Automated test system and test method

Abstract

The application provides an automatic test system and a test method. The test system comprises a test management platform, an Internet of Things device management platform, a data gateway service layer and a test execution layer; the test management platform is used for generating a test event to be tested based on a cloud computing resource pool, and publishing the test event through the Internet of Things device management platform; the data gateway service layer is used for encrypting the test event to be tested by using a preset data encryption algorithm, and sending the encrypted test event to the test execution layer in a message queue data transmission form; the test execution layer is used for executing device testing according to the encrypted test event based on a local area network, collecting test data information, and sending the test data information to the Internet of Things device management platform; and the Internet of Things device management platform is used for receiving and storing the test data information. Through the test management platform, the Internet of Things device management platform, the data gateway service layer and the test execution layer, device testing automation in a complex network environment is realized.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of automation testing, and in particular to an automation testing system and a testing method. BACKGROUND

[0002] Device testing can verify product performance, functionality and quality, for example, through device testing, the reliability and stability of the product in the design stage can be analyzed to ensure that it meets the design requirements and complies with relevant industry standards. At the same time, device testing is also able to effectively detect defects that may occur in the production process, improving the consistency and market competitiveness of the product. With the rapid development of electronic devices, Internet of Things devices and industrial intelligence, the types and application scenarios of devices are increasingly diversified, and their complexity and precision requirements have also significantly increased. In the field of Internet of Things devices, device testing not only verifies hardware performance, but also tests the communication capabilities of devices in various network environments; in the field of industrial automation, it is necessary to test the long-time running performance, energy consumption performance and environmental adaptability of the device.

[0003] In the prior art, device testing usually relies on an automation testing system based on a local area network environment or a single laboratory environment. These systems mainly connect test devices through a host computer, control devices using pre-set test task scripts, and collect test data. The creation, execution and result analysis of test tasks are all completed within the laboratory local area network and rely on the hardware devices and network environment within the laboratory, which has high controllability. This mode is suitable for relatively simple single-device testing and a small number of concurrent tasks. For example, in a laboratory environment, data interaction is achieved between the host computer and the test device through serial communication (such as RS-232, RS-485) or Ethernet, the host computer controls the test instrument to execute the predefined test task script, and records the performance data generated during the test process.

[0004] However, with the increasing demand for electronic device testing, the traditional automation testing system is difficult to meet the requirements of complex network environments. The traditional local area network testing mode has strong dependence on network environment and is difficult to adapt to the needs of distributed laboratories, cross-regional collaboration or cloud testing tasks. Therefore, there is an urgent need for an automation testing system to solve the technical problem that the prior art is difficult to adapt to complex network environments. SUMMARY

[0005] The present application provides an automation testing system and a testing method to solve the technical problem that the prior art is difficult to adapt to complex network environments.

[0006] In a first aspect, the present application provides an automation testing system, comprising a test management platform, an Internet of Things device management platform, a data gateway service layer and a test execution layer; wherein,

[0007] The test management platform is used to generate a test event containing test execution information based on the cloud computing resource pool, and publish the test event through the Internet of Things device management platform;

[0008] The data gateway service layer is configured to, after determining that the event to be tested is published, encrypt the event to be tested using a preset data encryption algorithm to obtain an encrypted test event, and send the encrypted test event to the test execution layer using a message queue data transmission form;

[0009] The test execution layer is configured to execute device testing based on the local area network according to the encrypted test event, collect and obtain test data information, and send the test data information to the Internet of Things device management platform according to an information feedback method matching the test data information;

[0010] The IoT device management platform is used to receive and store test data information of different events to be tested.

[0011] Optionally, in the test system as described above, the test management platform includes a test data display module;

[0012] The test management platform is also used to:

[0013] Acquire test data information matching the test execution information from the IoT device management platform, and visualize the test data information through the test data display module; wherein the test data information includes real-time test data and / or result test data.

[0014] Optionally, in the test system described above, the test execution layer includes an instrument host computer and test equipment;

[0015] The test execution layer is specifically used to:

[0016] Obtaining the encrypted test event through the instrument host computer, and decrypting the encrypted test event according to a preset decryption algorithm to obtain the test execution information;

[0017] After determining that the test execution information meets the preset test parameter specifications, the instrument host computer obtains a test script matching the test execution information based on the test execution information;

[0018] Sending a test execution instruction carrying a test script via the instrument host computer for the test device to perform device testing;

[0019] The instrument host computer monitors the test device, acquires first test data information, and encrypts the first test data information according to a preset data encryption algorithm.

[0020] The instrument host computer sends the encrypted first test data information to the data gateway service layer in a message queue data transmission form, so as to send the first test data to the Internet of Things device management platform through the data gateway service layer.

[0021] Optionally, the test system described above further comprises an external monitoring module and a positioning tag module.

[0022] The test execution layer is further configured to:

[0023] Based on the execution of the device test, the external monitoring module acquires second test data of the test device, and the second test data information is sent to the Internet of Things device management platform through a preset wireless communication unit; and

[0024] The positioning tag module acquires third test data of the test device according to a positioning base station, encrypts the third test data information according to a preset data encryption algorithm, and sends the encrypted third test data information to the data gateway service layer in a message queue data transmission form, so as to send the third test data to the Internet of Things device management platform through the data gateway service layer.

[0025] The second test data comprises device energy consumption data, and the third test data comprises device location information.

[0026] Optionally, the test system described above further comprises a data storage module.

[0027] The Internet of Things device management platform is configured to:

[0028] The data storage module receives and stores test data information of different test events, wherein the test data information comprises at least one of the first test data information, the second test data information, and the third test data information.

[0029] Optionally, the test system described above further comprises a test generation module and an information interaction module.

[0030] The test management platform is configured to:

[0031] The test generation module reads the test requirement information input by the user, obtains the test execution information according to the test requirement information, and generates a to-be-tested event containing the test execution information according to the cloud computing resource pool;

[0032] Through the information interaction module, according to a preset communication interface protocol, the event to be tested is sent to the Internet of Things device management platform, so that the Internet of Things device management platform can publish the test event.

[0033] Optionally, in the test system as described above, the IoT device management platform further includes an event publishing module;

[0034] The IoT device management platform is further specifically used for:

[0035] The event to be tested is published to a preset event topic through the event publishing module for monitoring by the data gateway service layer, thereby determining the publication of the event to be tested.

[0036] Optionally, in the test system described above, the data gateway service layer includes an event monitoring module, a data encryption module and a message queue module;

[0037] The data gateway service layer is specifically used to:

[0038] By means of the event monitoring module, according to a preset event theme, the release of the event to be tested is monitored, and after determining that the event to be tested is released, the event to be tested is obtained;

[0039] By using the data encryption module, a preset data encryption algorithm is used to encrypt the event to be tested to obtain an encrypted test event;

[0040] The encrypted test event is sent to the test execution layer through a message queue module in the form of message queue data transmission.

[0041] Optionally, in the test system as described above, the test equipment includes at least one of a DC power analyzer, a temperature rise data acquisition device, and a high and low temperature alternating damp heat test chamber;

[0042] The test execution layer is specifically used to:

[0043] The instrument host computer communicates with the DC power analyzer using the Telnet protocol to execute the test script through the DC power analyzer and complete the collection of the first test data information through the instrument host computer; and / or,

[0044] The instrument host computer communicates with the temperature rise data acquisition device through a Web Socket protocol to execute a test script through the temperature rise data acquisition device, and the instrument host computer collects the first test data information; and / or,

[0045] The instrument host computer communicates with the high-low temperature alternating damp heat test chamber through a UDP protocol to execute a test script through the high-low temperature alternating damp heat test chamber, and the instrument host computer collects the first test data information.

[0046] In a second aspect, the present application provides a test method, which is applied to a test execution layer, and the method comprises the following steps:

[0047] The data gateway service layer acquires an encrypted test event, and decrypts the encrypted test event according to a decryption algorithm corresponding to the encrypted test event to acquire test execution information;

[0048] After determining that the test execution information meets a preset test parameter specification, the test script matched with the test execution information is acquired according to the test execution information, and a device test is executed and monitored according to the test script;

[0049] The first test data information and / or the third test data information of the test device are acquired, the first test data information and / or the third test data information are encrypted according to a preset data encryption algorithm, and the encrypted first test data information and / or the third test data information are sent to the data gateway service layer in a message queue data transmission form, so that the first test data information and / or the third test data information are sent to the Internet of Things device management platform through the data gateway service layer; and / or,

[0050] The second test data of the test device are acquired, and the second test data information is sent to the Internet of Things device management platform.

[0051] In a third aspect, the present application provides an electronic device, which comprises a processor and a memory connected with the processor in communication;

[0052] The memory stores computer execution instructions;

[0053] The processor executes the computer execution instructions stored in the memory to realize the above method.

[0054] In a fourth aspect, the present application provides a computer readable storage medium, which stores computer execution instructions, and the computer execution instructions are executed by a processor to realize the above method.

