Automatic Test Adapter and Automatic Test System

Abstract

The automatic test adapter and automatic test system provided by the present invention relate to the technical field of automatic testing. In the present invention, a plurality of first connectors are provided on a first panel for connecting to the output end of a test device to obtain test signals output by the test device. A plurality of second connectors are provided on a second panel for connecting to the input end of a device under test to output at least one obtained test signal to the connected device under test. A signal adaptation module is provided on a third panel. The signal adaptation module is respectively connected to the plurality of first connectors and the plurality of second connectors, and is configured to, in response to a received signal adaptation instruction, send the test signal output by the first connector to the corresponding device under test through the corresponding second connector to perform corresponding device testing operations on the device under test. Based on the above, the problem of low test efficiency existing in the prior art can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of automatic testing, and in particular, to an automatic test adapter and an automatic test system. Background Art

[0002] In the field of testing, an adapter is mainly used for signal conditioning and routing to establish a connection path between a test device and a device under test. Traditional adapters generally use manual wiring. Their characteristics are low cost, but strong specificity and low modification efficiency (for example, it is necessary to continuously open the adapter chassis and continuously modify the wiring to meet different test requirements). Summary of the Invention

[0003] In view of this, the purpose of the present invention is to provide an automatic test adapter and an automatic test system to improve the problem of low test efficiency existing in the prior art.

[0004] To achieve the above purpose, the present invention adopts the following technical solutions:

[0005] An automatic test adapter is applied to an automatic test system. The automatic test system further includes at least one test device and at least one device under test respectively connected to the automatic test adapter. The automatic test adapter includes:

[0006] A first panel, on which there are a plurality of first connectors for connecting to at least one output end of at least one of the test devices to obtain at least one test signal output by at least one of the test devices;

[0007] A second panel, on which there are a plurality of second connectors for connecting to at least one input end of at least one of the devices under test to output the obtained at least one test signal to the connected device under test;

[0008] A third panel, on which there is a signal adaptation module. The signal adaptation module is respectively connected to the plurality of first connectors and the plurality of second connectors, and is configured to, in response to a received signal adaptation instruction, send each test signal output by the plurality of first connectors to the corresponding device under test through the corresponding second connector to perform corresponding device test operations on the device under test.

[0009] In a preferred selection of the present invention, in the above automatic test adapter, the signal adaptation module includes:

[0010] An embedded system, wherein the embedded system is connected to a host computer, and the embedded system is configured to receive a signal adaptation instruction sent by the host computer;

[0011] A digital signal adaptation module, wherein the digital signal adaptation module is respectively connected to the embedded system, at least one of the first connectors, and at least one of the second connectors, and the digital signal adaptation module is configured to, in response to the signal adaptation instruction received by the embedded system, send each test signal output by at least one of the connected first connectors to the corresponding second connector;

[0012] A relay array module, wherein the relay array module is respectively connected to the embedded system, at least one of the first connectors, and at least one of the second connectors, and the relay array module is configured to, in response to the signal adaptation instruction received by the embedded system, send each test signal output by at least one of the connected first connectors to the corresponding second connector.

[0013] In a preferred selection of the present invention, in the above-mentioned automatic test adapter, the digital signal adaptation module includes:

[0014] At least one input communication interface, wherein each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is configured to obtain each test signal output by each of the connected first connectors;

[0015] An input serial interface conversion chip, wherein the input serial interface conversion chip is respectively connected to the at least one input communication interface, and the input serial interface conversion chip is configured to perform protocol conversion processing on the test signals obtained by the at least one input communication interface and output them;

[0016] A field programmable gate array, wherein the field programmable gate array is connected to the input serial interface conversion chip, and the field programmable gate array is configured to perform signal conditioning processing on the test signals output by the input serial interface conversion chip and output them;

[0017] An output serial interface conversion chip, wherein the output serial interface conversion chip is connected to the field programmable gate array, and the output serial interface conversion chip is configured to perform protocol conversion processing on the test signals output by the field programmable gate array and output them;

[0018] At least one output communication interface, wherein each of the output communication interfaces is respectively connected to the output serial interface conversion chip and at least one of the second connectors, and each of the output communication interfaces is respectively configured to obtain the test signals output by the output serial interface conversion chip and output the test signals to the connected second connectors.

