Calibration method and device of data acquisition equipment

Abstract

The invention provides a calibration method and device for data acquisition equipment. The method comprises the following steps: acquiring a physical quantity to be measured and module information of each data acquisition module in data acquisition equipment, wherein the module information comprises chip information and channel information; determining the physical type of the physical quantity to be measured; and aiming at any data acquisition module, calibrating the data acquisition module according to the chip information, the channel information and the physical type. Therefore, the data acquisition equipment is calibrated according to the to-be-measured physical quantity and the module information of each data acquisition module in the data acquisition equipment, so that the problem that the data acquisition equipment cannot comprehensively consider the characteristics of various data types so that the calibration result is deviated can be solved; and the accuracy of the data acquired by the data acquisition equipment is influenced.

Description

Technical Field

[0001] The present application relates to the technical field of data acquisition, and in particular to a calibration method and device for data acquisition equipment. Background Art

[0002] With the rapid development of science and technology, data acquisition equipment is increasingly used in many fields such as environmental monitoring, industrial automation, and medical health. The demand for data acquisition equipment in these fields is also increasing. Especially in terms of data real-time performance, some users not only hope that the acquisition equipment can perform basic acquisition tasks, but also hope to achieve accurate and real-time data acquisition through remote data acquisition. Therefore, a method for calibrating data acquisition equipment is needed.

[0003] However, the calibration of existing data acquisition equipment is mainly carried out through traditional tools such as standard signal sources, calibration resistors, and calibration capacitors. Although this method has high accuracy, it is mainly suitable for single-type data calibration. When faced with complex scenarios that require the simultaneous collection of multiple types of data, the calibration results may be biased due to the inability to fully consider the characteristics of various data types, thereby affecting the accuracy of data collected by the data acquisition equipment. Summary of the invention

[0004] The purpose of the embodiments of the present application is to provide a calibration method and device for a data acquisition device to solve the technical problem that the data acquisition device cannot fully consider the characteristics of various data types, resulting in deviations in the calibration results, thereby affecting the accuracy of the data collected by the data acquisition device. The specific technical solution is as follows:

[0005] In a first aspect of an embodiment of the present application, a calibration method for a data acquisition device is first provided, the method comprising:

[0006] Acquire the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, wherein the module information includes chip information and channel information;

[0007] Determining the physical type of the physical quantity to be measured;

[0008] For any of the data acquisition modules, the data acquisition module is calibrated according to the chip information, the channel information and the physical type.

[0009] In an optional implementation, the calibrating the data acquisition module according to the chip information, the channel information and the physical type includes:

[0010] Acquire a channel type from the channel information;

[0011] If the channel type is a differential channel, extracting a first resolution from the chip information, and acquiring a first maximum range upper limit, a first maximum range lower limit, and a first gain value from the channel information;

[0012] Calibrate the data acquisition module according to the first gain value, the first resolution, the first maximum range upper limit, the first maximum range lower limit, and the physical type;

[0013] If the channel type is a single-ended channel, extracting a second resolution from the chip information, and obtaining a second maximum range upper limit and a second maximum range lower limit from the channel information;

[0014] The data acquisition module is calibrated according to the second resolution, the second maximum range upper limit, the second maximum range lower limit and the physical type.

[0015] In an optional implementation, calibrating the data acquisition module according to the first gain value, the first resolution, the first maximum range upper limit, the first maximum range lower limit, and the physical type includes:

[0016] The first maximum range upper limit, the first gain value, and the first resolution are input into a first differential slope formula to calculate a first differential slope. The first differential slope formula is:

[0017]

[0018] Among them, range0 + is the first maximum range upper limit, gain0 is the first gain value, N0 is the first resolution, and slope0 is the first differential slope;

[0019] The first maximum range lower limit and the first gain value are input into a first differential offset formula to calculate a first differential offset, where the first differential offset formula is:

[0020]

[0021] Among them, range0 - is the first maximum range lower limit, gain1 is the first gain value, and offset0 is the first differential offset;

[0022] The data acquisition module is calibrated according to the first differential slope, the first differential bias and the physical type.

[0023] In an optional implementation, calibrating the data acquisition module according to the second resolution, the second maximum range upper limit, the second maximum range lower limit and the physical type includes:

[0024] The second maximum range upper limit, the second maximum range lower limit and the second resolution are input into the first single-ended slope formula to calculate the first single-ended slope. The first single-ended slope formula is:

[0025]

[0026] Among them, range0′ + The second maximum range upper limit, range0′ - is the lower limit of the second maximum range, N0′ is the second resolution, and slope0′ is the first single-ended slope;

[0027] The second maximum range lower limit is input into the first single-ended offset formula to calculate the first single-ended offset, and the first single-ended offset formula is:

[0028] offset0′=range1′ _ ;

[0029] Among them, range1′ _ is the lower limit of the second maximum range, and offset0′ is the first single-ended offset;

[0030] The data acquisition module is calibrated according to the first single-ended slope, the first single-ended bias and the physical type.

[0031] In an optional implementation, calibrating the data acquisition module according to the first differential slope, the first differential bias and the physical type includes:

[0032] If the physical type is voltage, the first differential slope and the first differential offset are used as target parameters to calibrate the data acquisition module;

[0033] If the physical type is non-voltage, then according to the test board configuration, the bridge factor, gauge factor, bridge arm resistance value, shunt resistance value, and bridge excitation voltage are obtained;

[0034] Obtaining a second differential slope and a second differential bias according to the bridge factor, the gauge factor, the bridge arm resistance value, the shunt resistance value, and the bridge excitation voltage;

[0035] The data acquisition module is calibrated using the second differential slope and the second differential offset as target parameters.

[0036] In an optional implementation, obtaining the second differential slope and the second differential bias according to the bridge factor, the gauge factor, the bridge arm resistance value, the shunt resistance value, and the bridge excitation voltage includes:

[0037] The bridge arm resistance value, the shunt resistance value, the bridge factor and the gauge factor are input into a strain formula to calculate a strain value. The strain formula is:

[0038]

[0039] Wherein, GF is the gauge factor, BF is the bridge factor, R G is the bridge arm resistance value, R S is the shunt resistance value, ε0 is the strain value;

[0040] The strain value, the bridge excitation voltage and the gauge factor are input into a theoretical voltage formula to calculate the theoretical voltage. The theoretical voltage formula is:

[0041] V0=GF1*V S *ε;

[0042] Wherein, GF1 is the gauge factor, V S is the bridge excitation voltage, ε is the strain value, and V0 is the theoretical voltage;

[0043] The actual bridge voltage is acquired, and the second differential slope and the second differential offset are obtained according to the actual bridge voltage and the theoretical voltage.