[0055] In a fifth aspect, the present application provides a program product comprising a computer program which, when executed by a processor, implements the above method.

[0056] The automatic test system and test method provided by the present application realize the generation and management of test tasks through a test management platform. The test management platform generates a test event to be tested containing test execution information based on a cloud computing resource pool, so that the test task can make full use of the dynamic resource scheduling capability of cloud computing, and the flexibility and processing efficiency of test task creation are improved. Through encryption processing of the test event to be tested by the data gateway service layer, full-link data protection of the test task in a complex network environment is realized. The data gateway service layer encrypts the test event to be tested through a preset data encryption algorithm, so that the data has confidentiality during transmission, preventing the risk of external eavesdropping or data tampering. At the same time, through the transmission form of the message queue, the data gateway service layer improves the reliability and transmission efficiency of test event distribution. Not only the security of data transmission is ensured, but also the optimization of task distribution in a high-concurrency environment is realized, ensuring that the test task can be efficiently and stably transmitted to the test execution layer.

[0057] The test execution layer controls the test task based on the encrypted test event to be tested, and at the same time, the test execution layer can collect test data information of the test equipment in real time, and transmit the collected test data to the Internet of Things equipment management platform according to a preset information feedback mode. The closed-loop management of the test task is realized, the collection and transmission of test data are more efficient and secure, and a data basis is provided for subsequent data storage and analysis. Through the reception and storage of test data information by the Internet of Things equipment management platform, centralized management and traceability of test data are realized, and the centralized management mode improves the convenience of data access. Through the setting of the test management platform, the Internet of Things equipment management platform, the data gateway service layer and the test execution layer, equipment test automation in a complex network environment is realized. BRIEF DESCRIPTION OF DRAWINGS

[0058] The accompanying drawings, which are incorporated herein and form a part of the specification, illustrate embodiments consistent with the present application and, together with the description, further serve to explain the principles of the application.

[0059] Figure 1 A structural schematic diagram of the automatic test system provided by the embodiment of the present application is shown in the figure;

[0060] Figure 2 A structural schematic diagram of the automatic test system provided by the embodiment of the present application is shown in the figure;

[0061] Figure 3 A structural schematic diagram of the automatic test system provided by the embodiment of the present application is shown in the figure;

[0062] Figure 4 The overall working flow diagram of the test system provided for the embodiments of the present application is shown in the following figure:

[0063] Figure 5 The data flow diagram of data transmission provided for the embodiments of the present application is shown in the following figure:

[0064] Figure 6 The flow diagram of a test method provided for the embodiments of the present application is shown in the following figure:

[0065] Figure 7 The flow diagram of the test performed by the host computer of the instrument provided for the embodiments of the present application is shown in the following figure:

[0066] Figure 8 The structural diagram of an electronic device provided for the embodiments of the present application is shown in the following figure.

[0067] The specific embodiments of the present application have been shown in the above figures, and will be described in more detail hereinafter. These figures and the written description are not intended to limit the scope of the present application in any way, but to illustrate the present application to those skilled in the art by reference to particular embodiments. DETAILED DESCRIPTION

[0068] The exemplary embodiments will be described in detail herein with reference to the attached drawings. The following description is made with reference to the accompanying drawings in which like reference numerals refer to like elements, and the term "exemplary" is used herein to mean "serving as an example, instance, or illustration." The following description is not intended to limit the scope of the present application in any way, but to illustrate various aspects and embodiments of the present application.

[0069] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the user or authorized by all parties, and the collection, use and processing of related data need to comply with relevant laws, regulations and standards, and provide corresponding operation portal for user to choose authorization or refusal.

[0070] In the prior art, an automation test system based on a local area network is relied on to achieve control of test equipment and collection of test data through direct connection of an upper computer and the test equipment. A test task is executed according to a preset test script, and test results are recorded in a local storage device. In this framework, creation, execution and analysis of the test task are all completed in a local area network environment within a laboratory. However, this way is difficult to meet the scene requirements of test complication and network environment diversification. For example, transmission of the test task and data is not subjected to encryption processing, so that the data is vulnerable to external attacks or tampering in the transmission process, and cannot meet the high security requirements. Furthermore, the existing system is usually set for a single laboratory scene, lacks the collaborative ability with cloud resources, and is low in efficiency in execution of distributed laboratory or remote test tasks.

[0071] Based on the above problems and requirements, the inventive concept of the present application is to provide an automation test method for a complex network environment. Specifically, a test management platform deployed in a cloud environment, an Internet of Things device management platform, a data gateway service layer and a test execution layer deployed in a local area network are set. The test management platform is used to generate a test event to be tested, contains test execution information, and delivers it to the downstream part. The Internet of Things device management platform is used for data transfer and storage, publishes the test event and receives and manages test data information fed back by the test execution layer, forms a unified data storage and management mechanism. The data gateway service layer serves as a communication bridge, realizes safe transmission of the test event to be tested and test data through an encryption algorithm and a message queue. The test execution layer is a specific execution end of the test task, and is used to control test equipment to run based on a test script, collect and feed back test data. Through combination setting of cloud computing resource pool and local area network, closed-loop operation of the test task from the cloud to the equipment end is realized, and diversified scenes involving public cloud services, third-party platforms and local area network equipment in the laboratory are adapted. At the same time, the expansibility, stability and compatibility of the test system are enhanced, so that it is suitable for different equipment, complex network environment and diversified test requirements.

[0072] The automatic test system of the present application is suitable for various complex test scenarios, especially in test tasks involving multi-device collaboration, multi-protocol support and cross-network environment. In a large laboratory, the system can efficiently manage and schedule various test devices, realizing full-process automation from cloud generation to device execution of test tasks; in performance testing of electronic products or industrial devices, the system supports various communication protocols (such as Telnet, WebSocket, UDP, etc.) through the instrument host computer, adapts to the interface specifications of devices from different manufacturers, and ensures the compatibility and flexibility of testing; in dynamic environment testing that requires real-time monitoring, such as high and low temperature and humidity testing, energy consumption monitoring or device running state analysis, the system collects environmental parameters or energy consumption data through external monitoring modules, and combines with device performance data to provide support for testing and analysis. In addition, in a test environment combining cloud platform and local area network, the system can use cloud computing resource pool and distributed message queue technology to ensure the efficiency and security of test tasks and data in the transmission process, and is suitable for laboratories that rent public cloud services or require remote collaboration.

[0073] The technical solutions of the present application and how the technical solutions of the present application solve the above technical problems will be described in detail below with specific examples. The following specific examples can be combined with each other, and the same or similar concepts or processes may not be described again in some examples. The embodiments of the present application will be described below with reference to the accompanying drawings.

[0074] Figure 1 The structural schematic diagram of the automatic test system provided by the embodiments of the present application is shown in FIG. 1. As shown in FIG. 1, the automatic test system realizes device test automation and data management in a complex network environment through the collaborative work of the test management platform 11, the Internet of Things device management platform 12, the data gateway service layer 13 and the test execution layer 14. Figure 1

[0075] The test management platform 11 is used to generate a to-be-tested event containing test execution information based on a cloud computing resource pool, and publish the test event through the Internet of Things device management platform 12 to ensure the distribution and execution of test tasks.

[0076] In the present embodiment, the test management platform 11 relies on the cloud computing resource pool to provide computing power and flexible resource scheduling. The cloud computing resource pool is a virtualized computing environment that supports parallel processing and management of large-scale test tasks through dynamic allocation of computing, storage and network resources. For example, the test management platform 11 can generate a to-be-tested event containing test execution information according to the settings by calling the related services of the cloud computing resource pool. These test execution information usually includes the type of test device, the specific parameters of test task, the calling path of test script and the priority of task, etc., to ensure that the test task can be executed as required.​

[0077] After the generation of the test event to be tested, the test management platform 11 sends the test event to the device management platform through the communication interface with the Internet of Things device management platform 12. This process usually adopts a preset communication protocol to ensure the reliability and stability of data transmission. In this process, the test event can be further encapsulated and processed to adapt to the interface requirements of the device management platform and ensure that it can receive and identify the test event. Through the generation and release of the test event by the test management platform 11, unified planning and release of the test task can be realized. This process also provides support for the dynamic scalability of the system and can flexibly adjust resource allocation according to actual needs, laying a foundation for the operation of the subsequent test execution layer 14.

[0078] The data gateway service layer 13 is used to encrypt the test event to be tested after determining the release of the test event, using a preset data encryption algorithm, to obtain an encrypted test event, and to send the encrypted test event to the test execution layer 14 in the form of message queue data transmission.

[0079] In this embodiment, the main function of the data gateway service layer 13 is to encrypt the test event after its release and send the encrypted test event to the test execution layer 14 through the transmission mechanism of the message queue. This process ensures the secure transmission of the test event to be tested in a complex network environment and improves the overall reliability and flexibility. First, the data gateway service layer 13 listens to the test event release from the Internet of Things device management platform 12 in real time. After the release of the test event to be tested, the data gateway service layer 13 will immediately obtain the event. After obtaining the test event, it is verified for its integrity and validity. This verification process is usually based on a preset event structure and parameter verification mechanism to ensure that the test event has not been tampered with and meets the predefined format requirements.

