Chip classification method and classification system
By printing QR codes on the chip and binding information, the problem of difficult traceability and easy mixing of chips after classification in the existing technology is solved, and efficient classification and management of chips is realized, reducing costs and management difficulties.
Patent Information
- Application Number
- CN202411869459.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-18
- Publication Date
- 2025-05-02
AI Technical Summary
After testing and classification, existing chip classification technology is difficult to accurately trace the chip test results, and it is prone to mixing, which increases production time and management costs.
By printing a QR code on the surface of the chip, the QR code binds the chip's standard preset information and test result information, the chip classification and traceability are realized. The method includes presetting the chip category, scanning the QR code to obtain information, conducting chip testing and classification, and binding the category information through the QR code to prevent mixing.
Anti-mixing and traceability after chip classification is realized, management difficulty and cost are reduced, and classification efficiency of multiple types of chips is optimized.
Smart Images
Figure CN119917952A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of chip sorting technology, and more specifically, to a chip sorting method and a chip sorting system. Background Art
[0002] FT test, full name Final Test, is the abbreviation of semiconductor finished product (or chip finished product) test. It is the last test stage after the chip is packaged, and its purpose is to ensure the performance and reliability of the chip in actual application. FT test can include environmental test, aging test and application-specific performance test, such as electrical parameter test, functional test, signal integrity test, etc.
[0003] The principle of FT testing is to install the chip in an actual or simulated application environment, and use test equipment such as applying input signals and detecting output signals to determine whether the chip function and performance meet the design requirements. For example, a tester can be used to generate test vectors and analyze the chip's response to determine the chip's function and performance. During the test, the tester connects to the chip's pins, sends specific test patterns or signals, and monitors the chip's response. By comparing the expected output with the actual output, it can be determined whether the chip meets the specification requirements. The tested chips will be divided into different categories according to their different performance, and then supplied to meet different market needs.
[0004] In the prior art process of chip classification (i.e., chip binning), although the chips can be tested and classified into different categories, once mixed materials occur, the category of the chips cannot be accurately distinguished. At this time, it is generally necessary to repeat the test of some or all chips and then reclassify them, which increases production time and economic costs. At the same time, for chips classified into multiple categories, if they are improperly stored and labeled in the later stage, it may be impossible to accurately distinguish the category to which the chip belongs. That is, with the existing chip classification technology, after the test classification, the test results of the specific chip cannot be traced, which increases the management cost and difficulty of the enterprise. Summary of the invention
[0005] The purpose of this application is to provide a chip classification method and classification system, which can test and classify chips, and at the same time use QR codes to bind test result information and category information, so as to prevent mixing of classified chips and realize traceability between physical chips and test result information.
[0006] The present application provides a chip classification method, in which a two-dimensional code is printed on the surface of the chip, and the two-dimensional code is bound to the standard preset information of the chip. The chip classification method includes:
[0007] S0. Pre-set multiple chip categories; wherein each chip category is bound to a corresponding category evaluation standard;
[0008] S1. Obtain standard preset information by scanning the chip QR code;
[0009] S2, obtaining the actual internal information of the chip;
[0010] S3, compare and match the actual internal information of the chip with the standard preset information; if they match, proceed to the next step; if they do not match, classify the chip into an abnormal category, and bind the abnormal category information with the QR code of the current chip;
[0011] S4, perform chip testing, obtain chip test result information, and bind the test result information with the QR code of the current chip;
[0012] S5. Match the test result information with the evaluation criteria of each category to determine the chip category, and bind the determined chip category information with the QR code of the current chip.
[0013] In an implementable solution, the chip classification method further includes:
[0014] S6. sort out the chips belonging to the same chip category.
[0015] In an practicable solution, in step S6, the step of sorting and arranging chips belonging to the same chip category includes:
[0016] S61, scanning the QR code of each chip in turn to obtain the chip category of the current chip;
[0017] S62. Sort and arrange chips belonging to the same chip category.
