Test circuit, equipment and method for short circuit isolation function

Abstract

The invention provides a test circuit, test equipment and test method for a short circuit isolation function, electronic equipment and a computer storage medium, and the circuit comprises a first resistance adjustment module which comprises a plurality of test resistors and a plurality of switches corresponding to the test resistors, the plurality of test resistors are connected in parallel, and each test resistor is connected in series with the corresponding switch; the to-be-tested device has a short circuit isolation function, the input end of the to-be-tested device is electrically connected with the first resistance adjusting module, and the output end of the to-be-tested device is electrically connected with the second resistance adjusting module; the second resistance adjusting module is configured to adjust the resistance value of the resistor at the output end of the to-be-tested device; and the test module is electrically connected with the to-be-tested device, and the test module is configured to determine a test result for the short circuit isolation function of the to-be-tested device. In this way, the testing steps are effectively simplified, the testing time is shortened, the testing efficiency is improved, and the accuracy of the testing result is improved.

Description

Technical Field

[0001] Example embodiments of the present disclosure generally relate to the field of testing, and in particular, to a test circuit, a test device, a test method, an electronic device, and a computer-readable storage medium for a short circuit isolation function. Background Art

[0002] In the field of fire safety, short-circuit isolators are a vital component. Short circuits are a common fault in electrical systems, fire alarm systems, and other systems, which can cause overheating of wires, damage to equipment, and even fire. The function of a short-circuit isolator is to quickly cut off the current when a short circuit occurs, isolate the faulty circuit in time, and thus prevent serious consequences such as fire. For example, a short-circuit isolator can be installed in fire-fighting equipment such as fire alarm equipment, so that the fire-fighting equipment has a short-circuit isolation function. Under normal circumstances, before the fire-fighting equipment is put into use, it is often necessary to test the short-circuit isolation function of the fire-fighting equipment to ensure that the short-circuit isolation function is normal and provide effective protection for the fire-fighting equipment. Summary of the invention

[0003] In the first aspect of the present disclosure, a test circuit for a short-circuit isolation function is provided. The circuit includes: a first resistance adjustment module, including a plurality of test resistors and a plurality of switches corresponding thereto, the plurality of test resistors being connected in parallel, and each test resistor being connected in series with its corresponding switch; a device to be tested, the device to be tested having a short-circuit isolation function, the input end of the device to be tested being electrically connected to the first resistance adjustment module, and the output end of the device to be tested being electrically connected to the second resistance adjustment module; the second resistance adjustment module being configured to adjust the resistance value of the output end resistance of the device to be tested; and a test module, the test module being electrically connected to the device to be tested, and the test module being configured to determine a test result for the short-circuit isolation function of the device to be tested.

[0004] In a second aspect of the present disclosure, a short circuit isolation function test device is provided. The device includes the test circuit as described above, a base is arranged on the top of the test device, the base is used to install a device to be tested with an isolation function, and a plurality of dip switches are arranged on the side of the test device, and the resistance value of the test resistor or the resistance value of the output terminal resistor is marked near the dip switches.

[0005] In the third aspect of the present disclosure, a test method for a short-circuit isolation function is provided, which is applied to a test circuit of a device under test with an isolation function. The method includes: selecting a first test resistor from a plurality of test resistors based on a first resistance value to connect to the test circuit, and when the output end of the device under test is short-circuited, determining a first leakage current of the device under test, wherein the first resistance value is equal to the resistance value of the first test resistor; when the current of the test circuit reaches the maximum rated switch current when the short circuit occurs, determining the input voltage of the device under test, and determining the series impedance based on the input voltage and the maximum rated switch current; selecting a second test resistor from a plurality of test resistors based on a second resistance value to connect to the test circuit, and when the output end of the device under test is short-circuited, determining a second leakage current and a short-circuit voltage of the device under test, wherein the second resistance value is equal to the resistance value of the second test resistor; and when the output end voltage of the device under test returns to a normal value, determining a recovery voltage of the device under test, wherein the second resistance value is equal to the resistance value of the second test resistor.

[0006] In a fourth aspect of the present disclosure, an electronic device is provided. The device includes at least one processing unit; and at least one memory, the at least one memory is coupled to the at least one processing unit and stores instructions for execution by the at least one processing unit. When the instructions are executed by the at least one processing unit, the device executes the method of the first aspect.

[0007] In a fifth aspect of the present disclosure, a computer-readable storage medium is provided, wherein a computer program is stored on the computer-readable storage medium, and the computer program can be executed by a processor to implement the method of the first aspect.

[0008] It should be understood that the contents described in the content of this disclosure are not intended to limit the key features or important features of the embodiments of this disclosure, nor are they intended to limit the scope of this disclosure. Other features of this disclosure will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] The above and other features, advantages and aspects of the embodiments of the present disclosure will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. In the accompanying drawings, the same or similar reference numerals represent the same or similar elements, wherein:

[0010] Figure 1 A diagram showing a conventional test environment for short circuit isolation function;

[0011] Figure 2 A schematic diagram showing a test circuit for a short circuit isolation function according to some embodiments of the present disclosure;

[0012] Figure 3A A perspective view showing a test device structure of a test circuit including a short circuit isolation function according to an embodiment of the present disclosure;

[0013] Figure 3B A side view showing a test device structure of a test circuit including a short circuit isolation function according to an embodiment of the present disclosure;

[0014] Figure 4 A flow chart showing a method for testing a short circuit isolation function according to some embodiments of the present disclosure; and

[0015] Figure 5 A block diagram of a device capable of implementing various embodiments of the present disclosure is shown. DETAILED DESCRIPTION

[0016] Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although certain embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be construed as being limited to the embodiments set forth herein. On the contrary, these embodiments are provided to provide a more thorough and complete understanding of the present disclosure. It should be understood that the drawings and embodiments of the present disclosure are only for exemplary purposes and are not intended to limit the scope of protection of the present disclosure.

[0017] It should be noted that the titles of any sections / subsections provided herein are not restrictive. Various embodiments are described throughout this article, and any type of embodiment may be included under any section / subsection. In addition, the embodiments described in any section / subsection may be combined in any manner with any other embodiments described in the same section / subsection and / or different sections / subsections.

[0018] In the description of the embodiments of the present disclosure, the term "including" and similar terms should be understood as open inclusion, that is, "including but not limited to". The term "based on" should be understood as "based at least in part on". The term "one embodiment" or "the embodiment" should be understood as "at least one embodiment". The term "some embodiments" should be understood as "at least some embodiments". Other explicit and implicit definitions may be included below. The terms "first", "second", etc. may refer to different or the same objects. Other explicit and implicit definitions may be included below.