[0019] In a preferred option of the present invention, in the above-mentioned automatic test adapter, the digital signal adaptation module includes:

[0020] At least one input communication interface, wherein each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is used to obtain each test signal output by each of the connected first connectors;

[0021] A first controller area network transceiver unit, wherein the first controller area network transceiver unit is respectively connected to the at least one input communication interface, and the first controller area network transceiver unit is used to perform signal adaptation processing on the test signals obtained by the at least one input communication interface and output them;

[0022] A field programmable gate array, wherein the field programmable gate array is connected to the first controller area network transceiver unit, and the field programmable gate array is used to perform signal conditioning processing on the test signals output by the first controller area network transceiver unit and output them;

[0023] A second controller area network transceiver unit, wherein the second controller area network transceiver unit is connected to the field programmable gate array, and the second controller area network transceiver unit is used to perform signal adaptation processing on the test signals output by the field programmable gate array and output them;

[0024] At least one output communication interface, wherein each of the output communication interfaces is respectively connected to the second controller area network transceiver unit and at least one second connector, and each of the output communication interfaces is respectively used to obtain the test signals output by the second controller area network transceiver unit and output the test signals to the connected second connectors.

[0025] In a preferred option of the present invention, in the above-mentioned automatic test adapter, the digital signal adaptation module includes:

[0026] At least one digital input interface, wherein each of the digital input interfaces is connected to at least one of the first connectors, and each of the digital input interfaces is used to obtain each test signal output by each of the connected first connectors;

[0027] An isolation unit, wherein the isolation unit is respectively connected to the at least one digital input interface, and the isolation unit is used to perform signal isolation processing on the test signals obtained by the at least one digital input interface and output them;

[0028] Field Programmable Gate Array, wherein the Field Programmable Gate Array is connected to the isolation unit, and the Field Programmable Gate Array is used for signal conditioning processing of the test signal output by the isolation unit and outputting;

[0029] Buffer unit, wherein the buffer unit is connected to the Field Programmable Gate Array, and the buffer unit is used for signal isolation and level conversion processing of the test signal output by the Field Programmable Gate Array and outputting;

[0030] At least one digital output interface, wherein each of the digital output interfaces is respectively connected to the buffer unit and at least one second connector, and each of the digital output interfaces is respectively used for obtaining the test signal output by the buffer unit and outputting the test signal to the connected second connector.

[0031] In a preferred selection of the present invention, in the above-mentioned automatic test adapter, the relay array module includes a pulse switching module, and the pulse switching module includes:

[0032] At least one pulse input interface, wherein each of the pulse input interfaces is connected to at least one of the first connectors, and the pulse input interface is used for obtaining the test signal obtained by each of the connected first connectors, and the test signal belongs to a pulse signal;

[0033] At least one pulse output interface, wherein each of the pulse output interfaces is connected to at least one second connector, and the pulse output interface is used for outputting the obtained test signal to the connected second connector;

[0034] Programmable relay, wherein the programmable relay is respectively connected to the at least one pulse input interface and the at least one pulse output interface, and the programmable relay is used for controlling the connection between at least one of the pulse input interfaces and at least one of the pulse output interfaces, so that the test signal obtained by the pulse input interface is output to the connected pulse output interface.

[0035] In a preferred selection of the present invention, in the above-mentioned automatic test adapter, the relay array module includes an analog switching module, and the analog switching module includes:

[0036] At least one analog input interface, wherein each of the analog input interfaces is connected to at least one of the first connectors, and the analog input interface is used for obtaining the test signal obtained by each of the connected first connectors, and the test signal belongs to an analog signal;

[0037] At least one analog output interface, wherein each of the analog output interfaces is connected to at least one second connector, and the analog output interface is used for outputting the obtained test signal to the connected second connector;

[0038] A programmed relay, wherein the programmed relay is respectively connected to the at least one analog input interface and the at least one analog output interface, and the programmed relay is used to control the connection between at least one of the analog input interfaces and at least one of the analog output interfaces, so that the test signal obtained by the analog input interface is output to the connected analog output interface.

[0039] In a preferred option of the present invention, in the above automatic test adapter, the relay array module includes a multimeter switching module, and the multimeter switching module includes:

[0040] At least one multimeter input interface, wherein each of the multimeter input interfaces is connected to at least one of the first connectors, and the multimeter input interface is used to obtain the test signal obtained by each of the connected first connectors, and the test signal belongs to the multimeter signal;

[0041] At least one multimeter output interface, wherein each of the multimeter output interfaces is connected to at least one of the second connectors, and the multimeter output interface is used to output the obtained test signal to the connected second connector;

[0042] A programmed relay, wherein the programmed relay is respectively connected to the at least one multimeter input interface and the at least one multimeter output interface, and the programmed relay is used to control the connection between at least one of the multimeter input interfaces and at least one of the multimeter output interfaces, so that the test signal obtained by the multimeter input interface is output to the connected multimeter output interface.

