Measuring device and sorting device

By using electromagnetic wave irradiation technology with alternating high and low intensity in optical sorting machines, the problem of poor sorting accuracy and energy efficiency is solved, and more efficient identification and lower energy consumption are achieved.

CN119790298APending Publication Date: 2025-04-08SATAKE CORP
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Patent Information

Application Number
CN202380062292.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Priority Date
2022-09-01
Filing Date
2023-08-25
Publication Date
2025-04-08

AI Technical Summary

Technical Problem

The existing optical sorting machines have shortcomings in the selection accuracy, temperature increase, and power consumption, especially during long-term operation, resulting in reduced recognition accuracy and poor energy efficiency.

Method used

A measurement device is adopted, which includes an electromagnetic wave irradiation source, a sensor, an identification unit and an irradiation control unit. By controlling the intensity and irradiation time of the electromagnetic wave irradiation source, alternately irradiating electromagnetic waves with the first and second intensity is achieved, thereby reducing heat generation and power consumption, while improving identification accuracy.

Benefits of technology

The device reduces the heating and power consumption of electromagnetic wave irradiation sources through alternating high and low intensity irradiation, while improving the accuracy of identifying the state of the object, solving the shortcomings of traditional equipment in terms of accuracy and energy efficiency.

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Abstract

A measurement device for measuring the state of an object is provided with: a transfer unit configured to transfer the object; an electromagnetic wave irradiation source configured to irradiate an electromagnetic wave to the object being transferred by the action of the transfer unit; a sensor configured to detect at least one of a reflected electromagnetic wave irradiated from the electromagnetic wave irradiation source and reflected by the object and a transmitted electromagnetic wave transmitted through the object; a recognition unit configured to recognize a state of the object based on the signal acquired by the sensor; and an irradiation control unit configured to control irradiation of the electromagnetic waves from the electromagnetic wave irradiation source. The irradiation control unit is configured to control the electromagnetic wave irradiation source such that a first irradiation period in which the electromagnetic wave is irradiated at a first intensity and a second irradiation period in which the electromagnetic wave is irradiated at a second intensity greater than the first intensity occur.
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Description

Technical Field

[0001] The present disclosure relates to optical measurement technology. Background Art

[0002] In the past, there is a known optical sorting machine (hereinafter also referred to as a sorting machine) that uses light information obtained by an optical sensor when light is irradiated from a light source to a sorting object to identify and remove foreign matter and defective products contained in the sorting object (for example, Japanese Patent Laid-Open No. 2010-42326). In this sorting machine, the light information (for example, color grayscale value) obtained by the optical sensor is compared with a threshold value, and the state of the sorting object (whether it is a qualified product or a foreign matter or a defective product) is identified based on the comparison result.

[0003] In such a sorting machine, there is a demand for improving sorting accuracy and reducing temperature rise and power consumption caused by heat generation of the light source. In addition, this is not limited to the sorting machine, but is also common in a measuring device for measuring the state of an object. Summary of the invention

[0004] The present disclosure has been made to solve at least a part of the above-mentioned problems, and can be achieved, for example, in the following aspects.

[0005] According to a first embodiment of the present disclosure, a measuring device for measuring the state of an object is provided. The measuring device comprises: a transfer unit configured to transfer an object; an electromagnetic wave irradiation source configured to irradiate electromagnetic waves to an object being transferred by the action of the transfer unit; a sensor configured to detect at least one of a reflected electromagnetic wave irradiated from the electromagnetic wave irradiation source and reflected by the object, and a transmitted electromagnetic wave that passes through the object; an identification unit configured to identify the state of the object based on a signal obtained by the sensor; and an irradiation control unit configured to control the irradiation of electromagnetic waves from the electromagnetic wave irradiation source. The irradiation control unit is configured to control the electromagnetic wave irradiation source so that a first irradiation period in which electromagnetic waves are irradiated at a first intensity and a second irradiation period in which electromagnetic waves are irradiated at a second intensity greater than the first intensity occur.

[0006] “Objects being transferred by the action of the transfer unit” include, for example, objects being transferred on the transfer unit and objects being dropped from the transfer unit. The irradiation control unit may also control the electromagnetic wave irradiation source so that, in addition to the first irradiation period and the second irradiation period, there are also irradiation periods in which electromagnetic waves are irradiated with intensities other than the first intensity and the second intensity, and / or non-irradiation periods in which electromagnetic waves are not irradiated. In addition, the electromagnetic wave irradiation source may also irradiate at least one of visible light, near-infrared light, and X-rays. In the case where the electromagnetic wave irradiation source irradiates electromagnetic waves in multiple wavelength regions, the irradiation control unit may also control the electromagnetic wave irradiation source so that the first irradiation period and the second irradiation period appear in at least a part of the multiple wavelength regions. The so-called “intensity” may be, for example, luminosity when the “electromagnetic wave” is light, and may be X-ray intensity when the “electromagnetic wave” is X-ray.