[0019] The embodiments of the present disclosure may involve user data, data acquisition and / or use, etc. These aspects are subject to the corresponding laws, regulations and relevant provisions. In the embodiments of the present disclosure, all data collection, acquisition, processing, processing, forwarding, use, etc. are carried out on the premise that the user knows and confirms. Accordingly, when implementing each embodiment of the present disclosure, the type, scope of use, usage scenario, etc. of the data or information that may be involved should be informed to the user and the user's authorization should be obtained in an appropriate manner in accordance with the relevant laws and regulations. The specific notification and / or authorization method can vary according to the actual situation and application scenario, and the scope of the present disclosure is not limited in this respect.

[0020] As briefly mentioned above, it is necessary to test the device under test with short circuit isolation function, such as fire alarm equipment, etc. In the traditional test scheme, a specific test environment needs to be built to test the short circuit isolation performance. Figure 1 FIG. 100 shows a conventional short circuit isolation function test environment. Figure 1 As shown, the device under test is connected to the test circuit, the first voltmeter 110 is connected in parallel with the device under test 140, the ammeter 130 is used to measure the current in the test circuit, the first voltmeter 110 is used to measure the voltages at both ends of the input and output ends of the device under test 140, and the second voltmeter 120 is connected in parallel with the output end of the device under test 140 to measure the output end voltage of the device under test 140. The power supply module 160 is used to supply power to the test circuit, for example, supply power to the first voltmeter 110, the second voltmeter 120, the ammeter 130, the device under test 140, etc. When the switch S is closed, the output end b1b2 of the device under test 140 is short-circuited, that is, the output voltage of the device under test 140 is 0. When the switch S is opened, the output voltage corresponding to the output end b1b2 is adjusted by adjusting the resistance value of the sliding rheostat 150. During the test, the resistance of the sliding rheostat 150 is slowly reduced until it is close to 0Ω to simulate the situation where the output terminal b1b2 is short-circuited, and then the test parameters are determined by the data recorded by the first voltmeter 110, the second voltmeter 120, and the ammeter 130. The specific test parameters are described in detail below. If the test parameters are within the standard requirements of the device under test 140, it indicates that the short-circuit isolation function of the device under test 140 is normal. For example, in a mechanical test such as before and after a collision, or before and after a change in the climate environment, if the test parameters can still be maintained within the standard requirements of the device under test 140, it indicates that the short-circuit isolation function of the device under test 140 is normal.

[0021] However, the inventors have found that in some cases, such as Figure 1The traditional test environment shown is complex to set up, and the resistance value of the sliding rheostat 150 needs to be adjusted frequently and multiple times during the test process. At present, it is necessary to perform multiple tests in multiple scenarios, and the resistance value of the sliding rheostat 150 required for each test method is different. For example, the upper and lower limits of the input voltage of the device under test 140 are tested respectively. For another example, the device under test 140 is tested in the forward direction and the reverse direction. The forward test refers to the test in which the input end a1a2 of the device under test 140 is electrically connected to the power supply module 160, and the output end b1b2 is electrically connected to the adjustment sliding rheostat 150. The reverse test refers to the test in which the input end b1b2 is electrically connected to the power supply module 160, and the output end a1a2 is electrically connected to the adjustment sliding rheostat 150. For another example, the device under test 140 needs to be tested before and after certain mechanical experiments, electromagnetic compatibility EMC experiments, and climate environments. The resistance values ​​of the sliding rheostat 150 required by the above various test methods are all different, and the resistance value of the sliding rheostat 150 needs to be adjusted about 16 times in various test methods. Since the error of adjusting the resistance value of the sliding rheostat 150 is large, the accuracy is poor, and the performance degradation of the sliding rheostat 150 may lead to poor contact and other problems, which ultimately lead to inaccurate test parameters.

[0022] In other cases, the output terminal of the device under test 140 is short-circuited during the test. After the test is completed, the short circuit is undone by slowly increasing the resistance of the sliding rheostat 150 until the output voltage of the device under test 140 is pulled up to restore the normal output. However, the resistance value required to pull the output voltage up to the normal output of different devices under test 140 after the short circuit is undone is not fixed. For example, the required resistance is approximately in the range of 2kΩ-10kΩ. If a larger resistor is directly used in the initial stage, such as a sliding rheostat adjusted to 10kΩ, the size of the sliding rheostat that meets this specification is usually larger. On the one hand, the size of the sliding rheostat is too large to be convenient for fine-tuning. On the other hand, the size of the sliding rheostat is too large to be used to build and dismantle the test environment.

[0023] Therefore, the traditional test environment causes the tester to adjust the required resistance value of the sliding rheostat multiple times, resulting in low test efficiency, and the adjustment of the resistance value of the sliding rheostat is not precise, resulting in inaccurate test parameters obtained by the test.

[0024] In view of this, an embodiment of the present disclosure proposes a test scheme for a short-circuit isolation function. According to various embodiments of the present disclosure, a test circuit for a short-circuit isolation function includes: a first resistance adjustment module, the first resistance adjustment module includes a plurality of test resistors and a plurality of switches corresponding thereto, the plurality of test resistors are connected in parallel, and each test resistor is connected in series with its corresponding switch; a device to be tested, the device to be tested has a short-circuit isolation function, the input end of the device to be tested is electrically connected to the test resistor selection module, and the output end of the device to be tested is electrically connected to the second resistance adjustment module; a second resistance adjustment module, the second resistance module is configured to adjust the resistance value of the output end resistance of the device to be tested; and a test module, the test module is electrically connected to the device to be tested, and the test module is configured to determine a test result for the isolation function of the device to be tested.

[0025] Furthermore, the second resistance adjustment module includes a sliding rheostat and at least one output end resistor, both ends of each output end resistor are connected in parallel with corresponding switches, the sliding rheostat is connected in series with at least one output end resistor, one end of the sliding rheostat is connected to the output end of the device to be tested, and the other end is electrically connected to the output end resistor.