[0043] In a preferred option of the present invention, in the above automatic test adapter, the relay array module includes a simulation module, and the simulation module includes:

[0044] At least one simulation input interface, wherein each of the simulation input interfaces is connected to at least one of the first connectors, and the simulation input interface is used to obtain the test signal obtained by each of the connected first connectors, and the test signal belongs to the simulation signal;

[0045] At least one simulation output interface, wherein each of the simulation output interfaces is connected to at least one of the second connectors, and the simulation output interface is used to output the obtained test signal to the connected second connector;

[0046] A programmed relay, wherein the programmed relay is respectively connected to the at least one simulation input interface and the at least one simulation output interface, and the programmed relay is used to control the connection between at least one simulation input interface and at least one simulation output interface, so that the test signal obtained by the simulation input interface is output to the connected simulation output interface.

[0047] Based on the above, the present invention further provides an automatic test system, including:

[0048] The above-mentioned automatic test adapter;

[0049] At least one test device and at least one device under test respectively connected to the automatic test adapter, wherein at least one test signal output by at least one of the test devices is transmitted to at least one of the devices under test through the automatic test adapter, so that the corresponding device test operation is performed on at least one of the devices under test through at least one of the test signals.

[0050] In the automatic test adapter and the automatic test system provided by the present invention, the first panel has a plurality of first connectors for connecting to the output ends of test devices to obtain test signals output by the test devices. The second panel has a plurality of second connectors for connecting to the input ends of the devices under test to output at least one obtained test signal to the connected devices under test. The third panel has a signal adaptation module, and the signal adaptation module is respectively connected to the plurality of first connectors and the plurality of second connectors, and is configured to, in response to a received signal adaptation instruction, send the test signal output by the first connector to the corresponding device under test through the corresponding second connector to perform a corresponding device test operation on the device under test. Based on the above, since a plurality of first connectors and a plurality of second connectors are configured, and the signal adaptation module can, based on the signal adaptation instruction, send the test signal output by the first connector to the corresponding device under test through the corresponding second connector, thus, the switching adaptation of input and output based on the signal adaptation instruction can be achieved. Therefore, manual wiring modification is not required, and the test efficiency can be fully improved, thereby improving the problem of low test efficiency existing in the prior art. Especially for test scenarios with multiple requirements and multiple devices, the application value is relatively high. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] To make the above objects, features, and advantages of the present invention more obvious and understandable, the following specifically enumerates preferred embodiments and, in conjunction with the accompanying drawings, makes a detailed description as follows.

[0052] Figure 1 It is a system block diagram of the automatic test system provided by an embodiment of the present invention.

[0053] Figure 2 It is a schematic diagram of the automatic test adapter provided by an embodiment of the present invention.

[0054] Figure 3 It is a first schematic diagram of the digital signal adaptation module provided by an embodiment of the present invention.

[0055] Figure 4The second schematic diagram of the digital signal adaptation module provided by the embodiment of the present invention.

[0056] Figure 5 The third schematic diagram of the digital signal adaptation module provided by the embodiment of the present invention.

[0057] Figure 6 The schematic diagram of the relay array module provided by the embodiment of the present invention. Detailed implementation manners

[0058] To make the objectives, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part rather than all of the embodiments of the present invention. Generally, the components of the embodiments of the present invention described and illustrated in the accompanying drawings here can be arranged and designed in various different configurations.

[0059] Therefore, the detailed description of the embodiments of the present invention provided in the accompanying drawings below is not intended to limit the scope of the claimed present invention, but merely represents selected embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts fall within the scope of protection of the present invention.

[0060] As Figure 1 shown, the embodiment of the present invention provides an automatic test system. Among them, the automatic test system may include an automatic test adapter, at least one test device, and at least one device under test. Specifically, the at least one test device and the at least one device under test are respectively connected to the automatic test adapter. In this way, at least one test signal output by at least one of the test devices can be transmitted to at least one of the devices under test through the automatic test adapter, so that corresponding device test operations are performed on at least one of the devices under test through at least one of the test signals. The automatic test adapter is used to transmit the test signal output by the test device to the device under test that needs to be tested in response to the received signal adaptation instruction.

[0061] Combined with Figure 2 , the embodiment of the present invention further provides an automatic test adapter applicable to the above automatic test system. Among them, the automatic test system further includes at least one test device and at least one device under test respectively connected to the automatic test adapter.

[0062] Specifically, the automatic test adapter may include a first panel, a second panel, and a third panel. The first panel is provided with a plurality of first connectors for connecting to at least one output terminal of at least one of the test devices to obtain at least one test signal output by at least one of the test devices. The second panel is provided with a plurality of second connectors for connecting to at least one input terminal of at least one of the devices under test to output the obtained at least one test signal to the connected device under test. The third panel is provided with a signal adaptation module, which is respectively connected to the plurality of first connectors and the plurality of second connectors, and the signal adaptation module is configured to, in response to a received signal adaptation instruction, send each test signal output by the plurality of first connectors to the corresponding device under test through the corresponding second connector to perform corresponding device test operations on the device under test.