[0018] In an practicable solution, in step S2, the step of obtaining standard preset information by scanning the chip QR code includes:
[0019] S21, the host device obtains the QR code of the chip through the first scanning device; the first scanning device is set on the feeding path of the chip test production line and is connected to the host device for communication;
[0020] S22. The host device extracts standard preset information of the chip bound to the QR code.
[0021] In an practicable solution, in step S61, the steps of scanning the QR code of each chip in turn and obtaining the chip category of the current chip include:
[0022] S611, the host device obtains the QR code of the chip through the second scanning device; the second scanning device is arranged on the discharge path of the chip sorting production line and is in communication connection with the host device;
[0023] S612: The host device extracts information about the chip type bound to the QR code.
[0024] In an implementable solution, the standard preset information includes one or more of chip model, chip version, production date, batch number, configuration data, calibration data, test vector, and performance parameters. The actual internal information includes one or more of chip model, chip version, production date, batch number, configuration data, calibration data, test vector, and performance parameters.
[0025] In the second aspect, a chip classification system is also provided, including a classifier, a first scanning device and a host device. The classifier is provided with a feeding area and a discharging area, and a testing device and a carrier device are provided in the classifier; the testing device is used to obtain the actual internal information of the chip, and to test the chip to obtain the test result information of the chip; the carrier device is used to clamp the chip to be tested and place it on the test position of the testing device, and to remove the tested chip from the test position of the testing device. The first scanning device is provided at the feeding area of the classifier, and is used to obtain the two-dimensional code image of the chip; the two-dimensional code of the chip is bound with the standard preset information of the chip. The host device pre-stores information of multiple chip categories and corresponding category evaluation standards, and the host device is communicatively connected with the testing device, the carrier device, and the first scanning device.
[0026] Among them, the host device is used to control the first scanning device to scan and obtain the QR code image and analyze to obtain the standard preset information of the chip. The host device is used to control the test device to obtain the actual internal information of the chip, and compare and match it with the standard preset information; if it does not match, the host device classifies the current chip as an abnormal category, and binds the abnormal category information with the QR code of the current chip; if it matches, the host device controls the test device to test the chip to obtain the test result information of the chip, and binds the test result information with the QR code of the current chip. The host device is used to match the test result information with the evaluation criteria of each category to determine the chip category, and bind the determined chip category information with the QR code of the current chip.
[0027] In an implementable solution, the chip classification system further includes a sorting device, which is communicatively connected to the host device and is disposed on the discharge area side of the classifier for sorting out chips belonging to the same chip category.
[0028] In an practicable solution, the sorting device further includes a second scanning device, which is connected to the host device in communication and is arranged in the discharge area of the sorting machine, or in the feeding position of the sorting device. During the sorting operation, the chips of which chip categories have been determined pass through the second scanning device in sequence, and the host device controls the second scanning device to scan the QR code of each chip in sequence and analyze and obtain the chip category of the current chip; the host device controls the sorting device to sort and place the chips belonging to the same chip category.
[0029] In an implementable solution, a plurality of accommodating devices are arranged beside the sorting device, and each accommodating device is used to store chips belonging to the same chip category sorted by the sorting device.
[0030] Compared with the prior art, the beneficial effects of the present application include at least the following:
[0031] The chip classification method and classification system of the present application can test and classify chips, and use the QR code printed on the chip surface to bind the test result information and category information. It can not only prevent the classified chips from being mixed up through the chip category information bound to the QR code, but also realize the traceability between the actual chip and the test result information through the test result information bound to the QR code, thereby reducing the management difficulty of the chip testing process and, to a certain extent, reducing the management cost.
[0032] At the same time, in a further solution, for chips with multiple chip categories, soft classification can be uniformly performed first (i.e., the chip category to which the chip belongs is identified and the QR code is bound), without the need for immediate physical classification (i.e., chips belonging to the same chip category are grouped together). Afterwards, by identifying the chip category information bound to the QR code of the softly classified chip, unified physical classification is performed. This can optimize the testing and classification process of chip products with multi-category characteristics to a certain extent, and improve the classification efficiency of multi-category chips. BRIEF DESCRIPTION OF THE DRAWINGS
[0033] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.
