Special spaceflight computer DA test method and platform

Abstract

The invention discloses a spaceflight special-purpose computer DA test method and platform, the platform comprises a test module, a processor, a digital multimeter and a matrix board card, a test case is imported into the digital multimeter and the processor, the digital multimeter is switched to a voltage gear corresponding to the test case, and the matrix board card is connected with the processor. The processor is used for controlling the matrix board card to be switched to a conduction state corresponding to the test cases, the digital multimeter obtains voltage information of a tested product through the matrix board card, the test module analyzes the voltage information to obtain a corresponding analysis result, and after all the test cases are tested, the test module generates a final analysis result. According to the DA test method and platform, rapid and accurate test point switching is effectively supported, the numerical value of the digital multimeter does not need to be manually read, the test platform can automatically read the test value of the current test point and can automatically judge whether the current DA test value is correct or not, manpower and material resources are greatly saved, and the DA test efficiency of aerospace computer products is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of analog quantity DA testing, and in particular to a DA testing method and platform for aerospace-specific computers. Background Art

[0002] The production of domestic aerospace computers is mostly dominated by manual testing, which is relatively inefficient. With the changes in the international situation, the demand for national defense is constantly increasing. The previous debugging process and testing methods can no longer meet the explosive growth of production needs. The workload of front-line production personnel has increased dramatically, and they often work continuously and tirelessly, which is not only inefficient, but also brings low-level operational risks.

[0003] At present, when conducting DA tests, operators need to adjust the range of the digital multimeter according to the measured voltage. Each test must be repeated several times, and the test data must be manually interpreted and recorded. The test efficiency is low and it is difficult to meet the current mass production needs. The manual measurement, interpretation, and recording methods are not only a waste of manpower, but also a waste of material resources. For example, if the product to be tested has N D / A outputs, during the test, N high-precision digital multimeters need to be connected at the same time, or when testing different outputs, the connection path of the digital multimeter needs to be manually changed, which is time-consuming and labor-intensive, inefficient, and prone to misoperation hazards.

[0004] Some scholars have also developed an AC power supply voltage test system, which consists of a host, a programmable AC power supply, a power meter A, a power meter B, a digital multimeter A, a digital multimeter B and a multiplexer. It does not involve the program control of the digital multimeter and cannot automatically read the test value of the current test point. And the multiplexer used in this work is a topology that can connect one input to multiple outputs or one output to multiple inputs. This topology is usually used for scanning and is suitable for devices that automatically connect a series of channels to a common line. The matrix switch card is one of the flexible switch configurations. The matrix can connect multiple inputs to multiple outputs organized in rows and columns. Any column can be connected to any number of rows, and any row can be connected to any number of columns. There is a switch at each intersection of a row and a column. When the switch is closed, the row is connected to the column, which is more flexible. Summary of the invention

[0005] The present invention provides a DA test method and platform for aerospace special computers, which are used to solve the current problems of manual point reading test and manual filling of debugging records during DA testing, low test efficiency and low automation. In one aspect, the present invention provides a method for testing the performance of aerospace-specific computers, comprising: Get test cases; Switch the digital multimeter to the voltage range corresponding to the test case; Importing the test case from the test module to the processor; The processor controls the matrix board to switch to a conduction state corresponding to the test case; The digital multimeter obtains the voltage information of the product under test through the matrix board; The test module analyzes the voltage information to obtain corresponding analysis results; After all the test cases are tested, the final analysis results are generated.

[0006] Preferably, the specific method of switching the digital multimeter to the voltage range corresponding to the test case is as follows: The test module automatically analyzes the voltage theoretical value of the test case, and the digital multimeter selects a voltage gear that matches the voltage theoretical value.

[0007] Preferably, the processor generates a corresponding driving signal based on the test case analysis, and the matrix board responds to the driving signal to realize the switching on and off of the matrix board.

[0008] Preferably, after the processor generates the driving signal, the 3-8 decoder circuit decodes the driving signal to generate a corresponding control signal, and the control signal controls the conduction and disconnection of the matrix board.

[0009] Preferably, when the digital multimeter acquires the voltage information of the product under test through the matrix board, the digital multimeter will collect the voltage information of the product under test multiple times according to the test case.

[0010] Preferably, when analyzing the voltage information, the test module calculates a maximum error value between a set standard voltage value and a maximum measured value in the voltage information, and determines a test result of the voltage information according to the maximum error value.