[0026] In this way, on the one hand, in the first resistance adjustment module of the embodiment of the present disclosure, according to the resistance value of the required test resistor, a test resistor of the required resistance value is selected through a switch to access the test circuit, which not only does not need to frequently adjust the sliding rheostat, but also the resistance value of the test resistor is more accurate than adjusting the resistance value of the sliding rheostat, thereby improving the accuracy of the test result. On the other hand, in the second resistance adjustment module, according to the resistance value of the required output terminal resistor, an output terminal resistor of the required resistance value is selected through a switch to access the test circuit, so as to meet the output terminal voltage required by the device to be tested of various specifications. In addition, by selecting the required test resistor and / or output terminal resistor of a fixed resistance value through a switch (such as a dip switch), the time for setting up and dismantling the test environment can be saved, thereby improving the test efficiency.

[0027] Various example implementations of the scheme will be described in detail below with reference to the accompanying drawings.

[0028] Example Test Circuit

[0029] Figure 2 FIG. 2 is a schematic diagram of a test circuit 200 in which the short circuit isolation function can be implemented in an embodiment of the present disclosure. Figure 2 As shown, the short circuit isolation function test is performed on the device under test 220 using the test circuit 200. The test circuit 200 can be applied to any device under test 220 with a short circuit isolation function in an electrical system, a fire protection system, and the like.

[0030] The test circuit 200 includes a first resistance adjustment module 210, a device under test 220, a second resistance adjustment module 230, a test module 240, and a power supply 260. The power supply 250 is configured to provide a stable voltage, such as a voltage of 220 V, to the entire test circuit after the switch S (for example, the switch S is a dip switch) is closed. In an embodiment of the present disclosure, the power supply 250 can supply power to circuit elements such as the first resistance adjustment module 210, the device under test 220, the second resistance adjustment module 230, and the test module 240.

[0031] The first resistance adjustment module 210 includes a plurality of test resistors and a plurality of switches corresponding thereto, wherein the plurality of test resistors are connected in parallel, and each test resistor is connected in series with its corresponding switch. Each test resistor has a fixed resistance value, and at least one test resistor of a required resistance value can be selected through a switch to access the circuit, thereby meeting different test requirements for the device under test 220, and finally determining the test result of the short-circuit isolation function, and judging whether the test result is within the preset parameter range of the device under test 220. If the test result is within the preset parameter range, it is considered that the isolation function is normal and the test is passed. If the test result is not within the preset parameter range of the device under test 220, it is considered that the isolation function is abnormal and the test is not passed.

[0032] The disclosed embodiment designs a first resistance adjustment module 210 in the test circuit, wherein the resistance values ​​of multiple test resistors are determined as fixed resistance values. The relevant resistance values ​​can be selected to access the circuit through a switch (such as a dip switch) for further testing. This not only saves the time required to frequently adjust the sliding rheostat when testing in different scenarios, but also the test resistors with fixed resistance values ​​have more precise resistance values ​​than the sliding rheostat, thereby effectively reducing the test resistance value error.

[0033] The device under test 220 has a short-circuit isolation function. For example, a short-circuit isolator is provided in the device under test 220 to realize the short-circuit isolation function. When a short circuit occurs in the device under test 220, the short-circuit isolation function is turned on, and the isolator isolates the device under test from other electronic components. On the one hand, turning on the short-circuit isolation function can protect the device under test. On the other hand, turning on the short-circuit isolation function does not affect the normal operation of other electronic components in the circuit, and effectively protects the normal operation of the circuit. Exemplarily, the device under test 220 can be an electronic component with a short-circuit isolation function such as a fire-fighting device, an electrical device, etc., such as a fire-fighting electronic component such as a fire detection and alarm device. It should be understood that in the test circuit 200, the device under test 220 can also be any other device with a short-circuit isolation function, and the present disclosure does not make specific restrictions in this regard.

[0034] The input end of the device under test 220 is electrically connected to the first resistance adjustment module 210, and the output end of the device under test 220 is electrically connected to the second resistance adjustment module 230. The second resistance adjustment module 230 is configured to adjust the resistance value of the output end resistance of the device under test 220. Specifically, during the short-circuit isolation function test, the output end of the device under test 220 needs to be short-circuited, that is, the output end voltage is zero. After the test, the short circuit needs to be canceled, and the second resistance adjustment module 230 is often used to adjust the output end resistance of a suitable size to pull the output end voltage of the device under test 220 from 0 to the voltage required for normal output.

[0035] The test module 240 is electrically connected to the device under test 220, and the test module 240 is configured to determine the test result of the isolation function of the device under test 220. The test module 240 may include multiple voltmeters, ammeters, oscilloscopes, etc. The specific connection method is described in detail below, which is convenient for obtaining the test results during the test process.

[0036] In some embodiments, continue to refer to Figure 2 The first resistance adjustment module 210 may include a first power supply 211, which is configured to supply power to a plurality of test resistors and their corresponding switches, and the first power supply 211 is electrically connected to the plurality of test resistors in parallel. For example, the first power supply 211 may be a DC source. The first power supply 211 may be connected to a power supply 250, and the power supply 250 supplies power to the first power supply 211.

[0037] In some embodiments, the plurality of test resistors may include a first test resistor 211, a second test resistor 212, a third test resistor 213, and a fourth test resistor 214 connected in parallel, the first test resistor 211 is connected in series with a first switch 215, the second test resistor 212 is connected in series with a second switch 216, the third test resistor 213 is connected in series with a third switch 217, and the fourth test resistor 214 is connected in series with a fourth switch 218. The first test resistor 211, the second test resistor 212, the third test resistor 213, and the fourth test resistor 214 can be respectively selected to be connected to the test circuit 200 through the first switch 215, the second switch 216, the third switch 217, and the fourth switch 218. The output end of the first power supply 211 is electrically connected to the first test resistor 211, the second test resistor 212, the third test resistor 213, and the fourth test resistor 214, and the first switch 215, the second switch 216, the third switch 217, and the fourth switch 218 are all electrically connected to the device under test 220.

[0038] It should be understood that the above numbers of test resistors and switches are only examples. Depending on different test scenarios, the required number of test resistors may be any other number, and the present disclosure does not make any specific limitation in this regard.

[0039] In some embodiments, continue to refer to Figure 2 , the second resistance adjustment module 230 may include a sliding rheostat 231 and at least one output terminal resistor, and both ends of each output terminal resistor are connected in parallel with corresponding switches; the sliding rheostat 231 is connected in series with at least one output terminal resistor, one end of the sliding rheostat 231 is connected to the output terminal of the device under test 220, and the other end of the sliding rheostat 231 is electrically connected to the output terminal resistor. The sliding rheostat 231 is configured to slowly adjust from the maximum resistance value to a value close to the minimum resistance value (for example, 0Ω), and the switches at both ends of each output terminal resistor are closed to short-circuit the corresponding output terminal resistor, thereby simulating the process in which the output terminal of the device under test 220 is short-circuited, that is, the output terminal voltage becomes 0. The sliding rheostat 231 can also be configured to adjust the resistance value to slowly increase until the output terminal voltage of the device under test 220 returns to a normal value.

