Method and system for measuring frequency response characteristic of electronic device based on OFDM signal

Abstract

The invention relates to a method for measuring the frequency response characteristic of an electronic device based on an OFDM signal. The method comprises the following steps: generating a target input signal; accessing the target input signal to a first measurement object, and measuring a first output signal output by the first measurement object; accessing the first output signal to a second measurement object configured to be in a first state, and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal; and calculating first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal. Through the method, the measurement cost of the frequency response information of the electronic device can be reduced, and the measurement accuracy of the frequency response information can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of integrated circuits, and in particular to a method and system for measuring frequency response characteristics of electronic devices based on OFDM signals. Background Art

[0002] At present, there are two main methods for measuring the frequency response characteristics of integrated circuits. One is to use a vector network analyzer (VNA), connect the signal generated by the VNA to the integrated circuit, and then connect the output signal of the integrated circuit to another port of the VNA. This method uses the VNA instrument to obtain the frequency response characteristics of the integrated circuit. The other is to use a signal generator and a digital oscilloscope, connect the input signal generated by the signal generator to the integrated circuit, connect the input signal and the output signal of the integrated circuit to the digital oscilloscope, and use the digital oscilloscope to analyze and obtain the frequency response characteristics of the integrated circuit.

[0003] However, the above-mentioned related technologies have the following defects: 1) VNA and are too expensive, making the measurement cost of the frequency response characteristics of integrated circuits too high; 2) Digital oscilloscopes can only support the measurement of low-frequency signals and cannot support the measurement of high-frequency and medium-frequency signals, and have a narrow scope of application; 3) Using other low-cost instruments other than VNA and digital oscilloscopes cannot meet the measurement accuracy requirements of the frequency response characteristics of integrated circuits. Summary of the invention

[0004] In order to solve the deficiencies in the related art, the purpose of the present application is to provide a method and system for measuring the frequency response characteristics of electronic devices based on OFDM signals, which has the effects of reducing the cost of measuring the frequency response characteristics, increasing the frequency range of the frequency response characteristics measurement, and improving the accuracy of the frequency response characteristics measurement.

[0005] In a first aspect, the present application provides a method for measuring a frequency response characteristic of an electronic device based on an OFDM signal, comprising: generating a target input signal; Connecting the target input signal to a first measurement object, and measuring a first output signal output by the first measurement object; connecting the first output signal to a second measurement object configured in a first state, and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal; First frequency response information of the second measurement object in the first state is calculated according to a frequency response difference between the first output signal and the second output signal.

[0006] By adopting the above technical solution, it is possible to use low-cost equipment for measurement while meeting the measurement accuracy of the frequency response characteristics of the second measurement object, thereby reducing the cost of measurement.

[0007] Preferably, the generating of the target input signal comprises: Generate an initial OFDM-based input signal; The initial input signal is converted to obtain the target input signal, and the target input signal is sent.

[0008] By adopting the above technical solution, a target input signal that meets the frequency response characteristic measurement requirements can be generated, so that a relatively low-cost device can also accurately measure the frequency response characteristics of the second measurement object.

[0009] Preferably, the above method for measuring the frequency response characteristics of an electronic device based on OFDM signals further includes: modifying at least one configuration information of the second measurement object so that the second measurement object switches from the first state to a second state; the second state is different from the first state; Connecting the first output signal to the second measurement object in the second state, and measuring a third output signal output by the second measurement object; Second frequency response information of the second measurement object in the second state is calculated according to a frequency response difference between the first output signal and the third output signal.

[0010] By adopting the above technical solution, it is possible to measure the frequency response characteristics of the second measurement object in different configurations.

[0011] Preferably, the above method for measuring the frequency response characteristics of an electronic device based on OFDM signals further includes: According to the frequency response difference between the second output signal and the third output signal, third frequency response information of the second measurement object is calculated; the third frequency response information represents the frequency response change occurring when the second measurement object switches from the first state to the second state.

[0012] By adopting the above technical solution, it is possible to measure the frequency response characteristics exhibited when the state of the second measurement object is switched.

[0013] Preferably, the target input signal comprises at least two subcarrier signals, and the at least two target subcarrier signals are orthogonal to each other in the frequency domain and are implemented by orthogonal frequency division multiplexing technology.

