Integrated backscatter x-ray assembly for detecting backscatter x-rays reflected by target region of object under test and related methods

Abstract

The invention relates to an integrated backscatter x-ray assembly for detecting backscatter x-rays reflected by a target area of an object under test and a related method. An integrated backscatter X-ray assembly for detecting backscatter X-rays reflected by a target region of an object under test is disclosed. An integrated backscatter X-ray assembly includes a housing, an X-ray power source, an X-ray tube, a backscatter X-ray detector, and a cooling fluid. And the X-ray power supply is arranged in the shell. An X-ray tube is disposed within the housing and operably coupled to an X-ray power source. A backscatter X-ray detector is disposed within the housing. A cooling fluid is disposed within the housing such that the X-ray power source, the X-ray tube, and the backscatter X-ray detector are submerged in the cooling fluid. In various examples, the integrated backscatter X-ray assembly may also include a movable base and / or a mobile platform. A method for detecting backscattered X-rays reflected by a target region of an object under test is also disclosed.

Description

Technical Field

[0001] The present disclosure relates generally to an integrated backscatter X-ray assembly, and in particular, to using an integrated backscatter X-ray assembly to detect backscatter X-rays reflected by a target area of ​​an object under test. A movable base that raises and lowers the integrated backscatter X-ray assembly relative to the object under test is contemplated for capturing Z-axis backscatter X-ray data. Similarly, a movable platform that moves the integrated backscatter X-ray assembly along the longitudinal axis of the object under test is contemplated for capturing XY backscatter X-ray data. The three-dimensional backscatter X-ray data can be used to reconstruct a three-dimensional model of the object under test. Background Art

[0002] There is a need to detect and measure gaps or shim material thickness in aircraft composite structures. In addition, there is a need to detect subsurface corrosion, water intrusion, and disbands. The existing solution is to disassemble the structure and manually measure the gap or shim thickness. This technique is very time-consuming and expensive to perform. Currently, the backlog of performing such inspections causes delays in aircraft deliveries and results in millions of dollars in rework and overdue fines.

[0003] Current conventional X-ray backscatter systems (e.g., Radalytica as in Olomouc, Czech Republic) ) requires two robots - one for the detector and one for the X-ray source. Each unit requires its own cooling system and power supply. In addition, the use of a conventional X-ray source and a narrow slit aperture results in a significant loss of about 90% of the generated X-rays. In addition, the Radalytica system requires both units to maintain constant triangulation coordinates during the inspection, as any change in the distance of the detector or the X-ray source will cause the 3D image reconstruction to fail. In addition, the Radalytica system is bulky and not suitable for on-site inspections.

[0004] Accordingly, those skilled in the art continue to conduct research and development efforts to improve techniques for simplifying the inspection of items under test. Summary of the invention

[0005] Examples of integrated backscattered X-ray assemblies and methods for detecting backscattered X-rays reflected by a target area of ​​an object under test are disclosed.The following is a non-exhaustive list of examples according to the disclosed subject matter that may or may not be claimed.

[0006] In one example, an integrated backscatter X-ray assembly for detecting backscatter X-rays reflected by a target area of ​​a detected object is disclosed. The integrated backscatter X-ray assembly includes a housing, an X-ray power supply, an X-ray tube, a backscatter X-ray detector, and a cooling fluid. The X-ray power supply is disposed in the housing. The X-ray tube is disposed in the housing and is operably coupled to the X-ray power supply. The backscatter X-ray detector is disposed in the housing. The cooling fluid is disposed in the housing so that the X-ray power supply, the X-ray tube, and the backscatter X-ray detector are immersed in the cooling fluid.

[0007] In one example, a method for detecting backscattered X-rays reflected by a target area of ​​an object under test comprises: (1) positioning a housing relative to the target area of ​​the object under test, the housing containing an X-ray power supply, an X-ray tube operably coupled to the X-ray power supply, and a backscattered X-ray detector, the target area comprising a target length along a longitudinal axis and a target width transverse to the longitudinal axis, the housing comprising a side wall facing the object under test, the side wall comprising a first section and a second section forming an inverted angle facing the object under test, an emitter portion of the X-ray tube disposed proximate to the first section, and an aperture portion of the backscattered X-ray detector disposed proximate to the second section; (2) adjusting the position of the housing so that the emitter portion of the X-ray tube and the aperture portion of the backscattered X-ray detector are disposed at a predetermined height above the object under test and at a predetermined longitudinal position relative to the target area, for nondestructive inspection of a transverse portion of a surface layer of the target area; projecting an X-ray fan beam (fan beam) from the X-ray tube to the transverse portion of the surface layer at the predetermined longitudinal position. (3) in response to the projection of the X-ray fan beam, detecting backscattered X-rays reflected by the object under test at the backscatter X-ray detector, the detected backscattered X-rays having passed through the aperture portion to reach a detector array of the backscatter X-ray detector; and (4) during the projection of the X-ray fan beam and the detection of the backscattered X-rays, cooling the X-ray power supply, the X-ray tube and the backscatter X-ray detector using a cooling fluid disposed in the housing, the X-ray power supply, the X-ray tube and the backscatter X-ray detector being immersed in the cooling fluid.

[0008] In another example, an integrated backscatter X-ray assembly for detecting backscatter X-rays reflected by a target area of ​​an object under test is disclosed. The integrated backscatter X-ray assembly includes a housing, an X-ray power supply, an X-ray tube, a backscatter X-ray detector, a cooling fluid, a movable base, and a mobile platform. The X-ray power supply is disposed in the housing. The X-ray tube is disposed in the housing and is operably coupled to the X-ray power supply. The backscatter X-ray detector is disposed in the housing. The cooling fluid is disposed in the housing so that the X-ray power supply, the X-ray tube, and the backscatter X-ray detector are immersed in the cooling fluid. The movable base supports the housing and is configured to position the housing relative to the target area of ​​the object under test. The target area includes a target length along a longitudinal axis and a target width transverse to the longitudinal axis. The movable base is configured to position an emitter portion of the X-ray tube and an aperture portion of the backscatter X-ray detector to a predetermined height above the object under test and a predetermined longitudinal position relative to the target area for non-destructive inspection of a transverse portion of a surface layer of the target area. The movable platform supports the movable base and is configured to change the longitudinal position of the housing relative to the object under test along the longitudinal axis to position the emitter portion of the X-ray tube and the hole portion of the backscatter X-ray detector to a second predetermined longitudinal position for non-destructive inspection of a second lateral portion of the surface layer of the target area.

[0009] Other examples of the disclosed integrated backscattered X-ray assembly and method for detecting backscattered X-rays reflected by a target region of an inspected article will become apparent from the following detailed description, the accompanying drawings, and the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 is a functional block diagram of an example of an integrated backscatter X-ray assembly for detecting backscatter X-rays reflected by a target area of ​​an object under inspection;

[0011] Figure 2A yes Figure 1 A top view of an example of a target area of ​​an object to be inspected, with Figure 1 An example of an X-ray fan beam projected by an integrated backscatter X-ray assembly;

[0012] Figure 2B It is shown Figure 2A A side view of the target area and the X-ray fan beam;

[0013] Figure 3A yes Figure 1A front view of an example detector array in an example backscatter X-ray detector of an integrated backscatter X-ray assembly;

[0014] Figure 3B yes Figure 3A The aperture section and Figure 3A a top view of an example of a detector array functionally illustrating a field of view from a target area through an aperture portion to the detector array;

[0015] Figure 4 yes Figure 1 A functional block diagram of an integrated backscatter X-ray assembly illustrating an example of an internal controller assembly of the integrated backscatter X-ray assembly and providing an external communication path from the internal controller assembly to an example of a computing device and an example of a backscatter X-ray data repository;

[0016] Figure 5A is positioned at a predetermined height from the target area by means of a movable base. Figure 1 A front view of an integrated backscatter X-ray assembly showing projection of X-rays at a target area and detection of backscattered X-rays from a surface layer of the target area;

[0017] Figure 5B is located at a predetermined longitudinal position relative to the longitudinal axis of the target area Figure 1 Side view of the integrated backscatter X-ray assembly;

[0018] Fig. 6A yes Figure 1 a front view of another example of an integrated backscatter x-ray assembly providing a functional block diagram of an example of an external controller assembly for altitude position control of the integrated backscatter x-ray assembly using a base member, an elevation track, and an actuator, and providing an external communication path from the external controller assembly;

[0019] Figure 6B is located at a predetermined longitudinal position relative to the longitudinal axis of the target area Fig. 6A Side view of the integrated backscatter X-ray assembly;

[0020] Figure 7 An example of a mobile platform supported by a track system for translation along the longitudinal axis of the target area of ​​the object to be measured Figure 1 A functional diagram of yet another example of an integrated backscatter X-ray assembly;

[0021] Fig. 8A yes Figure 7a front view of an integrated backscatter x-ray assembly providing a functional block diagram of an external controller assembly for position control of the integrated backscatter x-ray assembly using a drive motor, a drive train, and a motion platform to change a longitudinal position along a longitudinal axis of a target region, and providing an external communication path from the external controller assembly;

[0022] Figure 8B is located at a predetermined longitudinal position relative to the longitudinal axis of the target area Fig. 8A Side view of the integrated backscatter X-ray assembly;

[0023] Fig. 9 yes Figure 1 a functional block diagram of yet another example of an integrated backscatter X-ray assembly, wherein another example of a movable base includes an example of a robotic arm and an example of a robotic control system, showing external communication paths from the robotic control system to a local computing device, a remote computing device, and a backscatter X-ray data repository;

[0024] Fig.10 is a flow chart of an example of a method for detecting backscattered X-rays reflected by a target area of ​​an object under test;

[0025] Fig.11 is used for Figure 1 A flow chart of an example of a cooling element of a method;

[0026] Fig.12 Combination Fig.10 is a flow chart of another example of a method for detecting backscattered X-rays reflected by a target area of ​​an object under test;

[0027] Fig.13 Combination Fig.10 is a flow chart of yet another example of a method for detecting backscattered X-rays reflected by a target area of ​​an object under test;

[0028] Fig.14 Combination Fig.10 and Fig.13 is a flow chart of yet another example of a method for detecting backscattered X-rays reflected by a target area of ​​an object under test;

[0029] Fig.15 Combination Fig.10 is a flow chart of yet another example of a method for detecting backscattered X-rays reflected by a target area of ​​an object under test;

[0030] Fig.16 Combination Fig.10 and Fig.15 is a flow chart of another example of a method for detecting backscattered X-rays reflected by a target area of ​​an object under test;

[0031] Fig.17 Combination Fig.10 is a flow chart of yet another example of a method for detecting backscattered X-rays reflected by a target area of ​​an object under test;

[0032] Fig.18 Combination Fig.10 and Fig.17 is a flow chart of yet another example of a method for detecting backscattered X-rays reflected by a target area of ​​an object under test;

[0033] Fig.19 is a block diagram of an example of an aircraft production and service method that implements one or more examples of the method disclosed herein for detecting backscattered X-rays reflected by a target area of ​​an article under test; and

[0034] Fig. 20 is a schematic diagram of an example of an aircraft including various components tested using the integrated backscatter X-ray assembly and related methods disclosed herein. DETAILED DESCRIPTION

[0035] Various examples of integrated backscatter X-ray assemblies and methods for detecting backscatter X-rays reflected by a target area of ​​an article under test provide assemblies in which an X-ray power supply, an X-ray tube, and a backscatter X-ray detector are housed within a single housing. This allows these components to be immersed in mineral nonconductive oil or the like for cooling and eliminates the need for an external cooling system. Various examples of integrated backscatter X-ray assemblies and methods also provide a solution for accurately detecting thickness, corrosion, water intrusion, and subsurface disintegration of gap or gasket materials in aircraft composite structures.

[0036] In addition, various examples of integrated backscatter X-ray assemblies and methods also provide a high-speed integrated X-ray backscatter system that provides X-ray backscatter data and corresponding position data for reconstructing a three-dimensional model of a target area of ​​a measured object through a three-dimensional reconstruction system. This solves the problem of conventional point rastering laser beam X-ray backscatter systems, which are extremely large, cumbersome, and cannot produce three-dimensional imaging due to their large single detector. For example, to achieve three-dimensional backscatter imaging, a two-dimensional image slice of the target area is created. In order to obtain a complete three-dimensional backscatter image, multiple two-dimensional slices are integrated and spliced ​​together.

[0037] Various examples of integrated backscatter X-ray assemblies provide a compact and practical assembly. This assembly incorporates an X-ray power supply, an X-ray tube, and a backscatter X-ray detector into a single inspection head unit. The components of the inspection head unit are immersed in mineral non-conductive oil, eliminating the need for external cooling. The integrated backscatter X-ray assembly may also include a movable base having a base member supporting the inspection head unit, an altitude tracker, and an actuator that changes the altitude relative to the target area. The integrated backscatter X-ray assembly may also include a mobile platform for transporting the inspection head unit along an expandable track that can be attached to an aircraft structure. The movable base and the mobile platform enable the inspection head unit to scan on three axes, thereby providing efficient and accurate inspection of large target areas.

[0038] The inspection head unit communication and control electronics are housed inside the unit. The movable base and mobile platform communication and control electronics may be located outside the unit. Backscattered X-ray data and position data are wirelessly transmitted to the backscattered X-ray data repository for access by the three-dimensional reconstruction computer system for image reconstruction and evaluation. The parameters and operation of the X-ray power supply, X-ray tube, and backscattered X-ray detector are remotely controlled. Likewise, the safety mechanism is also remotely operated and controlled.

[0039] Overall reference Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-B and Fig. 9 As an example, the present disclosure relates to an integrated backscatter X-ray assembly 100 for detecting backscatter X-rays reflected by a target area 128 of an object 116 under inspection. Figure 1 is a functional block diagram of an example of an integrated backscatter X-ray assembly 100 . Figure 2A and Figure 2B A top view and a side view of an example of a target area 128 are provided, with Figure 1 An example of an X-ray fan beam 124 projected by the integrated backscatter X-ray assembly 100 . Figure 3A and Figure 3B Provided Figure 1 Front and top views of an example detector array 302 and an example aperture portion 122 in an example backscatter X-ray detector 108 of an integrated backscatter X-ray assembly 100 with a field of view from a target area 128 through the aperture portion 122 to the detector array 302 .

