Four-channel ball pin high and low temperature endurance test bench

By using fast fixing components, simulation test components and auxiliary cooling components on the ball pin high and low temperature durability test bench, the problems of long installation time of traditional test bench, unreal simulated stress and low cooling efficiency are solved, and a more efficient and more accurate test process is achieved.

CN119880386AActive Publication Date: 2025-04-25YUHUAN ZHENGSHI MASCH RESPONSIBILITY CO LTD
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Patent Information

Application Number
CN202510082947.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-01-20
Publication Date
2025-04-25
Estimated Expiration
2045-01-20

AI Technical Summary

Technical Problem

The traditional ball pin high and low temperature durability test bench has problems such as long installation and disassembly time, unfixed fixation, unreal simulation stress, poor test accuracy, and difficulty in achieving rapid cooling and stable low temperature environment.

Method used

A four-channel ball pin high and low temperature durable test bench was designed, using fast fixing components, simulation test components and auxiliary cooling components to achieve rapid fixing, real simulated stress and efficient cooling.

Benefits of technology

It improves the test efficiency and accuracy, and can more realistically simulate the vibration and impact of the ball pin in the actual working environment, achieve rapid cooling and stable low temperature environment, and enhance the reliability and continuity of the test.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to the technical field of ball pin testing, and discloses a four-channel ball pin high and low temperature endurance test bench, which comprises a detection bench, a test box, a ship-shaped swing group and a ball pin, the test box is fixedly connected to the top of the detection bench, the ship-shaped swing group is rotatably connected to the inside of the test box, the ball pin is clamped to the top of the ship-shaped swing group, and the ship-shaped swing group is rotatably connected to the inside of the test box. A rapid fixing assembly used for assisting in rapidly fixing the ball pin is arranged in the test box, an auxiliary cooling assembly used for conducting low-temperature testing on the ball pin is arranged on the outer wall of the detection table, and through the arrangement of the rapid fixing assembly, when pressing of a button column is stopped, a first reset spring pushes the button column and a funnel-shaped limiting column to ascend; the funnel-shaped limiting column can push the limiting ball outwards to make the limiting ball abut against a limiting groove in the lower hemispherical groove sealing block, a traditional ball pin durability test bed needs a complex bolt and nut fastening mode or a clamp clamping mode or other modes, the fixing mode of the structure is easier, more convenient and faster to operate, and the test efficiency is improved.
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Description

Technical Field

[0001] The invention relates to the field of ball pin testing, in particular to a four-channel ball pin high and low temperature durability test bench. Background Art

[0002] The ball pin high and low temperature durability test bench is a professional equipment used to test the durability of ball pins in high and low temperature environments. According to the actual use conditions and test requirements of the ball pin, the loading system applies corresponding load, displacement or torque and other mechanical parameters to the ball pin, so that the ball pin is subjected to different mechanical effects, simulating its stress state in actual work, such as periodic tension, compression, torsion and other loads.

[0003] Traditional ball pin test benches usually use screws to fix the ball pins. During the installation process, the screws need to be aligned with the screw holes and then tightened one by one with tools. This process is relatively cumbersome, especially when the ball pins need to be replaced frequently for different tests. The installation and removal of the screws will take a lot of time, reducing the test efficiency. In addition, the traditional screw fixing method will cause the screws to loosen due to factors such as vibration. In the ball pin durability test, vibration of the test equipment is a common situation. Long-term vibration will gradually loosen the screws and affect the fixing effect of the ball pin.

[0004] And in terms of the actual working conditions of the ball pin durability test bench, the traditional test bench also has defects. Usually, it can only simply reciprocate the ball pin or apply force in a single direction. This simulation method is far from the stress state of the ball pin in the real complex environment. For example, during the actual driving process, the car ball pin will be subjected to irregular vibration and impact due to various situations such as road bumps, steering, acceleration and deceleration, and the traditional test bench is difficult to accurately reproduce these complex forces, making it impossible for the test results to truly reflect the durability of the ball pin in actual use. This is undoubtedly a huge obstacle to the research and development of related products such as automobiles that rely on the performance of the ball pin. In addition, the traditional test bench has poor ability to control test accuracy. Due to the lack of sophisticated transmission and control structure, it is difficult to accurately control the vibration frequency and impact force when simulating vibration and impact. This means that it is impossible to flexibly adjust the test parameters according to specific test needs, such as simulating the stress conditions of the ball pin under different road conditions and different vehicle speeds, and thus it is impossible to conduct in-depth research on the performance changes of the ball pin under different working conditions.

