Product aging test method and device, electronic equipment and storage medium

Abstract

The invention discloses a product aging test method and device, an electronic device and a storage medium, the method is used for testing a product connected to a test platform, a plurality of to-be-tested product modules are provided on an interactive interface, each to-be-tested product module corresponds to an adaptable to-be-tested product on the test platform, and the to-be-tested product module is used for testing the to-be-tested product on the test platform. Each to-be-tested product module comprises a plurality of test plans, and each test plan has starting, pausing and terminating functions; in response to selecting the test plan, providing a configuration related to the selected test plan for modification and confirmation; and in response to starting the test plan, testing according to configuration of the test plan and recording a test process to generate a test log. According to the invention, many defects and problems existing in manual power-off and power-on test are solved, so that the test efficiency and accuracy are greatly improved.

Description

Technical Field

[0001] The present application relates to the field of automated testing, and in particular to a method, device, electronic equipment and storage medium for aging testing of a product. Background Art

[0002] Currently, power-off and power-on testing, voltage fluctuation testing, and signal line fluctuation testing are important links in product testing. Automatic testing technology can be used to test the product's response speed, stability, and recovery ability during power-off and power-on processes, and to comprehensively monitor and evaluate product performance and status.

[0003] At present, the aging test methods commonly used in the industry are mostly implemented through PLC and some manual dial relays.

[0004] Manual testing requires testers to repeatedly perform power-off and power-on operations, as well as voltage fluctuation tests. This repetitive work is not only time-consuming and labor-intensive, but also prone to errors. As the number of tests increases, the time and human resource costs required for manual testing will also increase accordingly, which is particularly costly for large-scale or long-term aging tests. Manual power-off and power-on testing cannot achieve continuous, real-time monitoring and testing, and cannot promptly detect and handle problems that arise during the test process.

[0005] The results of manual testing are often affected by the tester's subjective influence, such as improper operation, careless observation, etc., which may lead to deviations in test results. Since manual testing lacks unified standards and processes, there may be differences in operation between different testers, resulting in inconsistent test results. Summary of the invention

[0006] The embodiments of the present application provide a product aging test method, device, electronic device and storage medium, which are used to solve the technical problems in the prior art that manual testing is time-consuming, labor-intensive and error-prone.

[0007] According to one aspect of the present application, a product aging test method is provided, which is used to test a product connected to a test platform, comprising:

[0008] Providing several product modules to be tested on the interactive interface, each of which corresponds to a product to be tested that can be adapted on the test platform, and each of which includes several test plans, each of which has the functions of starting, pausing, and terminating;

[0009] In response to selecting a test plan, providing a configuration associated with the selected test plan for modification and confirmation;

[0010] In response to starting the test plan, the test is performed according to the configuration of the test plan and the test process is recorded to generate a test log.

[0011] Furthermore, the product module to be tested provides plan creation and plan deletion functions;

[0012] When the plan is newly created, if the corresponding product to be tested communicates through the standard Modbus TCP protocol, a Modbus TCP client is created in each product to be tested module and passed into each test plan by reference to communicate with the product to be tested; if the corresponding product to be tested communicates through a serial port, the serial port is selected in the plan module during the plan creation process, and the serial port is occupied when the plan is confirmed to be created;

[0013] When the plan is deleted, if the corresponding product to be tested communicates via a serial port, the serial port occupied by the product to be tested under the plan is released.

[0014] Furthermore, the current globally synchronized data structure is provided on the interactive interface, including the serial port usage, network port usage, and existing plan status;

[0015] The globally synchronized data structure is synchronized to each of the modules of the product to be tested by reference.

[0016] Furthermore, an asynchronous execution mode is adopted between test plans in different modules of the product to be tested; and an asynchronous execution mode is adopted between different test plans under a certain module of the product to be tested.

[0017] Furthermore, a certain test plan includes a plurality of operation units, and the operation units in the same test plan are executed synchronously.

[0018] Furthermore, the operation units in the same test plan are executed synchronously, including:

[0019] The time intervals between the operation units are configured in the relevant configurations of the test plan, and Interval scheduling is used to trigger the execution of each of the operation units based on the time intervals.

[0020] Furthermore, the test log is studied to obtain the correlation between the parameters of the product to be tested and the faults.