[0007] According to the measuring device, there is a first irradiation period for irradiating electromagnetic waves with a first intensity, and a second irradiation period for irradiating electromagnetic waves with a second intensity greater than the first intensity. Therefore, compared with a structure in which the electromagnetic wave irradiation source always irradiates electromagnetic waves to the object with the second intensity, the temperature rise and power consumption caused by the heat of the electromagnetic wave irradiation source can be reduced. In addition, compared with a structure in which the electromagnetic wave irradiation source does not irradiate electromagnetic waves except for the second irradiation period in which the electromagnetic wave is irradiated with the second intensity (hereinafter referred to as a comparative example), the recognition accuracy of the state of the object recognized by the recognition unit can be improved. Specifically, in the comparative example, for the part of the object that passes through the detection area of ​​the sensor during the period in which the electromagnetic wave is not irradiated, the information for identifying the state of the object (at least one of the reflected electromagnetic wave and the transmitted electromagnetic wave) is not obtained. On the other hand, according to the above-mentioned measuring device, by replacing at least a part of the non-irradiation period in the comparative example with the first irradiation period, the information for identifying the state of the object can be obtained even during the first irradiation period. That is, compared with the comparative example, the information for identifying the state of the object can be obtained in a larger range of parts in the object. Therefore, compared with the comparative example, the detection capability of detecting small defects is improved, and as a result, the recognition accuracy can be improved. As apparent from the above description, according to this measuring device, it is possible to achieve both reduction in temperature rise and power consumption due to heat generation of the electromagnetic wave irradiation source and improvement in recognition accuracy.

[0008] According to a second mode of the present disclosure, based on the first mode, the irradiation control unit is configured to control the electromagnetic wave irradiation source so that, during each scanning period of the sensor, the first irradiation period and the second irradiation period occur, or the first irradiation period occurs but the second irradiation period does not occur. According to this mode, the second irradiation period does not last for a long time. Therefore, the temperature rise caused by the heat generated by the electromagnetic wave irradiation source can be reduced more efficiently.

[0009] According to a third embodiment of the present disclosure, on the basis of the first or second embodiment, the irradiation control unit is configured to control the electromagnetic wave irradiation source so that there is no non-irradiation period during which the electromagnetic wave irradiation source does not irradiate electromagnetic waves. In other words, there is no non-irradiation period between the first irradiation period and the second irradiation period. In other words, the electromagnetic wave irradiation source always irradiates electromagnetic waves. According to this embodiment, information for identifying the state of the object can be obtained at all times. Therefore, minor defects can be detected more reliably, and the recognition accuracy of the recognition unit can be further improved.

[0010] According to a fourth aspect of the present disclosure, on the basis of any one of the first to third aspects, the electromagnetic wave irradiation source includes a first irradiation source and a second irradiation source that are different in at least one of the wavelength region of the irradiated electromagnetic wave and the setting position. The second irradiation period includes: a third irradiation period in which the first irradiation source irradiates the electromagnetic wave with the second intensity, and a fourth irradiation period in which the second irradiation source irradiates the electromagnetic wave with the second intensity. The irradiation control unit is configured to control the electromagnetic wave irradiation source so that the third irradiation period and the fourth irradiation period do not overlap and appear alternately.

[0011] In the present specification, the third irradiation period and the fourth irradiation period "alternatingly" appearing refers to the appearance of the third irradiation period and the fourth irradiation period with at least a partial focus on the third irradiation period and the fourth irradiation period. Therefore, other irradiation periods may be sandwiched between the third irradiation period and the fourth irradiation period. For example, an irradiation period in which electromagnetic waves are irradiated with a third intensity greater than the first intensity and less than the second intensity may be sandwiched between the third irradiation period and the fourth irradiation period. Alternatively, a first irradiation period and a non-irradiation period may be sandwiched between the third irradiation period and the fourth irradiation period. Alternatively, an irradiation period in which the first irradiation source irradiates electromagnetic waves with the second intensity and the second irradiation source irradiates electromagnetic waves with the second intensity may be between the third irradiation period and the fourth irradiation period. The second intensity of the first irradiation source and the second intensity of the second irradiation source may be the same or different.

[0012] According to the fourth method, for each electromagnetic wave irradiated from the first irradiation source and the second irradiation source having at least one different wavelength region and setting position, at least one of the reflected electromagnetic wave and the transmitted electromagnetic wave can be detected. Therefore, the types of states that can be identified by the identification unit can be increased. In addition, since the third irradiation period does not overlap with the fourth irradiation period, the electromagnetic waves of the second intensity irradiated from the first irradiation source and the second irradiation source, respectively, do not interfere with each other during these irradiation periods. In addition, since the third irradiation period and the fourth irradiation period appear alternately, at least one of the reflected electromagnetic wave and the transmitted electromagnetic wave can be obtained with sufficient resolution during any period of the third irradiation period and the fourth irradiation period. Therefore, the recognition accuracy of the state of the object can be well ensured.

[0013] According to the fifth mode of the present disclosure, on the basis of the fourth mode, the irradiation control unit is configured to control the electromagnetic wave irradiation source so that the period during which the first irradiation source irradiates electromagnetic waves with the first intensity and the second irradiation source irradiates electromagnetic waves with the first intensity is between the third irradiation period and the fourth irradiation period. The first intensity of the first irradiation source and the first intensity of the second irradiation source may be the same or different. According to this mode, it is possible to easily suppress the electromagnetic waves from being detected by the sensor in a state where the electromagnetic waves irradiated from the first irradiation source with the second intensity interfere with the electromagnetic waves irradiated from the second irradiation source with the second intensity. Therefore, it is possible to detect more accurate reflected electromagnetic waves and / or transmitted electromagnetic waves, thereby improving the recognition accuracy of the state of the object.