[0040] Figure 4 yes Figure 1A functional block diagram of the integrated backscatter X-ray assembly 100 illustrating an example of an internal controller assembly 140 and providing an external communication path from the internal controller assembly 140 to an example of a computing device 402 and an example of a backscatter X-ray data repository 408 . Figure 5A Provided by way of example, the movable base 502 is positioned at a predetermined height from the target area 128 Figure 1 Front view of the integrated backscatter X-ray assembly 100. Figure 5B supply Figure 1 A side view of the integrated backscatter X-ray assembly 100 at a predetermined longitudinal position relative to the longitudinal axis 204 of the target region 128 .

[0041] Fig. 6A supply Figure 1 A front view of another example of an integrated backscatter X-ray assembly 100 provides a functional block diagram of an example of an external controller assembly 612 for height position control of the integrated backscatter X-ray assembly 100 using a base member 602, a height tracker 604, and an actuator 606 and provides an external communication path for the external controller assembly 612. Figure 6B Providing a target region 128 positioned at a predetermined longitudinal position relative to the longitudinal axis 204 Fig. 6A Side view of integrated backscatter X-ray assembly 100 .

[0042] Figure 7 The example of a mobile platform 702 is supported by a track system for translation along the longitudinal axis 204 of the target area 128 of the object 116 to be inspected. Figure 1 A functional block diagram of yet another example of an integrated backscatter X-ray assembly 100 . Fig. 8A supply Figure 7 A front view of the integrated backscatter X-ray assembly 100 providing a functional block diagram of an example of an external controller assembly 612 for position control of the integrated backscatter X-ray assembly 100 using a drive motor 802, a transmission train 804, and a mobile platform 702 and providing an external communication path from the external controller assembly 612. Figure 8B Providing a target region 128 positioned at a predetermined longitudinal position relative to the longitudinal axis 204 Figure 7 Side view of integrated backscatter X-ray assembly 100 . Fig. 9 yes Figure 1 A functional block diagram of another example of an integrated backscatter X-ray assembly 100, wherein another example of a movable base 502 includes an example of a robotic arm 902 and an example of a robotic control system 906, showing external communication paths from the robotic control system 906 to a local computing device 908, a remote computing device 910, and a backscatter X-ray data repository 408.

[0043] Reference again Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-B and Fig. 9 In one or more examples, an integrated backscatter X-ray assembly 100 for detecting backscatter X-rays reflected by a target area 128 of an object under test 116 includes a housing 102, an X-ray power supply 104, a backscatter X-ray detector 108, and a cooling fluid 110. The X-ray power supply 104 is disposed within the housing 102. The X-ray tube 106 is disposed within the housing 102 and is operably coupled to the X-ray power supply 104. The backscatter X-ray detector 108 is disposed within the housing 102. The cooling fluid 110 is disposed within the housing 102 such that the X-ray power supply 104, the X-ray tube 106, and the backscatter X-ray detector 108 are immersed in the cooling fluid 110.

[0044] In another example of the integrated backscatter X-ray assembly 100 , the housing 102 includes a Faraday cage 112 to shield the backscatter X-ray detector 108 from electromagnetic fields emitted by the X-ray power supply 104 and the X-ray tube 106 .

[0045] In yet another example of the integrated backscatter X-ray assembly 100, the housing 102 includes a side wall 114 that is configured to face the object under test 116. The side wall 114 includes a first section 118 and a second section 120 that form a chamfer 123 that is configured to face the object under test 116. An emitter portion 121 of the X-ray tube 106 is disposed proximate to the first section 118, and an aperture portion 122 of the backscatter X-ray detector 108 is disposed proximate to the second section 120. In further examples, the chamfer 123 includes an angle ranging from about 50 degrees to about 150 degrees, about 60 degrees to about 120 degrees, about 70 degrees to about 100 degrees, about 80 degrees to about 90 degrees, or any other suitable angle range.

[0046] In yet another example of the integrated backscatter X-ray assembly 100, the X-ray tube 106 and the backscatter X-ray detector 108 are oriented within the housing 102 such that an X-ray fan beam 124 generated by the X-ray power supply 104 and the X-ray tube 106 and a field of view 126 of the backscatter X-ray detector 108 intersect at a target region 128 of the measured article 116. In a further example, the X-ray tube 106 is oriented at an angle relative to the target region 128 of the measured article 116, the angle ranging from about 15 degrees to about 65 degrees, about 30 degrees to about 60 degrees, about 40 degrees to about 55 degrees, about 45 degrees to about 50 degrees, or any other suitable angle range. In another further example, the backscatter X-ray detector 108 is oriented at an angle relative to the target area 128 of the object under test 116, the angle ranging from about -15 degrees to about -65 degrees, about -30 degrees to about -60 degrees, about -40 degrees to about -55 degrees, about -45 degrees to about -50 degrees, or any other suitable angle range.

[0047] In yet another example of the integrated backscatter X-ray assembly 100, the X-ray power supply 104 and the X-ray tube 106 are configured to generate an X-ray fan beam 124 for non-destructive inspection of the object under test 116. In a further example, the X-ray tube 106 is configured to project the X-ray fan beam 124 to a target area 128 of the object under test 116. In yet a further example, the target area 128 includes a target length 202 along the longitudinal axis 204 and a target width 206 transverse to the longitudinal axis 204.

[0048] In yet a further example, the X-ray fan beam 124 includes a beam length 208 that constitutes (is equal to, represents) a portion of the target length 202, a beam width 210 that is related to the target width 206, and a beam depth 212 that represents the depth at which backscattered X-rays reflected by the object under test 116 can be detected by the backscattered X-ray detector 108 in response to the X-ray fan beam 124. In a further example, the beam length 208 represents pixel rows in the target area 128, and the pixel rows range from 4 rows to 10 rows. In another further example, the beam width 210 represents pixel columns in the target area 128. The pixel columns range from 200 columns to 600 columns. In another further example, the beam depth 212 represents the depth within the target area 128 along a Z-axis 214 extending from the object under test 116 to the housing 102. The beam depth 212 ranges from 4 mm to 10 mm.

[0049] In another example of the integrated backscatter X-ray assembly 100, the backscatter X-ray detector 108 is configured to detect at least a portion of the backscatter X-rays reflected from a target area 128 of the object under test 116 in response to an X-ray fan beam 124 generated by the X-ray power supply 104 and the X-ray tube 106.

[0050] In yet another example of the integrated backscatter X-ray assembly 100, the backscatter X-ray detector 108 includes an aperture portion 122 and a detector array 302. The aperture portion 122 is configured to pass at least a portion of the backscattered X-rays reflected from the target region 128 of the object 116 under test in response to the X-ray fan beam 124 generated by the X-ray power supply 104 and the X-ray tube 106. The detector array 302 is configured to detect the portion of the backscattered X-rays that pass through the aperture portion 122. In a further example, the aperture portion 122 and the detector array 302 are oriented and spaced to receive a portion of the backscattered X-rays reflected from the target region 128 of the object 116 under test in response to the X-ray fan beam 124 generated by the X-ray power supply 104 and the X-ray tube 106.

[0051] In yet a further example, the detector array 302 includes a plurality of direct detectors 304 arranged in a plurality of rows and a plurality of columns. In a further example, the direct detectors 304 include photon counting detectors 306, hybrid pixel detectors, monolithic active pixel sensors, pn-type charge coupled devices, or any other suitable type of direct detectors in any suitable combination. In another further example, the plurality of rows of the direct detectors 304 range from about 200 rows to about 600 rows, about 300 rows to about 500 rows, about 350 rows to about 450 rows, or any other suitable row range. In yet a further example, the plurality of columns of the direct detectors 304 range from about 200 columns to about 600 columns, about 300 columns to about 500 columns, about 350 columns to about 450 columns, or any other suitable column range.

[0052] In yet another example of the integrated backscatter X-ray assembly 100, the cooling fluid 110 is non-conductive. In a further example, the cooling fluid 110 includes a non-conductive cooling fluid, an organic cooling fluid, a mineral oil, or any other suitable cooling fluid in any suitable combination.

[0053] In yet another example, the integrated backscatter X-ray assembly 100 further includes a thermoelectric cooler 130 secured to an outer surface 132 of the housing 102 and configured to transfer thermal energy from the cooling fluid 110 by dissipating heat outside the housing 102 in response to receiving power from at least one of an external power source 134 and a battery 136. In a further example, the integrated backscatter X-ray assembly further includes a heat sink 138 secured to the thermoelectric cooler 130 and configured to dissipate heat from the thermoelectric cooler 130 to an ambient test environment.

[0054] In another example, the integrated backscatter X-ray assembly 100 further includes an internal controller assembly 140, an internal wireless transceiver 142, and an antenna 144. The internal controller assembly 140 is disposed within the housing 102 and is in operable communication with the X-ray power supply 104, the X-ray tube 106, and the backscatter X-ray detector 108 in response to receiving power from at least one of the external power supply 134 and the battery 136. The internal wireless transceiver 142 is disposed within the housing 102 and is in operable communication with the internal controller assembly 140. The antenna 144 is fixed to the outer surface 132 of the housing 102 and is in operable communication with the internal wireless transceiver 142. In a further example, the internal controller assembly 140, the internal wireless transceiver 142, and the antenna 144 are configured to receive control signals from the computing device 402, the mobile device 404, or any other suitable control device in any suitable combination via the wireless network 406. In yet a further example, the wireless network 406 includes a wireless fidelity network, a wireless local area network, a wireless personal area network, a metropolitan area network, a cellular network, or any other suitable wireless network in any suitable combination. In another further example, the internal controller component 140, the internal wireless transceiver 142, and the antenna 144 are configured to transmit the backscattered X-ray data to a backscattered X-ray data repository 408 accessible via the wireless network 406 and the communication network 410.

[0055] In yet another example of the integrated backscatter X-ray assembly 100, the target area 128 includes a target length 202 along the longitudinal axis 204 and a target width 206 transverse to the longitudinal axis 204. In this example, the integrated backscatter X-ray assembly 100 also includes a movable base 502 that supports the housing 102 and is configured to position the housing 102 relative to the target area 128 of the measured article 116. The X-ray tube 106 and the backscatter X-ray detector 108 are oriented within the housing 102 such that the X-ray fan beam 124 generated by the X-ray power supply 104 and the X-ray tube 106 intersects the field of view 126 of the backscatter X-ray detector 108 at the target area 128 of the measured article 116. The movable base 502 is configured to position the emitter portion 121 of the X-ray tube 106 and the hole portion 122 of the backscatter X-ray detector 108 to a predetermined height 504 above the object under test 116 and a predetermined longitudinal position 506 relative to the target area 128 for non-destructive inspection of a lateral portion of the surface layer of the target area 128.

[0056] In a further example of the integrated backscatter x-ray assembly 100, the movable base 502 includes a base member 602, a height tracker 604, an actuator 606, a position sensor 610, an external controller assembly 612, an external wireless transceiver 614, and an antenna 144. The base member 602 supports the housing 102. The height tracker 604 is movably coupled to the base member 602 and defines a Z axis 214 extending from the movable base 502 to the measured article 116. The actuator 606 is attached to the height tracker 604 and the base member 602. The actuator 606 is configured to change the height of the housing 102 relative to the object 116 to move the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 to a second predetermined height 608 closer to the object 116 along the Z axis 214 for non-destructive inspection of a subsurface layer of the target area 128. The position sensor 610 is configured to detect movement of at least one of the actuator 606, the movable base 502, and the housing 102. The external controller assembly 612 is in operative communication with the actuator 606 and the position sensor 610 to control movement of the housing 102 along the Z axis 214. The external wireless transceiver 614 is in operative communication with the external controller assembly 612. The antenna 144 is fixed to the housing 102 and is in operative communication with the external wireless transceiver 614.

[0057] In yet a further example, the predetermined height 504 and the second predetermined height 608 are determined such that the surface layer and the subsurface layer of the target area 128 at least partially overlap. In yet a further example, the overlap represents pixels in the target area 128 relative to the object under test 116 along the Z axis 214. The pixels along the Z axis 214 range from 2 pixels to 5 pixels. In another further example, the actuator 606 is configured to move the housing 102 closer to the object under test 116 to position the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 to an additional predetermined height associated with non-destructive inspection of an additional subsurface layer of the target area 128. In yet a further example, the actuator 606 includes a linear actuator, a mechanical linear actuator, an electromechanical linear actuator, a piezoelectric linear actuator, a worm gear linear actuator, a screw drive linear actuator, or any other suitable actuator.

[0058] In yet another further example, the external controller component 612, the external wireless transceiver 614, and the antenna 144 are configured to receive control signals from the internal controller component 140, from the computing device 402, the mobile device 404, or any other suitable control device in any suitable combination via the wireless network 406 for controlling the actuator 606. In yet another further example, the wireless network 406 includes a wireless fidelity network, a wireless local area network, a wireless personal area network, a metropolitan area network, a cellular network, or any other suitable wireless network in any suitable combination. In yet another further example, the external controller component 612, the external wireless transceiver 614, and the antenna 144 are configured to transmit position data from the position sensor 610 to the backscattered X-ray data repository 408 in conjunction with the control of the actuator 606. The backscattered X-ray data repository 408 can be accessed via the wireless network 406 and the communication network 410.

[0059] In another further example of the integrated backscatter X-ray assembly 100, the movable base 502 includes a moving platform 702, and the moving platform 702 is configured to change the longitudinal position of the housing 102 relative to the object under test 116 along the longitudinal axis 204 to position the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 to a second predetermined longitudinal position 704 for non-destructive inspection of a second transverse portion of the surface layer of the target area 128. In a further example, the predetermined longitudinal position 506 and the second predetermined longitudinal position 704 are determined so that the transverse portion of the surface layer of the target area 128 and the second transverse portion of the surface layer at least partially overlap. In a further example, the overlap represents a row of pixels in the target area 128 relative to the object under test 116 along the longitudinal axis 204. The range of pixel rows is from 2 rows to 5 rows. In another further example, the mobile platform 702 is configured to move the housing 102 along the longitudinal axis 204 of the target area 128 of the article under test 116 to position the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 to additional predetermined longitudinal positions associated with non-destructive inspection of additional lateral portions of the surface layer of the target area 128.

