Power supply protection system and method for irradiation test

Abstract

The invention discloses a power supply protection system and method for an irradiation test, and belongs to the technical field of component radiation effect test tools. The system comprises a test board and a secondary power supply board which are connected. A to-be-tested component is arranged on the test board; the secondary power supply board is provided with a power supply module, a current detection resistor and an MCU. The power supply module is connected with an external power supply through an electric connector; the current detection resistor is connected in series between the power supply module and the component to be detected, the current detection resistor is connected with a power supply monitoring chip, and the power supply monitoring chip is connected with the MCU; the MCU is in signal connection with an upper computer; the MCU is connected with the power supply module; and a current threshold parameter is preset in the upper computer. The MCU can automatically complete current comparison and power supply control, and delay and misoperation of manual switching of the power supply are avoided, so that risks and uncertainty caused by manual operation are reduced.

Description

Technical Field

[0001] The invention belongs to the technical field of component radiation effect test tooling, and relates to a power supply protection system and method for radiation testing. Background Art

[0002] Since satellite components in orbit are inevitably bombarded by protons from the Earth's radiation belt, galactic cosmic ray particles, and solar cosmic ray particles, these radiation particles can easily cause performance degradation, logical function errors, state locks, etc. of electronic components, resulting in functional errors and abnormalities of electronic equipment, which in turn endanger the function and even operational safety of satellites. Therefore, aerospace components usually need to assess their ability to work in a high-energy particle irradiation environment, confirm the limits of irradiation damage to microcircuits, and avoid high-energy particles entering the microcircuit in actual applications, causing changes in its microstructure to produce defects or additional charges or currents, thereby causing microcircuit parameter degradation, locks, circuit reversals, or surge currents that cause burnout and failure. The impact of space radiation on electronic components is mainly reflected in two aspects: total dose effect and single particle effect. The total dose effect is a cumulative effect, which is the absorption effect of the total ionization energy of charged particles, resulting in damage or performance degradation of devices, circuits, and systems; the single particle effect is a transient effect, which refers to a circuit failure caused by a specific high-energy particle passing through the sensitive area of ​​the circuit. This failure may be recoverable or permanent. According to the above two aspects, irradiation tests usually use high / low dose rate cobalt source irradiation devices to simulate the total dose effect under actual low dose rate conditions in space; electron accelerators are used to evaluate the single particle irradiation damage of electronic components under high energy heavy ion conditions. Both of the above tests require the components to be installed on the test board and powered on. It is also possible that the power supply current of the components to be tested will increase suddenly or continue to increase during the test, exceeding the maximum rating of the components.

[0003] The traditional manual operation mode is to observe the current output current of the voltage stabilizer in real time through monitoring equipment such as cameras at the irradiation site. When the current exceeds the expected value, the voltage stabilizer is manually and remotely operated to shut down. This mode has high requirements for the placement of the voltage stabilizer, requiring the camera to clearly identify the current indication on the voltage stabilizer LCD screen, and requiring the test personnel to concentrate highly. Summary of the invention

[0004] The purpose of the present invention is to solve the technical problem in the prior art that the voltage stabilizing source is cut off mainly by manual operation when an abnormality occurs during the irradiation test, and to provide a power supply protection system and method for the irradiation test.

[0005] In the first aspect, the present invention provides a power protection system for irradiation testing, comprising a connected test board and a secondary power supply board; the test board is provided with components to be tested; the secondary power supply board is provided with a power module, a current detection resistor and an MCU; the power module is connected to an external power supply through an external power supply electrical connector; the current detection resistor is connected in series between the power module and the components to be tested, the current detection resistor is connected to a power monitoring chip, and the power monitoring chip is connected to the MCU; the MCU is connected to a host computer through a host computer electrical connector; the MCU is connected to the power module; and the current threshold parameter is pre-set in the host computer.

[0006] Further improvements are: The power supply board is also provided with a differential amplifier connected to the current detection resistor, the differential amplifier is connected to a voltage comparator, and the voltage comparator is connected to the power module; the voltage comparator is pre-set with a threshold voltage of the current detection resistor.

