Element quantitative analysis method and device, electronic equipment and storage medium

Abstract

An element quantitative analysis method and device, electronic equipment and storage medium are disclosed. The element quantitative analysis method comprises: obtaining spectral data of a sample to be measured and a reference sample through rays, the sample to be measured comprising at least one element to be measured, and the reference sample being a sample with the same matrix composition as the sample to be measured but not containing the element to be measured; determining a transmittance value at an absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample; and determining a concentration value of each element to be measured in the sample to be measured based on the transmittance value at the absorption edge of each element to be measured in the sample to be measured.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of element quantitative analysis, and particularly to an element quantitative analysis method and device, an electronic device, and a storage medium. BACKGROUND

[0002] As a kind of fast, non-destructive analysis technology, X-ray absorption edge spectrum analysis technology is widely used in spent fuel reprocessing process control analysis and nuclear material accounting, such as the measurement of high-concentration uranium, plutonium and other elements in process liquid. In dry reprocessing, the composition of spent fuel and product is different from that in wet reprocessing, and the content of plutonium is about 30%, and the contents of uranium and plutonium are close. Since the absorption edge energies of uranium and plutonium are relatively close (the K absorption edge energy difference is 6.185 keV, and the LIII edge energy difference is 0.891 keV), there is serious overlapping interference on the absorption edge spectrum. The single-element X-ray absorption edge spectrum method established by the related technology is not suitable for simultaneous determination of uranium and plutonium with close contents. SUMMARY

[0003] Therefore, the present application provides an element quantitative analysis method and device, an electronic device and a storage medium, which can effectively measure the content of the element to be measured in a sample.

[0004] The technical solution of the present application is as follows:

[0005] In one aspect, the present application provides an element quantitative analysis method, which comprises the following steps:

[0006] Obtaining spectral data of rays penetrating through a sample to be measured and a reference sample; the sample to be measured comprises at least one element to be measured, and the reference sample is a sample with the same matrix composition as the sample to be measured but without the element to be measured;

[0007] Determining the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample;

[0008] Determining the concentration value of each element to be measured in the sample to be measured based on the transmittance value at the absorption edge of each element to be measured in the sample to be measured.

[0009] In the above solution, the step of determining the transmittance value at the absorption edge of each element to be measured in the sample to be measured based on the spectral data of the sample to be measured and the reference sample comprises the following steps:

[0010] In the spectral data of the sample to be measured, a fitting interval is determined on each side of the absorption edge of each element to be measured;

[0011] Two transmittance calculation points are determined on both sides of the absorption edge of each element to be detected in the spectral data of the sample to be detected;

[0012] According to the spectral data of the sample to be detected and the reference sample, the transmittance corresponding to each spectral data point in each fitting interval is calculated;

[0013] According to the transmittance corresponding to each spectral data point in each fitting interval, the spectral data points in the fitting interval on both sides of the absorption edge are fitted, and the transmittance at the absorption edge of each element to be detected is calculated by extrapolating to the transmittance calculation points on both sides of the absorption edge.

[0014] In the above scheme, the number of fitting intervals is one more than the number of elements to be detected.

[0015] In the above scheme, the transmittance is the ratio of the transmitted light intensity of the sample to be detected to the transmitted light intensity of the reference sample.

[0016] In the above scheme, after the spectral data of the sample to be detected and the reference sample is obtained, the method further comprises:

[0017] The spectral data is smoothed;

[0018] Based on the spectral data points after smoothing, the spectral data points of net intensity are obtained.

[0019] In the above scheme, the concentration value of each element to be detected in the sample to be detected is determined based on the transmittance value at the absorption edge of each element to be detected in the sample to be detected, comprising:

[0020] According to the transmittance value at the absorption edge of each element to be detected and the preset quantitative analysis model of each element to be detected, the concentration value of each element to be detected in the sample to be detected is calculated.

[0021] In the above scheme, the method further comprises:

[0022] Based on the spectral data of the reference sample and the standard sample, the absorption coefficient of each element to be detected is determined; the standard sample is a sample containing an element to be detected with a known concentration;

[0023] Based on the absorption coefficient of each element to be detected, a quantitative analysis model corresponding to each element is constructed.

[0024] In another aspect, the embodiment of the present application provides an element quantitative analysis device, which comprises:

[0025] The acquisition module is configured to acquire spectral data of rays penetrating a sample to be measured and a reference sample; the sample to be measured comprises at least one element to be measured, and the reference sample is a sample having the same matrix composition as the sample to be measured but not containing the element to be measured;

[0026] The first determination module is configured to determine, based on the spectral data of the sample to be measured and the reference sample, a transmittance value at an absorption edge of each element to be measured in the sample to be measured.