[0014] According to the sixth mode of the present disclosure, on the basis of the fourth or fifth mode, the first irradiation source is arranged on the first side relative to the transfer path of the object, and the second irradiation source is arranged on the second side opposite to the first side. The sensor includes: a first sensor arranged on the first side, and a second sensor arranged on the second side. The second intensity in the third irradiation period and the second intensity in the fourth irradiation period are set to the same level. According to this mode, four types of electromagnetic waves can be obtained, namely, reflected electromagnetic waves and transmitted electromagnetic waves based on electromagnetic waves irradiated from the first irradiation source, and reflected electromagnetic waves and transmitted electromagnetic waves based on electromagnetic waves irradiated from the second irradiation source. Therefore, the types of states of identifiable objects can be increased. In addition, since the second intensity in the third irradiation period and the second intensity in the fourth irradiation period are of the same level, electromagnetic wave information of the same intensity can be obtained on the first side and the second side, and as a result, the same recognition performance can be obtained on the first side and the second side. Therefore, defects that only appear on one side of the object can be accurately identified.

[0015] According to the seventh aspect of the present disclosure, a sorting device is provided. The sorting device comprises: a measuring device of any one of the first aspect to the sixth aspect; and a sorting unit configured to sort objects based on the recognition result of the recognition unit. According to the sorting device, the same effects as those of the first aspect to the sixth aspect can be obtained. For example, the sorting accuracy can be improved while reducing the temperature rise and power consumption caused by the heat of the electromagnetic wave irradiation source. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram showing a schematic configuration of a measuring device according to the first embodiment.

[0017] Figure 2 This is an explanatory diagram showing the relationship between an object and a scanning number of a sensor.

[0018] Figure 3 This is a timing chart showing an example of a lighting pattern of the light source according to the first embodiment.

[0019] Figure 4 1 is a timing chart showing an example of a lighting pattern of a light source as a comparative example.

[0020] Figure 5 This is a timing chart showing an example of a lighting pattern of the light source according to the second embodiment.

[0021] Figure 6 This is a timing chart showing an example of a lighting pattern of the light source according to the third embodiment.

[0022] Figure 7 It is a schematic diagram showing a schematic structure of a sorting device according to a fourth embodiment. DETAILED DESCRIPTION

[0023] A. First Implementation Method:

[0024] Figure 1 : is a schematic diagram showing the schematic structure of the measuring device 10 involved in the first embodiment. The measuring device 10 is a device for measuring the state (in other words, quality) of the object 90. The following describes the measurement of the quality (whole grains, uncooked grains, different-color grains, foreign matter (for example, pebbles, mud, glass pieces, etc.) of rice grains (more specifically, brown rice or polished rice) as an example of the object 90 by the measuring device 10. However, the object 90 is not limited to rice grains, and it can also be any granular object. For example, the object 90 can also be rice, wheat grains, beans (soybeans, chickpeas, edamame, etc.), resin (granules, etc.), rubber sheets, etc.

[0025] like Figure 1 As shown, the measuring device 10 includes: a first light source unit 20, a second light source unit 30, a first sensor 51, a second sensor 52, a storage tank 71, a feeder 72, a chute 73, a discharge tank 74, and a controller 80. The controller 80 controls all actions of the measuring device 10. The controller 80 also functions as a recognition unit 81 and an irradiation control unit 82. The functions of the controller 80 can be implemented by the CPU executing a prescribed program, or by a dedicated circuit. The functions of the recognition unit 81 and the irradiation control unit 82 can be implemented by an integrated device, or by separate devices. The details of the functions of the controller 80 will be described later.

[0026] The storage tank 71 temporarily stores the objects 90. The feeder 72 supplies the objects 90 stored in the storage tank 71 to the chute 73, which is an example of a transfer unit for transferring the objects. The objects 90 supplied to the chute 73 slide downward on the chute 73, fall from the lower end of the chute 73, and are guided to the discharge tank 74. The chute 73 has a predetermined width that allows a plurality of objects 90 to fall simultaneously. As the transfer unit, a conveyor may be used instead of the chute 73.

[0027] Each of the first light source unit 20 and the second light source unit 30 irradiates light to the object 90 sliding down from the chute 73 (that is, the object 90 falling from the chute 73). The irradiation portion is located between the chute 73 and the discharge chute 74. In an alternative embodiment, the object 90 sliding on the chute 73 may be irradiated with light. In addition, when a conveyor is used instead of the chute 73, the object 90 being transferred on the conveyor or the object 90 falling from the conveyor may be irradiated with light.

[0028] In the present embodiment, each of the first light source unit 20 and the second light source unit 30 is a light source unit for irradiating visible light. The first light source unit 20 is arranged on one side (also referred to as the front side) with respect to the transfer path of the object 90 (in other words, the trajectory of falling from the chute 73). On the other hand, the second light source unit 30 is arranged on the other side (also referred to as the rear side) with respect to the transfer path of the object 90.

[0029] The first light source unit 20 disposed on the front side includes a front red light source 21 that emits a front red light 24, a front green light source 22 that emits a front green light 25, and a front blue light source 23 that emits a front blue light 26. The second light source unit 30 disposed on the rear side emits light in the same wavelength region as the first light source unit 20. Specifically, the second light source unit 30 includes a rear red light source 31 that emits a rear red light 34, a rear green light source 32 that emits a rear green light 35, and a rear blue light source 33 that emits a rear blue light 36. In the present embodiment, each of the first light source unit 20 and the second light source unit 30 is a line light source in which a plurality of LEDs are arranged in the width direction of the slide groove 73. The specifications (for example, the number, the light emission form, the wavelength region, etc.) of the first light source unit 20 and the second light source unit 30 are not particularly limited. In addition, the layout of the light sources 21 to 23 is also not particularly limited. For example, the light sources 21 to 23 may be arranged so that the LEDs of each color extend in parallel with the width direction of the slide groove 73 (that is, three lines of different colors are formed). Alternatively, the light sources 21 to 23 may be LEDs of different colors arranged alternately (that is, three-color LEDs form a line) along the width direction of the run channel 73. This point is also the same for the light sources 31 to 33.