[0044] In an optional implementation, obtaining the second differential slope and the second differential bias according to the actual bridge voltage and the theoretical voltage includes:

[0045] The actual voltage and the theoretical voltage are input into the calibration coefficient formula to calculate the calibration coefficient, and the calibration coefficient formula is:

[0046]

[0047] Wherein, V2 is the actual voltage, V1 is the theoretical voltage, and α0 is the calibration coefficient;

[0048] The first differential slope, the bridge excitation voltage, the bridge factor, the gauge factor and the calibration coefficient are input into a second differential slope formula to calculate a second differential slope. The second differential slope formula is:

[0049]

[0050] Wherein, slope1 is the first differential slope, V S0 is the bridge excitation voltage, GF2 is the gauge factor, BF2 is the bridge factor, α is the calibration coefficient, and slope2 is the second differential slope;

[0051] Acquire a first balance factor from the channel information;

[0052] The first maximum range lower limit, the first gain value, the bridge excitation voltage, the bridge factor, the first balance factor, the gauge factor and the calibration factor are input into a second differential bias formula to calculate a second differential bias. The second differential bias formula is:

[0053]

[0054] Among them, range1 - is the first maximum range lower limit, i0 is the first balance factor, gain1 is the first gain value; V S1 is the bridge excitation voltage, GF3 is the gauge factor, BF3 is the bridge factor, α1 is the calibration coefficient, and offset2 is the second differential bias.

[0055] In an optional embodiment, the method further comprises:

[0056] If the physical type is non-voltage, then according to the sensor configuration, obtain the sensor excitation voltage, the sensor maximum range, and the output voltage of the sensor at full scale;

[0057] The output voltage of the sensor at full scale and the sensor excitation voltage are input into the sensitivity formula to calculate the sensitivity. The sensitivity formula is:

[0058]

[0059] Among them, V M is the output voltage of the sensor at full scale, V N is the sensor excitation voltage, k0 is the sensitivity;

[0060] The first differential slope, the maximum range of the sensor, the sensor excitation voltage and the sensitivity are input into a third differential slope formula to calculate a third differential slope. The third differential slope formula is:

[0061]

[0062] Wherein, slope3 is the first differential slope, V S2is the sensor excitation voltage, k1 is the sensitivity, cap0 is the maximum range of the sensor, and slope4 is the third differential slope;

[0063] Acquire a second balance factor from the channel information;

[0064] The first maximum range lower limit, the second balance factor, the first gain value, the sensor excitation voltage, the sensor maximum range and the sensitivity are input into a third differential bias formula to calculate a third differential bias. The third differential bias formula is:

[0065]

[0066] Among them, range3 - is the first maximum range lower limit, i1 is the second balance factor, gain3 is the first gain value, V S3 is the sensor excitation voltage, k is the sensitivity, cap1 is the maximum range of the sensor, and offset3 is the third differential offset;

[0067] The data acquisition module is calibrated using the third differential slope and the third differential bias as target parameters.

[0068] In an optional implementation, calibrating the data acquisition module according to the first single-ended slope, the first single-ended bias and the physical type includes:

[0069] If the physical type is voltage, the first single-ended slope and the first single-ended offset are used as target parameters to calibrate the data acquisition module;

[0070] If the physical type is non-voltage, obtaining a first calibration point and a second calibration point;

[0071] The first calibration point, the second calibration point and the first single-ended slope are input into a second single-ended slope formula to calculate a second single-ended slope, where the second single-ended slope formula is:

[0072]

[0073] Wherein, (x1, y1) is the first calibration point, (x2, y2) is the second calibration point, slope1′ is the first single-ended slope, and slope2′ is the second single-ended slope;

[0074] The first calibration point, the second calibration point and the first single-ended bias are input into a second single-ended bias formula to calculate a second single-ended bias, where the second single-ended bias formula is:

[0075]

[0076] Among them, (x 11 ,y 11 ) is the first calibration point, (x 22 ,y 22 ) is the second calibration point, offset1′ is the first single-ended offset, and offset2′ is the second single-ended offset;

[0077] The data acquisition module is calibrated using the second single-ended slope and the second single-ended offset as target parameters.

[0078] In a second aspect of the embodiments of the present application, a calibration device for a data acquisition device is also provided, the device comprising:

[0079] An initial module, which obtains the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, wherein the module information includes chip information and channel information;

[0080] A processing module determines the physical type of the physical quantity to be measured;

[0081] The calibration module calibrates any of the data acquisition modules according to the chip information, the channel information and the physical type.

[0082] In a third aspect of the embodiments of the present application, there is further provided an electronic device, comprising a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus;

[0083] Memory, used to store computer programs;

[0084] The processor is used to implement the calibration method of the data acquisition device described in any one of the first aspects above when executing the program stored in the memory.

[0085] In a fourth aspect of the embodiments of the present application, a storage medium is further provided, wherein instructions are stored in the storage medium, and when the storage medium is run on a computer, the computer executes the calibration method for the data acquisition device described in any one of the first aspects above.

[0086] In a fifth aspect of the embodiments of the present application, a computer program product comprising instructions is also provided, which, when executed on a computer, enables the computer to execute the calibration method for a data acquisition device as described in any one of the first aspects above.

[0087] The above technical solution provided in the embodiment of the present application obtains the module information of the physical quantity to be measured and each data acquisition module in the data acquisition device, the module information includes chip information and channel information; determines the physical type of the physical quantity to be measured; for any data acquisition module, calibrates the data acquisition module according to the chip information, channel information and physical type. In this way, the data acquisition device is calibrated according to the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, which can solve the technical problem that the data acquisition device cannot fully consider the characteristics of various data types, resulting in deviations in the calibration results, thereby affecting the accuracy of the data collected by the data acquisition device. BRIEF DESCRIPTION OF THE DRAWINGS

[0088] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0089] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0090] Figure 1 A schematic diagram of an implementation flow of a calibration method for a data acquisition device provided in an embodiment of the present application;

[0091] Figure 2 A schematic diagram of an implementation flow of another calibration method for a data acquisition device provided in an embodiment of the present application;

[0092] Figure 3 A schematic diagram of an implementation flow of a calibration method based on a differential channel provided in an embodiment of the present application;

[0093] Figure 4 A schematic diagram of an implementation flow of another calibration method based on a differential channel provided in an embodiment of the present application;

[0094] Figure 5 A schematic diagram of an implementation flow of another calibration method based on a differential channel provided in an embodiment of the present application;

[0095] Figure 6 A schematic diagram of an implementation flow of another calibration method based on a differential channel provided in an embodiment of the present application;

[0096] Figure 7 A schematic diagram of an implementation flow of a sensor-based calibration method provided in an embodiment of the present application;

[0097] Figure 8A schematic diagram of an implementation flow of a calibration method based on a single-ended channel provided in an embodiment of the present application;

[0098] Fig. 9 Schematic diagram of another implementation flow of a calibration method based on a single-ended channel provided in an embodiment of the present application

[0099] Fig.10 A schematic diagram of the structure of a calibration device for a data acquisition device provided in an embodiment of the present application;

[0100] Fig.11 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0101] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0102] To facilitate understanding of the embodiments of the present application, further explanation will be given below with reference to specific embodiments in conjunction with the accompanying drawings. The embodiments do not constitute a limitation on the embodiments of the present application.