[0021] A second aspect of the present application provides a device for product aging testing, comprising:

[0022] A plan providing module, used for providing several product modules to be tested on the interactive interface, each of which corresponds to a product to be tested adaptable on the test platform, each of which includes several test plans, each of which has the functions of starting, pausing and terminating;

[0023] A configuration module, for providing, in response to selecting a test plan, a configuration associated with the selected test plan for modification and confirmation;

[0024] The execution module is used to respond to the start of the test plan, perform the test according to the configuration of the test plan and record the test process to generate a test log.

[0025] The third aspect of the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the electronic device implements the method described in the first aspect of the present application.

[0026] The fourth aspect of the present application provides a computer-readable storage medium, which is used to store a computer program. When the computer program runs on a computer, the computer executes the method described in the first aspect of the present application.

[0027] Beneficial Effects

[0028] In an embodiment of the present application, a product aging test method is used to test products connected to a test platform, including: providing a number of product modules to be tested on an interactive interface, each of the product modules to be tested corresponds to a product to be tested that can be adapted on the test platform, each of the product modules to be tested includes a number of test plans, each of the test plans has start, pause, and terminate functions; in response to selecting a test plan, providing a configuration related to the selected test plan for modification and confirmation; in response to starting the test plan, testing is performed according to the configuration of the test plan and the test process is recorded to generate a test log. This application solves many drawbacks and problems in manual power-off and power-on testing, thereby greatly improving test efficiency and accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The drawings constituting a part of the present application are used to provide a further understanding of the present application. The illustrative embodiments and descriptions of the present application are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0030] Figure 1 It is a flow chart of an aging test method for a product according to an embodiment of the present application.

[0031] Figure 2 It is a schematic diagram of the architecture of a procedure of an aging test method for a product according to an embodiment of the present application.

[0032] Figure 3 It is a structural schematic diagram of an aging test device for a product according to an embodiment of the present application.

[0033] Figure 4 is a schematic diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0034] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0035] It should be noted that the steps shown in the flowcharts of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and that, although a logical order is shown in the flowcharts, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0036] In order to improve test efficiency, reduce costs, enhance test accuracy and reliability, and expand the scope and depth of testing, the embodiments of the present application provide an automatic power-off and power-on aging test device, which can automatically perform test operations such as power-off and power-on through preset test processes and parameters, and record and analyze test results in real time; it can also analyze and process the data collected during the test, generate a detailed test report, and push it to the tester.

[0037] The automated testing device includes a testing platform for providing various structures for connecting with various products to be tested, and a computer program, in which the communication between the automated testing device and the product to be tested, the management of the entire life cycle of the test plan, the recording and analysis of the test results are established, and at least one display is included to provide a human-computer interaction interface for testers to make necessary test plan settings and view relevant data.

[0038] like Figure 1 The flowchart of a product aging test method according to an embodiment of the present application is shown in FIG. 1 , which is used to test a product connected to a test platform. The method is executed based on a scheduling middle platform, which has a main program and several subprograms associated with the main program through sub-interfaces, such as Figure 3 The figure shows the relationship between the main program and each module in this embodiment. The connection between the main program and each subprogram adopts a tree structure, and each subprogram is in parallel. The main program is the main display interface and program entry. The data structure that needs global synchronization is defined in the main program, and the subprogram is each specific test module.

[0039] Depend on Figure 1 It can be seen that a product aging test method of an embodiment of the present application includes the following steps:

[0040] Step S102: provide a plurality of product modules to be tested on the interactive interface, each of the product modules to be tested corresponds to a product to be tested that is adaptable on the test platform, each of the product modules to be tested includes a plurality of test plans, and each of the test plans has the functions of starting, pausing, and terminating.

[0041] The product module to be tested can support a variety of different types of modules, such as relay modules, intelligent power modules, etc., and each product module to be tested is in parallel. Common test plans include power-off and power-on tests, voltage fluctuation tests, and signal line fluctuation tests. Each product module to be tested corresponds to a subroutine, which is implemented based on a programmable IO controller to achieve automatic control of the test process after the plan is set.

[0042] On the interactive interface, each product module to be tested is presented in a list format. By selecting a specific list, you can view the specific test plan under the product module to be tested.

[0043] Step S104: In response to selecting a test plan, providing a configuration related to the selected test plan for modification and confirmation.