[0060] In yet another further example of the integrated backscatter X-ray assembly 100, the mobile platform 702 includes a base member 602, a plurality of wheels 706, a drive motor 802, a transmission 804, a position sensor 806, an external controller assembly 612, an external wireless transceiver 614, and an antenna 144. The base member 602 supports the housing 102. The plurality of wheels 706 are rotatably attached to the base member 602. The drive motor 802 is configured to selectively provide power for movement of the mobile platform 702. The transmission 804 couples the drive motor 802 to one or more wheels 706 of the plurality of wheels 706 to move the mobile platform 702 in response to operation of the drive motor 802. The position sensor 806 is configured to detect movement of at least one of the drive motor 802, the transmission 804, and the one or more wheels 706. The external controller assembly 612 is in operative communication with the drive motor 802 and the position sensor 806 to control movement of the mobile platform 702 along the longitudinal axis 204. The external wireless transceiver 614 is in operable communication with the external controller assembly 612. The antenna 144 is secured to the housing 102 and is in operable communication with the external wireless transceiver 614.

[0061] In yet a further example, the drive motor 802 includes a DC motor, a precision motor, a stepper motor, a servo motor, a rotary actuator, or any other suitable drive motor. In another further example, the transmission system 804 includes a gearbox assembly, a belt drive assembly, a chain drive assembly, a gear coupled to the drive motor 802, a pulley coupled to the drive motor 802, a sprocket coupled to the drive motor 802, a gear driven shaft, a pulley driven shaft, a sprocket driven shaft, or any other suitable transmission system in any suitable combination. In yet a further example, the position sensor 806 includes a rotary position sensor, a rotary encoder, a rotary precision potentiometer, or any other suitable position sensor.

[0062] In yet another further example, the external controller assembly 612, the external wireless transceiver 614, and the antenna 144 are configured to receive control signals from the internal controller assembly 140, from the computing device 402, the mobile device 404, or any other suitable control device in any suitable combination via the wireless network 406 for controlling the drive motor 802. In a further example, the wireless network 406 includes a Wi-Fi network, a wireless local area network, a wireless personal area network, a metropolitan area network, a cellular network, or any other suitable wireless network in any suitable combination. In yet another further example, the external controller assembly 612, the external wireless transceiver 614, and the antenna 144 are configured to transmit position data from the position sensor 806 to a backscattered X-ray data repository 408 that can be accessed via the wireless network 406 and the communication network 410. The position data is related to the control of the drive motor 802.

[0063] In yet another further example of the integrated backscatter X-ray assembly 100, the movable base 502 includes a robotic arm 902 having an end effector 904 and a robotic control system 906. The robotic arm 902 supports the housing 102. The robotic control system 906 is in operative communication with the robotic arm 902. The robotic control system 906 and the robotic arm 902 are configured to change the height of the housing 102 relative to the object under test 116 to move the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 to a second predetermined height 608 closer to the object under test 116 along the Z axis 214 for non-destructive inspection of a sub-surface layer of the target area 128. The robotic control system 906 and the robotic arm 902 are configured to change the longitudinal position of the housing 102 relative to the object under test 116 along the longitudinal axis 204 so as to position the emitter portion 121 of the X-ray tube 106 and the hole portion 122 of the backscatter X-ray detector 108 to a second predetermined longitudinal position 704 for non-destructive inspection of a second lateral portion of the surface layer of the target area 128.

[0064] In yet a further example, the predetermined height 504 and the second predetermined height 608 are determined such that the surface layer and the sub-surface layer of the target area 128 at least partially overlap. In yet a further example, the overlap represents pixels in the target area 128 relative to the object under test 116 along the Z-axis 214, and the pixels along the Z-axis 214 range from 2 pixels to 5 pixels. In another further example, the robotic control system 906 and the robotic arm 902 are configured to move the housing 102 closer to the object under test 116 to position the emitter portion 121 of the x-ray tube 106 and the aperture portion 122 of the backscatter x-ray detector 108 to additional predetermined heights associated with non-destructive inspection of additional sub-surface layers of the target area 128.

[0065] In yet a further example, the robotic control system 906 is configured to receive control signals from the local computing device 908, the remote computing device 910, or any other suitable control device in any suitable combination for controlling the robotic arm 902. In yet a further example, the robotic control system 906 is configured to transmit position data associated with the predetermined height 504 and the predetermined longitudinal position 506 of the housing 102 to the backscattered X-ray data repository 408 in conjunction with control of the robotic arm 902.

[0066] In yet another further example, the predetermined longitudinal position 506 and the second predetermined longitudinal position 704 are determined such that the lateral portion of the surface layer of the target area 128 and the second lateral portion of the surface layer at least partially overlap. In a further example, the overlap represents pixel rows in the target area 128 relative to the measured object 116 along the longitudinal axis 204. The pixel rows range from 2 rows to 5 rows.

[0067] In another further example, the robotic control system 906 is configured to move the housing 102 along the longitudinal axis 204 of the target area 128 of the article under test 116 to position the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 to additional predetermined longitudinal positions associated with nondestructive inspection of additional lateral portions of the surface layer of the target area 128.

[0068] Overall reference Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-B and Figure 9-Figure 18As an example, the present disclosure relates to methods 1000 , 1200 , 1300 , 1400 , 1500 , 1600 , 1700 , 1800 for detecting backscattered X-rays reflected by a target area 128 of an object 116 under test. Figure 1 is a functional block diagram of an example of an integrated backscatter X-ray assembly 100 . Figure 2A and Figure 2B A top view and a side view of an example of a target area 128 are provided, with Figure 1 An example of an X-ray fan beam 124 projected by the integrated backscatter X-ray assembly 100 . Figure 3A and Figure 3B supply Figure 1 Front and top views of an example detector array 302 and an example aperture portion 122 in an example backscatter X-ray detector 108 of an integrated backscatter X-ray assembly 100 with a field of view from a target area 128 through the aperture portion 122 to the detector array 302 .

[0069] Figure 4 yes Figure 1 A functional block diagram of the integrated backscatter X-ray assembly 100 illustrating an example of an internal controller assembly 140 and providing an external communication path from the internal controller assembly 140 to an example of a computing device 402 and an example of a backscatter X-ray data repository 408 . Figure 5A Provided by way of example, the movable base 502 is positioned at a predetermined height from the target area 128 Figure 1 Front view of integrated backscatter X-ray assembly 100 . Figure 5B supply Figure 1 A side view of the integrated backscatter X-ray assembly 100 at a predetermined longitudinal position relative to the longitudinal axis 204 of the target region 128 . Fig. 6A supply Figure 1 A front view of another example of an integrated backscatter X-ray assembly 100 provides a functional block diagram of an example of an external controller assembly 612 for height position control of the integrated backscatter X-ray assembly 100 using a base member 602, a height tracker 604, and an actuator 606, and provides an external communication path for the external controller assembly 612. Figure 6B supply Fig. 6A A side view of the integrated backscatter X-ray assembly 100 positioned at a predetermined longitudinal position relative to the longitudinal axis 204 of the target region 128 .

[0070] Figure 7 The example of a mobile platform 702 is supported by a track system for translation along the longitudinal axis 204 of the target area 128 of the object 116 to be inspected. Figure 1A functional block diagram of yet another example of an integrated backscatter X-ray assembly 100 . Fig. 8A supply Figure 7 A front view of the integrated backscatter X-ray assembly 100 providing a functional block diagram of an example of an external controller assembly 612 for position control of the integrated backscatter X-ray assembly 100 using a drive motor 802, a transmission system 804, and a mobile platform 702, and providing an external communication path from the external controller assembly 612. Figure 8B supply Figure 7 A side view of the integrated backscatter X-ray assembly 100 positioned at a predetermined longitudinal position relative to the longitudinal axis 204 of the target region 128 . Fig. 9 yes Figure 1 A functional block diagram of another example of an integrated backscatter X-ray assembly 100, wherein another example of a movable base 502 includes an example of a robotic arm 902 and an example of a robotic control system 906, showing external communication paths from the robotic control system 906 to a local computing device 908, a remote computing device 910, and a backscatter X-ray data repository 408.

[0071] Fig.10 An example of a method 1000 for detecting backscattered X-rays reflected by a target region 128 of an article under test 116 is disclosed. Fig.11 Published from Figure 1 An example of cooling 1010 of method 1000 . Fig.12 Combination Fig.10 A method 1200 for detecting backscattered X-rays reflected by a target region 128 of an object 116 under inspection is disclosed. Fig.13 Combination Fig.10 A method 1300 for detecting backscattered X-rays reflected by a target region 128 of an object 116 under inspection is disclosed. Fig.14 Combination Fig.10 and Fig.13 A method 1400 for detecting backscattered X-rays reflected by a target region 128 of an object 116 under inspection is disclosed. Fig.15 Combination Fig.10 A method 1500 for detecting backscattered X-rays reflected by a target area of ​​an object under inspection is disclosed. Fig.16 Combination Fig.10 and Fig.15 A method 1600 for detecting backscattered X-rays reflected by a target region 128 of an object 116 under inspection is disclosed. Fig.17 Combination Fig.10 A method 1700 for detecting backscattered X-rays reflected by a target region 128 of an object 116 under inspection is disclosed. Fig.18 Combination Fig.10 and Fig.17A method 1800 for detecting backscattered X-rays reflected by a target region 128 of an article under inspection 116 is disclosed.

[0072] Reference again Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 5A-Figure 5B , Fig.10 and Fig.11 In one or more examples, a method 1000 for detecting backscattered X-rays reflected by a target region 128 of an object 116 is provided (see Fig.10 ) includes positioning 1002 a housing 102 relative to a target area 128 of an object under test 116. The housing 102 houses an X-ray power supply 104, an X-ray tube 106 operably coupled to the X-ray power supply 104, and a backscatter X-ray detector 108. The target area 128 includes a target length 202 along a longitudinal axis 204 and a target width 206 transverse to the longitudinal axis 204. The housing 102 includes a side wall 114 facing the object under test 116. The side wall 114 includes a first section 118 and a second section 120, the first section 118 and the second section 120 forming a chamfer 123 facing the object under test 116. An emitter portion 121 of the X-ray tube 106 is disposed proximate to the first section 118, and an aperture portion 122 of the backscatter X-ray detector 108 is disposed proximate to the second section 120. At 1004, the position of the housing 102 is adjusted so that the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 are disposed at a predetermined height 504 above the object 116 and at a predetermined longitudinal position 506 relative to the target area 128 for nondestructive inspection of a transverse portion of the surface layer of the target area 128. At 1006, an X-ray fan beam 124 is projected from the X-ray tube 106 toward the transverse portion of the surface layer at the predetermined longitudinal position 506. At 1008, in response to the projection of the X-ray fan beam 124, backscatter X-rays reflected by the object 116 are detected at the backscatter X-ray detector 108. The detected backscatter X-rays have passed through the aperture portion 122 to reach the detector array 302 of the backscatter X-ray detector 108. At 1010, during projection 1006 of the X-ray fan beam 124 and detection 1008 of backscattered X-rays, the X-ray power supply 104, the X-ray tube 106, and the backscattered X-ray detector 108 are cooled using a cooling fluid 110 disposed within the housing 102. The X-ray power supply 104, the X-ray tube 106, and the backscattered X-ray detector 108 are immersed in the cooling fluid 110.

[0073] In another example of method 1000, the X-ray fan beam 124 includes a beam length 208 constituting a portion of the target length 202, a beam width 210 related to the target width 206, and a beam depth 212 representing a depth at which backscattered X-rays reflected by the object under test 116 can be detected by the backscattered X-ray detector 108 in response to the X-ray fan beam 124. In a further example, the beam length 208 represents pixel rows in the target area 128. The pixel rows range from 4 rows to 10 rows. In another further example, the beam width 210 represents pixel columns in the target area 128. The pixel columns range from 200 columns to 600 columns. In another further example, the beam depth 212 represents a depth within the target area 128 along a Z-axis 214 extending from the object under test 116 to the housing 102. The beam depth 212 ranges from 4 millimeters to 10 millimeters.

[0074] In yet another example of the method 1000, the aperture portion 122 and the detector array 302 are oriented and spaced to receive at least a portion of the backscattered X-rays reflected from the target area 128 of the object 116 under test in response to the projection of the X-ray fan beam 124 from the X-ray tube 106. In a further example of the method 1000, the detector array 302 includes a plurality of direct detectors 304 arranged in a plurality of rows and a plurality of columns. In this example, the detection 1008 of the backscattered X-rays includes detecting the backscattered X-rays passing through the aperture portion 122 at the plurality of direct detectors 304 of the detector array 302. In yet further examples, the plurality of rows of the direct detectors 304 range from about 200 rows to about 600 rows, about 300 rows to about 500 rows, about 350 rows to about 450 rows, or any other suitable row range. In another further example, the number of columns of the direct detector 304 ranges from about 200 columns to about 600 columns, about 300 columns to about 500 columns, about 350 columns to about 450 columns, or any other suitable range of columns.

[0075] In yet another example of the method 1000, the cooling fluid 110 is non-conductive. In a further example, the cooling fluid 110 includes a non-conductive cooling fluid, an organic cooling fluid, a mineral oil, or any other suitable cooling fluid in any suitable combination. In yet another example of the method 1000, cooling 1010 includes cooling 1102 the X-ray power supply 104, the X-ray tube 106, and the backscatter X-ray detector 108 using a thermoelectric cooler 130, the thermoelectric cooler 130 being fixed to an outer surface 132 of the housing 102 and being configured to transfer thermal energy from the cooling fluid 110 by dissipating the heat outside the housing 102 in response to receiving power from at least one of an external power source 134 and a battery 136. In a further example, cooling 1010 also includes cooling 1104 the X-ray power supply 104, the X-ray tube 106, and the backscatter X-ray detector 108 using a heat sink 138 fixed to the thermoelectric cooler 130 to dissipate heat from the thermoelectric cooler 130 to an ambient test environment.

[0076] Reference again Figure 1 , Fig.10 and Fig.12 In one or more examples, a method 1200 for detecting backscattered X-rays reflected by a target region 128 of an object 116 (see Fig.12 )include Fig.10 Method 1000. Method 1200 includes receiving 1202 a control signal at an internal controller component 140 via an antenna 144 and an internal wireless transceiver 142. At 1204, the X-ray power supply 104, the X-ray tube 106, and the backscatter X-ray detector 108 are controlled based at least in part on the control signal. Method 1200 continues from 1204 to Fig.10 of 1002.

[0077] Reference again Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 8A-B , Fig.10 and Fig.13 , a method 1300 for detecting backscattered X-rays reflected by a target region 128 of an object 116 (see Fig.13 )include Fig.10The method 1000 of FIG. 1008 continues to 1302 where backscattered X-ray data is received at the internal controller assembly 140 from the backscattered X-ray detector 108. The backscattered X-ray data represents backscattered X-rays detected by the detector array 302 of the backscattered X-ray detector 108. At 1304, the backscattered X-ray data is at least temporarily stored at the internal controller assembly 140. At 1306, the backscattered X-ray data is transmitted from the internal controller assembly 140 to the backscattered X-ray data repository 408 via the internal wireless transceiver 142, the antenna 144, the wireless network 406, and the communication network 410.

