Secondary cell beam indication based on primary cell beam
By measuring the beam subset of the auxiliary cell based on the first beam of the main cell in the user equipment (UE) and selecting the second beam to establish a connection, the problem of low beam management of the auxiliary cell is solved, and higher power efficiency is achieved.
CN119856412APending Publication Date: 2025-04-18QUALCOMM INC
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- CN202380064973.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2022-09-21
- Filing Date
- 2023-08-10
- Publication Date
- 2025-04-18
AI Technical Summary
Technical Problem
The existing wireless communication systems have problems with inefficiency in auxiliary cell beam management, especially in high-frequency band operation, and the power consumption and signaling overhead in beam management are relatively large.
Method used
By measuring a subset of beams from the secondary cell using a first beam associated with the primary cell in the user equipment (UE), and selecting a second beam to establish a connection with the secondary cell based on this, the number of beams required for beam management of the secondary cell is reduced.
Benefits of technology
The power consumption and signaling overhead related to auxiliary cell beam management are reduced, and the power efficiency of beam management is improved.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN119856412A_ABST
Abstract
Aspects of the present disclosure generally relate to wireless communications. In some aspects, a user equipment (UE) can communicate one or more signals with a primary cell using a first beam associated with a first spatial direction. The UE can measure a subset of beams from a set of beams associated with the secondary cell, wherein the subset of beams is selected based at least in part on a first beam or a first spatial direction. The UE can establish a connection with the secondary cell using a second beam from the subset of beams based at least in part on the measurement of the subset of beams. Numerous other aspects are described.
Need to check novelty before this filing date? Find Prior Art