Decontrol measuring device and method for alpha surface pollution of mask

By designing an automated non-destructive testing device for masks, using ZnS detectors for non-destructive measurements, the complex and inaccurate problems of traditional measurement methods are solved, and efficient and accurate mask alpha surface pollution detection is achieved.

CN119936947APending Publication Date: 2025-05-06CHINA INST FOR RADIATION PROTECTION
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Patent Information

Application Number
CN202411932824.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-26
Publication Date
2025-05-06

AI Technical Summary

Technical Problem

The measurement methods of alpha surface pollution in traditional masks are complex and destructive, resulting in distortion of measurement results, cumbersome process, and poor applicability.

Method used

A decontrolled measurement device including a collection box, a measurement assembly and a conveying device is designed, and the mask to be tested is transported into the measurement assembly through an automated conveying device, and non-destructive measurement is performed using the ZnS detector.

Benefits of technology

It realizes automated non-destructive testing of masks, has the characteristics of non-destructive and rapid classification, improves detection efficiency and accuracy, reduces sample processing steps, and is suitable for large-scale and rapid testing.

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Abstract

The invention discloses a control-releasing measuring device and method for alpha surface pollution of a mask. The control-releasing measuring device comprises a collecting box, a measuring assembly and a conveying device. The collecting box is internally provided with a hanging part used for hanging a mask, the measuring assembly is located on one side of the collecting box, the collecting box is located on the upstream of the conveying direction of the conveying device and located above the conveying face of the conveying device, the measuring assembly is located on the downstream of the conveying direction of the conveying device, and the mask to be measured in the collecting box is conveyed into the measuring assembly; the measuring assembly is provided with a measuring part used for placing a mask to be measured, and the measuring part of the measuring assembly is lower than the conveying face of the conveying device or flush with the conveying face of the conveying device. According to the measuring device, the detection efficiency and accuracy are improved, the sample treatment steps are reduced, the measuring process is simplified, and a reliable guarantee is provided for radioactive protection. The application of the measuring device can significantly improve the management level of worker protection equipment and ensure the health and safety of workers.
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Description

Technical Field

[0001] The invention relates to the technical field of solid waste treatment of masks worn by workers in uranium enrichment plants, and in particular to a device and method for controlling and measuring alpha surface contamination of masks. Background Art

[0002] Uranium enrichment plant workers are exposed to high concentrations of radioactive substances at work. These substances may adhere to the masks they wear through the air, equipment, or splashes during operation, causing excessive accumulation of radioactive substances on the masks. Workers may be exposed to unnecessary radiation when wearing them, which may have an impact on health over a long period of time. Therefore, it is necessary to frequently perform alpha surface contamination detection and analysis on the masks worn by uranium enrichment plant workers, and then determine the subsequent disposal methods for the masks. Traditional methods for measuring alpha surface contamination in masks usually require complex physical or chemical treatments of samples. These processes are not only destructive, but also significantly increase the complexity and time cost of the operation. Destructive treatment methods may cause damage to the samples, thereby affecting the accuracy of the measurement and the reliability of subsequent analysis. For example, additional sources of contamination may be introduced or part of the substance to be tested may be lost during the processing, resulting in distorted measurement results. In addition, the cumbersome operating steps also increase the workload and labor costs, reduce the detection efficiency, and are not suitable for large-scale, rapid detection needs. Summary of the invention

[0003] One of the purposes of the present invention is to provide a control and measurement device for the alpha surface contamination of a mask, so as to solve the problems of distorted measurement results and complicated measurement process in the existing traditional method of measuring the alpha surface contamination of a mask.

[0004] The second purpose of the present invention is to provide a method for controlling and measuring the alpha surface contamination of a mask, so as to solve the problems of distorted measurement results and complicated measurement process in the existing traditional method for measuring the alpha surface contamination of a mask.

[0005] To solve the above problems, one of the purposes of the present invention is achieved as follows:

[0006] The present invention discloses a control and measurement device for detecting alpha surface contamination of a mask, comprising: a collection box for containing masks to be tested, a measuring component for detecting alpha surface contamination of the masks to be tested, and a conveying device for conveying the masks to be tested;

[0007] A mounting portion for mounting masks is provided in the collection box, the measuring component is located on one side of the collection box, the collection box is located upstream in the conveying direction of the conveying device, and the collection box is located above the conveying surface of the conveying device, the measuring component is located downstream in the conveying direction of the conveying device, and the masks to be tested in the collection box are transported to the measuring component, the measuring component has a measuring portion for placing the masks to be tested, and the measuring portion of the measuring component is lower than the conveying surface of the conveying device, or flush with the conveying surface of the conveying device.