[0044] The relevant configurations corresponding to each test plan can be set accordingly. For example, the configuration of a test plan includes but is not limited to running time, cycle time, corresponding equipment, etc.

[0045] For example, for a product to be tested, the tester edits the power-off and power-back test plan for the device: including power-off for X minutes, power-on for Y minutes, and the duration.

[0046] For example, for a certain product to be tested, the tester also carries out a power supply fluctuation test plan for the device: input the power supply range of the product to be tested as 5-8V, and select orderly increase or decrease, or disorderly change to perform power supply fluctuation test; the power supply fluctuation on the interactive interface is settable, and by setting the power supply fluctuation, the effect of simulating different degrees of battery attenuation is achieved, so as to test the changes of the device under battery attenuation, and test the working conditions of the device under extremely low voltage, etc.

[0047] Step S106: In response to starting the test plan, perform the test according to the configuration of the test plan and record the test process to generate a test log.

[0048] This embodiment configures the preset test process and parameters, generates a specific function code group package and sends the corresponding operation data to accurately control the operation of the test equipment. It can automatically and continuously execute various plans without human intervention, thereby greatly reducing the time and human resources required for testing. This automated testing method is particularly suitable for large-scale, long-term aging test tasks, and can significantly improve the overall test efficiency. In addition, users can configure parameters in the configuration file according to their needs, thereby improving the universality of the test. Through this device, remote control and automated operation can also be implemented, and the test equipment can be directly controlled at the application level to perform background tasks such as reading and writing, thereby avoiding direct contact between testers and equipment and products, and effectively reducing safety risks.

[0049] The supporting software of the automated test device of this embodiment can automatically record the execution data and monitor the operation status of the equipment in real time when executing the plan. Once data inconsistency or other abnormal conditions are found, the software will automatically terminate the test plan and take protective measures, such as shutting down the output. The real-time monitoring and recording method can ensure the accuracy and reliability of the test data and avoid test errors caused by human factors.

[0050] The communication between an automated test device and the product under test in this embodiment needs to be connected to the terminal device and read and send data through a protocol library according to the communication protocol supported by the product under test. The communication protocol includes a serial port and a network port.

[0051] Therefore, in some preferred embodiments, the product module to be tested provides plan creation and plan deletion functions.

[0052] Make selections during the connection initialization phase based on the communication protocol characteristics of the product under test:

[0053] If the corresponding product to be tested communicates through the standard Modbus TCP protocol when the plan is newly created, a Modbus TCP client is created in each product to be tested module and passed into each test plan by reference to communicate with the product to be tested; if the corresponding product to be tested communicates through a serial port, the serial port is selected in the plan module during the plan creation process, and the serial port is occupied when the plan is confirmed to be newly created.

[0054] When the plan is deleted, if the corresponding product to be tested communicates via a serial port, the serial port occupied by the product to be tested under the plan is released.

[0055] In the above embodiment, the establishment of communication between the product to be tested and the automated testing device is achieved during the plan generation process, and the disconnection of communication between the two is achieved after the plan is deleted.

[0056] When creating a new plan, a connection request will be sent through the communication protocol library supported by the terminal module to check whether it can be connected to the terminal module to which the plan belongs. If it cannot be connected normally, a prompt window will pop up and the new plan will be automatically canceled. When it can be connected to the terminal module normally, a plan parameter setting window will pop up, and the user can set the specific parameters in the plan. When confirming the new plan, it will automatically check whether the set parameters meet the requirements. Only when they meet the requirements can the plan be successfully established, otherwise a prompt window will pop up indicating that the corresponding parameters do not meet the requirements. After the plan is successfully established, the plan can be started. After the plan is started, the plan will be executed according to the parameter settings in the plan. The plan can be paused during the execution of the plan. After the plan is paused, the plan can be resumed. When the plan execution time reaches the running time set in the plan, the plan will be automatically stopped. After stopping the plan, the plan end message will be pushed through the custom robot to realize the timely notification of the plan end message. After the plan is established, the plan can be deleted. When the plan is deleted, the ports and other resources occupied by the plan will be automatically released so that they can be selected when the next plan is created.

[0057] In certain preferred embodiments, in order to ensure the consistency of data in the main program and each product module to be tested, the method includes: providing the current globally synchronized data structure on the interactive interface, including serial port usage, network port usage, and existing plan status; the globally synchronized data structure is synchronized to each of the product modules to be tested by reference.