[0103] like Figure 1 FIG. 1 is a schematic diagram of an implementation flow of a calibration method for a data acquisition device provided in an embodiment of the present application. The method may specifically include the following steps:

[0104] S101, obtaining the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, where the module information includes chip information and channel information.

[0105] In the embodiments of the present application, the physical quantity to be measured refers to the type of data or data characteristics that the data acquisition device needs to collect and monitor. It may include temperature, pressure, humidity, current, voltage, displacement, speed, etc. The specific choice depends on the actual application scenario and monitoring requirements. For example, in the field of industrial automation, it may be necessary to monitor the temperature and pressure of the equipment; while in the field of environmental monitoring, humidity and air quality may be more concerned.

[0106] The data acquisition module is the core component of the data acquisition device, which is responsible for converting physical quantities into digital signals for subsequent processing and analysis. Among them, the module information can mainly include chip information and channel information. Chip information mainly refers to the type of chip used in the data acquisition module, such as ADC (analog-to-digital converter) chip. Each ADC chip usually has a unique code or identifier, that is, coding information, which is used to distinguish different chips and data sources during data acquisition and subsequent processing to ensure the accuracy and traceability of the data. Channel information refers to the channel type, channel number, configuration parameters, channel status, etc. corresponding to the signal collected by the data acquisition module. Among them, the channel type refers to the channel type corresponding to the signal collected by the data acquisition module, such as a single-ended channel, a differential input channel, etc. Different channel types may correspond to different physical quantities or signal types. The channel number is used to identify the uniqueness of each channel, which is convenient for reference and identification during data processing and analysis. Configuration parameters may include gain, sampling rate, etc., and the settings of these parameters will directly affect the accuracy and speed of data acquisition. The channel status may include enabled and disabled states to control the acquisition activities of each channel. This application example is not limited to this.

[0107] S102, determining the physical type of the physical quantity to be measured.

[0108] In the embodiments of the present application, the physical quantity to be measured refers to the type of data or data characteristics that the data acquisition device needs to collect and monitor. It may include temperature, pressure, humidity, current, voltage, displacement, speed, etc. The physical type may be a data type, which is not limited in the embodiments of the present application.

[0109] For example, if the physical quantity to be measured is voltage, the physical type is voltage; if the physical quantity to be measured is current, the physical type is current.

[0110] S103, for any data acquisition module, calibrate the data acquisition module according to the chip information, channel information and physical type.

[0111] In the embodiments of the present application, for any data acquisition module, a suitable calibration method is selected according to the type and characteristics of the physical quantity to be measured and the specific requirements of the data acquisition module. The calibration method may include comparison with a standard source, correction using an algorithm, etc., which is not limited in the embodiments of the present application.

[0112] For example, physical type 1 selects the first calibration method, and physical type 2 selects the second calibration method.

[0113] Through the above description of the technical solution provided in the embodiment of the present application, the module information of the physical quantity to be measured and each data acquisition module in the data acquisition device is obtained, and the module information includes chip information and channel information; the physical type of the physical quantity to be measured is determined; for any data acquisition module, the data acquisition module is calibrated according to the chip information, channel information and physical type. In this way, the data acquisition device is calibrated according to the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, which can solve the technical problem that the data acquisition device cannot fully consider the characteristics of various data types, resulting in deviations in the calibration results, thereby affecting the accuracy of the data collected by the data acquisition device.

[0114] like Figure 2 FIG. 1 is a schematic diagram of an implementation flow of another calibration method for a data acquisition device provided in an embodiment of the present application, which may specifically include the following contents:

[0115] S201, obtaining the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, where the module information includes chip information and channel information.

[0116] In the embodiment of the present application, this step is similar to the above-mentioned step S101, and the embodiment of the present application will not be described one by one here.

[0117] S202, determining the physical type of the physical quantity to be measured.

[0118] In the embodiment of the present application, this step is similar to the above-mentioned step S102, and the embodiment of the present application will not be described one by one here.

[0119] S203: For any data acquisition module, obtain the channel type from the channel information.

[0120] In the embodiment of the present application, the channel type is obtained from the channel information. The information collected by the data acquisition module can be obtained from the channel information, and the corresponding channel type can be obtained according to the information type, wherein the channel type can include a single-ended channel and a differential channel, which is not limited in the embodiment of the present application.

[0121] For example, information 1 collected by the collection module is obtained from the channel information, and the type of information 1 is single-ended information, so it can be obtained that the corresponding channel type is a single-ended channel.

[0122] S204: If the channel type is a differential channel, extract a first resolution from the chip information, and obtain a first maximum range upper limit, a first maximum range lower limit, and a first gain value from the channel information.

[0123] In an embodiment of the present application, when it is identified that the channel type corresponding to the data acquisition module is a differential channel, the first resolution is extracted from the chip information. The first resolution can be the number of bits of the chip. Generally, the more bits of the chip, the smaller the minimum signal change that the chip can distinguish, that is, the higher the resolution, the more accurate the measurement. The first maximum range upper limit and the first maximum range lower limit are obtained from the channel information, that is, the signal range that the differential channel can measure, wherein the first maximum range upper limit can be the positive maximum value of the differential signal, and the first maximum range lower limit can be the negative maximum value (or minimum negative value) of the differential signal. These two values ​​jointly define the effective measurement interval of the differential channel. The first gain value can be the degree to which the input signal is amplified. In the differential channel, the gain value can be used to adjust the amplitude of the signal to better match the measurement range of the chip or improve the sensitivity of the measurement, and the example of the present application is not limited to this.

[0124] For example, if the ADC chip used has a 16-bit encoding bit number, then the chip can distinguish 2^16 (i.e. 65536) different signal levels. Therefore, the first resolution is 16 bits. For the differential channel, assume that it is used to measure the differential signal within the range of ±10V. Then the positive maximum value of the differential signal (i.e. the upper limit of the first maximum range) is +10V, and the negative maximum value (or the absolute value of the lower limit of the first maximum range) is -10V. If the first gain value is 20dB, it means that the voltage of the output signal is 10 times the voltage of the input signal (20dB = 10 × log10 (Vout / Vin), and Vout / Vin = 10).