[0005] Traditional test benches rely solely on external refrigeration equipment for cooling, which not only wastes energy but also makes it difficult to achieve rapid cooling. In addition, traditional ball pin durability test benches on the market find it difficult to create an accurate and stable low-temperature environment. For example, when a car ball pin is actually driving in cold areas, it faces continuous and stable low temperatures. Traditional test benches have large temperature fluctuations and uneven low-temperature areas, and are unable to highly reproduce this real environment.

[0006] Therefore, it is necessary to provide a four-channel ball pin high and low temperature durability test bench to solve the above problems. Summary of the invention

[0007] In view of the deficiencies in the prior art, the object of the present invention is to provide a four-channel ball pin high and low temperature durability test bench.

[0008] To achieve the above-mentioned objectives, the present invention provides the following technical solutions: a four-channel ball pin high and low temperature durability test bench, comprising a testing bench, a test box, a boat-shaped swing group, and a ball pin, wherein the test box is fixedly connected to the top of the testing bench, the boat-shaped swing group is rotatably connected to the inside of the test box, the ball pin is clamped to the top of the boat-shaped swing group, the inside of the test box is provided with a quick fixing component for assisting in the quick fixing of the ball pin, the bottom of the boat-shaped swing group is provided with a simulation test component for simulating the actual working condition of the ball pin, and the outer wall of the testing bench is provided with an auxiliary cooling component for performing low-temperature testing on the ball pin.

[0009] Preferably, the quick fixing assembly includes an upper hemispherical groove sealing block, which is fixedly connected to the interior of the test box, and the interior of the upper hemispherical groove sealing block is slidably connected with a positioning pin, a lower hemispherical groove sealing block is arranged below the upper hemispherical groove sealing block, and a limiting groove is opened inside the lower hemispherical groove sealing block.

[0010] Preferably, the quick fixing assembly also includes a button column, which is slidably connected to the inside of the positioning pin, a first return spring is fixedly connected between the positioning pin and the button column, a funnel-shaped limit column is fixedly connected to the bottom of the button column, and a limiting bead is arranged on the top of the funnel-shaped limit column.

[0011] Preferably, the simulation test assembly includes a fixed plate, which is fixedly connected to the bottom of the boat-shaped rocking group, the top of the fixed plate is slidably connected to an umbrella-shaped impact column, a second return spring is arranged on the top of the fixed plate, and the bottom of the umbrella-shaped impact column is rotatably connected to a connecting rod.

[0012] Preferably, the simulation test assembly also includes an L-shaped rotating column, which is rotatably connected to the bottom of the fixed plate, a lever protrusion is fixedly connected to the middle of the L-shaped rotating column, a T-shaped toggle rod is rotatably connected to the inside of the L-shaped rotating column, an end of the T-shaped toggle rod away from the L-shaped rotating column is fixedly connected to a gear plate, and a gear bar is fixedly connected to the bottom of the inner cavity of the test box.

[0013] Preferably, the auxiliary cooling component includes a fixed block, which is fixedly connected to the outer wall of the test box, an air inlet groove is provided on the side of the fixed block close to the test box, a double-layer gap-increasing ring is fixedly connected to the inside of the fixed block, and a cooling tube is fixedly connected to the inner side of the double-layer gap-increasing ring.

[0014] Preferably, the auxiliary cooling component also includes inclined grooves, which are arranged in a ring shape and equidistantly inside the cooling pipe. A sealing plug is clamped on the top of the cooling pipe, and a three-branch ventilation groove is opened inside the test box.

[0015] Preferably, the positioning pin is slidably connected to the inside of the limiting groove, the limiting bead is arranged between the funnel-shaped limiting column and the positioning pin, and a groove smaller than the diameter of the limiting bead is formed at the bottom of the positioning pin.

[0016] Preferably, the second return spring is sleeved on the outside of the umbrella-shaped impact column, the end of the L-shaped rotating column away from the fixed plate is rotatably connected to the bottom of the connecting rod, the toothed bar is arranged below the gear plate, and the gear plate is meshed with the toothed bar.