[0058] Regardless of whether you are currently in the product module under test, you can view the current global synchronized data structure, which is convenient for users to understand the current use of the automated test device. When you need to set a specific plan in a product module under test, you can also see the global data structure and select the current appropriate resources, such as idle serial ports, to participate in the execution of the plan.

[0059] In some optional embodiments, in order to improve the utilization rate of resources in the automated test device, this embodiment also provides the following serial port recommendation method when creating a new plan, that is, in the product module to be tested, the serial port is selected during the plan creation process, including:

[0060] Get all existing plans, including established but not running plans, running plans, suspended plans and terminated plans, and obtain the non-set running time interval T1 corresponding to the established but not running plans, the time after the end of the plan T2 corresponding to the running plans, the pause time interval T3 corresponding to the suspended plans, and the available time interval T4 of the terminated plans. T1, T2, T3 and T4 are the available time of the serial port corresponding to each plan;

[0061] For each serial port, if the serial port is currently participating in a plan, obtain the available time of the serial port corresponding to each participating plan to form the first available time set of the serial port; if the serial port is not participating in any plan, take all the time after the current time as the second available time set of the serial port;

[0062] Input the number of serial ports and the required time for the current new plan, preferentially select the serial ports with the first available time set whose number of serial ports and the available time of the serial ports both meet the current new plan as the first priority serial ports, and present the first priority serial ports on the interactive interface in the form of a first mark;

[0063] When the number of serial ports and the required time for the current new plan cannot be met from the serial ports in the first available time set, a second priority serial port is selected from the serial ports in the second available time set, and the second priority serial port is presented on the interactive interface in the form of a second mark.

[0064] Through the above method, each serial port can be fully utilized to adapt to different plans, and the utilization rate of the serial port can be maximized, so that the method can run multiple test plans at the same time.

[0065] In certain preferred embodiments, Figure 2 As shown, the test plans in different modules of the product to be tested are executed asynchronously; different test plans under a certain module of the product to be tested are executed asynchronously. A certain test plan includes several operation units, and the operation units in the same test plan are executed synchronously.

[0066] The tasks between modules of the product to be tested are executed asynchronously, and the asynchronous method is also used between different plans in the same module. The asynchronous method means that each task and plan has an independent storage and execution space, and all plans can be carried out simultaneously without interfering with each other. In the same test plan, each operation unit is executed synchronously. The test plan contains all the selected plan parameters and event operations such as starting the plan, pausing the plan, continuing the plan, and terminating the plan. The synchronous execution mechanism ensures that the access and modification of key data will not cause deadlock, so that the key data structure maintains a consistent state. The plan is used as the smallest synchronous execution unit, which also enhances the scalability of the main program.

[0067] In some preferred embodiments, the operation units in the same test plan are executed synchronously, including:

[0068] The time interval between the operation units is configured in the relevant configuration of the test plan, and Interval scheduling is used to trigger the execution of each operation unit based on the time interval. Interval scheduling is a task scheduling method that triggers the execution of tasks based on time intervals. The time interval is the period set in the plan. Tasks are executed in the background thread, allowing the main thread to continue processing other tasks, thereby not blocking the execution of the main thread.

[0069] In some preferred embodiments, the test log is studied to obtain the correlation between the parameters of the product to be tested and the faults.

[0070] As the test data continues to increase, the requirements for data processing and analysis capabilities are also getting higher and higher. The device needs to be equipped with an advanced data processing and analysis system. Each task execution includes multiple read and write operations on the device terminal, and these operations will be stored in the form of log data. This embodiment provides a machine learning model to learn the historical log data, so as to obtain a trained machine learning module, which can analyze real-time data, determine whether the real-time data reflects abnormal conditions, and push it through the message push module when necessary to make timely adjustments.

[0071] In some embodiments, the machine learning model is implemented by Python, which has a rich data analysis library, such as Nunpy, Pandas, Matplotlib, etc., and Python can greatly improve data processing capabilities. In addition, Python can implement multi-threaded and multi-process tasks through threading libraries and multiprocessing libraries. Data processing and analysis tasks are divided into different threads and processes according to CPU intensiveness and I / O intensiveness and executed in the background, which can greatly improve the speed of data processing and analysis. Data such as program running and power-off operations on terminal devices will be recorded in the log. Accumulating a large amount of log data can be used to deeply mine and analyze test data, extract log data when abnormal situations occur in test data and perform data analysis, statistically summarize the rules when abnormal situations occur, and promptly investigate and solve corresponding problems.