[0030] Each of the first sensor 51 and the second sensor 52 is an optical sensor that can detect red light, green light, and blue light separately. In the present embodiment, each of the first sensor 51 and the second sensor 52 is a color CCD sensor, but it can also be a color sensor of other forms such as a color CMOS sensor. In the present embodiment, each of the first sensor 51 and the second sensor 52 is a line sensor in which a plurality of light receiving elements are arranged along the width direction of the slide groove 73, but it can also be an area sensor. The specifications of the first sensor 51 and the second sensor 52 are not particularly limited and can be arbitrarily determined according to the specifications of the first light source unit 20 and the second light source unit 30. The first sensor 51 is arranged on the front side, and the second sensor 52 is arranged on the rear side.

[0031] The first sensor 51 on the front side can detect the front red light 24, the front green light 25, and the front blue light 26 emitted from the front red light source 21, the front green light source 22, and the front blue light source 23, respectively, and reflected by the object 90. The first sensor 51 can also detect the rear red light 34, the rear green light 35, and the rear blue light 36 emitted from the rear red light source 31, the rear green light source 32, and the rear blue light source 33, respectively, and transmitted through the object 90.

[0032] The second sensor 52 on the rear side can detect the rear red light 34, rear green light 35, and rear blue light 36 emitted from the rear red light source 31, rear green light source 32, and rear blue light source 33, respectively, and reflected by the object 90. The second sensor 52 can also detect the front red light 24, front green light 25, and front blue light 26 emitted from the front red light source 21, front green light source 22, and front blue light source 23, respectively, and transmitted through the object 90.

[0033] Hereinafter, the reflected light reflected by the object 90 and / or the transmitted light passing through the object 90 and detected by the first sensor 51 and / or the second sensor 52 will also be referred to as light associated with the object 90 .

[0034] As is well known, the first sensor 51 and the second sensor 52 scan an object 90 multiple times. In other words, the first sensor 51 and the second sensor 52 detect light associated with an object 90 in each of the multiple scanning periods. The scanning period refers to the time from the start to the end of a scan. By synthesizing the images obtained in each scan, the overall image of the object 90 is obtained. In the case where the optical sensor is a CCD sensor, the "scanning period" can be defined as the time from the start of charge accumulation in the photosensitive element to the end of charge accumulation. In the case where the optical sensor is a CMOS sensor, the "scanning period" can be defined as the time from the start of charge accumulation in the photosensitive element to the output of the accumulated charge.

[0035] Figure 2 1 is an explanatory diagram showing the relationship between an object 90 and the scanning numbers (numbers indicating the number of scans) of the first sensor 51 and the second sensor 52. Figure 2 As shown, in the present embodiment, image data is acquired by scanning one object 90 eight times (the number is shown to be smaller than the actual number for simplicity of description). Figure 2 The numbers 1 to 8 shown indicate the number of the scan in which the image data of the corresponding area was acquired. For example, the area labeled "1" indicates that the image data was acquired by the first scan.

[0036] The output from the first sensor 51 and the second sensor 52, that is, the analog signal representing the intensity of the detected light, is converted into a digital signal by an AC / DC converter (not shown). The digital signal (in other words, the grayscale value corresponding to the analog signal) is input to the controller 80. The controller 80 identifies the state of the object 90 based on the detection result of the input light (that is, the image), as a process of the recognition unit 81. Specifically, the recognition unit 81 identifies whether the object 90 is a qualified product (whole grain) or a defective product (for example, uncooked grain, different-colored grain) and / or a foreign body by comparing the grayscale value of the image with the threshold. This recognition is performed for each of the objects 90.

[0037] The irradiation of visible light from the first light source unit 20 and the second light source unit 30 is controlled by the irradiation control unit 82 of the controller 80. The irradiation control unit 82 controls the lighting pattern of the front red light source 21, the front green light source 22, the front blue light source 23, the rear red light source 31, the rear green light source 32, and the rear blue light source 33 according to a predetermined rule. Figure 3 is a timing chart showing an example of the lighting pattern of the first light source unit 20 and the second light source unit 30. Figure 3 In FIG. 5 , the scanning periods of the first sensor 51 and the second sensor 52 are associated with the lighting modes of the first light source unit 20 and the second light source unit 30 . Figure 3In the table, "R", "G", and "B" represent red, green, and blue, respectively. In addition, "Scan No." corresponds to Figure 2 Scan number as shown.