[0017] Preferably, one end of the cooling pipe away from the sealing plug is connected to the three-way ventilation groove, and the three-way ventilation groove is connected to the upper hemispherical groove sealing block and the lower hemispherical groove sealing block through the gas transmission pipe.

[0018] The four-channel ball pin high and low temperature durability test bench provided by the present invention has the following beneficial effects compared with the prior art: 1. Through the setting of the quick fixing component, before testing the ball stud, it is only necessary to place the ball head part of the ball stud between the upper hemispherical groove sealing block and the lower hemispherical groove sealing block, press the button column inside the positioning pin to make it retract the limiting bead into the positioning pin through the funnel-shaped limiting column, and after stopping pressing the button column, the first return spring automatically resists the button column and the funnel-shaped limiting column to rise, so that the funnel-shaped limiting column resists the limiting groove inside the lower hemispherical groove sealing block through the limiting bead, thereby achieving the purpose of quickly fixing the ball head part of the ball stud inside the upper hemispherical groove sealing block and the lower hemispherical groove sealing block; Among them, the button column is used as an operating component, which is convenient for users to press manually, and the movement of the limit bead is controlled by the funnel-shaped limit column. When the button column is pressed, the limit bead can shrink into the positioning pin. This design allows the positioning pin to be smoothly placed inside the lower hemisphere groove sealing block. When the button column is stopped being pressed, the first return spring pushes the button column and the funnel-shaped limit column to rise, and the funnel-shaped limit column will push the limit bead outward to make it conflict with the limiting groove inside the lower hemisphere groove sealing block. Compared with the traditional ball pin durability test bench, the traditional ball pin durability test bench requires complicated bolt and nut tightening or clamp clamping, and the fixing method of the above structure is simpler and faster to operate, which can save installation time and improve test efficiency.

[0019] 2. Through the setting of the simulation test components, when the equipment conducts a durability test on the ball pin through the boat-shaped swing group, the boat-shaped swing group will drive the gear plate at the bottom to engage with the toothed bar, so that the gear plate drives the T-shaped toggle rod to intermittently toggle the lever lug in the middle of the L-shaped rotating column, so that the L-shaped rotating column continuously pulls the umbrella-shaped impact column through the connecting rod to compress the second reset spring, and the second reset spring will reciprocate and drive the umbrella-shaped impact column to impact the fixture that fixes the ball pin after being stressed, thereby simulating the vibration and impact of the ball pin during operation; Among them, the design of the umbrella-shaped impact column can make the impact force distribution more uniform. When it hits the fixture under the action of the second return spring, the umbrella-shaped impact column can disperse the impact force to a certain area of ​​the fixture, which is closer to the distribution of the force that the ball stud is subjected to under actual complex working conditions. At the same time, compared with the traditional ball stud durability test bench, which simply reciprocates the ball stud or applies a single-direction force to simulate the working condition, the above structure can more realistically simulate the complex vibration and impact conditions of the ball stud in the actual working environment, such as the irregular vibration and impact that the ball stud of an automobile is subjected to during driving due to road bumps, steering, etc., so that the durability performance of the ball stud can be tested more comprehensively and accurately, making the test results more valuable for practical application. Among them, the cooperation among the boat-shaped rocking group, the gear plate, the toothed bar, the T-shaped toggle rod, the L-shaped rotating column and other components can accurately control the frequency and strength of the impact. For example, the meshing of the gear plate and the toothed bar can realize the precise control of the transmission ratio, thereby adjusting the frequency of the T-shaped toggle rod to toggle the L-shaped rotating column, and then controlling the frequency of the umbrella-shaped impact column impacting the fixture, and the elastic coefficient of the second return spring can be selected as needed to accurately control the magnitude of the impact force, so that the vibration and impact of the ball pin can be quantitatively controlled, which is convenient for studying the performance changes of the ball pin under different working conditions. Compared with the traditional method, it can be based on the specific working conditions. The test requirements of the whole body are met, such as simulating the force conditions of the ball stud under different road conditions and vehicle speeds, accurately adjusting the test parameters, improving the test accuracy, and better evaluating the quality and performance of the ball stud. Some traditional vibration and impact simulation equipment adopts relatively simple vibration motors or impact devices, which often fail during long-term operation, such as overheating of the vibration motor coil and wear of the impact device components. The above structure has certain advantages in reliability and stability through the reasonable coordination of mechanical transmission and springs, which can reduce the impact of equipment failure on the test and improve the continuity and reliability of the test.

