Device aging reliability test equipment and method

Abstract

The invention relates to the field of reliability testing of electric power devices, in particular to a device aging reliability testing device and method which are used for testing a to-be-tested device with a needle-shaped terminal. The test equipment comprises an environment simulation unit, a device connection unit and a data acquisition unit. The environment simulation unit simulates the working environment of the device. The device connection unit is composed of a test tool, a probe fixed on the test tool, and an adaptive tool. The adaptive tool is provided with an inner joint and an outer joint which can slide and are electrically connected, the bottom end of the inner joint can be electrically connected with the needle-shaped terminal of the to-be-tested device, and the top end of the outer joint can be connected with the probe. Particularly, the adaptive tool is composed of two adaptive plates, an outer sliding groove and an inner sliding groove are accurately formed in each adaptive plate, the distance between the two adaptive plates can be adjusted through a distance adjuster arranged between the adaptive plates, then the positions of the inner connector and the outer connector are flexibly adjusted, the problem that an existing testing device cannot adapt to devices to be tested of different models is solved, and the testing efficiency and accuracy are improved.

Description

Technical Field

[0001] The present invention relates to the field of reliability testing of electric power devices, and in particular to a device aging reliability testing device and method. Background Art

[0002] High-voltage and high-power devices, such as insulated gate bipolar transistors (IGBTs) or silicon carbide metal-oxide-semiconductor field-effect transistors, are widely used in power conversion systems such as offshore wind power generation, photovoltaics, and electric vehicles. These applications require high-voltage and high-power devices to be exposed outdoors, and the devices are simultaneously subjected to the effects of high temperature, high humidity, high voltage, high current, salt spray and other stresses that are coupled to each other. After a long stay in this complex stress environment, high-voltage and high-power devices are affected by electrochemical corrosion and thermomechanical stress, which may lead to premature failure, thereby reducing the reliability of the entire system.

[0003] In the manufacturing process of IGBT modules, it is crucial to conduct comprehensive testing of the packaged IGBT modules in order to evaluate the electrical parameter characteristics of the modules under extreme environmental conditions. Typically, the internal interconnection circuits of the IGBT modules are led out through busbar terminals, which serve as ports for testing and connection with external circuits. Currently, for IGBT modules equipped with pin terminals, these pin terminals are small in size and narrow in spacing, which poses a great challenge. Specifically, it is not feasible to use spring probes with a large contact area to test the modules. During the contact between the probe and the pin terminal, factors such as positioning deviation of the IGBT module and contact slippage are likely to occur. These factors can easily lead to poor contact, which in turn impairs the accuracy of IGBT module testing.

[0004] It is extremely difficult to ensure precise alignment of the pin terminals with the spring probes. Inadequate alignment often results in poor contact between the probe and the module pin terminals, which negatively affects IGBT module testing. In addition, during movement of the test equipment, the probes may slip when contacting the pin terminals. Under this stress, the module's pin terminals are prone to deformation and, in severe cases, even breakage. Such damage can render the module completely unusable.

[0005] For example, Chinese invention patent CN106707130B discloses an IGBT module testing device, including a test fixture with a probe and a fixed position, and also including a hot plate for fixing the IGBT module, the hot plate can drive the IGBT module to move in the direction of the test fixture to achieve the contact between the pin-shaped terminal of the IGBT module and the probe, a conductive sheet is arranged between the pin-shaped terminal and the probe, and the conductive sheet includes an inclined end for contacting the pin-shaped terminal and a horizontal end for contacting the probe. In this module testing device, the electrical connection between the pin-shaped terminal of the device under test and the probe is achieved through a conductive sheet. However, the position of these conductive sheets is fixed. In view of the different models of devices under test, the positions of their pin-shaped terminals are different, and this module testing device lacks the ability to adapt to devices of different models.