[0011] Preferably, when the maximum error value is less than or equal to the error requirement, the test result is a correct test, and when the maximum error value is greater than the error requirement, the test result is a test error.

[0012] Preferably, after the test module completes the analysis of one test case, it performs the analysis of the next test case in the test sequence until the analysis of all the test cases is completed.

[0013] On the other hand, the present invention provides a DA performance test platform for aerospace-specific computers, comprising: a test module, a processor, a digital multimeter and a matrix board; The test module is used to import test cases into the digital multimeter and the processor; The digital multimeter is switched to the voltage range corresponding to the test case, and the voltage information of the product under test is obtained through the matrix board; The processor is used to control the matrix board to switch to a conduction state corresponding to the test case; The test module is also used to analyze the voltage information to obtain corresponding analysis results; After all the test cases are tested, the test module generates a final analysis result.

[0014] Preferably, the platform also includes a matrix board driving circuit, the processor generates corresponding driving instructions after analyzing the test case, and the matrix board driving circuit generates corresponding driving signals according to the driving instructions, and the driving signal is used to switch the matrix board to a conductive state corresponding to the test case.

[0015] Beneficial Effects The present invention focuses on solving the problem of automated control of a digital multimeter, designs a multi-channel fast-switchable matrix board, effectively supports fast and accurate test point switching, does not require manual reading of the digital multimeter's numerical value, and the test platform can automatically read the test value of the current test point, and can automatically determine whether the current DA test value is correct, supports one-key generation of debugging records, and is easy to trace. The equipment and software have strong versatility, the test information is interactively smooth, the development cost is low, and the informatization and digitization of the test are fully realized, which greatly saves manpower and material resources, completely eliminates low-level events such as the outflow of over-standard products and human recording errors caused by human misinterpretation, solves the problems of correctness and real-time performance of human interpretation, saves the economic cost of DA testing, and greatly improves the efficiency of DA testing of aerospace computer products. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1 A flowchart of a method for testing DA performance of an aerospace-specific computer provided by an embodiment of the present invention; Figure 2 A hardware connection block diagram of a DA performance test platform for aerospace-specific computers provided in an embodiment of the present invention; Figure 3 A functional block diagram of a multi-channel fast-switchable matrix board system for a space-specific computer DA performance test platform provided by an embodiment of the present invention; Figure 4 The Ethernet circuit functional block diagram of a DA performance test platform for aerospace-specific computers provided by an embodiment of the present invention; Figure 5 A decoder cascade design block diagram of a space-specific computer DA performance test platform provided by an embodiment of the present invention; Figure 6 A relay cascade design block diagram of a DA performance test platform for aerospace-specific computers provided by an embodiment of the present invention; Figure 7 An import test case of a DA performance test platform for aerospace-specific computers provided in an embodiment of the present invention; Figure 8 A test software operation diagram of a DA performance test platform for aerospace-specific computers provided in an embodiment of the present invention; Fig. 9 A debugging record header saved by a DA performance test platform for aerospace-specific computers provided in an embodiment of the present invention; Fig.10 A debugging record form saved by a DA performance test platform for an aerospace-specific computer provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] Example 1 Figure 1 A flowchart of a method for testing the performance of a space-specific computer DA provided by an embodiment of the present invention. A method for testing the performance of a space-specific computer DA provided by an embodiment of the present invention comprises the following steps: S1. Obtain test cases.

[0020] Specifically, Figure 7As shown, the test case is in a standard excel format, and each row of excel is a test case. Each test case includes the following fields: positive signal name, negative signal name, whether to send instructions to DS, output standard voltage value (V), error requirement (±mV), number of tests, positive connector, positive point number, negative connector, negative point number, contact positive, contact negative, maximum measured value (V), maximum error (V), judgment result, test status, completion time, measurement time (s), interval time (s), compensation configuration K, compensation gain B. Among them, the positive signal name, the negative signal name, whether to send instructions to DS, output standard voltage value (V), error requirement (±mV), number of tests, positive connector, positive point number, negative connector, negative point number, contact positive, contact negative, measurement time (s), interval time (s), compensation configuration K, and compensation gain B are already known in advance in the test case. The maximum measured value (V), maximum error (±mV), judgment result, test status, and completion time are all things that need to be analyzed and judged by the test program. The measurement time (s) is the time that the test program needs to wait between sending the test point switching command to the processor and controlling the digital multimeter to collect data. The interval time (s) is the time that the test software needs to wait between testing two adjacent test cases.