[0020] 3. Through the setting of the auxiliary cooling component, when the ball pin high and low temperature durability test bench transmits the low temperature to the inside of the test box, the gas will flow into the cooling tube through the air inlet groove and along the inclined groove, and then flow into the cooling tube in a threaded shape, which will consume a lot of heat. Then part of the airflow will flow out from the gap between the sealing plug and the cooling tube in a spiral shape along the wall of the cooling tube, and the remaining airflow will flow in the opposite spiral shape due to the obstruction of the sealing plug. In this process, due to the energy loss of the air and the convection formed by the discharged air and the remaining air, the part of the air will be quickly cooled down. Then the cooled airflow will flow into the three-way ventilation groove through the bottom of the cooling tube, and finally the low-temperature airflow will be transmitted to the upper hemisphere groove sealing block and the lower hemisphere groove sealing block through the three-way ventilation groove, thereby achieving the purpose of low-temperature testing of the ball pin; Among them, when the gas flows into the cooling tube in a threaded shape, the contact area and contact time between the gas and the tube wall of the cooling tube are increased. The traditional test bench only uses a simple straight tube airflow channel, the contact between the gas and the tube wall is limited, and the heat exchange efficiency is low. The above structure enables the gas to fully transfer heat to the tube wall during the flow process, consumes a lot of heat, and achieves efficient cooling, thereby achieving the purpose of low-temperature testing of the ball pin. This convection is spontaneously formed in the narrow space inside the cooling tube, does not require additional power drive, is energy-saving and efficient, compared with the traditional test bench that simply relies on external refrigeration equipment for cooling and lacks self-optimization and adjustment of internal airflow. The new structure allows the gas's own energy loss to cooperate with convection to quickly take away the heat. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 It is a schematic diagram of the position relationship of the overall device in the present invention; Figure 2 It is a cross-sectional view of the overall device of the present invention; Figure 3 For the present invention Figure 2 A magnified view of the structure at center; Figure 4 It is a schematic diagram of the position relationship between the test box and the auxiliary cooling component in the present invention; Figure 5 For the present invention Figure 4 A magnified view of the structure at B in the middle; Figure 6 It is a schematic diagram of the position relationship among the test box, the boat-shaped swing group and the quick fixing assembly in the present invention; Figure 7 For the present invention Figure 6 A magnified view of the structure at C in the middle; Figure 8 A schematic diagram of the positional relationship between the ball stud and the quick fixing assembly in the present invention; Fig. 9 It is a schematic diagram of the positional relationship among the test box, the boat-shaped swing group, and the simulation test assembly in the present invention; Fig.10 For the present invention Fig. 9 Enlarged view of the structure at point D in the middle.

[0022] Reference numerals: 11, test bench; 12, test box; 13, boat-shaped swing group; 14, ball stud; The quick fixing assembly includes: 21, upper hemispherical groove sealing block; 22, lower hemispherical groove sealing block; 23, positioning pin; 24, button column; 25, first return spring; 26, funnel-shaped limiting column; 27, limiting bead; 28, limiting groove; The simulation test assembly includes: 31, a fixing plate; 32, an umbrella-shaped impact column; 33, a second return spring; 34, a connecting rod; 35, an L-shaped rotating column; 36, a lever protrusion; 37, a T-shaped toggle rod; 38, a gear plate; 39, a toothed bar; The auxiliary cooling component includes: 41, a fixing block; 42, an air inlet groove; 43, a double-layer gap-increasing ring; 44, a cooling pipe; 45, an inclined groove; 46, a sealing plug; 47, a three-branch ventilation groove. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0024] In the description of the present invention, the terms "center", "lateral", "up", "down", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, they should not be understood as limitations on the present invention.

[0025] The specific implementation of the present invention is described in detail below in conjunction with specific embodiments.