[0072] For example, for testing power-off and power-on devices, by monitoring the communication status of the devices, devices with IP are monitored in real time through PING packets. Once an abnormality occurs in the device during the test, the test plan is suspended in time and pushed to the tester through DingTalk. Python has a wealth of deep learning libraries and frameworks, such as TensorFlow, PyTorch, Keras, etc. The test data is used as a test set. After a certain degree of data cleaning and data conversion, the original data is converted into a format that can be used for deep learning model training, such as converting time series related data into Numpy arrays or Pandas DataFrame, and then extracting features through convolutional neural networks or recurrent neural networks in the deep learning model to mine potential rules and patterns in the data, such as mining the rules and patterns of device crashes and communication anomalies when the device is frequently powered off and restored, and troubleshooting and solving problems, providing strong data support for subsequent product improvements and optimizations. It can also learn according to the test plan formulated by the tester, sort out the standard test model of the system, and incubate the aging test standards of each system.

[0073] Based on the same inventive concept as the above method embodiment, a device for product aging testing in the embodiment of the present application is as follows: Figure 3 As shown, the device for product aging test comprises:

[0074] A plan providing module, used for providing several product modules to be tested on the interactive interface, each of which corresponds to a product to be tested adaptable on the test platform, each of which includes several test plans, each of which has the functions of starting, pausing and terminating;

[0075] A plan configuration module, for providing configuration related to the selected test plan for modification and confirmation in response to selecting the test plan;

[0076] The plan execution module is used to respond to the start of the test plan, perform the test according to the configuration of the test plan and record the test process to generate a test log.

[0077] In some preferred embodiments, the plan providing module includes:

[0078] The plan creation module is used for creating a new plan. If the corresponding product to be tested communicates through the standard Modbus TCP protocol, a Modbus TCP client is created in each product to be tested module and passed into each test plan by reference to communicate with the product to be tested; if the corresponding product to be tested communicates through a serial port, the serial port is selected in the plan creation process in the plan module, and the serial port is occupied when the plan is confirmed to be created.

[0079] The plan deletion module is used to release the serial port occupied by the product under test under the plan when the plan is deleted, if the corresponding product under test communicates through the serial port.

[0080] In some preferred embodiments, it also includes:

[0081] The data providing module is used to provide the current globally synchronized data structure on the interactive interface, including serial port usage, network port usage, and existing plan status; the globally synchronized data structure is synchronized to each of the modules of the product to be tested by reference.

[0082] In some preferred embodiments, it also includes:

[0083] The machine learning module is used to learn the test logs to obtain the correlation between the parameters of the product to be tested and the faults.

[0084] It should be noted that, although several units or subunits of the device are mentioned in the above detailed description, this division is merely exemplary and not mandatory. In fact, according to the embodiments of the present application, the features and functions of two or more units described above can be embodied in one unit. Conversely, the features and functions of one unit described above can be further divided into multiple units to be embodied.

[0085] Based on the same inventive concept as the above-mentioned method embodiment, an electronic device is also provided in an embodiment of the present application, including a memory, a processor, and a computer program stored in the memory and executable on the processor, and when the processor executes the computer program, the electronic device implements the control method in the above-mentioned embodiment.

[0086] In one embodiment, the electronic device may be a server. In this embodiment, the structure of the electronic device may be as follows: Figure 4 As shown, it includes a memory 2001 , a communication module 2003 and one or more processors 2002 .

[0087] The memory 2001 is used to store computer programs executed by the processor 2002. The memory 2001 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system and programs required for running the instant messaging function, etc.; the data storage area may store various instant messaging information and operation instruction sets, etc.

[0088] The memory 2001 may be a volatile memory, such as a random-access memory (RAM); the memory 2001 may also be a non-volatile memory, such as a read-only memory, a flash memory, a hard disk drive (HDD) or a solid-state drive (SSD); or the memory 2001 may be any other medium that can be used to carry or store a desired computer program in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto. The memory 2001 may be a combination of the above memories.