[0008] Wherein, the measuring component includes one or two ZnS detectors, each of which includes a ZnS scintillator, a light guide, and a photomultiplier tube, and the light guide is fixedly connected between the ZnS scintillator and the photomultiplier tube.

[0009] The light guide is in a tapered conical structure, the large diameter end of the light guide is connected to the ZnS scintillator, and the small diameter end of the light guide is connected to the photomultiplier tube.

[0010] Wherein, the side surface of the light guide member is a streamlined curved surface concave inwards.

[0011] There is one ZnS detection body, and a surface of the ZnS scintillator away from the light guide is the measuring part of the measuring assembly.

[0012] There are two ZnS detectors, which are symmetrically arranged with respect to a horizontal plane. There is a gap between the ZnS scintillators of the two ZnS detectors, and the gap is the measuring part of the measuring component.

[0013] Wherein, the conveying device includes two groups of conveying mechanisms, the two groups of conveying mechanisms are arranged oppositely and in parallel, and the two groups of conveying mechanisms simultaneously adopt chain conveying structure or belt conveying structure; the two groups of conveying mechanisms transmit synchronously, and a first hook is fixedly arranged on the conveying surface of each group of conveying mechanisms, and the first hooks of the two conveying mechanisms are arranged oppositely.

[0014] Among them, multiple groups of hooks are arranged in the collection box along the vertical direction, each group of hooks includes two second hooks arranged oppositely, the two second hooks in the same group are at the same height, and each second hook is rotatably connected to the corresponding side of the collection box.

[0015] The second object of the present invention is achieved in this way:

[0016] A method for controlling and measuring the contamination of the alpha surface of a mask of the present invention adopts the above-mentioned device for controlling and measuring the contamination of the alpha surface of a mask, and comprises the following steps:

[0017] a. Perform background measurement: place the measurement component in an environment without radioactive samples, turn on the power to complete the initialization operation, start the background measurement program, collect background signals, and record background measurement data;

[0018] b. The operator places the masks to be tested into the collection box one by one and closes the collection box after placement;

[0019] c. Measure the masks to be tested: when the first hook of the conveyor device is conveyed to the bottom of the collection box, the bottom of the collection box is opened, and the masks at the lower position in the collection box automatically fall off to the first hook of the conveyor device, and are transported to the measuring part of the measuring assembly by the conveyor device for measurement, and the sample measurement data is recorded;

[0020] d. Perform data analysis on the background measurement data and sample measurement data obtained in step a and step c.

[0021] In step a, the background measurement data includes the count rate of the background signal collected each time. The total number of data points collected is N, is the average counting rate of the background signal;

[0022]

[0023] In step c, when measuring the mask to be tested, the mask to be tested is scanned by the measuring component, and the count rate C collected each time is recorded. s,i , the sample measurement data includes the count rate C s,i , N is the total number of data points collected;

[0024] In step d, the sample measurement data needs to be subtracted from the background measurement data during data analysis, and the formula is as follows:

[0025] Among them, C net,i is the sample net counting rate;

[0026] Calculate the nuclide activity A, the formula is as follows:

[0027]

[0028]

[0029] Where, the sample net count rate, ∈ is the detection efficiency of the measurement component, T s is the detection time, and N is the total number of data points collected.

[0030] The beneficial effects of the present invention are:

[0031] The present invention includes a collection box, a measuring component, and a conveying device. The masks to be tested are collected in the collection box, and the masks to be tested in the collection box are transported to the measuring component for measurement by the conveying device, thereby realizing the automatic non-destructive testing of the masks. This automatic non-destructive testing method can count and measure the alpha radioactive substances in the masks worn by workers, and has the characteristics of non-destructiveness, calculation of net counts and spectrum analysis, and rapid classification. Through this method, it is possible to quickly determine whether the radioactive substances in the masks to be tested exceed the safety limit, thereby realizing efficient testing of masks worn by workers in large quantities of uranium enrichment plants.