[0027] The second determination module is configured to determine, based on the transmittance value at the absorption edge of each element to be measured in the sample to be measured, a concentration value of each element to be measured in the sample to be measured.

[0028] In another aspect, the embodiments of the present application further provide a computer program product, comprising a computer program, which, when executed by a processor, implements the steps of the element quantitative analysis method.

[0029] In another aspect, the embodiments of the present application provide an electronic device, comprising a processor and a memory, which are connected to each other, wherein the memory is configured to store a computer program, the computer program comprising program instructions, and the processor is configured to invoke the program instructions to execute the steps of the element quantitative analysis method provided in the first aspect of the embodiments of the present application.

[0030] In another aspect, the embodiments of the present application provide a computer-readable storage medium, comprising: the computer-readable storage medium stores a computer program. The computer program, when executed by a processor, implements the steps of the element quantitative analysis method provided in the first aspect of the embodiments of the present application.

[0031] The embodiments of the present application can realize simultaneous determination of multiple elements in a sample, and can obtain the concentration of multiple elements in the sample to be measured at one time. During the process operation, the change of the content of the element to be measured can be quickly and real-timely monitored, thereby providing technical support for the process operation. BRIEF DESCRIPTION OF DRAWINGS

[0032] Figure 1 is a schematic diagram of an implementation process of an element quantitative analysis method provided by the embodiments of the present application;

[0033] Figure 2is a schematic diagram of an absorption edge of an element provided by an embodiment of the present application.

[0034] Figure 3 is a schematic diagram of an electronic device provided by an embodiment of the present application. DETAILED DESCRIPTION

[0035] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some but not all of the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by a person of ordinary skill in the art without creative effort belong to the scope of protection of the present application.

[0036] As a fast and non-destructive analysis technique, X-ray absorption edge spectrum analysis technology has a wide application in spent fuel reprocessing process control analysis and nuclear material accounting, for example, measurement of high-concentration uranium, plutonium and other elements in process liquid. In dry reprocessing, the spent fuel and product components are different from those in aqueous reprocessing, in which the content of plutonium is about 30%, and the contents of uranium and plutonium are close. Since the absorption edge energies of uranium and plutonium are relatively close (the K absorption edge energy difference is 6.185 keV, and the LIII edge energy difference is 0.891 keV), there is serious overlapping interference on the absorption edge spectrum. The currently established single-element X-ray absorption edge spectrum method is not applicable to simultaneous determination of uranium and plutonium with close contents.

[0037] In view of the shortcomings of the above related technologies, the embodiments of the present application provide an element quantitative analysis method, establish a data processing method and a quantitative analysis model of multi-boundary X-ray absorption edge spectrum, and realize simultaneous determination of multiple elements. In order to describe the technical solutions of the present application, specific embodiments will be described below.

[0038] Figure 1 is a schematic diagram of the implementation process of an element quantitative analysis method provided by an embodiment of the present application. The execution subject of the element quantitative analysis method is an electronic device, which includes a desktop computer, a notebook computer, a server and the like. The server can be a physical device or a virtualized device deployed in the cloud. Referring to Figure 1 , the element quantitative analysis method includes:

[0039] S101, acquiring spectrum data of rays transmitted through a to-be-measured sample and a reference sample; the to-be-measured sample includes at least one to-be-measured element, and the reference sample is a sample with the same matrix composition as the to-be-measured sample but without the to-be-measured element.

[0040] Here, the rays can be X-rays, which are emitted by a ray light source. By adjusting the working voltage and current of the ray light source, the energy of the emitted rays can be controlled.

[0041] The reference sample and the sample to be measured have the same matrix composition except for the elements to be measured.

[0042] The spectral data of the rays penetrating the sample to be measured and the reference sample can be obtained by a spectrometer, for example:

[0043] Reference sample spectrum acquisition: The reference sample spectrum can be acquired at a smaller current and a shorter measurement time.

[0044] Sample spectrum acquisition: The sample spectrum can be acquired at a larger current and a longer measurement time.

[0045] The embodiments of the present application can be applied to: the content of the elements to be measured in the sample is close, and the absorption edge energies of the elements to be measured are close.

[0046] S102, based on the spectral data of the sample to be measured and the reference sample, determining the transmittance value at the absorption edge of each element to be measured in the sample to be measured.