[0038] The irradiation control unit 82 is configured to change the intensity (also referred to as luminosity, indicating the brightness of the light source) of the light irradiated from each of the light sources 21 to 23 and 31 to 33. In the present embodiment, the irradiation control unit 82 changes the voltage applied to the LEDs of the light sources 21 to 23 and 31 to 33 to change the luminosity. Figure 3 The pulse shape shown indicates the level of the voltage (forward voltage) applied to the LED. Specifically, "OFF" indicates the level of voltage zero, "ON (V1)" indicates the level of voltage V1, and "ON (V2)" indicates the level of voltage V2 (V2>V1). The LED emits light when a voltage above a specified value (also called VF) is applied, and when the voltage is above the specified value, it has the characteristic that the current increases and the luminosity increases as the voltage rises. The voltages V1 and V2 are set to values ​​above the specified value. In other words, each of the voltages V1 and V2 is set to make the LED emit light. Since V2>V1, the luminosity of the LED when the voltage V2 is applied is greater than the luminosity of the LED when the voltage V1 is applied. In the following description, the luminosity of the light source when the voltage V1 is applied is referred to as the first luminosity, and the luminosity of the light source when the voltage V2 is applied is referred to as the second luminosity. In addition, the period of irradiating light with the first luminosity is referred to as the first period, and the period of irradiating light with the second luminosity is referred to as the second period.

[0039] like Figure 3 As shown, the irradiation control unit 82 controls each of the light sources 21 to 23, 31 to 33 so that the first irradiation period and the second irradiation period occur. In particular, in this embodiment, the irradiation control unit 82 always applies the voltage V1 or V2 to the light sources 21 to 23, 31 to 33. That is, the light sources 21 to 23, 31 to 33 always irradiate light (there is no period when no light is irradiated).

[0040] In addition, the irradiation control unit 82 controls each of the light sources 21 to 23 and 31 to 33 so that the first irradiation period and the second irradiation period appear, or the first irradiation period appears but the second irradiation period does not appear, in each scanning period. Figure 3 In the example shown, one application of voltage V2 (one irradiation of light of the second luminous intensity) starts and ends within one scanning period. However, the second irradiation period may be set to span the boundaries of multiple scanning periods, or may be set to be longer than one scanning period. Figure 3In the example shown, the number of times voltage V2 is applied in one scanning period (that is, the number of times voltage V2 is continuously applied) is once, but voltage V2 may be applied multiple times. For example, in one scanning period, the voltage may be changed in the order of V1, V2, V1, V2, V1.

[0041] like Figure 3 As shown, the front red light source 21 is lit so that the first irradiation period and the second irradiation period appear in each scanning period of all scanning periods. Each of the front green light source 22 and the front blue light source 23 is lit so that the first irradiation period and the second irradiation period appear in each scanning period of all scanning periods. The rear red light source 31 is lit so that the first irradiation period and the second irradiation period appear in each scanning period of the scanning period with an odd number, and the first irradiation period appears in each scanning period of the scanning period with an even number, but the second irradiation period does not appear. Each of the rear green light source 32 and the rear blue light source 33 is lit so that the first irradiation period and the second irradiation period appear in each scanning period of all scanning periods.

[0042] In this embodiment, the second irradiation period of red light is set to be longer than the second irradiation period of green light and blue light. However, the second irradiation period of each color of light can be appropriately set according to the preferred brightness of the image to be obtained. For example, the second irradiation period of each color of light can also be the same.

[0043] In this embodiment, the second irradiation period starts at a time delayed from the start of the corresponding scanning period (the scanning period in which the second irradiation period is set). In addition, the second irradiation period ends at a time earlier than the end of the corresponding scanning period. According to one or both of them, the light of the second luminous intensity (relatively large luminous intensity) in any scanning period will not be mixed into the adjacent scanning period as noise.

[0044] according to Figure 3 In the lighting pattern shown, during the scanning period with an odd-numbered scanning number, the first sensor 51 on the front side obtains the reflection and transmission images of RGB. The reflection and transmission image refers to an image based on the detection result of the light synthesized by the reflected light and the transmitted light. For example, with respect to red light, an image based on the detection result of the light synthesized by the front red light 24 emitted from the front red light source 21 and reflected by the object 90 and the rear red light 34 emitted from the rear red light source 31 and transmitted through the object 90 is obtained. Similarly, during the scanning period with an odd-numbered scanning number, the second sensor 52 on the rear side also obtains the reflection and transmission images of RGB.

[0045] On the other hand, during the scanning period with an even-numbered scanning number, the first sensor 51 on the front side obtains a red reflected image (more accurately, a component in which a little light of the first luminous intensity from the rear red light source 31 is transmitted through the object 90), and a green and blue reflected and transmitted image. The reflected image refers to an image based on the detection result of the reflected light. Similarly, during the scanning period with an even-numbered scanning number, the second sensor 52 on the rear side obtains a red transmitted image (more accurately, a component in which a little light of the first luminous intensity from the rear red light source 31 is reflected by the object 90), and a green and blue reflected and transmitted image. The transmitted image refers to an image based on the detection result of the transmitted light. In addition, in the case where it is desired to remove the component of the reflected image mixed in red and / or the component of the transmitted image mixed in red, during the scanning period with an even-numbered scanning number, the rear red light source 31 may be turned off (or no voltage may be applied to the rear red light source 31).

[0046] The recognition unit 81 recognizes the state (quality) of the object 90 based on the various images of red, green, and blue obtained on the front side and the rear side, respectively. The type of image used for recognition is determined according to the type of state to be recognized. The controller 80 can also increase the type of image used for recognition processing performed by the recognition unit 81 by performing calculation processing based on the images obtained by the first sensor 51 and the second sensor 52. Such calculation can be performed based on image data obtained in two adjacent scanning periods, for example. For example, the grayscale value of the red reflection image obtained by the first sensor 51 in the scanning period with a scanning number of 2N-1 (N is a natural number) is subtracted from the grayscale value of the red reflection image obtained by the first sensor 51 in the scanning period with a scanning number of 2N, thereby obtaining a red transmission image. In addition, the grayscale value of the red reflection image obtained by the second sensor 52 in the scanning period with a scanning number of 2N-1 is subtracted from the grayscale value of the red transmission image obtained by the second sensor 52 in the scanning period with a scanning number of 2N, thereby obtaining a red reflection image.

