A speaker testing method, a measuring device and a computer readable storage medium

Abstract

A technical solution adopted in the present application is: to provide a speaker testing method, a measuring device and a computer-readable storage medium. The speaker testing method includes: controlling the speaker to be tested to work in a first operating state, and obtaining a first resistance value of the voice coil of the speaker; controlling the speaker to be tested to work in a second operating state; wherein the operating state at least includes an operating voltage, and the voltage value of the first operating voltage corresponding to the first operating state is less than the voltage value of the second operating voltage corresponding to the second operating state; controlling the speaker to be tested to work in the first operating state again, and obtaining a second resistance value of the voice coil of the speaker; determining the operating temperature of the voice coil according to the first resistance value and the second resistance value. In the above manner, the operating temperature of the voice coil of the speaker can be accurately measured when it is working without using a third-party temperature measurement device or disassembling the speaker.

Description

Technical Field

[0001] The present application relates to the field of electronic circuits, and in particular to a speaker testing method, a measuring device, and a computer-readable storage medium. Background Art

[0002] When the speaker is being tested for performance, the voice coil will generate high temperature. Due to the slow heat dissipation of the rear sound cavity, the glue between the voice coil layers will fail due to excessive temperature, and the voice coil will burst, resulting in speaker noise. Therefore, it is necessary to test the temperature of the voice coil when the speaker is working, and timely detect and adjust the temperature when it is too high, so as to ensure the stability of the speaker's working performance.

[0003] The existing method for testing the operating temperature of the speaker voice coil is generally to test it through third-party testing equipment, or to disassemble the speaker for testing. However, the speaker is very small, and third-party testing equipment such as temperature sensors cannot be placed in the rear sound cavity of the speaker for testing. The test value of the disassembled speaker is inaccurate, and the existing testing method is not timely enough to test the operating temperature of the speaker. The test cannot be performed when the speaker has just finished working, and the accuracy of the test results cannot be guaranteed. Summary of the invention

[0004] To solve the above problem, the present application provides a speaker testing method, a measuring device and a computer-readable storage medium. Through the above method, the working temperature of the speaker's voice coil can be accurately measured when it is working.

[0005] A technical solution adopted in the present application is: to provide a speaker testing method, which includes: controlling the speaker to be tested to operate in a first operating state, and obtaining a first resistance value of the voice coil of the speaker; controlling the speaker to be tested to operate in a second operating state; wherein the operating state at least includes an operating voltage, and a voltage value of a first operating voltage corresponding to the first operating state is less than a voltage value of a second operating voltage corresponding to the second operating state; controlling the speaker to be tested to operate in the first operating state again, and obtaining a second resistance value of the voice coil of the speaker; determining the operating temperature of the voice coil according to the first resistance value and the second resistance value.

[0006] In one embodiment, the operating state further includes a frequency of an operating voltage, and the frequency of a first operating voltage corresponding to the first operating state increases from a first frequency to a second frequency; wherein the first frequency is less than the second frequency.

[0007] In one embodiment, obtaining a first resistance value of a voice coil of a speaker includes: obtaining a first test resistance value of the voice coil of the speaker multiple times during a process in which the frequency of a first operating voltage increases from a first frequency to a second frequency, the multiple first test resistance values ​​at least including a first initial resistance value corresponding to the first frequency; fitting the multiple first test resistance values ​​to obtain a first resistance test curve; and determining the first resistance value according to the first resistance test curve and the first initial resistance value.

[0008] In one embodiment, obtaining a second resistance value of a voice coil of a speaker includes: obtaining a second test resistance value of the voice coil of the speaker multiple times during a process in which the frequency of a first operating voltage increases from a first frequency to a second frequency, the multiple second test resistance values ​​at least including a second initial resistance value corresponding to the first frequency; fitting the multiple second test resistance values ​​to obtain a second resistance test curve; and determining the second resistance value according to the second resistance test curve and the second initial resistance value.

[0009] In one embodiment, the frequency of the second operating voltage corresponding to the second operating state decreases from the second frequency to the first frequency.

