Gait evaluation method and system based on three-dimensional simulation and intelligent terminal

Abstract

The invention relates to a gait evaluation method and system based on three-dimensional simulation and an intelligent terminal, and relates to the technical field of gait evaluation, and the method comprises the steps: obtaining image detection information of legs of a patient; according to the image detection information, detection strip examination shape information of a detection strip preset on the legs of the patient is analyzed and determined; establishing a three-dimensional model on the basis of the detection strip inspection shape information to form leg simulation model information; analyzing change conditions among the leg simulation model information at different times to form leg change condition information; inputting the leg change condition information into a preset gait evaluation neural network model to form gait evaluation result information, and outputting the gait evaluation result information to a display terminal. The gait evaluation method has the effect of improving the accuracy of the gait evaluation result.

Description

Technical Field

[0001] The present invention relates to the technical field of gait assessment, and in particular to a gait assessment method, system and intelligent terminal based on three-dimensional simulation. Background Art

[0002] Gait assessment is a method for evaluating a person's gait characteristics and body balance while walking. It evaluates an individual's motor function and health status by analyzing their movement patterns during walking, including muscle contraction, skeletal movement, joint activity, and the coordination and control of the nervous system.

[0003] Currently, when performing gait assessment on patients with leg paralysis, markers are placed on the patient's joints in advance and the motion trajectories of these markers are captured using high-speed cameras or infrared cameras. This allows the position and motion state of each joint of the human body to be accurately recorded. The patient's kinematic characteristics, such as joint angle, velocity, and acceleration, are analyzed based on the motion trajectories of the markers to determine the patient's gait characteristics and conduct a gait assessment.

[0004] Since the current gait assessment involves placing markers on the patient's joints, when the patient's posture has been deformed while walking, the motion trajectory of the joint position is not easy to accurately reflect, resulting in inaccurate gait assessment results. Summary of the Invention

[0005] In order to improve the accuracy of gait assessment results, the present invention provides a gait assessment method, system and intelligent terminal based on three-dimensional simulation.

[0006] In a first aspect, the present invention provides a gait assessment method based on three-dimensional simulation, which adopts the following technical solutions: A gait assessment method based on three-dimensional simulation, comprising: Acquire image detection information of the patient's legs; Determining, based on the image detection information, the inspection shape information of the detection strip preset on the patient's leg; Building a three-dimensional model based on the shape information of the inspection strip to form leg simulation model information; Analyzing changes between leg simulation model information at different times to form leg change information; The leg change information is input into a preset gait assessment neural network model to form gait assessment result information, and the gait assessment result information is output to a display terminal.

[0007] Optionally, the method for determining the shape information of the detection strip includes: Retrieving side reflection information and front reflection information based on the reflection image detection information; Retrieving a side reflection intensity value based on the side reflection information; Determine the side inspection shape information based on the judgment result of the side reflection intensity value and the preset reflection reference intensity value; Analyze the front reflection information to determine the front inspection shape information; The side inspection shape information is combined with the front inspection shape information to form inspection comprehensive shape information, and the inspection comprehensive shape information is used as the detection bar inspection shape information.

[0008] Optionally, the method for determining the side inspection shape information includes: Retrieving side reflection shape information based on the side reflection information; Determining the side inspection initial shape information corresponding to the side reflection shape information according to the correspondence between the side reflection shape information and the preset side inspection initial shape; Determine whether the side reflection intensity values ​​are all greater than a preset reflection reference intensity value; If yes, the side inspection initial shape information is used as the side inspection shape information; If not, then based on the side reflection information, retrieve the position point corresponding to the side reflection intensity value not greater than the preset reflection reference intensity value and use it as the reflection abnormality position point; Analyze the reflection abnormality location and initial shape information from the side to determine the influence of the reflection abnormality shape; The side inspection shape adjustment information is determined based on the combination of the side inspection initial shape information and the reflection abnormality shape influence information, and the side inspection shape adjustment information is used as the side inspection shape information.

[0009] Optionally, a method for determining information on the influence of an abnormal reflection shape includes: Determining the initial shape area information corresponding to the side inspection initial shape information according to the correspondence between the side inspection initial shape information and the preset initial shape area information; Retrieving the initial shape area contour position points based on the initial shape area information; Analyze the reflection anomaly position points and the initial shape area contour position points to determine the anomaly relative contour position information; According to the correspondence between the abnormal relative contour position information and the preset relative position influence information, the relative position influence information corresponding to the abnormal relative contour position information is determined, and the relative position influence information is used as the reflection abnormal shape influence information.

[0010] Optionally, the method for determining abnormal relative contour position information includes: If and only if the number of the reflection abnormality position points is less than the preset abnormality position reference number, the initial shape area contour position point with the closest position distance is selected based on the reflection abnormality position points and is used as the abnormal closest contour position point; Calculate the distance between the reflection anomaly point and the nearest anomaly contour point and use it as the anomaly contour distance value; Analyze the reflection anomaly position points and the initial shape area contour position points to determine the relative direction information of the anomaly contour; Calculate the angle between the relative direction information of each abnormal contour and use it as the relative direction angle value; Determine whether the relative direction angle values ​​are all within the preset same-direction reference angle range; If yes, then combining the abnormal contour distance value with the preset relative reference position information outside the contour to form abnormal relative contour position information; If not, analysis is performed based on the abnormal contour distance value to determine the relative position information within the contour, and the relative position information within the contour is used as the abnormal relative contour position situation information.