[0063] It should be noted that the first panel may refer to the rear panel, the second panel may refer to the front panel, and the third panel may refer to the bottom panel. In addition, for the connection between the first connectors and the second connectors and the signal adaptation module, corresponding cable bases may be provided on the bottom panel, and then multi-core shielded cables may be used to connect to the corresponding connectors to avoid interference between signals. In addition, the automatic test adapter may further include a power supply module, which may be used to supply power to the signal adaptation module.

[0064] Based on the above, since a plurality of first connectors and a plurality of second connectors will be configured, and the signal adaptation module can, based on the signal adaptation instruction, send the test signal output by the first connector to the corresponding device under test through the corresponding second connector, thus, the switching adaptation of input and output based on the signal adaptation instruction can be realized. Therefore, manual rewiring is not required, and the test efficiency can be fully improved, thereby improving the problem of low test efficiency existing in the prior art. Especially for test scenarios with multiple requirements and multiple devices, the application value is relatively high.

[0065] Regarding the signal adaptation module, it should be noted that the specific composition of the signal adaptation module is not limited and can be selected according to actual needs.

[0066] For example, in an alternative embodiment, in order to ensure that the signal adaptation module can meet more test requirements, the above-mentioned signal adaptation module may include an embedded system, a digital signal adaptation module, and a relay array module.

[0067] Specifically, the embedded system is connected to the host computer. The embedded system (which can be a Linux-based system) is used to receive the signal adaptation instructions sent by the host computer. Exemplarily, the embedded system can communicate with the host computer through network communication such as UDP / TCP to achieve the sending of signal adaptation instructions. Specifically, the embedded system specifically configures the digital signal adaptation module according to the parameter setting file in XML format sent by the host computer to complete operations such as signal switching and docking. In addition, the embedded system can include components such as a communication module and a microprocessor.

[0068] Specifically, the digital signal adaptation module is respectively connected to the embedded system, at least one of the first connectors, and at least one of the second connectors. The digital signal adaptation module is used to respond to the signal adaptation instructions received by the embedded system and send each test signal output by at least one connected first connector to the corresponding second connector. Exemplarily, the digital signal adaptation module can be based on an FPGA, combined with peripheral protocols and level switching circuits to achieve corresponding switching adaptation.

[0069] Specifically, the relay array module is respectively connected to the embedded system, at least one of the first connectors, and at least one of the second connectors. The relay array module is used to respond to the signal adaptation instructions received by the embedded system and send each test signal output by at least one connected first connector to the corresponding second connector. Exemplarily, the relay array module can form a switching network according to project requirements through large-scale, low-power, and low-latency relays to achieve the switching adaptation of multiple test signals.

[0070] It can be understood that in an alternative implementation, in order to meet the requirements such as the adaptation of test signals for different types of serial ports, combined with Figure 3 , the digital signal adaptation module can include at least one input communication interface, an input serial interface conversion chip, a field programmable gate array, an output serial interface conversion chip, and at least one output communication interface.

[0071] Specifically, each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is configured to obtain each test signal output by each of the connected first connectors. The input serial interface conversion chip is respectively connected to the at least one input communication interface, and the input serial interface conversion chip is configured to perform protocol conversion processing on the test signals obtained by the at least one input communication interface and output the processed signals. The field programmable gate array is connected to the input serial interface conversion chip, and the field programmable gate array is configured to perform signal conditioning processing on the test signals output by the input serial interface conversion chip and output the processed signals. The output serial interface conversion chip is connected to the field programmable gate array, and the output serial interface conversion chip is configured to perform protocol conversion processing on the test signals output by the field programmable gate array and output the processed signals. Each of the output communication interfaces is respectively connected to the output serial interface conversion chip and at least one second connector, and each of the output communication interfaces is respectively configured to obtain the test signals output by the output serial interface conversion chip and output the test signals to the connected second connectors.

[0072] It should be noted that the protocol conversion processing may refer to the conversion between communication protocols such as RS485 / 422 / 232. The signal conditioning processing may refer to processing such as amplification, filtering, and attenuation. Additionally, the input serial interface conversion chip and the output serial interface conversion chip may respectively be multiple to form an input serial interface conversion chip group and an output serial interface conversion chip group, so as to enable the mutual conversion of multiple protocols.

[0073] It can be understood that in an alternative embodiment, in order to achieve reliable processing of test signals for the CAN (Controller Area Network) protocol, in combination with Figure 4 , the above digital signal adaptation module may include at least one input communication interface, a first Controller Area Network transceiver unit, a field programmable gate array, a second Controller Area Network transceiver unit, and at least one output communication interface.