[0034] Figure 1 This is a flow chart of a chip classification method according to an embodiment of the present application;
[0035] Figure 2 It is a flowchart of a chip classification method including physical sorting according to an embodiment of the present application;
[0036] Figure 3 A schematic diagram of the composition of a chip classification system according to an embodiment of the present application;
[0037] Figure 4 It is a schematic diagram of the composition of a chip classification system with a physical sorting function according to an embodiment of the present application;
[0038] Figure 5 It is a schematic diagram of the composition of a physical sorting device according to an embodiment of the present application.
[0039] In the figure: 1. main machine device; 2. sorting machine; 201. feeding area; 202. discharging area; 21. testing device; 22. carrier device; 3. first scanning device; 4. sorting device; 5. second scanning device; 6. accommodating device. DETAILED DESCRIPTION
[0040] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations.
[0041] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for which protection is sought, but merely represents selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.
[0042] The embodiment of the present application first provides a chip classification method, wherein a two-dimensional code is printed on the surface of the chip, and the two-dimensional code is bound to standard preset information of the chip.
[0043] like Figure 1 As shown, the chip classification method of this embodiment includes:
[0044] S0. Pre-set multiple chip categories; wherein each chip category is bound to a corresponding category evaluation standard;
[0045] S1. Obtain standard preset information by scanning the chip QR code;
[0046] S2, obtaining the actual internal information of the chip;
[0047] S3, compare and match the actual internal information of the chip with the standard preset information; if they match, proceed to the next step; if they do not match, classify the chip into an abnormal category, and bind the abnormal category information with the QR code of the current chip;
[0048] S4, perform chip testing, obtain chip test result information, and bind the test result information with the QR code of the current chip;
[0049] S5. Match the test result information with the evaluation criteria of each category to determine the chip category, and bind the determined chip category information with the QR code of the current chip.
[0050] It should be noted that for the production and manufacturing of chips, chip manufacturers generally adopt a selection process in which higher-performance chips are designated as more expensive models (for example, providing higher clock speeds, more cores, etc.) and less perfect models, but still making full use of silicon, can be sold as low-performance processors with disabled cores or lower speeds. For example, if a chip cannot run at 2GHz, it can be sold as a chip that runs at 1.5GHz. For another example, if the CPU shows that there is a defect in the integrated graphics card part, it is sold as a CPU without integrated graphics. The classification process of this embodiment is to evaluate the function and performance of the finished chip by simulating the actual operating environment, so as to classify the chips into different categories according to functional differences and performance differences, so as to sell them to markets with different needs.
[0051] In step S0, chips corresponding to different chip categories have different performance and functions. Category evaluation criteria may include chip functions (such as normal or defective integrated graphics cards), performance parameters (such as different clock speeds), etc.
[0052] It should also be noted that each chip is designed and produced according to the required standards, so each chip will have initial information, which may include chip model, chip version, production date, batch number, configuration data, calibration data, test vectors, performance parameters, etc. In this embodiment, one or more of the chip model, chip version, production date, batch number, configuration data, calibration data, test vectors, and performance parameters of a chip are bound to the QR code as standard preset information. At the same time, one or more of the chip model, chip version, production date, batch number, configuration data, calibration data, test vectors, and performance parameters of the same chip are written into the chip as prefabricated actual internal information.
[0053] In step S1, the standard preset information can be directly obtained by scanning the QR code or analyzing the image of the QR code, or a network link containing the standard preset information can be obtained, thereby extracting the standard preset information.
[0054] In step S2, the actual internal information prefabricated in the chip can be read by bringing the testing device into contact with the pins of the chip.