[0011] Optionally, the method for determining the relative position information within the contour includes: Based on the relative direction angle value, the initial shape area contour position point corresponding to the initial shape area contour position point that is not within the preset same-direction reference angle interval is selected as the angle contour position point; Analyze the angle contour position points and the reflection anomaly position points to determine the abnormal contour distance reference value; Determine whether the abnormal contour distance value is greater than the abnormal contour distance reference value; If yes, the preset reference position information within the contour is output as the relative position information within the contour; If not, then the relative position information within the contour is formed by combining the abnormal contour distance value with the preset relative reference position information within the contour.

[0012] Optionally, a method for determining the distance between the abnormal contour and the reference value includes: Analyze the angle profile position points to determine the length reference direction information; Determining width reference direction information corresponding to the length reference direction information according to a correspondence between the length reference direction information and preset width reference direction information; Based on the reflection abnormality position point, the initial shape area contour position point on the width reference direction information is selected as the width contour position point; Calculate the distance between the width contour position points and use it as the width distance value; According to the corresponding relationship between the width distance value and the preset abnormal contour distance reference value, the abnormal contour distance reference value corresponding to the width distance value is determined.

[0013] Optionally, the method for determining the frontal inspection shape information includes: Retrieve the front reflection position point based on the front reflection information; Perform curve analysis based on the front reflection position points to form a front reflection curve; According to the correspondence between the front reflection curve and the preset front inspection initial shape information, the front inspection initial shape information corresponding to the front reflection curve is determined; Obtain pressure detection information on the test strip; Determine pressure deviation impact information based on the deviation between the pressure detection information and the preset pressure detection reference information; The front inspection shape adjustment information is formed based on the combination of the front inspection initial shape information and the pressure deviation influence information, and the front inspection shape adjustment information is used as the front inspection shape information.

[0014] In a second aspect, the present invention provides a gait assessment system based on three-dimensional simulation, which adopts the following technical solutions: A gait assessment system based on three-dimensional simulation, comprising: An acquisition module is used to acquire image detection information and pressure detection information; A memory for storing a program of the gait assessment method based on three-dimensional simulation as described in the first aspect; The processor loads and executes the program in the memory and implements the gait assessment method based on three-dimensional simulation as described in the first aspect.

[0015] In a third aspect, the present invention provides an intelligent terminal, which adopts the following technical solution: An intelligent terminal includes a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and execute the gait assessment method based on three-dimensional simulation as described in the first aspect.

[0016] In summary, the present invention includes at least one of the following beneficial technical effects: 1. By acquiring and analyzing image detection information to determine the shape information of the detection strip inspection, a three-dimensional model is then established based on the detection strip inspection shape information to form leg simulation model information, and leg change information is analyzed to form leg change information. The leg change information is input into a preset gait assessment neural network model to form gait assessment result information and output to a display terminal. Thus, the gait is evaluated by the transformation of the entire leg, thereby improving the accuracy of the gait assessment result; 2. Retrieving side and frontal reflection information from the reflected image detection information, and retrieving the side reflection intensity value from the side reflection information. The side reflection intensity value is then compared with a preset reference reflection intensity value to determine the side inspection shape information. The frontal inspection shape information is then determined from the frontal reflection information. The side inspection shape information and the frontal inspection shape information are then combined to form comprehensive inspection shape information. The comprehensive inspection shape information is then used as the inspection shape information for the inspection strip, thereby improving the accuracy of the obtained inspection shape information for the inspection strip. 3. Retrieve the side reflection shape information through the side reflection information, determine the initial shape information of the side inspection through the side reflection shape information query, and judge whether the side reflection intensity values ​​are all greater than the preset reflection reference intensity value. When it is greater than, use the initial shape information of the side inspection as the side inspection shape information. When it is not greater than, retrieve the reflection abnormality position point through the side reflection information, and determine the reflection abnormality shape impact information through analysis of the reflection abnormality position point and the initial shape information of the side inspection. Then combine the initial shape information of the side inspection with the reflection abnormality shape impact information to determine the side inspection shape adjustment information, and use the side inspection shape adjustment information as the side inspection shape information, thereby improving the accuracy of the acquired side inspection shape information. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 is a flow chart of a method for gait assessment based on three-dimensional simulation according to an embodiment of the present application; Figure 2 This is a flow chart of a method for determining shape information of a test strip inspection according to an embodiment of the present application; Figure 3 is a flow chart of a method for determining side inspection shape information according to an embodiment of the present application; Figure 4 This is a flow chart of a method for determining information affecting reflection abnormality shape according to an embodiment of the present application; Figure 5 This is a flow chart of a method for determining abnormal relative contour position information according to an embodiment of the present application; Figure 6 is a flow chart of a method for determining relative position information within a contour according to an embodiment of the present application; Figure 7 This is a flow chart of a method for determining the distance between an abnormal contour and a reference value according to an embodiment of the present application; Figure 8 This is a flow chart of a method for determining frontal inspection shape information according to an embodiment of the present application. DETAILED DESCRIPTION

[0018] The present invention is further described in detail below with reference to the accompanying drawings and embodiments.

[0019] A gait assessment method based on three-dimensional simulation obtains image detection information and pressure detection information, thereby analyzing and determining the shape information of the detection strip inspection and establishing a three-dimensional model to form leg simulation model information, thereby analyzing and forming leg change information and inputting it into a preset gait assessment neural network model to form gait assessment result information and output it to a display terminal, thereby evaluating the gait by the transformation of the entire leg, thereby improving the accuracy of the gait assessment result.

[0020] The embodiment of the present invention discloses a gait assessment method based on three-dimensional simulation. Figure 1 , a gait assessment method based on three-dimensional simulation includes: Reference Figure 1 , a gait assessment method based on three-dimensional simulation includes: Step S100: Acquire image detection information of the patient's legs.