[0047] A specific element has a specific absorption edge for X-ray absorption, which is represented as a sharp drop in absorption coefficient at a specific wavelength in the spectral graph. For a sample that needs to be analyzed, by observing its X-ray absorption curve, analyzing each absorption edge, the qualitative information of the sample element composition can be obtained.

[0048] In the spectral graph corresponding to the sample to be measured, each absorption edge corresponds to an element to be measured, the energy at the absorption edge is calculated, and the corresponding database is queried to determine the element to be measured corresponding to each absorption edge.

[0049] As shown in Figure 2 , Figure 2 The absorption edge of element 1 and the absorption edge of element 2 are shown.

[0050] The transmittance value of each element to be measured in the sample to be measured can be determined according to the transmitted light intensity of the sample to be measured at each absorption edge and the transmitted light intensity of the reference sample.

[0051] For example, for a certain absorption edge, the transmittance of each spectral data point in the absorption edge can be calculated according to the transmitted light intensity of the sample to be measured at energy E and the transmitted light intensity of the reference sample at energy E. The transmittance ratio of the selected transmittance calculation points on both sides of the absorption edge can be taken as the transmittance value of the absorption edge of the corresponding element to be measured.

[0052] In an embodiment, the transmittance is the ratio of the transmitted light intensity of the sample to be measured to the transmitted light intensity of the reference sample.

[0053] In the embodiment, the transmittance and the transmissivity value are different, the transmittance represents a spectral data point, and the transmissivity value represents a change value of the transmittance at the absorption edge of the element to be detected.

[0054] S103, determining a concentration value of each element to be detected in the sample to be detected based on the transmissivity value at the absorption edge of each element to be detected in the sample to be detected.

[0055] The concentration of the element to be detected in the sample to be detected is related to the transmissivity value at the absorption edge, and the relationship can be represented by a quantitative analysis model. The transmissivity value corresponding to the element to be detected can be input into the corresponding quantitative analysis model, so as to obtain the concentration value of the element to be detected.

[0056] The parameters in the quantitative analysis model of each element are different. Before this, a standard sample with a known concentration of the element to be detected needs to be measured to obtain a ray absorption spectrum, and a quantitative analysis model of each element is constructed, that is, the parameters of the model (formula) are determined. The constructed model can be used to measure the concentration of the element to be detected.

[0057] The embodiment of the application obtains spectral data of rays transmitted through a sample to be detected and a reference sample. The sample to be detected includes at least one element to be detected, and the reference sample is a sample with the same matrix composition as the sample to be detected but without the element to be detected. Based on the spectral data of the sample to be detected and the reference sample, a transmissivity value at an absorption edge of each element to be detected in the sample to be detected is determined. Based on the transmissivity value at the absorption edge of each element to be detected in the sample to be detected, a concentration value of each element to be detected in the sample to be detected is determined. The embodiment of the application can realize simultaneous measurement of multiple elements in a sample, and can obtain the concentration of multiple elements in the sample to be detected at one time. In the process of running, the change of the content of the element to be detected can be quickly and real-timely monitored, thereby providing technical support for process running.

[0058] In an embodiment, the determination of the transmissivity value at the absorption edge of each element to be detected in the sample to be detected based on the spectral data of the sample to be detected and the reference sample includes:

[0059] In the spectral data of the sample to be detected, a fitting interval is determined on each side of the absorption edge of each element to be detected;

[0060] In the spectral data of the sample to be detected, a transmittance calculation point is determined on each side of the absorption edge of each element to be detected;

[0061] According to the spectral data of the sample to be detected and the reference sample, the transmittance corresponding to each spectral data point in each fitting interval is calculated;

[0062] According to the transmittance corresponding to each spectral data point in each fitting interval, the spectral data points in the fitting intervals on both sides of each absorption edge are fitted, and the transmittance values of the corresponding to-be-detected elements at the absorption edges are calculated by extrapolating to the transmittance calculation points on both sides of the absorption edges.

[0063] As shown in Figure 2 , the fitting intervals on both sides of the element 1 absorption edge are (x1, x2) and (x3, x4), and the fitting intervals on both sides of the element 2 absorption edge are (x3, x4) and (x5, x6).

[0064] In an embodiment, the number of fitting intervals is one more than the number of to-be-detected elements, for example, for a sample containing n (n≥2) to-be-detected elements, n+1 fitting intervals are needed to be selected.