[0040] In addition, considering that the normal values ​​of the output terminal voltages required by the devices under test 220 of different specifications are different, in order to expand the testing of the devices under test 220 of various specifications, it is designed to add at least one output terminal resistor connected in series with the sliding rheostat 231. The resistance value of the output terminal resistor can be a fixed resistance value. The output terminal resistors of different resistance values ​​are selected to be connected to the test resistor through a switch connected in parallel with the output terminal resistor, thereby meeting the output terminal voltages of the devices under test 220 of different specifications.

[0041] As an example, at least one output terminal resistor may include a first output terminal resistor 232, a second output terminal resistor 233, and a third output terminal resistor 234, wherein the first output terminal resistor 232 is connected in parallel with the fifth switch 234, the second output terminal resistor 233 is connected in parallel with the sixth switch 235, and the third output terminal resistor 234 is connected in parallel with the seventh switch 236. For example, the fixed resistance value of the first output terminal resistor 232 may be 1 kΩ, the fixed resistance value of the second output terminal resistor 233 may be 2 kΩ, and the fixed resistance value of the third output terminal resistor 234 may be 3 kΩ. It should be understood that the above is only an example, and the number and fixed resistance value of the output terminal resistors can be adjusted as needed, and the present disclosure does not make specific limitations in this regard.

[0042] It should be noted that the switches corresponding to the two ends of each output resistor connected in parallel may be dip switches. In the present disclosure, the fifth switch 234, the sixth switch 235, and the seventh switch 236 may be dip switches, such as Figure 2 As shown, these switches may be normally closed switches, which indicate disconnection when the switches are closed and conduction when the switches are open. Of course, these switches in parallel with the output terminal resistors may also be normally open switches, which indicate disconnection when the switches are open and conduction when the switches are closed. It should be understood that the above is only an example, and the switches in parallel with the output terminal resistors may also be of other types, and the present disclosure does not make specific limitations in this regard.

[0043] Continue to refer Figure 2 , an eighth switch 260 may be connected in parallel to the output end of the device under test 220, and the eighth switch 260 is connected in parallel to the output end of the device under test 220. The eighth switch 260 may be configured to turn on the eighth switch 260 so that the output end of the device under test 220 is short-circuited, that is, the output end of the device under test 220 is 0, thereby meeting the test requirements. It should be noted that the eighth switch 260 may be a dip switch, such as a normally open dip switch or a normally closed dip switch.

[0044] In some embodiments, the test module 240 may include a first voltage measuring device 241, a second voltage measuring device 242, a current measuring device 243, and an oscilloscope 244. The test module 240 may be configured to determine the test result of the short-circuit isolation function based on the data read by the first voltage measuring device 241, the second voltage measuring device 242, the oscilloscope 244, and the current measuring device 243. Specifically, the first voltage measuring device 241 is connected in parallel with both the input and output ends of the device under test 220, and can be used to measure the voltage at both ends of the device under test 220. Specifically, an isolator is usually installed in the device under test 220, and the installation position of the isolator may be different. For example, in some devices under test 220, the isolator may be installed between the two negative poles of the device under test 220, such as Figure 2 As shown, in order to measure the voltage at both ends of the isolator, the first voltage measuring device 241 can be electrically connected between the two negative poles of the device under test 220. It should be understood that the connection method of the first voltage measuring device 241 is only an example and can be adjusted according to the installation position of the isolator. The present disclosure does not make specific restrictions in this regard. The second voltage measuring device 242 is connected in parallel with the output end of the device under test 220 and can be used to measure the output end voltage of the device under test 220. The oscilloscope 244 is connected in parallel with the second voltage measuring device 242 and can be used to capture the waveform when the output end of the device under test 220 is short-circuited. Exemplarily, the first voltage measuring device 241, the second voltage measuring device 242, and the current measuring device 243 can all be high-precision four-wire modules, two of which are powered and the other two are used to measure the voltage / current value of the input signal.

[0045] In addition, the test module 240 may further include a second power supply 245, which is electrically connected to the first voltage measuring device 241, the second voltage measuring device 242, and the current measuring device 243, and the second power supply 245 may be configured to supply power to the first voltage measuring device 241, the second voltage measuring device 242, and the current measuring device 243. The second power supply 245 may be connected to a power supply 250, and the power supply 250 supplies power to the second power supply 245. It should be understood that in addition to the components described above, the test circuit 200 may also include other required components such as protection resistors, etc., which are not shown in the figure.

[0046] The basic structure and connection relationship of the test circuit 200 are introduced above. The following will introduce how to select different test resistor values ​​to meet various test requirements.

[0047] In some embodiments, the first power supply 211 can provide a maximum input voltage Vin for multiple test resistors. max Or minimum input voltage Vin min , when the first power supply 211 provides the maximum input voltage Vin max and minimum input voltage Vin min Under the conditions, the short-circuit isolation function test is performed on the device to be tested 220 respectively.

[0048] In some embodiments, the fixed resistance values ​​of the plurality of test resistors may be different, and the resistance values ​​thereof may be determined based on preset parameters of the device under test 220 .

[0049] The preset parameters may include at least one of the following: the maximum input voltage Vin of the device under test 220 max , minimum input voltage Vin min , Maximum rated continuous current Is max , Maximum rated switching current Ic max , minimum short-circuit voltage Vso min Specifically, the preset maximum input voltage Vin max , minimum input voltage Vin min It can be provided by the first power supply 211. The device under test 220 has a maximum rated continuous current Is in a short-circuit state, that is, when the output voltage is 0. max (i.e. the maximum rated continuous current of the isolator under short-circuit conditions), the maximum rated switching current Ic max (That is, the maximum rated switching current when the isolator switch is closed). Minimum short-circuit voltage Vso min (i.e., the minimum operating voltage of the isolator) means that the output resistance of the device under test 220 is slowly reduced by the second resistance adjustment module 230, and the output voltage of the device under test 220 gradually approaches 0V from the normal value. When the output voltage of the device under test 220 is close to 0V and a short circuit is about to occur, the device under test 220 starts the short circuit isolation function. At this time, the corresponding minimum output voltage of the device under test 220 is considered to be the minimum short circuit voltage Vso min .