[0047] According to the above-mentioned measuring device 10, there is a first irradiation period in which light is irradiated to the object 90 at a first luminous intensity, and a second irradiation period in which light is irradiated to the object 90 at a second luminous intensity greater than the first luminous intensity. Therefore, compared with a structure in which light is always irradiated to the object 90 at the second luminous intensity (voltage V2 is always applied), or compared with a structure in which light is irradiated to the object 90 at the second luminous intensity during the corresponding entire scanning period, the temperature rise and power consumption caused by the heat generated by the light sources 21 to 23, 31 to 33 can be reduced. In addition, since the first irradiation period and the second irradiation period exist during the scanning period in which the voltage V2 is applied, the second irradiation period does not last for a long time. Therefore, the temperature rise caused by the heat generated by the light sources 21 to 23, 31 to 33 can be more effectively reduced. In particular, in the above-mentioned example, one application of the voltage V2 starts and ends within one scanning period, so the period of continuous application of the voltage V2 becomes shorter, and this effect is more significant.

[0048] In addition, compared with the structure in which light is not irradiated except for the second irradiation period in which light is irradiated at the second luminous intensity ( Figure 4 Compared with the comparative example shown in the figure, the recognition accuracy of the recognition unit 81 in recognizing the state of the object 90 can be improved. Specifically, in the comparative example, for the portion of the object 90 that passed through the detection area of ​​the sensor during the period when no light was irradiated (the voltage was zero), no optical information for identifying the state of the object 90 was obtained. On the other hand, according to the above-mentioned measuring device 10, optical information for identifying the state of the object 90 can be obtained not only during the second irradiation period but also during the first irradiation period. That is, compared with the comparative example, optical information for identifying the state of the object 90 can be obtained in a wider range of parts. Therefore, compared with the comparative example, the detection capability of small defects is improved, and as a result, the recognition accuracy can be improved. Any one of the light sources 21 to 23, 31 to 33 or any combination of two or more thereof is a non-limiting example of the "electromagnetic wave irradiation source" in the claims.

[0049] Furthermore, according to the measuring device 10, since the light sources 21 to 23, 31 to 33 are always irradiating light, it is possible to always obtain information for identifying the state of the object 90. Therefore, it is possible to more reliably detect a small defect, and further improve the recognition accuracy of the recognition unit 81. Part of the first irradiation period during which the voltage V1 is applied may be replaced by a non-irradiation period during which no voltage is applied (no light is irradiated).

[0050] Furthermore, according to the measuring device 10, the same level of voltage V1 and V2 is applied to the light sources 21 to 23 on the front side and the light sources 31 to 33 on the rear side (irradiation at the same level of light intensity is performed). Therefore, the same recognition performance can be obtained on the front side and the rear side. Therefore, a defect that only appears on one side of the object 90 can be accurately recognized. However, the voltage V1 and / or voltage V2 on the front side and the voltage V1 and / or voltage V2 on the rear side can be set to different levels according to the characteristics of the image to be obtained. The voltage V1 and / or voltage V2 can also be set to different levels according to the color of the detected light.

[0051] B. Second Implementation Method:

[0052] Below, refer to Figure 5 The second embodiment is described below. The second embodiment differs from the first embodiment only in the lighting mode of the first light source unit 20 and the second light source unit 30 (more specifically, the lighting mode of the front red light source 21 and the rear red light source 31), and the other points are the same as the first embodiment. Figure 5 As shown, in the second embodiment, during the scanning period with an odd-numbered scanning number, the voltage V2 is applied only to the front red light source 21, and the voltage V2 is not applied to the rear red light source 31 (the voltage V1 is applied during the entire scanning period). On the other hand, during the scanning period with an even-numbered scanning number, the voltage V2 is applied only to the rear red light source 31, and the voltage V2 is not applied to the front red light source 21 (the voltage V1 is applied during the entire scanning period).

[0053] That is, in the second embodiment, the second irradiation period of the front red light source 21 and the second irradiation period of the rear red light source 31 do not overlap and appear alternately. In other words, the period during which the voltage V2 is applied to the front red light source 21 and the voltage V2 is not applied to the rear red light source 31, and the period during which the voltage V2 is applied to the rear red light source 31 and the voltage V2 is not applied to the front red light source 21 do not overlap and appear alternately. According to this structure, the lights of the second luminous intensity irradiated from the front red light source 21 and the rear red light source 31 do not interfere with each other. In addition, since the second irradiation period of the front red light source 21 and the second irradiation period of the rear red light source 31 appear alternately, a reflected image and a transmitted image with sufficient resolution can be obtained in any second irradiation period. Therefore, the recognition accuracy of the state of the object 90 can be well ensured.

[0054] In addition, Figure 5In the example, a period in which the voltage V1 is applied to both the front red light source 21 and the rear red light source 31 is sandwiched between a period in which the voltage V2 is applied to the front red light source 21 and a period in which the voltage V2 is applied to the rear red light source 31. Therefore, it is easy to prevent the light from being detected by the first sensor 51 and / or the second sensor 52 in a state where the light irradiated from the front red light source 21 with the second luminous intensity interferes with the light irradiated from the rear red light source 31 with the second luminous intensity. Therefore, it is possible to detect more accurate reflected light and / or transmitted light, thereby improving the recognition accuracy of the state of the object 90.