[0065] In an embodiment, the fitting interval points are selected by the coordinate rotation method, and the boundary values of the s optimal point are obtained by using the optimal coordinate rotation method with the relative standard deviation s as the index, and the steps include:

[0066] (1) Select the initial x1, x 2...... x 2n+2 .

[0067] (2) Fix x 2...... x 2n+2 , and increase x1 by channel, calculate s, and find the value x1' of the minimum s, and fix x1 as x1'.

[0068] (3) According to the method of step (2), the values of subsequent x 2...... x 2n+2 are fixed

[0069] (4) When the s value meets the requirements, the above x1', x2'... x 2n+2 ' are determined as the fitting boundary points; if the requirements are not met, steps (2)-(3) are repeated until the s value meets the requirements.

[0070] In an embodiment, the transmittance calculation points are selected by the coordinate rotation method, and for a sample containing n to-be-detected elements, 2 points are needed to be selected on both sides of each absorption edge to calculate the transmittance, and the optimal coordinate rotation method is also used to determine the transmittance calculation points.

[0071] The transmittance of the sample can be calculated by the following formula:

[0072]

[0073] Wherein, I(E) is the net intensity of the to-be-detected sample at energy E, and I0(E) is the net intensity of the reference sample at energy E. The net intensity can refer to the transmitted light intensity.

[0074] The data points in the fitting interval on both sides of the absorption edge are fitted , and extrapolated to the transmittance calculation points (whose energy is recorded as E - and E + ) on both sides of the absorption edge, and the transmittance values of the corresponding elements to be measured at the absorption edge are calculated

[0075] The above fitting calculation is performed on different elements to be measured, and the transmittance values of each element to be measured at the absorption edge are obtained.

[0076] In an embodiment, the transmittance is the ratio of the transmitted light intensity of the sample to be measured to the transmitted light intensity of the reference sample.

[0077] In an embodiment, after the spectral data of the rays transmitted through the sample to be measured and the reference sample are obtained, the method further comprises:

[0078] smoothing the spectral data;

[0079] obtaining the spectral data points of the net intensity based on the spectral data points after smoothing.

[0080] For example, after the spectral data is obtained, the spectral data is preprocessed, and the preprocessing includes:

[0081] (1) spectral data correction

[0082] The obtained spectral data is corrected according to the current intensity and the actual measurement time of the detector during the measurement process. The intensity value after correction is calculated according to the following formula:

[0083] I 校正 = I 测量 × F (current) ÷ T (time) (Formula 2)

[0084] Where: F (current) is the correction factor of current intensity, T (time) is the correction factor of measurement time, T (time) = measurement time × (1-dead time).

[0085] The detector needs a certain time to process the incoming ray signal. In the case where the previous ray has not been processed and the next ray has entered, the ray may not be processed, which is the dead time effect. The reason for the large dead time of the measurement system is that the count rate of the measurement is too large, which will make the measurement result inaccurate, so the measurement result needs to be corrected for dead time.

[0086] (2) spectral data smoothing

[0087] The measured spectral data is smoothed by using the Fourier transform algorithm, and the spectral data points after smoothing are obtained without affecting the shape of the spectrum.

[0088] The spectrum is composed of a series of data points, and many burrs are seen after connection, which are mainly noise signals of the detector. The spectrum line is smoother after smoothing processing, and the influence of noise can be reduced.

[0089] (3) Net intensity calculation

[0090] The background (X-ray scattering signal) of the measured spectral data is fitted by using the Fourier transform algorithm, and the background data points are subtracted from the smoothed spectral data points to obtain the spectral data points of the net intensity.

[0091] In an embodiment, the concentration value of each element to be measured in the sample to be measured is determined based on the transmittance value at the absorption edge of each element to be measured, comprising:

[0092] According to the transmittance value at the absorption edge of each element to be measured and the preset quantitative analysis model of each element to be measured, the concentration value of each element to be measured in the sample to be measured is calculated.

[0093] For example, the quantitative analysis model is shown in the following formula:

[0094]

[0095] Wherein, the transmittance value at the absorption edge of the element to be measured is c i The concentration of element i; E is the absorption edge energy of a certain element to be measured in the sample; Δu i (E) = u i (E - )-u i (E + ), u i (E) is the absorption coefficient of element i for X-ray with energy E.

[0096] Wherein, the concentration of element i is an unknown number, and other parameters are known parameters, therefore, the transmittance value is input, and the concentration of the element to be measured i can be calculated.