[0074] Specifically, each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is configured to obtain each test signal output by each of the connected first connectors. The first controller area network transceiver unit is respectively connected to the at least one input communication interface, and the first controller area network transceiver unit is configured to perform signal adaptation processing on the test signals obtained by the at least one input communication interface and output the processed signals. The field programmable gate array is connected to the first controller area network transceiver unit, and the field programmable gate array is configured to perform signal conditioning processing on the test signals output by the first controller area network transceiver unit and output the processed signals. The second controller area network transceiver unit is connected to the field programmable gate array, and the second controller area network transceiver unit is configured to perform signal adaptation processing on the test signals output by the field programmable gate array and output the processed signals. Each of the output communication interfaces is respectively connected to the second controller area network transceiver unit and at least one second connector, and each of the output communication interfaces is respectively configured to obtain the test signals output by the second controller area network transceiver unit and output the test signals to the connected second connectors.

[0075] It can be understood that, in an alternative embodiment, in order to achieve the interconnection of digital signals, in combination with Figure 5 , the digital signal adaptation module may include at least one digital input interface, an isolation unit, a field programmable gate array, a buffer unit, and at least one digital output interface.

[0076] Specifically, each of the digital input interfaces is connected to at least one of the first connectors, and each of the digital input interfaces is configured to obtain each test signal output by each of the connected first connectors. The isolation unit (such as an opto-isolation device) is respectively connected to the at least one digital input interface, and the isolation unit is configured to perform signal isolation processing on the test signals obtained by the at least one digital input interface and output the processed signals. The field programmable gate array is connected to the isolation unit, and the field programmable gate array is configured to perform signal conditioning processing on the test signals output by the isolation unit and output the processed signals. The buffer unit is connected to the field programmable gate array, and the buffer unit is configured to perform signal isolation and level conversion processing on the test signals output by the field programmable gate array and output the processed signals. Each of the digital output interfaces is respectively connected to the buffer unit and at least one second connector, and each of the digital output interfaces is respectively configured to obtain the test signals output by the buffer unit and output the test signals to the connected second connectors.

[0077] It can be understood that, in an alternative embodiment, in order to meet the test requirements based on pulse signals, in combination with Figure 6, the above relay array module may include a pulse switching module.

[0078] Specifically, the pulse switching module may include at least one pulse input interface, at least one pulse output interface, and a programmable relay. Each of the pulse input interfaces is connected to at least one of the first connectors. The pulse input interface is used to obtain the test signal obtained by each of the connected first connectors, and the test signal belongs to a pulse signal. Each of the pulse output interfaces is connected to at least one second connector. The pulse output interface is used to output the obtained test signal to the connected second connector. The programmable relay is respectively connected to the at least one pulse input interface and the at least one pulse output interface. The programmable relay is used to control the connection between at least one of the pulse input interfaces and at least one of the pulse output interfaces, so that the test signal obtained by the pulse input interface is output to the connected pulse output interface.

[0079] It should be noted that the pulse switching module may further include a controller. The controller is used to control the programmable relay in response to the signal adaptation instruction output by the embedded system, so that the corresponding pulse input interface and pulse output interface can be connected, thereby transmitting the corresponding test signal to the device under test.

[0080] It can be understood that in an alternative embodiment, in combination with Figure 6 , in order to meet the test requirements based on analog signals, the above relay array module may include an analog switching module.

[0081] Specifically, the analog switching module may include at least one analog input interface, at least one analog output interface, and a programmable relay. Each of the analog input interfaces is connected to at least one of the first connectors. The analog input interface is used to obtain the test signal obtained by each of the connected first connectors, and the test signal belongs to an analog signal. Each of the analog output interfaces is connected to at least one second connector. The analog output interface is used to output the obtained test signal to the connected second connector. The programmable relay is respectively connected to the at least one analog input interface and the at least one analog output interface. The programmable relay is used to control the connection between at least one of the analog input interfaces and at least one of the analog output interfaces, so that the test signal obtained by the analog input interface is output to the connected analog output interface.

[0082] It can be understood that in an alternative embodiment, in combination with Figure 6 , in order to meet the test requirements based on a multimeter, the above relay array module may include a multimeter switching module.

[0083] Specifically, the multimeter switching module may include at least one multimeter input interface, at least one multimeter output interface, and a programmable relay. Among them, each of the multimeter input interfaces is connected to at least one of the first connectors, and the multimeter input interface is used to obtain the test signal obtained by each of the connected first connectors, and this test signal belongs to the multimeter signal. Each of the multimeter output interfaces is connected to at least one second connector, and the multimeter output interface is used to output the obtained test signal to the connected second connector. The programmable relay is respectively connected to the at least one multimeter input interface and the at least one multimeter output interface, and the programmable relay is used to control the connection between at least one of the multimeter input interfaces and at least one of the multimeter output interfaces, so that the test signal obtained by this multimeter input interface is output to the connected multimeter output interface.