[0080] After determining that the to-be-tested event is published and passed verification, the data gateway service layer 13 performs encryption processing on the to-be-tested event. The encryption process adopts a preset data encryption algorithm, which can include symmetric encryption (such as Advanced Encryption Standard, referred to as AES) or asymmetric encryption (such as Remote Storage Engine, referred to as RSA) mode, to ensure the confidentiality and integrity of data during transmission. The selection of the encryption algorithm usually depends on the security requirements and computing performance of the system. For example, the AES encryption algorithm is commonly used in large-scale data encryption scenarios due to its high efficiency and wide applicability, while the RSA encryption algorithm is more suitable for sensitive tasks due to its flexibility in key management. The encrypted test event is referred to as an encrypted test event, which has a high security level and can effectively prevent data from being maliciously intercepted or tampered with during transmission. Through encryption processing, the data gateway service layer 13 ensures the security of the test event in a complex network environment.

[0081] After encryption is completed, the data gateway service layer 13 sends the encrypted test event to the test execution layer 14 through message queue data transmission. Message queue is an asynchronous communication mechanism. The setting of the message queue makes the data transmission efficient and reliable: on the one hand, the message queue can buffer the encrypted test event to be transmitted, avoiding data loss due to network fluctuations; on the other hand, the message queue supports topic subscription and load balancing mechanism, which can flexibly adapt to the concurrent requirements of the test execution layer 14. For example, Kafka can realize distributed storage and consumption of messages through partition (Partition) mechanism, ensuring that the test event can be accurately routed to the target device in a multi-device test scenario. In summary, the data gateway service layer 13 realizes the secure distribution of encrypted test events, while ensuring the efficient transmission of test tasks in a complex network environment. Through encryption processing of test events and transmission based on message queues, full-link data protection of test tasks is realized, enhancing the reliability and security of the system in large-scale distributed test scenarios.

[0082] The test execution layer 14 is configured to execute device testing based on a local area network according to the encrypted test event, collect and obtain test data information, and send the test data information to the Internet of Things device management platform 12 according to an information feedback mode matched with the test data information.

[0083] In the present embodiment, the test execution layer 14 receives encrypted test events in a local network environment, executes device test tasks, and sends the collected test data information to the IoT device management platform 12 according to a preset information feedback mode. Specifically, the test execution layer 14 communicates with the data gateway service layer 13 through a local network and receives encrypted test events from the data gateway service layer 13 through a preset message queue mechanism. After receiving the encrypted test events, the test execution layer 14 first decrypts the encrypted test events using a decryption algorithm. The decryption algorithm is usually paired with the encryption algorithm used in the data gateway service layer 13. The completion of the decryption process ensures that the test execution layer 14 can correctly parse the test execution information in the test events, such as the test device type, test script path, test parameter configuration, and task priority.

[0084] After decryption and parsing are completed, the test execution layer 14 sends test instructions to the target test device according to the parsed test execution information and starts the test script. During the execution of the test instructions by the test device, the test execution layer 14 monitors the test data (such as the running state and performance data) of the test device in real time. The test execution layer 14 sends the test data information to the IoT device management platform 12 through a local network. During data transmission, the test execution layer 14 processes the test data according to a preset information feedback mode, such as defining the priority, distribution path, and confirmation mechanism of the data, to ensure that the data can be correctly received and stored by the IoT device management platform 12. Through the test execution layer 14, a closed-loop management from test event parsing to test data collection and feedback is achieved. Through encrypted data parsing and transmission in the local network, the execution of test tasks and the feedback of data are realized, improving the flexibility and security of the test system.

[0085] The IoT device management platform 12 is configured to receive and store test data information of different test events.

[0086] In the present embodiment, the IoT device management platform 12 receives test data information from the test execution layer 14 and stores and manages these data. Through data management capabilities, the IoT device management platform 12 realizes the unified reception, integration, and storage of data generated by different test events in a complex network environment, providing support for subsequent data analysis and decision-making. The IoT device management platform 12 receives test data information from the test execution layer 14. For example, after the test execution layer 14 completes the test task through a local network, the IoT device management platform 12 continuously listens to the message topics related to the test data information (such as the preset topics in the MQTT or Kafka message queue). After listening to new test data messages, the IoT device management platform 12 will immediately extract and verify the integrity and validity of the data to ensure that the data is not lost or tampered during transmission.

[0087] After receiving the test data information, the Internet of Things device management platform 12 stores the data according to the test events. Test events are usually managed as task units. In order to improve the efficiency and reliability of data storage, distributed storage technology is usually used, such as NoSQL database (such as Mongo database) or distributed file system (such as Hadoop Distributed File System, abbreviated as: HDFS), to support fast writing and reading of large-scale data. For data with high real-time requirements, a memory database (such as Remote Dictionary Server, abbreviated as: Redis) can also be introduced for cache processing to ensure fast response of data. At the same time, the Internet of Things device management platform 12 realizes efficient organization of different test event data through classification and indexing management of data. For example, test data generated by different test devices can be stored in association through device ID or event ID, while the timestamp and task priority of the test data are used as query conditions to support subsequent data retrieval and analysis. In this way, the Internet of Things device management platform 12 not only meets the centralized management needs of multi-source data, but also supports multi-dimensional data query and analysis.

[0088] Further, after storage is completed, the Internet of Things device management platform 12 can also manage the state and access control of test data information. For example, the Internet of Things device management platform 12 can archive or delete historical data according to the data lifecycle management strategy, avoiding waste of storage resources. By introducing an access permission control mechanism, the Internet of Things device management platform 12 can divide data access permissions according to user roles to ensure the security and privacy of test data. By receiving and storing test data information for different test events, the Internet of Things device management platform 12 provides data management capabilities for the entire automated test system. Through the data receiving and storage mechanism, the integration and security management of test data are realized, ensuring the integrity and traceability of data.

[0089] The application realizes efficient generation and flexible management of test tasks through the test management platform 11, improves the adaptability and expansion capability of test tasks by using the dynamic scheduling capability of the cloud computing resource pool, and improves the processing efficiency of task creation and distribution. Through the encryption processing of the data gateway service layer 13 and the message queue transmission form, the full-link data protection of the test task in the complex network environment is realized, ensuring the security of data transmission and reliable distribution in the high concurrency environment. The test execution layer 14 accurately controls the device to execute the test task based on the encrypted test event, and collects test data in real time, ensuring the effectiveness of task execution and the efficiency of data collection, and realizing closed-loop management of the test task. The Internet of Things device management platform 12 realizes centralized management and traceability of data by receiving and storing test data information, improves the convenience of data access and the support capability of subsequent analysis.

[0090] Further, the test management platform 11 comprises a test data display module.

[0091] Then the test management platform 11 is also used for: obtaining test data information matched with the test execution information from the Internet of Things device management platform 12, and visualizing and displaying the test data information through the test data display module. The test data information includes real-time test data and / or result test data.

[0092] In this embodiment, the function of the test management platform 11 is not only limited to generating and issuing test tasks, but also includes realizing real-time monitoring and visualizing display of test results through the test data display module. After the test task is executed, the test management platform 11 obtains test data information matched with the test execution information from the Internet of Things device management platform 12 through the communication interface. The test data information includes but is not limited to performance test results, running state, environmental monitoring data and key logs of task execution of the test device. These data are collected by the test execution layer 14 and transmitted to the Internet of Things device management platform 12, and after classification and storage, the test data can be matched with specific test execution information through a unique test task identifier, so as to ensure that the test management platform 11 can quickly retrieve the required test data.

[0093] After obtaining the test data information, the test management platform 11 performs visual processing and presentation of the data through the test data display module. For example, the visual display module can present complex test data information in an intuitive form on the user interface by relying on modern data visualization technologies such as charts, real-time curves, dashboards, etc. For example, for performance data of test equipment, the trend of indicators such as current, voltage or temperature can be displayed through a line chart; for result data of test task execution, statistical information such as success rate and error distribution can be displayed through a column chart or a pie chart. This diversified visualization form enables users to quickly understand and analyze test results, improving the readability of test data.

