Electronic product testing device

By designing an electronic product testing device that includes testing components, transfer flip components and clamping components, the problems of inconvenience and labor burden in the prior art are solved, efficient testing and automated operations during processing are achieved, and testing and detection effects are improved.

CN119827870AInactive Publication Date: 2025-04-15HUANGHUAI UNIV +1
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Patent Information

Application Number
CN202411976993.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-31
Publication Date
2025-04-15
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

The existing electronic product testing devices cannot effectively test electronic products during processing, which increases the testing burden, reduces the testing effect, and is difficult to move and flip, automatically clamp and disassemble, increasing the labor burden.

Method used

An electronic product testing device including a test bench body, a test assembly, a transfer flip assembly and a clamp assembly is designed. The test component is used to test electronic products during processing, the transmission flip assembly realizes mobile flip of electronic products, and the clamping assembly realizes automatic clamping and disassembly.

Benefits of technology

The device can test electronic products during processing, reduce additional testing processes, reduce testing burden, and improve testing results. At the same time, through moving flip and automatic clamping, the manual burden is reduced and the detection and clamping effect is improved.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to the technical field of electronic product testing, in particular to an electronic product testing device which comprises a testing table body, a testing assembly, a conveying and overturning assembly and a clamping assembly, the testing assembly is installed on the outer wall of the top end of the testing table body, and the conveying and overturning assembly is installed in the testing table body. A clamping assembly is mounted in the test board main body; the testing assembly comprises a supporting frame, a first motor, a first lead screw, a guide rod, a lifting plate and a threaded hole. According to the invention, the test assembly is adopted, so that electronic products can be tested during processing, qualified electronic products can be selected, no extra test process is needed to test the electronic products, the test burden is reduced, and the test effect is improved; the conveying and overturning assembly is adopted, when defect detection is carried out on the electronic products, the electronic products can be moved and overturned, the products need to be overturned manually, the manual burden is reduced, and the detection effect is improved.
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Description

Technical Field

[0001] The present invention relates to the technical field of electronic product testing, and in particular to an electronic product testing device. Background Art

[0002] Electronic products are related products that use electricity as the basis for their work, mainly including watches, smart phones, telephones, televisions, DVD players, VCRs, camcorders, radios, tape recorders, combination speakers, laser players, computers, game consoles and mobile communication products, etc., and these electronic products require testing equipment for testing during processing; but existing testing equipment generally cannot test electronic products during processing, and cannot ensure whether the electronic products can operate normally. Additional testing procedures are required, which increases the testing burden and reduces the testing effect. Moreover, when defect detection is performed on electronic products, it is generally impossible to move and flip the electronic products, and manual flipping is required, which increases the manual burden and reduces the detection effect. Moreover, it is generally impossible to automatically clamp and disassemble electronic products, and manual assistance is required, which increases the clamping burden and reduces the clamping effect. Summary of the invention

[0003] The problem solved by the present invention is to provide an electronic product testing device, which can test and process electronic products during processing, so that qualified electronic products can be selected, and no additional testing process is required to test the electronic products, which reduces the testing burden and improves the testing effect. Moreover, when the electronic products are defect-detected, the electronic products can be moved and flipped, and the product needs to be flipped manually, which reduces the manual burden and improves the detection effect. Moreover, the electronic products can be automatically clamped and disassembled, which reduces manual assistance, reduces the clamping burden and improves the clamping effect.

[0004] In order to achieve the above-mentioned purpose, the present invention adopts the following technical scheme: an electronic product testing device, comprising a test bench body, a test assembly, a transmission and flip assembly and a clamping assembly, wherein the test assembly is installed on the top outer wall of the test bench body, the transmission and flip assembly is installed in the test bench body, and the clamping assembly is installed in the test bench body;

[0005] The test assembly includes a support frame, a first motor, a first screw rod, a guide rod, a lifting plate, a first threaded hole, a first guide hole, an adjustment hole, an adjustment rod, a first spring, a test connector and a signal line. A support frame is welded on the top outer wall of the test bench body, and a first motor is embedded and installed on the support frame. A first screw rod is fixedly connected to the bottom end of an output shaft of the first motor. A lifting plate is installed below the support frame, and a first threaded hole is opened on the lifting plate corresponding to the position of the first screw rod. A guide rod is symmetrically fixedly connected to the inner wall of the bottom end of the support frame, and a first guide hole is symmetrically opened on the lifting plate corresponding to the position of the guide rod.