[0006] Specifically, there are significant differences in the geometric layout and size specifications of the pin terminals of different types of devices. The fixed-position conductive sheets in existing test devices are designed to match the positions of a specific set of pin terminals. Therefore, when faced with devices of other types, if the positions of their pin terminals deviate from the pre-designed layout, the conductive sheets cannot effectively align with these terminals and establish reliable electrical connections. This misalignment will not only hinder the accurate transmission of electrical signals during the test process, but also make the test device incompatible with many different types of devices, thereby severely limiting its versatility and scope of application in actual test scenarios. Summary of the invention

[0007] 1. Technical issues to be solved

[0008] The present invention is aimed at the above-mentioned defects existing in the prior art, and specifically proposes a device aging reliability testing equipment and method, which simulates the working environment of the device through an environmental simulation unit, and is connected to the device to be tested through an adapter tool. The movable internal connector on the adapter tool can be connected with the needle terminals at different positions on the devices to be tested of different models, and the external connector on the adapter tool that is electrically connected to the internal connector can be electrically connected to the probe on the test tool, which solves the problem that the existing test device cannot adapt to devices to be tested of different models.

[0009] 2. Technical Solution

[0010] In order to solve the above technical problems, the present invention provides a device aging reliability testing equipment, which is used for testing a device to be tested with a needle-shaped terminal. The testing equipment includes an environmental simulation unit and a device connection unit and a data acquisition unit arranged in the environmental simulation unit. The device connection unit is electrically connected to the device to be tested. The device connection unit includes a test tool and a probe fixedly arranged on the test tool. The device connection unit also includes an adapter tool electrically connected to the device to be tested. The adapter tool has an inner joint and an outer joint that can slide. The inner joint and the outer joint are electrically connected. The bottom end of the inner joint can be electrically connected to the needle-shaped terminal, and the top end of the outer joint can be electrically connected to the probe.

[0011] Preferably, the adapter tooling is provided with a parallel inner slide groove and outer slide groove, the inner joint is slidably arranged in the inner slide groove in a lockable manner, and the outer joint is slidably arranged in the outer slide groove in a lockable manner.

[0012] Preferably, the top and bottom ends of the inner joint are respectively provided with an inner upper clamping block and an inner lower clamping block extending along the width direction of the inner slide groove, and the inner upper clamping block and the inner lower clamping block clamp a single side of the inner slide groove.

[0013] Preferably, the top end of the inner upper clamping block is provided with an inner positioning bolt which passes through the inner upper clamping block and is threadedly connected thereto, and the inner positioning bolt abuts against the upper surface of one side of the inner sliding groove.

[0014] Preferably, a socket is provided at the bottom end of the inner connector, a metal tube with interference fit is provided in the socket, the metal tube can be plugged with the pin terminal to form an electrical connection, and a flexible wire is provided between the metal tube and the outer connector to form an electrical connection.

[0015] Preferably, the top and bottom ends of the external joint are provided with an outer upper clamping block and an outer lower clamping block extending along the width direction of the outer slide groove, and the outer upper clamping block and the outer lower clamping block clamp a single side of the outer slide groove.

[0016] Preferably, the top end of the outer upper clamping block is provided with an outer positioning bolt which passes through the outer upper clamping block and is threadedly connected thereto, and the outer positioning bolt abuts against the upper surface of one side of the outer sliding groove.

[0017] Preferably, a metal sheet is provided on the external connector, the metal sheet having a longitudinal surface extending longitudinally and clamped on the side of the external connector and an upwardly inclined transverse surface, the longitudinal surface is electrically connected to the internal connector, and the probe abuts against the transverse surface of the metal sheet.

[0018] Preferably, the adapting tool further comprises two adapting plates, each of which is provided with the outer slide groove and the inner slide groove, and a spacing adjuster is provided between the two adapting plates.

[0019] A device aging reliability test method, using a device aging reliability test device, includes the following steps:

[0020] Step 1: adjusting the number and position of the inner connectors on the adapter according to the position and number of the pin terminals on the device under test;

[0021] Step 2: connect the inner connector on the adapter tooling with the pin-shaped terminal of the device under test, and connect the probe on the test tooling with the outer connector on the adapter tooling;

[0022] Step 3: Power on the test fixture, start the environmental simulation unit, and use the data acquisition unit to collect the working data of the device under test.