[0125] S205, calibrating the data acquisition module according to the first gain value, the first resolution, the first maximum range upper limit, the first maximum range lower limit and the physical type.

[0126] In an embodiment of the present application, the data acquisition module is calibrated according to the first gain value, the first resolution, the first maximum range upper limit, the first maximum range lower limit and the physical type, so that an accurate data acquisition device can be obtained.

[0127] For example, the first gain value is 20dB, the first resolution is 16 bits, the first maximum range upper limit is +10V, the first maximum range lower limit is -10V, and the physical type is voltage. The data acquisition module is calibrated according to the above data.

[0128] When the channel type is a differential channel, how to calibrate the data acquisition module according to the first gain value, the first resolution, the first maximum range upper limit, the first maximum range lower limit and the physical type can be specifically referred to as follows Figure 3 The method shown, such as Figure 3As shown, it is a schematic diagram of an implementation flow of a calibration method based on a differential channel provided in an embodiment of the present application, which may specifically include the following contents:

[0129] S301, input a first maximum range upper limit, a first gain value, and a first resolution into a first differential slope formula to calculate a first differential slope.

[0130] Furthermore, in the embodiment of the present application, the first differential slope can be calculated by the following first differential slope formula:

[0131]

[0132] Among them, range0 + is the first maximum range upper limit, gain0 is the first gain value, N0 is the first resolution, and slope0 is the first differential slope.

[0133] For example, the first maximum range upper limit range0 + is A, the first gain value gain0 is B, the first resolution N0 is C, and the first differential slope slope0 is calculated according to the first differential slope formula:

[0134] S302: Input the first maximum range lower limit and the first gain value into a first differential offset formula to calculate a first differential offset.

[0135] Further, in the embodiment of the present application, the first differential offset can be calculated by the following first differential offset formula:

[0136]

[0137] Among them, range0 - is the first maximum range lower limit, gain1 is the first gain value, and offset0 is the first differential offset.

[0138] For example, the first maximum range lower limit range0 - is A, the first gain value gain1 is B, and the first differential offset offset0 is calculated according to the first differential offset formula:

[0139] S303, calibrating the data acquisition module according to the first differential slope, the first differential bias and the physical type.

[0140] In the embodiment of the present application, the data acquisition module is calibrated according to the first differential slope, the first differential bias and the physical type. The first differential slope and the first differential bias can be processed according to the physical type.

[0141] For example, if the physical type is voltage, directly set the first differential slope and the first differential bias As the target parameter, the data module is calibrated.

[0142] As for how to calibrate the data acquisition module according to the first differential slope, the first differential bias and the physical type, please refer to the following Figure 4 As shown in the method. Figure 4 As shown, it is a schematic diagram of an implementation flow of another calibration method based on a differential channel provided in an embodiment of the present application, which may specifically include the following steps:

[0143] S401: If the physical type is voltage, the first differential slope and the first differential offset are used as target parameters to calibrate the data acquisition module.

[0144] In the embodiment of the present application, when the physical type is voltage, the first differential slope and the first differential bias can be used as target parameters for calibration, the target parameters are input into the host computer, and the host computer distributes the target parameters to the corresponding data acquisition module, the data acquisition module uses the target parameters as new calibration parameters to perform more accurate data acquisition, and ensure that the data acquisition module has higher accuracy and stability when measuring voltage. The host computer can be a variety of types of computers or single-chip microcomputer devices, and the host computer is used to send control commands to the data acquisition device to achieve precise control of the device, and can also monitor and adjust the working state of the data acquisition module in real time to ensure that it is always in the best performance state. This application example is not limited to this.

[0145] For example, when the physical type is voltage, the first differential slope is A, and the first differential bias is B. The first differential slope A and the first differential bias B are input into the host computer as target parameters. The host computer allocates the target parameters to the corresponding data acquisition module, thereby obtaining a linear relationship between the data acquisition data and the measured voltage of V (mV) = A*bits + B.

[0146] S402, if the physical type is non-voltage, obtain the bridge factor, gauge factor, bridge arm resistance value, shunt resistance value, and bridge excitation voltage according to the test board configuration.

[0147] In an embodiment of the present application, when the physical type is non-voltage, the bridge factor, gauge factor, bridge arm resistance value, shunt resistance value, and bridge excitation voltage are obtained according to the test board configuration. The above-mentioned bridge factor is to find and obtain the corresponding bridge factor value from a predefined configuration table according to the switch state of the test board, and the configuration table is as shown in Table 1. The above-mentioned gauge factor is used to describe the parameter of the sensor's sensitivity to strain response, which is pre-set according to the configuration of the test board and generally defaults to 2. The gauge factor can change according to the specific application scenario and sensor characteristics. The above-mentioned bridge arm resistance value is the resistance value of the bridge arm resistance in the Wheatstone bridge included in the test board configuration, for example, 1kΩ, 2kΩ, 3kΩ. The above-mentioned shunt resistance value is the resistance value of the resistor connected in parallel with the bridge arm resistance on the test board, which is used to provide the necessary shunting effect in the current measurement, so that the voltage passing through the bridge arm resistance can be measured, for example, 1kΩ, 2kΩ, 3kΩ. The above-mentioned bridge excitation voltage refers to the voltage value output to the test board for powering the external bridge. The bridge excitation voltage is usually determined based on the design requirements of the bridge circuit and the characteristics of the sensor.

[0148] Configuration Switch 1 Switch 2 Switch 3 Switch 4 Bridge Factor Full Bridge ON ON ON OFF 4 Half Bridge ON OFF OFF OFF 2 Quarter Bridge OFF OFF OFF ON 1

[0149] Table 1

[0150] S403, obtaining a second differential slope and a second differential bias according to the bridge factor, the gauge factor, the bridge arm resistance value, the shunt resistance value, and the bridge excitation voltage.

[0151] In the embodiment of the present application, the second differential slope and the second differential bias are obtained according to the bridge factor, the gauge factor, the bridge arm resistance value, the shunt resistance value, and the bridge excitation voltage, and then the data acquisition module is calibrated.

[0152] How to obtain the second differential slope and the second differential bias according to the bridge factor, gauge factor, bridge arm resistance value, shunt resistance value, and bridge excitation voltage can be specifically referred to as follows Figure 5 As shown in the method. Figure 5 As shown, it is a schematic diagram of an implementation flow of another calibration method based on a differential channel provided in an embodiment of the present application, which may specifically include the following steps:

[0153] S501, inputting the bridge arm resistance value, the shunt resistance value, the bridge factor and the strain coefficient into the strain formula to calculate the strain value.