[0006] Preferably, the lifting plate is symmetrically provided with adjustment holes, an adjustment rod is sleeved in the adjustment hole, a test connector is fixedly connected to the outer wall of the bottom end of the adjustment rod, a first spring is fixedly connected to the top of the test connector, and the top of the first spring is fixedly connected to the outer wall of the lifting plate, and a signal line is installed on the top of the lifting plate.

[0007] Preferably, the conveying and flipping assembly includes a rack, a slide groove, a second motor, a second screw rod, a slider, a second threaded hole, a rotating rod, a gear and a rotating frame, slide grooves are provided on both sides of the test bench body, and a second motor is embedded and installed on an inner wall of one side of the slide groove, one end of the output shaft of the second motor is fixedly connected to the second screw rod, and the other end of the second screw rod is rotatably connected to the inner wall of the slide groove, a slider is slidably connected in the slide groove, a second threaded hole is provided on the slider corresponding to the position of the second screw rod, a rotating rod is rotatably connected on an outer wall of one side of the slider, a rotating frame is fixedly connected to the outer walls of one end of the two rotating rods, a gear is fixedly connected to the outer wall of one side of the rotating rod, and a rack is fixedly connected to the outer walls of both sides of the test bench body, and the bottom end of the rack is meshingly installed on the outer wall of the gear.

[0008] Preferably, the clamping assembly includes a first connecting frame, an extrusion arc plate, a second guide hole, a clamping frame, a moving rod, a second spring, a second connecting frame and an arc plate, the clamping frame is distributed and installed in the rotating frame, the moving rod is fixedly connected to an outer wall of one side of the clamping frame, and second guide holes are opened on the outer walls of both sides of the rotating frame corresponding to the position of the moving rod, the second connecting frame is fixedly connected to the outer wall of one end of the two moving rods, the second spring is symmetrically fixedly connected to the outer wall of one side of the second connecting frame, and the other end of the second spring is fixedly connected to the outer wall of the rotating frame, the arc plate is fixedly connected to the top outer wall of the second connecting frame, and the extrusion arc plate is symmetrically installed on the test bench main body corresponding to the position of the arc plate, the first connecting frame is fixedly connected to the outer wall of one side of the extrusion arc plate, and the bottom end of the first connecting frame is fixedly connected to the outer wall of the test bench main body.

[0009] Preferably, support plates are fixedly connected to the outer walls on both sides of the test bench body, and the support plates are provided with connection holes, and bolts are sleeved in the connection holes.

[0010] Preferably, support columns are symmetrically fixedly connected to the top outer wall of the support frame, test display screens are fixedly mounted on the top outer walls of the two support columns, and the output end of the signal line is fixedly connected to the outer wall of the test display screen.

[0011] Preferably, a mounting frame is fixedly connected to the top outer walls of the two racks, and defect detection probes are symmetrically mounted on the bottom inner wall of the mounting frame.

[0012] Preferably, the first spring is internally sleeved on the outer wall of the adjusting rod, and a baffle is provided at the top end of the adjusting rod corresponding to the position of the adjusting hole.

[0013] Preferably, the second spring is internally sleeved on the outer wall of the moving rod, and the number of the second springs is four.

[0014] The beneficial effects of the present invention are: by using the test assembly, the electronic products can be tested during processing, so that qualified electronic products can be selected, and no additional test process is required to test the electronic products, thereby reducing the test burden and improving the test effect;

[0015] The transmission flip component is used. When the electronic products are tested for defects, the electronic products can be flipped over manually, which reduces the manual burden and improves the detection effect.