[0010] In one embodiment, the frequency of the first operating voltage increases from the first frequency to the second frequency in a logarithmic increase ratio, and the frequency of the second operating voltage decreases from the second frequency to the first frequency in a logarithmic decrease ratio.

[0011] In one embodiment, determining the operating temperature of the voice coil according to the first resistance value and the second resistance value includes: determining the operating temperature of the voice coil according to the first resistance value, the second resistance value, a resistance temperature coefficient of the voice coil, and an ambient temperature.

[0012] In one embodiment, the operating temperature of the voice coil is determined by the following formula:

[0013]

[0014] Wherein, T represents the operating temperature of the voice coil, R1 represents the first resistance value, R2 represents the second resistance value, α represents the resistance temperature coefficient of the voice coil, and To represents the ambient temperature.

[0015] The present application also provides a device for measuring the temperature of a speaker voice coil, the device comprising: a processing module configured to output a working voltage; an amplifying module connected to the processing module; an impedance measuring module connected to the amplifying module, the processing module and a speaker to be tested, the impedance measuring module configured to input the amplified working voltage output by the amplifying module to the speaker, and obtain the resistance value of the voice coil of the speaker; wherein the processing module is further configured to determine the working temperature of the voice coil using the speaker testing method as described above.

[0016] The present application also provides a computer-readable storage medium, in which program data is stored. When the program data is executed by a processor, it is used to implement the speaker testing method as described above.

[0017] A technical solution adopted in the present application is: to provide a speaker testing method, the speaker testing method comprising: controlling the speaker to be tested to work in a first operating state, and obtaining a first resistance value of the speaker's voice coil; controlling the speaker to be tested to work in a second operating state; wherein the operating state at least includes an operating voltage, and the voltage value of the first operating voltage corresponding to the first operating state is less than the voltage value of the second operating voltage corresponding to the second operating state; controlling the speaker to be tested to work in the first operating state again, and obtaining a second resistance value of the speaker's voice coil; determining the operating temperature of the voice coil according to the first resistance value and the second resistance value. In the above manner, the operating temperature of the speaker's voice coil can be accurately measured when it is working without using a third-party temperature measurement device or disassembling the speaker. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0019] in:

[0020] Figure 1 is a flowchart of a first embodiment of a speaker testing method provided by the present application;

[0021] Figure 2 is a flow chart of a second embodiment of a speaker testing method provided by the present application;

[0022] Figure 3 is a schematic diagram of a third embodiment of a speaker testing method provided by the present application;

[0023] Figure 4 is a flowchart of a fourth embodiment of a speaker testing method provided by the present application;

[0024] Figure 5 is a schematic diagram of a fourth embodiment of a speaker testing method provided by the present application;

[0025] Figure 6 It is a structural schematic diagram of an embodiment of a device for measuring the temperature of a loudspeaker voice coil provided by the present application;

[0026] Figure 7It is a structural schematic diagram of an embodiment of a computer-readable storage medium provided by the present application. DETAILED DESCRIPTION

[0027] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It will be appreciated that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some but not all structures related to the present application are shown in the drawings. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the art without making creative work are within the scope of protection of the present application.

[0028] The terms "first", "second", etc. in this application are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices.

[0029] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0030] Combine the following Figure 1-Figure 4 , give a detailed description of the speaker testing method.

[0031] See also Figure 1 , Figure 1 1 is a flow chart of a first embodiment of a method for testing a loudspeaker provided in the present application. The method comprises:

[0032] Step S11: controlling the speaker to be tested to operate in a first operating state, and obtaining a first resistance value of the voice coil of the speaker.

[0033] Among them, a speaker is a device that converts electrical signals into sound signals. It is an electroacoustic device that can be used on terminal devices such as mobile phones. The speaker converts electrical signals into sound signals through a voice coil.

[0034] The voice coil is usually wound with conductive materials such as copper wire, and the resistivity of metal materials such as copper will change with temperature. Specifically, as the temperature rises, the resistivity of the metal material will increase, resulting in an increase in the resistance of the voice coil; conversely, when the temperature decreases, the resistance of the voice coil will decrease. Therefore, the working temperature of the voice coil can be calculated through the relationship between resistance and temperature.