[0154] Furthermore, in the embodiment of the present application, the strain value can be calculated by the following strain formula:

[0155]

[0156] Where GF is the gauge factor, BF is the bridge factor, R G is the bridge arm resistance value, RS is the shunt resistance value, and ε0 is the strain value.

[0157] S502, input the strain value, the bridge excitation voltage and the gauge factor into a theoretical voltage formula to calculate and obtain a theoretical voltage.

[0158] Furthermore, in the embodiment of the present application, the theoretical voltage can be calculated by the following theoretical voltage formula:

[0159] V0=GF1*V S *ε

[0160] Where GF1 is the gauge factor, V S is the bridge excitation voltage, ε is the strain value, and V0 is the theoretical voltage;

[0161] S503, obtaining the actual bridge voltage, and obtaining a second differential slope and a second differential offset according to the actual bridge voltage and the theoretical voltage.

[0162] In an embodiment of the present application, the actual bridge voltage is obtained, and the second differential slope and the second differential bias are obtained according to the actual bridge voltage and the theoretical voltage, wherein the actual bridge voltage is a bridge voltage value obtained by actually measuring the actual bridge voltage.

[0163] As for how to obtain the second differential slope and the second differential bias according to the actual bridge voltage and the theoretical voltage, please refer to the following for details. Figure 6 As shown in the method. Figure 6 As shown, it is a schematic diagram of an implementation flow of another calibration method based on a differential channel provided in an embodiment of the present application, which may specifically include the following steps:

[0164] S601, input the actual voltage and the theoretical voltage into the calibration coefficient formula to calculate the calibration coefficient.

[0165] Furthermore, in the embodiment of the present application, the calibration coefficient can be calculated by the following calibration coefficient formula.

[0166]

[0167] Among them, V2 is the actual voltage, V1 is the theoretical voltage, and α0 is the calibration coefficient.

[0168] S602, input the first differential slope, the bridge excitation voltage, the bridge factor, the gauge factor and the calibration coefficient into the second differential slope formula to calculate the second differential slope.

[0169] Further, in the embodiment of the present application, the second differential slope can be calculated by the following second differential slope formula:

[0170]

[0171] Where slope1 is the first differential slope, V S0 is the bridge excitation voltage, GF2 is the gauge factor, BF2 is the bridge factor, α is the calibration coefficient, and slope2 is the second differential slope.

[0172] S603: Obtain a first balance factor from the channel information.

[0173] In the embodiment of the present application, the first balance factor is preset according to the physical quantity to be measured.

[0174] S604, input the first maximum range lower limit, the first gain value, the bridge excitation voltage, the bridge factor, the first balance factor, the gauge factor and the calibration factor into a second differential offset formula to calculate a second differential offset.

[0175] Further, in the embodiment of the present application, the second differential offset can be calculated by the following second differential offset formula:

[0176]

[0177] Among them, range1 - is the first maximum range lower limit, i0 is the first balance factor, gain1 is the first gain value; V S1 is the bridge excitation voltage, GF3 is the gauge factor, BF3 is the bridge factor, α1 is the calibration coefficient, and offset2 is the second differential bias.

[0178] S404, using the second differential slope and the second differential offset as target parameters to calibrate the data acquisition module.

[0179] In the embodiment of the present application, the second differential slope and the second differential bias are used as target parameters for calibration, the target parameters are input into the host computer, and the host computer distributes the target parameters to the corresponding data acquisition module, the data acquisition module uses the target parameters as new calibration parameters to perform more accurate data acquisition, and ensure that the data acquisition module has higher accuracy and stability when measuring voltage. The host computer can be a variety of types of computers or single-chip microcomputer devices, and the host computer is used to send control commands to the data acquisition device to achieve precise control of the device, and can also monitor and adjust the working state of the data acquisition module in real time to ensure that it is always in the best performance state. This application example is not limited to this.

[0180] For example, when the physical type is temperature, the second differential slope is A, and the second differential bias is B. The second differential slope A and the second differential bias B are input into the host computer as target parameters. The host computer assigns the target parameters to the corresponding data acquisition module, thereby obtaining a linear relationship between the data acquisition data and the measured temperature.

[0181] In another optional embodiment, when the physical type is non-voltage, it is also possible to Figure 7 The method shown is used to calibrate the data acquisition module. Figure 7 FIG. 1 is a schematic diagram of an implementation flow of a sensor-based calibration method provided in an embodiment of the present application, which may specifically include the following steps:

[0182] S701, if the physical type is non-voltage, obtain the sensor excitation voltage, the sensor maximum range, and the output voltage of the sensor at full scale according to the sensor configuration.

[0183] In the embodiment of the present application, when the physical type is non-voltage, the sensor excitation voltage, the maximum range of the sensor, and the output voltage of the sensor at full scale are obtained by accessing the configuration information of the sensor. Among them, the sensor excitation voltage refers to the voltage applied to drive the sensor to work normally. The maximum range of the sensor refers to the maximum value of the physical quantity that the sensor can measure. The output voltage of the sensor at full scale refers to the voltage value output by the sensor when the physical quantity measured by the sensor reaches its maximum range, and the example of the present application does not limit this.

[0184] For example, according to the configuration information of the sensor, the sensor excitation voltage (5V), the maximum range of the sensor (100kPa), and the output voltage of the sensor at full scale (4.5V) are obtained.

[0185] S702, input the output voltage of the sensor at full scale and the sensor excitation voltage into a sensitivity formula to calculate the sensitivity.

[0186] Furthermore, in the embodiment of the present application, the sensitivity can be calculated by the following sensitivity formula:

[0187]

[0188] Among them, V M is the output voltage of the sensor at full scale, V N is the sensor excitation voltage, and k0 is the sensitivity.

[0189] S703, input the first differential slope, the maximum range of the sensor, the sensor excitation voltage and the sensitivity into a third differential slope formula to calculate and obtain a third differential slope.

[0190] Further, in the embodiment of the present application, the third differential slope can be calculated by the following third differential slope formula:

[0191]

[0192] Where slope3 is the first differential slope, V S2is the sensor excitation voltage, k1 is the sensitivity, cap0 is the maximum range of the sensor, and slope4 is the third differential slope.

[0193] S704: Obtain a second balance factor from the channel information.

[0194] In the embodiment of the present application, the first balance factor is preset according to the physical quantity to be measured.

[0195] S705, input the first maximum range lower limit, the second balance factor, the first gain value, the sensor excitation voltage, the sensor maximum range and sensitivity into a third differential offset formula to calculate a third differential offset.