[0023] 3. Beneficial Effects

[0024] Compared with the prior art, in the device test system of the present invention, the environment simulation unit plays the role of simulating the actual working environment of the device under test. The unit reproduces various actual working scene conditions such as temperature, humidity, air pressure and electromagnetic interference through precise environmental parameter setting and regulation, providing a real and effective environmental basis for the performance test of the device under test.

[0025] The environmental simulation unit is connected to the device under test with the help of an adapter. The adapter has a movable internal connector assembly. The internal connector can be flexibly adjusted according to the structural differences of different types of devices under test, so as to accurately connect with the pin terminals at different positions on different types of devices under test. This design of movable internal connectors greatly improves the adaptability of the adapter to the diverse interface layout of the device under test.

[0026] At the same time, the adapter tooling is provided with an external connector that is electrically connected to the internal connector. The external connector is responsible for establishing an electrical connection with the probe on the test tooling, thereby building a complete electrical signal transmission path from the environmental simulation unit, through the adapter tooling, to the test tooling. This unique adapter tooling design effectively solves the problem of the existing test device being unable to adapt to different models of devices under test due to problems such as interface incompatibility and differences in connection methods, significantly enhancing the versatility and flexibility of the test system and greatly improving the efficiency and accuracy of electronic device testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a three-dimensional diagram of the middle adapting tool of the present invention when it is electrically connected to the device under test.

[0028] Figure 2 It is a stereoscopic diagram of the middle adapting tool and the device under test of the present invention when they are separated from each other at a first viewing angle.

[0029] Figure 3 It is a stereoscopic diagram of the second viewing angle when the middle adapting tooling of the present invention is separated from the device under test.

[0030] Figure 4 It is a top view of the middle adapting tool of the present invention.

[0031] Figure 5 It is a schematic diagram of the adapting tool and the testing tool of the present invention.

[0032] Figure 6 It is a partial three-dimensional exploded view of the middle adapting tooling of the present invention.

[0033] Figure 7 It is a stereoscopic view of the middle and outer joints and the inner joint of the present invention.

[0034] Figure 8 It is a three-dimensional exploded view of the middle and outer joints and the inner joint of the present invention.

[0035] Fig. 9 It is a schematic diagram of the metal tube and the metal sheet in the present invention.

[0036] Fig.10 It is a schematic diagram of the external connector, the internal connector and the device to be tested of the present invention.

[0037] In the figure:

[0038] 1 is the device to be tested; 2 is the test fixture; 21 is the probe; 3 is the adapter fixture; 31 is the inner joint; 311 is the inner upper clamp block; 312 is the inner lower clamp block; 313 is the inner positioning bolt; 314 is the metal tube; 315 is the flexible wire; 32 is the outer joint; 321 is the outer upper clamp block; 322 is the outer lower clamp block; 323 is the outer positioning bolt; 324 is the metal sheet; 33 is the inner slide groove; 34 is the outer slide groove; 35 is the adapter plate; 351 is the positioning groove; 361 is the screw nut; 362 is the bidirectional screw; 363 is the connecting rod; 37 is the positioning block; 371 is the positioning rod; 38 is the spring. DETAILED DESCRIPTION

[0039] The specific implementation of the present invention is further described in detail below in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0040] Embodiment 1:

[0041] like Figure 1 , Figure 2 , Figure 3 and Figure 5As shown, the device aging reliability test equipment of this embodiment is used to test a device to be tested 1 with a needle-shaped terminal. The test equipment includes an environmental simulation unit and a device connection unit and a data acquisition unit arranged in the environmental simulation unit. The device connection unit is electrically connected to the device to be tested 1. The device connection unit includes a test fixture 2 and a probe 21 fixedly arranged on the test fixture 2. The device connection unit also includes an adapter fixture 3 electrically connected to the device to be tested 1. The adapter fixture 3 has an inner joint 31 and an outer joint 32 that can slide. The inner joint 31 and the outer joint 32 are electrically connected. The bottom end of the inner joint 31 can be electrically connected to the needle-shaped terminal, and the top end of the outer joint 32 can be electrically connected to the probe 21.