[0014] By adopting the above technical solution, in the process of measuring the frequency response characteristics, it is possible to use low-cost equipment to measure the frequency response characteristics of the first measurement object and the second measurement object, thereby reducing the difficulty of improving the accuracy.

[0015] In a second aspect, the present application also proposes a system for measuring the frequency response characteristics of an electronic device based on an OFDM signal, comprising: A signal generating device, used for generating a target input signal; A first measuring device, used for connecting the target input signal to a first measuring object to obtain a first output signal output by the first measuring object; a second measuring device, configured to connect the first output signal to a second measuring object configured in a first state, and measure a second output signal output by the second measuring object; the second measuring object is different from the first measuring object, and the second output signal is different from the first output signal; The first calculation device is used to calculate first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal.

[0016] By adopting the above technical solution, it is possible to use low-cost equipment for measurement while meeting the measurement accuracy of the frequency response characteristics of the second measurement object, thereby reducing the cost of measurement.

[0017] Preferably, the signal generating device comprises: A signal generating unit, used for generating an initial input signal based on OFDM; The signal conversion unit is used to perform signal conversion on the initial input signal to obtain the target input signal and send the target input signal.

[0018] By adopting the above technical solution, a target input signal that meets the frequency response characteristic measurement requirements can be generated, so that a relatively low-cost device can also accurately measure the frequency response characteristics of the second measurement object.

[0019] Preferably, the system further comprises: a third measuring device, configured to connect the first output signal to the second measuring object in the second state and measure a third output signal output by the second measuring object when at least one configuration information of the second measuring object is changed and the second measuring object is switched from the first state to the second state; the second state is different from the first state; The second calculation device is used to calculate second frequency response information of the second measurement object in the second state according to the frequency response difference between the first output signal and the third output signal.

[0020] By adopting the above technical solution, it is possible to measure the frequency response characteristics of the second measurement object in different configurations.

[0021] Preferably, the system further comprises: A third calculation device is used to calculate third frequency response information of the second measurement object according to the frequency response difference between the second output signal and the third output signal; the third frequency response information represents the frequency response change that occurs when the second measurement object switches from the first state to the second state.

[0022] By adopting the above technical solution, it is possible to measure the frequency response characteristics exhibited when the state of the second measurement object is switched.

[0023] Preferably, the target input signal includes at least two target sub-signals, and the at least two target sub-signals are orthogonal to each other in the frequency domain and are implemented by orthogonal frequency division multiplexing technology.

[0024] By adopting the above technical solution, in the process of measuring the frequency response characteristics, it is possible to use low-cost equipment to measure the frequency response characteristics of the first measurement object and the second measurement object, thereby reducing the difficulty of improving the accuracy.

[0025] In summary, the beneficial effects of this application are: 1. Under the condition that the frequency response of the second measurement object is met, low-cost equipment is used for measurement, thereby reducing the cost of measurement; 2. Generate a target input signal that meets the frequency response characteristic measurement requirements. During the frequency response characteristic measurement process, it is beneficial for lower-cost equipment to measure the frequency response characteristics of the first measurement object and the second measurement object, thereby reducing the difficulty of improving accuracy; 3. Realize the measurement of the frequency response characteristics of the second measurement object in different configurations, and the measurement of the frequency response characteristics exhibited when the state of the second measurement object is switched. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 This is a flow chart of a method for measuring the frequency response characteristics of an electronic device based on OFDM signals provided in the present application.

[0027] Figure 2 It is a flowchart of a method for generating a target input signal provided in this application.

[0028] Figure 3 This is a flow chart of another method for measuring the frequency response characteristics of an electronic device based on OFDM signals provided by the present application.

[0029] Figure 4This is a flow chart of another method for measuring the frequency response characteristics of an electronic device based on OFDM signals provided by the present application.

[0030] Figure 5 This is a schematic diagram of a system framework for measuring the frequency response characteristics of electronic devices based on OFDM signals provided by the present application.

[0031] Figure 6 This is a schematic diagram of the system structure for measuring the frequency response characteristics of electronic devices based on OFDM signals provided by the present application.

[0032] Figure 7 This is another schematic diagram of the system structure for measuring the frequency response characteristics of electronic devices based on OFDM signals provided by the present application. DETAILED DESCRIPTION

[0033] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application.