[0007] When conducting a total dose test, the test board is exposed to a radiation space, and lead bricks are arranged around the secondary power supply board and the components arranged thereon; the secondary power supply board supplies power to the test board through a power cable.

[0008] When a single particle test is performed, the test board and the secondary power supply board are arranged on the same printed circuit board.

[0009] The self-test procedure on the test board.

[0010] In a first aspect, the present invention provides a power supply protection method for irradiation test based on the above system, comprising: The power monitoring chip collects the working current of the components to be tested in real time, and transmits the collected results to the MCU, which transmits them to the host computer. The operator observes the working current and change trend of the components to be tested through the host computer, and manually cuts off the external power supply when an abnormality occurs, thereby realizing the first level of power protection.

[0011] After placing the components to be tested on the test board, turning on the external power input, and setting the current threshold parameters and the threshold voltage, the test board is self-checked, and an irradiation experiment is performed after the self-check is successful.

[0012] The host computer sends the preset current threshold parameters to the MCU. The MCU transmits the collection results to the host computer and compares them with the preset current threshold parameters. When the collection results are greater than the current threshold parameters, the MCU shuts down the power module to achieve the second level of power protection.

[0013] The voltage drop across the current detection resistor is sampled and amplified by the differential amplifier, and then used as the inverting input of the voltage comparator and compared with the threshold voltage. When the inverting input is less than the threshold voltage, the output voltage of the differential amplifier is less than the threshold voltage. At this time, the voltage comparator outputs a high level and the power supply module works normally; otherwise, the voltage comparator will output a low level, shut down the power supply, and achieve the third power supply protection.

[0014] When any of the first power protection, the second power protection and the third power protection is triggered and the power input to the component under test is turned off, it is determined whether the component under test is failed. If so, the irradiation test is terminated; otherwise, the power input is controlled to be reopened.

[0015] Compared with the prior art, the present invention has the following beneficial effects: The invention discloses a power supply protection system for irradiation test. By adding a current detection resistor to the secondary power supply output by the power module on the test board and connecting a dedicated power supply monitoring chip, the system can collect the working current of the components to be tested in real time, and transmit the collected results back to the host computer through the MCU. In this way, the operator can intuitively observe the working current and change trend of the components to be tested, so as to more accurately judge the performance and stability of the components, and improve the accuracy and reliability of the irradiation test. The system realizes dual protection of the components to be tested in the irradiation test by designing a power supply protection scheme of the first manual operation mode and a power supply protection scheme of the second MCU automatic control. In the first scheme, the operator can monitor the working current and change trend of the components to be tested in real time, and manually cut off the power supply in time to avoid component damage or safety accidents caused by abnormal current. In the second scheme, the MCU can automatically compare the working current with the preset current threshold, and automatically shut down the power module when necessary, thereby further improving the safety and reliability of the system. Compared with the power supply protection scheme of the first manual operation mode, the power supply protection scheme of the second MCU automatic control significantly improves the automation of the system. MCU can automatically complete current comparison and power control, avoiding the delay and misoperation of manual power switching, thereby reducing the risk and uncertainty caused by human operation. The power protection scheme designed in this system has high adaptability and can be applied to a variety of component tests that require different voltage inputs. By adjusting the output of the voltage regulator and the conversion of the power module, this system can flexibly provide the required power for the components to be tested to meet the diverse needs of irradiation tests.

[0016] Furthermore, a differential amplifier connected to the current detection resistor is also provided on the power supply board, and the differential amplifier is connected to a voltage comparator, and the voltage comparator is connected to the power module; the threshold voltage of the current detection resistor is pre-set in the voltage comparator. During the experiment, the voltage drop across the current detection resistor is first sampled and amplified by the differential amplifier to improve the anti-interference ability of the system, and then used as the inverting input of the voltage comparator to compare with the threshold voltage calculated in advance and obtained by resistor voltage division. When the working current of the component to be tested is less than the design threshold, the output voltage of the differential amplifier is less than the threshold voltage. At this time, the voltage comparator outputs a high level and the power module works normally; otherwise, the voltage comparator will output a low level and shut down the power module. Compared with the second power supply protection mentioned above, the threshold voltage corresponding to the current threshold needs to be calculated, and the voltage divider resistor on the test board needs to be welded and debugged in advance. Since it does not involve complex logic such as digital circuits, its response time is shorter and its reliability is higher.