[0055] In step S3, the actual internal information of the chip is compared and matched with the standard preset information, which may include but is not limited to the comparison and matching of the chip model, the comparison and matching of the chip version, the comparison and matching of the production date, the comparison and matching of the batch number, the comparison and matching of the configuration data, etc. If the chip model, chip version, production date, batch number, configuration data, etc. of the standard preset information bound to the QR code are inconsistent with the actual internal information of the chip, it does not indicate an abnormality, and the QR code may be misprinted. At this time, the current chip is directly classified as an abnormal category, and no subsequent testing is performed to improve efficiency. At the same time, this abnormal category information is bound to the QR code of the current chip, so that the abnormal category error report of the test system can be traced back to the physical chip, and the physical chip can also be distinguished from other qualified chips by scanning the QR code of the physical chip.
[0056] In step S4, after the actual internal information of the chip matches the standard preset information bound to the QR code successfully, the normal test procedure is entered. A dedicated test device for detecting the function and performance of the chip can be used to apply an input signal to the chip, collect the output signal and compare it with the expected value to determine the effectiveness and difference of the function and performance of the chip under different working conditions, and then generate a test result.
[0057] Furthermore, the test results obtained by the test are bound to the QR code of the chip. Specifically, the test results are written into the network link bound to the QR code to achieve the binding of the test results and the QR code. In this way, the physical chip can be traced back through the test results, and the test results can also be traced back through the QR code of the physical chip.
[0058] In step S5, the determined chip category information is bound to the QR code of the current chip. Specifically, the chip category information is written into the network link bound to the QR code to realize the binding of the chip category and the QR code. In this way, the chip category of the current chip can be determined by identifying the chip QR code in the future, which can prevent the mixing of chips of different categories. Even if they are mixed, the chip category information can be extracted by identifying the QR code, thereby separating the mixed chips from each other, and realizing the traceability of the chip category after classification through the QR code.
[0059] In summary, the chip classification method of this embodiment can test and classify chips. At the same time, by binding the test result information and category information with the help of QR codes, it can not only prevent the mixing of classified chips, but also realize the traceability between the actual chip and the test result information, which reduces the management difficulty of the chip testing process and can also reduce the management cost to a certain extent.
[0060] In one embodiment, if Figure 2 As shown, the chip classification method includes not only steps S1 to S5, but also the following steps:
[0061] S6. sort out the chips belonging to the same chip category.
[0062] Steps S1 to S5 are soft classification of chips, that is, through chip testing, each chip is judged to which chip category it belongs and labeled. Step S6 is physical classification of chips, that is, the chips are grouped together according to the chip category they belong to, so as to facilitate subsequent packaging and sales.
[0063] After step S5 is completed, the chip can be directly and seamlessly connected to a sorting device, and then the chips are sorted and placed according to different categories.
[0064] Alternatively, after step S5, the chips may be collected together and then physically classified. Specifically, in one embodiment, in step S6, the step of sorting and placing chips belonging to the same chip category may include:
[0065] S61, scanning the QR code of each chip in turn to obtain the chip category of the current chip;
[0066] S62. Sort and arrange chips belonging to the same chip category.
[0067] It can be seen that for chips with multiple chip categories, the soft classification of steps S1 to S5 can be uniformly performed first, without the need for immediate physical classification, to improve chip testing efficiency. Afterwards, uniform physical classification is performed by identifying the chip category information bound to the QR code of the softly classified chip, which can optimize the testing and classification process of multi-category chip products to a certain extent and improve the classification efficiency of multi-category chips.
[0068] In one embodiment, in step S61, scanning the QR code of each chip in turn to obtain the chip category of the current chip may include:
[0069] S611, the host device obtains the QR code of the chip through the second scanning device; the second scanning device is arranged on the discharge path of the chip sorting production line and is in communication connection with the host device;
[0070] S612: The host device extracts information about the chip type bound to the QR code.
[0071] In one embodiment, in step S2, the step of obtaining standard preset information by scanning the chip QR code may include:
[0072] S21, the host device obtains the QR code of the chip through the first scanning device; the first scanning device is set on the feeding path of the chip test production line and is connected to the host device for communication;
[0073] S22. The host device extracts standard preset information of the chip bound to the QR code.
[0074] like Figure 3 As shown, an embodiment of the present application further provides a chip classification system, which can implement the aforementioned chip classification method, including a host device 1, a classifier 2 and a first scanning device 3.