[0084] It can be understood that in an alternative implementation, in order to meet the test requirements based on simulation signals, the above relay array module may include a simulation module.

[0085] Specifically, the simulation module may include at least one simulation input interface, at least one simulation output interface, and a programmable relay. Among them, each of the simulation input interfaces is connected to at least one of the first connectors, and the simulation input interface is used to obtain the test signal obtained by each of the connected first connectors, and this test signal belongs to the simulation signal. Each of the simulation output interfaces is connected to at least one second connector, and the simulation output interface is used to output the obtained test signal to the connected second connector. The programmable relay is respectively connected to the at least one simulation input interface and the at least one simulation output interface, and the programmable relay is used to control the connection between at least one simulation input interface and at least one simulation output interface, so that the test signal obtained by this simulation input interface is output to the connected simulation output interface.

[0086] It should be noted that in an alternative implementation, the simulation module may be used to simulate resistors, and in other implementations, other simulations may also be performed.

[0087] Based on the above settings, in a specific application scenario, the following can be achieved:

[0088] For the self-checking requirements of the test system, the connections on the rear panel are as follows:

[0089] 1) Any interconnection of 24 RS422 / 232 / 485 serial ports;

[0090] 2) Any interconnection of 4 CAN interfaces;

[0091] 3) One-to-one interconnection of 6 pulse PWM inputs and 6 outputs;

[0092] 4) Any interconnection between DI (40 channels, digital signal input) and DO (40 channels, digital signal output), with the IO level set to 5V / 10V / 15V / 28V;

[0093] 5) One-to-one interconnection between 16 channels of AD and 16 channels of DA;

[0094] 6) Interconnection between 1 multimeter port and 1 resistor emulator;

[0095] 7) Interconnection between 1 multimeter port and 1 voltage output.

[0096] For the resource reuse requirement, the connections of the front and rear panels are as follows:

[0097] 1) Any interconnection between 24 channels of RS422 / 232 / 485 serial ports on the rear panel and 42 channels of RS422 / 232 / 485 serial ports on the front panel;

[0098] 2) Any interconnection between 4 CAN interfaces on the rear panel and 4 CAN interfaces on the front panel;

[0099] 3) One-to-one interconnection between 6 pulse PWM outputs on the rear panel and 6 PWM outputs on the front panel;

[0100] 4) One-to-one interconnection between 8 pulse PWM inputs on the rear panel and 8 PWM inputs on the front panel;

[0101] 5) Any interconnection between 1 pulse PWM output on the rear panel and 6 PWM outputs on the front panel;

[0102] 6) Any interconnection between 1 pulse PWM input on the rear panel and 8 PWM inputs on the front panel;

[0103] 7) Any interconnection between 40 channels of DI on the rear panel and 60 channels of DI on the front panel, with the IO level set to 5V / 10V / 15V / 28V;

[0104] 8) Any interconnection between 40 channels of DO on the rear panel and 50 channels of DO on the front panel, with the IO level set to 5V / 10V / 15V / 28V;

[0105] 9) Single-pole double-throw switching between 15 channels of DA on the rear panel and 30 channels of DA on the front panel (divided into two groups, 15 channels in each group);

[0106] 10) Any interconnection between 1 channel of DA on the rear panel and 31 channels of DA on the front panel;

[0107] 11) Single-pole double-throw switching between 15 channels of AD on the rear panel and 30 channels of AD on the front panel (divided into two groups, 15 channels in each group);

[0108] 12) Any interconnection between 1 channel of AD on the rear panel and 32 channels of AD on the front panel;

[0109] 13) The 2-channel resistance simulation on the rear panel is interconnected with the 2-channel resistance simulation on the front panel one by one;

[0110] 14) The 1-channel multimeter on the rear panel is interconnected with the 1-channel multimeter on the front panel;

[0111] For the virtual-real switching requirements, the connections on the rear panel are as follows:

[0112] 1) Any of the 42-channel RS422 / 232 / 485 serial ports are interconnected arbitrarily;

[0113] 2) Any of the 8-channel CAN interfaces are interconnected arbitrarily;

[0114] 3) The 6-channel pulse PWM inputs are interconnected with the 6-channel outputs one by one;

[0115] 4) DI (60 channels) and DO (50 channels) are interconnected arbitrarily, and the IO level is set to 5V / 10V / 15V / 28V.