[0042] The environmental simulation unit is the basic support part of the entire test equipment. It has the ability to accurately simulate various complex environmental conditions, covering temperature, humidity, air pressure, electromagnetic interference and other aspects. Through the fine adjustment of these environmental parameters, it can highly reproduce various harsh environments that the device under test 1 may encounter in actual application scenarios, providing a real and reliable environmental foundation for aging testing.

[0043] The device connection unit mainly includes two parts: a test fixture 2 and an adapter fixture 3. Probes 21 are fixedly arranged on the test fixture 2. These probes 21 have the characteristics of high precision and high stability, and can accurately obtain the electrical signal of the device under test 1 and transmit it to the subsequent data processing link.

[0044] The adapter tool 3 is equipped with an internal connector 31 and an external connector 32 that can slide flexibly, and a good electrical connection is maintained between the two. The bottom end of the internal connector 31 is cleverly designed, and can make precise electrical connections according to the position and size of the needle terminal of the device under test 1. This slidable design allows the internal connector 31 to easily adapt to the position differences of the needle terminals on different models of devices under test 1, greatly improving the versatility of the equipment. The top of the external connector 32 also has electrical connection performance, and can achieve stable and reliable electrical connection with the probe 21 on the test tool 2. The adapter tool 3 successfully solves the connection problem between different models of devices under test 1 and the test equipment, ensuring the accurate transmission of electrical signals and the reliability of test data.

[0045] The data acquisition unit is responsible for real-time acquisition and recording of various electrical signals and data generated during the test process. It can perform preliminary processing and analysis on the acquired data and feed back the results to the operator so as to timely understand the performance changes and aging of the device under test 1.

[0046] like Figure 3 , Figure 4 and Figure 6As shown, the adapter 3 is provided with a parallel inner slide groove 33 and an outer slide groove 34, the inner joint 31 is slidably arranged in the inner slide groove 33 in a lockable manner, and the outer joint 32 is slidably arranged in the outer slide groove 34 in a lockable manner.

[0047] The inner joint 31 is placed in the inner groove 33 in a lockable sliding manner. Specifically, the structural design of the inner joint 31 is highly adapted to the inner groove 33, and sliding components that fit the shape of the inner groove 33, such as sliders or rollers, are provided on both sides or the bottom. These sliding components can slide smoothly in a straight line in the inner groove 33, so that the position of the inner joint 31 on the adapter 3 can be flexibly adjusted according to actual needs. At the same time, the inner joint 31 is also equipped with a set of locking mechanisms, which can firmly lock the inner joint 31 at the current position of the inner groove 33 after receiving an external control signal or a manual operation instruction, ensuring that during the subsequent test process, the inner joint 31 will not be displaced due to external interference or vibration and other factors, thereby ensuring the stability and reliability of the electrical connection with the needle terminal of the device under test 1.

[0048] Similarly, the external connector 32 is also arranged in the outer slide groove 34 in a lockable sliding manner. The sliding assembly of the external connector 32 and the outer slide groove 34 have extremely high matching accuracy, which can achieve smooth and precise sliding operation. By sliding in the outer slide groove 34, the external connector 32 can accurately adjust its relative position with the probe 21 on the test fixture 2 to meet the connection requirements in different test scenarios. In addition, the external connector 32 is also equipped with a corresponding locking device. When the external connector 32 slides to the appropriate position, the locking device can be quickly activated to firmly lock the external connector 32 in the outer slide groove 34 to prevent loosening or displacement during the test process, ensuring that the electrical connection between the external connector 32 and the probe 21 is always in good condition, providing a solid guarantee for the stable operation of the entire test system.