[0034] Reference Figure 1 , is a flow chart of a method for measuring the frequency response characteristics of an electronic device based on an OFDM signal disclosed in the present application, which is applied to an integrated circuit, comprising: S101: Generate a target input signal; In the embodiment of the present application, the target input signal may be generated by a signal generating device, and may also be obtained by performing signal conversion on an initial input signal generated by the signal generating device.

[0035] In a specific embodiment, the target input signal may be a digital signal applied to digital circuit testing. Accordingly, the signal generating device may be a digital signal generator or a mixed signal generator.

[0036] In a specific embodiment, the target input signal may be an analog signal used for analog circuit testing. Accordingly, the signal generating device may be an analog signal generator or a mixed signal generator.

[0037] In a specific embodiment, the target input signal may be a low-frequency signal, a medium-frequency signal, or a high-frequency signal.

[0038] In practical applications, when the target input signal is a high-frequency signal, compared with the case where the target input signal is a low-frequency signal or an intermediate-frequency signal, the degree of influence of interference and multipath effects is lower, and the frequency response information measurement accuracy is higher.

[0039] S102: Connecting the target input signal to a first measurement object, and measuring a first output signal output by the first measurement object; In an embodiment of the present application, the first measurement object may be a reference measurement object. When the first measurement object serves as a carrier of the target input signal, the frequency response characteristic of the first output signal may be a reference frequency response characteristic. Specifically, the reference frequency response characteristic may include a reference amplitude characteristic and / or a reference phase characteristic.

[0040] It can be understood that the reference measurement object can be at least one signal transmission line, or a reference integrated circuit. The channel through which the target input signal is transmitted in the reference measurement object can be a reference channel. The reference frequency response characteristic can be a frequency response characteristic of the reference channel.

[0041] In practical applications, multiple signal transmission lines can be used to connect the output end of the signal generating device and the input end of the signal measuring device to form a path. When the target input signal passes through the path, the frequency response characteristics of the multiple signal transmission lines are measured.

[0042] S103: connecting the first output signal to a second measurement object configured in a first state, and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal; In the embodiment of the present application, the second measurement object may be a target measurement object, and the first state may be an initial state of the target measurement object, or may be other states other than the initial state, such as a standby state and a sleep state. When the target measurement object in the initial state serves as a carrier of the target input signal, the second output signal may be used to measure the initial frequency response characteristics of the target measurement object.

[0043] In a specific embodiment, the target measurement object may be an integrated circuit, including an analog circuit, a digital circuit, and a hybrid circuit, wherein the hybrid circuit may be used to process or transmit analog signals and digital signals.

[0044] It can be understood that when the target measurement object in the initial state serves as a carrier of the first output signal, the channel through which the first output signal is transmitted in the target measurement object may be an initial measurement channel. The frequency response characteristic of the initial measurement channel may be the initial frequency response characteristic.

[0045] In practical applications, the target measurement object may be an electronic device, such as a chip, and the chip is a packaged integrated circuit device.

[0046] In practical applications, at least one signal transmission line can be used to connect the output end of the signal generating device and the input end of the target measurement object, and at least one signal transmission line can be used to connect the output end of the target measurement object and the input end of the signal testing device to form a path. When the target input signal passes through the path, the frequency response characteristics of the initial measurement channel are measured and calculated.

[0047] S104: Calculate first frequency response information of the second measurement object in the first state according to a frequency response difference between the first output signal and the second output signal.

[0048] In an embodiment of the present application, when measuring the target measurement object, a signal transmission line is required to be used for connection to form a path between the signal generating device, the target measurement object and the signal analysis device, or to form a path between the signal generating device, the up-conversion device, the target measurement object, the down-conversion device and the signal analysis device.

[0049] It can be understood that the second output signal represents the total frequency response characteristics of the first measurement object and the second measurement object. The second output signal cannot directly reflect the frequency response characteristics of the target measurement object in the first state, and needs to be analyzed in combination with the frequency response characteristics of the first output signal.

[0050] In a specific embodiment, the first measurement object may also be a reference integrated circuit. In practical applications, when measuring the reference integrated circuit, a signal transmission line is required to be used for connection to form a path between the signal generating device, the reference integrated circuit and the signal analysis device, or to form a path between the signal generating device, the up-conversion device, the reference integrated circuit, the down-conversion device and the signal analysis device. In this case, the first output signal represents the total frequency response characteristics of the reference integrated circuit and the at least one signal transmission line. However, this does not affect the subsequent measurement of the frequency response characteristics of the second measurement object in the first state or the second state.