[0021] The image detection information refers to image information captured and detected from the patient's legs. This image detection information is acquired by a camera positioned at a capture location while the patient is in the required standing position for the test. The capture location is located near the required standing position, facilitating image capture and detection of the patient's legs.

[0022] Step S200: determining the shape information of the detection strip preset on the patient's leg according to the image detection information analysis.

[0023] The shape information of the detection strip refers to the shape information of the detection strip when the patient is walking. The detection strip is pre-set on the patient's leg via an elastic band and can change its shape under force to measure changes in the patient's leg as the patient walks. The detection strip is set on the thigh and calf of the patient's leg, and four detection strips are set on each thigh and calf and distributed around the perimeter. The detection strips are available in a variety of lengths, making it easy to select a detection strip that is suitable for the length of the patient's thigh and calf. The detection strip can be self-luminous, or it can be made of a reflective material and reflect light through an illuminating device pre-set around the patient's required standing position for testing, thereby facilitating testing of the detection strip. In this embodiment, the detection strip is made of a reflective material and reflects light through an illuminating device pre-set around the patient's required standing position for testing.

[0024] By using preset inspection strip features to identify image detection information, the inspection strip shape information is determined, facilitating subsequent use. Inspection strip features refer to the appearance and parameter characteristics corresponding to inspection strips of different specifications and sizes. Inspection strip features are obtained through operator pre-entry.

[0025] Step S200: Building a three-dimensional model based on the shape information of the inspection strip to form leg simulation model information.

[0026] The leg simulation model information refers to the model information after three-dimensional model simulation of the patient's legs, and the leg simulation model information is obtained by inputting the shape information of the detection strip inspection into the three-dimensional model simulation software.

[0027] Step S400: analyzing the changes between the leg simulation model information at different times to form leg change information.

[0028] Among them, the leg change information refers to the change information corresponding to the changes in the patient's legs when walking. The leg change information is formed by analyzing the changes between the leg simulation model information at different times, which is convenient for subsequent use.

[0029] Step S500: Inputting the leg change information into a preset gait assessment neural network model to form gait assessment result information, and outputting the gait assessment result information to a display terminal.

[0030] The gait assessment result information refers to the result information of the patient's gait when walking, and the gait assessment neural network model refers to the neural network model used to analyze leg change information to form the gait assessment result. The gait assessment neural network model is obtained by the operator inputting a large amount of leg change information in advance and then training the neural network. By inputting the leg change information into the preset gait assessment neural network model to form the gait assessment result information, and outputting the gait assessment result information to the display terminal, the gait is evaluated by the transformation of the entire leg, thereby improving the accuracy of the gait assessment result.

[0031] Furthermore, in order to facilitate rehabilitation training for patients, the following steps are further included after step S500.

[0032] Step S600: determining gait adjustment prompt information corresponding to the gait evaluation result information according to the correspondence between the gait evaluation result information and the preset gait adjustment prompt information, and outputting the gait adjustment prompt information to the display terminal.

[0033] The gait adjustment prompt information refers to prompt information used to prompt the patient to adjust their gait. The gait adjustment prompt information is obtained by querying a database that stores the correspondence between gait assessment results and gait adjustment prompt information. The database is obtained after the operator pre-enters the database. The gait adjustment prompt information is determined by querying the gait assessment results information and output to the display terminal, thereby prompting the patient to adjust their gait in a timely manner, thereby facilitating the patient's rehabilitation training.

[0034] exist Figure 1 In step S200, in order to further ensure the rationality of the shape information of the detection strip, it is necessary to further analyze and calculate the shape information of the detection strip. Figure 2 The steps shown are explained in detail.

[0035] Reference Figure 2 , the method for determining the shape information of the detection strip includes the following steps: Step S210: Retrieve side reflection information and front reflection information based on the reflection image detection information.

[0036] Among them, the side reflection information refers to the reflection information corresponding to the test strips located on both sides of the patient, and the front reflection information refers to the reflection information of the test strips on the front of the patient. The side reflection information and the front reflection information are retrieved through the reflected image detection information to facilitate subsequent use.

[0037] Step S220: Retrieve the side reflection intensity value based on the side reflection information.

[0038] Among them, the side reflection intensity value refers to the intensity value of the brightness of the light reflected by the detection strips on both sides of the patient. The side reflection intensity value is retrieved through the side reflection information to facilitate subsequent use.

[0039] Step S230 : determining the side inspection shape information according to the judgment result of the side reflection intensity value and the preset reflection reference intensity value.

[0040] The "reflection reference intensity value" refers to the minimum intensity value corresponding to the brightness of the test strips on both sides of the patient when reflecting light normally. This reflection reference intensity value is pre-entered by the operator and obtained. The "lateral inspection shape information" refers to the shape information corresponding to the test strips on both sides of the patient. This information is determined by analyzing the lateral reflection intensity value against the preset reflection reference intensity value to facilitate subsequent use.

[0041] Step S240: Analyze the front reflection information to determine the front inspection shape information.

[0042] Among them, the front inspection shape information refers to the shape information corresponding to the test strip on the front of the patient. By analyzing the front reflection information, the front inspection shape information is determined to facilitate subsequent use.

[0043] Step S250: Combining the side inspection shape information with the front inspection shape information to form comprehensive inspection shape information, and using the comprehensive inspection shape information as the detection bar inspection shape information.