[0017] The present invention discloses a power supply protection method for irradiation test, in which a current detection resistor is added to the secondary power supply output by the power module on the test board, and the working current of the components to be tested is collected in real time through a dedicated power supply monitoring chip. The collection result of the power supply monitoring chip can be read by the MCU chip on the board that controls the secondary power switch, and the collection value is transmitted back to the ground through the serial port. The operator can observe the working current and change trend of the components to be tested more intuitively through the host computer software, and manually cut off the power supply in time to achieve the first power supply protection.

[0018] Furthermore, the host computer software first sends the current threshold parameter to the MCU on the test board. After the test starts, the MCU transmits the working current of the component to be tested in real time and compares it with the preset current threshold. When it is found that the working current is greater than the set current, the power module is turned off to achieve the second power protection. Compared with the first power protection, this solution avoids the delay of manual power switching, and even if a communication failure occurs during the test and the host computer cannot obtain the current, the system can still perform the test normally, with a higher degree of automation.

[0019] Furthermore, the third power supply protection is to control the power supply through a differential amplifier and a voltage comparator. During the experiment, the voltage drop across the current detection resistor is first sampled and amplified by a differential amplifier to improve the anti-interference ability of the system, and then used as the inverting input of the voltage comparator to compare with the threshold voltage calculated in advance and obtained by resistor voltage division. When the working current of the component to be tested is less than the design threshold, the output voltage of the differential amplifier is less than the threshold voltage. At this time, the voltage comparator outputs a high level and the power module works normally; otherwise, the voltage comparator will output a low level and turn off the power module. Compared with the second power supply protection, the third power supply protection needs to calculate the threshold voltage corresponding to the current threshold and weld and debug the voltage divider resistor on the test board in advance, which loses the flexibility of software on-site adjustment; but since it does not involve complex logic such as digital circuits, its response time is shorter and the reliability is higher. The present invention uses a three-redundant power supply protection scheme that combines software and hardware to ensure that when the working current of the component to be tested is too large due to latching and other conditions, the output of the voltage regulator is promptly turned off. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0021] Figure 1 A flow chart of an irradiation test using the power supply protection method for irradiation test in the present invention; Figure 2 It is the overall structure diagram of the power supply protection system for irradiation test in the present invention; Figure 3 It is a principle block diagram of power supply protection for irradiation test in an embodiment of the present invention; Figure 4 This is an interconnection diagram of the power protection design for the irradiation test in an embodiment of the present invention.

[0022] Among them: 1-secondary power supply board; 2-test board; 3-components to be tested; 4-MCU; 5-power module; 6-current detection resistor; 7-differential amplifier; 8-host computer electrical connector; 9-external power supply electrical connector. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0024] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0025] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0026] In the description of the embodiments of the present invention, it should be noted that if the terms "upper", "lower", "horizontal", "inner", etc. indicate an orientation or positional relationship based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship in which the product of the invention is usually placed when in use, it is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first", "second", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0027] In addition, if the term "horizontal" appears, it does not mean that the component must be absolutely horizontal, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", which does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0028] In the description of the embodiments of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal connection of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0029] The present invention is further described in detail below in conjunction with the accompanying drawings: See also Figure 2The embodiment of the present invention discloses a power supply protection system for irradiation test, including a connected test board 2 and a secondary power supply board 1; a self-test program is provided on the test board 2. The test board 2 is provided with a component to be tested 3; the secondary power supply board 1 is provided with a power module 5, a current detection resistor 6 and an MCU 4; the component to be tested 3 is connected to an external power supply through an electrical connector; the current detection resistor 6 is connected in series between the power module 5 and the component to be tested 3, the current detection resistor 6 is connected to a power monitoring chip, and the power monitoring chip is connected to the MCU 4; the MCU 4 signal is connected to a host computer; the MCU 4 is connected to the power module 5; the current threshold parameter is pre-set in the host computer. The power supply board 1 is also provided with a differential amplifier 7 connected to the current detection resistor 6, the differential amplifier 7 is connected to a voltage comparator, and the voltage comparator is connected to the power module 5; the voltage comparator is pre-set with the threshold voltage of the current detection resistor 6.