[0055] According to such a lighting pattern, a red reflection image and a transmission image can be obtained by the front red light source 21 and the rear red light source 31. The controller 80 can also increase the types of images used in the recognition process performed by the recognition unit 81 by performing arithmetic processing based on the images obtained by the first sensor 51 and the second sensor 52. For example, the grayscale value of the red reflection image obtained by the first sensor 51 during the scanning period with a scanning number of 2N-1 (N is a natural number) and the grayscale value of the red transmission image obtained by the first sensor 51 during the scanning period with a scanning number of 2N can be added to obtain a red reflection transmission image.

[0056] The front red light source 21 and the rear red light source 31 are non-limiting examples of the “first irradiation source” and the “second irradiation source” in the claims. In addition, the second irradiation period of the front red light source 21 and the second irradiation period of the rear red light source 31 are non-limiting examples of the “third irradiation period” and the “fourth irradiation period” in the claims.

[0057] C. Third Implementation Method:

[0058] Below, refer to Figure 6 The third embodiment is described below. The third embodiment is different from the second embodiment only in the lighting mode of the first light source unit 20 and the second light source unit 30, and the other points are the same as the second embodiment. Figure 6 As shown, in the third embodiment, during the 3M-2 (M is a natural number) scanning period, the voltage V2 is applied only to the front red light source 21 and the rear red light source 31, and the voltage V2 is not applied to other light sources (the voltage V1 is applied during the entire scanning period). During the 3M-1 scanning period, the voltage V2 is applied only to the front green light source 22 and the rear green light source 32, and the voltage V2 is not applied to other light sources (the voltage V1 is applied during the entire scanning period). During the 3M scanning period, the voltage V2 is applied only to the front blue light source 23 and the rear blue light source 33, and the voltage V2 is not applied to other light sources (the voltage V1 is applied during the entire scanning period).

[0059] That is, in the third embodiment, the second irradiation period of the red light sources 21 and 31, the second irradiation period of the green light sources 22 and 32, and the second irradiation period of the blue light sources 23 and 33 do not overlap and appear alternately. In other words, the second irradiation periods do not overlap and appear alternately between light sources with different wavelength regions of irradiated light. Therefore, it is easy to suppress the light from being detected by the first sensor 51 and / or the second sensor 52 in a state where light with different wavelength regions (all light of the second luminous intensity) interferes.

[0060] One or both of the red light sources 21 and 31 can be non-limiting examples of the “first illumination source” or “second illumination source” in the claims. Similarly, one or both of the green light sources 22 and 32 can be non-limiting examples of the “first illumination source” or “second illumination source” in the claims. Similarly, one or both of the blue light sources 23 and 33 can be non-limiting examples of the “first illumination source” or “second illumination source” in the claims.

[0061] D. Fourth Implementation Method:

[0062] Below, refer to Figure 7 A fourth embodiment is described. Figure 7 As shown, the sorting device 110 involved in the fourth embodiment is different from the first embodiment only in that it is provided with a sorting unit 160 in addition to the measuring device 10 involved in the first embodiment. The sorting unit 160 sprays air 163 toward the object 90 identified as a defective product (rice grains other than whole grains) by the identification unit 81 to sort the object 90. Specifically, the sorting unit 160 includes: a plurality of nozzles 161, and valves 162 corresponding to the number of nozzles 161 (in this embodiment, the number is the same as the number of nozzles 161, but it may be different from the number of nozzles 161). The plurality of nozzles 161 are arranged along the width direction of the chute 73.

[0063] The plurality of nozzles 161 are connected to a compressor (not shown) via a plurality of valves 162, respectively. The plurality of valves 162 are selectively opened according to a control signal from the controller 80, so that the plurality of nozzles 161 selectively spray air 163 toward the object 90 identified as a defective product or a foreign object. The object 90 identified as a defective product or a foreign object is blown away by the air 163, deviates from the trajectory of falling from the chute 73, and is guided to the defective product discharge chute 175 (at Figure 7 On the other hand, the air 163 is not sprayed on the object 90 identified as a qualified product (whole grain). Therefore, the object 90 identified as a qualified product (whole grain) does not change the falling trajectory, but is guided to the qualified product discharge slot 174 (at Figure 7 92).

[0064] In addition, instead of spraying the air 163 toward the object 90 that has fallen from the chute 73, the air 163 may be sprayed toward the object 90 that is sliding on the chute 73 to change the transfer path of the object 90. In addition, a belt conveyor may be used as a transfer unit instead of the chute 73. In this case, the air may be sprayed toward the object that has fallen from one end of the belt conveyor. Alternatively, the air may be sprayed toward the object that is being transported on the belt conveyor.

[0065] The irradiation control unit 82 may also Figure 3 , 5 , 6. According to the sorting device 110, the same effects as those of the first to third embodiments can be obtained. Therefore, the temperature rise and power consumption caused by the heat generation of the light sources 21 to 23, 31 to 33 can be reduced while improving the sorting accuracy.

[0066] The above embodiments are described, but the above embodiments are for the purpose of making the explanation easy to understand and are not intended to limit the present invention. The present invention can be changed and improved without departing from its main purpose, and its equivalents are included in the present invention. In addition, within the scope of at least a part of the above-mentioned problems or at least a part of the effects, any combination or any omission of the constituent elements recorded in the claims and the specification can be performed.