[0044] Among them, the comprehensive inspection shape information refers to the comprehensive shape information of the leg inspection strip when the patient walks. The side inspection shape information is combined with the front inspection shape information to form the comprehensive inspection shape information, and the comprehensive inspection shape information is used as the inspection shape information of the inspection strip, thereby improving the accuracy of the obtained inspection shape information of the inspection strip.

[0045] exist Figure 2 In step S230, in order to further ensure the rationality of the side inspection shape information, it is necessary to further analyze and calculate the side inspection shape information. Figure 3 The steps shown are explained in detail.

[0046] Reference Figure 3 , the method for determining the side inspection shape information includes the following steps: Step S231: Retrieve side reflection shape information based on the side reflection information.

[0047] The side reflection shape information refers to the shape information of the area covered by the detection strips on both sides of the patient after reflecting the light. The side reflection shape information is retrieved through the side reflection information to facilitate subsequent use.

[0048] Step S232: determining the side inspection initial shape information corresponding to the side reflection shape information according to the correspondence between the side reflection shape information and the preset side inspection initial shape.

[0049] The initial shape information for the lateral examination refers to the initial shape information corresponding to the lateral reflection shapes of the test strips on both sides of the patient. This initial shape information is obtained by querying a database that stores the correspondence between lateral reflection shape information and initial shape information for lateral examination. This database is pre-entered by the operator and then retrieved. Determining the initial shape information for lateral examination through querying the lateral reflection shape information facilitates subsequent use.

[0050] Step S233: Determine whether the side reflection intensity values ​​are all greater than a preset reflection reference intensity value. If yes, proceed to step S234. If no, proceed to step S235.

[0051] Here, it is determined whether the side reflection intensity values ​​are all greater than a preset reflection reference intensity value, thereby determining whether there is a position with abnormal reflection on the detection strip.

[0052] Step S234: Using the side inspection initial shape information as the side inspection shape information.

[0053] Among them, when the side reflection intensity values ​​are all greater than the preset reflection reference intensity values, it means that there is no position with abnormal reflection on the detection strip at this time, so the side inspection initial shape information is used as the side inspection shape information, thereby improving the accuracy of the obtained side inspection shape information.

[0054] Step S235: Based on the side reflection information, retrieve a position point corresponding to a side reflection intensity value that is not greater than a preset reflection reference intensity value and use it as a reflection abnormality position point.

[0055] The "abnormal reflection location" refers to the location on the test strip where a reflection anomaly exists. If the side reflection intensity values ​​are not all greater than the preset reference reflection intensity value, this indicates a reflection anomaly exists on the test strip. Therefore, the location corresponding to the side reflection intensity value not exceeding the preset reference reflection intensity value is retrieved from the side reflection information and used as the abnormal reflection location for subsequent use.

[0056] Step S236: Analyze the reflection abnormality location point and the initial shape information of the side inspection to determine the reflection abnormality shape impact information.

[0057] Among them, the reflection abnormality shape impact information refers to the impact information of the reflection abnormality position on the test strip on the shape of the test strip. The reflection abnormality shape impact information is determined by analyzing the initial shape information of the reflection abnormality position point and the side inspection, which is convenient for subsequent use.

[0058] Step S237: Determine side inspection shape adjustment information based on the side inspection initial shape information and the reflection abnormality shape influence information, and use the side inspection shape adjustment information as the side inspection shape information.

[0059] Among them, the lateral examination shape adjustment information refers to the adjustment information for adjusting the shape of the detection strips on both sides of the patient. The lateral examination shape adjustment information is determined by combining the lateral examination initial shape information with the reflection abnormality shape influence information, and the lateral examination shape adjustment information is used as the lateral examination shape information, thereby improving the accuracy of the obtained lateral examination shape information.

[0060] exist Figure 3 In step S236, in order to further ensure the rationality of the reflection abnormal shape influence information, it is necessary to further analyze and calculate the reflection abnormal shape influence information separately, specifically by Figure 4 The steps shown are explained in detail.

[0061] Reference Figure 4 , the method for determining the influence information of the reflection abnormal shape includes the following steps: Step S2361: determining the initial shape region information corresponding to the side inspection initial shape information according to the correspondence between the side inspection initial shape information and the preset initial shape region information.

[0062] The initial shape area information refers to the area information corresponding to the initial shape of the test strip. The initial shape area information is obtained by querying a database that stores the correspondence between the initial shape information of the side inspection and the initial shape area information. The database is obtained after the operator pre-enters the information. The initial shape area information is determined by querying the initial shape information of the side inspection to facilitate subsequent use.

[0063] Step S2362: Retrieve the initial shape area contour position points based on the initial shape area information.

[0064] The initial shape area contour position points refer to the contour position points of the area corresponding to the initial shape of the detection bar. The initial shape area contour position points are retrieved through the initial shape area information to facilitate subsequent use.

[0065] Step S2363: Analyze the reflection anomaly position point and the initial shape area contour position point to determine the anomaly relative contour position information.

[0066] Among them, the abnormal relative contour position information refers to the information used to indicate the relative position between the abnormal position of the detection strip and the contour of the detection strip. By analyzing the reflected abnormal position point and the initial shape area contour position point, the abnormal relative contour position information is determined to facilitate subsequent use.

[0067] Step S2364: Determine the relative position influence information corresponding to the abnormal relative contour position information based on the correspondence between the abnormal relative contour position information and the preset relative position influence information, and use the relative position influence information as the reflection abnormal shape influence information.

[0068] Relative position influence information refers to the influence of the relative position between the abnormal position of the detection strip and the detection strip's contour on the shape of the detection strip. This relative position influence information is obtained by querying a database that stores correspondences between abnormal relative contour position information and relative position influence information. This database is pre-entered and retrieved by the operator. The relative position influence information is determined by querying the abnormal relative contour position information and used as the reflection abnormal shape influence information, thereby improving the accuracy of the obtained reflection abnormal shape influence information.