[0016] The clamping assembly is used to automatically clamp and disassemble electronic products, reducing manual assistance, reducing the clamping burden and improving the clamping effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is the overall three-dimensional structure diagram of the present invention;

[0018] Figure 2 It is a front view cutaway structural diagram of the present invention;

[0019] Figure 3 For the present invention Figure 2 Partial cross-section structure diagram in;

[0020] Figure 4 is a three-dimensional structural diagram of the test assembly of the present invention;

[0021] Figure 5 For the present invention Figure 4 A magnified view of the structure in the middle A area;

[0022] Figure 6 It is a side cutaway structural diagram of the present invention;

[0023] Figure 7 It is a three-dimensional structural diagram of the transmission flip assembly and the clamping assembly of the present invention;

[0024] Figure 8 For the present invention Figure 7 A magnified view of the structure in the middle B area;

[0025] Fig. 9 A three-dimensional structural diagram of the transmission flip assembly of the present invention;

[0026] Fig.10 It is a three-dimensional structural diagram of the clamping assembly of the present invention.

[0027] Legend:

[0028] 1. Test bench body; 2. Test assembly; 3. Transmission flip assembly; 4. Clamping assembly; 5. Support plate; 6. Connection hole; 7. Bolt; 8. Support column; 9. Test display screen; 10. Mounting frame; 11. Defect detection probe; 201. Support frame; 202. First motor; 203. First screw rod; 204. Guide rod; 205. Lifting plate; 206. First threaded hole; 207. First guide hole; 208. Adjustment hole; 209. Adjustment rod; 2010. First spring Spring; 2011, test connector; 2012, signal line; 301, rack; 302, slide groove; 303, second motor; 304, second screw rod; 305, slider; 306, second threaded hole; 307, rotating rod; 308, gear; 309, rotating frame; 401, first connecting frame; 402, extrusion arc plate; 403, second guide hole; 404, clamping frame; 405, moving rod; 406, second spring; 407, second connecting frame; 408, arc plate. DETAILED DESCRIPTION

[0029] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0030] Embodiment 1

[0031] See also Figure 1 to Figure 5, an electronic product testing device, comprising a test bench body 1, a test assembly 2, a transmission flip assembly 3 and a clamping assembly 4, the test bench body 1 is provided with a test assembly 2 on the top outer wall, the test bench body 1 is provided with a transmission flip assembly 3, and the test bench body 1 is provided with a clamping assembly 4; the test bench body 1 is provided with a support plate 5 on both sides of the outer wall, the support plate 5 is provided with a connection hole 6, and the connection hole 6 is sleeved with a bolt 7, the support plate 5 on the test bench body 1 is placed in a specified position, and then the test bench body 1 is fixedly installed by the bolt 7 in the connection hole 6; the top outer wall of the support frame 201 Support columns 8 are symmetrically fixedly connected to the wall, and a test display screen 9 is fixedly installed on the top outer wall of the two support columns 8, and the output end of the signal line 2012 is fixedly connected to the outer wall of the test display screen 9, and the usage status is transmitted to the inside of the test display screen 9 on the support column 8 through the signal line 2012, and then it is judged whether the electronic product can operate normally; the top outer wall of the two racks 301 is fixedly connected to the installation frame 10, and the bottom inner wall of the installation frame 10 is symmetrically installed with a defect detection probe 11, and the defect detection of the electronic product is carried out through the defect detection probe 11 on the installation frame 10, which is convenient for defect detection of the electronic product;