[0067] For example, Figure 3 , 5 Any lighting mode shown in 6 is only a non-limiting example, and any change can be made as long as a first irradiation period in which a voltage V1 is applied and light of a first luminous intensity is irradiated, and a second irradiation period in which a voltage V2 is applied and light of a second luminous intensity is irradiated appears in at least one of the light sources 21 to 23, 31 to 33. For example, a non-irradiation period in which no voltage is applied and no light is irradiated may be added. Alternatively, an additional irradiation period in which a voltage less than the voltage V2 and different from the voltage V1 is applied may be set. Alternatively, other lighting modes of each light source may be added. For example, in Figure 5 In the example shown, a scanning period having a second irradiation period in which a voltage V2 is applied to each of the light sources 21 to 23, 31 to 33 and light of a second luminous intensity is irradiated may be sandwiched between the scanning period having an odd scanning number and the scanning period having an even scanning number (for example, Figure 3 The scan number is 1 during the scan).

[0068] Alternatively, the lighting pattern of the light sources 21 to 23 and 31 to 33 may be set so that only one of the reflection image and the transmission image is acquired.

[0069] Alternatively, one of the front light source and the rear light source may be omitted. Alternatively, one of the front first sensor 51 and the rear second sensor 52 may be omitted.

[0070] Alternatively, an arbitrary electromagnetic wave source may be provided instead of or on the basis of the light source emitting visible light. Such an electromagnetic wave source may include, for example, a near-infrared source and / or an X-ray source. In this case, the near-infrared source and / or the X-ray source may be arranged only on one side of the transport path of the object 90, or on both sides. In addition, the sensor for detecting near-infrared rays and / or the sensor for detecting X-rays may be arranged only on one side of the transport path of the object 90, or on both sides. The irradiation control unit 82 may also control the electromagnetic wave irradiation source in the same manner as the above-mentioned visible light lighting mode, so that there is a first irradiation period in which the electromagnetic wave is irradiated with a first intensity, and a second irradiation period in which the electromagnetic wave is irradiated with a second intensity greater than the first intensity.

[0071] Description of Reference Numerals

[0072] 10...measuring device; 20...first light source unit; 21...front red light source; 22...front green light source; 23...front blue light source; 24...front red light; 25...front green light; 26...front blue light; 30...second light source unit; 31...rear red light source; 32...rear green light source; 33...rear blue light source; 34...rear red light; 35...rear green light; 36...rear blue light; 51...first sensor; 52...second sensor; 71...storage tank; 72...feeder; 73...chute; 74...discharge tank; 80...controller; 81...recognition unit; 82...irradiation control unit; 90...object; 91...object; 92...object; 110...sorting device; 160...sorting unit; 161...nozzle; 162...valve; 163...air; 174...qualified product discharge tank; 175...unqualified product discharge tank.

Claims

1. A measuring device for measuring the state of an object, characterized in that: have: a transfer unit configured to transfer the object; an electromagnetic wave irradiation source configured to irradiate the object being transferred by the transfer unit with electromagnetic waves; a sensor configured to detect at least one of a reflected electromagnetic wave irradiated from the electromagnetic wave irradiation source and reflected by the object, and a transmitted electromagnetic wave transmitted through the object; an identification unit configured to identify the state of the object based on the signal obtained by the sensor; as well as an irradiation control unit configured to control irradiation of the electromagnetic wave from the electromagnetic wave irradiation source, The irradiation control unit is configured to control the electromagnetic wave irradiation source so that a first irradiation period in which the electromagnetic wave is irradiated at a first intensity and a second irradiation period in which the electromagnetic wave is irradiated at a second intensity greater than the first intensity occur.

2. The measuring device according to claim 1, characterized in that The irradiation control unit is configured to control the electromagnetic wave irradiation source so that the first irradiation period and the second irradiation period appear, or the first irradiation period appears but the second irradiation period does not appear, during each scanning period of the sensor.

3. The measuring device according to claim 1 or 2, characterized in that The irradiation control unit is configured to control the electromagnetic wave irradiation source so that there is no non-irradiation period during which the electromagnetic wave irradiation source does not irradiate the electromagnetic wave.

4. The measuring device according to any one of claims 1 to 3, characterized in that The electromagnetic wave irradiation source includes a first irradiation source and a second irradiation source having at least one different wavelength region and setting position of the irradiated electromagnetic wave. The second irradiation period includes: a third irradiation period during which the first irradiation source irradiates the electromagnetic wave at the second intensity, and a fourth irradiation period during which the second irradiation source irradiates the electromagnetic wave at the second intensity. The irradiation control unit is configured to control the electromagnetic wave irradiation source so that the third irradiation period and the fourth irradiation period do not overlap and appear alternately.

5. The measuring device according to claim 4, characterized in that The irradiation control unit is configured to control the electromagnetic wave irradiation sources so that the first irradiation source irradiates the electromagnetic waves at the first intensity and the second irradiation source irradiates the electromagnetic waves at the first intensity during a period between the third irradiation period and the fourth irradiation period.

6. A sorting device, characterized in that: have: The measuring device according to any one of claims 1 to 5; and The sorting unit is configured to sort the object based on the recognition result of the recognition unit.

Citation Information

Patent Citations

  • Optical cereal grain sorting apparatus

    JP2010042326A