus voltage short circuit or open circuit fault, motor overtemperature fault and IGBT overtemperature fault.

[0011] In combination with the first aspect above, as an optional implementation, when it is determined that a specific fault occurs for the first time, it is cleared from the first position through a set diagnostic command;

[0012] When it is determined that the specific fault does not occur for the first time, the most recently occurring fault is overwritten and stored in the second location.

[0013] In combination with the first aspect above, as an optional implementation manner, when it is determined that the entire flash memory is full, the data at the first location is copied to the second location to optimize the flash memory.

[0014] In combination with the first aspect above, as an optional implementation method, an array of fault record times is set;

[0015] If the array of the number of detection fault records is 0, it is determined that the fault of the current category occurs for the first time;

[0016] If the array of the number of detection fault records is 1, it is determined that the current type of fault is not the first occurrence.

[0017] In combination with the first aspect above, as an optional implementation method, an array is defined in a random access memory, wherein the array includes an index number, a DTC code, and an environment array, wherein the environment array is updated cyclically with different cycles, and the environment array includes: temperature, voltage, bus voltage, duty cycle, and position.

[0018] In combination with the first aspect above, as an optional implementation manner, data is acquired from the first location and / or the second location according to different UDS protocols, and the acquired data is copied to a random access memory;

[0019] The data copied to the random access memory is read, automatically parsed into a set format and converted into a table for data analysis, wherein the set format includes: floating point type and int type.

[0020] In a second aspect, the present application provides a fault data analysis device, the device comprising:

[0021] A processing module, which is used to obtain multiple environmental data groups before and after a specific fault occurs, and determine whether the specific fault occurs for the first time;

[0022] a storage module, configured to store the plurality of environmental data sets to a first location if yes, and to store the plurality of environmental data sets to a second location if no;

[0023] The analysis module is used to copy the data stored in the location to a random access memory and perform fault analysis through the data read from the random access memory.

[0024] In a third aspect, the present application further provides an electronic device, comprising: a processor; a memory, wherein the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the processor, the method described in any one of the first aspects is implemented.

[0025] In a fourth aspect, the present application further provides a computer-readable storage medium storing computer program instructions, which, when executed by a computer, enables the computer to execute any of the methods described in the first aspect.

[0026] The present application provides a method, device, equipment and storage medium for analyzing fault data, wherein the method includes the steps of: obtaining multiple environmental data groups before and after a specific fault occurs, and determining whether the specific fault occurs for the first time; if so, storing the multiple environmental data groups in a first location, and if not, storing the multiple environmental data groups in a second designated location; copying the data stored in the location to a random access memory, and performing fault analysis by reading the data in the random access memory. The present application can comprehensively analyze the cause of the fault, and adopts an immediate write method to avoid data storage failure and is convenient for analysis and has strong applicability.

[0027] It is to be understood that the foregoing general description and the following detailed description are exemplary only and are not restrictive of the invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0029] Figure 1 A flow chart of a fault data analysis method provided in an embodiment of the present application;

[0030] Figure 2 A schematic diagram of a fault data analysis device provided in an embodiment of the present application;

[0031] Figure 3 A schematic diagram of an electronic device provided in an embodiment of the present application;

[0032] Figure 4 A schematic diagram of a computer-readable program medium provided in an embodiment of the present application. DETAILED DESCRIPTION

[0033] Here, exemplary embodiments will be described in detail, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are merely examples of devices and methods consistent with some aspects of the present invention as detailed in the appended claims.

[0034] Furthermore, the drawings are only schematic illustrations of the present disclosure and are not necessarily drawn to scale. Some of the blocks shown in the drawings are functional entities and do not necessarily correspond to physically or logically separate entities.

[0035] The embodiments of the present application are further described in detail below in conjunction with the accompanying drawings.

[0036] Reference Figure 1 , Figure 1 FIG. 1 is a flow chart of a fault data analysis method provided by the present invention. Figure 1 As shown, the method comprises the steps of:

[0037] Step S101: Acquire multiple environmental data sets before and after a specific fault occurs, and determine whether the specific fault occurs for the first time.

[0038] Specifically, an array is defined in a random access memory, the array includes an index number, a DTC code and an environment array, wherein the environment array is updated in different cycles, and the environment array includes: temperature, voltage, bus voltage, duty cycle and position.