[0078] In another example, the method 1300 also includes transmitting 1308 position data to the backscattered X-ray data repository 408. The position data is associated with the backscattered X-ray data and indicates a predetermined height 504 and a predetermined longitudinal position 506 of the housing 102 when the backscattered X-rays are detected. In a further example, a first portion of the position data indicating the predetermined height 504 is based on a first position sensor 610 that detects movement of a movable base 502 supporting the housing 102, the movement detected by the first position sensor 610 being along a Z-axis 214 extending from the movable base 502 to the object under test 116. In this example, a second portion of the position data indicating the predetermined longitudinal position 506 is based on a second position sensor 806 that detects movement of the movable base 502 along the longitudinal axis 204 of the target area 128. In another further example, the housing 102 is supported by a movable base 502 including a robotic arm 902 having an end effector 904 and a robotic control system 906 such that position data is transmitted from the robotic control system 906 to the backscatter X-ray data repository 408 .

[0079] Reference again Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-B , Fig.10 , Fig.13 and Fig.14 , a method 1400 for detecting backscattered X-rays reflected by a target area 128 of an object 116 (see Fig.14 )include Fig.10 Method 1000 and Fig.13In method 1400, movable base 502 includes base member 602, height tracker 604, actuator 606, external controller component 612, and first position sensor 610. Method 1400 continues from 1008 to 1402, where position data indicating predetermined height 504 is received from first position sensor 610 at external controller component 612. At 1404, position data indicating predetermined height 504 is at least temporarily stored at external controller component 612. Method 1400 continues from 1404 to Fig.13 1308. Method 1400 also from Fig.10 1008 continues to 1406. In this path of 1400, the movable base 502 includes a movable platform having a base member 602, a plurality of wheels 706, a drive motor 802, a drive train 804, an external controller component 612, and a second position sensor 806. At 1406, position data indicating the predetermined longitudinal position 506 is received from the second position sensor 806 at the external controller component 612. At 1408, the position data indicating the predetermined longitudinal position 506 is at least temporarily stored at the external controller component 612. Method 1400 continues from 1408 to Fig.13 of 1308.

[0080] Reference again Figure 1 , Figure 3A-3B , Figure 5A-Figure 5B , Figure 6A-6B , Fig.10 and Fig.15 , a method 1500 for detecting backscattered X-rays reflected by a target area 128 of an object 116 (see Fig.15 )include Fig.10The method 1000 of claim 1010 continues from 1010 to 1502, where the position of the housing 102 is adjusted so that the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 are disposed at a second predetermined height 608 above the object 116 and at a predetermined longitudinal position 506 relative to the target region 128 for nondestructive inspection of a lateral portion of a subsurface layer of the target region 128. At 1504, a second X-ray fan beam 124 is projected from the X-ray tube 106 toward the lateral portion of the subsurface layer at the predetermined longitudinal position 506. At 1506, in response to the projection of the second X-ray fan beam 124, a second backscatter X-ray reflected by the object 116 is detected at the backscatter X-ray detector 108. The detected second backscatter X-ray has passed through the aperture portion 122 to reach the detector array 302 of the backscatter X-ray detector 108. At 1508 , the X-ray power supply 104 , the X-ray tube 106 , and the backscatter X-ray detector 108 are cooled using a cooling fluid 110 disposed within the housing 102 during projection 1504 of the second X-ray fan beam 124 and detection 1506 of second backscatter X-rays.

[0081] Reference again Figure 1 , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Fig. 9 , Fig.10 , Fig.15 and Fig.16 , a method 1600 for detecting backscattered X-rays reflected by a target area 128 of an object 116 (see Fig.16 )include Fig.10 Method 1000 and Fig.15The method 1500 of FIG. 1506 continues to 1602 where first backscattered X-ray data and second backscattered X-ray data are received at the internal controller assembly 140 from the backscattered X-ray detector 108. The first backscattered X-ray data represent backscattered X-rays detected by the detector array 302 of the backscattered X-ray detector 108. The second backscattered X-ray data represent second backscattered X-rays detected by the detector array 302 of the backscattered X-ray detector 108. At 1604, the first backscattered X-ray data and the second backscattered X-ray data are at least temporarily stored at the internal controller assembly 140. At 1606, the first backscattered X-ray data and the second backscattered X-ray data are transmitted from the internal controller assembly 140 to the backscattered X-ray data repository 408 via the internal wireless transceiver 142, the antenna 144, the wireless network 406, and the communication network 410. At 1608, the first position data and the second position data are transmitted to the backscattered X-ray data repository 408. The first position data is associated with the first backscattered X-ray data and indicates a predetermined height 504 and a predetermined longitudinal position 506 of the housing 102 when the backscattered X-rays are detected. The second position data is associated with the second backscattered X-ray data and indicates a second predetermined height 608 and a predetermined longitudinal position 506 of the housing 102 when the second backscattered X-rays are detected.

[0082] In another example of method 1600, the backscattered X-ray data repository 408 can be accessed by the three-dimensional reconstruction computer system 912 for reconstructing a three-dimensional representation of at least a portion of the target area 128 of the object under test 116 based on the first backscattered X-ray data, the first position data, the second backscattered X-ray data, and the second position data.

[0083] Reference again Figure 1 , Fig.10 and Fig.15 In another example of the method 1500, the adjusting of the position 1502, the projecting 1504 of the second X-ray fan beam 124, the detecting 1506 of the second X-ray fan beam 124, and the cooling 1508 are repeated for additional predetermined heights associated with nondestructive inspection of additional subsurfaces of the target region 128. In a further example, the adjusting of the position 1502, the projecting 1504 of the second X-ray fan beam 124, the detecting 1506 of the second X-ray fan beam 124, and the cooling 1508 are repeated for additional predetermined longitudinal positions associated with nondestructive inspection of additional lateral portions of the surface, subsurface, and additional subsurfaces of the target region 128.

[0084] Reference again Figure 1 , Figure 3A-3B , Figure 5A-Figure 5B , Figure 7 , Fig.10 and Fig.17 , a method 1700 for detecting backscattered X-rays reflected by a target area 128 of an object 116 (see Fig.17 )include Fig.10 Method 1000 of the present invention. Method 1700 continues from 1010 to 1702, where the position of housing 102 is adjusted so that emitter portion 121 of X-ray tube 106 and aperture portion 122 of backscatter X-ray detector 108 are disposed at a predetermined height 504 above the object 116 and at a second predetermined longitudinal position 704 relative to target region 128 for nondestructive inspection of a second transverse portion of the surface layer of target region 128. At 1704, second X-ray fan beam 124 is projected from X-ray tube 106 toward the second transverse portion of the surface layer at the second predetermined longitudinal position 704. At 1706, in response to the projection of second X-ray fan beam 124, second backscatter X-rays reflected by the object 116 are detected at backscatter X-ray detector 108. The detected second backscatter X-rays have passed through aperture portion 122 to detector array 302 of backscatter X-ray detector 108. At 1708 , the X-ray power supply 104 , the X-ray tube 106 , and the backscatter X-ray detector 108 are cooled using a cooling fluid 110 disposed within the housing 102 during projection 1704 of the second X-ray fan beam 124 and detection 1706 of second backscatter X-rays.

[0085] Reference again Figure 1 , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 7 , Fig. 9 , Fig.10 , Fig.17 and Fig.18 , a method 1800 for detecting backscattered X-rays reflected by a target area 128 of an object 116 (see Fig.18 )include Fig.10 Method 1000 and Fig.17The method 1800 continues from 1706 to 1802, where first backscattered X-ray data and second backscattered X-ray data are received from the backscattered X-ray detector 108 at the internal controller assembly 140. The first backscattered X-ray data represent backscattered X-rays detected by the detector array 302 of the backscattered X-ray detector 108. The second backscattered X-ray data represent second backscattered X-rays detected by the detector array 302 of the backscattered X-ray detector 108. At 1804, the first backscattered X-ray data and the second backscattered X-ray data are at least temporarily stored at the internal controller assembly 140. At 1806, the first backscattered X-ray data and the second backscattered X-ray data are transmitted from the internal controller assembly 140 to the backscattered X-ray data repository 408 via the internal wireless transceiver 142, the antenna 144, the wireless network 406, and the communication network 410. At 1808, the first position data and the second position data are transmitted to the backscattered X-ray data repository 408. The first position data is associated with the first backscattered X-ray data and indicates a predetermined height 504 and a predetermined longitudinal position 506 of the housing 102 when the backscattered X-rays were detected. The second position data is associated with the second backscattered X-ray data and indicates a predetermined height 504 and a second predetermined longitudinal position 704 of the housing 102 when the second backscattered X-rays were detected. In a further example, the backscattered X-ray data repository 408 is accessible by the three-dimensional reconstruction computer system 912 for reconstructing a three-dimensional representation of at least a portion of the target region 128 of the measured article 116 based on the first backscattered X-ray data, the first position data, the second backscattered X-ray data, and the second position data.

[0086] Reference again Figure 1 , Fig.10 and Fig.17 In another example of the method 1700, the adjusting 1702 of the position, the projecting 1704 of the second X-ray fan beam 124, the detecting 1706 of the second X-ray fan beam 124, and the cooling 1708 are repeated for additional predetermined longitudinal positions associated with nondestructive inspection of additional lateral portions of the surface of the target area 128. In a further example, the adjusting 1702 of the position, the projecting 1704 of the second X-ray fan beam 124, the detecting 1706 of the second X-ray fan beam 124, and the cooling 1708 are repeated for additional predetermined heights and additional predetermined longitudinal positions of the subsurface associated with nondestructive inspection of the subsurface of the target area 128.

[0087] Overall reference Figure 1 , Figure 2A-2B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-B and Fig. 9 As an example, the present disclosure relates to an integrated backscatter X-ray assembly 100 for detecting backscatter X-rays reflected by a target area 128 of an object 116 under inspection. Figure 1 is a functional block diagram of an example of an integrated backscatter X-ray assembly 100 . Figure 2A and Figure 2B A top view and a side view of an example of a target area 128 are provided, with Figure 1 An example of an X-ray fan beam 124 projected by the integrated backscatter X-ray assembly 100 .

[0088] Figure 4 yes Figure 1 A functional block diagram of the integrated backscatter X-ray assembly 100 illustrating an example of an internal controller assembly 140 and providing an external communication path from the internal controller assembly 140 to an example of a computing device 402 and an example of a backscatter X-ray data repository 408 . Figure 5A Provided by way of example, the movable base 502 is positioned at a predetermined height from the target area 128 Figure 1 Front view of integrated backscatter X-ray assembly 100 . Figure 5B supply Figure 1 A side view of the integrated backscatter X-ray assembly 100 at a predetermined longitudinal position relative to the longitudinal axis 204 of the target region 128 . Fig. 6A supply Figure 1 A front view of another example of an integrated backscatter X-ray assembly 100 provides a functional block diagram of an example of an external controller assembly 612 for height position control of the integrated backscatter X-ray assembly 100 using a base member 602, a height tracker 604, and an actuator 606, and provides an external communication path for the external controller assembly 612. Figure 6B supply Fig. 6A A side view of the integrated backscatter X-ray assembly 100 positioned at a predetermined longitudinal position relative to the longitudinal axis 204 of the target region 128 .

[0089] Figure 7 The example of a mobile platform 702 is supported by a track system for translation along the longitudinal axis 204 of the target area 128 of the object 116 to be inspected. Figure 1 A functional block diagram of yet another example of an integrated backscatter X-ray assembly 100 . Fig. 8A supply Figure 7A front view of the integrated backscatter X-ray assembly 100 providing a functional block diagram of an example of an external controller assembly 612 for position control of the integrated backscatter X-ray assembly 100 using a drive motor 802, a transmission system 804, and a mobile platform 702, and providing an external communication path from the external controller assembly 612. Figure 8B supply Figure 7 A side view of the integrated backscatter X-ray assembly 100 positioned at a predetermined longitudinal position relative to the longitudinal axis 204 of the target region 128 . Fig. 9 yes Figure 1 A functional block diagram of another example of an integrated backscatter X-ray assembly 100, wherein another example of a movable base 502 includes an example of a robotic arm 902 and an example of a robotic control system 906, showing external communication paths from the robotic control system 906 to a local computing device 908, a remote computing device 910, and a backscatter X-ray data repository 408.

[0090] Reference again Figure 1 , Figure 2A-2B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-B and Fig. 9In one or more examples, an integrated backscatter X-ray assembly 100 for detecting backscatter X-rays reflected by a target area 128 of an object under test 116 includes a housing 102, an X-ray power supply 104, a backscatter X-ray detector 108, a cooling fluid 110, a movable base 502, and a mobile platform 702. The X-ray power supply 104 is disposed in the housing 102. The X-ray tube 106 is disposed in the housing 102 and is operably coupled to the X-ray power supply 104. The backscatter X-ray detector 108 is disposed in the housing 102. The cooling fluid 110 is disposed in the housing 102 such that the X-ray power supply 104, the X-ray tube 106, and the backscatter X-ray detector 108 are immersed in the cooling fluid 110. The movable base 502 supports the housing 102 and is configured to position the housing 102 relative to the target area 128 of the object under test 116. The target region 128 includes a target length 202 along the longitudinal axis 204 and a target width 206 transverse to the longitudinal axis 204. The movable base 502 is configured to position the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 to a predetermined height 504 above the object 116 under test and a predetermined longitudinal position 506 relative to the target region 128 for nondestructive inspection of a transverse portion of a surface layer of the target region 128. The movable platform 702 supports the movable base 502 and is configured to change a longitudinal position of the housing 102 relative to the object 116 under test along the longitudinal axis 204 to position the emitter portion 121 of the X-ray tube 106 and the aperture portion 122 of the backscatter X-ray detector 108 to a second predetermined longitudinal position 704 for nondestructive inspection of a second transverse portion of a surface layer of the target region 128.

[0091] In another example of an integrated backscatter X-ray assembly 100, the X-ray tube 106 and the backscatter X-ray detector 108 are oriented within the housing 102 so that an X-ray fan beam 124 generated by the X-ray power supply 104 and the X-ray tube 106 and a field of view 126 of the backscatter X-ray detector 108 intersect at a target area 128 of the object 116 under test.