[0050] It should be understood that the above preset parameters may also include other types of parameters, and the present disclosure does not make specific limitations in this regard. For example, the preset parameters may also include the maximum short-circuit voltage Vso max The maximum output voltage of the device under test 220 when the short-circuit isolation function is activated is considered to be the maximum short-circuit voltage Vso maxFor another example, the preset parameters may also include a maximum recovery voltage Vsc max , minimum recovery voltage Vsc min . Maximum recovery voltage Vsc max (that is, the isolator recovery voltage) means that the output resistance of the device under test 220 is slowly increased through the second resistance adjustment module 230 until the output voltage of the device under test 220 recovers from 0V to a normal value. The maximum output voltage before recovery is the maximum recovery voltage. Similarly, the minimum output voltage before recovery is the minimum recovery voltage.

[0051] For example, the minimum input voltage Vin min Can be 21V, the maximum input voltage Vin max Can be 36V, maximum rated continuous current Is max It can be about 1.63A, the maximum rated switching current Ic max It can be about 0.75A, the minimum short-circuit voltage Vso min Can be about 7V, the maximum short-circuit voltage Vso max It can be about 9.875V, the maximum recovery voltage Vsc max It can be about 9.7V, the minimum recovery voltage Vsc min It can be about 8.8V, and the series impedance Zc of the built-in isolation circuit of the device under test max It may be about 56 mΩ. It should be understood that the value ranges of the above preset parameters are only examples, and the above preset parameters are determined based on the devices under test 220 of different specifications, and the present disclosure does not make specific limitations in this regard.

[0052] In some embodiments, the resistance of the first test resistor 211 can be based on the minimum input voltage Vin min and maximum rated continuous current Is max For example, assuming Vin min Can be 21V, Is max It can be 1.63A, according to the formula R1 = Vin min / Is max , the fixed resistance R1 of the first test resistor 211 may be 12.9Ω.

[0053] The resistance value of the second test resistor 212 can be based on the minimum input voltage Vin min , minimum short-circuit voltage Vso min and maximum rated switching current Ic max For example, assuming Vin min Can be 21V, Vso min Can be 9A, Ic max It can be 0.75A, according to R2=(Vinmin -Vso min ) / Ic max , the fixed resistance R2 of the second test resistor 212 may be 16.7Ω.

[0054] The resistance value of the third test resistor 213 can be based on the maximum input voltage Vin max and maximum rated continuous current Is max For example, assuming Vin max Can be 36V, Is max It can be 1.63A, according to the formula R1 = Vin max / Is max , the fixed resistance R3 of the third test resistor 213 may be 22.1Ω.

[0055] The resistance value of the fourth test resistor 214 can be based on the maximum input voltage Vin max , minimum short-circuit voltage Vso min and maximum rated switching current Ic max For example, assuming Vin max Can be 36V, Vso min Can be 9A, Ic max It can be 0.75A, according to R2=(Vin max -Vso min ) / Ic max , the fixed resistance R4 of the fourth test resistor 214 may be 36.7Ω.

[0056] It should be understood that the number of test resistors and the size of fixed resistance are only examples, and may be other numbers and resistances determined according to requirements, and the present disclosure does not make specific limitations in this regard.

[0057] Multiple test resistors with fixed resistance are connected in parallel, and a dip switch is used to control whether each test resistor is connected to the circuit. This allows the tester to select the relevant resistance value to connect to the circuit for testing with one click of the dip switch. The test result obtained should be within the above-mentioned preset parameter range, indicating that the short-circuit isolation function is normal. The following will introduce in detail how to determine the test result through the test module 240.

[0058] In some embodiments, the test module 240 can determine a test result, which includes at least one of the following: a leakage current I of the output terminal of the device under test 220 in a short-circuit state; L , series impedance Zc, short-circuit voltage Vso, and recovery voltage Vsc.

[0059] For example, if in various test scenarios, the leakage current, series impedance, short-circuit voltage, and recovery voltage of the output terminal of the device under test 220 in the short-circuit state are all within the preset parameter range of the device under test 220, it indicates that the test result is normal and the short-circuit isolation function of the device under test 220 is normal. Figure 2 The first voltage measuring device 241, the second voltage measuring device 242, the current measuring device 243, and the oscilloscope 244 shown can determine these test results. It should be understood that the devices in the test module 240 can be adjusted according to the adjustment of the test circuit. Figure 2 This is just an example and the present disclosure is not specifically limited in this regard.

[0060] Specifically, when the first switch 211 is turned on, the second switch 212, the third switch 213, and the fourth switch 214 are turned off, and the fifth switch 234, the sixth switch 235, and the seventh switch 236 are turned on, that is, the first output terminal resistor 232, the second output terminal resistor 233, and the third output terminal resistor 234 are not connected to the circuit, when the eighth switch 260 is turned on, the output terminal of the device under test 220 is short-circuited, and the leakage current I of the device under test 220 in the short-circuit state is detected by the current measuring device 243. L .

[0061] Then, the eighth switch 260 is turned off, and the resistance of the sliding rheostat 231 is slowly reduced until the current displayed by the current measuring device 243 reaches the maximum rated switch current Ic. max (e.g. 0.75A), the first voltage measuring device 241 detects the voltage V1, and determines the series impedance Zc = V1 / Ic max .

[0062] Next, the sliding rheostat 231 is turned off, and when the second switch 212 is turned on and the first switch 211, the third switch 213, and the fourth switch 214 are turned off, the sliding rheostat 231 is adjusted to the maximum value, and the resistance of the sliding rheostat 231 is slowly reduced (simulating the situation where the eighth switch 260 is turned off to cause a short circuit). The waveform displayed by the oscilloscope 244 slowly decreases until the second voltage measuring device 242 displays that the voltage is 0V. The oscilloscope 244 displays the waveform height at this time, and the voltage value at this time, i.e., the short-circuit voltage Vso, is determined.

[0063] Next, the eighth switch 260 is turned on, and the current measuring device 243 detects the leakage current I of the device under test 220 in the short-circuit state. LWhen the eighth switch 260 is turned off, the fifth switch 234, the sixth switch 235, and the seventh switch 236 are turned off, that is, the first output terminal resistor 232, the second output terminal resistor 233, and the third output terminal resistor 234 are connected to the circuit, the resistance value of the sliding rheostat 231 is slowly increased until the voltage displayed by the oscilloscope 244 returns to a normal value, and the voltage value at this time, that is, the recovery voltage Vsc, as well as the current value detected by the current measuring device 243 and the voltage value detected by the first voltage measuring device 241 are determined, in order to obtain the leakage current I L This is confirmed by the voltage V1 detected by the first voltage measuring device 241 .