[0094] To further enhance the accuracy and flexibility of data display, the test data display module can implement multi-dimensional query and filtering functions. Users can filter and sort the displayed data according to the execution time of the test task, the identification of the test equipment or the type of the task, etc. For example, in a large-scale parallel test scenario, users can set filtering conditions to focus on the execution results of a specific device or task, and quickly obtain key data. This flexible data display method can meet the individual needs of different users and provide higher convenience for test management. At the same time, the test data display module can update data in real time. Through a dynamic data interface with the Internet of Things device management platform 12, the test management platform 11 can obtain the latest data in real time during the execution of the test task, and display the current test progress and device status in the form of a dynamic chart. For example, in a device performance test, users can monitor the changes in the operating parameters of the test equipment in real time and promptly identify potential problems. This real-time display capability not only improves the transparency of the test process, but also provides users with the possibility of dynamically adjusting test parameters or tasks, thereby improving the flexibility and responsiveness of the test. In summary, through the test data display module in the test management platform 11, the test system realizes the integration from data collection to visualization. Through dynamic acquisition and multi-dimensional display of test data information, the user's insight into the test process is improved, and the value of test data is also improved, providing solid support for subsequent analysis, decision-making and optimization.

[0095] In one embodiment, the test management platform 11 includes a test generation module and an information interaction module. The test management platform 11 realizes a complete functional chain from user demand input to task generation and release through the test generation module and the information interaction module, ensuring the flexibility, standardization and distribution efficiency of the test task. The test management platform 11 is specifically used for:

[0096] The test generation module reads the test requirement information input by the user, and acquires test execution information according to the test requirement information, and generates a to-be-tested event containing the test execution information according to the cloud computing resource pool;

[0097] The information interaction module sends the to-be-tested event to the IoT device management platform 12 according to the preset communication interface protocol, so that the IoT device management platform 12 publishes the test event.

[0098] In this embodiment, the test management platform 11 can read the test requirement information input by the user through the test generation module. The test requirement information usually includes the type of test equipment, test target, test parameter, and execution condition, etc. The test generation module performs structured processing on the test requirement information input by the user through a preset analysis mechanism, to ensure the standardization and integrity of the data format. For example, the test parameters in the test requirement may involve indicators such as voltage, current, and environmental temperature, and the test generation module will convert these parameters into standard data structures that can be directly called according to the requirements of the system, to ensure the processing and analysis of the task. After the structured processing is completed, the test generation module generates test execution information according to the user requirement information, which usually includes the calling path of the test script, the identification of the test equipment, the task priority, and the environmental constraint condition, etc. These information clearly defines the execution target and specific requirements of the test task. Based on the test execution information, the test generation module calls the cloud computing resource pool to generate a to-be-tested event containing the test execution information. The cloud computing resource pool supports parallel processing and dynamic adjustment of large-scale test tasks by dynamically allocating computing resources and storage resources. The test generation module stores the generated to-be-tested event in the resource pool by interacting with the interface of the cloud computing resource pool, and classifies and marks the task, to facilitate subsequent distribution and management. The test management platform 11 can be deployed in the cloud environment to realize the scheduling of the cloud computing resources.

[0099] Through the information interaction module, the test management platform 11 can send the generated test event to the Internet of Things device management platform 12. The information interaction module is responsible for establishing a stable communication connection with the Internet of Things device management platform 12, and usually uses a preset communication interface protocol (such as HTTP, MQTT, WebSocket, etc.) to realize reliable transmission of events. These protocols can ensure the integrity and transmission efficiency of data, and support flexible adaptation in different network environments. For example, in a high real-time requirement scenario, the MQTT protocol can be used to quickly deliver the test event to the Internet of Things device management platform 12 through the publish / subscribe mechanism; while in a complex network environment, the WebSocket protocol can ensure the bidirectionality and stability of data transmission. After the test event is sent to the Internet of Things device management platform 12 through the information interaction module, the Internet of Things device management platform 12 further publishes the test event for other modules to listen to and process. This process ensures that the test task can be accurately delivered to the execution layer. Further, in this process, the information interaction module can also monitor and feedback the task transmission process, such as recording the sending state of the task, and resending the task in abnormal cases, to ensure the transmission reliability of the test task.

[0100] Figure 2 The overall architecture diagram provided by the embodiments of the present application is shown. Based on the above-mentioned embodiments, as shown in Figure 2 The test execution layer 14 includes an instrument host computer and a test device. Through the cooperation of the instrument host computer and the test device, the test execution layer 14 can receive test tasks, parse execution information, control test devices, collect test data, and complete data transmission. Then the test execution layer 14 is specifically used for:

[0101] Through the instrument host computer, the encrypted test event is obtained, and the encrypted test event is decrypted according to the decryption algorithm of the encryption algorithm to obtain the test execution information;

[0102] Through the instrument host computer, after determining that the test execution information meets the preset test parameter specification, the test script matched with the test execution information is obtained through the instrument host computer according to the test execution information;

[0103] Through the instrument host computer, the test execution instruction carrying the test script is sent for the test device to perform device testing;

[0104] Through the instrument host computer, the test device is monitored, and the first test data information is collected and obtained, and the first test data information is encrypted according to the preset data encryption algorithm;

[0105] The instrument host computer sends the encrypted first test data information to the data gateway service layer 13 in the form of message queue data transmission, so as to send the first test data to the Internet of Things device management platform 12 through the data gateway service layer 13.

[0106] In this embodiment, the test execution layer 14 receives the encrypted test event from the data gateway service layer 13 through the instrument host computer. The instrument host computer is a software platform for managing test task execution and device control, with high compatibility and multi-protocol adaptation capability. After receiving the encrypted test event, the instrument host computer decrypts the event data according to the decryption algorithm matched with the encryption algorithm. Through decryption, the instrument host computer can extract test execution information, such as test device type, test parameters, test script path, and task priority. After decryption, the instrument host computer performs preset parameter specification verification on the test execution information. The preset test parameter specification defines the basic requirements of the test task, such as the range of input parameters, the constraints of test conditions, and the availability state of the device. The purpose of this step is to ensure the validity of the test task and avoid test failure or device abnormality caused by parameter errors. After verification, the instrument host computer obtains the test script matched with the test task from the task library according to the test execution information. The test script is a program file for specifically controlling the test device, usually based on Python, Lua or other programmable languages, which can adapt to the communication protocol and functional requirements of different devices. This ensures the flexibility and scalability of the test task.

[0107] After obtaining the test script, the instrument host computer sends a test execution instruction to the test device, starting the device test process. The test execution instruction carries the test script, including test steps, device configuration parameters, execution time, and other key information. The instrument host computer establishes a stable connection through the communication interface with the test device to transmit test commands and data in real time. The communication interface includes but is not limited to serial communication (such as RS-485, RS-232) and network communication (such as UDP, WebSocket protocol, Telnet). The multi-protocol adaptation capability of the instrument host computer enables the test execution layer 14 to be compatible with multiple types and manufacturers of test devices, meeting the testing needs of multiple scenarios. During the execution of the test device, the instrument host computer monitors the running state and test data of the device in real time. The monitoring content includes device running parameters (such as voltage, current, temperature, etc.), test progress information, and device abnormal state (such as overload alarm, communication interruption). At the same time, the instrument host computer obtains first test data information through the acquisition module, which is usually the original performance data generated directly by the test device, such as current curve, power fluctuation data, or environmental response data, etc. Through real-time acquisition, the instrument host computer ensures the completeness and timeliness of the test data. To ensure the safety of the test data during transmission, the instrument host computer encrypts the first test data information according to the preset data encryption algorithm. The encryption algorithm can be based on an end-to-end encryption strategy to protect the privacy and integrity of the data. The encrypted test data is sent to the data gateway service layer 13 in the form of message queue transmission, which can ensure the stability and accuracy of data transmission in high concurrency situations. The encrypted first test data information is received by the data gateway service layer 13 and further processed before being transmitted to the Internet of Things device management platform 12. Through this process, the execution of the test task and the safe transmission of the data are ensured, providing accurate and reliable data support for the data storage and analysis of the Internet of Things device management platform 12.

[0108] Furthermore, test equipment includes, but is not limited to, automated test instruments and conventional instruments. Automated test instruments typically support remote control and programming interfaces, and the instrument host computer can establish direct communication with them through a preset communication protocol to implement parameter configuration and task execution. Conventional test instruments generally do not have automated interfaces, and automated control can be achieved through expansion modules (such as external control modules) or simulated operations. The instrument host computer mainly uses external hardware control devices and manual script simulation operations to control conventional test instruments. For example, the instrument host computer uses external modules such as relay controllers or general purpose input / output (GPIO) interfaces to perform simple signal triggering and on / off operations on conventional test instruments. For example, it controls the instrument's start / stop button, adjustment knob, or other mechanical operations. The instrument host computer uses external sensors or data acquisition cards (such as data acquisition modules, or DAQ modules) to collect output signals from conventional test instruments, such as voltage output or frequency change data. After processing and encryption, the collected data is sent to the data gateway service layer according to the same transmission process as the automated test instruments. Furthermore, for some test instruments lacking digital interfaces, the instrument host computer can incorporate image recognition technology or robotic arm manipulation to achieve simulated automated control. For example, a camera can capture readings on the instrument display, or a robotic arm can operate knobs and buttons to complete the test task. The specific implementation methods can be based on existing technologies and will not be detailed here. This allows the host computer to adapt to a wide range of test equipment, meeting the control requirements of modern instruments while maintaining the automated testing capabilities of traditional instruments.