[0032] The test assembly 2 includes a support frame 201, a first motor 202, a first screw rod 203, a guide rod 204, a lifting plate 205, a first threaded hole 206, a first guide hole 207, an adjustment hole 208, an adjustment rod 209, a first spring 2010, a test connector 2011 and a signal line 2012. A support frame 201 is welded on the top outer wall of the test bench body 1, and the first motor 202 is embedded and installed on the support frame 201. The bottom end of the output shaft of the first motor 202 is fixedly connected to the first screw rod 203. A lifting plate 205 is installed below the support frame 201. The lifting plate 205 is provided with a first threaded hole 206 corresponding to the position of the first screw rod 203. The guide rod 204 is symmetrically fixedly connected to the inner wall of the bottom end of the support frame 201. The lifting plate 205 is symmetrically provided with first guide holes 207 corresponding to the position of the guide rod 204; the lifting plate 205 is symmetrically provided with adjustment holes 208. An adjusting rod 209 is sleeved in the hole 208, a test connector 2011 is fixedly connected to the outer wall of the bottom end of the adjusting rod 209, a first spring 2010 is fixedly connected to the top of the test connector 2011, and the top of the first spring 2010 is fixedly connected to the outer wall of the lifting plate 205, a signal line 2012 is installed on the top of the lifting plate 205, when the lifting plate 205 is lowered again, the test connector 2011 on the adjusting rod 209 is moved up along the adjusting hole 208 by the action of the first spring 2010, and the test connector 2011 is squeezed with the contact of the electronic product, so that the electronic product is powered on; the first spring 2010 is sleeved on the outer wall of the adjusting rod 209, and a baffle is provided at the top of the adjusting rod 209 corresponding to the position of the adjusting hole 208, and the test connector 2011 on the adjusting rod 209 is moved up along the adjusting hole 208 by the action of the first spring 2010.

[0033] Working principle: After the product is tested, the first motor 202 is started to rotate the first screw rod 203, and then the slider 305 is moved along the slide groove 302 under the action of the first threaded hole 206, so that the rotating frame 309 on the rotating rod 307 is moved, and the electronic product is moved to the bottom of the lifting plate 205. At this time, the first motor 202 on the support frame 201 is started to rotate the first screw rod 203, and then the first guide hole 207 on the lifting plate 205 is lowered along the guide rod 204 under the action of the first threaded hole 206 until the test connector 2011 contacts the contact point of the electronic product. When the lifting plate 205 descends again, the test connector 2011 on the adjusting rod 209 rises along the adjusting hole 208 under the action of the first spring 2010, and the test connector 2011 is squeezed with the contact of the electronic product to power on the electronic product. The usage status is then transmitted to the test display screen 9 on the supporting column 8 through the signal line 2012 to determine whether the electronic product can operate normally. The electronic product can be tested during processing, so that qualified electronic products can be selected. No additional testing process is required to test the electronic products, which reduces the testing burden and improves the testing effect.

[0034] Embodiment 2

[0035] See also Figure 6 to Figure 9 The transmission flip assembly 3 includes a rack 301, a slide 302, a second motor 303, a second screw rod 304, a slider 305, a second threaded hole 306, a rotating rod 307, a gear 308 and a rotating frame 309. The slide 302 is provided on both sides of the test bench body 1. The second motor 303 is embedded and installed on the inner wall of one side of the slide 302. One end of the output shaft of the second motor 303 is fixedly connected to the second screw rod 304, and the other end of the second screw rod 304 is rotatably connected to the inner wall of the slide 302. A slider 305 is slidably connected in the slide groove 302, a second threaded hole 306 is opened on the slider 305 corresponding to the position of the second screw rod 304, a rotating rod 307 is rotatably connected to the outer wall of one side of the slider 305, a rotating frame 309 is fixedly connected to the outer wall of one end of the two rotating rods 307, a gear 308 is fixedly connected to the outer wall of one side of the rotating rod 307, racks 301 are fixedly connected to the outer walls of both sides of the test bench body 1, and the bottom end of the rack 301 is meshingly installed on the outer wall of the gear 308.

[0036] When the clamping frame 404 clamps and fixes the electronic product, the first motor 202 is started to rotate the first screw rod 203, and then the slider 305 is moved along the slide groove 302 under the action of the first threaded hole 206, so that the rotating frame 309 on the rotating rod 307 is moved, and then under the action of the rack 301 and the gear 308, the rotating frame 309 on the rotating rod 307 is flipped along the slider 305, and then the defect detection probe 11 on the mounting frame 10 is used to detect defects in the electronic product. When the electronic product is tested for defects, the electronic product can be moved and flipped, and the product needs to be flipped manually, which reduces the manual burden and improves the detection effect.