[0116] In summary, in the automatic test adapter and the automatic test system provided by the present invention, there are multiple first connectors on the first panel, which are used to connect to the output end of the test device to obtain the test signals output by the test device. There are multiple second connectors on the second panel, which are used to connect to the input end of the device under test to output at least one obtained test signal to the connected device under test. There is a signal adaptation module on the third panel. The signal adaptation module is respectively connected to multiple first connectors and multiple second connectors, and is used to respond to the received signal adaptation instruction, and send the test signal output by the first connector to the corresponding device under test through the corresponding second connector, so as to perform corresponding device test operations on the device under test. Based on the above content, since multiple first connectors and multiple second connectors will be configured, and the signal adaptation module can, based on the signal adaptation instruction, send the test signal output by the first connector to the corresponding device under test through the corresponding second connector, thus, the switching adaptation of input and output based on the signal adaptation instruction can be realized. Therefore, manual wiring modification is not required, and the test efficiency can be fully improved, thereby improving the problem of low test efficiency existing in the prior art. Especially for the test scenarios with multiple requirements and multiple devices, the application value is relatively high.

[0117] The above are only the preferred embodiments of the present invention and are not used to limit the present invention. For those skilled in the art, the present invention can have various changes and modifications. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims

1. An automatic test adapter, characterized in that The automatic test adapter is applied to an automatic test system, and the automatic test system further includes at least one test device and at least one device under test that are respectively connected to the automatic test adapter. The automatic test adapter includes: A first panel, wherein a plurality of first connectors are provided on the first panel, and the plurality of first connectors are used to connect to at least one output end of at least one of the test devices to obtain at least one test signal output by at least one of the test devices; A second panel, wherein a plurality of second connectors are provided on the second panel, and the plurality of second connectors are used to connect to at least one input end of at least one of the devices under test to output the obtained at least one test signal to the connected device under test; A third panel, wherein a signal adaptation module is provided on the third panel. The signal adaptation module is respectively connected to the plurality of first connectors and the plurality of second connectors, and the signal adaptation module is configured to, in response to a received signal adaptation instruction, send each test signal output by the plurality of first connectors to the corresponding device under test through the corresponding second connector to perform corresponding device test operations on the device under test. The signal adaptation module includes: an embedded system, wherein the embedded system is connected to a host computer and is used to receive the signal adaptation instruction sent by the host computer; a digital signal adaptation module, wherein the digital signal adaptation module is respectively connected to the embedded system, at least one of the first connectors, and at least one of the second connectors, and is used to, in response to the signal adaptation instruction received by the embedded system, send each test signal output by the connected at least one first connector to the corresponding second connector; a relay array module, wherein the relay array module is respectively connected to the embedded system, at least one of the first connectors, and at least one of the second connectors, and is used to, in response to the signal adaptation instruction received by the embedded system, send each test signal output by the connected at least one first connector to the corresponding second connector.

2. The automatic test adapter according to claim 1, wherein The digital signal adaptation module includes: At least one input communication interface, wherein each input communication interface is connected to at least one of the first connectors, and each input communication interface is used to obtain each test signal output by the connected first connector; An input serial interface conversion chip, wherein the input serial interface conversion chip is respectively connected to the at least one input communication interface, and the input serial interface conversion chip is used to perform protocol conversion processing on the test signals obtained by the at least one input communication interface and output them; A field programmable gate array, wherein the field programmable gate array is connected to the input serial interface conversion chip, and the field programmable gate array is used to perform signal conditioning processing on the test signals output by the input serial interface conversion chip and output them; Output serial interface conversion chip, wherein the output serial interface conversion chip is connected to the field programmable gate array, and the output serial interface conversion chip is used to perform protocol conversion processing on the test signal output by the field programmable gate array and output it; At least one output communication interface, wherein each of the output communication interfaces is respectively connected to the output serial interface conversion chip and at least one second connector, and each of the output communication interfaces is respectively used to obtain the test signal output by the output serial interface conversion chip and output the test signal to the connected second connector.

3. The automatic test adapter according to claim 1, characterized in that, The digital signal adaptation module includes: At least one input communication interface, wherein each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is used to obtain each test signal output by each of the connected first connectors; First controller area network transceiver unit, wherein the first controller area network transceiver unit is respectively connected to the at least one input communication interface, and the first controller area network transceiver unit is used to perform signal adaptation processing on the test signals obtained by the at least one input communication interface and output them; Field programmable gate array, wherein the field programmable gate array is connected to the first controller area network transceiver unit, and the field programmable gate array is used to perform signal conditioning processing on the test signals output by the first controller area network transceiver unit and output them; Second controller area network transceiver unit, wherein the second controller area network transceiver unit is connected to the field programmable gate array, and the second controller area network transceiver unit is used to perform signal adaptation processing on the test signals output by the field programmable gate array and output them; At least one output communication interface, wherein each of the output communication interfaces is respectively connected to the second controller area network transceiver unit and at least one second connector, and each of the output communication interfaces is respectively used to obtain the test signal output by the second controller area network transceiver unit and output the test signal to the connected second connector.