[0069] exist Figure 4In step S2363, in order to further ensure the rationality of the abnormal relative contour position information, it is necessary to further analyze and calculate the abnormal relative contour position information. Figure 5 The steps shown are explained in detail.

[0070] Reference Figure 5 , the method for determining abnormal relative contour position information includes the following steps: Step S23631: When and only when the number of corresponding reflection abnormality position points is less than the preset abnormality position reference value, the initial shape area contour position point with the closest position is selected based on the reflection abnormality position point and used as the abnormal closest contour position point.

[0071] The abnormal position reference value refers to the maximum reference value that can be tolerated when an abnormality exists on the test strip. The abnormal position reference value is obtained by pre-entering the operator. When the number of reflected abnormal position points is not less than the preset abnormal position reference value, it indicates that there are multiple abnormalities on the test strip, and there may be situations such as damage to the test strip or incorrect installation of the test strip. At this time, the preset test strip abnormality warning information is output for warning. The test strip abnormality warning information refers to the warning information used to warn of abnormalities on the test strip. The test strip abnormality warning information is obtained by pre-entering the operator. If and only if the number of reflected abnormal position points is less than the preset abnormal position reference value, it indicates that the test strip is normal. The initial shape area contour position point with the closest position distance is selected by reflecting the abnormal position point and used as the abnormal closest contour position point for convenience in subsequent use.

[0072] Step S23632: Calculate the distance between the reflection anomaly position point and the abnormal nearest contour position point and use it as the abnormal contour distance value.

[0073] The abnormal contour distance value refers to the distance between the abnormal position and the nearest contour, which is calculated by taking the distance between the reflection abnormal position point and the abnormal nearest contour position point and using it as the abnormal contour distance value.

[0074] Step S23633: Analyze the reflection anomaly position points and the initial shape area contour position points to determine the relative direction information of the anomaly contour.

[0075] Among them, the relative direction information of the abnormal contour refers to the relative direction information of the abnormal position on the detection strip at the contour point of the detection strip shape. By analyzing the reflected abnormal position point and the initial shape area contour position point, the relative direction information of the abnormal contour is determined based on the angle value between the corresponding straight line between the reflected abnormal position point and the initial shape area contour position point and the preset reference straight line, which is convenient for subsequent use.

[0076] Step S23634: Calculate the angle value between the relative direction information of each abnormal contour and use it as the relative direction angle value.

[0077] Among them, the relative direction angle value refers to the angle value between the abnormal position on the detection strip and the direction formed by each position point on the shape contour of the detection strip. By calculating the angle value between the relative direction information of each abnormal contour and using it as the relative direction angle value, it is convenient for subsequent use.

[0078] Step S23635: Determine whether the relative direction angle values ​​are all within the preset same-direction reference angle range. If yes, execute step S23636; if not, execute step S23637.

[0079] The same-direction reference angle interval is the reference angle interval that indicates that the direction formed by the abnormal position on the test strip and each position point on the test strip's outline is the same. The same-direction reference angle interval is retrieved from a database storing same-direction reference angle intervals. By determining whether the relative direction angle values ​​are all within the preset same-direction reference angle interval, it is determined whether the abnormal position on the test strip is within the test strip's outline.

[0080] Step S23636: combining the abnormal contour distance value with the preset outside contour relative reference position information to form abnormal relative contour position information.

[0081] The "out-of-contour relative reference position information" refers to reference position information indicating that the abnormal position on the test strip is outside the test strip's contour. This information is pre-entered by the operator and acquired. When the relative direction angle values ​​are all within the preset same-direction reference angle range, it indicates that the abnormal position on the test strip is outside the test strip's contour. Therefore, the abnormal contour distance value is combined with the preset "out-of-contour relative reference position information" to generate the abnormal relative contour position information, thereby improving the accuracy of the acquired abnormal relative contour position information.

[0082] Step S23637: Analyze the abnormal contour distance value to determine the relative position information within the contour, and use the relative position information within the contour as the abnormal relative contour position situation information.

[0083] Among them, the relative position information within the contour refers to the position information when the abnormal position on the detection strip is located inside the contour of the detection strip shape. When the relative direction angle values ​​are not all within the preset unidirectional reference angle range, it means that the abnormal position on the detection strip is located inside the contour of the detection strip shape. Therefore, the relative position information within the contour is determined by analyzing the abnormal contour distance value, and the relative position information within the contour is used as the abnormal relative contour position information, thereby improving the accuracy of the acquired abnormal relative contour position information.

[0084] exist Figure 5 In step S23637, in order to further ensure the rationality of the relative position information within the contour, it is necessary to further analyze and calculate the relative position information within the contour. Figure 6 The steps shown are explained in detail.

[0085] Reference Figure 6 , the method for determining the relative position information within the contour includes the following steps: Step S236371: Based on the relative direction angle value, select the initial shape area contour position point that is not located in the preset same-direction reference angle interval and use it as the angle contour position point.

[0086] Step S236372: Analyze the angle contour position points and the reflection anomaly position points to determine the distance between the abnormal contour and the reference value.

[0087] Among them, the abnormal contour distance reference value refers to the minimum reference distance value corresponding to the distance between the abnormal position and the contour position having no impact. By analyzing the angle contour position points and the reflection abnormality position points, the abnormal contour distance reference value is determined to facilitate subsequent use.

[0088] Step S236373: Determine whether the abnormal contour distance value is greater than the abnormal contour distance reference value. If yes, execute step S236374; if no, execute step S236375.

