Element quantitative analysis method and device, electronic equipment and storage medium

Abstract

The invention discloses an element quantitative analysis method and device, electronic equipment and a storage medium. The element quantitative analysis method comprises the steps that spectral data of rays penetrating through a to-be-detected sample and a reference sample are obtained, the to-be-detected sample comprises at least one to-be-detected element, and the reference sample is a sample with the same matrix composition as the to-be-detected sample but does not contain the to-be-detected element; and determining the transmittance value at the absorption edge of each element to be detected in the sample to be detected based on the spectral data of the sample to be detected and the reference sample, and determining the concentration value of each element to be detected in the sample to be detected based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected.

Description

Technical Field

[0001] The present invention relates to the technical field of element quantitative analysis, and in particular to an element quantitative analysis method, device, electronic equipment and storage medium. Background Art

[0002] As a fast and non-destructive analytical technology, X-ray absorption edge spectroscopy is widely used in spent fuel reprocessing process control analysis and nuclear material balance, such as the measurement of high-concentration uranium, plutonium and other element contents in process liquid. In dry reprocessing, the spent fuel and product components are different from those in water reprocessing. The plutonium content is about 30%, and the contents of uranium and plutonium are close. Since the absorption edge energies of uranium and plutonium are relatively close (the K absorption edge energy difference is 6.185keV, and the LIII edge energy difference is 0.891keV), serious overlapping interference occurs in the absorption edge spectrum. The single element X-ray absorption edge spectroscopy established by related technologies is not suitable for the simultaneous determination of uranium and plutonium with similar contents. Summary of the invention

[0003] In view of this, embodiments of the present invention provide a method, device, electronic device and storage medium for element quantitative analysis, aiming to effectively measure the content of an element to be measured in a sample.

[0004] The technical solution of the embodiment of the present invention is achieved as follows:

[0005] In one aspect, an embodiment of the present invention provides a method for quantitative element analysis, the method comprising:

[0006] Acquire spectral data of radiation passing through a sample to be tested and a reference sample; the sample to be tested includes at least one element to be tested, and the reference sample is a sample having the same matrix composition as the sample to be tested but not containing the element to be tested;

[0007] Determine the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample;

[0008] Based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected, the concentration value of each element to be detected in the sample to be detected is determined.

[0009] In the above scheme, determining the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample includes:

[0010] In the spectrum data of the sample to be tested, a fitting interval is determined on both sides outside the absorption edge of each element to be tested;

[0011] In the spectrum data of the sample to be tested, a transmittance calculation point is determined on both sides of the absorption edge of each element to be tested;

[0012] Calculating the transmittance corresponding to each spectral data point in each fitting interval according to the spectral data of the sample to be tested and the reference sample;

[0013] According to the transmittance corresponding to each spectral data point in each fitting interval, the spectral data points in the fitting interval on both sides outside each absorption edge are fitted, and extrapolated to the transmittance calculation points on both sides inside the absorption edge to calculate the transmittance value at the absorption edge of the corresponding element to be measured.

[0014] In the above solution, the number of the fitting intervals is one more than the number of the elements to be measured.

[0015] In the above solution, the transmittance is the ratio of the transmitted light intensity of the sample to be tested to the transmitted light intensity of the reference sample.

[0016] In the above scheme, after acquiring the spectral data of the radiation passing through the sample to be tested and the reference sample, the method further comprises:

[0017] Performing smoothing on the spectral data;

[0018] Based on the smoothed spectral data points, spectral data points of net intensity are obtained.

[0019] In the above scheme, determining the concentration value of each element to be detected in the sample to be detected based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected includes:

[0020] The concentration value of each element to be measured in the sample to be measured is calculated according to the transmittance value at the absorption edge of each element to be measured and the preset quantitative analysis model of each element to be measured.

[0021] In the above solution, the method further includes:

[0022] Determine the absorption coefficient of each element to be measured based on the spectral data of the reference sample and the standard sample; the standard sample is a sample containing the element to be measured with a known concentration;

[0023] Based on the absorption coefficient of each element to be measured, a quantitative analysis model corresponding to each element is constructed.