[0026] Implementation example Figures 1 to 10 As shown, a four-channel ball pin high and low temperature durability test bench provided by an embodiment of the present invention includes a test bench 11, a test box 12, a boat-shaped swing group 13, and a ball pin 14. The test box 12 is fixedly connected to the top of the test bench 11, the boat-shaped swing group 13 is rotatably connected to the inside of the test box 12, and the ball pin 14 is clamped on the top of the boat-shaped swing group 13. The inside of the test box 12 is provided with a quick fixing component for assisting in quick fixing of the ball pin 14, the bottom of the boat-shaped swing group 13 is provided with a simulation test component for simulating the actual working condition of the ball pin 14, and the outer wall of the test bench 11 is provided with an auxiliary cooling component for performing low-temperature testing on the ball pin 14.

[0027] The quick fixing assembly includes an upper hemispherical groove sealing block 21, which is fixedly connected to the interior of the test box 12, and a positioning pin 23 is slidably connected to the interior of the upper hemispherical groove sealing block 21. A lower hemispherical groove sealing block 22 is arranged below the upper hemispherical groove sealing block 21, and a limiting groove 28 is opened inside the lower hemispherical groove sealing block 22.

[0028] The quick fixing assembly also includes a button column 24, which is slidably connected to the inside of the positioning pin 23. A first return spring 25 is fixedly connected between the positioning pin 23 and the button column 24. A funnel-shaped limit column 26 is fixedly connected to the bottom of the button column 24, and a limit bead 27 is arranged on the top of the funnel-shaped limit column 26.

[0029] The positioning pin 23 is slidably connected to the inside of the limiting groove 28, and the limiting bead 27 is arranged between the funnel-shaped limiting column 26 and the positioning pin 23. The bottom of the positioning pin 23 is provided with a groove smaller than the diameter of the limiting bead 27, so that the funnel-shaped limiting column 26 can contact the limiting groove 28 through the limiting bead 27, and the bottom of the funnel-shaped limiting column 26 is set to an elastic material, so that the positioning pin 23 can compress the funnel-shaped limiting column 26 to produce deformation.

[0030] The simulation test assembly includes a fixed plate 31, which is fixedly connected to the bottom of the boat-shaped rocking group 13. The top of the fixed plate 31 is slidably connected to an umbrella-shaped impact column 32. A second return spring 33 is provided on the top of the fixed plate 31. The bottom of the umbrella-shaped impact column 32 is rotatably connected to a connecting rod 34.

[0031] The simulation test assembly also includes an L-shaped rotating column 35, which is rotatably connected to the bottom of the fixed plate 31, a lever protrusion 36 is fixedly connected to the middle of the L-shaped rotating column 35, a T-shaped toggle rod 37 is rotatably connected to the inside of the L-shaped rotating column 35, and a gear plate 38 is fixedly connected to the end of the T-shaped toggle rod 37 away from the L-shaped rotating column 35, and a gear bar 39 is fixedly connected to the bottom of the inner cavity of the test box 12.

[0032] The second return spring 33 is sleeved on the outer side of the umbrella-shaped impact column 32, so that the second return spring 33 can be continuously compressed during the movement of the umbrella-shaped impact column 32. The end of the L-shaped rotating column 35 away from the fixed plate 31 is rotatably connected to the bottom of the connecting rod 34, so that the L-shaped rotating column 35 will pull the connecting rod 34 during rotation. The toothed bar 39 is arranged below the gear plate 38, and the gear plate 38 is meshed with the toothed bar 39, so that the toothed bar 39 can drive the L-shaped rotating column 35 to rotate through the gear plate 38.

[0033] The auxiliary cooling component includes a fixed block 41, which is fixedly connected to the outer wall of the test box 12. An air inlet groove 42 is provided on one side of the fixed block 41 close to the test box 12. A double-layer gap-increasing ring 43 is fixedly connected to the inside of the fixed block 41, and a cooling pipe 44 is fixedly connected to the inner side of the double-layer gap-increasing ring 43.

[0034] The auxiliary cooling component also includes inclined grooves 45 , which are equidistantly distributed in a ring shape inside the cooling tube 44 . A sealing plug 46 is clamped on the top of the cooling tube 44 . A three-branch ventilation groove 47 is opened inside the test box 12 .