[0051] In a specific embodiment, when measuring the first output signal, if the first output signal is a high-frequency signal, when the first output signal is obtained, the first output signal is input into a down-conversion device, and the first output signal is down-converted to obtain a fourth output signal. When measuring the second output signal, if the second output signal is a high-frequency signal, the second output signal is input into a down-conversion device to obtain a fifth output signal. The first frequency response characteristic information is calculated based on the fourth output signal and the fifth output signal.

[0052] In a specific embodiment, the frequency response characteristic of the first output signal is It can be mathematically expressed as formula 1, the frequency response characteristic of the second output signal It can be mathematically expressed as Formula 2. According to the frequency response characteristic of the first output signal and the frequency response characteristic of the second output signal, the frequency response characteristic of the target measurement object is calculated. , see formula 3: , (Formula 1) , (Formula 2) , (Formula 3) in, for The amplitude characteristic parameters, for Phase characteristic parameters of for The amplitude characteristic parameters, for Phase characteristic parameters of for Amplitude characteristic parameters, for Phase characteristic parameters. Among them, The first output signal, the second output signal and the angular frequency of the first frequency response information.

[0053] According to formula (3), the amplitude characteristic of the second measurement object in the first state is , the phase characteristic is .

[0054] Through the above scheme, the frequency response characteristics of the second measurement object in different states can be accurately measured. This scheme is applicable to a variety of signal generating devices and signal analyzing devices, does not rely on expensive signal generating devices and signal analyzing devices, and can effectively reduce costs.

[0055] In a specific embodiment, Figure 2 FIG. 1 is a flow chart of a method for generating a target input signal provided by the present application, wherein generating the target input signal comprises: S201: Generate an initial input signal based on OFDM; In a specific embodiment, the initial input signal may be a baseband signal, and the baseband signal may be a low-frequency OFDM signal. When the signal generator generates the baseband signal, the baseband signal is transmitted to an up-conversion device, and the up-conversion device processes the baseband signal to obtain the target input signal.

[0056] S202: Perform signal conversion on the initial input signal to obtain the target input signal, and send the target input signal.

[0057] In a specific embodiment, the up-conversion device performs signal conversion on the initial input signal to obtain the target input signal. Specifically, the signal conversion process can be processed by the up-conversion device, and the processing steps can include serial-to-parallel conversion, modulation, inverse fast Fourier transform (IFFT), adding cyclic prefix, digital-to-analog conversion and up-conversion. The target input signal is sent from the output end of the up-conversion device.

[0058] By adopting the above technical solution, a target input signal that meets the frequency response characteristic measurement requirements can be generated, so that a relatively low-cost device can also accurately measure the frequency response characteristics of the second measurement object.

[0059] like Figure 3 As shown, another method for measuring the frequency response characteristics of an electronic device based on an OFDM signal is provided in an embodiment of the present application. The method for measuring the frequency response characteristics of an electronic device based on OFDM further includes: S301: Change at least one configuration information of the second measurement object so that the second measurement object switches from the first state to a second state; the second state is different from the first state; In a specific embodiment, the at least one configuration information may include but is not limited to the working mode, working temperature and communication protocol of the second measurement object. In the case of changing the working mode of the second measurement object, the second state may include a sleep state, a no-load state and a full-load state. In the case of changing the working temperature of the second measurement object, the second state may include a low-temperature working state and a high-temperature working state. In the case of changing the communication protocol of the second measurement object, the second state may include a Wi-Fi working state, a Bluetooth working state and a ZigBee working state.

[0060] It can be understood that the second state is different from the first state, and the second state and the first state are interchangeable.

[0061] S302: Connecting the first output signal to the second measurement object in the second state, and measuring a third output signal output by the second measurement object; When the target measurement object in the second state serves as the carrier of the first output signal, the second output signal can be used to measure the first frequency response information of the target measurement object, and the first frequency response information characterizes the frequency response characteristics of the target measurement object in the second state, including amplitude characteristics and phase characteristics.

[0062] It can be understood that when the target measurement object in the second state serves as a carrier of the first output signal, the channel through which the target input signal is transmitted between the reference measurement object and the target measurement object can be a second state measurement channel. The frequency response characteristics of the second state measurement channel can be the frequency response characteristics of the target measurement object in the second state.