[0089] Here, by judging whether the abnormal contour distance value is greater than the abnormal contour distance reference value, it is judged whether the distance between the abnormal position and the contour position will affect the subsequent shape.

[0090] Step S236374: Output the preset reference position information within the contour and use it as the relative position information within the contour.

[0091] The in-contour reference position information refers to the reference position information within the contour that has no impact. This in-contour reference position information is retrieved from a database that stores this information. When the abnormal contour distance value is greater than the abnormal contour distance reference value, it indicates that the distance between the abnormal position and the contour position will not affect the subsequent shape. Therefore, the preset in-contour reference position information is output as the in-contour relative position information, thereby improving the accuracy of the acquired in-contour relative position information.

[0092] Step S236375: combining the abnormal contour distance value with the preset relative reference position information within the contour to form relative position information within the contour.

[0093] The relative position information within the contour refers to the relative position information of the anomaly within the contour. This information is pre-entered by the operator and obtained. When the abnormal contour distance value is not greater than the abnormal contour distance reference value, it indicates that the distance between the abnormal position and the contour position will affect the subsequent shape. Therefore, the abnormal contour distance value is combined with the preset relative position information within the contour to form the relative position information within the contour, thereby improving the accuracy of the obtained relative position information within the contour.

[0094] exist Figure 6 In step S236372 shown in FIG, in order to further ensure the rationality of the abnormal contour distance from the reference value, it is necessary to further analyze and calculate the abnormal contour distance from the reference value, specifically by Figure 7 The steps shown are explained in detail.

[0095] Reference Figure 7 , the method for determining the distance between the abnormal contour and the reference value includes the following steps: Step S2363721: Analyze the angle contour position points to determine the length reference direction information.

[0096] Among them, the length reference direction information refers to the reference direction information of the length of the detection bar. The relative direction angle values ​​that are not within the preset same-direction reference angle range are sorted from large to small, and the distance vector of the initial shape area contour position point corresponding to the first-ranked relative direction angle value is calculated to determine the length reference direction information for subsequent use.

[0097] Step S2363722: Determine the width reference direction information corresponding to the length reference direction information according to the correspondence between the length reference direction information and the preset width reference direction information.

[0098] The width reference direction information refers to the reference direction information of the detection strip width. The width reference direction information is obtained by querying a database that stores the correspondence between length reference direction information and width reference direction information. This database is pre-entered by the operator and then retrieved. The width reference direction information is determined by querying the length reference direction information to facilitate subsequent use.

[0099] Step S2363723: Based on the reflection abnormality position point, the initial shape area contour position point on the width reference direction information is selected as the width contour position point.

[0100] Among them, the width contour position point refers to the position point where the reflection anomaly position point intersects with the contour in the width direction. By using the reflection anomaly position point, the initial shape area contour position point on the width reference direction information is selected and used as the width contour position point, which is convenient for subsequent use.

[0101] Step S2363724: Calculate the distance between the width contour position points and use it as the width distance value.

[0102] The width distance value refers to the distance between two width profile position points of the reflection anomaly position point in the width direction. The distance between the width profile position points is calculated and used as the width distance value for convenience in subsequent use.

[0103] Step S2363725: Determine the abnormal contour distance reference value corresponding to the width distance value according to the corresponding relationship between the width distance value and the preset abnormal contour distance reference value.

[0104] The abnormal contour distance reference value refers to the reference distance value that can be tolerated between the abnormal position and the contour based on the width of the detection strip. The abnormal contour distance reference value is obtained by querying a database that stores the correspondence between width distance values ​​and abnormal contour distance reference values. This database is pre-entered by the operator and then retrieved. Determining the abnormal contour distance reference value through the width distance value query facilitates subsequent use.

[0105] exist Figure 2 In step S240, in order to further ensure the rationality of the front inspection shape information, it is necessary to further analyze and calculate the front inspection shape information separately, specifically by Figure 8 The steps shown are explained in detail.

[0106] Reference Figure 8 , the method for determining the front inspection shape information includes the following steps: Step S241: Retrieve the front reflection position point based on the front reflection information.

[0107] The front reflection position point refers to the position point corresponding to when the detection strip on the front of the patient reflects light, and the front reflection position point is obtained by querying from a database storing the front reflection position points.

[0108] Step S242: Performing a curve analysis based on the front reflection position points to form a front reflection curve.

[0109] Among them, the front reflection curve refers to the curve formed by the reflection position of the test strip on the front of the patient. By performing a curve analysis on the front reflection position points, a front reflection curve is formed to facilitate subsequent use.

[0110] Step S243: determining the front inspection initial shape information corresponding to the front reflection curve according to the correspondence between the front reflection curve and the preset front inspection initial shape information.

[0111] The frontal examination initial shape information refers to the initial shape of the test strip on the patient's front face. This information is retrieved from a database that stores correspondences between frontal reflection curves and frontal examination initial shape information. This database is retrieved after pre-entry by the operator. Determining the frontal examination initial shape information through the frontal reflection curve query facilitates subsequent use.

[0112] Step S244: Obtain pressure detection information on the detection strip.

[0113] The pressure detection information refers to the pressure information detected on the side of the detection strip close to the patient, and the pressure detection information is obtained by detection through a pressure detection device preset on the detection strip.

[0114] Step S245: Determine pressure deviation impact information based on the deviation between the pressure detection information and the preset pressure detection reference information.