[0035] One end of the cooling pipe 44 away from the sealing plug 46 is connected to the three-way ventilation groove 47, and the three-way ventilation groove 47 is connected to the upper hemispherical groove sealing block 21 and the lower hemispherical groove sealing block 22 through the gas transmission pipe, so that the three-way ventilation groove 47 can transmit the cooled airflow to the interior of the upper hemispherical groove sealing block 21 and the lower hemispherical groove sealing block 22.

[0036] Working principle: In the initial state, the positioning pin 23 is located inside the upper hemispherical groove sealing block 21 and the limiting groove 28, the limiting bead 27 is in conflict with the limiting groove 28, the first return spring 25 and the second return spring 33 are not compressed, the L-shaped rotating column 35 does not conflict with the T-shaped toggle rod 37, and the umbrella-shaped impact column 32 is located on the top of the fixed plate 31.

[0037] During operation, when the staff needs to perform a durability test on the new ball pin 14, the ball pin 14 needs to be disassembled first, and then the staff holds the positioning pin 23 to press the button column 24, and then the button column 24 gradually compresses the first return spring 25, and at the same time, the button column 24 compresses the funnel-shaped limit column 26. Because the bottom of the funnel-shaped limit column 26 is set to an elastic material, the positioning pin 23 compresses the funnel-shaped limit column 26 to cause deformation; After the funnel-shaped limiting column 26 is deformed, the limiting bead 27 will gradually slide into the interior of the positioning pin 23, so that the limiting bead 27 cannot interfere with the limiting groove 28, and the staff can disassemble the lower hemispherical groove sealing block 22 and then take out the ball pin 14 inside the lower hemispherical groove sealing block 22; When the staff needs to install a new ball stud 14, the above steps are opposite. First, the ball head end of the new ball stud 14 is passed through the lower hemispherical groove sealing block 22, and then the lower hemispherical groove sealing block 22 is fitted with the upper hemispherical groove sealing block 21. At the same time, the positioning pin 23 is held to press the button column 24 so that the limiting bead 27 is located inside the positioning pin 23, and the positioning pin 23 is passed through the upper hemispherical groove sealing block 21 and the limiting groove 28 in turn. After the bottom of the positioning pin 23 hits the lower hemispherical groove sealing block 22, the staff stops pressing the button column 24. When the staff stops pressing the button column 24, the first return spring 25 elastically stretches to push the button column 24 to rise along the inside of the positioning pin 23, and then the button column 24 pulls the funnel-shaped limit column 26 to rise synchronously. Because the bottom of the positioning pin 23 is provided with a groove smaller than the diameter of the limit bead 27, the funnel-shaped limit column 26 will resist the limit bead 27 on the top and move to the inside of the groove at the bottom of the positioning pin 23. At the same time, the limit bead 27 resists the limiting groove 28, thereby achieving the purpose of limiting the position of the upper hemisphere groove sealing block 21 and the lower hemisphere groove sealing block 22, and finally achieving the purpose of fixing the new ball head pin 14. Compared with the traditional ball pin durability test bench, the fixing method of the above structure is simpler and faster to operate, which can save installation time and improve test efficiency.

[0038] When the ball stud 14 needs to be tested at low temperature, the staff first injects the air flow into the air inlet groove 42, and then the air flow flows into the cooling tube 44 along the air inlet groove 42 and the double-layer gap-increasing ring 43. Since the outer wall of the cooling tube 44 is provided with an inclined groove 45, the gas flows into the cooling tube 44 through the air inlet groove 42 and along the inclined groove 45, and then flows into the cooling tube 44 in a threaded shape, which consumes a lot of heat when circulating. Part of the airflow flows out from the gap between the sealing plug 46 and the cooling tube 44 in a spiral shape along the wall of the cooling tube 44, while the remaining airflow flows in an opposite spiral shape due to the obstruction of the sealing plug 46. In this process, the energy loss of the air and the convection formed between the discharged air and the remaining air rapidly cool the part of the air. Subsequently, the cooled airflow flows into the three-way ventilation groove 47 through the bottom of the cooling tube 44, and finally the low-temperature airflow is transmitted to the upper hemispherical groove sealing block 21 and the lower hemispherical groove sealing block 22 through the three-way ventilation groove 47, thereby achieving the purpose of low-temperature testing of the ball stud 14. Among them, when the gas flows into the cooling tube 44 in a threaded shape, the contact area and contact time between the gas and the wall of the cooling tube 44 are increased, and the above structure achieves the purpose of low-temperature testing of the ball pin 14. This convection is spontaneously formed in the narrow space inside the cooling tube 44, and does not require additional power drive. It is energy-saving and efficient. Compared with the traditional test bench that simply relies on external refrigeration equipment for cooling and lacks self-optimization and adjustment of internal airflow, the new structure can make the gas's own energy loss cooperate with convection to quickly take away the heat.