[0064] Test results The leakage current IL of the above two operations is the same or similar, and the series impedance Zc≤Zc max , short circuit voltage Vso at Vso max To Vso min In the range of Vsc, the recovery voltage Vsc is max To Vsc min If the test result is within the range of

[0065] The above describes the functions of the various components in the test module 240 during the test process. The above is only one test scenario. In addition, the input terminal a1a2 and the output terminal b1b2 of the device under test 220 can be reversed, that is, the input terminal b1b2 and the output terminal a1a2 of the device under test 220 are connected to the circuit for testing again. The test results obtained remain unchanged or the error is within a reasonable range, indicating that the short-circuit isolation function is normal.

[0066] The test circuit 200 based on the short-circuit isolation function can select a test resistor with a required fixed resistance value according to the test needs, which not only saves the time of frequently adjusting the sliding rheostat when testing in different scenarios, but also the fixed resistance test resistor has a more precise resistance value than the sliding rheostat, effectively reducing the test resistance error and improving the accuracy of the test results.

[0067] Example Test Equipment

[0068] Figure 3A A perspective view 300A showing a test device structure of the test circuit 200 including a short circuit isolation function according to an embodiment of the present disclosure. Figure 3B A side view 300B of a test device structure of a test circuit 200 including a short circuit isolation function according to an embodiment of the present disclosure is shown. As shown in FIG. 300A and FIG. 300B, the isolator function test environment is fixed into a tooling, that is, the test circuit 200 is packaged into a test device. Figure 3A , Figure 3B Describe the test equipment in detail.

[0069] like Figure 3A As shown in FIG. 3B , the test device includes the test circuit 200 of the above embodiment. A base 310 is provided on the top of the test device, and the base 310 is used to install a device under test with an isolation function (not shown). A voltmeter 321, a voltmeter 322 and an ammeter 323 are also provided on the top of the test device, corresponding to Figure 2 The first voltage measuring device 241, the second voltage measuring device 242, and the current measuring device 243, it should be understood that the voltage meter and the current measuring device 243 in FIG. Figure 2 The voltage measuring devices in the embodiment may correspond one-to-one in any manner, and the present disclosure is not limited in this regard.

[0070] The side of the test device is provided with a sliding rheostat 340, which can be Figure 2 The sliding rheostat 231 in the tester is convenient for the tester to adjust the resistance value. A power supply 330 is also provided on the side of the test device, and the power supply 330 can correspond to Figure 2 The first power supply 211 in the test device. A plurality of dip switches are also arranged on the side of the test device, for example, a group of four adjacent dip switches 351 and another group of five adjacent dip switches 352. The dip switches are marked with the resistance value of the corresponding test resistor or the resistance value of the output resistor, so that the tester can turn on or off the switch according to the resistance value marked nearby.

[0071] For example, in Figure 3A Or in 3B, a set of four dip switches 351 can correspond to Figure 2 The first switch 215, the second switch 216, the third switch 217 and the fourth switch 218 in the embodiment. The four dip switches 351 are respectively marked with the resistance values ​​of the first test resistor 211, the second test resistor 212, the third test resistor 213 and the fourth test resistor 214. Another set of five dip switches 352 can correspond to Figure 2 The fifth switch 234, the sixth switch 235, the seventh switch 236, the eighth switch 250 and the main switch 260. The three dip switches 352 are respectively marked with the resistance values ​​of the first output terminal resistor 232, the second output terminal resistor 233 and the third output terminal resistor 234. It should be understood that the dip switches and Figure 2 The switches in the example may correspond one-to-one in any manner, and the present disclosure is not limited in this regard.

[0072] It should be understood that Figure 3A The shape, quantity, and setting position of the base in or 3B, the quantity and setting position of the power supplies, and the quantity and setting position of the dip switches are only examples, and the present disclosure does not make specific limitations in this regard.

[0073] The above describes the test equipment structure of the test circuit 200 with the short-circuit isolation function. Before testing, the device to be tested, such as a fire electronic component (for example, a fire alarm, etc.), can be directly fixed to the base for testing, eliminating the tedious steps of setting up and dismantling the test environment, simplifying the test steps, effectively reducing the test time, and improving the test efficiency.

[0074] Example Test Method

[0075] Figure 4 The flowchart of the short circuit isolation function testing method 400 according to the embodiment of the present disclosure is shown, which is applied to the short circuit isolation function testing circuit 200. Figure 2 and Figure 4 The test method 400 will be described in detail.

[0076] like Figure 4 As shown, in box 410, a first test resistor is selected from multiple test resistors based on a first resistance value and connected to the test circuit. When the output terminal of the device under test is short-circuited, a first leakage current of the device under test is determined, wherein the first resistance value is equal to the resistance value of the first test resistor.

[0077] First, the switch S is closed, and the power supply 250 supplies power to the test circuit 200. Then, when the first switch 211 is turned on, the second switch 212, the third switch 213, and the fourth switch 214 are turned off, and the fifth switch 234, the sixth switch 235, and the seventh switch 236 are turned on, that is, the first output terminal resistor 232, the second output terminal resistor 233, and the third output terminal resistor 234 are short-circuited and thus not connected to the circuit, when the eighth switch 260 is turned on, the output terminal of the device under test 220 is short-circuited, and the current measuring device 243 detects the first leakage current I of the device under test 220 in the short-circuit state. L1 .

[0078] The first resistance is equal to the resistance of the first test resistor. For example, the first resistance is 12.9Ω.

[0079] At block 420 , when the current of the test circuit when short-circuited reaches the maximum rated switch current, the input voltage of the device under test is determined, and the series impedance is determined based on the input voltage and the maximum rated switch current.

[0080] Next, the eighth switch 260 is turned off, and the resistance of the sliding rheostat 231 is slowly reduced until the current displayed by the current measuring device 243 reaches the maximum rated switch current Ic. max (e.g. 0.75A), the first voltage measuring device 241 detects the input voltage V1, and determines the series impedance Zc = V1 / Ic max .