[0049] like Figure 7 , Figure 8 , Fig. 9 and Fig.10 As shown, the top and bottom ends of the inner joint 31 are respectively provided with an inner upper clamping block 311 and an inner lower clamping block 312 extending along the width direction of the inner slide groove 33, and the inner upper clamping block 311 and the inner lower clamping block 312 clamp a single side of the inner slide groove 33. In the structural design of the inner joint 31, in order to achieve accurate adaptation and stable connection with the inner slide groove 33, clamping block assemblies are respectively provided at the top and bottom ends of the inner joint 31. Specifically, at the top position of the inner joint 31, an inner upper clamping block 311 extending transversely along the width direction of the inner slide groove 33 is installed; at the bottom position, an inner lower clamping block 312 also extending along the width direction of the inner slide groove 33 is correspondingly provided.

[0050] The upper inner clamp block 311 and the lower inner clamp block 312 ensure a tight and reliable clamping effect. In the actual assembly and use process, the upper inner clamp block 311 and the lower inner clamp block 312 clamp the single side of the inner slide groove 33 from the upper and lower ends of the inner joint 31. Through this clamping method, the inner joint 31 can not only achieve a smooth sliding function in the inner slide groove 33 to meet the docking requirements of different positions; at the same time, after reaching the target position and locking, the friction force generated between the clamp block and the single side of the inner slide groove 33 can effectively resist external interference forces such as vibration and impact, and prevent the inner joint 31 from accidentally shifting during the test process, thereby ensuring that the inner joint 31 and the needle terminal of the device under test 1 always maintain a stable electrical connection state, providing key support for the reliable operation of the entire test system.

[0051] like Figure 7 and Figure 8 As shown, the top of the inner upper clamp block 311 is provided with an inner positioning bolt 313 that passes through it and is threadedly connected thereto, and the inner positioning bolt 313 abuts against the upper surface of one side of the inner slide groove 33. When the inner joint 31 slides to the desired position, the inner positioning bolt 313 is rotated clockwise so that the bottom end of the bolt gradually moves downward and finally abuts against the upper surface of one side of the inner slide groove 33. As the inner positioning bolt 313 is continuously screwed in, the pressure between the bottom end of the bolt and the upper surface of one side of the inner slide groove 33 gradually increases, thereby generating sufficient friction. This friction can effectively prevent the inner joint 31 from sliding in the inner slide groove 33, and firmly lock the inner joint 31 in the current position.

[0052] This design of the internal positioning bolt 313 can not only accurately adjust the position of the internal connector 31, but also effectively prevent the internal connector 31 from being displaced due to external interference forces in the face of various complex working conditions, such as vibration and impact, during the test process, ensuring that the electrical connection between the internal connector 31 and the needle terminal of the device under test 1 always remains stable, providing an important position locking guarantee mechanism for the reliable operation of the entire test system.

[0053] like Figure 8 As shown, a socket is provided at the bottom end of the inner connector 31, in which a metal tube 314 is provided which is interference fit therewith. The metal tube 314 can be plugged into a pin terminal to form an electrical connection, and a flexible wire 315 is provided between the metal tube 314 and the outer connector 32 to form an electrical connection.

[0054] Inside the jack, a metal tube 314 is installed with an interference fit. The metal tube 314 is made of a metal material with good electrical conductivity and mechanical properties, such as copper alloy or aluminum alloy. Its outer diameter is in interference with the inner diameter of the jack, so that after the metal tube 314 is inserted into the jack, it can be firmly fixed in the jack by the friction force generated by the interference fit, and at the same time ensure a reliable electrical connection between the two.

[0055] The metal tube 314 is designed to be plugged into the pin-shaped terminal of the device under test 1. When the metal tube 314 is plugged into the pin-shaped terminal, the contact surfaces of the two can achieve good electrical contact, thereby forming a stable electrical connection, ensuring that the signal can be accurately transmitted between the two.