[0035] Specifically, the constant voltage method can be used to calculate the first resistance value of the speaker voice coil. A fixed voltage is applied to the speaker, and the current value passing through the voice coil is obtained. The resistance value of the voice coil is obtained according to Ohm's law, thereby obtaining the resistance value when the voice coil just starts working, that is, the first resistance value of the speaker voice coil.

[0036] Step S12: controlling the speaker to be tested to operate in a second operating state; wherein the operating state at least includes an operating voltage, and a voltage value of a first operating voltage corresponding to the first operating state is less than a voltage value of a second operating voltage corresponding to the second operating state.

[0037] Specifically, when the speaker is in a static or inactive state, its internal components (such as voice coils, magnets, etc.) may be in a certain physical or electrical state. Directly applying a high voltage may cause a current surge. Excessive current may cause the voice coil to overheat, thereby damaging the speaker. Therefore, when the speaker just starts to work in the first operating state, it is necessary to set a lower starting voltage to gradually activate the speaker to avoid instantaneous large current surges, thereby protecting the speaker. When the speaker begins to work normally, that is, when it works in the second operating state, a higher operating voltage is required to excite the speaker for a long time to put it into a normal working state, so as to facilitate testing of various performance indicators of the speaker.

[0038] Optionally, the operating state further includes a frequency of an operating voltage, and the frequency of a first operating voltage corresponding to the first operating state increases from a first frequency to a second frequency, wherein the first frequency is less than the second frequency. The frequency of a second operating voltage corresponding to the second operating state decreases from the second frequency to the first frequency.

[0039] Optionally, the frequency of the first operating voltage increases from the first frequency to the second frequency in a logarithmic increase ratio, and the frequency of the second operating voltage decreases from the second frequency to the first frequency in a logarithmic decrease ratio.

[0040] Specifically, the impedance of the voice coil includes not only the resistance part (DC resistance) but also the inductance part (inductive reactance). The inductive reactance changes with frequency. Therefore, the frequency of the working voltage will directly affect the impedance characteristics of the voice coil. The low frequency band is the more basic and stable part of the audio signal. The voice coil starts working in the low frequency band to ensure that its response is stable and predictable when the voice coil starts working, while the high-frequency signal is more susceptible to external electromagnetic interference and the internal parasitic effects of the voice coil, resulting in inaccurate measurement results. In addition, because the DC resistance of the voice coil does not change with frequency, it is more accurate to take the impedance value of the low frequency band (for example, at a frequency of 100Hz) as the resistance value of the voice coil when it starts working and just ends working. Increasing the frequency of the first working voltage from the first frequency to the second frequency, that is, starting the frequency of the working voltage of the voice coil from a low frequency and gradually increasing it to a high frequency, can gradually reveal the impedance characteristics of the voice coil at different frequencies, while reducing the influence of high-frequency interference on the initial measurement value.

[0041] See also Figure 2 , Figure 2 is a flow chart of step S11 in one embodiment. Step S11 may specifically include:

[0042] Step S111: acquiring first test resistance values ​​of the voice coil of the speaker multiple times during a process in which the frequency of the first working voltage increases from the first frequency to the second frequency, wherein the multiple first test resistance values ​​at least include a first initial resistance value corresponding to the first frequency.

[0043] Specifically, there are multiple octaves between the first frequency and the second frequency. A complete octave refers to a frequency range from a certain starting frequency to twice the frequency. Specifically, if one frequency is twice another frequency, then the two frequencies belong to the same octave. For example, when the frequency of a voltage increases from 100 Hz, then 100 Hz to 200 Hz is an octave. A plurality of equally spaced test points are set in each octave. In the process of the frequency of the first working voltage increasing from the first frequency to the second frequency, a plurality of first test resistance values ​​of the voice coil of the speaker are obtained through these test points. The first test resistance value corresponding to the first frequency is the first initial resistance value.

[0044] Step S112: fitting a plurality of first test resistance values ​​to obtain a first resistance test curve.

[0045] Specifically, for the obtained multiple first test resistance values, a smooth first resistance test curve needs to be generated by a fitting method, for example, a fitting method such as polynomial fitting, least squares method, etc., or a specific impedance module can be used for fitting.