[0037] Embodiment 3

[0038] See also Figure 7 , Figure 8 and Fig.10 The clamping assembly 4 includes a first connecting frame 401, an extrusion arc plate 402, a second guide hole 403, a clamping frame 404, a moving rod 405, a second spring 406, a second connecting frame 407 and an arc plate 408. The clamping frame 404 is installed in the rotating frame 309. The moving rod 405 is fixedly connected to the outer wall of one side of the clamping frame 404. The second guide holes 403 are distributed on the outer walls of both sides of the rotating frame 309 corresponding to the positions of the moving rods 405. The second connecting frame 407 is fixedly connected to the outer walls of one end of the two moving rods 405. The second spring 406 is symmetrically fixedly connected to the outer wall of one side of the second connecting frame 407, and the other end of the second spring 406 is fixedly connected to the rotating frame 309. On the outer wall of the rotating frame 309, an arc plate 408 is fixedly connected to the top outer wall of the second connecting frame 407, and an extrusion arc plate 402 is symmetrically installed on the test bench main body 1 at a position corresponding to the arc plate 408. A first connecting frame 401 is fixedly connected to the outer wall of one side of the extrusion arc plate 402, and the bottom end of the first connecting frame 401 is fixedly connected to the outer wall of the test bench main body 1; the second spring 406 is internally sleeved on the outer wall of the moving rod 405, and the number of the second springs 406 is four. When the extrusion arc plate 402 is separated from the arc plate 408, then under the action of the second spring 406, the moving rod 405 on the second connecting frame 407 is reset along the second guide hole 403.

[0039] First, the support plate 5 on the test bench body 1 is placed at the specified position, and then the test bench body 1 is fixed and installed by the bolts 7 in the connecting holes 6. When the electronic product is tested, the first motor 202 is started to rotate the first screw rod 203, and then the slider 305 is moved along the slide groove 302 under the action of the first threaded hole 206, so that the rotating frame 309 on the rotating rod 307 is moved to the extrusion arc plate 402, and the arc plate 408 is squeezed by the extrusion arc plate 402 on the first connecting frame 401, so that the moving rod 405 on the second connecting frame 407 is moved along the second guide hole 403, so that the four clamping frames 404 move away from each other, and then place the electronic product into the clamping frame 404. At this time, start the first motor 202 to reset the first screw rod 203. Then, under the action of the first threaded hole 206, the slider 305 is reset along the slide groove 302. Then, the extrusion arc plate 402 is separated from the arc plate 408. Then, under the action of the second spring 406, the moving rod 405 on the second connecting frame 407 is reset along the second guide hole 403. The electronic product is clamped and fixed by the clamping frame 404, and the electronic product can be automatically clamped and disassembled, which reduces manual assistance, reduces the clamping burden, and improves the holding effect.

[0040] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. An electronic product testing device, characterized in that: The test bench comprises a test bench body (1), a test assembly (2), a transmission and flipping assembly (3) and a clamping assembly (4); the test assembly (2) is installed on the top outer wall of the test bench body (1), the transmission and flipping assembly (3) is installed in the test bench body (1), and the clamping assembly (4) is installed in the test bench body (1); The test assembly (2) comprises a support frame (201), a first motor (202), a first screw rod (203), a guide rod (204), a lifting plate (205), a first threaded hole (206), a first guide hole (207), an adjustment hole (208), an adjustment rod (209), a first spring (2010), a test connector (2011) and a signal line (2012); a support frame (201) is welded to the top outer wall of the test bench body (1); and a first screw rod (203) is embedded and mounted on the support frame (201). A motor (202), wherein the bottom end of the output shaft of the first motor (202) is fixedly connected to a first screw rod (203), a lifting plate (205) is installed below the support frame (201), a first threaded hole (206) is opened on the lifting plate (205) at a position corresponding to the first screw rod (203), a guide rod (204) is symmetrically fixedly connected to the inner wall of the bottom end of the support frame (201), and a first guide hole (207) is symmetrically opened on the lifting plate (205) at a position corresponding to the guide rod (204).