[0021] S2. Switch the digital multimeter to the voltage range corresponding to the test case.

[0022] Exemplarily, the specific method of switching the digital multimeter to the voltage range corresponding to the test case is as follows: The test module automatically analyzes the voltage theoretical value of the test case, and the digital multimeter selects a voltage gear that matches the voltage theoretical value.

[0023] S3. Import the test case from the test module to the processor.

[0024] S4. The processor controls the matrix board to switch to a conduction state corresponding to the test case.

[0025] Exemplarily, the processor generates a corresponding driving signal based on the test case analysis, and the matrix board responds to the driving signal to turn the matrix board on and off.

[0026] Specifically, for each test point, the test program sends a test point switching instruction to the processor, and the processor controls the matrix board drive circuit through the GPIO pins of the chip to realize the conduction and disconnection of each path of the matrix board.

[0027] S5. The digital multimeter obtains voltage information of the product under test through a matrix board.

[0028] Exemplarily, when the digital multimeter acquires the voltage information of the product under test through the matrix board, the digital multimeter will collect the voltage information of the product under test multiple times according to the test case.

[0029] Specifically, the test program will automatically send instructions to the digital multimeter to control the digital multimeter to complete N voltage acquisitions, where N is the number of tests in the test case, and automatically record the voltage values ​​acquired N times.

[0030] S6. The test module analyzes the voltage information to obtain corresponding analysis results.

[0031] Exemplarily, when analyzing the voltage information, the test module calculates a maximum error value between a set standard voltage value and a maximum measured value in the voltage information, and determines a test result of the voltage information according to the maximum error value.

[0032] Exemplarily, when the maximum error value is less than or equal to the error requirement, the test result is a correct test, and when the maximum error value is greater than the error requirement, the test result is a test error.

[0033] Specifically, the maximum measured value and the maximum error are calculated based on the collected voltage value, and the correctness of the test is judged based on the error requirements. The test status and completion time are recorded and displayed, and the test records are saved in a certain format.

[0034] Furthermore, in the test program, the three functions of initializing the digital multimeter, measuring the voltage, and closing the digital multimeter are called to complete the measurement of the DA value of the current test point. Assume that the voltage value collected by the digital multimeter N times is {v_1, v_2, …, v_N}, N is the number of tests in the test case, then the N measured values ​​are {V_1, V_2, …, V_N}, where V_n=v_n*K+B, n can be from 1 to N, where K is the compensation configuration K, and B is the compensation gain B. Then the maximum measured value is V_max= max(V_1, V_2, …, V_N), and the output standard voltage value is V_std, then the calculation formula of the maximum error V_error_max is V_error_max=abs(V_max-V_std). If V_error_max is less than or equal to the error requirement V_error_std, the judgment result is marked as "test correct" and the box is marked green. If V_error_max is greater than the error requirement V_error_std, the result is marked as "test error" and the box is marked in red. If the current test case has been tested, the test status is displayed as "tested"; at the same time, the current time is recorded as the completion time of the test case, and the specific format is "yyyy / mm / ddhhmmss". If the current test case has not been tested, the test status is displayed as "not tested".

[0035] Furthermore, the specific effects of DA test software are as follows Figure 8 As shown, users can click "Matrix Card Connect" and "Matrix Card Disconnect" to control the network connection and disconnection of the DA test software and the multi-channel matrix board that can be quickly switched. Click "Test Case Import" to support users to select test cases located in any storage location of the test computer and load them, which will be automatically displayed on the interface line by line. Users can click the "Select All" button and the "Unselect" button to select or deselect all test cases on the interface with one click. You can also enter the start sequence number and the end sequence number, and click the "Select" button to select the test case. Click the "Start Test" and "Stop Test" buttons to control the test. Click "Output Report" or "Export Report" to export the debugging record. Click "Clear Test Data with One Click" to clear the test data on the DA test software interface. The test progress column can display the current test progress, which is expressed in the form of "m / M", where m represents the number of test cases that have been completed as of the current moment. M represents the total number of test cases that need to be tested. After an Excel test case is tested, the DA test software will automatically count the number of test errors and the number of test correct items and display them. In addition, the DA test software interface is also equipped with a product test configuration information input interface, which mainly includes the following information: product code, component code, component name, process file number, station number, instrument number, instrument validity period, digital meter model, debugger 1, debugger 2, debug date, stage, local IP list, matrix card IP, digital meter validity period. Among them, the product code, component code, component name, process file number, and stage are all parsed from the product information of the imported test case. The station number, instrument number, instrument validity period, digital meter model, debugger 1, debugger 2, debug date, local IP, digital meter validity period, and matrix card IP all need to be filled in manually by the operator.