[0063] In practical applications, when the signal generated by the signal generating device is the target input signal, a plurality of signal transmission lines can be used to connect the output end of the signal generating device with the input end of the target measurement object, and the output end of the target measurement object with the input end of the signal testing device to form a path. When the target input signal passes through the path, the second frequency response information is measured and obtained.

[0064] In practical applications, when the signal generated by the signal generating device is the initial input signal, a plurality of signal transmission lines can be used to connect the output end of the signal generating device to the input end of the up-conversion device, and the output end of the up-conversion device to the input end of the target measurement object. When the signal analysis device can analyze high-frequency signals, a plurality of signal transmission lines can be used to connect the output end of the target measurement object to the input end of the signal test device to form a path. When the signal analysis device can analyze low-frequency signals, the output end of the target measurement object is connected to the input end of the down-conversion device, and the output end of the down-conversion device is connected to the input end of the signal test device to form a path. When the target input signal passes through the path, the second frequency response information is measured and calculated.

[0065] The signal processing of the down-conversion device includes down-conversion, analog-to-digital conversion, cyclic prefix removal, fast Fourier transform (FFT), demodulation and parallel-to-serial conversion.

[0066] S303: Calculate second frequency response information of the second measurement object in the second state according to a frequency response difference between the first output signal and the third output signal.

[0067] Specifically, the frequency response difference includes an amplitude characteristic difference and a phase characteristic difference.

[0068] In a specific embodiment, when the third output signal is a high-frequency signal, the third output information is connected to the down-conversion device, and the output of the down-conversion device is connected to the signal analysis device to measure and obtain the sixth output information. The second frequency response information is calculated based on the sixth output information.

[0069] In practical applications, when the initial input signal is a baseband signal, multiple signal transmission lines can be used to connect the output end of the signal generating device to the input end of the up-conversion device, connect the output end of the up-conversion device to the input end of the reference measurement object, connect the output end of the reference measurement object to the input end of the down-conversion device, and connect the output end of the down-conversion device to the signal analysis device. The signal generating device generates a baseband signal to form a path, and the signal analysis device measures to obtain the fourth output information.

[0070] The fifth output information can be obtained by measuring the reference measurement object replaced by the second measurement object in the first state. The sixth output information can be obtained by measuring the reference measurement object replaced by the second measurement object in the first state.

[0071] In a specific embodiment, the frequency response characteristic of the third output signal is It can be mathematically expressed as Formula 4. According to the frequency response characteristics of the first output signal and the frequency response characteristics of the third output signal, the second frequency response information is calculated. See formula 5: , (Formula 4) , (Formula 5) in, for The amplitude characteristic parameters, for Phase characteristic parameters of for The amplitude characteristic parameters, for Phase characteristic parameters. Among them, is the angular frequency of the first output signal and the first frequency response information.

[0072] Among them, the amplitude characteristic of the second measurement object in the second state is , the phase characteristic is .

[0073] By adopting the above technical solution, it is possible to measure the frequency response characteristics of the second measurement object in different configurations.

[0074] like Figure 4 As shown, another method for measuring the frequency response characteristics of an electronic device based on an OFDM signal is provided in an embodiment of the present application. The method for measuring the frequency response characteristics of an electronic device based on OFDM further includes: S401: Obtain third frequency response information of the second measurement object according to a frequency response difference between the second output signal and the third output signal; the third frequency response information represents a frequency response change that occurs when the second measurement object switches from the first state to the second state.

[0075] In a specific embodiment, the third frequency response information It can be mathematically expressed as Formula 6. The third frequency response information is calculated based on the first frequency response information and the second frequency response information. , see formula 7: , (Formula 6) , (Formula 7) in, for The amplitude characteristic parameters, for The phase characteristic parameters, is the angular frequency of the first frequency response information.

[0076] The amplitude characteristic transition of the second measurement object from the first state to the second state is: , the phase characteristic transition is .

[0077] By adopting the above technical solution, it is possible to measure the frequency response characteristics exhibited when the state of the second measurement object is switched.

[0078] In a specific embodiment, the target input signal includes at least two target sub-signals, and the at least two target sub-signals are orthogonal to each other in the frequency domain and are implemented by orthogonal frequency division multiplexing (OFDM) technology.

[0079] In a specific embodiment, the initial input signal may be an OFDM signal converted into an analog signal after baseband processing and radio frequency processing. Correspondingly, the at least two target sub-signals may be at least two sub-carriers of the OFDM signal.