[0056] In addition, in order to realize the electrical connection between the metal tube 314 and the external connector 32, a flexible wire 315 is arranged between the metal tube 314 and the external connector 32. The flexible wire 315 uses a high-conductivity wire as the inner core, and is wrapped with a flexible insulating material with good insulation performance, such as rubber or silicone. One end of the flexible wire 315 is connected to the metal tube 314 through a reliable electrical connection process such as welding and crimping, and the other end is electrically connected to the external connector 32 accordingly. The setting of this flexible wire 315 not only ensures a stable electrical connection between the metal tube 314 and the external connector 32, but also adapts to the position change and angle adjustment that may occur during the sliding process of the internal connector 31, avoiding wire damage or electrical connection interruption caused by rigid connection, thereby providing a reliable electrical connection path for the stable operation of the entire test system.

[0057] like Figure 7 , Figure 8 and Fig. 9 As shown, the top and bottom ends of the external joint 32 are provided with an outer upper clamping block 321 and an outer lower clamping block 322 extending along the width direction of the outer slide groove 34, and the outer upper clamping block 321 and the outer lower clamping block 322 clamp a single side of the outer slide groove 34. The outer upper clamping block 321 and the outer lower clamping block 322 are designed to cooperatively clamp a single side of the outer slide groove 34. The outer upper clamping block 321 and the outer lower clamping block 322 are structurally tightly integrated with the main body of the external joint 32, and have considerable mechanical strength and a certain degree of elastic deformation ability.

[0058] In the actual assembly process and usage scenario, the upper outer clamp block 321 and the lower outer clamp block 322 clamp the outer slot 34 from both ends of the outer connector 32. With this clamping method, the outer connector 32 can not only smoothly slide in the outer slot 34, but also meet the diverse needs for position adjustment under different working conditions; at the same time, after sliding to the target position and completing the locking operation, the friction generated between the clamp block and the outer slot 34 can effectively resist various interference forces such as vibration and impact from the external environment, effectively preventing the outer connector 32 from accidentally moving during the test process, thereby ensuring that the outer connector 32 and the probe 21 on the test fixture 2 always maintain a stable electrical connection state, providing crucial structural support for the reliable operation of the entire test system.

[0059] like Figure 7and Figure 8 As shown, the top end of the outer upper clamping block 321 is provided with an outer positioning bolt 323 penetrating therethrough and threadedly connected thereto, and the outer positioning bolt 323 abuts against the upper surface of one side of the outer sliding groove 34 .

[0060] When the external joint 32 slides in the external slide groove 34 to the designated position that meets the test requirements, the operator rotates the external positioning bolt 323 in a clockwise direction. As the bolt is screwed in continuously, its bottom end gradually moves downward until it finally tightly abuts against the upper surface of one side of the external slide groove 34. In this process, as the screwing depth of the external positioning bolt 323 increases continuously, the pressure between the bottom end of the bolt and the upper surface of one side of the external slide groove 34 increases linearly, thereby generating a friction force sufficient to counteract external interference forces.

[0061] The generation of this friction force can effectively suppress the sliding tendency of the external connector 32 in the external slide groove 34, and firmly lock the external connector 32 in the currently selected position. During the operation of the entire test system, especially in the face of complex and changeable working conditions, such as high-intensity vibration, sudden impact loads, etc., the stable locking effect provided by the external positioning bolt 323 can effectively avoid the risk of displacement of the external connector 32 due to external interference, ensure that the external connector 32 and the probe 21 on the test fixture 2 maintain a stable and reliable electrical connection state, and provide a solid positioning guarantee mechanism for the stable operation and accurate data collection of the entire test system.

[0062] like Figure 8 As shown, a metal sheet 324 is provided on the external connector 32 , and the metal sheet 324 has a longitudinal surface extending longitudinally and clamped on the side of the external connector 32 , and a transverse surface inclined upward, the longitudinal surface is electrically connected to the internal connector 31 , and the probe 21 abuts against the transverse surface of the metal sheet 324 .