[0024] On the other hand, an embodiment of the present invention provides an element quantitative analysis device, the device comprising:

[0025] An acquisition module is used to acquire spectral data of radiation passing through a sample to be tested and a reference sample; the sample to be tested includes at least one element to be tested, and the reference sample is a sample having the same matrix composition as the sample to be tested but not containing the element to be tested;

[0026] A first determination module is used to determine the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample;

[0027] The second determination module is used to determine the concentration value of each element to be detected in the sample to be detected based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected.

[0028] On the other hand, an embodiment of the present application further provides a computer program product, including a computer program, which, when executed by a processor, implements the steps of the above-mentioned element quantitative analysis method.

[0029] On the other hand, an embodiment of the present invention provides an electronic device, comprising a processor and a memory, wherein the processor and the memory are interconnected, wherein the memory is used to store a computer program, the computer program comprises program instructions, and the processor is configured to call the program instructions to execute the steps of the element quantitative analysis method provided in the first aspect of the embodiment of the present invention.

[0030] On the other hand, an embodiment of the present invention provides a computer-readable storage medium, including: the computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the steps of the element quantitative analysis method provided in the first aspect of the embodiment of the present invention are implemented.

[0031] The embodiment of the present application obtains the spectral data of the rays passing through the sample to be tested and the reference sample, wherein the sample to be tested includes at least one element to be tested, and the reference sample is a sample whose matrix composition is the same as that of the sample to be tested but does not contain the element to be tested. Based on the spectral data of the sample to be tested and the reference sample, the transmittance value at the absorption edge of each element to be tested in the sample to be tested is determined, and based on the transmittance value at the absorption edge of each element to be tested in the sample to be tested, the concentration value of each element to be tested in the sample to be tested is determined. The embodiment of the present application can realize the simultaneous determination of multiple elements in the sample, and can obtain the concentrations of multiple elements in the sample to be tested at one time. During the process operation, the changes in the content of the elements to be tested can be quickly and real-time monitored to provide technical support for the process operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 It is a schematic diagram of the implementation process of a method for quantitative element analysis provided by an embodiment of the present invention;

[0033] Figure 2is a schematic diagram of an absorption edge of an element provided by an embodiment of the present invention;

[0034] Figure 3 is a schematic diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0035] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0036] As a fast and non-destructive analytical technology, X-ray absorption edge spectroscopy is widely used in spent fuel reprocessing process control analysis and nuclear material balance, such as the measurement of high-concentration uranium, plutonium and other element contents in process liquid. In dry reprocessing, the spent fuel and product components are different from those in water reprocessing. The plutonium content is about 30%, and the contents of uranium and plutonium are close. Since the absorption edge energies of uranium and plutonium are relatively close (the K absorption edge energy difference is 6.185keV, and the LIII edge energy difference is 0.891keV), serious overlapping interference occurs in the absorption edge spectrum. The currently established single element X-ray absorption edge spectroscopy is not suitable for the simultaneous determination of uranium and plutonium with similar contents.

[0037] In view of the shortcomings of the above-mentioned related technologies, the embodiment of the present invention provides an element quantitative analysis method, establishes a data processing method and a quantitative analysis model for multi-boundary X-ray absorption edge spectra, and realizes the simultaneous determination of multiple elements. In order to illustrate the technical solution of the present invention, a specific embodiment is used for description below.

[0038] Figure 1 The following is a schematic diagram of an implementation process of an element quantitative analysis method provided by an embodiment of the present invention. The execution subject of the element quantitative analysis method is an electronic device, and the electronic device includes a desktop computer, a laptop computer, and a server. The server can be a physical device or a virtualized device deployed in the cloud. Figure 1 , element quantitative analysis methods include:

[0039] S101, obtaining spectral data of radiation passing through a sample to be tested and a reference sample; the sample to be tested includes at least one element to be tested, and the reference sample is a sample having the same matrix composition as the sample to be tested but not containing the element to be tested.

[0040] Here, the radiation may be an X-ray, which is emitted by a radiation light source. The energy of the emitted radiation may be controlled by adjusting the operating voltage and current of the radiation light source.