[0092] In yet another example, the integrated backscatter X-ray assembly 100 further includes an internal controller assembly 140, an internal wireless transceiver 142, and an antenna 144. The internal controller assembly 140 is disposed within the housing 102 and is in operable communication with the X-ray power supply 104, the X-ray tube 106, and the backscatter X-ray detector 108 in response to receiving power from at least one of the external power supply 134 and the battery 136. The internal wireless transceiver 142 is disposed within the housing 102 and is in operable communication with the internal controller assembly 140. The antenna 144 is fixed to the outer surface 132 of the housing 102 and is in operable communication with the internal wireless transceiver 142. The internal controller assembly 140, the internal wireless transceiver 142, and the antenna 144 are configured to transmit the backscatter X-ray data and the position data to a backscatter X-ray data repository 408 accessible via the wireless network 406 and the communication network 410. In a further example, the backscattered X-ray data repository 408 may be accessed by the 3D reconstruction computer system 912 for reconstructing a 3D representation of at least a portion of the target region 128 of the object 116 under inspection based on the backscattered X-ray data and the position data.

[0093] In yet another example of the integrated backscatter x-ray assembly 100, the movable base 502 includes a base member 602, a height tracker 604, an actuator 606, a position sensor 610, an external controller assembly 612, an external wireless transceiver 614, and an antenna 144. The base member 602 supports the housing 102. The height tracker 604 is movably coupled to the base member 602 and defines a Z axis 214 extending from the movable base 502 to the object under test 116. The actuator 606 is attached to the height tracker 604 and the base member 602. The actuator 606 is configured to change the height of the housing 102 relative to the object under test 116 so that the emitter portion 121 of the x-ray tube 106 and the aperture portion 122 of the backscatter x-ray detector 108 are moved along the Z axis 214 to a second predetermined height 608 closer to the object under test 116 for non-destructive inspection of a sub-surface layer of the target area 128. The position sensor 610 is configured to detect movement of at least one of the actuator 606, the movable base 502, and the housing 102. The external controller assembly 612 is in operative communication with the actuator 606 and the position sensor 610 to control movement of the housing 102 along the Z axis 214. The external wireless transceiver 614 is in operative communication with the external controller assembly 612. The antenna 144 is fixed to the housing 102 and is in operative communication with the external wireless transceiver 614.

[0094] In yet another example of the integrated backscatter X-ray assembly 100, the mobile platform 702 includes a base member 602, a plurality of wheels 706, a drive motor 802, a transmission system 804, a position sensor 806, an external controller assembly 612, an external wireless transceiver 614, and an antenna 144. The base member 602 supports the housing 102. The plurality of wheels 706 are rotatably attached to the base member 602. The drive motor 802 is configured to selectively provide power for the movement of the mobile platform 702. The transmission system 804 couples the drive motor 802 to one or more wheels 706 of the plurality of wheels 706 to move the mobile platform 702 in response to the operation of the drive motor 802. The position sensor 806 is configured to detect the movement of at least one of the drive motor 802, the transmission system 804, and the one or more wheels 706. The external controller assembly 612 is in operative communication with the drive motor 802 and the position sensor 806 to control the movement of the mobile platform 702 along the longitudinal axis 204. The external wireless transceiver 614 is in operable communication with the external controller assembly 612. The antenna 144 is secured to the housing 102 and is in operable communication with the external wireless transceiver 614.

[0095] Examples of the integrated backscatter X-ray assembly 100 and methods 1000, 1200, 1300, 1400, 1500, 1600, 1700, 1800 may be related to or used in the context of aircraft manufacturing. Although an aircraft example is described, the examples and principles disclosed herein may be applied to other products in the aerospace industry and other industries, such as the automotive industry, the aerospace industry, the construction industry, and other design and manufacturing industries. Thus, in addition to aircraft, the examples and principles disclosed herein may be applied to detecting backscatter X-rays reflected by target areas of aircraft and / or components thereof, as well as other equipment in the construction of various types of vehicles and various types of buildings.

[0096] The above specific embodiments refer to the accompanying drawings, which illustrate the specific examples described in the present disclosure. Other examples with different structures and operations do not depart from the scope of the present disclosure. In different drawings, the same reference numerals may refer to the same features, elements or parts. Throughout the present disclosure, any one of a plurality of projects may be referred to as a project individually, and a plurality of projects may be collectively referred to as projects and may be referred to with the same reference numerals. In addition, as used herein, features, elements, parts or steps starting with the words "a (a)" or "an (an)" should be understood as not excluding a plurality of features, elements, parts or steps, unless such exclusion is explicitly described.

[0097] The above provides illustrative, non-exhaustive examples according to the subject matter of the present disclosure, which examples may be, but not necessarily are claimed. Reference to "example" herein means that one or more features, structures, elements, parts, characteristics and / or operating steps described in conjunction with the example are included in at least one aspect, embodiment and / or implementation of the subject matter of the present disclosure. Therefore, the phrases "an example", "another example", "one or more examples" and similar terms throughout the present disclosure may, but do not necessarily refer to the same example. In addition, the subject matter representing any one example may, but does not necessarily include the subject matter representing any other example. In addition, the subject matter representing any one example may, but does not necessarily combine with the subject matter representing any other example.

[0098] As used herein, a system, device, apparatus, structure, article, element, component, or hardware that is "configured to" perform a specified function is indeed capable of performing the specified function without any changes, rather than having only the potential to perform the specified function after further modification. In other words, a system, device, apparatus, structure, article, element, component, or hardware that is "configured to" perform a specified function is specifically selected, created, implemented, utilized, programmed, and / or designed for the purpose of performing the specified function. As used herein, "configured to" represents an existing characteristic of a system, device, structure, article, element, component, or hardware that enables the system, device, structure, article, element, component, or hardware to perform the specified function without further modification. For the purposes of this disclosure, a system, device, apparatus, structure, article, element, component, or hardware that is described as "configured to" perform a specific function may be additionally or alternatively described as "suitable for" and / or "operable to" perform the function.

[0099] Unless otherwise indicated, the terms "first", "second", "third", etc. are used herein merely as labels and are not intended to impose order, positioning, or hierarchy requirements on the items to which these terms refer. In addition, reference to, for example, a "second" item does not require or exclude the presence of, for example, a "first" or lower numbered item and / or, for example, a "third" or higher numbered item.

[0100] As used herein, when used with a list of items, the phrase "at least one of..." means that different combinations of one or more of the listed items may be used, and only one of each item in the list may be required. For example, "at least one of item A, item B, and item C" may include, but is not limited to, item A or item A and item B. This example may also include item A, item B, and item C or item B and item C. In other examples, "at least one of..." may be, for example, but not limited to, two of item A, one of item B, and ten of item C; four of item B and seven of item C; and other suitable combinations. As used herein, the term "and / or" and the " / " symbol include any and all combinations of one or more of the associated listed items.

[0101] As used herein, the terms "coupled," "coupling," and similar terms refer to two or more elements that are linked, linked, fastened, attached, connected, communicated, or otherwise associated (e.g., mechanically, electrically, fluidically, optically, electromagnetically) with one another. In various examples, these elements may be associated directly or indirectly. As an example, element A may be directly associated with element B. As another example, element A may be indirectly associated with element B, such as via another element C. It will be understood that not all associations between the various disclosed elements are necessarily represented. Therefore, couplings may also exist in addition to those shown in the figures.

[0102] As used herein, the term "approximately" refers to or indicates conditions that are close to, but not exactly, the stated conditions, which still perform the desired function or achieve the desired result. As an example, the term "approximately" refers to conditions that are within an acceptable predetermined tolerance or accuracy, such as conditions within 10% of the stated conditions. However, the term "approximately" does not exclude conditions that are exactly the stated conditions. As used herein, the term "substantially" refers to conditions that are essentially the stated conditions that perform the desired function or achieve the desired result.

[0103] In the above mentioned Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-B and Fig. 9 , may represent functional elements, features or components, and does not necessarily imply any specific structure. Therefore, modifications, additions and / or omissions may be made to the structures shown. In addition, those skilled in the art will appreciate that not all of the above mentioned Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B, Figure 6A-6B , Figure 7 , Figure 8A-B and Fig. 9 The elements, features, and / or components described and illustrated in the present disclosure need not be included in every example, and not all elements, features, and / or components described herein need to be depicted in every illustrative example. Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-8B and Fig. 9 Some of the elements, features and / or components described and shown in the drawings may be combined in various ways without necessarily including Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-8B and Fig. 9 , other figures and / or the accompanying disclosure, even if such a combination is not explicitly stated herein. Similarly, additional features not limited to the examples presented may be combined with some or all of the features shown and described herein. Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-8B and Fig. 9 The schematic illustration of the examples shown in is not intended to imply structural limitations to the illustrative examples. Specifically, although an illustrative structure is indicated, it should be understood that the structure may be modified when appropriate. Therefore, modifications, additions and / or omissions may be made to the illustrated structure. In addition, Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-8B and Fig. 9 In each of the , elements, features and / or components that achieve similar or at least substantially similar purposes are labeled with like numerals, and such elements, features and / or components may not be referred to herein. Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-8B and Fig. 9 Each of these is discussed in detail. Similarly, Figure 1 , Figure 2A-2B , Figure 3A-3B , Figure 4 , Figure 5A-Figure 5B , Figure 6A-6B , Figure 7 , Figure 8A-8B and Fig. 9 Not all elements, features, and / or components may be labeled in each of the embodiments, but for consistency, the figure numerals associated therewith may be used herein.

[0104] In the above mentioned Figure 10-Figure 18 In the embodiment, the boxes may represent operations, steps and / or parts thereof, and the lines connecting the boxes do not imply any particular order or dependence of the operations or parts thereof. It will be understood that not all of the dependencies between the various disclosed operations must be indicated. Figure 10-Figure 18 And the accompanying disclosure describing the operation of the disclosed method set forth herein should not be interpreted as necessarily determining the order in which the operation is to be performed. Specifically, although an illustrative order is indicated, it should be understood that the order of the operations can be modified when appropriate. Therefore, the operations shown can be modified, added and / or omitted, and some operations can be performed in different orders or performed simultaneously. In addition, those skilled in the art will appreciate that not all described operations need to be performed.

[0105] In addition, references throughout this specification to features, advantages, or similar terms used herein do not imply that all features and advantages that can be realized with the examples disclosed herein should be or are present in any single example. Rather, terms referring to features and advantages are understood to mean that a specific feature, advantage, or characteristic described in conjunction with an example is included in at least one example. Therefore, discussions of features, advantages, and similar terms used throughout this disclosure may, but do not necessarily, refer to the same example.

[0106] Examples of the subject matter disclosed herein can be found at Fig.19 Aircraft manufacturing and service method 1900 is shown and Fig. 201900 is described in the context of the aircraft 2000 shown. In one or more examples, the disclosed components and methods for non-destructive inspection of an article under test can be used in aircraft manufacturing. During pre-production, the service method 1900 may include the specification and design of the aircraft 2000 (box 1902) and material procurement (box 1904). During production, component and subassembly manufacturing (box 1906) and system integration (box 1908) of the aircraft 2000 may be performed. Thereafter, the aircraft 2000 may be certified and delivered (box 1910) to be put into service (box 1912). While in service, the aircraft 2000 may be scheduled for routine maintenance and servicing (box 1914). Routine maintenance and servicing may include modification, reconfiguration, refurbishment, etc. of one or more systems of the aircraft 2000.

[0107] Each process of service method 1900 may be performed or implemented by a system integrator, a third party, and / or an operator (e.g., a customer). For the purposes of this specification, a system integrator may include, but is not limited to, any number of aircraft manufacturers and main system subcontractors; a third party may include, but is not limited to, any number of dealers, subcontractors, and suppliers; and an operator may be an airline, a leasing company, a military entity, a service organization, and the like.

[0108] like Fig. 20 As shown, an aircraft 2000 produced by service method 1900 may include a fuselage 2002 having a plurality of high-level systems 2004 and an interior 2006. Examples of high-level systems 2004 include one or more of a propulsion system 2008, an electrical system 2010, a hydraulic system 2012, and an environmental system 214. Any number of other systems may be included. Although an example of aerospace is shown, the principles disclosed herein may be applicable to other industries, such as the automotive industry. Therefore, in addition to aircraft 2000, the principles disclosed herein may be applicable to other vehicles, such as land vehicles, sea vehicles, space vehicles, etc.

[0109] During any one or more stages of the manufacturing and service method 1900, the disclosed methods and systems for associating test data of a part under test with a final project coordinate system may be employed. For example, components or subassemblies corresponding to component and subassembly manufacturing (block 1906) may be fabricated or manufactured in a manner similar to components or subassemblies produced when the aircraft 2000 is placed in service (block 1912). In addition, one or more examples of the system(s), method(s), or combination thereof may also be utilized during the production stage (blocks 1906 and 1908), for example, resulting in significantly faster assembly or reduced cost of the aircraft 2000. Similarly, for example and without limitation, one or more examples of the system or method implementation or combination thereof may be utilized when the aircraft 2000 is placed in service (block 1912) and / or during maintenance and service (block 1914).

[0110] The features, advantages, and characteristics of one example described may be combined in any suitable manner in one or more other examples. Those skilled in the relevant art will recognize that the examples described herein may be practiced without the presence of one or more of the specific features or advantages of a particular example. In other cases, additional features and advantages that may not be present in all examples may be recognized in certain examples. In addition, although various examples of the integrated backscatter X-ray assembly 100 and methods 1000, 1200, 1300, 1400, 1500, 1600, 1700, 1800 have been shown and described, modifications may occur to those skilled in the art after reading the specification. The present application includes these modifications and is limited only by the scope of the claims.

[0111] In addition, the present application also includes the following embodiments:

[0112] Embodiment 1. An integrated backscattered X-ray assembly (100) for detecting backscattered X-rays reflected by a target area (128) of an object (116) under test, comprising:

[0113] Housing (102);

[0114] An X-ray power source (104) disposed in the housing (102);

[0115] an X-ray tube (106) disposed within the housing (102) and operably coupled to the X-ray power supply (104);

[0116] a backscattered X-ray detector (108) disposed within the housing (102); and

[0117] A cooling fluid (110) is disposed within the housing (102) such that the X-ray power supply (104), the X-ray tube (106) and the backscattered X-ray detector (108) are immersed in the cooling fluid (110).

[0118] Embodiment 2. An integrated backscatter X-ray assembly according to embodiment 1, wherein the housing (102) includes a Faraday cage (112) to protect the backscatter X-ray detector (108) from electromagnetic fields emitted by the X-ray power supply (104) and the X-ray tube (106).

