Integrated quantum field intensity probe for high-sensitivity microwave electric field measurement and measurement method

Abstract

The invention relates to the technical field of microwave electric field measurement, in particular to an integrated quantum field intensity probe for high-sensitivity microwave electric field measurement and a measurement method, and aims to solve the problems of low integration level, poor stability and use of an external antenna in the prior art. The device comprises an optical fiber atomic gas chamber, wherein the end part of the optical fiber atomic gas chamber is connected with a detection light input optical fiber, a coupling light input optical fiber and a detection light output optical fiber; the optical fiber atomic gas chamber is provided with a microstrip antenna, and the microstrip antenna is used for providing a local microwave field. Dependence on a traditional external antenna is eliminated, measurement errors caused by environmental factors are reduced, and the probe can be more easily integrated into various small or portable devices.

Description

Technical Field

[0001] This document relates to the field of microwave electric field measurement technology, and in particular to an integrated quantum field strength probe and measurement method for high-sensitivity microwave electric field measurement. Background Art

[0002] Conventional probes for high-sensitivity microwave electric field measurements typically employ direct detection or classical mixing techniques. These methods rely on conventional electronic components and external antennas to generate and detect the interaction between the microwave field being measured and the local oscillator signal. Although these techniques have demonstrated certain performance in certain applications, they have significant drawbacks that limit their practicality and widespread adoption.

[0003] The existing technology has the following limitations:

[0004] Low integration: Traditional probes have complex designs and numerous components, resulting in a large overall size and difficulty in integrating into compact devices.

[0005] Poor stability: Due to its reliance on external antennas and environmental conditions (such as temperature, humidity, etc.), the measurement results of traditional probes are easily affected and have poor stability.

[0006] Inconvenient to move: The large and bulky design makes the probe difficult to carry, limiting its use in the field or mobile environment.

[0007] Use of external antennas: The measured microwave field and the local microwave field must be generated by external antennas, which not only increases the complexity of the system but also makes precise control and calibration difficult.

[0008] Practical challenges: The above factors combined make it difficult for traditional technologies to be practical, especially in application scenarios with space constraints or strict requirements on stability and accuracy.

[0009] Therefore, it is necessary to provide an integrated quantum field strength probe and a measurement method for high-sensitivity microwave electric field measurement. Summary of the invention

[0010] This specification provides an integrated quantum field strength probe and measurement method for high-sensitivity microwave electric field measurement, which are used to solve the problems of low integration, poor stability and use of external antennas in the prior art.

[0011] In a first aspect, the present invention provides an integrated quantum field intensity probe for high-sensitivity microwave electric field measurement, the probe comprising an optical fiber atomic gas chamber, the end of which is connected to a detection light input optical fiber, a coupling light input optical fiber and a detection light output optical fiber;

[0012] A microstrip antenna is installed on the optical fiber atomic gas chamber, and the microstrip antenna is used to provide a local microwave field.

[0013] Furthermore, the detection light input optical fiber, the coupling light input optical fiber and the optical fiber atomic gas chamber are on the same axis.

[0014] Furthermore, the microstrip antenna is provided with a radio frequency input interface, and the radio frequency input interface is used to receive a radio frequency signal and input the signal into the microstrip antenna.

[0015] Furthermore, the alkali metal filled in the optical fiber atomic gas chamber is cesium atoms.

[0016] Furthermore, the alkali metal filled in the optical fiber atomic gas chamber is rubidium atoms.

[0017] Furthermore, the optical fiber atomic gas chamber is in a cylindrical structure, and a detection light anti-reflection film is provided on the end face.

[0018] Furthermore, the microstrip antenna is installed below the optical fiber atomic gas chamber.

[0019] Furthermore, the length of the microstrip antenna is the same as the length of the optical fiber atomic gas chamber.

[0020] Furthermore, a first input port, a second input port and a first output port are provided on the end surface of the optical fiber atomic gas chamber;

[0021] The first input port and the second input port are respectively arranged at the two end surfaces of the optical fiber atomic gas chamber, the first input port is used to connect the detection light input optical fiber, and the second input port is used to connect the coupling light input optical fiber;

[0022] The first output port is arranged on the same end face of the optical fiber atomic gas chamber as the second input port, and the first output port is used to connect to the detection light output optical fiber.

[0023] In a second aspect of the present invention, an integrated quantum field strength measurement method for high-sensitivity microwave electric field measurement is proposed. Based on an integrated quantum field strength probe for high-sensitivity microwave electric field measurement, the method comprises:

[0024] Inputting the radio frequency signal to the microstrip antenna through the radio frequency input interface;

[0025] The detection light is input into the fiber atomic gas chamber through the detection light input optical fiber to interact with the internal atoms;

[0026] The coupling light is input into the fiber atomic gas chamber through the coupling light input optical fiber, and is reversely overlapped with the detection light inside the fiber atomic gas chamber to realize the atomic internal state preparation;

[0027] After interacting with the atoms, the probe light comes out of the fiber atomic gas chamber and is output to the photodetector through the probe light output fiber.