[0041] The reference sample has the same matrix composition as the sample to be tested except for the element to be tested. For example, the sample to be tested includes two elements to be tested, uranium and plutonium.

[0042] The spectrometer can be used to obtain the spectral data of the radiation passing through the sample to be tested and the reference sample, for example:

[0043] Reference sample spectrum acquisition: The reference sample spectrum can be acquired at a lower current and a shorter measurement time.

[0044] Acquisition of the spectrum of the sample to be tested: The spectrum of the sample to be tested can be obtained at a larger current and a longer measurement time.

[0045] The embodiment of the present invention is applicable to the following situations: the contents of the elements to be measured in the samples are close and at the same order of magnitude; the absorption edge energies of the elements to be measured are close and there is mutual interference.

[0046] S102, determining the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample.

[0047] Specific elements have specific absorption edges for X-ray absorption, which is reflected in the spectrum as a sharp drop in absorption coefficient at a specific wavelength. For samples that need elemental analysis, qualitative information about the elemental composition of the sample can be obtained by observing its X-ray absorption curve and analyzing each absorption edge.

[0048] Among them, in the spectrum corresponding to the sample to be tested, each absorption edge corresponds to an element to be tested. The energy at the absorption edge is calculated, and the corresponding database is queried to determine the element to be tested corresponding to each absorption edge.

[0049] like Figure 2 As shown, Figure 2 The absorption edge of element 1 and the absorption edge of element 2 are shown.

[0050] The transmittance value corresponding to each element to be measured in the sample to be measured can be determined according to the transmitted light intensity of the sample to be measured at each absorption edge and the transmitted light intensity of the reference sample.

[0051] For example, for a certain absorption edge, the transmittance of each spectral data point in the absorption edge can be calculated based on the transmitted light intensity of the sample to be tested at energy E and the transmitted light intensity of the reference sample at energy E, and the transmittance ratio of the transmittance calculation points selected on both sides of the absorption edge can be used as the transmittance value of the absorption edge of the corresponding element to be tested.

[0052] In one embodiment, the transmittance is the ratio of the transmitted light intensity of the sample to be tested to the transmitted light intensity of the reference sample.

[0053] In this embodiment, the transmittance and the transmittance value are different. The transmittance represents a spectral data point, and the transmittance value represents a change in the transmittance at the absorption edge of the element to be measured.

[0054] S103, determining the concentration value of each element to be detected in the sample to be detected based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected.

[0055] The concentration of the element to be tested in the sample to be tested is correlated with the transmittance value at the absorption edge. This relationship can be expressed by a quantitative analysis model. The transmittance value corresponding to the element to be tested can be input into the corresponding quantitative analysis model to obtain the concentration value of the element to be tested.

[0056] The parameters in the quantitative analysis model of each element are different. Prior to this, it is necessary to measure the X-ray absorption spectrum based on the standard sample with known concentration of the element to be measured, and build a quantitative analysis model for each element, that is, to determine the parameters of the model (formula). The constructed model can measure the concentration of the element to be measured.

[0057] The embodiment of the present application obtains the spectral data of the rays passing through the sample to be tested and the reference sample, wherein the sample to be tested includes at least one element to be tested, and the reference sample is a sample whose matrix composition is the same as that of the sample to be tested but does not contain the element to be tested. Based on the spectral data of the sample to be tested and the reference sample, the transmittance value at the absorption edge of each element to be tested in the sample to be tested is determined, and based on the transmittance value at the absorption edge of each element to be tested in the sample to be tested, the concentration value of each element to be tested in the sample to be tested is determined. The embodiment of the present application can realize the simultaneous determination of multiple elements in the sample, and can obtain the concentrations of multiple elements in the sample to be tested at one time. During the process operation, the changes in the content of the elements to be tested can be quickly and real-time monitored to provide technical support for the process operation.