[0032] The measuring device of the present invention not only improves the efficiency and accuracy of detection, reduces the sample processing steps, simplifies the measurement process, but also provides reliable protection for radiation protection. The application of the measuring device will significantly improve the management level of workers' protective equipment and ensure the health and safety of workers. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0034] Figure 1 It is a schematic diagram of the structure of the present invention;

[0035] Figure 2 It is a schematic diagram of the structure of the measurement component;

[0036] Figure 3 for Figure 2 A magnified view of point A;

[0037] Figure 4 It is a schematic diagram of the structure of the ZnS detector;

[0038] Figure 5 A schematic diagram of the structure of the ZnS detector from another perspective;

[0039] Figure 6 It is a schematic diagram of the structure of the collection box;

[0040] Figure 7 It is a schematic diagram of the structure after the second hook is flipped.

[0041] Description of Reference Numerals

[0042] 1. Collection box; 11. Second hook; 12. Box body; 13. Upper cover; 14. Lower cover; 15. Rotary clamping cylinder; 2. Measuring component; 21. ZnS detection body; 211. ZnS scintillator; 212. Light guide; 213. Protective net; 3. Conveying device; 31. Conveying mechanism; 32. First hook; 4. Mask to be tested. DETAILED DESCRIPTION

[0043] The technical scheme in the embodiment of the present invention is described clearly and completely below in conjunction with the accompanying drawings in the embodiment of the present invention. In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention can also be implemented in other ways different from those described herein, and those skilled in the art can make similar generalizations without violating the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.

[0044] Embodiment 1:

[0045] like Figure 1 As shown, a device for controlling and measuring the alpha surface contamination of a mask of the present invention comprises: a collection box 1 for containing a mask 4 to be tested, a measuring component 2 for detecting the alpha surface contamination of the mask 4 to be tested, and a conveying device 3 for conveying the mask 4 to be tested.

[0046] Figure 1 , Figure 2 , Figure 6 , Figure 7 As shown, a mounting portion for mounting a mask is provided in the collection box 1, the measuring component 2 is located on one side of the collection box 1, the collection box 1 is located upstream in the conveying direction of the conveying device 3, and the collection box 1 is located above the conveying surface of the conveying device 3, and the measuring component 2 is located downstream in the conveying direction of the conveying device 3, and the mask 4 to be tested in the collection box 1 is transported to the measuring component 2, and the measuring component 2 has a measuring portion for placing the mask 4 to be tested, and the measuring portion of the measuring component 2 is lower than the conveying surface of the conveying device 3, or is flush with the conveying surface of the conveying device 3.

[0047] The present invention includes a collection box 1, a measuring component 2, and a conveying device 3. The masks 4 to be tested are collected in the collection box 1, and the masks 4 to be tested in the collection box are transported to the measuring component for measurement through the conveying device 3, thereby realizing the automatic non-destructive detection of the masks. This automatic non-destructive detection method can count and measure the alpha radioactive substances in the masks worn by workers, and has the characteristics of non-destructiveness, calculation of net counts and spectrum analysis, and rapid classification. Through this method, it is possible to quickly determine whether the radioactive substances in the masks to be tested exceed the safety limit, thereby realizing efficient detection of masks worn by workers in large quantities of uranium enrichment plants. The measuring device of the present invention not only improves the efficiency and accuracy of detection, reduces the sample processing steps, simplifies the measurement process, but also provides reliable protection for radiation protection. The application of the measuring device will significantly improve the management level of workers' protective equipment and ensure the health and safety of workers.

[0048] like Figure 6 , Figure 7As shown, in this embodiment, multiple groups of hooks are arranged in the vertical direction in the collection box 1, and each group of hooks includes two second hooks 11 arranged opposite to each other. The two second hooks 11 in the same group are at the same height, and each second hook 11 is rotatably connected to the corresponding side of the collection box 1. In order to facilitate the smooth falling off of the mask 4 to be tested when the second hook 11 rotates, the second hook 11 is in an L-shaped structure, the second hook 11 includes a hook part and a connecting part, the axial direction of the connecting part of the second hook 11 is inclined in the inner and upper direction, and the connecting part of the second hook 11 is in a circular shaft structure. One end of the connecting part of the second hook 11 extends to the outside of the collection box 1 and is fixedly connected to the motor. The motor drives the connecting part to rotate, thereby driving the second hook 11 to rotate. When the operator needs to place the mask 4 to be tested in the collection box 1, the motor drives the second hook 11 to rotate, and the hook part of the second hook 11 is rotated to the upward bending position, so that the operator can smoothly hook the mask to the corresponding second hook 11 in sequence, and the operator places the mask 4 to be tested in sequence from bottom to top. When the mask 4 to be tested needs to be measured, it is only necessary to rotate the second hook 11 of the lowest layer to a state where the hook portion is bent downward, so that the ear straps of the mask 4 to be tested naturally fall downward to the corresponding position of the conveying device 3. The improvement inside the collection box 1 of the present invention ingeniously realizes the natural falling of the mask 4 to be tested, providing a basis for the automatic measurement of the mask 4 to be tested.