[0080] In a specific embodiment, in order to obtain an OFDM input signal, the signal conversion step may include serial-to-parallel conversion, modulation, inverse fast Fourier transform (IFFT), adding a cyclic prefix, digital-to-analog conversion, and especially up-conversion for high-frequency OFDM signals.

[0081] The present application embodiment relates to a system for measuring the frequency response characteristics of an electronic device based on an OFDM signal, referring to Figure 5 The system for measuring the frequency response characteristics of electronic devices based on OFDM signals includes a signal generating device 51, an up-conversion device 52, a measurement object 53, a down-conversion device 54, a signal analysis device 55, and at least one signal transmission line 56. Specifically, the at least one signal transmission line 56 is used to connect the output end of the signal generating device 51 and the input end of the up-conversion device 52, the output end of the up-conversion device 52 and the input port of the measurement object 53, and is also used to connect the output port of the measurement object 53 and the input port of the down-conversion device 54, and the output port of the down-conversion device 54 and the input port of the signal analysis device 55. The measurement object 53 can be the first measurement object or the second measurement object.

[0082] Among them, the signal generating device 51 generates an initial input signal, and the initial input signal can be an OFDM baseband signal. In particular, for the measurement of high-frequency devices, the baseband signal needs to be processed by the up-conversion device 52 to obtain a high-frequency target input signal. The target input signal can be an OFDM signal, and the OFDM signal includes multiple orthogonal subcarriers. When the OFDM signal is loaded on the measurement object 53, the frequency response characteristics of the measurement object 53 will affect the frequency response characteristics of the OFDM signal, specifically, the amplitude and phase of the OFDM signal change. The down-conversion device 54 performs down-conversion processing on the changed OFDM signal to obtain the changed baseband signal. The signal analysis device 55 analyzes the changed baseband signal to obtain the frequency response characteristics of the changed baseband signal.

[0083] Among them, the frequency response characteristic changes caused by the OFDM signal loaded on the first measurement object and the second measurement object are different. The frequency response characteristic changes caused by the OFDM signal loaded on the second measurement object in the first state are also different from the frequency response characteristic changes caused by the OFDM signal loaded on the second measurement object in the second state. By comparing the frequency response characteristics of the first output signal and the second output signal, the frequency response characteristics of the second measurement object in the first state can be obtained. By comparing the frequency response characteristics of the first output signal and the third output signal, the frequency response characteristics of the second measurement object in the second state can be obtained. The frequency response characteristics of the first frequency response information and the second frequency response information can be used to obtain the frequency response characteristic changes that occur when the second measurement object transitions from the first state to the second state.

[0084] Among them, Figure 5 As shown, the signal generating device 51 also generates a reference clock signal (reference clock signal transmission channel 57), and sends the reference clock to the up-conversion device 52, the down-conversion device 54 and the signal analysis device 55 to achieve reference clock synchronization. The signal generating device 51 also generates a clock pulse signal (clock pulse signal transmission line 58), and sends the clock pulse signal to the signal analysis device 55 to achieve clock synchronization. Reference synchronization is conducive to reducing the frequency offset interference of OFDM signals during transmission, and reducing the frequency phase drift and jitter caused by different crystal oscillators; while clock synchronization is conducive to reducing the clock offset interference of OFDM signals during transmission.

[0085] Figure 5 The dotted box in indicates that the up-conversion device 52 and the signal generating device 51 can communicate internally; the down-conversion device 54 and the signal analyzing device 55 can communicate internally. Alternatively, it indicates that the up-conversion device 52 and the signal generating device 51 can be integrated, and the down-conversion device 54 and the signal analyzing device 55 can be integrated.

[0086] In the embodiment of the present application, the advantage of the signal loaded on the measurement object being the OFDM signal is that the characteristic of the OFDM signal including multiple orthogonal subcarriers can be utilized so that the influence of the frequency response characteristics of the measurement object on the multiple orthogonal subcarriers is independent and does not affect each other. This is conducive to improving the accuracy of the measurement. At the same time, since the OFDM signal is a broadband signal, the characteristics at multiple frequency points can be measured simultaneously through the OFDM signal.