[0058] In one embodiment, determining the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample includes:

[0059] In the spectrum data of the sample to be tested, a fitting interval is determined on both sides outside the absorption edge of each element to be tested;

[0060] In the spectrum data of the sample to be tested, a transmittance calculation point is determined on both sides of the absorption edge of each element to be tested;

[0061] Calculating the transmittance corresponding to each spectral data point in each fitting interval according to the spectral data of the sample to be tested and the reference sample;

[0062] According to the transmittance corresponding to each spectral data point in each fitting interval, the spectral data points in the fitting interval on both sides outside each absorption edge are fitted, and extrapolated to the transmittance calculation points on both sides inside the absorption edge to calculate the transmittance value at the absorption edge of the corresponding element to be measured.

[0063] like Figure 2 As shown, the fitting intervals on both sides of the absorption edge of element 1 are (x1, x2) and (x3, x4), and the fitting intervals on both sides of the absorption edge of element 2 are (x3, x4) and (x5, x6).

[0064] In one embodiment, the number of fitting intervals is one more than the number of elements to be measured. For example, for a sample containing n (n≥2) elements to be measured, n+1 fitting intervals need to be selected.

[0065] In one embodiment, the fitting interval points are selected by the coordinate rotation method, the relative standard deviation s is used as the evaluation index, and the optimal coordinate rotation method is adopted to obtain the boundary value of the optimal point s, and the steps include:

[0066] (1) Select the initial x1, x 2...... x 2n+2 .

[0067] (2) Fixed x 2...... x 2n+2 ; x1 increases step by step, calculates s, finds the minimum value x1' of s, and fixes x1 to x1'.

[0068] (3) Follow the method in step (2) to perform the following x 2...... x 2n+2 The value of

[0069] (4) When the s value meets the requirements, determine the above x1', x2'...x 2n+2 ' is the fitting boundary point; if it does not meet the requirements, repeat steps (2) to (3) until the s value meets the requirements.

[0070] In one embodiment, the transmittance calculation points are selected by the coordinate rotation method. For a sample containing n elements to be measured, two points need to be selected on both sides of each absorption edge to calculate the transmittance respectively. The transmittance calculation points are also determined by the optimized coordinate rotation method.

[0071] The transmittance of the sample can be calculated by the following formula:

[0072]

[0073] Wherein, I(E) is the net intensity of the sample to be tested at energy E, and I0(E) is the net intensity of the reference sample at energy E. The net intensity may refer to the intensity of the transmitted light.

[0074] For the data points of the fitting interval on both sides of the absorption edge, The fitting is then extrapolated to the transmittance calculation points on both sides of the absorption edge (the energy of which is recorded as E - and E + ), calculate the transmittance value at the absorption edge of the corresponding element to be measured

[0075] By performing the above fitting calculations on different elements to be measured, the transmittance value at the absorption edge of each element to be measured can be obtained.

[0076] In one embodiment, the transmittance is the ratio of the transmitted light intensity of the sample to be tested to the transmitted light intensity of the reference sample.

[0077] In one embodiment, after acquiring the spectral data of the radiation passing through the sample to be tested and the reference sample, the method further comprises:

[0078] Performing smoothing on the spectral data;

[0079] Based on the smoothed spectral data points, spectral data points of net intensity are obtained.

[0080] For example, after obtaining the spectral data, the spectral data is preprocessed first, and the preprocessing includes:

[0081] (1) Spectral data correction

[0082] The acquired spectral data is corrected according to the current intensity set during the measurement and the actual measurement time of the detector. The corrected intensity value is calculated according to the following formula:

[0083] I 校正 =I 测量 ×F(current)÷T(time) (Formula 2)

[0084] Wherein: F (current) is the correction factor of current intensity, T (time) is the correction factor of measurement time, T (time) = measurement time × (1-dead time).

[0085] It takes a certain amount of time for the detector to process incoming ray signals. If the previous ray has not been processed and the next ray has entered, the ray may not be processed, which is the dead time effect. The reason why the dead time of the measurement system is large is that the measured count rate is too high, which will make the measurement result inaccurate, so the measurement result needs to be corrected for dead time.

[0086] (2) Spectral data smoothing

[0087] The Fourier transform algorithm is used to smooth the measured spectral data and obtain the smoothed spectral data points without affecting the shape of the spectrum.