[0097] In an embodiment, the method further comprises:

[0098] Based on the spectral data of the reference sample and the standard sample, the absorption coefficient of each element to be measured is determined; the standard sample is a sample containing a known concentration of the element to be measured;

[0099] Based on the absorption coefficient of each element to be measured, the quantitative analysis model corresponding to each element is constructed.

[0100] According to formula (3), the concentration value of each element in the standard sample is known, and the multivariate linear fitting method is used to obtain the fitting formula for the absorption edge of each element to be measured The coefficient Δu i and b of the quantitative analysis model of the multi-boundary algorithm are established. i is the absorption coefficient of the element, and b is the constant term parameter of the linear fitting formula.

[0101] Each quantitative analysis model corresponding to each element is different from each other, so it is necessary to separately perform fitting calculation for each element to obtain the values of the coefficients Δu i and b in the fitting formula of each element.

[0102] In an embodiment, after the quantitative analysis model is established, the accuracy and precision of the quantitative analysis model need to be determined.

[0103] Different concentrations of strontium and yttrium mixed standard solutions are prepared, X-ray absorption spectrum is measured, a quantitative analysis model is established, and the correlation coefficient R 2 of the model is 0.999.

[0104] A strontium and yttrium mixed solution with a known concentration is prepared, and after the absorption spectrum is measured, the concentration of strontium and yttrium in the solution is calculated by using the above model, and the results are shown in Table 1. The relative error of the calculation results of the model is within ±3%.

[0105]

[0106]

[0107] Table 1

[0108] A sample (sample No. 10) with a strontium concentration of 50g·L -1 and a yttrium concentration of 50g·L -1 is measured 6 times, and the relative standard deviation is calculated, and the results are shown in Table 2. The relative standard deviation is within 0.5%.

[0109] Number Strontium (g·L -1 )]]> Yttrium (g L -1 ) 1 49.76 50.46 2 50.32 50.38 3 49.7 50.62 4 49.85 49.99 5 50.2 50.21 6 49.91 50.15 Mean 49.96 50.30 Relative standard deviation 0.45％ 0.41％

[0110] Table 2

[0111] The X-ray absorption edge spectrum analysis technology provided by the embodiments of the present application can realize simultaneous measurement of multiple elements and is also applicable to quantitative analysis of single elements. During process operation, the change of the content of the to-be-measured element can be quickly and real-timely monitored, thereby providing technical support for process operation. The method can reduce the process of sample pretreatment, and especially for radioactive samples, the radiation dose of the operator can be reduced.

[0112] It should be understood that the size of the serial number of each step in the above embodiments does not mean the order of execution, and the execution order of each process should be determined according to its function and inherent logic, and should not constitute any limitation on the implementation process of the embodiments of the present application. It should be understood that the size of the serial number of each step in the above embodiments does not mean the order of execution, and the execution order of each process should be determined according to its function and inherent logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0113] It should be understood that the terms "comprises" and "comprising" when used in this specification and accompanying claims, indicate the presence of the described features, integers, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0114] It should be noted that the technical solutions recorded in the embodiments of the present application can be combined arbitrarily without conflict.

[0115] In addition, in the embodiments of the present application, "first", "second", etc. are used to distinguish similar objects, and do not necessarily describe a specific order or sequence.

[0116] The embodiments of the present application also provide an element quantitative analysis device, which corresponds to the above-mentioned element quantitative analysis method, and each step in the embodiments of the above-mentioned element quantitative analysis method is also completely applicable to the embodiments of the device. The device comprises:

[0117] The acquisition module is configured to acquire spectral data of rays transmitted through a sample to be measured and a reference sample; the sample to be measured comprises at least one element to be measured, and the reference sample is a sample having the same matrix composition as the sample to be measured but not containing the element to be measured;

[0118] The first determination module is configured to determine, based on the spectral data of the sample to be measured and the reference sample, a transmittance value at an absorption edge of each element to be measured in the sample to be measured;

[0119] The second determination module is configured to determine, based on the transmittance value at the absorption edge of each element to be measured in the sample to be measured, a concentration value of each element to be measured in the sample to be measured.

[0120] In an embodiment, the first determination module is specifically configured to:

[0121] In the spectral data of the sample to be measured, a fitting interval is determined on each side of the absorption edge of each element to be measured;

[0122] In the spectral data of the sample to be measured, a transmittance calculation point is determined on each side of the absorption edge of each element to be measured;

[0123] According to the spectral data of the sample to be measured and the reference sample, the transmittance corresponding to each spectral data point in each fitting interval is calculated;

[0124] According to the transmittance corresponding to each spectral data point in each fitting interval, the spectral data points in the fitting intervals on each side of the absorption edge are fitted, and the transmittance calculation points on the two sides of the absorption edge are extrapolated to calculate the transmittance value at the absorption edge of the corresponding element to be measured.