[0119] Embodiment 3. An integrated backscatter X-ray assembly according to embodiment 1, wherein the housing (102) includes: a side wall (114) configured to face the object to be measured (116), the side wall (114) including a first section (118) and a second section (120) forming a chamfer (123) configured to face the object to be measured (116); an emitter portion (121) of the X-ray tube (106) disposed near the first section (118); and a hole portion (122) of the backscatter X-ray detector (108) disposed near the second section (120).

[0120] Embodiment 4. An integrated backscatter X-ray component according to embodiment 3, wherein the chamfer (123) includes an angle ranging from at least one of about 50 degrees to about 150 degrees, about 60 degrees to about 120 degrees, about 70 degrees to about 100 degrees, and about 80 degrees to about 90 degrees.

[0121] Embodiment 5. An integrated backscatter X-ray assembly according to embodiment 1, wherein the X-ray tube (106) and the backscatter X-ray detector (108) are oriented within the housing (102) so that an X-ray fan beam (124) generated by the X-ray power supply (104) and the X-ray tube (106) intersects with a field of view (126) of the backscatter X-ray detector (108) at the target area (128) of the object to be measured (116).

[0122] Embodiment 6. An integrated backscatter X-ray assembly according to embodiment 5, wherein the X-ray tube (106) is oriented at an angle relative to the target area (128) of the object under test (116), and the angle ranges from at least one of about 15 degrees to about 65 degrees, about 30 degrees to about 60 degrees, about 40 degrees to about 55 degrees, and about 45 degrees to about 50 degrees.

[0123] Embodiment 7. An integrated backscatter X-ray assembly according to embodiment 5, wherein the backscatter X-ray detector (108) is oriented at an angle relative to the target area (128) of the object under test (116), and the angle ranges from at least one of about -15 degrees to about -65 degrees, about -30 degrees to about -60 degrees, about -40 degrees to about -55 degrees, and about -45 degrees to about -50 degrees.

[0124] Embodiment 8. An integrated backscatter X-ray assembly according to embodiment 1, wherein the X-ray power supply (104) and the X-ray tube (106) are configured to generate an X-ray fan beam (124) for non-destructive inspection of the object under test (116).

[0125] Embodiment 9. An integrated backscatter X-ray assembly according to embodiment 8, wherein the X-ray tube (106) is configured to project the X-ray fan beam (124) onto the target area (128) of the object (116) under test.

[0126] Embodiment 10. An integrated backscatter X-ray assembly according to Embodiment 9, wherein the target region (128) includes a target length (202) along a longitudinal axis (204) and a target width (206) transverse to the longitudinal axis (204).

[0127] Embodiment 11. An integrated backscatter X-ray assembly according to embodiment 10, wherein the X-ray fan beam (124) includes: a beam length (208) constituting a portion of the target length (202); a beam width (210) related to the target width (206); and a beam depth (212) representing the depth at which backscatter X-rays reflected by the object under test (116) in response to the X-ray fan beam (124) can be detected by the backscatter X-ray detector (108).

[0128] Embodiment 12. An integrated backscatter X-ray assembly according to embodiment 11, wherein the beam length (208) represents pixel rows in the target area (128), and the pixel rows range from 4 rows to 10 rows.

[0129] Embodiment 13. The integrated backscatter X-ray assembly of embodiment 11, wherein the beam width (210) represents pixel columns in the target area (128), the pixel columns ranging from 200 columns to 600 columns.

[0130] Embodiment 14. An integrated backscatter X-ray assembly according to embodiment 11, wherein the beam depth (212) represents the depth within the target area (128) along a Z-axis line (214) extending from the object under test (116) to the housing (102), and the beam depth (212) ranges from 4 mm to 10 mm.

[0131] Embodiment 15. An integrated backscatter X-ray assembly according to embodiment 1, wherein the backscatter X-ray detector (108) is configured to detect at least a portion of the backscatter X-rays reflected from the target area (128) of the object under test (116) in response to an X-ray fan beam (124) generated by the X-ray power supply (104) and the X-ray tube (106).

[0132] Embodiment 16. According to the integrated backscatter X-ray assembly of embodiment 1, the backscatter X-ray detector (108) comprises:

[0133] an aperture portion (122) configured to pass at least a portion of backscattered X-rays reflected from the target area (128) of the object (116) in response to an X-ray fan beam (124) generated by the X-ray power supply (104) and the X-ray tube (106); and

[0134] A detector array (302) is configured to detect a portion of the backscattered light that passes through the aperture portion (122).

[0135] Embodiment 17. An integrated backscatter X-ray assembly according to embodiment 16, wherein the aperture portion (122) and the detector array (302) are oriented and spaced to receive the portion of the backscattered X-rays reflected from the target area (128) of the object under test (116) in response to the X-ray fan beam (124) generated by the X-ray power supply (104) and the X-ray tube (106).

[0136] Embodiment 18. The integrated backscatter X-ray assembly of Embodiment 17, wherein the detector array (302) comprises a plurality of direct detectors (304) arranged in a plurality of rows and a plurality of columns.

[0137] Embodiment 19. An integrated backscatter X-ray assembly according to embodiment 18, wherein the direct detector (304) includes at least one of a photon counting detector (306), a hybrid pixel detector, a monolithic active pixel sensor, and a pn-type charge coupled device.

[0138] Embodiment 20. An integrated backscatter X-ray assembly according to embodiment 18, wherein the multiple rows of the direct detector (304) range from at least one of about 200 rows to about 600 rows, about 300 rows to about 500 rows, and about 350 rows to about 450 rows.

[0139] Embodiment 21. An integrated backscatter X-ray assembly according to embodiment 18, wherein the multiple columns of the direct detector (304) range from at least one of about 200 columns to about 600 columns, about 300 columns to about 500 columns, and about 350 columns to about 450 columns.

[0140] Embodiment 22. The integrated backscatter X-ray assembly of Embodiment 1, wherein the cooling fluid (110) is non-conductive.

[0141] Embodiment 23. An integrated backscatter X-ray assembly according to Embodiment 22, wherein the cooling fluid (110) comprises at least one of a non-conductive cooling fluid, an organic cooling fluid, and a mineral oil.

[0142] Embodiment 24. The integrated backscatter X-ray assembly of embodiment 1, further comprising:

[0143] A thermoelectric cooler (130) is secured to an outer surface (132) of the housing (102) and is configured to transfer thermal energy from the cooling fluid (110) by dissipating heat outside the housing (102) in response to receiving power from at least one of an external power source (134) and a battery (136).

[0144] Embodiment 25. The integrated backscatter X-ray assembly of embodiment 24, further comprising:

[0145] A heat sink (138) is secured to the thermoelectric cooler (130) and is configured to dissipate heat from the thermoelectric cooler (130) to an ambient test environment.

[0146] Embodiment 26. The integrated backscatter X-ray assembly of embodiment 1, further comprising:

[0147] an internal controller assembly (140) disposed within the housing (102) and in operable communication with the X-ray power supply (104), the X-ray tube (106), and the backscatter X-ray detector (108) in response to receiving power from at least one of an external power supply (134) and a battery (136);

[0148] an internal wireless transceiver (142) disposed within the housing (102) and in operable communication with the internal controller assembly (140); and

[0149] An antenna (144) is secured to an exterior surface (132) of the housing (102) and is in operable communication with the internal wireless transceiver (142).

[0150] Embodiment 27. An integrated backscatter X-ray assembly according to embodiment 26, wherein the internal controller assembly (140), the internal wireless transceiver (142) and the antenna (144) are configured to receive control signals from at least one of a computing device (402) and a mobile device (404) via a wireless network (406).

[0151] Embodiment 28. The integrated backscatter X-ray assembly of embodiment 27, wherein the wireless network (406) comprises at least one of a wireless fidelity network, a wireless local area network, a wireless personal area network, a metropolitan area network, and a cellular network.

[0152] Embodiment 29. An integrated backscatter X-ray assembly according to embodiment 26, wherein the internal controller assembly (140), the internal wireless transceiver (142) and the antenna (144) are configured to transmit backscatter X-ray data to a backscatter X-ray data repository (408) that can be accessed via a wireless network (406) and a communication network (410).

[0153] Embodiment 30. The integrated backscatter X-ray assembly of embodiment 1, wherein the target region (128) comprises a target length (202) along a longitudinal axis (204) and a target width (206) transverse to the longitudinal axis (204), the integrated backscatter X-ray assembly (100) further comprising:

[0154] a movable base (502) supporting the housing (102) and configured to position the housing (102) relative to the target area (128) of the object (116),

[0155] wherein the X-ray tube (106) and the backscatter X-ray detector (108) are oriented within the housing (102) such that an X-ray fan beam (124) generated by the X-ray power supply (104) and the X-ray tube (106) intersects a field of view (126) of the backscatter X-ray detector (108) at the target area (128) of the object (116) being inspected,

[0156] The movable base (502) is configured to position the emitter portion (121) of the X-ray tube (106) and the hole portion (122) of the backscatter X-ray detector (108) to a predetermined height (504) above the object to be tested (116) and a predetermined longitudinal position (506) relative to the target area (128) for non-destructive inspection of a lateral portion of a surface layer of the target area (128).

[0157] Embodiment 31. According to the integrated backscatter X-ray assembly of embodiment 30, the movable base (502) comprises:

[0158] a base member (602) supporting the housing (102);

[0159] a height tracker (604) movably coupled to the base member (602) and defining a Z-axis line (214) extending from the movable base (502) toward the measured article (116);

[0160] an actuator (606) attached to the height tracker (604) and the base member (602), the actuator (606) being configured to change the height of the housing (102) relative to the object (116) to move the emitter portion (121) of the X-ray tube (106) and the aperture portion (122) of the backscatter X-ray detector (108) along the Z axis (214) to a second predetermined height (608) closer to the object (116) for non-destructive inspection of a sub-surface layer of the target area (128);

[0161] a position sensor (610) configured to detect movement of at least one of the actuator (606), the movable base (502), and the housing (102);

[0162] an external controller assembly (612) in operable communication with the actuator (606) and the position sensor (610) to control movement of the housing (102) along the Z-axis (214);

[0163] an external wireless transceiver (614) in operable communication with the external controller assembly (612); and

[0164] An antenna (144) is secured to the housing (102) and is in operable communication with the external wireless transceiver (614).

[0165] Embodiment 32. An integrated backscatter X-ray assembly according to embodiment 31, wherein the predetermined height (504) and the second predetermined height (608) are determined so that the surface layer of the target area (128) at least partially overlaps with the sub-surface layer.

[0166] Embodiment 33. An integrated backscatter X-ray assembly according to embodiment 32, wherein the overlap represents pixels in the target area (128) along the Z axis (214) relative to the object under test (116), and the pixels along the Z axis (214) range from 2 pixels to 5 pixels.

[0167] Embodiment 34. An integrated backscatter X-ray assembly according to embodiment 31, wherein the actuator (606) is configured to move the housing (102) closer to the object under test (116) to position the emitter portion (121) of the X-ray tube (106) and the hole portion (122) of the backscatter X-ray detector (108) to an additional predetermined height associated with non-destructive inspection of an additional sub-surface layer of the target area (128).

[0168] Embodiment 35. An integrated backscatter X-ray assembly according to embodiment 31, wherein the actuator (606) includes at least one of a linear actuator, a mechanical linear actuator, an electromechanical linear actuator, a piezoelectric linear actuator, a worm gear linear actuator and a screw-driven linear actuator.

[0169] Embodiment 36. An integrated backscatter X-ray component according to embodiment 31, wherein the external controller component (612), the external wireless transceiver (614) and the antenna (144) are configured to receive control signals from the internal controller component (140) and from at least one of the computing device (402) and the mobile device (404) via the wireless network (406) for controlling the actuator (606).

[0170] Embodiment 37. An integrated backscatter X-ray assembly according to embodiment 36, wherein the wireless network (406) includes at least one of a wireless fidelity network, a wireless local area network, a wireless personal area network, a metropolitan area network, and a cellular network.

[0171] Example 38. An integrated backscatter X-ray assembly according to Example 31, wherein the external controller assembly (612), the external wireless transceiver (614) and the antenna (144) are configured to transmit position data from the position sensor (610) to a backscatter X-ray data repository (408) in conjunction with control of the actuator (606), and the backscatter X-ray data repository (408) is accessible via a wireless network (406) and a communication network (410).

[0172] Embodiment 39. According to the integrated backscatter X-ray assembly of embodiment 30, the movable base (502) comprises:

[0173] A moving platform (702) is configured to change the longitudinal position of the housing (102) relative to the object under test (116) along the longitudinal axis (204) to position the emitter portion (121) of the X-ray tube (106) and the aperture portion (122) of the backscattered X-ray detector (108) to a second predetermined longitudinal position (704) for non-destructive inspection of a second lateral portion of the surface layer of the target area (128).

[0174] Embodiment 40. An integrated backscatter X-ray assembly according to embodiment 39, wherein the predetermined longitudinal position (506) and the second predetermined longitudinal position (704) are determined so that the lateral portion of the surface layer of the target area (128) at least partially overlaps with the second lateral portion of the surface layer.

[0175] Embodiment 41. An integrated backscatter X-ray assembly according to embodiment 40, wherein the overlap represents pixel rows in the target area (128) relative to the object under test (116) along the longitudinal axis (204), and the pixel rows range from 2 rows to 5 rows.

[0176] Embodiment 42. An integrated backscatter X-ray assembly according to embodiment 39, wherein the movable platform (702) is configured to move the housing (102) along the longitudinal axis (204) of the target area (128) of the object under test (116) to position the emitter portion (121) of the X-ray tube (106) and the hole portion (122) of the backscatter X-ray detector (108) to additional predetermined longitudinal positions associated with non-destructive inspection of additional lateral portions of the surface layer of the target area (128).

[0177] Embodiment 43. The integrated backscatter X-ray assembly according to embodiment 39, wherein the mobile platform (702) comprises:

[0178] a base member (602) supporting the housing (102);

[0179] a plurality of wheels (706) rotatably attached to the base member (602);

[0180] a drive motor (802) configured to selectively provide power for movement of the mobile platform (702);

[0181] a drive train (804) coupling the drive motor (802) to one or more wheels (706) of the plurality of wheels (706) to move the mobile platform (702) in response to operation of the drive motor (802);

[0182] a position sensor (806) configured to detect movement of at least one of the drive motor (802), the drive train (804), and the one or more wheels (706);

[0183] an external controller assembly (612) in operable communication with the drive motor (802) and the position sensor (806) to control movement of the mobile platform (702) along the longitudinal axis (204);

[0184] an external wireless transceiver (614) in operable communication with the external controller assembly (612); and

[0185] An antenna (144) is secured to the housing (102) and is in operable communication with the external wireless transceiver (614).