[0088] The spectrum is composed of a series of data points. After connecting the lines, many burrs can be seen, which are mainly noise signals from the detector. Smoothing can make the spectrum smoother and reduce the impact of noise.

[0089] (3) Net strength calculation

[0090] The background (X-ray scattering signal) of the measured spectral data is fitted using the Fourier transform algorithm, and the background data points are subtracted from the smoothed spectral data points to obtain the spectral data points of net intensity.

[0091] In one embodiment, determining the concentration value of each element to be detected in the sample to be detected based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected includes:

[0092] The concentration value of each element to be measured in the sample to be measured is calculated according to the transmittance value at the absorption edge of each element to be measured and the preset quantitative analysis model of each element to be measured.

[0093] For example, the quantitative analysis model is shown in the following formula:

[0094]

[0095] Among them, the transmittance value at the absorption edge of the element to be measured is c i is the concentration of element i; E is the absorption edge energy of a certain element to be measured in the sample; Δu i (E) = u i (E - )-u i (E + ),u i (E) is the absorption coefficient of element i to X-rays with energy E.

[0096] Among them, the concentration of element i is an unknown number, and other parameters are known parameters. Therefore, by inputting the transmittance value, the concentration of the element i to be measured can be calculated.

[0097] In one embodiment, the method further comprises:

[0098] Determine the absorption coefficient of each element to be measured based on the spectral data of the reference sample and the standard sample; the standard sample is a sample containing the element to be measured with a known concentration;

[0099] Based on the absorption coefficient of each element to be measured, a quantitative analysis model corresponding to each element is constructed.

[0100] According to formula (3), the concentration of each element in the standard sample is known, and the fitting formula is obtained by multivariate linear fitting method for the absorption edge of each element to be measured: The coefficient Δu i and b values, and establish a quantitative analysis model for the multi-boundary algorithm. i is the absorption coefficient of the element, and b is the constant parameter of the linear fitting formula.

[0101] Among them, the quantitative analysis model corresponding to each element is different, so it is necessary to perform fitting calculations for each element separately to obtain the coefficient Δu in the fitting formula of each element i and the value of b.

[0102] In one embodiment, after the quantitative analysis model is established, the accuracy and precision of the quantitative analysis model need to be determined.

[0103] Prepare mixed standard solutions of strontium and yttrium of different concentrations, measure X-ray absorption spectra, and establish a quantitative analysis model. The correlation coefficient R 2 =0.999.

[0104] A mixed solution of strontium and yttrium with known concentrations was prepared. After measuring the absorption spectrum, the above model was used to calculate the concentrations of strontium and yttrium in the solution. The results are shown in Table 1. The relative error of the calculation results of the model is within ±3%.

[0105]

[0106]

[0107] Table 1

[0108] Take the strontium concentration as 50g·L -1 , Yttrium 50 concentration is 50g·L -1 The sample (sample number 10) was measured 6 times and the relative standard deviation was calculated. The results are shown in Table 2. The relative standard deviation was within 0.5%.

[0109] serial number <![CDATA[Strontium (g·L -1 )]]> <![CDATA[Yttrium (g·L -1 )]]> 1 49.76 50.46 2 50.32 50.38 3 49.7 50.62 4 49.85 49.99 5 50.2 50.21 6 49.91 50.15 average value 49.96 50.30 Relative standard deviation 0.45％ 0.41％

[0110] Table 2

[0111] The X-ray absorption edge spectroscopy analysis technology provided in the embodiment of the present application can realize the simultaneous measurement of multiple elements and is also suitable for the quantitative analysis of single elements. During the process operation, the change of the content of the element to be measured can be monitored quickly and in real time, providing technical support for the process operation. This method can reduce the sample pretreatment process, especially for radioactive samples, and can reduce the radiation dose of operators.

[0112] It should be understood that the order of execution of the steps in the above embodiment does not necessarily mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present invention.

[0113] It should be understood that when used in this specification and the appended claims, the terms "include" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or combinations thereof.

[0114] It should be noted that the technical solutions described in the embodiments of the present invention can be combined arbitrarily without conflict.