[0049] The collection box 1 includes a box body 12, an upper cover 13, and a lower cover 14. The top and bottom ends of the box body 12 are open. The upper cover 13 and the lower cover 14 are rotatably connected to the top and bottom openings of the box body 12 respectively. In the present embodiment, a rotating shaft is fixedly provided on the upper cover 13. The upper cover 13 is rotatably connected to the side of the top opening of the box body 12 through the rotating shaft. The rotating shaft is connected to a rotating clamping cylinder 15. The rotating clamping cylinder 15 drives the upper cover to rotate to the top of the top opening and drives it downward at the same time to seal the top opening of the box body 12. The rotating clamping cylinder 15 can adopt the existing technology. The structure of the lower cover is similar to that of the upper cover. A rotating shaft is fixed on the lower cover 14. The lower cover 14 is rotatably connected to the side of the bottom opening of the box body 12 through the rotating shaft. The rotating shaft is connected to the rotating clamping cylinder 15. The rotating clamping cylinder 15 drives the lower cover 14 to rotate to the bottom of the bottom opening and drives it upward at the same time to seal the bottom opening of the box body 12, thereby realizing the automatic opening and closing of the collection box 1.

[0050] like Figure 3-Figure 5As shown, the measuring assembly 2 includes one or two ZnS detectors 21, each of which includes a ZnS scintillator 211, a light guide 212, and a photomultiplier tube, and the light guide 212 is fixedly connected between the ZnS scintillator 211 and the photomultiplier tube. The ZnS detector 21 can accurately measure the α particles of the mask to be tested. The light guide 212 can be made of aluminum foil, which can facilitate the centralized collection of radioactive pollutants and improve the detection efficiency. In order to further focus the radioactive signal on the effective area of ​​the detector and enhance the sensitivity of the measurement, the light guide 212 is a tapered cone structure, the large diameter end of the light guide 212 is connected to the ZnS scintillator 211, and the small diameter end of the light guide 212 is connected to the photomultiplier tube. In addition, a data acquisition board, a circuit board, etc. are arranged on the outside of the small diameter end of the light guide 212, and the photomultiplier tube can be located on the inside of the small diameter end of the light guide 212. The light guide 212 is designed as a cone-shaped structure, which can also effectively shield or isolate stray radiation in the environment, thereby reducing errors. The side of the light guide 212 is a streamlined curved surface that is concave inward. The streamlined design can reduce air resistance or interference from pollutants, facilitate the centralized collection of radioactive pollutants, and improve detection efficiency. In addition, it is conducive to uniform mechanical distribution, ensuring that the equipment is not easily deformed during long-term operation and extending its service life.

[0051] In one embodiment, the number of the ZnS detector 21 may be one, and the surface of the ZnS scintillator 211 away from the light guide 212 is the measuring portion of the measuring assembly 2. In another embodiment, the number of the ZnS detector 21 may be two.

[0052] In this embodiment, if Figure 3-Figure 5 As shown, there are two ZnS detection bodies 21, and the two ZnS detection bodies 21 are symmetrically arranged about a horizontal plane. There is a gap between the ZnS scintillators 211 of the two ZnS detection bodies 21, and the gap is the measuring part of the measuring assembly 2. In this way, both sides of the mask 4 to be measured can be detected, which improves the accuracy of detection. In this embodiment, a protective net 213 is fitted on one side of the ZnS scintillator 211 away from the light guide 212, which can prevent the ZnS scintillator 211 from being worn when measuring the mask 4 to be measured. On the other hand, it also prevents the two ZnS detection bodies 21 from colliding when they are buckled together, which protects the ZnS scintillator 211 to a certain extent and prolongs the service life of the ZnS scintillator 211.