[0196] Further, in the embodiment of the present application, the third differential bias can be calculated by the following third differential bias formula:

[0197]

[0198] Among them, range3 - is the lower limit of the first maximum range, i1 is the second balance factor, gain3 is the first gain value, V S3 is the sensor excitation voltage, k is the sensitivity, cap1 is the maximum range of the sensor, and offset3 is the third differential offset.

[0199] S706, using the third differential slope and the third differential offset as target parameters, to calibrate the data acquisition module.

[0200] In the embodiment of the present application, the third differential slope and the third differential bias are used as target parameters for calibration, the target parameters are input into the host computer, and the host computer distributes the target parameters to the corresponding data acquisition module, the data acquisition module uses the target parameters as new calibration parameters to perform more accurate data acquisition, and ensure that the data acquisition module has higher accuracy and stability when measuring voltage. The host computer can be a variety of types of computers or single-chip microcomputer devices, and the host computer is used to send control commands to the data acquisition device to achieve precise control of the device, and can also monitor and adjust the working state of the data acquisition module in real time to ensure that it is always in the best performance state. This application example is not limited to this.

[0201] For example, when the physical type is temperature, the third differential slope is A, and the third differential bias is B. The third differential slope A and the third differential bias B are input into the host computer as target parameters. The host computer allocates the target parameters to the corresponding data acquisition module, thereby obtaining a linear relationship between the data acquisition data and the measured temperature.

[0202] S206: If the channel type is a single-ended channel, extract the second resolution from the chip information, and obtain the second maximum range upper limit and the second maximum range lower limit from the channel information.

[0203] In an embodiment of the present application, when it is identified that the channel type corresponding to the data acquisition module is a single-ended channel, the second resolution is extracted from the chip information. The second resolution can be the number of bits of the chip. Generally, the more bits of the chip, the smaller the minimum signal change that the chip can distinguish, that is, the higher the resolution, the more accurate the measurement. The second maximum range upper limit and the second maximum range lower limit are obtained from the channel information, that is, the signal range that the single-ended channel can measure, wherein the first maximum range upper limit can be the positive maximum value of the single-ended signal, and the first maximum range lower limit can be the negative maximum value (or minimum negative value) of the single-ended signal. These two values ​​jointly define the effective measurement interval of the single-ended channel, and the present application example does not limit this.

[0204] For example, if the ADC chip used has a 16-bit encoding bit number, then the chip can distinguish 2^16 (i.e. 65536) different signal levels. Therefore, the second resolution is 16 bits. For a single-ended channel, assume that it is used to measure a single-ended signal within the range of ±10V. Then the positive maximum value of the single-ended signal (i.e. the upper limit of the first maximum range) is +10V, and the negative maximum value (or the absolute value of the lower limit of the first maximum range) is -10V.

[0205] S207, calibrating the data acquisition module according to the second resolution, the second maximum range upper limit, the second maximum range lower limit and the physical type.

[0206] In the embodiment of the present application, the second resolution, the second maximum range upper limit, the second maximum range lower limit and the physical type are used to calibrate the data acquisition module, thereby obtaining an accurate data acquisition device.

[0207] For example, the second resolution is 16 bits, the second maximum range upper limit is +10V, the second maximum range lower limit is -10V, and the physical type is voltage. The data acquisition module is calibrated according to the above data.

[0208] As for how to calibrate the data acquisition module according to the second resolution, the second maximum range upper limit, the second maximum range lower limit and the physical type, please refer to the following for details. Figure 8 As shown in the method. Figure 8 As shown, it is a schematic diagram of an implementation flow of a calibration method based on a single-ended channel provided in an embodiment of the present application, which may specifically include the following steps:

[0209] S801, inputting a second maximum range upper limit, a second maximum range lower limit, and a second resolution into a first single-ended slope formula to calculate a first single-ended slope.

[0210] Further, in the embodiment of the present application, the first single-ended slope can be calculated using the following first single-ended slope formula.

[0211]

[0212] Among them, range0′ + The second maximum range upper limit, range0′ - is the second maximum range lower limit, N0′ is the second resolution, and slope0′ is the first single-ended slope.

[0213] S802, input the second maximum range lower limit into the first single-ended offset formula to calculate and obtain the first single-ended offset.

[0214] Further, in the embodiment itself, the first single-ended bias can be calculated by the following first single-ended bias formula:

[0215] offset0′=range1′ -

[0216] Among them, range1′ - is the second maximum range lower limit, and offset0′ is the first single-ended offset.

[0217] S803, calibrating the data acquisition module according to the first single-ended slope, the first single-ended offset and the physical type.

[0218] In the embodiment of the present application, the data acquisition module is calibrated according to the first single-ended slope, the first single-ended bias and the physical type, so that an accurate data acquisition device can be obtained.

[0219] For example, the second resolution is 16 bits, the second maximum range upper limit is +10V, the second maximum range lower limit is -10V, and the physical type is voltage. The data acquisition module is calibrated according to the above data.

[0220] As for how to calibrate the data acquisition module according to the first single-ended slope, the first single-ended bias and the physical type, please refer to the following for details. Fig. 9 As shown in the method. Fig. 9 As shown, it is a schematic diagram of an implementation flow of another calibration method based on a single-ended channel provided in an embodiment of the present application, which may specifically include the following steps:

[0221] S901: If the physical type is voltage, the first single-ended slope and the first single-ended offset are used as target parameters to calibrate the data acquisition module.

[0222] In the embodiment of the present application, when the physical type is voltage, the first single-ended slope and the first single-ended bias can be used as target parameters for calibration, the target parameters are input into the host computer, and the host computer distributes the target parameters to the corresponding data acquisition module, the data acquisition module uses the target parameters as new calibration parameters to perform more accurate data acquisition, and ensure that the data acquisition module has higher accuracy and stability when measuring voltage. The host computer can be a variety of types of computers or single-chip microcomputer devices, and the host computer is used to send control commands to the data acquisition device to achieve precise control of the device, and can also monitor and adjust the working state of the data acquisition module in real time to ensure that it is always in the best performance state. This application example is not limited to this.

[0223] For example, when the physical type is voltage, the first single-ended slope is A, and the first single-ended bias is B. The first single-ended slope A and the first single-ended bias B are input into the host computer as target parameters. The host computer allocates the target parameters to the corresponding data acquisition module, thereby obtaining a linear relationship between the data acquisition data and the measured voltage of V (mV) = A*bits + B.

[0224] S902: If the physical type is non-voltage, obtain a first calibration point and a second calibration point.