[0115] In addition, in the embodiments of the present invention, "first", "second", etc. are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.

[0116] The present application also provides an element quantitative analysis device, which corresponds to the above-mentioned element quantitative analysis method, and each step in the above-mentioned element quantitative analysis method embodiment is also fully applicable to the present device embodiment. The device includes:

[0117] An acquisition module is used to acquire spectral data of radiation passing through a sample to be tested and a reference sample; the sample to be tested includes at least one element to be tested, and the reference sample is a sample having the same matrix composition as the sample to be tested but not containing the element to be tested;

[0118] A first determination module is used to determine the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample;

[0119] The second determination module is used to determine the concentration value of each element to be detected in the sample to be detected based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected.

[0120] In one embodiment, the first determining module is specifically configured to:

[0121] In the spectrum data of the sample to be tested, a fitting interval is determined on both sides outside the absorption edge of each element to be tested;

[0122] In the spectrum data of the sample to be tested, a transmittance calculation point is determined on both sides of the absorption edge of each element to be tested;

[0123] Calculating the transmittance corresponding to each spectral data point in each fitting interval according to the spectral data of the sample to be tested and the reference sample;

[0124] According to the transmittance corresponding to each spectral data point in each fitting interval, the spectral data points in the fitting interval on both sides outside each absorption edge are fitted, and extrapolated to the transmittance calculation points on both sides inside the absorption edge to calculate the transmittance value at the absorption edge of the corresponding element to be measured.

[0125] In one embodiment, the number of the fitting intervals is one more than the number of elements to be measured.

[0126] In one embodiment, the transmittance is the ratio of the transmitted light intensity of the sample to be tested to the transmitted light intensity of the reference sample.

[0127] In one embodiment, the device further comprises:

[0128] A smoothing module, used for smoothing the spectral data;

[0129] The net intensity processing module is used to obtain the spectral data points of net intensity based on the spectral data points after smoothing.

[0130] In one embodiment, the second determining module is specifically configured to:

[0131] The concentration value of each element to be tested in the sample to be tested is calculated according to the transmittance value and a preset quantitative analysis model of each element to be tested.

[0132] In one embodiment, the device further comprises:

[0133] A third determination module is used to determine the absorption coefficient of each element to be measured based on the spectral data of the reference sample and the standard sample; the standard sample is a sample containing the element to be measured with a known concentration;

[0134] The construction module is used to construct a quantitative analysis model corresponding to each element based on the absorption coefficient of each element to be measured.

[0135] In actual application, the acquisition module, the first determination module and the second determination module can be implemented by a processor in an electronic device, such as a central processing unit (CPU), a digital signal processor (DSP), a microcontroller unit (MCU) or a programmable gate array (FPGA).

[0136] It should be noted that: the element quantitative analysis device provided in the above embodiment only uses the division of the above modules as an example when performing element quantitative analysis. In actual applications, the above processing can be assigned to different modules as needed, that is, the internal structure of the device is divided into different modules to complete all or part of the processing described above. In addition, the element quantitative analysis device provided in the above embodiment and the element quantitative analysis method embodiment belong to the same concept, and the specific implementation process is detailed in the method embodiment, which will not be repeated here.

[0137] The above-mentioned element quantitative analysis device can be in the form of an image file. After the image file is executed, it can be run in the form of a container or a virtual machine to implement the element quantitative analysis method described in this application. Of course, it is not limited to the image file form. As long as some software forms that can implement the element quantitative analysis method described in this application are within the protection scope of this application.

[0138] Based on the hardware implementation of the above program modules and in order to implement the method of the embodiment of the present application, the embodiment of the present application also provides an electronic device. Figure 3 Schematic diagram of the hardware structure of the electronic device of the present application embodiment. Figure 3 As shown, the electronic equipment includes:

[0139] Communication interface, which can exchange information with other devices such as network equipment;

[0140] The processor is connected to the communication interface to realize information exchange with other devices, and is used to execute the method provided by one or more technical solutions of the electronic device side when running the computer program. The computer program is stored in the memory.

[0141] The electronic device may be externally connected to an X-ray absorption edge densitometer.