[0089] The processor 2002 may include one or more central processing units (CPU) or a digital processing unit, etc. The processor 2002 is used to implement the above-mentioned audio data processing method when calling the computer program stored in the memory 2001 .

[0090] The communication module 2003 is used to communicate with terminal devices and other servers.

[0091] The specific connection medium between the memory 2001, the communication module 2003 and the processor 2002 is not limited in the embodiment of the present application. Figure 4 In the embodiment, the memory 2001 and the processor 2002 are connected via a bus 2004. The bus 2004 is Figure 4 The arrows in the figure are used to describe the connection between other components, which is only for illustrative purposes and is not intended to be limiting. Bus 2004 can be divided into address bus, data bus, control bus, etc. For ease of description, Figure 4 The diagram shows that only one arrow is used, but this does not mean that there is only one bus or only one type of bus.

[0092] Based on the same inventive concept as the above method embodiment, an embodiment of the present invention also provides a computer-readable storage medium, the computer-readable storage medium is used to store a computer program, when the computer program is run on a computer, the electronic device implements the control method in the above embodiment. The computer-readable storage medium can be a readable signal medium or a readable storage medium. The readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination of the above. More specific examples of readable storage media (non-exhaustive list) include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0093] Based on the same inventive concept as the above-mentioned method embodiment, an embodiment of the present invention further provides a computer program product, the computer program product including a computer program. When the program product is run on an electronic device, the computer program is used to enable the electronic device to execute the steps of the control method according to various exemplary embodiments of the present application described above in this specification. The program product may adopt any combination of one or more readable media. These computer program commands may be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the commands executed by the processor of the computer or other programmable data processing device generate commands for implementing the steps in the process Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0094] Although the preferred embodiments of the present application have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications falling within the scope of the present application.

Claims

1. A product aging test method, used to test a product connected to a test platform, characterized in that: Providing several product modules to be tested on the interactive interface, each of which corresponds to a product to be tested that can be adapted on the test platform, and each of which includes several test plans, each of which has the functions of starting, pausing, and terminating; In response to selecting a test plan, providing a configuration associated with the selected test plan for modification and confirmation; In response to starting the test plan, the test is performed according to the configuration of the test plan and the test process is recorded to generate a test log.

2. The method according to claim 1, characterized in that The product module to be tested provides functions of creating a new plan and deleting a plan; When the plan is newly created, if the corresponding product to be tested communicates through the standard Modbus TCP protocol, a Modbus TCP client is created in each product to be tested module and passed into each test plan by reference to communicate with the product to be tested; if the corresponding product to be tested communicates through a serial port, the serial port is selected in the plan module during the plan creation process, and the serial port is occupied when the plan is confirmed to be created; When the plan is deleted, if the corresponding product to be tested communicates via a serial port, the serial port occupied by the product to be tested under the plan is released.

3. The method according to claim 2, characterized in that Provide the current global synchronization data structure on the interactive interface, including serial port usage, network port usage, and existing plans; The globally synchronized data structure is synchronized to each of the modules of the product to be tested by reference.

4. The method according to claim 3, characterized in that: The test plans within different modules of the product to be tested are executed asynchronously; the different test plans under a certain module of the product to be tested are executed asynchronously.

5. The method according to claim 3, characterized in that: A certain test plan includes a plurality of operation units, and the operation units in the same test plan are executed synchronously.

6. The method according to claim 5, characterized in that: The operation units in the same test plan are executed synchronously, including: The time intervals between the operation units are configured in the relevant configurations of the test plan, and Interval scheduling is used to trigger the execution of each of the operation units based on the time intervals.

7. The method according to claim 5, characterized in that: The test logs are studied to obtain the correlation between the parameters of the product under test and the faults.

8. A device for product aging testing, characterized in that: include: A plan providing module, used for providing several product modules to be tested on the interactive interface, each of which corresponds to a product to be tested adaptable on the test platform, each of which includes several test plans, each of which has the functions of starting, pausing and terminating; A configuration module, for providing, in response to selecting a test plan, a configuration associated with the selected test plan for modification and confirmation; The execution module is used to respond to the start of the test plan, perform the test according to the configuration of the test plan and record the test process to generate a test log.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the electronic device implements the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium is used to store a computer program, and when the computer program is run on a computer, the computer is caused to execute the method according to any one of claims 1 to 7.

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