[0125] In an embodiment, the number of fitting intervals is one more than the number of elements to be measured.

[0126] In an embodiment, the transmittance is a ratio of the transmitted light intensity of the sample to be measured to the transmitted light intensity of the reference sample.

[0127] In an embodiment, the device further comprises:

[0128] a smoothing module configured to smooth the spectral data;

[0129] a net intensity processing module configured to obtain the spectral data points of net intensity based on the smoothed spectral data points.

[0130] In an embodiment, the second determining module is specifically configured to:

[0131] According to the transmittance value and a preset quantitative analysis model of each element to be measured, the concentration value of each element to be measured in the sample to be measured is calculated.

[0132] In an embodiment, the device further comprises:

[0133] a third determining module configured to determine the absorption coefficient of each element to be measured based on the spectral data of the reference sample and a standard sample; the standard sample is a sample containing the element to be measured with a known concentration;

[0134] a constructing module configured to construct a quantitative analysis model corresponding to each element based on the absorption coefficient of each element to be measured.

[0135] In actual application, the obtaining module, the first determining module and the second determining module can be implemented by a processor in an electronic device, such as a central processing unit (CPU), a digital signal processor (DSP), a microcontroller unit (MCU) or a field-programmable gate array (FPGA).

[0136] It should be noted that: the element quantitative analysis device provided in the above embodiments is used for element quantitative analysis, and the division of the above modules is only used as an example for illustration. In actual application, the above processing can be completed by different modules according to needs, that is, the internal structure of the device is divided into different modules to complete all or part of the above-described processing. In addition, the element quantitative analysis device and the element quantitative analysis method provided in the above embodiments belong to the same concept, and the specific implementation process is described in the method embodiments, which will not be repeated here.

[0137] The element quantitative analysis device can be in the form of an image file, which can be executed to run in the form of a container or a virtual machine to implement the element quantitative analysis method described in the application. Of course, it is not limited to the form of an image file, and any software form that can implement the element quantitative analysis method described in the application is within the protection scope of the application.

[0138] Based on the hardware implementation of the above program module, and in order to implement the method of the embodiment of the application, the embodiment of the application further provides an electronic device. Figure 3 The hardware component structure diagram of the electronic device of the embodiment of the application is shown in Figure 3 The electronic device includes:

[0139] The communication interface can interact with other devices such as network devices and the like.

[0140] The processor is connected with the communication interface to realize information interaction with other devices, and is used to run a computer program to execute the method provided by one or more technical solutions of the electronic device. The computer program is stored on the memory.

[0141] The electronic device can be externally connected with an X-ray absorption edge density meter.

[0142] Of course, in actual application, various components in the electronic device are coupled together through a bus system. It can be understood that the bus system is used to realize the connection and communication between the components. In addition to the data bus, the bus system also includes a power bus, a control bus and a state signal bus. However, for the purpose of clear illustration, all kinds of buses are marked as a bus system in Figure 3 .

[0143] The above-mentioned electronic device can be in the form of a cluster, such as a cloud computing platform. The so-called cloud computing platform is a business form that organizes multiple independent server physical hardware resources into a pool of resources by using computing virtualization, network virtualization and storage virtualization technology. It is a software-defined resource structure based on the development foundation of virtualization technology, which can provide virtual machines, containers and other forms of resource capabilities. By eliminating the fixed relationship between hardware and operating system, relying on the connection of unified resource scheduling of the network, and then providing the required virtual resources and services, it is a new type of IT, software delivery mode, with the characteristics of flexibility, elasticity, distribution, multi-tenancy, on-demand, etc.

[0144] The current cloud computing platform supports several service modes:

[0145] SaaS (Software as a Service): Cloud computing platform users do not need to purchase software, but instead rent software deployed on the cloud computing platform. Users do not need to maintain the software, and the software service provider will fully manage and maintain the software.

[0146] PaaS (Platform as a Service): Cloud computing platform users (usually software developers at this time) can build new applications or extend existing applications on the architecture provided by the cloud computing platform, without having to purchase development, quality control, or production servers.