[0075] Specifically, the sorting machine 2 is provided with a feeding area 201 and a discharging area 202, and a testing device 21 and a carrier device 22 are provided in the sorting machine 2; the testing device 21 is used to obtain the actual internal information of the chip, and to test the chip to obtain the test result information of the chip; the carrier device 22 is used to clamp the chip to be tested and place it on the test position of the testing device 21, and to remove the tested chip from the test position of the testing device 21. The first scanning device 3 is set at the feeding area 201 of the sorting machine 2, and is used to obtain the two-dimensional code image of the chip; the two-dimensional code of the chip is bound with the standard preset information of the chip. The host device 1 pre-stores information of multiple chip categories and corresponding category evaluation standards, and the host device 1 is connected to the testing device 21, the carrier device 22, and the first scanning device 3 in communication.
[0076] Among them, the host device 1 is used to control the first scanning device 3 to scan and obtain the QR code image and analyze to obtain the standard preset information of the chip. The host device 1 is used to control the test device 21 to obtain the actual internal information of the chip, and compare and match it with the standard preset information; if it does not match, the host device 1 classifies the current chip as an abnormal category, and binds the abnormal category information with the QR code of the current chip; if it matches, the host device 1 controls the test device 21 to test the chip to obtain the test result information of the chip, and binds the test result information with the QR code of the current chip. The host device 1 is used to match the test result information with the evaluation criteria of each category to determine the chip category, and bind the determined chip category information with the QR code of the current chip.
[0077] In one embodiment, if Figure 4 As shown, the chip classification system may further include a sorting device 4, which is in communication with the host device 1 and is disposed at the discharge area 202 side of the sorting machine 2, and is used to sort out chips belonging to the same chip category. The sorting device 4 may be a multi-degree-of-freedom robotic arm with a gripping arm and a suction arm.
[0078] In one embodiment, the sorting device 4 can be directly connected to the discharge area 202 of the sorting machine 2 through a transmission structure (such as a manipulator, a conveyor belt, etc.), and the chips with the determined chip categories directly enter the sorting device 4, and the chips of the same chip category are packaged together. At the same time, a second scanning device 5 can be set in the discharge area 202 of the sorting machine 2 to scan and read the QR code on the chip again to obtain the chip category information to help the sorting device 4 put the chip into a predetermined position.
[0079] In one embodiment, the sorting device 4 may not be directly connected to the discharge area 202 of the sorting machine 2, and in this case, the second scanning device 5 may be set at the feeding position of the sorting device 4. During the sorting operation, the chips of the determined chip category are uniformly sent to the feeding position of the sorting device 4, and pass through the second scanning device 5 in turn. The host device 1 controls the second scanning device 5 to scan the QR code of each chip in turn and analyze to obtain the chip category of the current chip; the host device 1 controls the sorting device 4 to sort and place the chips belonging to the same chip category.
[0080] In one embodiment, a plurality of accommodating devices 6 may be disposed beside the sorting device 4 , and each accommodating device 6 is used to store chips belonging to the same chip category sorted by the sorting device 4 .
[0081] In addition, each accommodating device 6 may be provided with a category identification QR code, and the category information of the contained chip may be bound to the category identification QR code to facilitate information identification and traceability of subsequent production processes.
[0082] The above description is only a partial embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims
1. A chip classification method, characterized in that: A QR code is printed on the surface of the chip, and the QR code is bound to the standard preset information of the chip; The chip classification method comprises: S0. Pre-set multiple chip categories; wherein each chip category is bound to a corresponding category evaluation standard; S1. Obtain standard preset information by scanning the chip QR code; S2, obtaining the actual internal information of the chip; S3, compare and match the actual internal information of the chip with the standard preset information; if they match, proceed to the next step; if they do not match, classify the chip into an abnormal category, and bind the abnormal category information with the QR code of the current chip; S4, perform chip testing, obtain chip test result information, and bind the test result information with the QR code of the current chip; S5. Match the test result information with the evaluation criteria of each category to determine the chip category, and bind the determined chip category information with the QR code of the current chip.