[0030] When conducting a total dose test, the test board 2 is exposed to the radiation space, and lead bricks are arranged around the secondary power supply board 1 and the components arranged thereon; the secondary power supply board 1 supplies power to the test board 2 through a power cable. When conducting a single particle test, the test board 2 and the secondary power supply board 1 are arranged on the same printed circuit board.

[0031] See also Figure 1 The embodiment of the present invention further discloses a power supply protection method for irradiation test based on the above system, comprising: After placing the components 3 to be tested on the test board 2, turning on the external power input, and setting the current threshold parameter and the threshold voltage, the test board 2 is self-checked, and an irradiation experiment is performed after the self-check is successful.

[0032] The working current of the component 3 to be tested is collected in real time through the power monitoring chip, and the collection result is transmitted to MCU 4, which transmits it to the host computer. The operator observes the working current and change trend of the component 3 to be tested through the host computer, and manually cuts off the external power supply when an abnormality occurs, thereby realizing the first level of power protection.

[0033] The host computer sends the preset current threshold parameter to MCU 4. MCU 4 transmits the collection result to the host computer and compares it with the preset current threshold parameter. When the collection result is greater than the current threshold parameter, MCU 4 shuts down the power module 5 to achieve the second power protection.

[0034] The voltage drop across the current detection resistor 6 is sampled and amplified by the differential amplifier 7, and then used as the inverting input of the voltage comparator and compared with the threshold voltage. When the inverting input is less than the threshold voltage, the output voltage of the differential amplifier is less than the threshold voltage. At this time, the voltage comparator outputs a high level, and the power supply module 5 works normally; otherwise, the voltage comparator will output a low level, shut down the power supply 5, and realize the third power supply protection.

[0035] When any one of the first power protection, the second power protection and the third power protection is triggered and the power input to the component 3 under test is turned off, it is determined whether the component 3 under test is failed. If so, the irradiation test is terminated; otherwise, the power input is controlled to be reopened.

[0036] Example 1 The principle block diagram of a memory single particle irradiation test board is as follows: Figure 3 As shown. Considering that the memory single-particle test requires continuous testing of the memory's read and write functions in addition to current detection, the main control part uses an FPGA that can work in parallel to complete it. In order to reasonably use the test space, the test board is placed with three devices under test. Therefore, the power module 1 that supplies power to the device under test should include at least three independent output channels, and each channel should be designed with power protection.

[0037] The power protection design is divided into three parts: the first power protection is mainly implemented by software, and the host computer controls the power supply through the communication interface and FPGA; the second and third power protection are mainly implemented by hardware, that is, Figure 3 The power protection design in the circuit should include devices such as current detection resistors, power monitoring chips, differential amplifiers and voltage comparators.

[0038] Calculated based on the normal working power supply of the memory under test being 1.5V@400mA, if the single-particle latch current is considered to be 5 times the normal working current, the resistance of the current detection resistor RS should be less than 75mΩ to ensure that when the working current is 2A, the voltage drop loss on RS does not affect the normal working of the device under test. Taking the commonly used resistance value of 50mΩ, the voltage drop on RS during normal working is 20mV, and the voltage drop during single-particle latch is 100mV. The power monitoring chip is INA219, which has a common-mode voltage range of 0~26V, a differential-mode voltage range of ±320mV, and a minimum resolution of 10μV, meeting the current monitoring requirements; the differential amplifier is INA195, which has a common-mode voltage range of -16V to +80V, and a transfer function of 100V / V. The single-particle latch voltage drop after amplification is 10V; the voltage comparator is LM139, which has an input voltage range of 0~36V. When the output of the differential amplifier is used as the inverting input of the comparator, the comparator is input with 10V using a resistor divider, and the output of the comparator is pulled up by RL and connected to the control end of the power module.