[0109] In a specific embodiment, Figure 3 This is a schematic diagram of the connection structure between the instrument host computer and the test equipment provided in the embodiment of the present application. Figure 3 As shown, the test equipment includes at least one of a DC power analyzer, a temperature rise data acquisition device, and a high-low temperature alternating humidity test chamber. The test execution layer 14 communicates with these devices through the instrument host computer and sends test instructions, ensuring that the devices execute the predetermined tasks according to the test script and return the first test data information. Through multi-protocol communication capabilities, the test execution layer 14 achieves efficient control and data acquisition of different test devices, meeting the needs of diverse test scenarios. The test execution layer 14 is specifically used to:

[0110] The instrument host computer communicates with the DC power analyzer using the Telnet protocol to execute the test script through the DC power analyzer and complete the collection of the first test data information through the instrument host computer;

[0111] The instrument host computer communicates with the temperature rise data acquisition device using the WebSocket protocol to execute test scripts and collect first test data information.

[0112] The instrument host computer communicates with the high-low temperature alternating humidity test chamber using the UDP protocol to execute test scripts and collect first test data information.

[0113] In this embodiment, when testing the DC power supply analyzer, the test execution layer 14 establishes a communication connection with the device using the Telnet protocol through the instrument host computer. Telnet is a text-based remote control protocol that can transmit real-time commands to remote devices over a TCP / IP network. The test execution layer 14 sends a test script to the DC power supply analyzer through the Telnet protocol, which contains specific test steps, device parameter settings, and output conditions, such as voltage range, current size, and test duration. After receiving the test script, the DC power supply analyzer begins to execute the specified tasks, such as recording power performance indicators, voltage stability, or load response characteristics. The test execution layer 14 monitors the running state of the DC power supply analyzer in real time through the instrument host computer and collects the first test data information generated. The first test data information includes voltage fluctuation data, current curve, or power output stability data, etc.

[0114] For the temperature rise data acquisition device, the test execution layer 14 communicates with the device using the WebSocket protocol through the instrument host computer. The WebSocket protocol is a full-duplex communication protocol that can maintain real-time and high-efficiency communication after establishing a connection. The instrument host computer sends a test script through the WebSocket protocol, which can include measurement time interval, target temperature variation range, and collection frequency parameters. After receiving the test script, the temperature rise data acquisition device begins to monitor the device's temperature rise curve or thermal distribution state in real time and returns the collected data to the instrument host computer through the WebSocket protocol. The first test data information may include the dynamic variation curve of the device temperature, the time constant of the heating and cooling process, and the performance of the device under extreme temperature conditions.

[0115] In the test of the high-low temperature alternating damp heat test chamber, the test execution layer 14 communicates with the device through the instrument host computer using the User Datagram Protocol (UDP). During the execution of the test task, the instrument host computer sends a test script to the high-low temperature alternating damp heat test chamber through the UDP protocol. The script usually contains parameters such as the temperature range, humidity conditions, alternating period, and device exposure time of the test. The test chamber adjusts the internal environment according to the received test script and simulates the specified high-low temperature and damp heat conditions. The test execution layer 14 collects the first test data information generated during the operation of the device in real time through the instrument host computer, such as the environmental temperature curve, humidity change rate, and device running state data under extreme conditions.

[0116] In another embodiment, as shown in Figure 2 the test execution layer 14 also includes an external monitoring module and a positioning tag module. The test execution layer 14 is also specifically used for:

[0117] Based on the execution of the device test, the second test data of the test device is collected through the external monitoring module, and the second test data information is sent to the Internet of Things device management platform 12 through the pre-installed wireless communication unit; and,

[0118] Through the positioning tag module, the third test data of the test device is obtained according to the positioning base station, and the third test data information is encrypted according to the pre-set data encryption algorithm, and the encrypted third test data information is sent to the data gateway service layer 13 in the form of message queue data transmission, so as to realize the sending of the third test data to the Internet of Things device management platform 12 through the data gateway service layer 13;

[0119] Among them, the second test data includes device energy consumption data, and the third test data includes device location information.

[0120] In the present embodiment, the external monitoring module provides comprehensive running state information of the test system during the running process of the test equipment through real-time monitoring and data collection. Specifically, the external monitoring module is responsible for collecting the second test data of the equipment during the running process, and sending these data to the Internet of Things equipment management platform 12 through the pre-installed wireless communication unit. The external monitoring module is composed of various sensor components, and these sensors can collect external state data or additional performance parameters during the running of the equipment independently of the internal monitoring unit of the test equipment. For example, the power consumption data of the test equipment during the running process can be collected in real time through the energy consumption sensor. Through the monitoring of environmental data and running data, the external monitoring module can provide a more comprehensive data perspective for the test task, effectively supplementing the first test data information obtained in the equipment test. During the execution of the equipment test, the external monitoring module runs synchronously with the test equipment. Through real-time perception of the running state of the equipment, for example, the temperature and humidity sensor in the external module can collect real-time temperature and humidity data of the environment where the test equipment is located; in the energy consumption monitoring scene, the energy consumption meter in the external module can record the power consumption fluctuation curve of the equipment under different working conditions. These data are collected in real time by the external energy consumption sensor and transmitted to the Internet of Things equipment management platform 12 for unified storage and management through wireless communication (such as CAT1 or Wi-Fi).

[0121] The use of the external monitoring module not only improves the ability of the test system to analyze the energy efficiency of the equipment, but also provides basic data support for subsequent energy-saving optimization. Through real-time collection and transmission of equipment energy consumption data, comprehensive monitoring of the energy efficiency of the test equipment is realized, and the adaptability of the test system in complex application scenarios is enhanced. It should be noted that the external monitoring module can be triggered by the upper computer for unified control to perform the monitoring task; or it can automatically collect data according to the start of the equipment when the test equipment is running. The specific implementation mode can be flexibly set according to the specific laboratory LAN environment, and no specific limitation is made here.

[0122] Meanwhile, the position information of the test device (i.e., the third test data) can be obtained in real time through the positioning tag module. The positioning tag module relies on the support of the positioning base station and realizes real-time tracking of the position information of the test device through a communication protocol (such as LoRa, Wi-Fi, or Bluetooth). The position information is usually represented in the form of three-dimensional coordinates or regional identifiers, and is used to reflect the specific position changes of the test device in the test scene. To ensure the security of data transmission, the positioning tag module will encrypt the third test data information according to a preset data encryption algorithm after collecting the device position information, and send the encrypted data to the data gateway service layer 13 through the message queue data transmission form. In the data gateway service layer 13, the third test data is further integrated and processed, and then transmitted to the Internet of Things device management platform 12 for storage and management. Through the encrypted transmission of the device position information, the secure sharing of the device position information in a complex network environment is realized, and the reliability of the test system in dynamic monitoring and device management is improved. It should be noted that the encryption of the positioning information can be done by a separate module, or it can be obtained and encrypted by the upper computer. The specific implementation mode can be flexibly set according to the specific laboratory LAN environment, and is not limited here.

[0123] The second test data and the third test data together constitute a multi-dimensional monitoring of the running state of the test device, providing support for the comprehensiveness and accuracy of the test system. Energy consumption data can reflect the device running efficiency and energy consumption, while position information provides a basis for multi-device collaborative testing or device mobility analysis. This combination not only enhances the perception ability of the test system for the running state of the test device, but also lays a solid foundation for subsequent test optimization and result analysis. At the same time, through the wireless communication unit setting, the stability and security of the test data in transmission are ensured, so that the system can adapt to the needs of different network environments.

[0124] In one embodiment, the Internet of Things device management platform 12 includes a data storage module; then the Internet of Things device management platform 12 is specifically used for:

[0125] Through the data storage module, test data information of different test events is received and stored; wherein the test data information includes at least one of the first test data information, the second test data information, and the third test data information.

[0126] In the present embodiment, after the test execution layer 14 completes the device test and transmits the first test data information, the second test data information and the third test data information to the Internet of Things device management platform 12, the data storage module is responsible for receiving these data and classifying and storing them. The data storage module can associate the data from different test tasks with their corresponding test events through task identification or device identification, realizing accurate management of the data. For example, in the process of storing data, the data storage module performs structured processing on the data. For different types of test data information, the data is layered and indexed through preset storage rules. For example, the first test data information is stored according to the device performance index, facilitating subsequent user performance analysis; the second test data information and the third test data information are stored in groups according to the task running environment or the device state, facilitating dynamic query of environmental data. In addition, it also has multi-dimensional data indexing function, such as indexing conditions based on test time, device identification, event type, etc., providing convenience for subsequent fast retrieval and use of data. Further, while realizing reliable storage of data, the data storage module also has security and data management capabilities. The data storage module can combine with the permission management mechanism to limit the access rights of different users to the test data information, thereby protecting the confidentiality of the data. In addition, through the data integrity checking and management function, the data storage module can effectively prevent data loss or tampering in the data storage and calling process, ensuring the authenticity and consistency of the data. Through the data storage module, the Internet of Things device management platform 12 realizes centralized reception and storage of data information of different test events, providing guarantee for data flow of the entire automatic test system. This not only improves the data utilization efficiency of the test system, but also provides data support for subsequent result analysis, visual display and test optimization.