[0039] When a specific fault occurs, the index number corresponding to the current fault is recorded, and multiple environment arrays before and after the preset time of the index number and the environment array at the current time are frozen to obtain multiple environmental data groups before and after the specific fault occurs, wherein the specific faults include: ECU overvoltage fault, ECU undervoltage fault, hardware overcurrent fault, motor overspeed fault, bus voltage short circuit or open circuit fault, motor overtemperature fault and IGBT overtemperature fault.

[0040] For ease of understanding, an example is given. The type and number of data to be recorded are determined according to the controller requirements. For example, 200 pieces of information such as temperature, 12V voltage, bus voltage, duty cycle, location information, etc. are recorded, with 150 groups recorded before the fault occurs, 1 group recorded when the fault occurs, and 49 groups recorded after the fault occurs.

[0041] The update cycle of each data can also be customized according to the update frequency. For example, if the voltage changes slowly, it can be updated every 500ms, and if the temperature changes quickly, it can be updated every 10ms.

[0042] Determine the DTCs (Diagnostic Trouble Codes) for which these fault data should be recorded. Only high priority faults are recorded.

[0043] Based on the established array, set the corresponding scheduling period according to the update frequency of each data.

[0044] When a specific DTC occurs, freeze the current index number, freeze the 150 data before the index number (i.e., the environment array at different times) and the current time data, and continue to update 49 data later, saving a total of 200 sets of data. It can be understood that when a specific fault occurs (specific faults include: ECU overvoltage fault, ECU undervoltage fault, hardware overcurrent fault, motor overspeed fault, bus voltage short circuit or open circuit fault, motor overtemperature fault and IGBT overtemperature fault), for example, there are 10 moments, and the motor overtemperature DTC code is detected at 7 o'clock, then collect the environment array of the first 6 moments, i.e., temperature, voltage, bus voltage, duty cycle and position, and collect the environment array of the last 3 moments, and the index code can be understood as the moment of 7 o'clock.

[0045] In one embodiment, an array of N data is defined in the Ram (random access memory), and the Ram address is fixed. It is updated in real time with a cycle of 5ms. The array includes the index number, DTC code, and environmental data to be recorded. When a fault occurs, the current index number is recorded, the N1 groups of data before the index number are retained, and the N2 groups of data are stored and then stopped updating, where N = N1 + N2, and the N groups of data are written into the flash. The data record can still be retained after power off.

[0046] Determining whether a specific fault occurs for the first time includes: setting an array of fault record times. If the array of fault record times is 0, it is determined that the fault of the current category occurs for the first time; if the array of fault record times is 1, it is determined that the fault of the current category does not occur for the first time.

[0047] For example, set up an array A that records the number of fault records. When a new ECU (no specific DTC has occurred or the clearing function has been executed), the initial value is A(0,0). After the first specific fault occurs, the array becomes (0,1). After the second specific fault occurs, the array becomes (1,2). After the third specific fault occurs, the array is still (1,2). When array A[0]=0, it is the first time that the fault occurs. When array A[0]=1, it is not the first time that the fault occurs.

[0048] Step S102: If yes, store the plurality of environmental data sets to a first location; if no, store the plurality of environmental data sets to a second location.

[0049] Specifically, since the environmental data when the first fault occurs is crucial for fault analysis, the first fault data can be stored in block 1 of the flash, and the latest fault data can be stored in block 2. It should be explained that the first position and the second position will change, but each block (position) will have its own identification code to determine whether you are BLOCKA or BLOCKB based on the previous identification code. In addition,

[0050] Specifically, the BLOCK size and number of fault data are set in the NVM module.

[0051] After receiving the fault data write flag from the application layer, if it is the first time to write fault data, the standard interface NvM_SetDataIndex of the nvm module of Autosar is called to switch area A as the block to be written, and store the current fault data through NvM_WriteBlock. If it is not the first time to write fault data, the standard interface NvM_SetDataIndex of the nvm module of Autosar is called to switch area B as the block to be written, and store the current fault data through NvM_WriteBlock.

[0052] In one embodiment, when it is determined that a specific fault occurs for the first time, it is cleared from the first position by a set diagnostic command;

[0053] When it is determined that a specific fault is not the first occurrence, the latest fault is overwritten and stored in the second position. It is understandable that the first fault data can only be cleared by sending a fixed diagnostic command from the host computer, otherwise it will be stored in the flash forever, and the latest data does not need to be manually updated. When a high-priority fault occurs in the current cycle, the previous data will be overwritten immediately. It should be emphasized that the first fault data will not be overwritten unless there are special circumstances, and all fault data can only be cleared by the set diagnostic command (clearing the first position and the second position at the same time).