[0039] The specific interconnection relationship of the power protection design in this embodiment is as follows: Figure 4 shown.

[0040] The working principle of the present invention is as follows: The triple redundant power supply protection solution combining software and hardware ensures that when the operating current of the component under test is too large due to latching or other conditions, the output of the voltage regulator is turned off in time. The test flow diagram of this solution is as follows: Figure 1 As shown, the overall structure diagram is as follows Figure 2 shown.

[0041] The first power protection is the optimized manual operation mode. Since some components such as processors usually require two or more power inputs with different voltages, the output of the voltage regulator is set to a higher voltage range during design, and then converted into a lower voltage secondary power supply through the power module on the test board for the components to be tested. At this time, the change in the working current of the component to be tested will only be reflected in the output current of the voltage regulator, which will be a small fluctuation and cannot be used as a criterion for whether power is needed to be cut off. This design adds a current detection resistor to the secondary power supply output by the power module on the test board, and collects the working current of the component to be tested in real time through a dedicated power monitoring chip. The collection results of the power monitoring chip can be read through the MCU chip on the board that controls the secondary power switch, and the collected values ​​are transmitted back to the ground through the serial port. The operator can observe the working current and change trend of the component to be tested more intuitively through the host computer software, and manually cut off the power supply in time.

[0042] The second power protection is to control the power supply through MCU. First, the host computer software sends the current threshold parameter to the MCU on the test board. After the test starts, the MCU transmits the working current of the component to be tested in real time and compares it with the preset current threshold. When it is found that the working current is greater than the set current, the power module is turned off. Compared with the first power protection solution, this solution avoids the delay of manual power switching, and even if a communication failure occurs during the test and the host computer cannot obtain current, the system can still perform the test normally, with a higher degree of automation.

[0043] The third power supply protection is to control the power supply through a differential amplifier and a voltage comparator. During the experiment, the voltage drop across the current detection resistor is first sampled and amplified by a differential amplifier to improve the system's anti-interference ability, and then used as the inverting input of the voltage comparator to compare with the threshold voltage calculated in advance and obtained by resistor voltage division. When the operating current of the component to be tested is less than the designed threshold, the output voltage of the differential amplifier is less than the threshold voltage. At this time, the voltage comparator outputs a high level and the power module works normally; otherwise, the voltage comparator will output a low level and shut down the power module. Compared with the second power supply protection scheme, this scheme needs to calculate the threshold voltage corresponding to the current threshold and weld and debug the voltage divider resistor on the test board in advance, which loses the flexibility of software on-site adjustment; but because it does not involve complex logic such as digital circuits, its response time is shorter and its reliability is higher.

[0044] The above describes the hardware logic of the power protection solution. For different test scenarios, the above hardware needs to be installed in different positions of the test board: For total dose tests, the common practice is to divide the test system into two parts: the power supply board and the irradiation board. The irradiation board is used to carry the components to be tested and expose them to the radiation space. The power supply board is placed in an environment protected by lead bricks, and uses the power supply module on the board to generate various secondary power supplies required by the components to be tested, and then supplies power to the irradiation board through power cables. Considering non-irradiation-resistant devices such as current monitoring chips, the above power protection hardware should be designed on the power supply board for total dose tests.

[0045] For single particle testing, due to the limited area of ​​the particle beam, the common practice is to design the components to be tested, the power module, and the peripheral circuit on the same printed circuit board. Therefore, for single particle testing, the above power protection hardware should be designed near the power module to avoid being impacted by the particle beam.