[0028] At least one of the above technical solutions adopted in the embodiments of this specification can achieve the following beneficial effects:

[0029] Highly integrated: By integrating the fiber atomic gas cell, the detection light input / output fiber and the coupling light input fiber, and directly installing a microstrip antenna on the fiber atomic gas cell, the number of components is greatly reduced and the size of the device is reduced. This compact design makes it easier to integrate the probe into various small or portable devices.

[0030] Enhanced stability and reliability: Eliminates the reliance on traditional external antennas and reduces measurement errors caused by environmental factors such as temperature, humidity, etc. The internally integrated microstrip antenna and optical path ensure more stable signal transmission and higher measurement accuracy, maintaining good performance even in a changing environment.

[0031] Easy to move and deploy: The miniaturized and lightweight design makes the quantum field strength probe easy to carry and operate, suitable for field operations, mobile monitoring and other application scenarios that require rapid response. Its flexibility and convenience greatly expand the scope of application.

[0032] Simplified system complexity: The built-in microstrip antenna is used to generate the local microwave field, replacing the traditional external antenna solution, which not only reduces the overall complexity of the system, but also simplifies the calibration process and improves the ease of operation.

[0033] Improved measurement sensitivity: The quantum superheterodyne principle is used to combine the interaction of precisely controlled coupling light and detection light to achieve highly sensitive measurement of microwave electric fields. The use of alkali metals (such as cesium or rubidium) further enhances the ability to detect weak signals. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0035] Figure 1 The schematic diagram is a structural diagram of an integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to the present invention. DETAILED DESCRIPTION

[0036] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in combination with the specific embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present application.

[0037] The technical solutions provided by various embodiments of the present application are described in detail below in conjunction with the accompanying drawings.

[0038] Figure 1 This is a schematic diagram of the structure of an integrated quantum field strength probe for high-sensitivity microwave electric field measurement provided in an embodiment of this specification, see Figure 1 The probe comprises: the probe comprises an optical fiber atomic gas chamber 2, the end of the optical fiber atomic gas chamber 2 is connected with a detection light input optical fiber 1, a coupling light input optical fiber 4 and a detection light output optical fiber 3; the detection light input optical fiber 1, the coupling light input optical fiber 4 and the optical fiber atomic gas chamber 2 are on the same axis;

[0039] A microstrip antenna 6 is installed on the optical fiber atomic gas chamber 2, and the microstrip antenna 6 is used to provide a local microwave field.

[0040] The fiber atom chamber 2 is the core of the entire probe, and is filled with alkali metals such as cesium or rubidium atoms to achieve the interaction between light and matter. The design of the fiber atom chamber 2 ensures the effective transmission of light signals therein and the efficient interaction with atoms.

[0041] Probe light input fiber 1, coupling light input fiber 4, and probe light output fiber 3: These fibers are connected to the ends of the fiber atomic gas cell. The probe light enters the fiber atomic gas cell 2 through the probe light input fiber 1, and after interacting with the internal atoms, it is output from the probe light output fiber 3. The coupling light enters the fiber atomic gas cell 2 through the coupling light input fiber 4, and coincides with the probe light in the opposite direction, and is used to prepare the atomic internal state.

[0042] Microstrip antenna 6: installed on the optical fiber atomic gas chamber 2, used to provide a local microwave field. The microstrip antenna is provided with a radio frequency input interface 5, which is used to receive an external radio frequency signal and convert it into a microwave electric field, thereby affecting the atomic state in the optical fiber atomic gas chamber.

[0043] The optical fiber atomic gas chamber 2 is made of glass material, which has a lower dielectric constant than the electric field probe with a metal structure and has less interference with the microwave electric field being measured.

[0044] As a further explanation of the present invention, the end surface of the optical fiber atomic gas chamber 2 is provided with a first input port, a second input port and a first output port;

[0045] The first input port and the second input port are respectively arranged at the two end surfaces of the optical fiber atomic gas chamber 2, the first input port is used to connect the detection light input optical fiber 1, and the second input port is used to connect the coupling light input optical fiber 4;

[0046] The first output port is arranged on the same end face of the optical fiber atomic gas chamber 2 as the second input port, and the first output port is used to connect to the detection light output optical fiber 3 .

[0047] The optical fiber atomic gas chamber 2 is in a cylindrical structure, and a detection light anti-reflection film is provided on the end face to reduce light reflection loss and improve light transmission efficiency.

[0048] The length of the microstrip antenna 6 is the same as the length of the optical fiber atomic gas chamber 2 .

[0049] The microstrip antenna 6 in the present invention is installed below the optical fiber atomic gas chamber 2, and its length is consistent with that of the optical fiber atomic gas chamber 2, so as to ensure that the microwave field evenly covers the entire gas chamber space.

[0050] The working principle of the present invention is:

[0051] The radio frequency signal is fed to the microstrip antenna 6 through the radio frequency input interface 5. The microstrip antenna 6 converts the received radio frequency signal into a local microwave field, and this microwave field and the measured microwave field act together on the atoms in the optical fiber atomic gas chamber 2.