[0127] In one embodiment, the Internet of Things device management platform 12 further comprises an event publishing module. Then the Internet of Things device management platform 12 is also specifically used for:

[0128] Through the event publishing module, the to-be-tested event is published to a preset event topic for the data gateway service to listen, realizing publication of the to-be-tested event.

[0129] In the present embodiment, the main function of the event publishing module is to publish the to-be-tested events to the preset event topics. The event topic is a logical classification unit for organizing and managing the task data flow in the system. Each to-be-tested event is assigned to an event topic after being generated, so that the data gateway service can subscribe and process the corresponding events according to the preset logic. For example, different types of test tasks can be published to different topics (such as electrical performance test topics, environmental monitoring test topics, etc.), thereby realizing the classification management and distributed processing of tasks. After the to-be-tested event arrives at the Internet of Things device management platform 12, the event publishing module will perform standardized processing and format packaging on it. This process usually includes checking the event data structure, supplementing the event attributes, and assigning the event priority. For example, the event publishing module will check the integrity of the to-be-tested event to ensure that it contains necessary information such as test device identification, task script path, execution parameters, and timestamp. At the same time, the event publishing module will assign the priority of the event according to the scheduling strategy, so as to ensure that high-priority tasks can be executed preferentially when multiple tasks are processed in parallel. After standardized processing, the to-be-tested event is converted into a standard event format that meets the preset requirements, facilitating the identification and processing of subsequent modules.

[0130] The event publishing module publishes the to-be-tested event to the specified event topic through a preset communication protocol (such as Message Queuing Telemetry Transport, MQTT). MQTT is a lightweight publish / subscribe message protocol suitable for low-bandwidth and high-latency network environments. According to the requirements, the event publishing module can select different protocols for task publishing. For example, in scenarios with high real-time requirements, the MQTT protocol can ensure the rapid publication and timely listening of events; while in large-scale distributed test tasks, the partition storage and parallel consumption mechanism of Kafka can improve the efficiency of task publishing and processing. The to-be-tested event published to the event topic will be listened to by the listening module of the data gateway service in real time. Once the event is published, the data gateway service will obtain the event data by subscribing to the corresponding event topic and perform subsequent encryption and task distribution work. In order to further enhance the reliability of task publishing, the event publishing module can also track the task status and handle exceptions. For example, in the case of unstable network transmission, the event publishing module can detect the failure of event publishing and republish the task through a retry mechanism or a failover strategy to ensure that the task will not be lost due to network interruption.

[0131] Next, in one embodiment, the data gateway service layer 13 includes an event listening module, a data encryption module, and a message queue module, and the data gateway service layer 13 is specifically configured to:

[0132] The event listening module listens to the publication of the to-be-tested event according to a preset event topic, and acquires the to-be-tested event after determining that the to-be-tested event is published;

[0133] The data encryption module encrypts the to-be-tested event by using a preset data encryption algorithm to acquire an encrypted test event;

[0134] The message queue module transmits the encrypted test event to the test execution layer 14 in a message queue data transmission form.

[0135] In this embodiment, the data gateway service layer 13 listens to the publication of the to-be-tested event in real time according to a preset event topic through the event listening module. The event listening module is connected with the event publishing module by subscribing to the event topic in the Internet of Things device management platform 12. Once the publication of the to-be-tested event is detected, the event listening module will immediately acquire the event data and perform preliminary verification to ensure the data integrity and structure conform to the preset specification. The real-time nature of the event listening module ensures that the to-be-tested event can be quickly captured after being published, reducing the delay of task distribution. After acquiring the to-be-tested event, the data gateway service layer 13 performs encryption processing on the event through the data encryption module. The data encryption module encrypts the content of the to-be-tested event by using a preset data encryption algorithm to generate an encrypted test event. For example, the data gateway service layer 13 can combine two encryption methods: using RSA to encrypt the key metadata of the task to ensure high security during transmission; and using AES to encrypt the large-capacity task data to balance efficiency and security. Through encryption processing, the data gateway service layer 13 can effectively prevent the to-be-tested event from being intercepted, tampered with, or leaked during transmission, providing reliable data protection for the execution of the test task.

[0136] After encryption is completed, the data gateway service layer 13 transmits the encrypted test event to the test execution layer 14 through the message queue module. The message queue module uses a distributed asynchronous communication mechanism to support reliable transmission of high-concurrency tasks. During transmission, the message queue module stores the encrypted test event in segments and generates a message identifier to ensure that the transmission task can be quickly recovered in the event of network interruption or node failure, avoiding data loss. At the same time, the message queue module supports a multi-consumer subscription mechanism, allowing multiple devices in the test execution layer 14 to simultaneously listen to and receive tasks, thereby improving parallel processing capabilities. In summary, the event listening module ensures that the to-be-tested event can be quickly captured and verified; the data encryption module encrypts the event by using a preset algorithm to ensure the security of task transmission; and the message queue module uses an efficient and reliable transmission mechanism to ensure that the encrypted test event can reach the test execution layer 14. This not only improves the efficiency and security of test task distribution in complex network environments, but also enhances the scalability and adaptability of the system.

[0137] On the basis of the above-mentioned embodiments, the overall workflow of the test system is explained here, Figure 4 The overall workflow of the test system provided by the embodiments of the present application is shown in the schematic diagram. As shown, Figure 4 It includes:

[0138] Create a test task and configure parameters: the user selects the specific product that needs to be tested from the product list through the operation interface of the test management platform 11. Then, the user selects the test standard that matches the product type and test requirements from the provided preset standard library, such as industry standards, quality specifications, or performance requirements. At the same time, the user selects the test cases required to cover the test task, which define the test steps, expected results, and test conditions in detail. The user selects the test instrument type that matches the test task through the test management platform 11, and can also flexibly configure test parameters such as voltage range, environmental temperature conditions, or test time according to test requirements.

[0139] After the above configuration is completed, the test management platform 11 sends the generated test event to the Internet of Things device management platform 12 through the information interaction module. The Internet of Things device management platform 12 publishes the test event to the preset MQTT event topic (mqtt-topic) through its event publishing module for the data gateway service layer 13 to listen to.

[0140] The data gateway service layer 13 listens to the test event in the mqtt-topic through the event listening module, and after receiving the event, it performs data assembly (including format conversion) and forwards the test event to the specified message topic (kafka-topic) of Kafka.

[0141] The instrument host computer of the test execution layer 14 listens to the test event in the kafka-topic in real time. When receiving the event, the instrument host computer parses the test event to extract the test execution information. Then, the instrument host computer obtains the matching test script through the test execution information, and starts the test script process to control the target test device to perform the test task according to the script instructions.

[0142] During the execution of the test task by the test device, the instrument host computer monitors the device running state in real time to ensure that the device operates according to the expected conditions. At the same time, the instrument host computer collects the first test data information generated by the test device, and according to the preset encryption algorithm, the instrument host computer performs encryption processing on the collected data. The encrypted first test data information is sent to the specified topic (kafka-topic) of the Kafka message queue through the instrument host computer. The data gateway service layer 13 listens to this topic in real time, and after integrating and formatting the received test data, it forwards the data to the Internet of Things device management platform 12.

[0143] The IoT device management platform 12 receives and stores the integrated test data through the data storage module. At the same time, the test management platform 11 reads the real-time test data from the IoT device management platform 12 through the test data display module, and uses a visual interface to display the test process and quality results.

[0144] When the test device completes all the scheduled tasks, the instrument host computer stops the device operation and closes the test script process, and at the same time sends a task completion flag to the specified topic (kafka-topic) of the Kafka message queue for the data gateway service layer 13 to listen to. After receiving the task completion information, the data gateway service layer 13 forwards it to the IoT device management platform 12 for recording and storage. And the instrument host computer analyzes and generates the final test result data (such as whether the test passes, performance index analysis results, etc.) according to the time parameters and execution conditions in the test task. The test result data is encrypted by the instrument host computer and then transmitted to the data gateway service layer 13 again, and the data gateway service layer 13 forwards it to the IoT device management platform 12 for storage after processing.

[0145] The IoT device management platform 12 provides the stored test result data to the test management platform 11, and the test management platform 11 updates the execution results of each test case.

[0146] The test management platform 11 finally records the process and results of all test tasks, and provides users with traceable test archives and improvement suggestions.

[0147] Figure 5 The data flow diagram of the data transmission provided by the embodiment of the application is shown. Here, the direction of data transmission is described as a whole. On the basis of the above-mentioned embodiment, as shown in Figure 5 .