[0046] With the trend of precision and expansion in the application of electronic components in the future, the impact of radiation effects on microcircuits cannot be ignored. In order to assess the working ability of components in a high-energy particle irradiation environment and confirm the limit of radiation damage to microcircuits, various irradiation tests are inevitable. Taking into account that single-particle latching and other situations may occur during the irradiation test, resulting in excessive working current, causing device burnout, overcurrent damage, equipment damage and other problems, the present invention proposes a highly reliable, highly responsive, and flexible triple-redundant irradiation test power supply protection design scheme. This scheme overcomes the current situation of complete reliance on manual observation, can automatically and timely shut down the output of the voltage regulator, has a shorter response time, higher reliability, and has certain engineering application value. The above are only preferred embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A power supply protection system for irradiation test, characterized in that: The invention comprises a connected test board (2) and a secondary power supply board (1); the test board (2) is provided with a component to be tested (3); the secondary power supply board (1) is provided with a power module (5), a current detection resistor (6) and an MCU (4); the power module (5) is connected to an external power supply via an external power supply electrical connector (9); the current detection resistor (6) is connected in series between the power module (5) and the component to be tested (3); the current detection resistor (6) is connected to a power monitoring chip; the power monitoring chip is connected to the MCU (4); the MCU (4) is connected to a host computer via a host computer electrical connector (8); the MCU (4) is connected to the power module (5); and a current threshold parameter is pre-set in the host computer.

2. The power supply protection system for irradiation test according to claim 1, characterized in that: The power supply board (1) is also provided with a differential amplifier (7) connected to the current detection resistor (6); the differential amplifier (7) is connected to a voltage comparator; the voltage comparator is connected to the power module (5); and the threshold voltage of the current detection resistor (6) is pre-set in the voltage comparator.

3. The power supply protection system for irradiation test according to claim 2, characterized in that: When a total dose test is performed, the test board (2) is exposed to a radiation space, and lead bricks are arranged around the secondary power supply board (1) and the components arranged thereon; the secondary power supply board (1) supplies power to the test board (2) via a power cable.

4. The power supply protection system for irradiation test according to claim 2, characterized in that: When a single particle test is performed, the test board (2) and the secondary power supply board (1) are arranged on the same printed circuit board.

5. The power supply protection system for irradiation test according to claim 2, characterized in that: The test board (2) has a self-test program.

6. A power supply protection method for irradiation test based on the system according to any one of claims 1 to 5, characterized in that: include: The operating current of the component to be tested (3) is collected in real time by the power monitoring chip, and the collected result is transmitted to the MCU (4). The MCU (4) transmits it to the host computer. The operator observes the operating current and the change trend of the component to be tested (3) through the host computer, and manually cuts off the external power supply when an abnormality occurs, thereby realizing the first level of power supply protection.

7. The power supply protection method for irradiation test according to claim 6, characterized in that: include: The components (3) to be tested are placed on the test board (2), the external power input is turned on, and the current threshold parameter and the threshold voltage are set, and then a self-test is performed on the test board (2). After the self-test is successful, an irradiation experiment is performed.

8. The power supply protection method for irradiation test according to claim 7, characterized in that: include: The host computer sends the preset current threshold parameter to the MCU (4). The MCU (4) transmits the collected result to the host computer and compares it with the preset current threshold parameter. When the collected result is greater than the current threshold parameter, the MCU (4) shuts down the power module (5) to achieve the second power protection.

9. The power supply protection method for irradiation test according to claim 8, characterized in that: include: The voltage drop across the current detection resistor (6) is sampled and amplified by the differential amplifier (7), and then used as an inverting input of the voltage comparator and compared with the threshold voltage. When the inverting input is less than the threshold voltage, the output voltage of the differential amplifier is less than the threshold voltage. At this time, the voltage comparator outputs a high level, and the power supply module (5) works normally. Otherwise, the voltage comparator will output a low level, shutting down the power supply (5), thereby realizing the third level of power supply protection.

10. The power supply protection method for irradiation test according to claim 9, characterized in that: include: When any of the first power protection, the second power protection and the third power protection is triggered, resulting in the power input to the component under test (3) being turned off, it is determined whether the component under test (3) is failed. If so, the irradiation test is terminated; otherwise, the power input is controlled to be turned back on.

Images