[0054] In one embodiment, when it is determined that the entire flash memory is full, the data at the first location is copied to the second location to optimize the flash memory to improve the read and write speed and the flash life.

[0055] Step S103: copy the data stored in the location to a random access memory, and perform fault analysis by reading the data in the random access memory.

[0056] Specifically, acquiring data from the first location and / or the second location according to different UDS protocols, and copying the acquired data to a random access memory;

[0057] The data copied to the random access memory is read, automatically parsed into a set format and converted into a table for data analysis, wherein the set format includes: floating point type and int type.

[0058] For the convenience of understanding, a complete implementation example is added. When a specific DTC occurs, the current index number is frozen, and 150 groups of environmental data before the fault occurs, 1 group when the fault occurs, and 49 groups of environmental data after the fault occurs are recorded. b) The update cycle of each data can also be customized according to the update frequency. For example, if the voltage changes slowly, it can be updated every 500ms, and if the temperature changes quickly, it can be updated every 10ms.

[0059] After the data is frozen, the fault data write flag is set to 1 and passed to the bottom layer. After receiving the fault data write flag from the application layer, if it is the first time to write fault data, the standard interface NvM_SetDataIndex of the nvm module of Autosar is called to switch area A as the block that should be written at present, and the current fault data is stored through NvM_WriteBlock. If it is not the first time to write fault data, the standard interface NvM_SetDataIndex of the nvm module of Autosar is called to switch area B as the block that should be written at present, and the current fault data is stored through NvM_WriteBlock. The routine of the 31 service is used to control the reading of data in the A / B area. For example, send 31 01RIDA 00 to copy the first (area A) fault data in nvram to ram; send 31 01RIDA 01 to copy the latest (area B) fault data in nvram to ram. Send 31 01RIDB to clear the fault data in area A / B.

[0060] By sending the UDS protocol service 10 to switch the session, by sending the UDS protocol service 31 to copy the last / current fault data from NVRAM (non-volatile random access memory) to RAM (random access memory), by sending the UDS protocol service 31 to clear the fault data in the flash (executed when offline or after maintenance), by sending the UDS protocol service 23 to read the RAM data, after receiving the UDS response message, it will automatically parse it into the desired format and convert it into Excel for easy viewing.

[0061] It can be understood that the routine of service 31 is used to control the reading of data in area A / B, for example, 31 01RIDA 00 is sent to copy the first fault data in nvram (area A) to ram; 31 01RIDA 01 is sent to copy the latest fault data in nvram (area B) to ram. 31 01RIDB is sent to clear the fault data in area A / B.

[0062] By sending the 23 service of the UDS protocol, the RAM data is read and after receiving the UDS response message, it is automatically parsed into the desired format and converted into Excel.

[0063] This application updates the defined N groups of data through different cycles. When a specific DTC occurs, the corresponding N groups of data are latched and the fault data is written into the flag bit and transmitted to the bottom layer. After receiving the flag bit, the bottom layer writes the N groups of data into NVM through the NVM standard interface of Autosar. The immediate writing method is adopted to avoid data storage failure caused by the staff of the vehicle test directly plugging and unplugging the power supply.

[0064] Define the nvmblock as a dataset type to store two sets of data, one for the previous cycle and the other for the current cycle. This prevents the vehicle test staff from losing the first fault data when they need to power on and off to determine whether the fault has disappeared.

[0065] Reference Figure 2 , Figure 2 FIG. 1 is a schematic diagram of a fault data analysis device provided by the present invention, such as Figure 2 As shown, the device comprises:

[0066] Processing module 201: It is used to obtain multiple environmental data groups before and after a specific fault occurs, and determine whether the specific fault occurs for the first time.

[0067] The storage module 202 is configured to store the plurality of environment data sets to a first location if yes, and to store the plurality of environment data sets to a second location if no.

[0068] Analysis module 203: used for copying the data stored in the location to a random access memory, and performing fault analysis through the data read from the random access memory.

[0069] Furthermore, in a possible implementation manner, the processing module is also used to record the index number corresponding to the current fault when a specific fault occurs, and freeze multiple environment arrays before and after the preset time of the index number and the environment array at the current time, so as to obtain multiple environmental data groups before and after the occurrence of the specific fault, wherein the specific fault includes: ECU overvoltage fault, ECU undervoltage fault, hardware overcurrent fault, motor overspeed fault, bus voltage short circuit or open circuit fault, motor overtemperature fault and IGBT overtemperature fault.