[0186] Embodiment 44. An integrated backscatter X-ray assembly according to Embodiment 43, wherein the drive motor (802) includes at least one of a DC motor, a precision motor, a stepper motor, a servo motor and a rotary actuator.

[0187] Example 45. An integrated backscatter X-ray assembly according to Example 43, wherein the drive system (804) includes a gearbox assembly, a belt drive assembly, a chain drive assembly, a gear coupled to the drive motor (802), a pulley coupled to the drive motor (802), a sprocket coupled to the drive motor (802), at least one of a gear driven shaft, a pulley driven shaft and a sprocket driven shaft.

[0188] Embodiment 46. An integrated backscatter X-ray assembly according to Embodiment 43, wherein the position sensor (806) includes at least one of a rotary position sensor, a rotary encoder, and a rotary precision potentiometer.

[0189] Example 47. An integrated backscatter X-ray component according to Example 43, wherein the external controller component (612), the external wireless transceiver (614) and the antenna (144) are configured to receive control signals from the internal controller component (140) and from at least one of the computing device (402) and the mobile device (404) via the wireless network (406) for controlling the drive motor (802).

[0190] Embodiment 48. An integrated backscatter X-ray assembly according to embodiment 47, wherein the wireless network (406) includes at least one of a wireless fidelity network, a wireless local area network, a wireless personal area network, a metropolitan area network, and a cellular network.

[0191] Embodiment 49. An integrated backscatter X-ray assembly according to embodiment 43, wherein the external controller assembly (612), the external wireless transceiver (614) and the antenna (144) are configured to transmit position data from the position sensor (806) to a backscatter X-ray data repository (408) accessible via a wireless network (406) and a communication network (410), the position data being related to the control of the drive motor (802).

[0192] Embodiment 50. The integrated backscatter X-ray assembly according to embodiment 30, wherein the movable base (502) comprises:

[0193] a robotic arm (902) having an end effector (904) supporting the housing (102); and

[0194] a robotic control system (906) in operable communication with the robotic arm (902),

[0195] wherein the robot control system (906) and the robot arm (902) are configured to change the height of the housing (102) relative to the object (116) to move the emitter portion (121) of the X-ray tube (106) and the aperture portion (122) of the backscatter X-ray detector (108) along the Z axis (214) to a second predetermined height (608) closer to the object (116) for non-destructive inspection of a sub-surface layer of the target area (128), and

[0196] The robotic control system (906) and the robotic arm (902) are configured to change the longitudinal position of the housing (102) relative to the object under test (116) along the longitudinal axis (204) to position the emitter portion (121) of the X-ray tube (106) and the hole portion (122) of the backscattered X-ray detector (108) to a second predetermined longitudinal position (704) for non-destructive inspection of a second lateral portion of the surface layer of the target area (126).

[0197] Embodiment 51. An integrated backscatter X-ray assembly according to embodiment 50, wherein the predetermined height (504) and the second predetermined height (608) are determined so that the surface layer of the target area (128) at least partially overlaps with the sub-surface layer.

[0198] Embodiment 52. An integrated backscatter X-ray assembly according to embodiment 51, wherein the overlap represents pixels in the target area (128) along the Z axis (214) relative to the object under test (116), and the pixels along the Z axis (214) range from 2 pixels to 5 pixels.

[0199] Embodiment 53. An integrated backscatter X-ray assembly according to embodiment 50, wherein the robotic control system (906) and the robotic arm (902) are configured to move the housing (102) closer to the object under test (116) to position the emitter portion (121) of the X-ray tube (106) and the hole portion (122) of the backscatter X-ray detector (108) to an additional predetermined height associated with non-destructive inspection of an additional sub-surface layer of the target area (128).

[0200] Embodiment 54. An integrated backscatter X-ray assembly according to embodiment 50, wherein the robotic control system (906) is configured to receive control signals from at least one of a local computing device (908) and a remote computing device (910) for controlling the robotic arm (902).

[0201] Example 55. An integrated backscatter X-ray assembly according to Example 50, wherein the robotic control system (906) is configured to transmit position data related to the predetermined height (504) and the predetermined longitudinal position (506) of the housing (102) to a backscatter X-ray data repository (408) in conjunction with control of the robotic arm (902).

[0202] Embodiment 56. An integrated backscatter X-ray component according to embodiment 50, wherein the predetermined longitudinal position (506) and the second predetermined longitudinal position (704) are determined so that the lateral portion of the surface layer of the target area (128) at least partially overlaps with the second lateral portion of the surface layer.

[0203] Embodiment 57. An integrated backscatter X-ray assembly according to embodiment 56, wherein the overlap represents pixel rows in the target area (128) relative to the object under test (116) along the longitudinal axis (204), and the pixel rows range from 2 rows to 5 rows.

[0204] Embodiment 58. An integrated backscatter X-ray assembly according to embodiment 50, wherein the robotic control system (906) is configured to move the housing (102) along the longitudinal axis (204) of the target area (128) of the object under test (116) to position the emitter portion (121) of the X-ray tube (106) and the hole portion (122) of the backscatter X-ray detector (108) to additional predetermined longitudinal positions associated with non-destructive inspection of additional lateral portions of the surface layer of the target area (116).

[0205] Embodiment 59. A method (1000) for detecting backscattered X-rays reflected by a target area (128) of an object (116) under test, comprising:

[0206] A housing (102) is positioned (1002) relative to a target region (128) of the object (116) being inspected, the housing (102) housing an X-ray power source (104), an X-ray tube (106) operably coupled to the X-ray power source (104), and a backscattered X-ray detector (108), the target region (128) comprising a target length (202) along a longitudinal axis (204) and a target width (206) transverse to the longitudinal axis (204). The housing (102) comprises: a side wall (114) facing the object (116) to be detected, the side wall (114) comprising a first section (118) and a second section (120) forming a chamfer (123) facing the object (116) to be detected; an emitter portion (121) of the X-ray tube (106) disposed near the first section (118); and a hole portion (122) of the backscattered X-ray detector (108) disposed near the second section (120);

[0207] adjusting (1004) the position of the housing (102) so that the emitter portion (121) of the X-ray tube (106) and the aperture portion (122) of the backscattered X-ray detector (108) are disposed at a predetermined height (504) above the object (116) to be tested and at a predetermined longitudinal position (506) relative to the target area (128) for non-destructive inspection of a transverse portion of a surface layer of the target area (128);

[0208] projecting (1006) a fan beam (124) of X-rays from the X-ray tube (106) toward the transverse portion of the surface at the predetermined longitudinal position (506);

[0209] In response to the projection of the X-ray fan beam (124), detecting (1008) backscattered X-rays reflected by the detected object (116) at the backscattered X-ray detector (108), the detected backscattered X-rays having passed through the aperture portion (122) to reach the detector array (302) of the backscattered X-ray detector (108); and

[0210] During the projection (1006) of the X-ray fan beam (124) and the detection (1008) of the backscattered X-rays, the X-ray power supply (104), the X-ray tube (106) and the backscattered X-ray detector (108) are cooled (1010) using a cooling fluid (110) disposed within the housing (102), the X-ray power supply (104), the X-ray tube (106) and the backscattered X-ray detector (108) being immersed in the cooling fluid (110).

[0211] Embodiment 60. A method according to embodiment 59, wherein the X-ray fan beam (124) includes: a beam length (208) constituting a portion of the target length (202); a beam width (210) related to the target width (206); and a beam depth (212) representing the depth at which backscattered X-rays reflected by the object under test (116) in response to the X-ray fan beam (124) can be detected by the backscattered X-ray detector (108).

[0212] Embodiment 61. The method of Embodiment 60, wherein the beam length (208) represents rows of pixels in the target area (128), the rows of pixels ranging from 4 rows to 10 rows.

[0213] Embodiment 62. The method of Embodiment 60, wherein the beam width (210) represents a number of pixel columns in the target area (128), the number of pixel columns ranging from 200 columns to 600 columns.

[0214] Embodiment 63. A method according to embodiment 60, wherein the beam depth (212) represents the depth within the target area (128) along a Z-axis line (214) extending from the object under test (116) to the housing (102), and the beam depth (212) ranges from 4 mm to 10 mm.

[0215] Embodiment 64. A method according to embodiment 59, wherein the aperture portion (122) and the detector array (302) are oriented and spaced to receive at least a portion of backscattered X-rays reflected from the target area (128) of the object under test (116) in response to the projection of the X-ray fan beam (124) from the X-ray tube (106).

[0216] Embodiment 65. The method of embodiment 64, wherein the detector array (302) comprises a plurality of direct detectors (304) arranged in a plurality of rows and a plurality of columns, and the detecting of the backscattered X-rays comprises:

[0217] The backscattered X-rays passing through the aperture portion (122) are detected at the plurality of direct detectors (304) of the detector array (302).

[0218] Embodiment 66. A method according to embodiment 65, wherein the plurality of rows of the direct detector (304) ranges from at least one of about 200 rows to about 600 rows, about 300 rows to about 500 rows, and about 350 rows to about 450 rows.

[0219] Embodiment 67. A method according to Embodiment 65, wherein the plurality of columns of the direct detector (304) ranges from at least one of about 200 columns to about 600 columns, about 300 columns to about 500 columns, and about 350 columns to about 450 columns.

[0220] Embodiment 68. The method of Embodiment 59, wherein the cooling fluid (110) is non-conductive.

[0221] Embodiment 69. The method of Embodiment 68, wherein the cooling fluid (110) comprises at least one of a non-conductive cooling fluid, an organic cooling fluid, and a mineral oil.

[0222] Embodiment 70. The method according to embodiment 59, wherein the cooling (1010) comprises:

[0223] The X-ray power supply (104), the X-ray tube (106), and the backscatter X-ray detector (108) are cooled (1102) using a thermoelectric cooler (130), the thermoelectric cooler being secured to an outer surface (132) of the housing (102) and being configured to transfer thermal energy from the cooling fluid (110) by dissipating heat outside the housing (102) in response to receiving power from at least one of an external power supply (134) and a battery (136).

[0224] Embodiment 71. The method according to embodiment 70, wherein the cooling (1010) further comprises:

[0225] The X-ray power supply (104), the X-ray tube (106), and the backscatter X-ray detector (108) are cooled (1104) using a heat sink (138) secured to the thermoelectric cooler (130) to dissipate heat from the thermoelectric cooler (130) to an ambient test environment.

[0226] Embodiment 72. The method (1200) of embodiment 59, further comprising:

[0227] receiving (1202) a control signal at an internal controller component (140) via an antenna (144) and an internal wireless transceiver (142); and

[0228] The X-ray power supply (104), the X-ray tube (106), and the backscatter X-ray detector (108) are controlled (1204) based at least in part on the control signal.

[0229] Embodiment 73. The method (1300) of embodiment 59, further comprising:

[0230] receiving (1302) at an internal controller assembly (140) backscattered X-ray data from the backscattered X-ray detector (108), the backscattered X-ray data representing the backscattered X-rays detected by the detector array (302) of the backscattered X-ray detector (108);

[0231] at least temporarily storing (1304) the backscattered X-ray data at the internal controller assembly (140); and

[0232] The backscattered X-ray data (1306) from the internal controller assembly (140) is transmitted (1306) to a backscattered X-ray data repository (408) via an internal wireless transceiver (142), an antenna (144), a wireless network (406), and a communication network (410).

[0233] Embodiment 74. The method according to embodiment 73, further comprising:

[0234] Position data is transmitted (1308) to the backscattered X-ray data repository (408), the position data being associated with the backscattered X-ray data and indicating the predetermined height (504) and the predetermined longitudinal position (506) of the housing (102) when the backscattered X-rays were detected.

[0235] Embodiment 75. A method according to embodiment 74, wherein a first portion of the position data indicating the predetermined height (504) is based on a first position sensor (610), the first position sensor (610) detecting movement of a movable base (502) supporting the housing (102), the movement detected by the first position sensor (610) being along a Z-axis line (214) extending from the movable base (502) toward the object under test (116), and

[0236] A second portion of the position data indicative of the predetermined longitudinal position (506) is based on a second position sensor (806) detecting movement of the movable base (502) along the longitudinal axis (204) of the target area (128).

[0237] Embodiment 76. The method (1400) of Embodiment 75, wherein the movable base (502) comprises a base member (602), a height tracker (604), an actuator (606), an external controller assembly (612), and a first position sensor (610), the method further comprising:

[0238] receiving (1402) at the external controller assembly (612) the position data indicative of the predetermined height (504) from the first position sensor (610); and

[0239] The position data indicative of the predetermined height (504) is at least temporarily stored (1404) at the external controller component (612).

[0240] Embodiment 77. The method of Embodiment 75, wherein the movable base (502) comprises a movable platform having a base member (602), a plurality of wheels (706), a drive motor (802), a drive train (804), an external controller assembly (612), and the second position sensor (806), the method further comprising:

[0241] receiving (1406) at the external controller component (612) the position data indicative of the predetermined longitudinal position (506) from the second position sensor (806); and

[0242] The position data indicative of the predetermined longitudinal position (506) is at least temporarily stored (1408) at the external controller component (612).

[0243] Embodiment 78. A method according to embodiment 74, wherein the housing (102) is supported by a movable base (502), and the movable base (502) includes a robotic arm (902) having an end effector (904) and a robotic control system (906), so that the position data is transmitted from the robotic control system (906) to the backscattered X-ray data repository (408).

[0244] Embodiment 79. The method (1500) of embodiment 59, further comprising:

[0245] adjusting (1502) the position of the housing (102) so that the emitter portion (121) of the X-ray tube (106) and the aperture portion (122) of the backscatter X-ray detector (108) are disposed at a second predetermined height (608) above the object (116) and a predetermined longitudinal position (506) relative to the target area (128) for non-destructive inspection of a lateral portion of a sub-surface layer of the target area (128);

[0246] projecting (1504) a second X-ray fan beam (124) from the X-ray tube (106) toward the transverse portion of the subsurface at the predetermined longitudinal position (506);

[0247] In response to the projection of the second X-ray fan beam (124), detecting (1506) second backscattered X-rays reflected by the object (116) at the backscattered X-ray detector (108), the detected second backscattered X-rays having passed through the aperture portion (122) to reach the detector array (302) of the backscattered X-ray detector (108); and

[0248] During the projection (1504) of the second X-ray fan beam (124) and the detection (1506) of the second backscattered X-rays, the X-ray power supply (104), the X-ray tube (106) and the backscattered X-ray detector (108) are cooled (1508) using the cooling fluid (110) disposed within the housing (102).