[0115] The pressure detection reference information refers to the reference detection information of the pressure when the detection strip is normally in contact with the patient. The pressure detection reference information is retrieved from a database storing the pressure detection reference information. By analyzing the deviation between the pressure detection information and the preset pressure detection reference information, and using the deviation between the pressure detection information and the preset pressure detection reference information as the pressure detection deviation information, the pressure deviation impact information corresponding to the pressure detection deviation information is determined based on the correspondence between the pressure detection deviation information and the preset pressure deviation impact information, thereby facilitating subsequent use. The pressure deviation impact information is retrieved from a database storing the correspondence between the pressure detection deviation information and the pressure deviation impact information, and the database is retrieved after being pre-entered by the operator.

[0116] Step S246 : combining the front inspection initial shape information and the pressure deviation influence information to form front inspection shape adjustment information, and using the front inspection shape adjustment information as the front inspection shape information.

[0117] Among them, the front inspection shape adjustment information refers to the adjustment information after adjusting the shape of the test strip on the front of the patient. The front inspection shape adjustment information is formed by combining the front inspection initial shape information with the pressure deviation influence information, and the front inspection shape adjustment information is used as the front inspection shape information, thereby improving the accuracy of the obtained front inspection shape information.

[0118] exist Figure 8 In step S246 shown, in order to further ensure the rationality of the front inspection shape information, it is necessary to perform further separate analysis and calculation on the front inspection shape adjustment information as the front inspection shape information, which is specifically explained in detail through the following steps.

[0119] The steps after using the front surface inspection shape adjustment information as the front surface inspection shape information include the following steps: Step S2461: When the side reflection intensity values ​​are not all greater than the preset reflection reference intensity values, the abnormal relative contour position reference influence value corresponding to the abnormal relative contour position situation information is determined based on the correspondence between the abnormal relative contour position situation information and the preset abnormal relative contour position reference influence value.

[0120] The abnormal relative profile position baseline impact value refers to the baseline impact value when the relative position between the abnormal position and the profile position affects each other. The abnormal relative profile position baseline impact value is obtained by querying from a database that stores the correspondence between abnormal relative profile position information and abnormal relative profile position baseline impact values. This database is obtained after pre-entry by the operator. When the side reflection intensity values ​​are not all greater than the preset reflection baseline intensity value, it indicates that an abnormal position exists. The abnormal relative profile position baseline impact value is determined by querying the abnormal relative profile position information for subsequent use.

[0121] Step S2462: Calculate the difference between the side reflection intensity value and the reflection reference intensity value and use it as the side reflection intensity deviation value.

[0122] Among them, the side reflection intensity deviation value refers to the deviation value when the side reflection intensity value has a deviation. The difference between the side reflection intensity value and the reflection reference intensity value is calculated and used as the side reflection intensity deviation value for convenience of subsequent use.

[0123] Step S2463: Calculate the product of the side reflection intensity deviation value and the abnormal relative contour position reference influence value and use it as the side reflection intensity influence value.

[0124] Among them, the side reflection intensity impact value refers to the impact degree value when the side reflection intensity deviation value has an impact. The product value between the side reflection intensity deviation value and the abnormal relative contour position benchmark impact value is calculated and used as the side reflection intensity impact value for subsequent use.

[0125] Step S2464: Determine the reflection intensity shape influence information corresponding to the side reflection intensity influence value based on the correspondence between the side reflection intensity influence value and the preset reflection intensity shape influence information, and add the reflection intensity shape influence information to the front inspection shape information to form new front inspection shape information.

[0126] Reflection intensity shape impact information refers to the influence of the intensity of reflected light on the shape. This information is retrieved from a database that stores correspondences between side reflection intensity impact values ​​and reflection intensity shape impact information. This database is retrieved after pre-entering by the operator. The reflection intensity shape impact information is determined by querying the side reflection intensity impact values ​​and then added to the frontal inspection shape information to form new frontal inspection shape information, thereby improving the accuracy of the acquired frontal inspection shape information.

[0127] Based on the same inventive concept, an embodiment of the present invention provides a gait assessment system based on three-dimensional simulation, comprising: An acquisition module is used to obtain image detection information and pressure detection information; Memory, used to store Figures 1 to 8 A procedure for any one of the three-dimensional simulation-based gait assessment methods; The processor loads the program in the execution memory and implements the following Figures 1 to 8 Any one of the three-dimensional simulation-based gait assessment methods described.

[0128] Based on the same inventive concept, an embodiment of the present invention provides an intelligent terminal, including a memory and a processor, wherein the memory stores data that can be loaded and executed by the processor. Figures 1 to 8 A computer program for any one of the three-dimensional simulation-based gait assessment methods.

[0129] Those skilled in the art will clearly understand that for the sake of convenience and brevity, the division of the above-mentioned functional modules is only used as an example for illustration. In actual applications, the above-mentioned functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. The specific working processes of the above-mentioned systems, devices, and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0130] The above description is merely a preferred embodiment of the present invention. The scope of protection of the present invention is not limited to the above embodiment. All technical solutions based on the concept of the present invention are within the scope of protection of the present invention. It should be noted that for those skilled in the art, various improvements and modifications that do not depart from the principles of the present invention should also be considered within the scope of protection of the present invention.

Claims

1. A gait assessment method based on three-dimensional simulation, characterized in that: include: Acquire image detection information of the patient's legs; Determine the inspection shape information of the inspection strip preset on the patient's leg according to the image inspection information analysis; A three-dimensional model is established based on the shape information of the detection strip inspection to form leg simulation model information; Analyze the changes between the leg simulation model information at different times to form leg change information; The information based on the leg changes is input into a preset gait assessment neural network model to form gait assessment result information, and the gait assessment result information is output to a display terminal.