[0147] IaaS (Infrastructure as a Service): Cloud computing platforms provide data centers, infrastructure hardware, and software resources over the Internet. IaaS mode cloud computing platforms can provide servers, operating systems, disk storage, databases, and / or information resources.

[0148] The memory in the embodiments of the present application is used to store various types of data to support the operation of the electronic device. Examples of these data include: any computer programs for operating on the electronic device.

[0149] It can be appreciated that the memory can be a volatile memory or a nonvolatile memory, and can also include both volatile and nonvolatile memory. Among them, the nonvolatile memory can be a Read Only Memory (ROM), a Programmable Read-Only Memory (PROM), an Erasable Programmable Read-Only Memory (EPROM), an Electrically Erasable Programmable Read-Only Memory (EEPROM), a ferromagnetic random access memory (FRAM), a Flash Memory, a magnetic surface memory, an optical disc, or a Compact Disc Read-Only Memory (CD-ROM). The magnetic surface memory can be a disk memory or a tape memory. The volatile memory can be a Random Access Memory (RAM) used as an external cache. By way of example and not limitation, many forms of RAM can be used, such as Static Random Access Memory (SRAM), Synchronous Static Random Access Memory (SSRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDR SDRAM), Enhanced Synchronous Dynamic Random Access Memory (ESDRAM), Sync Link Dynamic Random Access Memory (SLDRAM), and Direct Rambus Random Access Memory (DRRAM). The memory described in the embodiments of the present application is intended to include but not limited to these and any other suitable types of memory.

[0150] The method disclosed in the embodiments of the present application can be applied to a processor or implemented by the processor. The processor can be an integrated circuit chip with a signal processing capability. In the implementation process, the steps of the above method can be completed by hardware integrated logic circuit or software form of instructions in the processor. The processor can be a general processor, DSP, or other programmable logic device, discrete gate or transistor logic device, discrete hardware component, etc. The processor can implement or execute the disclosed methods, steps and logic block diagrams in the embodiments of the present application. The general processor can be a microprocessor or any conventional processor, etc. In combination with the steps of the method disclosed in the embodiments of the present application, the hardware decoding processor can be directly embodied to execute the steps of the method, or the hardware and software modules in the decoding processor can be combined to execute the steps of the method. The software module can be located in a storage medium, which is located in a memory. The processor reads the program in the memory and combines the hardware to complete the steps of the method.

[0151] Alternatively, the processor implements the corresponding processes realized by the electronic device in each method of the embodiments of the present application when executing the program. For brevity, details are not repeated here.

[0152] In the exemplary embodiments, the embodiments of the present application also provide a storage medium, that is, a computer storage medium, specifically a computer readable storage medium, for example, including a first memory for storing a computer program, and the computer program can be executed by the processor of the electronic device to complete the steps of the foregoing method. The computer readable storage medium can be FRAM, ROM, PROM, EPROM, EEPROM, Flash Memory, magnetic surface memory, optical disc, or CD-ROM, etc.

[0153] In several embodiments provided in the present application, it should be understood that the disclosed apparatus, electronic device and method can be implemented by other means. The device embodiments described above are only schematic, for example, the division of the units is only a logical function division, and actual implementation can have another division manner, for example, a plurality of units or components can be combined, or integrated into another system, or some features can be ignored, or not executed. In addition, the coupling or direct coupling or communication connection between the various components shown or discussed can be indirect coupling or communication connection through some interface, device or unit, which can be electrical, mechanical or other forms.

[0154] The units described as separate components above can or can not be physically separate, and the components shown as units can or can not be physical units, i.e., can be located in one place or distributed to multiple network units; part or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.

[0155] In addition, the functional units in each embodiment of the present application can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; the integrated unit can be realized in the form of hardware or in the form of hardware plus software functional units.

[0156] Those skilled in the art can understand that all or part of the steps of the above-mentioned method embodiments can be completed by program instruction related hardware, and the above-mentioned program can be stored in a computer readable storage medium, and the program executes the steps including the above-mentioned method embodiments when executed; and the above-mentioned storage medium includes mobile storage devices, ROM, RAM, magnetic discs or optical discs and various storage program codes.

[0157] Alternatively, the integrated units of the present application, if implemented in the form of software functional modules and sold or used as independent products, can also be stored in a computer readable storage medium. Based on this understanding, the technical solutions of the embodiments of the present application can be embodied in the form of software products, which are stored in a storage medium and include a number of instructions for making a computer device (which can be a personal computer, a server, or a network device, etc.) execute all or part of the methods described in the embodiments of the present application. The above-mentioned storage medium includes mobile storage devices, ROM, RAM, magnetic discs or optical discs and various storage program codes.