[0148] The data transmission embodiment includes test event data transmission, instrument state data transmission, and instrument point control data transmission. The specific implementation process is as follows:

[0149] The test management platform 11 first generates a test event to be tested, and sends the test event to the event-topic of the IoT device management platform 12 through the information interaction module. The data gateway service layer 13 listens to the event-topic through the event listening module, and uploads the test event to the task-info topic in the Kafka message queue after detecting the test event. The task-info topic is used to distribute task information for the instrument host computer of the test execution layer 14 to subscribe.

[0150] The instrument host computer listens to the task-info topic in real time. When receiving the test event, the instrument host computer parses the event content, extracts the test parameters, and generates the corresponding Python test script according to the extracted information. The Python test script is executed by the instrument host computer and sent to the target test device to control the test device to perform specific test tasks.

[0151] During the test execution process, the instrument host computer sends instructions in real time, collects the test data generated by the test device, and uploads the collected first test data information to the task-data topic of the data gateway service layer 13. After the test is completed, the instrument host computer analyzes the collected test data and uploads the analysis result to the task-result topic, and uploads the original data to the task-origin-data topic.

[0152] The data gateway service layer 13 listens to the task-data, task-result, and task-origin-data topics in real time, and integrates and formats the received data. After processing, the data gateway service layer 13 synchronizes the data to the event-topic of the Internet of Things device management platform 12 for the test management platform 11 to access and use. The test management platform 11 extracts real-time test data, test results, and original data from the event-topic and displays them to the user through a visual interface, facilitating real-time monitoring of test task progress.

[0153] During the test task execution process, the instrument host computer monitors the running state and attributes of the test device in real time. For example, it monitors the running state (such as "idle", "running", "fault", etc.) and key parameters (such as voltage, current, or temperature) of the device. During the monitoring process, the instrument host computer collects the state attribute data of the device in real time and uploads it to the device-status topic of the data gateway service layer 13.

[0154] After receiving the data of the device-status topic, the data gateway service layer 13 forwards it to the device-attributes topic of the Internet of Things device management platform 12. The Internet of Things device management platform 12 manages the state attribute data of the test device through the device-attributes topic, which is used by the test management platform 11 for real-time query and use. The test management platform 11 can display the current running state and parameter information of the device in the visual interface through real-time updating of the device attribute data.

[0155] During the execution of test tasks, the point control function of the instrument is supported by the automated test system to meet the temporary test requirements or manually adjust the running state of the equipment. The user inputs control commands such as starting, pausing, or adjusting the equipment parameters through the operation interface of the test management platform 11. The test management platform 11 sends these control commands to the device-control topic of the Internet of Things equipment management platform 12.

[0156] The data gateway service layer 13 listens to the device-control topic and immediately synchronizes the command to the device-control topic in the Kafka message queue after receiving the control command. The instrument host computer listens to the device-control topic in real time, parses the control command after receiving it, and generates specific control instructions according to the command content. For example, the control equipment starts a specific test program, adjusts the working parameters, or enters the pause state. The instrument host computer then sends the generated control instructions to the test equipment to perform the corresponding control operation.

[0157] The whole point control process is continuous, and the efficient cooperation of the data gateway service layer 13 and the instrument host computer ensures the real-time transmission of the control command and the timeliness of the equipment response. Through the point control function, the test management platform 11 realizes the flexible adjustment and manual intervention ability of the running state of the test equipment, providing more operation space for complex test scenarios.

[0158] Figure 6 A flowchart of a test method provided by an embodiment of the present application. Applied to the test execution layer, as shown in Figure 6 The method comprises the following steps:

[0159] S61, from the data gateway service layer, obtain an encrypted test event, and according to a decryption algorithm corresponding to the encrypted test event, perform data decryption on the encrypted test event to obtain test execution information;

[0160] S62, after determining that the test execution information meets the preset test parameter specification, according to the test execution information, obtain a test script matched with the test execution information, and according to the test script, execute and monitor the equipment test;

[0161] S63, collect the first test data information and / or the third test data information of the test equipment, and according to a preset data encryption algorithm, encrypt the first test data information and / or the third test data information, and in the form of message queue data transmission, send the encrypted first test data information and / or the third test data information to the data gateway service layer, so as to realize sending the first test data and / or the third test data information to the Internet of Things equipment management platform through the data gateway service layer;

[0162] S64, collect the second test data of the test device, and send the second test data to the Internet of Things device management platform.

[0163] The process of the test execution layer acquiring the encrypted test event and the test execution in this embodiment corresponds to the above-described embodiment, and the implementation principle and technical effects are similar. Details are not described herein again.

[0164] In one specific embodiment, Figure 7 A flowchart of the test execution of the instrument host computer is provided for the embodiments of the present application. Based on the above-described embodiments, as shown in Figure 7 , the flowchart includes the following steps:

[0165] The instrument host computer subscribes to a preset Kafka-topic (task topic) through its listening module. When the data gateway service layer sends a test event to the Kafka-topic, the instrument host computer listens to the topic in real time and receives the test task information. The task information includes test parameters, test device types, and test script paths.

[0166] After receiving the test task, the instrument host computer decrypts the task information through the built-in decryption module, extracts the test parameters and configuration data in the task. After decryption, the host computer checks the extracted parameters, such as whether the parameter values are within the allowed range of the device, whether they meet the specification requirements of the test task, etc. If the parameter check fails, the information of the failed check is returned to the Kafka-topic to realize subsequent data processing and decision analysis;

[0167] If the check passes, the instrument host computer generates a Python test script according to the decrypted test parameters. The script is a customized code for the target test device, which contains the specific execution logic and control instructions of the test task. The instrument host computer loads the generated test script as an independent process and starts it. By starting the script process, the task logic and hardware operation can be separated, improving the efficiency and stability of task execution. The instrument host computer establishes a connection with the test device through a preset communication protocol and sends the control instructions in the test script.

[0168] During the test process, the instrument host computer is responsible for real-time processing of test data, including result file writing, data uploading, and log recording. Among them, result file writing refers to writing the collected test data into a local result file in real time, facilitating subsequent local analysis and archiving; data uploading refers to sending the real-time collected test data to the data gateway service layer through Kafka-topic. When uploading data, the host computer will format and encrypt the test data; log recording refers to recording the steps and state information in the test script execution process in real time, such as test start time, data collection progress, and possible error information.

[0169] When the test script execution is completed, the instrument host computer sends a stop test instruction to the test device and terminates the script process. Subsequently, the instrument host computer performs cleaning operations, including releasing system resources, resetting device state, and closing the communication connection with the device, ensuring that the device can safely return to the initial state and prepare for the execution of subsequent test tasks.

[0170] The instrument host computer analyzes the first test data information generated during the test process, such as statistical device performance indicators or test result reports. After analysis, the host computer sends the test results to the data gateway service layer through Kafka-topic. After receiving the test results, the data gateway service layer will further process and forward them to the Internet of Things device management platform for data storage and decision analysis by the upper modules of the system.

[0171] Figure 8 The structure schematic diagram of the electronic device provided by the embodiment of the present application is shown in the figure. Figure 8 As shown in the figure, the electronic device 8 includes at least one processor 81 and a memory 82. The electronic device 8 also includes a communication component 83. Among them, the processor 81, the memory 82 and the communication component 83 are connected through the bus 84.

[0172] In the specific implementation process, the at least one processor 81 executes the computer execution instructions stored in the memory 82, so that the at least one processor 81 executes the test method as executed by the electronic device side above.

[0173] The specific implementation process of the processor 81 can refer to the above method embodiment, which has similar implementation principles and technical effects, and will not be described here in detail.

[0174] In the above embodiments, it should be understood that the processor can be a central processing unit (CPU) and can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), etc. The general-purpose processor can be a microprocessor or can also be any conventional processor. The steps of the method disclosed in combination with the application can be directly embodied as hardware processor execution or combined with hardware and software modules in the processor for execution.

[0175] The memory can include a high-speed RAM memory and can also include a non-volatile storage NVM, such as at least one disk memory.

[0176] The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For the sake of representation, the bus in the drawings of the present application does not limit to only one bus or one type of bus.

[0177] The functions realized by the electronic device and the master device described above are introduced for the scheme provided by the embodiments of the present application. It can be understood that the electronic device or the master device contains the hardware structure and / or software module corresponding to the execution of each function in order to realize the above functions. The units and algorithm steps of each example described in combination with the embodiments disclosed in the embodiments of the present application can be realized in the form of hardware or a combination of hardware and computer software. Whether a certain function is executed by hardware or computer software driven hardware depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the technical solution of the embodiments of the present application.

[0178] The present application also provides a computer readable storage medium, and the computer readable storage medium stores computer execution instructions. When the processor executes the computer execution instructions, the method as described above is realized.

[0179] The computer readable storage medium described above can be implemented by any type of volatile or nonvolatile storage devices or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk or optical disk. The readable storage medium can be any available medium that can be accessed by a general or special purpose computer.