[0225] In the embodiment of the present application, when the physical type is non-voltage, the first calibration point and the second calibration point are obtained, wherein the first calibration point and the second calibration point are the coordinate values ​​of two points set artificially according to the requirements, and the two end points of the calibration curve can be calibrated. For example, the coordinate value corresponding to the first calibration point is (x1, y1), and the coordinate value corresponding to the second calibration point is (x2, y2), wherein x1 represents the voltage value measured at the first calibration point, and y1 represents the value of the measured physical quantity corresponding to the first calibration point. x2 represents the voltage value measured at the second calibration point, and y2 represents the value of the measured physical quantity corresponding to the second calibration point, and the example of the present application is not limited to this.

[0226] For example, the first calibration point is (0V, 25°C), and the second calibration point is (5V, 100°C).

[0227] S903: Input the first calibration point, the second calibration point and the first single-ended slope into a second single-ended slope formula to calculate a second single-ended slope.

[0228] Further, in the embodiment of the present application, the second single-ended slope can be calculated by the following second single-ended slope formula:

[0229]

[0230] Wherein, (x1, y1) is the first calibration point, (x2, y2) is the second calibration point, slope1′ is the first single-ended slope, and slope2′ is the second single-ended slope.

[0231] S903: Input the first calibration point, the second calibration point and the first single-ended bias into a second single-ended bias formula to calculate a second single-ended bias.

[0232] Further, in the embodiment of the present application, the second single-ended bias can be calculated by the following second single-ended bias formula:

[0233]

[0234] Among them, (x 11 ,y 11 ) is the first calibration point, (x 22 ,y 22 ) is the second calibration point, offset1′ is the first single-ended offset, and offset2′ is the second single-ended offset.

[0235] S904, calibrating the data acquisition module by taking the second single-ended slope and the second single-ended offset as target parameters.

[0236] In the embodiment of the present application, the second single-ended slope and the second single-ended bias are used as target parameters for calibration, the target parameters are input into the host computer, and the host computer distributes the target parameters to the corresponding data acquisition module, the data acquisition module uses the target parameters as new calibration parameters to perform more accurate data acquisition, and ensure that the data acquisition module has higher accuracy and stability when measuring voltage. The host computer can be a variety of types of computers or single-chip microcomputer devices, and the host computer is used to send control commands to the data acquisition device to achieve precise control of the device, and can also monitor and adjust the working state of the data acquisition module in real time to ensure that it is always in the best performance state. This application example is not limited to this.

[0237] For example, when the physical type is temperature, the second single-ended slope is A, and the second single-ended bias is B. The second single-ended slope A and the second single-ended bias B are input into the host computer as target parameters. The host computer assigns the target parameters to the corresponding data acquisition module, thereby obtaining a linear relationship between the data acquisition data and the measured temperature.

[0238] Corresponding to the above method embodiment, the present application embodiment also provides a calibration device for a data acquisition device, such as Fig.10 As shown, the device may include an initial module 1001 , a processing module 1002 , and a calibration module 1003 .

[0239] Initial module 1001, obtaining the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, the module information including chip information and channel information;

[0240] Processing module 1002, determining the physical type of the physical quantity to be measured;

[0241] The calibration module 1003 calibrates any data acquisition module according to chip information, channel information and physical type.

[0242] The present application also provides an electronic device, such as Fig.11 As shown, it includes a processor 111, a communication interface 112, a memory 113 and a communication bus 114, wherein the processor 111, the communication interface 112, and the memory 113 communicate with each other through the communication bus 114.

[0243] Memory 113, used for storing computer programs;

[0244] In one embodiment of the present application, the processor 111, when used to execute the program stored in the memory 113, implements the following steps:

[0245] Obtain the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, the module information including chip information and channel information; determine the physical type of the physical quantity to be measured; for any data acquisition module, calibrate the data acquisition module according to the chip information, channel information and physical type.

[0246] The communication bus mentioned in the above electronic device can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The communication bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one thick line is used in the figure, but it does not mean that there is only one bus or one type of bus.

[0247] The communication interface is used for communication between the above electronic device and other devices.

[0248] The memory may include a random access memory (RAM) or a non-volatile memory, such as at least one disk memory. Optionally, the memory may also be at least one storage device located away from the aforementioned processor.

[0249] The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0250] In another embodiment provided in the present application, a storage medium is also provided, in which instructions are stored. When the storage medium is run on a computer, the computer executes the calibration method of the data acquisition device described in any of the above embodiments.

[0251] In another embodiment provided in the present application, a computer program product including instructions is also provided, which, when executed on a computer, enables the computer to execute the calibration method for a data acquisition device described in any one of the above embodiments.

[0252] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a storage medium, or transmitted from one storage medium to another storage medium, for example, the computer instructions may be transmitted from a website site, a computer, a server or a data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) mode to another website site, computer, server or data center. The storage medium may be any available medium that a computer can access or a data storage device such as a server or a data center that includes one or more available media integrations. The available medium may be a magnetic medium, (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive Solid State Disk (SSD)), etc.

[0253] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0254] Each embodiment in this specification is described in a related manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the system embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0255] The above description is only a preferred embodiment of the present application and is not intended to limit the protection scope of the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application are included in the protection scope of the present application.

Claims

1. A calibration method for a data acquisition device, characterized in that: The method comprises: Acquire the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, wherein the module information includes chip information and channel information; Determining the physical type of the physical quantity to be measured; For any of the data acquisition modules, the data acquisition module is calibrated according to the chip information, the channel information and the physical type.

2. The method according to claim 1, characterized in that The calibrating the data acquisition module according to the chip information, the channel information and the physical type includes: Acquire a channel type from the channel information; If the channel type is a differential channel, extracting a first resolution from the chip information, and acquiring a first maximum range upper limit, a first maximum range lower limit, and a first gain value from the channel information; Calibrate the data acquisition module according to the first gain value, the first resolution, the first maximum range upper limit, the first maximum range lower limit, and the physical type; If the channel type is a single-ended channel, extracting a second resolution from the chip information, and obtaining a second maximum range upper limit and a second maximum range lower limit from the channel information; The data acquisition module is calibrated according to the second resolution, the second maximum range upper limit, the second maximum range lower limit and the physical type.

3. The method according to claim 2, characterized in that The calibrating the data acquisition module according to the first gain value, the first resolution, the first maximum range upper limit, the first maximum range lower limit and the physical type includes: The first maximum range upper limit, the first gain value, and the first resolution are input into a first differential slope formula to calculate a first differential slope. The first differential slope formula is: Among them, range0 + is the first maximum range upper limit, gain0 is the first gain value, N0 is the first resolution, and slope0 is the first differential slope; The first maximum range lower limit and the first gain value are input into a first differential offset formula to calculate a first differential offset, where the first differential offset formula is: Among them, range0 - is the first maximum range lower limit, gain1 is the first gain value, and offset0 is the first differential offset; The data acquisition module is calibrated according to the first differential slope, the first differential bias and the physical type.