[0063] The metal sheet 324 has a unique geometric shape and structural layout. First, the metal sheet 324 has a longitudinal surface extending in the longitudinal direction and tightly clamped on the side of the external connector 32. The design of this longitudinal surface is intended to establish a stable and reliable electrical connection path with the internal connector 31. Through professional electrical connection processes such as welding and crimping, the longitudinal surface and the internal connector 31 achieve a firm electrical connection, thereby ensuring that electrical signals can be accurately and efficiently transmitted between the two.

[0064] Secondly, the metal sheet 324 also has an upwardly inclined transverse surface. The inclination angle of the transverse surface is precisely calculated based on mechanical and electrical properties to optimize the contact effect between the probe 21 on the test fixture 2. In the actual test process, the probe 21 on the test fixture 2 will accurately abut the transverse surface of the metal sheet 324. This abutment method makes full use of the inclined structure of the transverse surface of the metal sheet 324, so that good physical contact and electrical connection can be formed between the probe 21 and the metal sheet 324. On the one hand, the inclined transverse surface increases the contact area with the probe 21, which is conducive to improving the transmission stability of the electrical signal; on the other hand, the inclined structure can buffer the impact force generated when the probe 21 contacts the metal sheet 324 to a certain extent, reduce the wear and damage caused by mechanical collision, thereby extending the service life of the metal sheet 324 and the probe 21, and further ensuring the reliability and stability of the entire test system during long-term operation. Through this unique design of the metal sheet 324, the electrical connection between the inner joint 31 and the probe 21 on the test fixture 2 is cleverly realized, providing key electrical connection support for the stable operation of the entire test system.

[0065] A device aging reliability test method, using a device aging reliability test device, includes the following steps:

[0066] Step 1: adjusting the number and position of the inner connectors 31 on the adapter 3 according to the position and number of the pin terminals on the device under test 1;

[0067] Step 2: dock the inner connector 31 on the adapter tool 3 with the pin-shaped terminal of the device under test 1, and dock the probe 21 on the test tool 2 with the outer connector 32 on the adapter tool 3;

[0068] Step 3: The test fixture 2 is powered on, the environmental simulation unit is started, and the data acquisition unit collects the working data of the device under test 1 .

[0069] Embodiment 2:

[0070] Compared with Example 1, Figure 6As shown, the adapter tool 3 also includes two adapter plates 35, each of which is provided with the outer slide groove 34 and the inner slide groove 33, and a spacing adjuster is provided between the two adapter plates 35. A spacing adjuster is provided between the two adapter plates 35. The spacing adjuster is one of the core components of the adapter tool 3 to achieve flexible adaptation of devices under test 1 of different sizes. By operating the spacing adjuster, the spacing between the two adapter plates 35 can be accurately adjusted. This adjustable spacing design enables the adapter tool 3 to flexibly change the relative positions of the inner joint 31 and the outer joint 32 according to the size of the device under test 1, thereby achieving a wide range of adaptation to devices under test 1 of different models and specifications. Whether it is a miniaturized, compactly laid out electronic device or a large, complexly structured industrial equipment component, the adapter fixture 3 can ensure accurate docking and stable connection between the internal connector 31 and the needle terminal of the device under test 1, and between the external connector 32 and the probe 21 on the test fixture 2 through precise adjustment of the spacing adjuster, which greatly expands the scope of use of the test equipment and significantly improves the efficiency and accuracy of the test work.

[0071] The spacing adjuster includes two screw nuts 361 and a bidirectional screw 362. The two screw nuts 361 are arranged facing each other or back to back between the two adapter plates 35. The screw nuts 361 are provided with a connecting rod 363 rotatably connected to the two adapter plates 35. The bidirectional screw 362 is rotatably arranged between the two adapter plates 35. The two ends of the bidirectional screw 362 are respectively threadedly connected to the two screw nuts 361. When the bidirectional screw 362 is rotated, the two screw threads move toward each other or back to back to adjust the spacing between the two adapter plates 35.