2. The chip classification method according to claim 1, characterized in that: Also includes: S6. sort out the chips belonging to the same chip category.
3. The chip classification method according to claim 2, characterized in that: In step S6, the step of sorting and arranging chips belonging to the same chip category includes: S61, scanning the QR code of each chip in turn to obtain the chip category of the current chip; S62. Sort and arrange chips belonging to the same chip category.
4. The chip classification method according to claim 1, characterized in that: In step S2, the step of obtaining standard preset information by scanning the chip QR code includes: S21, the host device obtains the two-dimensional code of the chip through a first scanning device; the first scanning device is arranged on the feeding path of the chip test production line and is in communication connection with the host device; S22. The host device extracts standard preset information of the chip bound to the QR code.
5. The chip classification method according to claim 3, characterized in that: In step S61, the steps of scanning the QR code of each chip in turn and obtaining the chip category of the current chip include: S611, the host device obtains the two-dimensional code of the chip through a second scanning device; the second scanning device is arranged on the discharge path of the chip sorting production line and is in communication connection with the host device; S612: The host device extracts information about the chip type bound to the QR code.
6. The chip classification method according to any one of claims 1 to 5, characterized in that: The standard preset information includes one or more of chip model, chip version, production date, batch number, configuration data, calibration data, test vector, and performance parameters; The actual internal information includes one or more of chip model, chip version, production date, batch number, configuration data, calibration data, test vectors, and performance parameters.
7. A chip classification system, characterized in that: include: A sorting machine (2) is provided with an inlet area (201) and an outlet area (202), and the sorting machine (2) is provided with a testing device (21) and a carrier device (22); the testing device (21) is used to obtain actual internal information of a chip, and to test the chip to obtain test result information of the chip; the carrier device (22) is used to clamp a chip to be tested and place it on a test position of the testing device (21), and to remove a tested chip from the test position of the testing device (21); A first scanning device (3) is arranged at the feeding area (201) of the sorting machine (2) and is used to obtain a two-dimensional code image of a chip; the two-dimensional code of the chip is bound with standard preset information of the chip; A host device (1) in which information on a plurality of chip categories and corresponding category evaluation standards are pre-stored, and the host device (1) is communicatively connected with the test device (21), the carrier device (22), and the first scanning device (3); The host device (1) is used to control the first scanning device (3) to scan and obtain a two-dimensional code image and analyze and obtain standard preset information of the chip; The host device (1) is used to control the test device (21) to obtain actual internal information of the chip and compare and match it with standard preset information; if there is no match, the host device (1) classifies the current chip as an abnormal category and binds the abnormal category information with the QR code of the current chip; if there is a match, the host device (1) controls the test device (21) to test the chip to obtain test result information of the chip, and binds the test result information with the QR code of the current chip; The host device (1) is used to match the test result information with the evaluation criteria of each category to determine the chip category, and to bind the information of the determined chip category with the QR code of the current chip.
8. The chip classification system according to claim 7, characterized in that: It also includes a sorting device (4) which is connected to the host device (1) for communication and is arranged on the discharge area (202) side of the sorting machine (2) for sorting out chips belonging to the same chip category.
9. The chip classification system according to claim 8, characterized in that: The sorting device (4) further comprises a second scanning device (5), the second scanning device (5) being communicatively connected to the host device (1) and being arranged in the discharge area (202) of the sorting machine (2), or being arranged at the feeding position of the sorting device (4); During the sorting operation, the chips of which chip categories have been determined pass through the second scanning device (5) in sequence, and the host device (1) controls the second scanning device (5) to scan the QR code of each chip in sequence and analyze and obtain the chip category of the current chip; the host device (1) controls the sorting device (4) to sort and place the chips of the same chip category.
10. The chip classification system according to claim 9, characterized in that: A plurality of accommodating devices (6) are arranged beside the sorting device (4), and each of the accommodating devices (6) is used to store chips belonging to the same chip category sorted by the sorting device (4).