[0070] Further, in a possible implementation manner, the storage module is further configured to clear the specific fault from the first position by a set diagnostic command when it is determined that the specific fault occurs for the first time;

[0071] When it is determined that the specific fault does not occur for the first time, the most recently occurring fault is overwritten and stored in the second location.

[0072] Furthermore, in a possible implementation manner, the storage module is further configured to copy the data at the first location to the second location to optimize the flash memory when it is determined that the entire flash memory is full.

[0073] Furthermore, in a possible implementation manner, the processing module is further used to set an array of fault record times;

[0074] If the array of the number of detection fault records is 0, it is determined that the fault of the current category occurs for the first time;

[0075] If the array of the number of detection fault records is 1, it is determined that the current type of fault is not the first occurrence.

[0076] Furthermore, in a possible implementation, the processing module is also used to define an array in a random access memory, wherein the array includes an index number, a DTC code, and an environment array, wherein the environment array is updated cyclically in different cycles, and the environment array includes: temperature, voltage, bus voltage, duty cycle, and position.

[0077] Further, in a possible implementation manner, the analysis module is further configured to obtain data from the first location and / or the second location according to different UDS protocols, and copy the obtained data to a random access memory;

[0078] The data copied to the random access memory is read, automatically parsed into a set format and converted into a table for data analysis, wherein the set format includes: floating point type and int type.

[0079] Refer to the following Figure 3 The electronic device 300 according to this embodiment of the present invention will be described. Figure 3 The electronic device 300 shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present invention.

[0080] like Figure 3 As shown, the electronic device 300 is in the form of a general computing device. The components of the electronic device 300 may include but are not limited to: at least one processing unit 310, at least one storage unit 320, and a bus 330 connecting different system components (including the storage unit 320 and the processing unit 310).

[0081] The storage unit stores program codes, which can be executed by the processing unit 310, so that the processing unit 310 executes the steps according to various exemplary embodiments of the present invention described in the above “Embodiment Method” section of this specification.

[0082] The storage unit 320 may include a readable medium in the form of a volatile storage unit, such as a random access memory unit (RAM) 321 and / or a cache memory unit 322 , and may further include a read-only memory unit (ROM) 323 .

[0083] The storage unit 320 may also include a program / utility 324 having a set (at least one) of program modules 325, such program modules 325 including but not limited to: an operating system, one or more application programs, other program modules, and program data, each of which or some combination may include an implementation of a network environment.

[0084] Bus 330 may represent one or more of several types of bus structures, including a memory unit bus or memory unit controller, a peripheral bus, an accelerated graphics port, a processing unit, or a local bus using any of a variety of bus architectures.

[0085] The electronic device 300 may also communicate with one or more external devices (e.g., keyboards, pointing devices, Bluetooth devices, etc.), may also communicate with one or more devices that enable a user to interact with the electronic device 300, and / or communicate with any device that enables the electronic device 300 to communicate with one or more other computing devices (e.g., routers, modems, etc.). Such communication may be performed via an input / output (I / O) interface 350. Furthermore, the electronic device 300 may also communicate with one or more networks (e.g., local area networks (LANs), wide area networks (WANs), and / or public networks, such as the Internet) via a network adapter 360. As shown, the network adapter 360 communicates with other modules of the electronic device 300 via a bus 330. It should be understood that, although not shown in the figure, other hardware and / or software modules may be used in conjunction with the electronic device 300, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems, etc.

[0086] Through the description of the above implementation, it is easy for those skilled in the art to understand that the example implementation described here can be implemented by software, or by software combined with necessary hardware. Therefore, the technical solution according to the implementation of the present disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (which can be a CD-ROM, a USB flash drive, a mobile hard disk, etc.) or on a network, including several instructions to enable a computing device (which can be a personal computer, a server, a terminal device, or a network device, etc.) to execute the method according to the implementation of the present disclosure.

[0087] According to the solution of the present disclosure, a computer-readable storage medium is also provided, on which a program product capable of implementing the above method of the present specification is stored. In some possible implementations, various aspects of the present invention can also be implemented in the form of a program product, which includes a program code, and when the program product is run on a terminal device, the program code is used to enable the terminal device to execute the steps according to various exemplary implementations of the present invention described in the above "Exemplary Method" section of the present specification.

[0088] refer to Figure 4 As shown, a program product 400 for implementing the above method according to an embodiment of the present invention is described, which can adopt a portable compact disk read-only memory (CD-ROM) and include program code, and can be run on a terminal device, such as a personal computer. However, the program product of the present invention is not limited thereto. In this document, a readable storage medium can be any tangible medium containing or storing a program, which can be used by or in combination with an instruction execution system, an apparatus or a device.