[0180] An exemplary readable storage medium is coupled to the processor, so that the processor can read information from the readable storage medium, and can write information to the readable storage medium. Of course, the readable storage medium can also be an integral part of the processor. The processor and the readable storage medium can be located in an application specific integrated circuit (ASIC). Of course, the processor and the readable storage medium can also exist as discrete components in an electronic device or a host device.

[0181] The present application also provides a computer program product, which comprises a computer program stored in a readable storage medium, and at least one processor of an electronic device can read the computer program from the readable storage medium, and the at least one processor executes the computer program to enable the electronic device to perform the scheme provided in any of the above embodiments.

[0182] Those skilled in the art can understand that all or part of the steps of the above-mentioned method embodiments can be completed by program instruction related hardware. The foregoing program can be stored in a computer readable storage medium. When the program is executed, the steps of the above-mentioned method embodiments are executed; and the foregoing storage medium includes ROM, RAM, magnetic disk or optical disk and various storage media that can store program codes.

[0183] The division of units is only a logical function division, and other division manners can be used in actual implementation, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the units shown or discussed can be indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0184] The units described as separate components can or can not be physically separated, and the components shown as units can or can not be physical units, that is, they can be located in one place, or can be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment scheme.

[0185] In addition, each functional unit in various embodiments of the present application can be integrated in one processing unit, or each unit can exist physically, or two or more units can be integrated in one unit.

[0186] If the function is realized in the form of a software function unit and sold or used as an independent product, it can be stored in a computer readable storage medium. Based on this understanding, the technical solutions of the present application or the part of the present application that essentially contributes to the prior art or the part of the technical solutions can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes a plurality of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the various embodiment methods of the present application. The aforementioned storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), a magnetic disk or an optical disk, and various media that can store program codes.

[0187] It should be noted that for the foregoing method embodiments, in order to simply describe, they are all expressed as a combination of a series of actions, but those skilled in the art should know that the present application is not limited by the order of the actions described, because according to the present application, certain steps can be performed in other order or simultaneously. Secondly, those skilled in the art should know that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily necessary for the present application.

[0188] It should be further noted that although each step in the flowchart is displayed in sequence according to the arrow, these steps are not necessarily executed in sequence according to the arrow. Unless otherwise stated in this article, the execution of these steps has no strict order limit, and these steps can be executed in other order. Moreover, at least part of the steps in the flowchart can include multiple sub-steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution order of these sub-steps or stages is not necessarily sequential, but can be executed with at least part of other steps or other steps or stages of sub-steps or stages, or alternately.

[0189] In the above embodiments, the description of each of the embodiments focuses on different aspects of the embodiments. The parts not described in detail in a certain embodiment can be seen in the relevant description of the other embodiments. The technical features of the above embodiments can be combined in any manner. In order to make the description simple, not all possible combinations of the technical features in the above embodiments are described, however, as long as the combinations of the technical features do not exist contradictory, they should be considered as falling within the scope of the disclosure.

[0190] Other embodiments of the application will be apparent to those skilled in the art from consideration of the specification and practice of the application disclosed herein. It is intended that the specification and examples be considered as exemplary only, with the true scope and spirit of the application being indicated by the following claims.

[0191] It should be understood that the application is not limited to the precise construction that has been described above and shown in the accompanying drawings, and that various modifications and changes can be made by those skilled in the art without departing from the scope of the application. The scope of the application is limited only by the appended claims.

Claims

1. An automated testing system, characterized in that: It includes test management platform, IoT device management platform, data gateway service layer and test execution layer; among them, The test management platform is used to generate a test event containing test execution information based on the cloud computing resource pool, and publish the test event through the Internet of Things device management platform; The data gateway service layer is configured to, after determining that the event to be tested is published, encrypt the event to be tested using a preset data encryption algorithm to obtain an encrypted test event, and send the encrypted test event to the test execution layer using a message queue data transmission form; The test execution layer is configured to execute device testing based on the local area network according to the encrypted test event, collect and obtain test data information, and send the test data information to the Internet of Things device management platform according to an information feedback method matching the test data information; The IoT device management platform is used to receive and store test data information of different events to be tested.

2. The test system according to claim 1, wherein: The test management platform includes a test data display module; The test management platform is also used to: Acquire test data information matching the test execution information from the IoT device management platform, and visualize the test data information through the test data display module; wherein the test data information includes real-time test data and / or result test data.

3. The test system according to claim 1, wherein: The test execution layer includes an instrument host computer and test equipment; The test execution layer is specifically used to: Obtaining the encrypted test event through the instrument host computer, and decrypting the encrypted test event according to a preset decryption algorithm to obtain the test execution information; After determining that the test execution information meets the preset test parameter specifications, the instrument host computer obtains a test script matching the test execution information based on the test execution information; Sending a test execution instruction carrying a test script via the instrument host computer for the test device to perform device testing; The instrument host computer monitors the test device, collects and obtains first test data information, and encrypts the first test data information according to a preset data encryption algorithm; The encrypted first test data information is sent to the data gateway service layer through the instrument host computer in the form of message queue data transmission, so as to send the first test data to the Internet of Things device management platform through the data gateway service layer.

4. The test system according to claim 3, characterized in that: The test execution layer also includes an external monitoring module and a positioning tag module; The test execution layer is further specifically used for: Based on the execution of the device test, second test data of the test device is collected and obtained through the external monitoring module, and the second test data information is sent to the Internet of Things device management platform through a preset wireless communication unit; as well as, Obtaining, through the positioning tag module, third test data of the test device according to the positioning base station, encrypting the third test data information according to a preset data encryption algorithm, and sending the encrypted third test data information to the data gateway service layer in the form of message queue data transmission, so as to achieve sending the third test data to the Internet of Things device management platform through the data gateway service layer; The second test data includes device energy consumption data, and the third test data includes device location information.

5. The test system according to claim 4, characterized in that: The Internet of Things device management platform includes a data storage module; The IoT device management platform is specifically used to: The data storage module receives and stores test data information of different events to be tested; wherein the test data information includes at least one of first test data information, second test data information and third test data information.

6. The test system according to any one of claims 1 to 3, characterized in that: The test management platform includes a test generation module and an information interaction module; The test management platform is specifically used to: The test generation module reads the test requirement information input by the user, obtains the test execution information according to the test requirement information, and generates a to-be-tested event containing the test execution information according to the cloud computing resource pool; Through the information interaction module, according to a preset communication interface protocol, the event to be tested is sent to the Internet of Things device management platform, so that the Internet of Things device management platform can publish the test event.

7. The test system according to any one of claims 1 to 3, characterized in that: The IoT device management platform also includes an event publishing module; The IoT device management platform is further specifically used for: The event to be tested is published to a preset event topic through the event publishing module for monitoring by the data gateway service layer, thereby determining the publication of the event to be tested.

8. The test system according to claim 7, characterized in that: The data gateway service layer includes an event monitoring module, a data encryption module and a message queue module; The data gateway service layer is specifically used to: By means of the event monitoring module, according to a preset event theme, the release of the event to be tested is monitored, and after determining that the event to be tested is released, the event to be tested is obtained; By using the data encryption module, a preset data encryption algorithm is used to encrypt the event to be tested to obtain an encrypted test event; The encrypted test event is sent to the test execution layer through a message queue module in the form of message queue data transmission.

9. The test system according to claim 3, wherein: The test equipment includes at least one of a DC power analyzer, a temperature rise data acquisition device, and a high and low temperature alternating damp heat test chamber; The test execution layer is specifically used to: The instrument host computer communicates with the DC power analyzer using the Telnet protocol to execute the test script through the DC power analyzer and complete the collection of the first test data information through the instrument host computer; and / or, The instrument host computer communicates with the temperature rise data acquisition device using the Web Socket protocol to execute a test script through the temperature rise data acquisition device and complete the collection of the first test data information through the instrument host computer; and / or, The instrument host computer communicates with the high and low temperature alternating humidity and heat test chamber using the UDP protocol to execute the test script through the high and low temperature alternating humidity and heat test chamber, and completes the collection of the first test data information through the instrument host computer.

10. A testing method, characterized in that: The method is applied to the test execution layer and includes: Obtaining an encrypted test event from the data gateway service layer, and decrypting the encrypted test event according to a decryption algorithm corresponding to the encrypted test event to obtain test execution information; After determining that the test execution information meets the preset test parameter specifications, obtaining a test script matching the test execution information based on the test execution information, and executing and monitoring the device test according to the test script; Collecting and obtaining first test data information and / or third test data information of the test device, encrypting the first test data information and / or third test data information according to a preset data encryption algorithm, and sending the encrypted first test data information and / or third test data information to the data gateway service layer using a message queue data transmission form, so as to send the first test data and / or third test data information to the Internet of Things device management platform through the data gateway service layer; and / or, Collect and obtain second test data of the test device, and send the second test data information to the Internet of Things device management platform.

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