2. The electronic product testing device according to claim 1, characterized in that: The lifting plate (205) is symmetrically provided with adjustment holes (208), an adjustment rod (209) is sleeved in the adjustment hole (208), a test connector (2011) is fixedly connected to the outer wall of the bottom end of the adjustment rod (209), a first spring (2010) is fixedly connected to the top end of the test connector (2011), and the top end of the first spring (2010) is fixedly connected to the outer wall of the lifting plate (205), and a signal line (2012) is installed at the top end of the lifting plate (205).

3. The electronic product testing device according to claim 1, characterized in that: The transmission flip assembly (3) comprises a rack (301), a slide groove (302), a second motor (303), a second screw rod (304), a slider (305), a second threaded hole (306), a rotating rod (307), a gear (308) and a rotating frame (309). The test bench body (1) is provided with a slide groove (302) on both sides. The second motor (303) is embedded and installed on the inner wall of one side of the slide groove (302). One end of the output shaft of the second motor (303) is fixedly connected to the second screw rod (304), and the other end of the second screw rod (304) is rotatably connected to the inner wall of the slide groove (302). A slider (305) is slidably connected in the slide groove (302), a second threaded hole (306) is opened on the slider (305) corresponding to the position of the second screw rod (304), a rotating rod (307) is rotatably connected to the outer wall of one side of the slider (305), a rotating frame (309) is fixedly connected to the outer wall of one end of the two rotating rods (307), a gear (308) is fixedly connected to the outer wall of one side of the rotating rod (307), and racks (301) are fixedly connected to the outer walls of both sides of the test bench body (1), and the bottom end of the rack (301) is meshingly mounted on the outer wall of the gear (308).

4. The electronic product testing device according to claim 3, characterized in that: The clamping assembly (4) comprises a first connecting frame (401), an extrusion arc plate (402), a second guide hole (403), a clamping frame (404), a moving rod (405), a second spring (406), a second connecting frame (407) and an arc plate (408); the clamping frame (404) is installed in the rotating frame (309); the moving rod (405) is fixedly connected to an outer wall of one side of the clamping frame (404); second guide holes (403) are arranged on the outer walls of both sides of the rotating frame (309) corresponding to the positions of the moving rods (405); and two moving rods (405) are fixedly connected to the outer walls at one end thereof. A second connecting frame (407) is connected, a second spring (406) is symmetrically fixedly connected to an outer wall of one side of the second connecting frame (407), and the other end of the second spring (406) is fixedly connected to the outer wall of the rotating frame (309), an arc plate (408) is fixedly connected to the top outer wall of the second connecting frame (407), an extrusion arc plate (402) is symmetrically installed on the test bench body (1) at a position corresponding to the arc plate (408), a first connecting frame (401) is fixedly connected to an outer wall of one side of the extrusion arc plate (402), and the bottom end of the first connecting frame (401) is fixedly connected to the outer wall of the test bench body (1).

5. The electronic product testing device according to claim 1, characterized in that: Support plates (5) are fixedly connected to the outer walls of both sides of the test bench body (1), and the support plates (5) are provided with connection holes (6), and bolts (7) are sleeved in the connection holes (6).

6. The electronic product testing device according to claim 2, characterized in that: Support columns (8) are symmetrically fixedly connected to the top outer wall of the support frame (201), and test display screens (9) are fixedly installed on the top outer walls of the two support columns (8), and the output end of the signal line (2012) is fixedly connected to the outer wall of the test display screen (9).

7. The electronic product testing device according to claim 3, characterized in that: A mounting frame (10) is fixedly connected to the top outer walls of the two racks (301), and a defect detection probe (11) is symmetrically mounted on the bottom inner wall of the mounting frame (10).

8. The electronic product testing device according to claim 2, characterized in that: The first spring (2010) is internally sleeved on the outer wall of the adjusting rod (209), and a baffle is provided at the top end of the adjusting rod (209) corresponding to the position of the adjusting hole (208).

9. The electronic product testing device according to claim 4, characterized in that: The second spring (406) is sleeved on the outer wall of the moving rod (405), and the number of the second springs (406) is four.