[0142] Of course, in actual applications, the various components in the electronic device are coupled together through the bus system. It is understandable that the bus system is used to achieve connection and communication between these components. In addition to the data bus, the bus system also includes a power bus, a control bus, and a status signal bus. However, for the sake of clarity, Figure 3 In the specification, various buses are labeled as bus systems.

[0143] The electronic devices mentioned above can be in the form of clusters, such as cloud computing platforms. The so-called cloud computing platform is a business form that uses computing virtualization, network virtualization, and storage virtualization technologies to organize multiple independent server physical hardware resources into pooled resources. It is a software-defined resource structure based on the development of virtualization technology, which can provide resource capabilities in the form of virtual machines and containers. By eliminating the fixed relationship between hardware and operating systems, relying on network connectivity to unify resource scheduling, and then providing the required virtual resources and services, it is a new type of IT and software delivery model with the characteristics of flexibility, elasticity, distribution, multi-tenancy, and on-demand.

[0144] The current cloud computing platform supports several service models:

[0145] SaaS (Software as a Service): Cloud computing platform users do not need to purchase software, but instead rent software deployed on the cloud computing platform. Users do not need to maintain the software, and the software service provider will fully manage and maintain the software;

[0146] PaaS (Platform as a Service): Cloud computing platform users (usually software developers in this case) can build new applications or extend existing applications on the architecture provided by the cloud computing platform without having to purchase development, quality control or production servers;

[0147] IaaS (Infrastructure as a Service): Cloud computing platforms provide data centers, infrastructure hardware and software resources through the Internet. Cloud computing platforms under the IaaS model can provide servers, operating systems, disk storage, databases and / or information resources.

[0148] The memory in the embodiment of the present application is used to store various types of data to support the operation of the electronic device. Examples of such data include: any computer program used to operate on the electronic device.

[0149] It can be understood that the memory can be a volatile memory or a non-volatile memory, and can also include both volatile and non-volatile memories. Among them, the non-volatile memory can be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a magnetic random access memory (FRAM), a flash memory, a magnetic surface memory, an optical disk, or a compact disc read-only memory (CD-ROM); the magnetic surface memory can be a disk memory or a tape memory. The volatile memory can be a random access memory (RAM), which is used as an external cache. By way of example but not limitation, many forms of RAM are available, such as static random access memory (SRAM), synchronous static random access memory (SSRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDRSDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link dynamic random access memory (SLDRAM), direct memory bus random access memory (DRRAM). The memory described in the embodiments of the present application is intended to include but is not limited to these and any other suitable types of memory.

[0150] The method disclosed in the above embodiment of the present application can be applied to a processor or implemented by a processor. The processor may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by an integrated logic circuit of hardware in the processor or an instruction in the form of software. The above processor may be a general-purpose processor, a DSP, or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. The processor can implement or execute the various methods, steps and logic block diagrams disclosed in the embodiments of the present application. The general-purpose processor may be a microprocessor or any conventional processor, etc. In combination with the steps of the method disclosed in the embodiment of the present application, it can be directly embodied as a hardware decoding processor to execute, or it can be executed by a combination of hardware and software modules in the decoding processor. The software module can be located in a storage medium, which is located in a memory, and the processor reads the program in the memory and completes the steps of the above method in combination with its hardware.

[0151] Optionally, when the processor executes the program, the corresponding processes implemented by the electronic device in each method of the embodiments of the present application are implemented, which will not be described in detail here for the sake of brevity.

[0152] In an exemplary embodiment, the present application also provides a storage medium, namely a computer storage medium, specifically a computer-readable storage medium, for example, including a first memory storing a computer program, and the computer program can be executed by a processor of an electronic device to complete the steps of the aforementioned method. The computer-readable storage medium can be a memory such as FRAM, ROM, PROM, EPROM, EEPROM, Flash Memory, magnetic surface storage, optical disk, or CD-ROM.

[0153] In the several embodiments provided in the present application, it should be understood that the disclosed devices, electronic devices and methods can be implemented in other ways. The device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as: multiple units or components can be combined, or can be integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the components shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0154] The units described above as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units; some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0155] In addition, all functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may be a separate unit, or two or more units may be integrated into one unit; the above-mentioned integrated units may be implemented in the form of hardware or in the form of hardware plus software functional units.