[0046] See also Figure 3 , Figure 3It represents a first resistance test curve, wherein the horizontal axis represents the frequency of the first operating voltage, and the vertical axis represents the first test resistance at different frequencies.

[0047] Step S113: determining a first resistance value according to the first resistance test curve and the first initial resistance value.

[0048] The resistance value corresponding to the first frequency in the test curve of the first resistor is the resistance value of the voice coil just starting to work, that is, the first resistance value.

[0049] Step S13: controlling the speaker to be tested to operate in the first operating state again, and obtaining a second resistance value of the voice coil of the speaker.

[0050] Specifically, similar to when the voice coil of the speaker just starts working, the voice coil also needs to work in the first operating state when it stops working. A lower voltage value needs to be set so that the components inside the speaker gradually transition from the working state to the static state to avoid current shock or mechanical stress that may be caused by sudden power failure, thereby protecting the speaker from damage.

[0051] Specifically, the constant voltage method can be used to calculate the second resistance value of the speaker voice coil. A fixed voltage is applied to the speaker, and the current value passing through the voice coil is obtained. The resistance value of the voice coil is calculated according to Ohm's law, thereby obtaining the resistance value of the voice coil just after working, that is, the second resistance value of the speaker voice coil. The operating temperature of the speaker voice coil is determined based on the change in the first resistance value and the second resistance value.

[0052] See also Figure 4 , Figure 4 : is a flow chart of step S13 in one embodiment, and step S13 may specifically include:

[0053] Step S131: acquiring second test resistance values ​​of the voice coil of the speaker multiple times during a process in which the frequency of the first operating voltage increases from the first frequency to the second frequency, wherein the multiple second test resistance values ​​at least include a second initial resistance value corresponding to the first frequency.

[0054] Specifically, after the speaker has been in the second operating state for a period of time, the working state of the voice coil is stable. At this time, it is necessary to test the resistance value of the speaker just after working. The speaker needs to be put into the first operating state again, and multiple second test resistance values ​​are determined through multiple test points between the first frequency and the second frequency. At this time, the second test resistance value corresponding to the first frequency is the second initial resistance value.

[0055] Step S132: fitting a plurality of second test resistance values ​​to obtain a second resistance test curve.

[0056] Step S133: determining a second resistance value according to the second resistance test curve and the second initial resistance value.

[0057] The resistance value corresponding to the first frequency in the test curve of the second resistor is the resistance value of the voice coil just after it finishes working, that is, the second resistance value.

[0058] In one application scenario, software such as Soundcheck can be used to adjust the working voltage and generate resistance test curves. Soundcheck can generate test signals, including specific frequencies and voltage signals for impedance measurement. Soundcheck also has powerful data analysis and fitting functions. After measuring the impedance data, the software can process and analyze the data, select a suitable fitting method, and generate a smooth impedance curve. For example, when the voice coil of the speaker is working in the first operating state, Soundcheck is configured to output a fixed voltage and is set to perform a positive scan in a certain frequency range through an octave scanning method. When the voice coil of the speaker is working in the second operating state, Soundcheck is configured to output another fixed voltage and is set to perform a reverse scan in a certain frequency range through an octave scanning method.

[0059] Specifically, during the process of measuring the voice coil temperature of the speaker, Soundcheck will also generate a series of test sequences to test the speaker to ensure that the operating temperature of the speaker voice coil obtained from the test is more in line with the actual application scenario.

[0060] For specific test sequences, please refer to Figure 5 As shown, through Figure 5 The test sequence ensures the accuracy of the working temperature test of the speaker's voice coil.