[0087] In a specific embodiment, when the signal generating device 51 can generate a high-frequency OFDM signal, the up-converting device 52 can Figure 5In the case where the signal analysis device 55 can analyze the high-frequency OFDM signal, the down-conversion device 54 can also be used Figure 5 Omitted in .

[0088] In a specific embodiment, the signal analysis device 55 may be a signal analyzer.

[0089] The present application also discloses a system for measuring the frequency response characteristics of an electronic device based on an OFDM signal, referring to Figure 6 ,include: A signal generating device 61, for generating a target input signal; A first measuring device 62, used to connect the target input signal to a first measuring object to obtain a first output signal output by the first measuring object; A second measuring device 63 is used to connect the first output signal to a second measuring object configured in a first state, and measure a second output signal output by the second measuring object; the second measuring object is different from the first measuring object, and the second output signal is different from the first output signal; The first calculation device 64 is used to calculate first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal.

[0090] The signal generating device 61 comprises: A signal generating unit, used for generating an initial input signal based on OFDM; The signal conversion unit is used to perform signal conversion on the initial input signal to obtain the target input signal and send the target input signal.

[0091] The system further comprises: a third measuring device, configured to connect the first output signal to the second measuring object in the second state and measure a third output signal output by the second measuring object when at least one configuration information of the second measuring object is changed and the second measuring object is switched from the first state to the second state; the second state is different from the first state; The second calculation device is used to calculate second frequency response information of the second measurement object in the second state according to the frequency response difference between the first output signal and the third output signal.

[0092] The system further comprises: A third calculation device is used to calculate third frequency response information of the second measurement object according to the frequency response difference between the second output signal and the third output signal; the third frequency response information represents the frequency response change that occurs when the second measurement object switches from the first state to the second state.

[0093] The target input signal includes at least two target sub-signals, and the at least two target sub-signals are orthogonal to each other in the frequency domain and are implemented by orthogonal frequency division multiplexing technology.

[0094] The present application also discloses another system for measuring the frequency response characteristics of an electronic device based on OFDM signals, referring to Figure 7 ,include: A signal generating device 71, for generating a target input signal; A first measuring device 72, used to connect the target input signal to a first measurement object, and measure a first output signal output by the first measurement object; A second measuring device 73, configured to connect the first output signal to a second measuring object configured in a first state, and measure a second output signal output by the second measuring object; the second measuring object is different from the first measuring object, and the second output signal is different from the first output signal; The first calculation device 74 is used to calculate first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal.

[0095] The signal generating device 71 comprises: A signal generating unit, used for generating an initial input signal based on OFDM; The signal conversion unit is used to perform signal conversion on the initial input signal to obtain the target input signal and send the target input signal.

[0096] The system further comprises: a third measuring device, configured to connect the first output signal to the second measuring object in the second state and measure a third output signal output by the second measuring object when at least one configuration information of the second measuring object is changed and the second measuring object is switched from the first state to the second state; the second state is different from the first state; The second calculation device is used to calculate second frequency response information of the second measurement object in the second state according to the frequency response difference between the first output signal and the third output signal.

[0097] The system further comprises: A third calculation device is used to calculate third frequency response information of the second measurement object according to the frequency response difference between the second output signal and the third output signal; the third frequency response information represents the frequency response change that occurs when the second measurement object switches from the first state to the second state.

[0098] The target input signal includes at least two target sub-signals, and the at least two target sub-signals are orthogonal to each other in the frequency domain and are implemented by orthogonal frequency division multiplexing technology.

[0099] The implementation principle of the embodiment of the present application is: the multiple subcarriers of the OFDM signal are orthogonal, and have the advantages of resisting multipath effects, easy synchronization and adapting to a variety of different channel conditions. The embodiment of the present application can accurately obtain the frequency response characteristics of the second measurement object in different states according to the first output signal obtained by the OFDM signal loaded on the reference measurement object and the second output signal obtained by loading on the electronic device. In this process, the problems of frequency offset and clock offset of the OFDM signal are solved by clock synchronization and frequency synchronization, and the rough clock synchronization of the transmitting end and the receiving end can be achieved by triggering the signal, and the precise clock synchronization can be completed by adding the clock offset compensation algorithm to solve the influence of the frequency characteristics caused by the clock asynchronization. The same reference clock can be used by each module to solve the influence of different crystal oscillators of different devices on the frequency characteristic measurement. The signal generation and measurement can be completed by using low-cost signal generation equipment, signal analysis equipment, and up and down conversion equipment, which can greatly reduce the measurement cost and meet the measurement accuracy requirements.