[0052] The probe light is generated by a laser source and introduced into the fiber atomic gas cell 2 through the probe light input fiber 1. At the same time, the coupling light is introduced through the coupling light input fiber 4, and propagates in the opposite direction and overlaps with the probe light in the fiber atomic gas cell 2 to prepare the internal state of the atom. This design ensures that the two beams of light can interact with the atoms in the same area, enhancing the accuracy of the measurement.

[0053] In the optical fiber atomic gas chamber 2, the probe light, the coupled light and the local microwave field generated by the microstrip antenna 6 act together on the filled alkali metal atoms. In this process, the internal state of the atoms changes, and this change reflects the characteristics of the microwave field.

[0054] After the above interaction, the probe light comes out of the fiber atomic gas chamber 2 and is output through the probe light output fiber 3. The probe light at this time carries information about the microwave field, which can be further analyzed to obtain the intensity and other parameters of the microwave field.

[0055] The use of quantum superheterodyne principle to process the output detection light can significantly improve the sensitivity of microwave electric field measurement. This process involves the interference effect between the detection light and the reference light (i.e., coupled light), from which the information of the microwave field is extracted.

[0056] In a second aspect of the present invention, an integrated quantum field strength measurement method for high-sensitivity microwave electric field measurement is proposed. Based on an integrated quantum field strength probe for high-sensitivity microwave electric field measurement, the method comprises:

[0057] Inputting the radio frequency signal to the microstrip antenna 6 through the radio frequency input interface 5;

[0058] The detection light is input into the fiber atomic gas chamber 2 through the detection light input optical fiber 1 to interact with the internal atoms;

[0059] The coupling light is input into the optical fiber atomic gas chamber 2 through the coupling light input optical fiber 4, and is reversely overlapped with the detection light inside the optical fiber atomic gas chamber 2 to realize the atomic internal state preparation;

[0060] After interacting with the atoms, the detection light comes out of the optical fiber atomic gas chamber 2 and is output to the photodetector through the detection light output optical fiber 3.

[0061] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0062] It should also be noted that the terms "first" and "second" in this application are used to distinguish multiple objects of the same name, and are not used to limit the order or size. Unless otherwise specified, they have no other special meanings.

[0063] The above is only an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.

Claims

1. An integrated quantum field strength probe for high-sensitivity microwave electric field measurement, characterized in that: The probe comprises an optical fiber atomic gas chamber (2), the end of which is connected to a detection light input optical fiber (1), a coupling light input optical fiber (4) and a detection light output optical fiber (3); A microstrip antenna (6) is installed on the optical fiber atomic gas chamber (2), and the microstrip antenna (6) is used to provide a local microwave field.

2. The integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to claim 1, characterized in that: The detection light input optical fiber (1), the coupling light input optical fiber (4) and the optical fiber atomic gas chamber (2) are located on the same axis.

3. The integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to claim 1, characterized in that: The microstrip antenna (6) is provided with a radio frequency input interface (5), and the radio frequency input interface (5) is used to receive radio frequency signals and input the signals into the microstrip antenna (6).

4. The integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to claim 1, characterized in that: The alkali metal filled in the optical fiber atomic gas chamber (2) is cesium atoms.

5. The integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to claim 1, characterized in that: The alkali metal filled in the optical fiber atomic gas chamber (2) is rubidium atoms.

6. The integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to claim 1, characterized in that: The optical fiber atomic gas chamber (2) is in a cylindrical structure, and a detection light anti-reflection film is provided on the end face.

7. The integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to claim 1, characterized in that: The microstrip antenna (6) is installed below the optical fiber atomic gas chamber (2).

8. The integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to claim 1, characterized in that: The length of the microstrip antenna (6) is the same as the length of the optical fiber atomic gas chamber (2).

9. The integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to claim 1, characterized in that: The end surface of the optical fiber atomic gas chamber (2) is provided with a first input port, a second input port and a first output port; A first input port and a second input port are respectively arranged at two end surfaces of the optical fiber atomic gas chamber (2), the first input port is used to connect to the detection light input optical fiber (1), and the second input port is used to connect to the coupling light input optical fiber (4); The first output port is arranged on the same end face of the optical fiber atomic gas chamber (2) as the second input port, and the first output port is used to connect to the detection light output optical fiber (3).

10. An integrated quantum field strength measurement method for high-sensitivity microwave electric field measurement, based on an integrated quantum field strength probe for high-sensitivity microwave electric field measurement according to any one of claims 1 to 9, characterized in that: The method includes: Inputting a radio frequency signal to a microstrip antenna (6) through a radio frequency input interface (5); Inputting the detection light into the optical fiber atomic gas chamber (2) through the detection light input optical fiber (1) to interact with the internal atoms; The coupling light is input into the optical fiber atomic gas chamber (2) through the coupling light input optical fiber (4), and is reversely overlapped with the detection light inside the optical fiber atomic gas chamber (2), thereby realizing the preparation of the atomic internal state; After interacting with the atoms, the detection light comes out of the optical fiber atomic gas chamber (2) and is output to the photoelectric detector through the detection light output optical fiber (3).

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