[0039] When the test box 12 performs a shaking test on the ball pin 14 through the boat-shaped swing group 13, the boat-shaped swing group 13 will drive the fixing plate 31 at the bottom to rotate synchronously, and the fixing plate 31 will drive the gear plate 38 and the T-shaped toggle rod 37 at the bottom to move synchronously. Because the toothed bar 39 is arranged below the gear plate 38, and the gear plate 38 is meshed with the toothed bar 39, during the process of the fixing plate 31 driving the T-shaped toggle rod 37 and the gear plate 38 to move, the toothed bar 39 can toggle the T-shaped toggle rod 37 to rotate through the gear plate 38, and during the rotation of the T-shaped toggle rod 37, the levering protrusion 36 in the middle of the L-shaped rotating column 35 will be continuously toggled, and then the L-shaped rotating column 35 will continuously pull the umbrella-shaped impact column 32 through the connecting rod 34 to compress the second return spring 33, and after being subjected to force, the second return spring 33 will reciprocate and drive the umbrella-shaped impact column 32 to impact the fixture of the fixed ball pin 14, thereby simulating the vibration and impact of the ball pin 14 during the working process; When the umbrella-shaped impact column 32 impacts the fixture under the action of the second return spring 33, the umbrella-shaped impact column 32 can disperse the impact force to a certain area of ​​the fixture, which is closer to the distribution of the force received by the ball stud 14 under actual complex working conditions, such as the irregular vibration and impact received by the ball stud 14 of an automobile during driving due to road bumps, steering, etc., so that the durability of the ball stud 14 can be tested more comprehensively and accurately, making the test results more valuable for practical applications; Among them, the meshing of the gear plate 38 and the toothed bar 39 can realize the precise control of the transmission ratio, thereby adjusting the frequency of the T-shaped toggle lever 37 to toggle the L-shaped rotating column 35, and then controlling the frequency of the umbrella-shaped impact column 32 impacting the fixture, and the elastic coefficient of the second return spring 33 can be selected as needed to accurately control the magnitude of the impact force, so that the vibration and impact of the ball pin 14 can be quantitatively controlled, which is convenient for studying the performance changes of the ball pin 14 under different working conditions. Compared with the traditional method, according to specific test requirements, such as simulating the force of the ball pin 14 under different road conditions and different vehicle speeds, the test parameters can be accurately adjusted to improve the test accuracy and better evaluate the quality and performance of the ball pin 14; In addition, some traditional devices for simulating vibration and impact use relatively simple vibration motors or impact devices, which often fail during long-term operation, such as overheating of the vibration motor coil and wear of the impact device components. The above structure has certain advantages in reliability and stability through the reasonable coordination of mechanical transmission and springs, which can reduce the impact of equipment failure on the test and improve the continuity and reliability of the test.

[0040] For those skilled in the art, although several embodiments and examples of the present invention are described, these embodiments and examples are presented as examples and are not intended to limit the scope of the invention. These new embodiments can be implemented in various other ways, and various omissions, substitutions, and changes can be made without departing from the scope of the subject matter of the invention. These embodiments and their variations are included in the scope and subject matter of the invention, and are included in the invention described in the claims and the scope of their equivalents.

[0041] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. A four-channel ball pin high and low temperature durability test bench, comprising a test bench (11), a test box (12), a boat-shaped swing group (13), and a ball pin (14), wherein the test box (12) is fixedly connected to the top of the test bench (11), the boat-shaped swing group (13) is rotatably connected to the inside of the test box (12), and the ball pin (14) is clamped to the top of the boat-shaped swing group (13), characterized in that: The interior of the test box (12) is provided with a quick fixing component for assisting in the quick fixing of the ball pin (14); the bottom of the boat-shaped rocking group (13) is provided with a simulation test component for simulating the actual working condition of the ball pin (14); and the outer wall of the test bench (11) is provided with an auxiliary cooling component for performing a low-temperature test on the ball pin (14).