[0081] In block 430, a second test resistor is selected from a plurality of test resistors based on a second resistance value and connected to the test circuit, and a second leakage current and a short-circuit voltage of the device under test are determined when the output terminal of the device under test is short-circuited, wherein the second resistance value is equal to the resistance value of the second test resistor.

[0082] The second resistance is equal to the resistance of the second test resistor, for example, the second resistance is 16.7Ω. Next, the sliding rheostat 231 is turned off, and when the second switch 212 is turned on and the first switch 211, the third switch 213, and the fourth switch 214 are turned off, the sliding rheostat 231 is adjusted to the maximum, and the resistance of the sliding rheostat 231 is slowly reduced (simulating the situation where the eighth switch 260 is turned off to cause a short circuit), and the waveform displayed by the oscilloscope 244 slowly decreases until the second voltage measuring device 242 displays a voltage of 0V. The oscilloscope 244 displays the waveform height at this time, and determines the voltage value at this time, that is, the short-circuit voltage Vso.

[0083] In block 440 , when the output terminal voltage of the device under test recovers to a normal value, a recovery voltage of the device under test is determined.

[0084] Next, the eighth switch 260 is turned on, and the current measuring device 243 detects the second leakage current I of the device under test 220 in the short-circuit state. L2 When the eighth switch 260 is turned off, the fifth switch 234, the sixth switch 235, and the seventh switch 236 are turned off, that is, the first output terminal resistor 232, the second output terminal resistor 233, and the third output terminal resistor 234 are connected to the circuit, the resistance value of the sliding rheostat 231 is slowly increased until the voltage displayed by the oscilloscope 244 returns to a normal value, and the voltage value at this time, that is, the recovery voltage Vsc, as well as the current value detected by the current measuring device 243 and the voltage value detected by the first voltage measuring device 241 are determined, in order to obtain the leakage current I L This is confirmed by the voltage V1 detected by the first voltage measuring device 241 .

[0085] In some embodiments, a corresponding test resistor is selected from a plurality of test resistors using a dip switch to connect to the test circuit.

[0086] The first leakage current IL1 in the test result is the same as or similar to the second leakage current, and the series impedance Zc≤Zc max , short circuit voltage Vso at Vso max To Vso min In the range of Vsc, the recovery voltage Vsc is max To Vsc min If the test result is within the range of

[0087] The above describes the test method of the test circuit 200 based on the short circuit isolation function. The tester selects a test resistor with a fixed resistance value through a dial switch to perform the test, which not only saves the time of frequently adjusting the sliding rheostat during the test, but also the fixed resistance test resistor has a more accurate resistance value than the sliding rheostat, effectively reducing the test resistance error, effectively improving the accuracy of the test results, simplifying the test steps, reducing the test time, and improving the test efficiency.

[0088] Example Electronic Devices

[0089] Figure 5 A block diagram of an electronic device 500 is shown in which various embodiments of the present disclosure may be implemented. It should be understood that Figure 5 The electronic device 500 shown is merely exemplary and should not constitute any limitation on the functionality and scope of the embodiments described herein. Figure 5 The electronic device 500 shown can be used to execute the above-mentioned testing method.

[0090] like Figure 5 As shown, the electronic device 500 is in the form of a general electronic device. The components of the electronic device 500 may include, but are not limited to, one or more processors or processing units 510, a memory 520, a storage device 530, one or more communication units 540, one or more input devices 550, and one or more output devices 560. The processing unit 510 may be an actual or virtual processor and is capable of performing various processes according to a program stored in the memory 520. In a multi-processor system, multiple processing units execute computer executable instructions in parallel to improve the parallel processing capability of the electronic device 500.

[0091] The electronic device 500 typically includes a plurality of computer storage media. Such media may be any accessible media that is accessible to the electronic device 500, including but not limited to volatile and non-volatile media, removable and non-removable media. The memory 520 may be a volatile memory (e.g., a register, a cache, a random access memory (RAM)), a non-volatile memory (e.g., a read-only memory (ROM), an electrically erasable programmable read-only memory (EEPROM), flash memory), or some combination thereof. The storage device 530 may be a removable or non-removable medium, and may include a machine-readable medium, such as a flash drive, a disk, or any other medium, which may be capable of being used to store information and / or data (e.g., training data for training) and may be accessed within the electronic device 500.

[0092] The electronic device 500 may further include additional removable / non-removable, volatile / non-volatile storage media. Figure 5As shown in , a disk drive for reading or writing from a removable, non-volatile disk (e.g., a "floppy disk") and an optical drive for reading or writing from a removable, non-volatile optical disk may be provided. In these cases, each drive may be connected to the bus (not shown) by one or more data media interfaces. The memory 520 may include a computer program product 525 having one or more program modules that are configured to perform various methods or actions of various embodiments of the present disclosure.

[0093] The communication unit 540 implements communication with other electronic devices through a communication medium. Additionally, the functions of the components of the electronic device 500 can be implemented in a single computing cluster or multiple computing machines that can communicate through a communication connection. Therefore, the electronic device 500 can operate in a networked environment using a logical connection with one or more other servers, a network personal computer (PC), or another network node.

[0094] The input device 550 may be one or more input devices, such as a mouse, a keyboard, a tracking ball, etc. The output device 560 may be one or more output devices, such as a display, a speaker, a printer, etc. The electronic device 500 may also communicate with one or more external devices (not shown) through the communication unit 540 as needed, such as a storage device, a display device, etc., communicate with one or more devices that allow a user to interact with the electronic device 500, or communicate with any device that allows the electronic device 500 to communicate with one or more other electronic devices (e.g., a network card, a modem, etc.). Such communication may be performed via an input / output (I / O) interface (not shown).

[0095] According to an exemplary implementation of the present disclosure, a computer-readable storage medium is provided, on which computer-executable instructions are stored, wherein the computer-executable instructions are executed by a processor to implement the method described above. According to an exemplary implementation of the present disclosure, a computer program product is also provided, which is tangibly stored on a non-transitory computer-readable medium and includes computer-executable instructions, and the computer-executable instructions are executed by a processor to implement the method described above.

[0096] Various aspects of the present disclosure are described herein with reference to the flowcharts and / or block diagrams of the methods, devices, equipment, and computer program products implemented according to the present disclosure. It should be understood that each box in the flowchart and / or block diagram and the combination of each box in the flowchart and / or block diagram can be implemented by computer-readable program instructions.