[0053] like Figure 1As shown, the conveying device 3 includes two groups of conveying mechanisms 31, the two groups of conveying mechanisms 31 are arranged oppositely and in parallel, and the two groups of conveying mechanisms 31 simultaneously adopt a chain conveying structure, or simultaneously adopt a belt conveying structure. In this embodiment, the two groups of conveying mechanisms 31 simultaneously adopt a belt conveying structure. The two groups of conveying mechanisms 31 are synchronously transmitted, and a first hook 32 is fixedly arranged on the conveying surface of each group of conveying mechanisms 31. The first hooks 32 of the two conveying mechanisms 31 are arranged oppositely to hook the mask 4 to be tested.

[0054] Embodiment 2:

[0055] like Figure 1-Figure 7 As shown, a method for controlling and measuring the surface contamination of the mask alpha of the present invention adopts the control and measuring device for the surface contamination of the mask alpha of the embodiment 1, and comprises the following steps:

[0056] a. Perform background measurement: Place the measurement component 2 in an environment without radioactive samples, turn on the power to complete the initialization operation, start the background measurement program, collect background signals, and record background measurement data.

[0057] b. The operator places the masks 4 to be tested into the collection box 1 one by one, and closes the collection box 1 after placing them. The specific process is: the operator first opens the upper cover 13 by rotating the clamping cylinder 15, and then hooks the masks 4 to be tested to the first hooks 32 in the collection box 1 from bottom to top. When the masks 4 to be tested are collected, the upper cover 13 is closed by rotating the clamping cylinder 15.

[0058] A vertical positioning groove (not shown) can be provided in the area where the first hook 32 of the collection box 1 is located, so that the operator can quickly locate the hook of the mask 4 to be tested.

[0059] c. Measure the mask 4 to be tested: When the first hook 32 of the conveyor 3 is conveyed to the bottom of the collection box 1, the bottom of the collection box 1 is opened, and the mask in the lower position in the collection box 1 automatically falls off to the first hook of the conveyor 3, and is transported to the measurement part of the measurement component 2 under the conveyance of the conveyor 3 for measurement, and the sample measurement data is recorded. The specific process is: the two conveying mechanisms 31 are conveyed synchronously (synchronous transmission can be achieved by using existing technology) so that the two first hooks 32 are kept relatively arranged to smoothly hook the mask 4 to be tested. When the two first hooks 32 of the conveyor 3 are conveyed to the bottom of the collection box 1, the bottom of the collection box 1 is opened, and the second hook 11 in the lower position in the collection box 1 is rotated 11 so that the bend is facing downward, so that the mask 4 to be tested automatically falls off to the first hook 32 of the conveyor 3, and is transported to the measurement part of the measurement component 2 under the conveyance of the conveyor 3 for measurement, and the sample measurement data is recorded. In this embodiment, the first hook 32 and the second hook 11 are both elastic hooks, which can adjust the fixing force according to the tightness of the ear straps of the mask 4 to prevent the ear straps from slipping or pulling. In addition, the second hook 11 is L-shaped.

[0060] d. Perform data analysis on the background measurement data and sample measurement data obtained in step a and step c.

[0061] In step a, the background measurement data includes the count rate of the background signal collected each time. (Unit: cps, countper second), the total number of data points collected N, is the average counting rate of the background signal;

[0062]

[0063] The background standard deviation is calculated as:

[0064]

[0065] The calculation of standard deviation can be used to evaluate the stability of background signal.

[0066] In step c, when measuring the mask 4 to be tested, the mask 4 to be tested is scanned by the measuring component 2, and the count rate C collected each time is recorded. s,i , the sample measurement data includes the count rate C s,i .

[0067] In another embodiment, in this step, the contamination of the mask 4 to be tested can be preliminarily classified and judged. The specific operation is as follows: When (k is the confidence coefficient, and its value is selected as 2), the mask 4 to be tested is judged as non-polluted and classified into the non-polluted area. On the one hand, it reduces the volume of mask waste in the radiation area, and on the other hand, it reduces the workload of subsequent calculation and processing of radioactive masks. When , proceed to the subsequent step d.

[0068] In step d, the sample measurement data needs to be subtracted from the background measurement data during data analysis, and the formula is as follows:

[0069]

[0070] Among them, C net,i is the sample net counting rate;

[0071] Calculate the nuclide activity A, the formula is as follows:

[0072]

[0073]

[0074] Where, the sample net count rate, ∈ is the detection efficiency of the measurement component 2, T s is the detection time, and N is the total number of data points collected.