[0089] The program product may use any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination of the above. More specific examples (non-exhaustive list) of readable storage media include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0090] Computer readable signal media may include data signals propagated in baseband or as part of a carrier wave, in which readable program code is carried. Such propagated data signals may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the above. Readable signal media may also be any readable medium other than a readable storage medium, which may send, propagate, or transmit a program for use by or in conjunction with an instruction execution system, apparatus, or device.

[0091] The program code embodied on the readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wired, optical cable, RF, etc., or any suitable combination of the foregoing.

[0092] Program code for performing the operations of the present invention may be written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Java, C++, etc., and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user computing device, partially on the user device, as a separate software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server. In cases involving a remote computing device, the remote computing device may be connected to the user computing device through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computing device (e.g., through the Internet using an Internet service provider).

[0093] In addition, the above-mentioned figures are only schematic illustrations of the processes included in the method according to an exemplary embodiment of the present invention, and are not intended to be limiting. It is easy to understand that the processes shown in the above-mentioned figures do not indicate or limit the time sequence of these processes. In addition, it is also easy to understand that these processes can be performed synchronously or asynchronously, for example, in multiple modules.

[0094] The above description is only a specific implementation of the present application, so that those skilled in the art can understand or implement the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest range consistent with the principles and novel features applied for herein.

[0095] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems) and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the process in the flowchart. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

Claims

1. A fault data analysis method, characterized in that: include: Acquire multiple environmental data groups before and after a specific fault occurs, and determine whether the specific fault occurs for the first time; If yes, then store the plurality of environmental data sets to the first location, if no, then store the plurality of environmental data sets to the second location; The data stored in the location is copied to a random access memory, and the fault analysis is performed by reading the data in the random access memory.

2. The method according to claim 1, characterized in that The step of obtaining multiple sets of environmental data before and after a specific fault occurs includes: When a specific fault occurs, the index number corresponding to the current fault is recorded, and multiple environment arrays before and after the preset time of the index number and the environment array at the current time are frozen to obtain multiple environmental data groups before and after the specific fault occurs, wherein the specific faults include: ECU overvoltage fault, ECU undervoltage fault, hardware overcurrent fault, motor overspeed fault, bus voltage short circuit or open circuit fault, motor overtemperature fault and IGBT overtemperature fault.

3. The method according to claim 1, characterized in that: Also includes: When it is determined that a specific fault occurs for the first time, clearing it from the first position by a set diagnostic command; When it is determined that the specific fault does not occur for the first time, the most recently occurring fault is overwritten and stored in the second location.

4. The method according to claim 1, characterized in that: Also includes: When it is determined that the entire flash memory is full, the data at the first location is copied to the second location to optimize the flash memory.

5. The method according to claim 1, characterized in that: The determining whether the specific fault occurs for the first time includes: Set the array of fault record counts; If the array of the number of detection fault records is 0, it is determined that the specific fault occurs for the first time; If the array of the number of detection fault records is 1, it is determined that the specific fault is not the first occurrence.

6. The method according to claim 1, characterized in that Before obtaining a plurality of environmental data groups before and after a specific fault occurs, the method includes: An array is defined in a random access memory, the array including an index number, a DTC code and an environment array, wherein the environment array is updated in different cycles, and the environment array includes: temperature, voltage, bus voltage, duty cycle and position.

7. The method according to claim 1, characterized in that The step of copying the data stored at the location to a random access memory and performing fault analysis by reading the data from the random access memory comprises: Acquire data from the first location and / or the second location according to different UDS protocols, and copy the acquired data to a random access memory; The data copied to the random access memory is read, automatically parsed into a set format and converted into a table for data analysis, wherein the set format includes: floating point type and int type.

8. A fault data analysis device, characterized in that: include: A processing module, which is used to obtain multiple environmental data groups before and after a specific fault occurs, and determine whether the specific fault occurs for the first time; a storage module, configured to store the plurality of environmental data sets to a first location if yes, and to store the plurality of environmental data sets to a second location if no; The analysis module is used to copy the data stored in the location to a random access memory and perform fault analysis through the data read from the random access memory.

9. An electronic device, characterized in that: The electronic device comprises: processor; A memory having computer-readable instructions stored thereon, wherein when the computer-readable instructions are executed by the processor, the method according to any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium, characterized in that: The computer program instructions are stored therein, and when the computer program instructions are executed by a computer, the computer is caused to execute the method according to any one of claims 1 to 7.

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