[0061] Among them, Test Sequence 1, Hardware, Hardware Setup, this sequence focuses on the hardware preparation before testing, which involves checking whether all hardware components connected to the test system (such as the audio device under test, amplifier, connection cables, etc.) are correctly installed and in good condition. In addition, it also includes an assessment of the test environment, such as ensuring that the test environment is quiet and free of interference; Test Sequence 2, Calibration, in this sequence, includes adjusting parameters such as sensitivity, gain and phase of the test equipment to ensure the accuracy of the test results; Test Sequences 3, 4, and 5 are settings for the voltage before the voice coil works, the voltage during work, and the voltage just after the voice coil ends. Test Sequences 3 and 5 correspond to the voltage of the first operating state, and Test Sequence 4 corresponds to the voltage of the second operating state; Test Sequence 6, Acquisition 1, accepting data from Stimulation 1, in this sequence, the test system sends a known signal (Stimulation 1) to the speaker under test, usually a sine wave or swept frequency signal within a certain frequency range, and the test system then receives and records the response data of the speaker to this signal, which will be used for data analysis and processing in subsequent Test Sequences 7 and 8, such as filtering, smoothing, noise suppression, and other operations; Test Sequences 9 to 14 are similar to Test Sequences 6, 7, and 8, and will not be repeated here.

[0062] Step S14: determining the operating temperature of the voice coil according to the first resistance value and the second resistance value.

[0063] Specifically, when the speaker is working, the current flowing through the speaker will generate heat, causing the temperature of the speaker's voice coil to rise. Since the voice coil generally uses a metal conductor (such as copper or aluminum) as a raw material, the temperature increase will cause the resistance to increase. Based on the positive temperature coefficient relationship between resistance and temperature, the temperature of the voice coil when working can be determined.

[0064] Optionally, in one embodiment, the speaker testing method provided by the present application further includes: determining the operating temperature of the voice coil according to the first resistance value, the second resistance value, the resistance temperature coefficient of the voice coil and the ambient temperature:

[0065]

[0066] Wherein, T represents the operating temperature of the voice coil, R1 represents the first resistance value, R2 represents the second resistance value, α represents the resistance temperature coefficient of the voice coil, and To represents the ambient temperature.

[0067] Specifically, in addition to the resistance of the speaker voice coil, the operating temperature of the voice coil is also affected by many other factors, such as the ambient temperature of the environment in which the speaker is located, and the temperature coefficient of resistance of the voice coil material, which represents the percentage of resistance change for each degree increase in temperature of the voice coil.

[0068] In an application scenario, the voltage value of the first working voltage is set to 0.1V, the voltage value of the second working voltage is set to 2.83V, the first frequency is 100Hz, and the second frequency is 20KHz. When the speaker is working in the first operating state, the frequency of the first working voltage increases from 100Hz to 20KHz according to the R40 octave, and the resistance value corresponding to 100Hz in the first resistance test curve is used as the first resistance value R1; then the speaker enters the second operating state, and the frequency of the second working voltage decreases from 20KHz to 100Hz according to the R80 octave; finally, the speaker is put into the first operating state again, and the resistance value corresponding to 100Hz in the second resistance test curve is used as the second resistance value R2. The temperature of the speaker voice coil when working is accurately determined by the first resistance value R1, the second resistance value R2, the resistance temperature coefficient α of the voice coil material, and the ambient temperature.

[0069] Among them, the R40 octave division method is based on the basic principle of octave analysis. It provides more frequency points than the standard octave (such as one octave) to ensure that the frequency of the first operating voltage can obtain sufficient frequency distribution in the process of increasing from the first frequency to the second frequency, thereby achieving more refined frequency analysis, obtaining a more accurate first resistance test curve, and ensuring the accuracy of the first resistance value. The R80 octave is a more refined frequency division method than the R40 octave. The width of each frequency band is smaller. The R80 octave can more accurately capture the subtle differences of the speaker at different frequencies, making the test results more accurate and reliable.

[0070] A technical solution adopted in the present application is: to provide a speaker testing method, the speaker testing method comprising: controlling the speaker to be tested to work in a first operating state, and obtaining a first resistance value of the speaker's voice coil; controlling the speaker to be tested to work in a second operating state; wherein the operating state at least includes an operating voltage, and the voltage value of the first operating voltage corresponding to the first operating state is less than the voltage value of the second operating voltage corresponding to the second operating state; controlling the speaker to be tested to work in the first operating state again, and obtaining a second resistance value of the speaker's voice coil; determining the operating temperature of the voice coil according to the first resistance value and the second resistance value. In the above manner, the operating temperature of the speaker's voice coil can be accurately measured when it is working without using a third-party temperature measurement device or disassembling the speaker.