[0158] In exemplary embodiments, the embodiments of the present application also provide a computer program product, which includes a computer program executable by a processor of an electronic device to complete the steps of the element quantitative analysis method in the embodiments of the present application.

[0159] It should be noted that the technical solutions described in the embodiments of the present application can be combined arbitrarily without conflict.

[0160] In addition, in the present application, "first", "second", etc. are used to distinguish similar objects, and do not necessarily describe a specific order or sequence.

[0161] The above merely provides the specific implementation of the present application, but the protection scope of the present application is not limited to this. Any person skilled in the art can easily think of the changes or replacements within the technical range disclosed by the present application, which should be covered in the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A method of quantitative analysis of elements, characterized by, The method comprises: acquiring spectral data of rays penetrating a sample to be measured and a reference sample; the sample to be measured comprises at least one element to be measured, and the reference sample is a sample having the same matrix composition as the sample to be measured but not containing the element to be measured; determining a fitting interval on each side of an absorption edge of each element to be measured in the spectral data of the sample to be measured; determining a transmittance calculation point on each side of the absorption edge of each element to be measured in the spectral data of the sample to be measured; calculating the transmittance corresponding to each spectral data point in each fitting interval according to the spectral data of the sample to be measured and the reference sample; fitting the spectral data points in the fitting intervals on each side of the absorption edge of each element to be measured according to the transmittance corresponding to each spectral data point in each fitting interval, extrapolating the transmittance calculation points on each side of the absorption edge to the transmittance calculation points on the other side of the absorption edge, and taking the transmittance ratio of the transmittance calculation points on each side of the absorption edge as the transmittance value at the absorption edge of the corresponding element to be measured; determining the concentration value of each element to be measured in the sample to be measured based on the transmittance value at the absorption edge of each element to be measured in the sample to be measured.

2. The method of claim 1, wherein, The number of fitting intervals is one more than the number of elements to be measured.

3. The method of claim 1, wherein, The transmittance is the ratio of the transmitted light intensity of the sample to be measured to the transmitted light intensity of the reference sample.

4. The method of claim 1, wherein, After acquiring the spectral data of rays penetrating the sample to be measured and the reference sample, the method further comprises: performing smoothing processing on the spectral data; acquiring spectral data points of net intensity based on the spectral data points after smoothing processing.

5. The method of claim 1, wherein, The determination of the concentration value of each element to be measured in the sample to be measured based on the transmittance value at the absorption edge of each element to be measured in the sample to be measured comprises: calculating the concentration value of each element to be measured in the sample to be measured according to the transmittance value at the absorption edge of each element to be measured and a preset quantitative analysis model of each element to be measured.

6. The method of claim 5, wherein, The method further comprises: determining the absorption coefficient of each element to be measured based on the spectral data of the reference sample and a standard sample; the standard sample is a sample containing the element to be measured with a known concentration; constructing a quantitative analysis model corresponding to each element based on the absorption coefficient of each element to be measured.

7. An elemental quantitative analysis device, characterized by comprising: comprises: an acquisition module, configured to acquire spectral data of rays penetrating a sample to be measured and a reference sample; the sample to be measured comprises at least one element to be measured, and the reference sample is a sample having the same matrix composition as the sample to be measured but not containing the element to be measured; The first determining module is configured to determine a fitting interval on each side of an absorption edge of each element to be detected in the spectral data of the sample to be detected; determine a transmittance calculation point on each side of the absorption edge of each element to be detected in the spectral data of the sample to be detected; calculate the transmittance corresponding to each spectral data point in each fitting interval according to the spectral data of the sample to be detected and the reference sample; perform fitting on the spectral data points in the fitting intervals on each side of the absorption edge of each element to be detected according to the transmittance corresponding to each spectral data point in each fitting interval, and extrapolate to the transmittance calculation points on each side of the absorption edge, and take the transmittance ratio of the transmittance calculation points selected on each side of the absorption edge as the transmittance value of the corresponding element to be detected at the absorption edge; The second determining module is configured to determine the concentration value of each element to be detected in the sample to be detected based on the transmittance value corresponding to each element to be detected in the sample to be detected.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, The processor executes the computer program to implement the element quantitative analysis method according to any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, The computer readable storage medium stores a computer program, and the computer program includes program instructions, which, when executed by a processor, cause the processor to execute the element quantitative analysis method according to any one of claims 1 to 6.

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