[0097] These computer-readable program instructions can be provided to a processing unit of a general-purpose computer, a special-purpose computer, or other programmable data processing device, thereby producing a machine, so that when these instructions are executed by the processing unit of the computer or other programmable data processing device, a device that implements the functions / actions specified in one or more boxes in the flowchart and / or block diagram is generated. These computer-readable program instructions can also be stored in a computer-readable storage medium, and these instructions cause the computer, programmable data processing device, and / or other equipment to work in a specific manner, so that the computer-readable medium storing the instructions includes a manufactured product, which includes instructions for implementing various aspects of the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0098] Computer-readable program instructions can be loaded onto a computer, other programmable data processing apparatus, or other device so that a series of operational steps are performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, so that the instructions executed on the computer, other programmable data processing apparatus, or other device implement the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0099] The flow chart and block diagram in the accompanying drawings show the possible architecture, function and operation of the system, method and computer program product according to multiple implementations of the present disclosure. In this regard, each square box in the flow chart or block diagram can represent a part of a module, program segment or instruction, and a part of a module, program segment or instruction includes one or more executable instructions for realizing the logical function of the specification. In some implementations as replacements, the function marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two continuous square boxes can actually be executed substantially in parallel, and they can sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be realized by a special hardware-based system that performs the function or action of the specification, or can be realized by a combination of special hardware and computer instructions.

[0100] The above descriptions of various implementations of the present disclosure are exemplary, non-exhaustive, and not limited to the disclosed implementations. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described implementations. The selection of terms used herein is intended to best explain the principles of the implementations, practical applications, or improvements to the technology in the market, or to enable other persons of ordinary skill in the art to understand the various implementations disclosed herein.

Claims

1. A test circuit for short circuit isolation function, comprising: A first resistance adjustment module, comprising a plurality of test resistors and a plurality of switches corresponding thereto, wherein the plurality of test resistors are connected in parallel, and each of the test resistors is connected in series with its corresponding switch; A device under test, wherein the device under test has a short-circuit isolation function, an input end of the device under test is electrically connected to the first resistance adjustment module, and an output end of the device under test is electrically connected to the second resistance adjustment module; The second resistance adjustment module is configured to adjust the resistance value of the output terminal resistance of the device under test; as well as A test module is electrically connected to the device under test, and is configured to determine a test result of a short circuit isolation function of the device under test. 2 . The test circuit according to claim 1 , wherein the first resistance adjustment module further comprises a first power supply, the first power supply is configured to supply power to the plurality of test resistors, and the first power supply is electrically connected to the plurality of test resistors in parallel.

3. The test circuit according to claim 2, wherein the multiple test resistors include a first test resistor, a second test resistor, a third test resistor, and a fourth test resistor connected in parallel, the first test resistor is connected in series with a first switch, the second test resistor is connected in series with a second switch, the third test resistor is connected in series with a third switch, and the fourth test resistor is connected in series with a fourth switch.

4. The test circuit according to claim 1, wherein the second resistance adjustment module comprises a sliding rheostat and at least one output terminal resistor, and both ends of each output terminal resistor are connected in parallel with corresponding switches; The sliding rheostat is connected in series with the at least one output terminal resistor, one end of the sliding rheostat is connected to the output terminal of the device under test, and the other end is electrically connected to the output terminal resistor.

5. The test circuit according to claim 4, wherein the at least one output terminal resistor includes a first output terminal resistor, a second output terminal resistor, and a third output terminal resistor, the first output terminal resistor is connected in parallel with the fifth switch, the second output terminal resistor is connected in parallel with the sixth switch, and the third output terminal resistor is connected in parallel with the seventh switch. 6 . The test circuit according to claim 1 , further comprising an eighth switch connected in parallel with an output terminal of the device under test. 7 . The test circuit according to claim 3 , wherein the first switch to the eighth switch are all dip switches.

8. The test circuit according to claim 1, wherein the test resistance is determined based on preset parameters of the device under test, and the preset parameters include at least one of the following: the maximum input voltage, the minimum input voltage, the maximum rated continuous current in the short-circuit state, and the maximum rated switching current in the short-circuit state of the device under test.

9. The test circuit according to claim 1, wherein the test module comprises: A first voltage measuring device, wherein the first voltage measuring device is connected in parallel with two ends of the device under test; a second voltage measuring device, the second voltage measuring device being connected in parallel to an output terminal of the device under test; A current measuring device is electrically connected to an output terminal of the device to be measured. 10 . The test circuit according to claim 9 , wherein the test module further comprises an oscilloscope, and the oscilloscope is electrically connected to the output terminal of the second voltage measuring device.

11. The test circuit according to claim 1, wherein the test result comprises at least one of the following: leakage current, series impedance, short-circuit voltage, and recovery voltage of the output terminal of the device under test in a short-circuit state.

12. A test device for a short-circuit isolation function, comprising a test circuit as claimed in claims 1-11, wherein a base is arranged on the top of the test device, and the base is used to install a device to be tested with an isolation function, and a plurality of dip switches are arranged on the side of the test device, and the resistance value of the test resistor or the resistance value of the output resistor is marked near the dip switch.

13. A method for testing a short circuit isolation function, applied to a test circuit of a device under test having an isolation function, the method comprising: Selecting a first test resistor from a plurality of test resistors based on a first resistance value and connecting it to the test circuit, and determining a first leakage current of the device under test when an output terminal of the device under test is short-circuited, wherein the first resistance value is equal to the resistance value of the first test resistor; When the current of the test circuit when short-circuited reaches the maximum rated switch current, determining the input voltage of the device under test, and determining the series impedance based on the input voltage and the maximum rated switch current; Selecting a second test resistor from the plurality of test resistors based on a second resistance value and connecting it to the test circuit, and determining a second leakage current and a short-circuit voltage of the device under test when an output terminal of the device under test is short-circuited, wherein the second resistance value is equal to the resistance value of the second test resistor; as well as When the output terminal voltage of the device under test recovers to a normal value, the recovery voltage of the device under test is determined, wherein the second resistance value is equal to the resistance value of the second test resistor. 14 . The testing method according to claim 13 , wherein a corresponding test resistor is selected from the plurality of test resistors by using a dip switch to connect to the test circuit.

15. An electronic device, comprising: at least one processing unit; as well as At least one memory is coupled to the at least one processing unit and stores instructions for execution by the at least one processing unit, the instructions causing the electronic device to perform the method according to claims 13-14 when executed by the at least one processing unit.

16. A computer-readable storage medium having a computer program stored thereon, wherein the computer program can be executed by a processor to implement the method according to any one of claims 13 to 14.

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