2. A four-channel ball pin high and low temperature durability test bench according to claim 1, characterized in that: The quick fixing assembly comprises an upper hemispherical groove sealing block (21), the upper hemispherical groove sealing block (21) is fixedly connected to the inside of the test box (12), a positioning pin (23) is slidably connected to the inside of the upper hemispherical groove sealing block (21), a lower hemispherical groove sealing block (22) is arranged below the upper hemispherical groove sealing block (21), and a limiting groove (28) is opened inside the lower hemispherical groove sealing block (22).

3. A four-channel ball pin high and low temperature durability test bench according to claim 2, characterized in that: The quick fixing assembly further comprises a button column (24), the button column (24) being slidably connected to the interior of the positioning pin (23), a first return spring (25) being fixedly connected between the positioning pin (23) and the button column (24), a funnel-shaped limiting column (26) being fixedly connected to the bottom of the button column (24), and a limiting bead (27) being arranged on the top of the funnel-shaped limiting column (26).

4. A four-channel ball pin high and low temperature durability test bench according to claim 1, characterized in that: The simulation test assembly comprises a fixing plate (31), the fixing plate (31) being fixedly connected to the bottom of the boat-shaped rocking group (13), the top of the fixing plate (31) being slidably connected to an umbrella-shaped impact column (32), the top of the fixing plate (31) being provided with a second return spring (33), and the bottom of the umbrella-shaped impact column (32) being rotatably connected to a connecting rod (34).

5. A four-channel ball pin high and low temperature durability test bench according to claim 4, characterized in that: The simulation test assembly further comprises an L-shaped rotating column (35), wherein the L-shaped rotating column (35) is rotatably connected to the bottom of the fixed plate (31), a lever protrusion (36) is fixedly connected to the middle of the L-shaped rotating column (35), a T-shaped toggle rod (37) is rotatably connected to the inside of the L-shaped rotating column (35), an end of the T-shaped toggle rod (37) away from the L-shaped rotating column (35) is fixedly connected to a gear plate (38), and a toothed bar (39) is fixedly connected to the bottom of the inner cavity of the test box (12).

6. A four-channel ball pin high and low temperature durability test bench according to claim 1, characterized in that: The auxiliary cooling component comprises a fixed block (41), the fixed block (41) being fixedly connected to the outer wall of the test box (12), an air inlet groove (42) being provided on a side of the fixed block (41) close to the test box (12), a double-layer gap-increasing ring (43) being fixedly connected inside the fixed block (41), and a cooling pipe (44) being fixedly connected inside the double-layer gap-increasing ring (43).

7. A four-channel ball pin high and low temperature durability test bench according to claim 6, characterized in that: The auxiliary cooling component further comprises inclined grooves (45), the inclined grooves (45) are arranged in an annular shape and are equidistantly distributed inside the cooling tube (44), a sealing plug (46) is clamped on the top of the cooling tube (44), and a three-branch ventilation groove (47) is arranged inside the test box (12).

8. The four-channel ball pin high and low temperature durability test bench according to claim 3 is characterized in that: The positioning pin (23) is slidably connected to the interior of the limiting groove (28), the limiting bead (27) is arranged between the funnel-shaped limiting column (26) and the positioning pin (23), and a groove smaller than the diameter of the limiting bead (27) is provided at the bottom of the positioning pin (23).

9. The four-channel ball pin high and low temperature durability test bench according to claim 5 is characterized in that: The second return spring (33) is sleeved on the outer side of the umbrella-shaped impact column (32); one end of the L-shaped rotating column (35) away from the fixed plate (31) is rotatably connected to the bottom of the connecting rod (34); the toothed bar (39) is arranged below the gear plate (38), and the gear plate (38) is meshed with the toothed bar (39).

10. The four-channel ball pin high and low temperature durability test bench according to claim 7, characterized in that: One end of the cooling pipe (44) away from the sealing plug (46) is connected to a three-way ventilation groove (47), and the three-way ventilation groove (47) is connected to an upper hemispherical groove sealing block (21) and a lower hemispherical groove sealing block (22) via a gas transmission pipe.

Citation Information

Patent Citations

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