[0075] Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

Claims

1. A control and measurement device for mask alpha surface contamination, characterized in that: include: A collection box for containing masks to be tested, a measuring component for detecting alpha surface contamination of the masks to be tested, and a conveying device for conveying the masks to be tested; A mounting portion for mounting masks is provided in the collection box, the measuring component is located at one side of the collection box, the collection box is located upstream in the conveying direction of the conveying device, and the collection box is located above the conveying surface of the conveying device, the measuring component is located downstream in the conveying direction of the conveying device, and the masks to be tested in the collection box are transported to the measuring component, the measuring component has a measuring portion for placing the masks to be tested, and the measuring portion of the measuring component is lower than the conveying surface of the conveying device, or flush with the conveying surface of the conveying device.

2. A control and measurement device for mask alpha surface contamination according to claim 1, characterized in that: The measuring assembly comprises one or two ZnS detectors, each of which comprises a ZnS scintillator, a light guide, and a photomultiplier tube, wherein the light guide is fixedly connected between the ZnS scintillator and the photomultiplier tube.

3. A control and measurement device for mask alpha surface contamination according to claim 2, characterized in that: The light guide is in a tapered conical structure, the large-diameter end of the light guide is connected to the ZnS scintillator, and the small-diameter end of the light guide is connected to the photomultiplier tube.

4. A control and measurement device for mask alpha surface contamination according to claim 3, characterized in that: The side surface of the light guide member is a streamlined curved surface that is concave inwards.

5. A control and measurement device for mask alpha surface contamination according to claim 2, characterized in that: The number of the ZnS detection body is one, and the side of the ZnS scintillator away from the light guide is the measuring part of the measuring assembly.

6. A control and measurement device for mask alpha surface contamination according to claim 2, characterized in that: There are two ZnS detectors, which are symmetrically arranged with respect to a horizontal plane. There is a gap between the ZnS scintillators of the two ZnS detectors, and the gap is the measuring part of the measuring component.

7. A control and measurement device for mask alpha surface contamination according to claim 1, characterized in that: The conveying device includes two groups of conveying mechanisms, which are arranged opposite to each other and in parallel. The two groups of conveying mechanisms simultaneously adopt a chain conveying structure or a belt conveying structure. The two groups of conveying mechanisms transmit synchronously, and a first hook is fixedly arranged on the conveying surface of each group of conveying mechanisms, and the first hooks of the two conveying mechanisms are arranged opposite to each other.

8. A control and measurement device for mask alpha surface contamination according to claim 1, characterized in that: A plurality of groups of hooks are arranged in the vertical direction in the collection box, each group of the hooks includes two second hooks arranged opposite to each other, the two second hooks in the same group are at the same height, and each second hook is rotatably connected to the corresponding side of the collection box.

9. A method for measuring the alpha surface contamination of a mask, characterized in that: A control and measurement device for the alpha surface contamination of a mask according to any one of claims 1 to 8 is used, comprising the following steps: a. Perform background measurement: place the measurement component in an environment without radioactive samples, turn on the power to complete the initialization operation, start the background measurement program, collect background signals, and record background measurement data; b. The operator places the masks to be tested into the collection box one by one and closes the collection box after placement; c. Measure the masks to be tested: when the first hook of the conveyor device is conveyed to the bottom of the collection box, the bottom of the collection box is opened, and the masks at the lower position in the collection box automatically fall off to the first hook of the conveyor device, and are transported to the measuring part of the measuring assembly by the conveyor device for measurement, and the sample measurement data is recorded; d. Perform data analysis on the background measurement data and sample measurement data obtained in step a and step c.

10. A method for controlling and measuring the alpha surface contamination of a mask according to claim 8, characterized in that: In step a, the background measurement data includes the count rate of the background signal collected each time The total number of data points collected is N, is the average count rate of the background signal: In step c, when measuring the mask to be tested, the mask to be tested is scanned by the measuring component, and the count rate C collected each time is recorded. s,i , the sample measurement data includes the count rate C s,i , N is the total number of data points collected; In step d, the sample measurement data needs to be subtracted from the background measurement data during data analysis, and the formula is as follows: Among them, C net,i is the sample net counting rate; Calculate the nuclide activity A, the formula is as follows: Where, the sample net count rate, ∈ is the detection efficiency of the measurement component, T s is the detection time, and N is the total number of data points collected.