[0156] A person of ordinary skill in the art can understand that: all or part of the steps of implementing the above-mentioned method embodiment can be completed by hardware related to program instructions, and the aforementioned program can be stored in a computer-readable storage medium, which, when executed, executes the steps of the above-mentioned method embodiment; and the aforementioned storage medium includes: various media that can store program codes, such as mobile storage devices, ROM, RAM, disks or optical disks.

[0157] Alternatively, if the above-mentioned integrated unit of the present application is implemented in the form of a software function module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the embodiment of the present application can be essentially or partly embodied in the form of a software product that contributes to the relevant technology. The computer software product is stored in a storage medium, including several instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the methods described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as mobile storage devices, ROM, RAM, magnetic disks or optical disks.

[0158] In an exemplary embodiment, the present application also provides a computer program product, including a computer program, which can be executed by a processor of an electronic device to complete the steps of the element quantitative analysis method in the embodiment of the present application.

[0159] It should be noted that the technical solutions described in the embodiments of the present application can be combined arbitrarily without conflict.

[0160] In addition, in the examples of the present application, "first", "second", etc. are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.

[0161] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A method for quantitative element analysis, characterized in that: The method comprises: Acquire spectral data of radiation passing through a sample to be tested and a reference sample; the sample to be tested includes at least one element to be tested, and the reference sample is a sample having the same matrix composition as the sample to be tested but not containing the element to be tested; Determine the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample; Based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected, the concentration value of each element to be detected in the sample to be detected is determined.

2. The method according to claim 1, characterized in that The step of determining the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample comprises: In the spectrum data of the sample to be tested, a fitting interval is determined on both sides outside the absorption edge of each element to be tested; In the spectrum data of the sample to be tested, a transmittance calculation point is determined on both sides of the absorption edge of each element to be tested; Calculating the transmittance corresponding to each spectral data point in each fitting interval according to the spectral data of the sample to be tested and the reference sample; According to the transmittance corresponding to each spectral data point in each fitting interval, the spectral data points in the fitting interval on both sides outside each absorption edge are fitted, and extrapolated to the transmittance calculation points on both sides inside the absorption edge to calculate the transmittance value at the absorption edge of the corresponding element to be measured.

3. The method according to claim 2, characterized in that The number of the fitting intervals is one more than the number of elements to be measured.

4. The method according to claim 2, characterized in that: The transmittance is the ratio of the transmitted light intensity of the sample to be tested to the transmitted light intensity of the reference sample.

5. The method according to claim 1, characterized in that After acquiring the spectral data of the radiation passing through the sample to be tested and the reference sample, the method further comprises: Performing smoothing on the spectral data; Based on the smoothed spectral data points, spectral data points of net intensity are obtained.

6. The method according to claim 1, characterized in that The step of determining the concentration value of each element to be detected in the sample to be detected based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected comprises: The concentration value of each element to be measured in the sample to be measured is calculated according to the transmittance value at the absorption edge of each element to be measured and the preset quantitative analysis model of each element to be measured.

7. The method according to claim 6, characterized in that The method further comprises: Determine the absorption coefficient of each element to be measured based on the spectral data of the reference sample and the standard sample; the standard sample is a sample containing the element to be measured with a known concentration; Based on the absorption coefficient of each element to be measured, a quantitative analysis model corresponding to each element is constructed.

8. An element quantitative analysis device, characterized in that: include: An acquisition module is used to acquire spectral data of radiation passing through a sample to be tested and a reference sample; the sample to be tested includes at least one element to be tested, and the reference sample is a sample having the same matrix composition as the sample to be tested but not containing the element to be tested; A first determination module is used to determine the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample; The second determination module is used to determine the concentration value of each element to be detected in the sample to be detected based on the transmittance value corresponding to each element to be detected in the sample to be detected.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the element quantitative analysis method according to any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a processor, the processor executes the element quantitative analysis method according to any one of claims 1 to 7.

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