[0071] See also Figure 6 , Figure 6 1 is a schematic diagram of the structure of the first embodiment of the device for measuring the temperature of a loudspeaker voice coil provided in the present application. The device 100 for measuring the temperature of a loudspeaker voice coil comprises: a processing module 10 , an amplifying module 20 and an impedance measuring module 30 .

[0072] Among them, the processing module 10 is configured to output a working voltage; the amplifying module 20 is connected to the processing module 10; the impedance measuring module 30 is connected to the amplifying module 20, the processing module 10 and the speaker to be tested, and the impedance measuring module 30 is configured to input the amplified working voltage output by the amplifying module 20 into the speaker, and obtain the resistance value of the voice coil of the speaker.

[0073] In one embodiment, the processing module 10 is further configured to execute: increasing the frequency of the first operating voltage from a first frequency to a second frequency; wherein the first frequency is less than the second frequency.

[0074] In one embodiment, the processing module 10 is further configured to execute: reducing the frequency of the second operating voltage from the second frequency to the first frequency.

[0075] In one embodiment, the processing module 10 is also used to perform: obtaining the first test resistance value of the voice coil of the speaker multiple times during the process of the frequency of the first working voltage increasing from the first frequency to the second frequency, the multiple first test resistance values ​​at least including the first initial resistance value corresponding to the first frequency; fitting the multiple first test resistance values ​​to obtain a first resistance test curve; determining the first resistance value according to the first resistance test curve and the first initial resistance value.

[0076] In one embodiment, the processing module 10 is also used to perform: obtaining the second test resistance value of the voice coil of the speaker multiple times during the process of the frequency of the first working voltage increasing from the first frequency to the second frequency, the multiple second test resistance values ​​at least including the second initial resistance value corresponding to the first frequency; fitting the multiple second test resistance values ​​to obtain a second resistance test curve; determining the second resistance value according to the second resistance test curve and the second initial resistance value.

[0077] In one embodiment, the processing module 10 is further configured to execute: determining the working temperature of the voice coil according to the first resistance value and the second resistance value includes: determining the working temperature of the voice coil according to the first resistance value, the second resistance value, the resistance temperature coefficient of the voice coil and the ambient temperature.

[0078] See also Figure 7 , Figure 7 1 is a schematic diagram of a computer-readable storage medium according to an embodiment of the present application. The computer-readable storage medium 1000 stores program data 110. When the program data 110 is executed by a processor, it is used to implement the following speaker testing method:

[0079] Control the speaker to be tested to operate in a first operating state, and obtain a first resistance value of the voice coil of the speaker; control the speaker to be tested to operate in a second operating state; wherein the operating state at least includes an operating voltage, and a voltage value of a first operating voltage corresponding to the first operating state is less than a voltage value of a second operating voltage corresponding to the second operating state; control the speaker to be tested to operate in the first operating state again, and obtain a second resistance value of the voice coil of the speaker; determine the operating temperature of the voice coil according to the first resistance value and the second resistance value.

[0080] In one embodiment, when the program data 110 is executed by a processor, it is used to implement: increasing the frequency of the first working voltage from a first frequency to a second frequency; wherein the first frequency is less than the second frequency.

[0081] In one embodiment, when the program data 110 is executed by the processor, it is used to achieve: reducing the frequency of the second operating voltage from the second frequency to the first frequency.

[0082] In one embodiment, when the program data 110 is executed by the processor, it is used to achieve: obtaining the first test resistance value of the voice coil of the speaker multiple times during the process of the frequency of the first working voltage increasing from the first frequency to the second frequency, the multiple first test resistance values ​​at least including the first initial resistance value corresponding to the first frequency; fitting the multiple first test resistance values ​​to obtain a first resistance test curve; determining the first resistance value according to the first resistance test curve and the first initial resistance value.

[0083] In one embodiment, when the program data 110 is executed by the processor, it is used to achieve: obtaining the second test resistance value of the voice coil of the speaker multiple times during the process of the frequency of the first working voltage increasing from the first frequency to the second frequency, the multiple second test resistance values ​​at least including the second initial resistance value corresponding to the first frequency; fitting the multiple second test resistance values ​​to obtain a second resistance test curve; determining the second resistance value according to the second resistance test curve and the second initial resistance value.