4. The automatic test adapter according to claim 1, wherein The digital signal adaptation module includes: At least one digital input interface, wherein each of the digital input interfaces is connected to at least one of the first connectors, and each of the digital input interfaces is used to obtain each test signal output by each of the connected first connectors; Isolation unit, wherein the isolation unit is respectively connected to the at least one digital input interface, and the isolation unit is used to perform signal isolation processing on the test signals obtained by the at least one digital input interface and output them; Field programmable gate array, wherein the field programmable gate array is connected to the isolation unit, and the field programmable gate array is used to perform signal conditioning processing on the test signals output by the isolation unit and output them; Buffer unit, wherein the buffer unit is connected to the field programmable gate array, and the buffer unit is used to perform signal isolation and level conversion processing on the test signals output by the field programmable gate array and output them; At least one digital output interface, wherein each of the digital output interfaces is respectively connected to the buffer unit and at least one second connector, and each of the digital output interfaces is respectively configured to obtain a test signal output by the buffer unit and output the test signal to the connected second connector.

5. The automatic test adapter according to claim 1, characterized in that The relay array module includes a pulse switching module, and the pulse switching module includes: At least one pulse input interface, wherein each of the pulse input interfaces is connected to at least one of the first connectors, and the pulse input interface is configured to obtain a test signal obtained by each of the connected first connectors, and the test signal belongs to a pulse signal; At least one pulse output interface, wherein each of the pulse output interfaces is connected to at least one second connector, and the pulse output interface is configured to output the obtained test signal to the connected second connector; A programmable relay, wherein the programmable relay is respectively connected to the at least one pulse input interface and the at least one pulse output interface, and the programmable relay is configured to control the connection of at least one of the pulse input interfaces and at least one of the pulse output interfaces, so that the test signal obtained by the pulse input interface is output to the connected pulse output interface.

6. The automatic test adapter according to claim 1, characterized in that, The relay array module includes an analog switching module, and the analog switching module includes: At least one analog input interface, wherein each of the analog input interfaces is connected to at least one of the first connectors, and the analog input interface is configured to obtain a test signal obtained by each of the connected first connectors, and the test signal belongs to an analog signal; At least one analog output interface, wherein each of the analog output interfaces is connected to at least one second connector, and the analog output interface is configured to output the obtained test signal to the connected second connector; A programmable relay, wherein the programmable relay is respectively connected to the at least one analog input interface and the at least one analog output interface, and the programmable relay is configured to control the connection of at least one of the analog input interfaces and at least one of the analog output interfaces, so that the test signal obtained by the analog input interface is output to the connected analog output interface.

7. The automatic test adapter according to claim 1, characterized in that The relay array module includes a multimeter switching module, and the multimeter switching module includes: At least one multimeter input interface, wherein each of the multimeter input interfaces is connected to at least one of the first connectors, and the multimeter input interface is configured to obtain a test signal obtained by each of the connected first connectors, and the test signal belongs to a multimeter signal; At least one multimeter output interface, wherein each of the multimeter output interfaces is connected to at least one second connector, and the multimeter output interface is configured to output the obtained test signal to the connected second connector; A programmable relay, wherein the programmable relay is respectively connected to the at least one multimeter input interface and the at least one multimeter output interface, and the programmable relay is configured to control the connection of at least one of the multimeter input interfaces and at least one of the multimeter output interfaces, so that the test signal obtained by the multimeter input interface is output to the connected multimeter output interface.

8. The automatic test adapter according to claim 1, characterized in that The relay array module includes a simulation module, and the simulation module includes: At least one simulation input interface, wherein each of the simulation input interfaces is connected to at least one of the first connectors, and the simulation input interface is configured to obtain the test signals obtained by each of the connected first connectors, and the test signals belong to simulation signals; At least one simulation output interface, wherein each of the simulation output interfaces is connected to at least one of the second connectors, and the simulation output interface is configured to output the obtained test signals to the connected second connectors; A programmable relay, wherein the programmable relay is respectively connected to the at least one simulation input interface and the at least one simulation output interface, and the programmable relay is configured to control the at least one simulation input interface to communicate with the at least one simulation output interface, so that the test signals obtained by the simulation input interface are output to the communicated simulation output interface.

9. An automatic test system, characterized in that, Comprising: The automatic test adapter according to any one of claims 1-8; At least one test device and at least one device under test respectively connected to the automatic test adapter, wherein at least one test signal output by the at least one test device is transmitted to the at least one device under test through the automatic test adapter, so that corresponding device test operations are performed on the at least one device under test by the at least one test signal.

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