[0249] Embodiment 80. The method (1600) of embodiment 79, further comprising:

[0250] receiving (1602) at an internal controller component (140) first backscattered X-ray data and second backscattered X-ray data from the backscattered X-ray detector (108), the first backscattered X-ray data representing the backscattered X-rays detected by the detector array (302) of the backscattered X-ray detector (108), the second backscattered X-ray data representing the second backscattered X-rays detected by the detector array (302) of the backscattered X-ray detector (108);

[0251] at least temporarily storing (1604) the first backscattered X-ray data and the second backscattered X-ray data at the internal controller assembly (140);

[0252] transmitting (1606) the first backscattered X-ray data and the second backscattered X-ray data from the internal controller assembly (140) to a backscattered X-ray data repository (408) via an internal wireless transceiver (142), an antenna (144), a wireless network (406), and a communications network (410); and

[0253] Transmitting (1608) first position data and second position data to the backscattered X-ray data repository (408), the first position data being associated with the first backscattered X-ray data and indicating the predetermined height (504) and the predetermined longitudinal position (506) of the housing (102) when the backscattered X-ray is detected, and the second position data being associated with the second backscattered X-ray data and indicating the second predetermined height (608) and the predetermined longitudinal position (506) of the housing (102) when the second backscattered X-ray is detected.

[0254] Embodiment 81. A method according to embodiment 80, wherein the backscattered X-ray data repository (408) is capable of being accessed by a three-dimensional reconstruction computer system (912) for reconstructing a three-dimensional representation of at least a portion of the target area (128) of the object under test (116) based on the first backscattered X-ray data, the first position data, the second backscattered X-ray data and the second position data.

[0255] Embodiment 82. A method according to embodiment 79, wherein the adjustment (1502) of the position, the projection (1504) of the second X-ray fan beam (124), the detection (1506) of the second X-ray fan beam (124) and the cooling (1508) are repeated for additional predetermined heights associated with non-destructive inspection of additional sub-surface layers of the target area (128).

[0256] Embodiment 83. A method according to embodiment 82, wherein the adjustment (1502) of the position, the projection (1504) of the second X-ray fan beam (124), the detection (1506) of the second X-ray fan beam (124) and the cooling (1508) are repeated for additional predetermined longitudinal positions associated with non-destructive inspection of additional lateral portions of the surface layer, the sub-surface layer and the additional sub-surface layer of the target area (128).

[0257] Embodiment 84. The method (1700) of embodiment 59, further comprising:

[0258] adjusting (1702) the position of the housing (102) so that the emitter portion (121) of the X-ray tube (106) and the aperture portion (122) of the backscatter X-ray detector (108) are disposed at the predetermined height (504) above the object (116) under test and at a second predetermined longitudinal position (704) relative to the target area (128) for non-destructive inspection of a second transverse portion of the surface layer of the target area (128);

[0259] projecting (1704) a second X-ray fan beam (124) from the X-ray tube (106) toward the second transverse portion of the surface at the second predetermined longitudinal position (704);

[0260] In response to the projection of the second X-ray fan beam (124), detecting (1706) second backscattered X-rays reflected by the detected object (116) at the backscattered X-ray detector (108), the detected second backscattered X-rays having passed through the aperture portion (122) to reach the detector array (302) of the backscattered X-ray detector (108); and

[0261] During the projection (1704) of the second X-ray fan beam (124) and the detection (1706) of the second backscattered X-rays, the X-ray power supply (104), the X-ray tube (106) and the backscattered X-ray detector (108) are cooled (1708) using the cooling fluid (110) disposed within the housing (102).

[0262] Embodiment 85. The method (1800) of embodiment 84, further comprising:

[0263] receiving (1802) at an internal controller assembly (140) first backscattered X-ray data and second backscattered X-ray data from the backscattered X-ray detector (108), the first backscattered X-ray data representing the backscattered X-rays detected by the detector array (302) of the backscattered X-ray detector (108), the second backscattered X-ray data representing the second backscattered X-rays detected by the detector array (302) of the backscattered X-ray detector (108);

[0264] at least temporarily storing (1804) the first backscattered X-ray data and the second backscattered X-ray data at the internal controller assembly (140);

[0265] transmitting (1806) the first backscattered X-ray data and the second backscattered X-ray data from the internal controller assembly (140) to a backscattered X-ray data repository (408) via an internal wireless transceiver (142), an antenna (144), a wireless network (406), and a communications network (410); and

[0266] Transmitting (1808) first position data and second position data to the backscattered X-ray data repository (408), the first position data being associated with the first backscattered X-ray data and indicating the predetermined height (504) and the predetermined longitudinal position (506) of the housing (102) when the backscattered X-ray is detected, and the second position data being associated with the second backscattered X-ray data and indicating the predetermined height (504) and the second predetermined longitudinal position (704) of the housing (102) when the second backscattered X-ray is detected.

[0267] Example 86. A method according to Example 85, wherein the backscattered X-ray data repository (408) is capable of being accessed by a three-dimensional reconstruction computer system (912) for reconstructing a three-dimensional representation of at least a portion of the target area (128) of the object under test (116) based on the first backscattered X-ray data, the first position data, the second backscattered X-ray data and the second position data.

[0268] Example 87. A method according to Example 84, wherein the adjustment (1702) of the position, the projection (1704) of the second X-ray fan beam (124), the detection (1706) of the second X-ray fan beam (124) and the cooling (1708) are repeated for additional predetermined longitudinal positions associated with non-destructive inspection of additional lateral portions of the surface layer of the target area (128).

[0269] Embodiment 88. A method according to embodiment 87, wherein the adjustment (1702) of the position, the projection (1704) of the second X-ray fan beam (124), the detection (1706) of the second X-ray fan beam (124) and the cooling (1708) are repeated for an additional predetermined height associated with non-destructive inspection of a sub-surface of the target area (128) and the additional predetermined longitudinal position of the sub-surface.

[0270] Embodiment 89. An integrated backscattered X-ray assembly (100) for detecting backscattered X-rays reflected by a target area (128) of an object (116) under test, comprising:

[0271] Housing (102);

[0272] An X-ray power source (104) disposed in the housing (102);

[0273] an X-ray tube (106) disposed within the housing (102) and operably coupled to the X-ray power supply (104);

[0274] a backscattered X-ray detector (108) disposed within the housing (102);

[0275] a cooling fluid (110) disposed within the housing (102) such that the X-ray power supply (104), the X-ray tube (106) and the backscattered X-ray detector (108) are immersed in the cooling fluid (110);

[0276] a movable base (502) supporting the housing (102) and configured to position the housing (102) relative to the target area (128) of the object (116) under test, wherein the target area (128) includes a target length (202) along a longitudinal axis (204) and a target width (206) transverse to the longitudinal axis (204), wherein the movable base (502) is configured to position an emitter portion (121) of the X-ray tube (106) and an aperture portion (122) of the backscatter X-ray detector (108) to a predetermined height (504) above the object (116) under test and to a predetermined longitudinal position (506) relative to the target area (128) for non-destructive inspection of a transverse portion of a surface layer of the target area (128); and

[0277] A movable platform (702) supports the movable base (502) and is configured to change the longitudinal position of the housing (102) relative to the object under test (116) along the longitudinal axis (204) to position the emitter portion (121) of the X-ray tube (106) and the aperture portion (122) of the backscattered X-ray detector (108) to a second predetermined longitudinal position (704) for non-destructive inspection of a second lateral portion of the surface layer of the target area (128).

[0278] Embodiment 90. An integrated backscatter X-ray assembly according to embodiment 89, wherein the X-ray tube (106) and the backscatter X-ray detector (108) are oriented within the housing (102) so that the X-ray fan beam (124) generated by the X-ray power supply (104) and the X-ray tube (106) intersects with the field of view (126) of the backscatter X-ray detector (108) at the target area (128) of the object to be measured (116).

[0279] Embodiment 91. The integrated backscatter X-ray assembly of Embodiment 89, further comprising:

[0280] an internal controller assembly (140) disposed within the housing (102) and in operable communication with the X-ray power supply (104), the X-ray tube (106), and the backscatter X-ray detector (108) in response to receiving power from at least one of an external power supply (134) and a battery (136);

[0281] an internal wireless transceiver (142) disposed within the housing (102) and in operable communication with the internal controller assembly (140); and

[0282] an antenna (144) secured to an exterior surface (132) of the housing (102) and in operable communication with the internal wireless transceiver (142), and

[0283] wherein the internal controller assembly (140), the internal wireless transceiver (142), and the antenna (144) are configured to transmit backscattered X-ray data and position data to a backscattered X-ray data repository (408) accessible via a wireless network (406) and a communication network (410).

[0284] Embodiment 92. An integrated backscatter X-ray assembly according to embodiment 91, wherein the backscatter X-ray database (408) is accessible by a three-dimensional reconstruction computer system (912) for reconstructing a three-dimensional representation of at least a portion of the target area (128) of the object under test (116) based on the backscatter X-ray data and the position data.

[0285] Embodiment 93. The integrated backscatter X-ray assembly of embodiment 89, wherein the movable base (502) comprises:

[0286] a base member (602) supporting the housing (102);

[0287] a height tracker (604) movably coupled to the base member (602) and defining a Z-axis line (214) extending from the movable base (502) toward the measured article (116);

[0288] an actuator (606) attached to the height tracker (604) and the base member (602), the actuator (606) being configured to change the height of the housing (102) relative to the object (116) to move the emitter portion (121) of the X-ray tube (106) and the aperture portion (122) of the backscatter X-ray detector (108) along the Z axis (214) to a second predetermined height (608) closer to the object (116) for non-destructive inspection of a sub-surface layer of the target area (128);

[0289] a position sensor (610) configured to detect movement of at least one of the actuator (606), the movable base (502), and the housing (102);

[0290] an external controller assembly (612) in operable communication with the actuator (606) and the position sensor (610) to control movement of the housing (102) along the Z-axis (214);

[0291] an external wireless transceiver (614) in operable communication with the external controller assembly (612); and

[0292] An antenna (144) is secured to the housing (102) and is in operable communication with the external wireless transceiver (614).

[0293] Embodiment 94. The integrated backscatter X-ray assembly of embodiment 89, wherein the mobile platform (702) comprises:

[0294] a base member (602) supporting the housing (102);

[0295] a plurality of wheels (706) rotatably attached to the base member (602);

[0296] a drive motor (802) configured to selectively provide power for movement of the mobile platform (702);

[0297] a drive train (804) coupling the drive motor (802) to one or more wheels (706) of the plurality of wheels (706) for moving the mobile platform (702) in response to operation of the drive motor (802);

[0298] a position sensor (806) configured to detect movement of at least one of the drive motor (802), the drive train (804), and the one or more wheels (706);

[0299] an external controller assembly (612) in operable communication with the drive motor (802) and the position sensor (806) to control movement of the mobile platform (702) along the longitudinal axis (204);

[0300] an external wireless transceiver (614) in operable communication with the external controller assembly (612); and

[0301] An antenna (144) is secured to the housing (102) and is in operable communication with the external wireless transceiver (614).

Claims

1. An integrated backscattered X-ray assembly (100) for detecting backscattered X-rays reflected by a target area (128) of an object (116) under test, comprising: Housing (102); An X-ray power source (104) disposed in the housing (102); an X-ray tube (106) disposed within the housing (102) and operably coupled to the X-ray power supply (104); a backscattered X-ray detector (108) disposed within the housing (102); and A cooling fluid (110) is disposed within the housing (102) such that the X-ray power supply (104), the X-ray tube (106) and the backscattered X-ray detector (108) are immersed in the cooling fluid (110).

2. The integrated backscatter X-ray assembly of claim 1 , wherein the housing ( 102 ) includes a Faraday cage ( 112 ) to protect the backscatter X-ray detector ( 108 ) from electromagnetic fields emitted by the X-ray power supply ( 104 ) and the X-ray tube ( 106 ).

3. The integrated backscatter X-ray assembly of claim 1 , wherein the housing ( 102 ) comprises: A side wall (114) is configured to face the object to be measured (116), the side wall (114) includes a first section (118) and a second section (120) forming a chamfer (123) configured to face the object to be measured (116); an emitter portion (121) of the X-ray tube (106) is arranged near the first section (118); and a hole portion (122) of the backscattered X-ray detector (108) is arranged near the second section (120).

4. The integrated backscatter X-ray assembly of claim 3, wherein the chamfer (123) comprises an angle ranging from at least one of about 50 degrees to about 150 degrees, about 60 degrees to about 120 degrees, about 70 degrees to about 100 degrees, and about 80 degrees to about 90 degrees.

5. The integrated backscatter X-ray assembly of claim 1 , wherein the X-ray tube (106) and the backscatter X-ray detector (108) are oriented within the housing (102) such that an X-ray fan beam (124) generated by the X-ray power supply (104) and the X-ray tube (106) intersects a field of view (126) of the backscatter X-ray detector (108) at the target area (128) of the object under test (116).

6. The integrated backscatter X-ray assembly of claim 5, wherein the X-ray tube (106) is oriented at an angle relative to the target area (128) of the object under test (116), the angle ranging from at least one of about 15 degrees to about 65 degrees, about 30 degrees to about 60 degrees, about 40 degrees to about 55 degrees, and about 45 degrees to about 50 degrees.

7. The integrated backscatter X-ray assembly of claim 5, wherein the backscatter X-ray detector (108) is oriented at an angle relative to the target area (128) of the object under test (116), the angle ranging from at least one of about -15 degrees to about -65 degrees, about -30 degrees to about -60 degrees, about -40 degrees to about -55 degrees, and about -45 degrees to about -50 degrees.

8. The integrated backscatter X-ray assembly of claim 1, wherein the X-ray power supply (104) and the X-ray tube (106) are configured to generate an X-ray fan beam (124) for non-destructive inspection of the object (116) under test.

9. The integrated backscatter X-ray assembly of claim 8, wherein the X-ray tube (106) is configured to project the X-ray fan beam (124) onto the target area (128) of the object (116) under inspection.

10. The integrated backscatter X-ray assembly of claim 9, wherein the target region (128) includes a target length (202) along a longitudinal axis (204) and a target width (206) transverse to the longitudinal axis (204).

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