[0084] In one embodiment, when the program data 110 is executed by the processor, it is used to implement: determining the working temperature of the voice coil according to the first resistance value and the second resistance value includes: determining the working temperature of the voice coil according to the first resistance value, the second resistance value, the resistance temperature coefficient of the voice coil and the ambient temperature.

[0085] In the several embodiments provided in this application, it should be understood that the disclosed methods and devices can be implemented in other ways. For example, the device implementation described above is only illustrative, for example, the division of the modules or units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed.

[0086] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0087] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0088] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A method for testing a loudspeaker, characterized in that: include: Controlling the speaker to be tested to operate in a first operating state, and obtaining a first resistance value of a voice coil of the speaker; Controlling the speaker to be tested to operate in a second operating state; wherein the operating state at least includes an operating voltage, and a voltage value of a first operating voltage corresponding to the first operating state is less than a voltage value of a second operating voltage corresponding to the second operating state; Controlling the speaker to be tested to operate in the first operating state again, and obtaining a second resistance value of the voice coil of the speaker; The operating temperature of the voice coil is determined according to the first resistance value and the second resistance value.

2. The speaker testing method according to claim 1, characterized in that: The operating state also includes a frequency of an operating voltage, and the frequency of the first operating voltage corresponding to the first operating state increases from a first frequency to a second frequency; wherein the first frequency is less than the second frequency.

3. The speaker testing method according to claim 2, characterized in that: The obtaining a first resistance value of the voice coil of the speaker includes: Acquire a first test resistance value of the voice coil of the speaker multiple times during a process in which the frequency of the first working voltage increases from the first frequency to the second frequency, wherein the multiple first test resistance values ​​at least include a first initial resistance value corresponding to the first frequency; Fitting the plurality of first test resistance values ​​to obtain a first resistance test curve; The first resistance value is determined according to the first resistance test curve and the first initial resistance value.

4. The speaker testing method according to claim 2, characterized in that: The obtaining a second resistance value of the voice coil of the speaker comprises: acquiring a second test resistance value of the voice coil of the speaker multiple times during a process in which the frequency of the first operating voltage increases from the first frequency to the second frequency, wherein the multiple second test resistance values ​​at least include a second initial resistance value corresponding to the first frequency; Fitting the plurality of second test resistance values ​​to obtain a second resistance test curve; The second resistance value is determined according to the second resistance test curve and the second initial resistance value.

5. The speaker testing method according to claim 2, characterized in that: The frequency of the second operating voltage corresponding to the second operating state decreases from the second frequency to the first frequency.

6. The speaker testing method according to claim 5, characterized in that: The frequency of the first operating voltage increases from the first frequency to the second frequency in a logarithmic increase ratio, and the frequency of the second operating voltage decreases from the second frequency to the first frequency in a logarithmic decrease ratio.

7. The speaker testing method according to claim 1, characterized in that: Determining the operating temperature of the voice coil according to the first resistance value and the second resistance value includes: The operating temperature of the voice coil is determined according to the first resistance value, the second resistance value, the resistance temperature coefficient of the voice coil, and the ambient temperature.

8. The speaker testing method according to claim 7, characterized in that: The operating temperature of the voice coil is determined by the following formula: Wherein, T represents the operating temperature of the voice coil, R1 represents the first resistance value, R2 represents the second resistance value, α represents the resistance temperature coefficient of the voice coil, and To represents the ambient temperature.

9. A device for measuring the temperature of a loudspeaker voice coil, characterized in that: The device for measuring the temperature of the loudspeaker voice coil comprises: A processing module is configured to output an operating voltage; an amplification module, connected to the processing module; an impedance measurement module, connected to the amplification module, the processing module and the speaker to be tested, the impedance measurement module being configured to input the amplified working voltage output by the amplification module into the speaker and obtain the resistance value of the voice coil of the speaker; Wherein, the processing module is further configured to determine the operating temperature of the voice coil by adopting the method according to any one of claims 1-8.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores program data, and when the program data is executed by a processor, it is used to implement the speaker testing method according to any one of claims 1-8.

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