[0100] The embodiments of this specific implementation method are all preferred embodiments of the present invention, and are not intended to limit the protection scope of the present invention. Therefore, any equivalent changes made based on the structure, shape, and principle of the present invention should be included in the protection scope of the present invention.

[0101] Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making any creative work shall fall within the scope of protection of this application.

[0102] It should be noted that the terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, including a series of steps or units, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

Claims

1. A method for measuring the frequency response characteristics of an electronic device based on an OFDM signal, characterized in that: The method comprises: generating a target input signal; Connecting the target input signal to a first measurement object, and measuring a first output signal output by the first measurement object; connecting the first output signal to a second measurement object configured in a first state, and measuring a second output signal output by the second measurement object; the second measurement object is different from the first measurement object, and the second output signal is different from the first output signal; First frequency response information of the second measurement object in the first state is calculated according to a frequency response difference between the first output signal and the second output signal.

2. The method for measuring the frequency response characteristics of an electronic device based on an OFDM signal according to claim 1, characterized in that: Generating a target input signal comprises: generating an initial input signal; The initial input signal is converted to obtain the target input signal, and the target input signal is sent.

3. The method for measuring the frequency response characteristics of an electronic device based on an OFDM signal according to claim 1, characterized in that: The method further comprises: modifying at least one configuration information of the second measurement object so that the second measurement object switches from the first state to a second state; the second state is different from the first state; Connecting the first output signal to the second measurement object in the second state, and measuring a third output signal output by the second measurement object; Second frequency response information of the second measurement object in the second state is calculated according to a frequency response difference between the first output signal and the third output signal.

4. The method for measuring the frequency response characteristics of an electronic device based on an OFDM signal according to claim 3, characterized in that: The method further comprises: According to the frequency response difference between the second output signal and the third output signal, third frequency response information of the second measurement object is calculated; the third frequency response information represents the frequency response change occurring when the second measurement object switches from the first state to the second state.

5. The method for measuring the frequency response characteristics of an electronic device based on OFDM signals according to any one of claims 1 to 3, characterized in that: The target input signal includes at least two target sub-signals, and the at least two target sub-signals are orthogonal to each other in the frequency domain and are implemented by orthogonal frequency division multiplexing technology.

6. A system for measuring the frequency response characteristics of electronic devices based on OFDM signals, characterized in that: The system comprises: A signal generating device, used for generating a target input signal; A first measuring device, used to connect the target input signal to a first measuring object, and measure a first output signal output by the first measuring object; a second measuring device, configured to connect the first output signal to a second measuring object configured in a first state, and measure a second output signal output by the second measuring object; the second measuring object is different from the first measuring object, and the first output signal is different from the second output signal; The first calculation device is used to calculate first frequency response information of the second measurement object in the first state according to the frequency response difference between the first output signal and the second output signal.

7. The system for measuring the frequency response characteristics of electronic devices based on OFDM signals according to claim 6, characterized in that: The signal generating device comprises: A signal generating unit, used for generating an initial input signal; The signal conversion unit is used to perform signal conversion on the initial input signal to obtain the target input signal and send the target input signal.

8. The system for measuring the frequency response characteristics of electronic devices based on OFDM signals according to claim 6, characterized in that: The system further comprises: a third measuring device, configured to connect the first output signal to the second measuring object in the second state, and measure a third output signal output by the second measuring object, when at least one configuration information of the second measuring object is changed and the second measuring object is switched from the first state to the second state; the second state is different from the first state; The second calculation device is used to calculate second frequency response information of the second measurement object in the second state according to the frequency response difference between the first output signal and the third output signal.

9. The system for measuring the frequency response characteristics of electronic devices based on OFDM signals according to claim 8, characterized in that: The system further comprises: A third calculation device is used to calculate third frequency response information of the second measurement object according to the frequency response difference between the second output signal and the third output signal; the third frequency response information represents the frequency response change that occurs when the second measurement object switches from the first state to the second state.

10. The system for measuring the frequency response characteristics of electronic devices based on OFDM signals according to any one of claims 6 to 8, characterized in that: The target input signal includes at least two target sub-signals, and the at least two target sub-signals are orthogonal to each other in the frequency domain and are implemented by orthogonal frequency division multiplexing technology.

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