2. The gait assessment method based on three-dimensional simulation according to claim 1, characterized in that: The method for determining the shape information of the test strip includes: Retrieving side reflection information and front reflection information based on the reflection image detection information; Retrieving the side reflection intensity value based on the side reflection information; Determine the side inspection shape information according to the judgment result of the side reflection intensity value and the preset reflection reference intensity value; Analyze the front reflection information to determine the front inspection shape information; The side inspection shape information is combined with the front inspection shape information to form inspection comprehensive shape information, and the inspection comprehensive shape information is used as the detection bar inspection shape information.

3. The gait assessment method based on three-dimensional simulation according to claim 2, characterized in that: Methods for determining side inspection shape information include: Retrieving side reflection shape information based on the side reflection information; According to the correspondence between the side reflection shape information and the preset side inspection initial shape, the side inspection initial shape information corresponding to the side reflection shape information is determined; Determine whether the side reflection intensity values ​​are all greater than a preset reflection reference intensity value; If yes, the side inspection initial shape information is used as the side inspection shape information; If not, then based on the side reflection information, retrieve the position point corresponding to the side reflection intensity value not greater than the preset reflection reference intensity value and use it as the reflection abnormality position point; Analyze the reflection abnormality location point and the initial shape information of the lateral inspection to determine the reflection abnormality shape influence information; The side inspection shape adjustment information is determined based on the combination of the side inspection initial shape information and the reflection abnormality shape influence information, and the side inspection shape adjustment information is used as the side inspection shape information.

4. The gait assessment method based on three-dimensional simulation according to claim 3, characterized in that: Methods for determining information on the influence of reflection abnormal shape include: According to the correspondence between the initial shape information of the side inspection and the preset initial shape area information, the initial shape area information corresponding to the initial shape information of the side inspection is determined; Retrieving the initial shape area contour position points based on the initial shape area information; Analyze the reflection anomaly position points and the initial shape area contour position points to determine the anomaly relative contour position information; According to the correspondence between the abnormal relative contour position information and the preset relative position influence information, the relative position influence information corresponding to the abnormal relative contour position information is determined, and the relative position influence information is used as the reflection abnormal shape influence information.

5. The gait assessment method based on three-dimensional simulation according to claim 4, characterized in that: The method for determining the abnormal relative contour position information includes: If and only if the number of the reflection abnormal position points is less than the preset abnormal position reference number, the initial shape area contour position point with the closest position distance is selected based on the reflection abnormal position points and used as the abnormal closest contour position point; Calculate the distance between the reflection anomaly position point and the nearest contour position point of the anomaly and use it as the anomaly contour distance value; Analyze the reflection anomaly position points and the initial shape area contour position points to determine the relative direction information of the anomaly contour; Calculate the angle between the relative direction information of each abnormal contour and use it as the relative direction angle value; Determine whether the relative direction angle values ​​are all within the preset same-direction reference angle range; If yes, then combining the abnormal contour distance value with the preset relative reference position information outside the contour to form abnormal relative contour position information; If not, an analysis is performed based on the abnormal contour distance value to determine the relative position information within the contour, and the relative position information within the contour is used as the abnormal relative contour position situation information.

6. The gait assessment method based on three-dimensional simulation according to claim 5, characterized in that: The method for determining the relative position information within the contour includes: Based on the relative direction angle value, the initial shape area contour position point corresponding to the initial shape area contour position point that is not within the preset same-direction reference angle interval is selected as the angle contour position point; Analyze the angle contour position points and the reflection anomaly position points to determine the abnormal contour distance reference value; Determine whether the abnormal contour distance value is greater than the abnormal contour distance reference value; If yes, the preset reference position information within the contour is output as the relative position information within the contour; If not, then the relative position information within the contour is formed by combining the abnormal contour distance value with the preset relative reference position information within the contour.

7. The gait assessment method based on three-dimensional simulation according to claim 6, characterized in that: Methods for determining the distance between abnormal contours and reference values ​​include: Analyze the angle contour position points to determine the length reference direction information; According to the correspondence between the length reference direction information and the preset width reference direction information, the width reference direction information corresponding to the length reference direction information is determined; Based on the reflection abnormality position point, the initial shape area contour position point on the width reference direction information is selected as the width contour position point; Calculate the distance between the width contour position points and use it as the width distance value; According to the corresponding relationship between the width distance value and the preset abnormal contour distance reference value, the abnormal contour distance reference value corresponding to the width distance value is determined.

8. The gait assessment method based on three-dimensional simulation according to claim 4, characterized in that: Methods for determining the front inspection shape information include: Retrieve the front reflection position point based on the front reflection information; Performing a curve analysis according to the front reflection position points to form a front reflection curve; According to the correspondence between the front reflection curve and the preset front inspection initial shape information, the front inspection initial shape information corresponding to the front reflection curve is determined; Get the pressure detection information on the detection strip; According to the deviation between the pressure detection information and the preset pressure detection reference information, the pressure deviation impact information is determined; The front inspection shape adjustment information is formed based on the combination of the front inspection initial shape information and the pressure deviation influence information, and the front inspection shape adjustment information is used as the front inspection shape information.

9. A gait assessment system based on three-dimensional simulation, characterized in that: include: An acquisition module, used to acquire image detection information and pressure detection information; A memory, used to store a program of the gait assessment method based on three-dimensional simulation according to any one of claims 1 to 8; A processor is configured to load and execute a program in a memory and implement a gait assessment method based on three-dimensional simulation as claimed in any one of claims 1 to 8.

10. An intelligent terminal, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and executes the gait assessment method based on three-dimensional simulation as described in any one of claims 1 to 8.

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