[0072] The adapter plate 35 is provided with a positioning groove 351 extending along its width direction, and a positioning block 37 sliding along its length direction is provided in the positioning groove 351. A positioning rod 371 extending along the longitudinal direction is provided at the bottom end of the positioning block 37. The positioning rod 371 can be inserted into the fastening hole of the device under test 1. A spring 38 is also provided in the positioning groove 351, and both ends of the spring 38 are fixedly connected to the positioning block 37 and one end of the positioning groove 351 respectively.

[0073] The above are only preferred embodiments of the present invention. It should be pointed out that, for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the technical principles of the present invention. These improvements and modifications should also be regarded as within the scope of protection of the present invention.

Claims

1. A device aging reliability test device, used for testing a device under test with a needle-shaped terminal, the test device comprises an environmental simulation unit, a device connection unit and a data acquisition unit arranged in the environmental simulation unit, the device connection unit is electrically connected to the device under test, the device connection unit comprises a test fixture and a probe fixedly arranged on the test fixture, characterized in that: The device connection unit also includes an adapter tooling electrically connected to the device to be tested, the adapter tooling has a slidable inner joint and an outer joint, the inner joint and the outer joint are electrically connected, the bottom end of the inner joint can be electrically connected to the needle terminal, and the top end of the outer joint can be electrically connected to the probe.

2. A device aging reliability testing device according to claim 1, characterized in that: The adapter tooling is provided with a parallel inner slide groove and an outer slide groove, the inner joint is slidably arranged in the inner slide groove in a lockable manner, and the outer joint is slidably arranged in the outer slide groove in a lockable manner.

3. A device aging reliability testing device according to claim 2, characterized in that: The top and bottom ends of the inner joint are respectively provided with an inner upper clamping block and an inner lower clamping block extending along the width direction of the inner slide groove, and the inner upper clamping block and the inner lower clamping block clamp a single side of the inner slide groove.

4. A device aging reliability testing device according to claim 3, characterized in that: The top end of the inner upper clamping block is provided with an inner positioning bolt which passes through the inner upper clamping block and is threadedly connected thereto, and the inner positioning bolt abuts against the upper surface of one side of the inner sliding groove.

5. A device aging reliability testing device according to any one of claims 2 to 4, characterized in that: The bottom end of the inner connector is provided with a socket, in which a metal tube with interference fit is provided, the metal tube can be plugged with the pin terminal to form an electrical connection, and a flexible wire forming an electrical connection is provided between the metal tube and the outer connector.

6. A device aging reliability testing device according to claim 2, characterized in that: The top and bottom ends of the external joint are provided with an outer upper clamping block and an outer lower clamping block extending along the width direction of the outer sliding groove, and the outer upper clamping block and the outer lower clamping block clamp a single side of the outer sliding groove.

7. A device aging reliability testing device according to claim 6, characterized in that: The top end of the outer upper clamping block is provided with an outer positioning bolt which passes through the outer upper clamping block and is threadedly connected thereto, and the outer positioning bolt abuts against the upper surface of one side of the outer sliding groove.

8. A device aging reliability testing device according to claim 6 or 7, characterized in that: A metal sheet is arranged on the external connector, and the metal sheet has a longitudinal surface extending longitudinally and clamped on the side of the external connector, and a transverse surface inclined upward, the longitudinal surface is electrically connected to the internal connector, and the probe abuts against the transverse surface of the metal sheet.

9. A device aging reliability testing device according to any one of claims 2-4, 6, and 7, characterized in that: The adapting tooling also includes two adapting plates, each of which is provided with the outer slide groove and the inner slide groove, and a spacing adjuster is provided between the two adapting plates.

10. A device aging reliability testing method, characterized in that: Using a device aging reliability test device as described in any one of claims 1-4, 6, and 7, comprising the following steps: Step 1, adjusting the number and position of the inner connectors on the adapter according to the position and number of the pin terminals on the device under test; Step 2, docking the inner connector on the adapter tool with the pin-shaped terminal of the device under test, and docking the probe on the test tool with the outer connector on the adapter tool; Step 3: Power on the test fixture, start the environmental simulation unit, and let the data acquisition unit collect the working data of the device under test.

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