4. The method according to claim 2, characterized in that: The calibrating the data acquisition module according to the second resolution, the second maximum range upper limit, the second maximum range lower limit and the physical type includes: The second maximum range upper limit, the second maximum range lower limit and the second resolution are input into the first single-ended slope formula to calculate the first single-ended slope. The first single-ended slope formula is: Among them, range0′ + The second maximum range upper limit, range0′ - is the lower limit of the second maximum range, N0′ is the second resolution, and slope0′ is the first single-ended slope; The second maximum range lower limit is input into the first single-ended offset formula to calculate the first single-ended offset, and the first single-ended offset formula is: offset0′=range1′ - ; Among them, range1′ - is the lower limit of the second maximum range, and offset0′ is the first single-ended offset; The data acquisition module is calibrated according to the first single-ended slope, the first single-ended bias and the physical type.

5. The method according to claim 3, characterized in that: The step of calibrating the data acquisition module according to the first differential slope, the first differential bias and the physical type includes: If the physical type is voltage, the first differential slope and the first differential offset are used as target parameters to calibrate the data acquisition module; If the physical type is non-voltage, then according to the test board configuration, the bridge factor, gauge factor, bridge arm resistance value, shunt resistance value, and bridge excitation voltage are obtained; Obtaining a second differential slope and a second differential bias according to the bridge factor, the gauge factor, the bridge arm resistance value, the shunt resistance value, and the bridge excitation voltage; The data acquisition module is calibrated using the second differential slope and the second differential offset as target parameters.

6. The method according to claim 5, characterized in that The step of obtaining a second differential slope and a second differential bias according to the bridge factor, the gauge factor, the bridge arm resistance value, the shunt resistance value, and the bridge excitation voltage comprises: The bridge arm resistance value, the shunt resistance value, the bridge factor and the gauge factor are input into a strain formula to calculate a strain value. The strain formula is: Wherein, GF is the gauge factor, BF is the bridge factor, R G is the bridge arm resistance value, R S is the shunt resistance value, ε0 is the strain value; The strain value, the bridge excitation voltage and the gauge factor are input into a theoretical voltage formula to calculate the theoretical voltage. The theoretical voltage formula is: V0=GF1*V S *ε; Wherein, GF1 is the gauge factor, V S is the bridge excitation voltage, ε is the strain value, and V0 is the theoretical voltage; The actual bridge voltage is acquired, and the second differential slope and the second differential offset are obtained according to the actual bridge voltage and the theoretical voltage.

7. The method according to claim 6, characterized in that The step of obtaining the second differential slope and the second differential bias according to the actual bridge voltage and the theoretical voltage comprises: The actual voltage and the theoretical voltage are input into the calibration coefficient formula to calculate the calibration coefficient, and the calibration coefficient formula is: Wherein, V2 is the actual voltage, V1 is the theoretical voltage, and α0 is the calibration coefficient; The first differential slope, the bridge excitation voltage, the bridge factor, the gauge factor and the calibration coefficient are input into a second differential slope formula to calculate a second differential slope. The second differential slope formula is: Wherein, slope1 is the first differential slope, V S0 is the bridge excitation voltage, GF2 is the gauge factor, BF2 is the bridge factor, α is the calibration coefficient, and slope2 is the second differential slope; Acquire a first balance factor from the channel information; The first maximum range lower limit, the first gain value, the bridge excitation voltage, the bridge factor, the first balance factor, the gauge factor and the calibration factor are input into a second differential bias formula to calculate a second differential bias. The second differential bias formula is: Among them, range1 - is the first maximum range lower limit, i0 is the first balance factor, gain1 is the first gain value; V S1 is the bridge excitation voltage, GF3 is the gauge factor, BF3 is the bridge factor, α1 is the calibration coefficient, and offset2 is the second differential bias.

8. The method according to claim 5, characterized in that: The method further comprises: If the physical type is non-voltage, then according to the sensor configuration, obtain the sensor excitation voltage, the sensor maximum range, and the output voltage of the sensor at full scale; The output voltage of the sensor at full scale and the sensor excitation voltage are input into the sensitivity formula to calculate the sensitivity. The sensitivity formula is: Among them, V M is the output voltage of the sensor at full scale, V N is the sensor excitation voltage, k0 is the sensitivity; The first differential slope, the maximum range of the sensor, the sensor excitation voltage and the sensitivity are input into a third differential slope formula to calculate a third differential slope. The third differential slope formula is: Wherein, slope3 is the first differential slope, V S2 is the sensor excitation voltage, k1 is the sensitivity, cap0 is the maximum range of the sensor, and slope4 is the third differential slope; Acquire a second balance factor from the channel information; The first maximum range lower limit, the second balance factor, the first gain value, the sensor excitation voltage, the sensor maximum range and the sensitivity are input into a third differential bias formula to calculate a third differential bias. The third differential bias formula is: Among them, range3 - is the first maximum range lower limit, i1 is the second balance factor, gain3 is the first gain value, V S3 is the sensor excitation voltage, k is the sensitivity, cap1 is the maximum range of the sensor, and offset3 is the third differential offset; The data acquisition module is calibrated using the third differential slope and the third differential bias as target parameters.

9. The method according to claim 4, characterized in that The calibrating the data acquisition module according to the first single-ended slope, the first single-ended bias and the physical type includes: If the physical type is voltage, the first single-ended slope and the first single-ended offset are used as target parameters to calibrate the data acquisition module; If the physical type is non-voltage, obtaining a first calibration point and a second calibration point; The first calibration point, the second calibration point and the first single-ended slope are input into a second single-ended slope formula to calculate a second single-ended slope, where the second single-ended slope formula is: Wherein, (x1, y1) is the first calibration point, (x2, y2) is the second calibration point, slope1′ is the first single-ended slope, and slope2′ is the second single-ended slope; The first calibration point, the second calibration point and the first single-ended bias are input into a second single-ended bias formula to calculate a second single-ended bias, where the second single-ended bias formula is: Among them, (x 11 ,y 11 ) is the first calibration point, (x 22 ,y 22 ) is the second calibration point, offset1′ is the first single-ended offset, and offset2′ is the second single-ended offset; The data acquisition module is calibrated using the second single-ended slope and the second single-ended offset as target parameters.

10. A calibration device for a data acquisition device, characterized in that: The device comprises: An initial module, which obtains the physical quantity to be measured and the module information of each data acquisition module in the data acquisition device, wherein the module information includes chip information and channel information; A processing module determines the physical type of the physical quantity to be measured; The calibration module calibrates any of the data acquisition modules according to the chip information, the channel information and the physical type.

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