[0036] Furthermore, if Fig. 9 The following is the debug record header saved by the DA performance test platform, which mainly corresponds to the product test configuration information of the DA test software, including product information, test equipment information, and tester information. Among them, product information includes product code, product set number, product stage, component (whole) name, process file number, component (whole) code. Test equipment information mainly includes signal measuring instrument equipment number, signal measuring instrument measurement validity period, digital multimeter model, and digital multimeter measurement validity period. Tester information mainly includes tester 1, tester 2, and test time.

[0037] Furthermore, if Fig.10As shown, the debugging record form mainly includes the positive signal name, negative signal name, voltage standard value (V), error requirement (±mV), measured value (V), error (mV), and judgment result of all test cases.

[0038] S7. After all the test cases are tested, a final analysis result is generated.

[0039] Exemplarily, after the test module completes the analysis of one test case, it performs the analysis of the next test case in the test sequence until the analysis of all the test cases is completed.

[0040] Specifically, when testing the next test case, it is necessary to wait for the interval time to send the test point switching instruction to the processor. If the current test case has been tested, the test status is displayed as "tested", and the current time is recorded as the completion time of the test of the current case. The specific format is "yyyy / mm / ddhhmmss". If the current test case has not been tested, the test status is displayed as "untested". According to the above method, each row of the test case is gradually scanned. If the scan is completed, the test is terminated, and the DA test software disconnects the Ethernet connection with the multi-channel fast-switchable matrix board.

[0041] The embodiment of the present invention also provides a DA performance test platform for aerospace-specific computers, such as Figure 2 As shown, the platform includes: a test module, a processor, a digital multimeter and a matrix board; The test module is used to import test cases into the digital multimeter and the processor; The digital multimeter is switched to the voltage range corresponding to the test case, and the voltage information of the product under test is obtained through the matrix board; The processor is used to control the matrix board to switch to a conduction state corresponding to the test case; The digital multimeter obtains the voltage information of the product under test through the matrix board; The test module is also used to analyze the voltage information to obtain corresponding analysis results; After all the test cases are tested, the test module generates a final analysis result.

[0042] Exemplarily, the platform also includes a matrix board driving circuit, the processor generates corresponding driving instructions after analyzing the test case, and the matrix board driving circuit generates corresponding driving signals according to the driving instructions, and the driving signals are used to switch the matrix board to a conductive state corresponding to the test case.

[0043] Specifically, the matrix board is a multi-channel fast-switching matrix board, the digital multimeter model is Keysight34461A, and the processor model is STM32F407. The product under test is connected to the multi-channel fast-switching matrix board, and the multi-channel fast-switching matrix board is driven by the multi-channel fast-switching matrix board driving circuit, and the positive end and the negative end are connected to the Keysight34461A digital multimeter. The digital multimeter Keysight34461A has 5 gears, namely (1) the range is 0.1 and the resolution is 0.0000001 (2) the range is 1 and the resolution is 0.000001 (3) the range is 10 and the resolution is 0.00001 (4) the range is 100 and the resolution is 0.0001 (5) the range is 1000 and the resolution is 0.001.

[0044] The test module is responsible for coordinating the working status of the entire system. It communicates with the Keysight34461A digital multimeter and the STM32F407 processor through two network ports respectively. It has the ability to send instructions to the Keysight34461A digital multimeter and the STMF407 processor, and can perform two major functions: data storage and data analysis. It can save the test results of product 1 to product n in the internal storage module. The STM32F407 controls the multi-channel fast-switching matrix board drive circuit through the GPIO pins of the chip to realize the conduction and disconnection of each path of the multi-channel fast-switching matrix board.

[0045] Furthermore, if Figure 3 As shown, the multi-channel fast-switching matrix board consists of an Ethernet circuit, a power circuit, a control circuit, a drive circuit, a 3-8 decoder circuit, a relay output, a D-type connector, etc. It can realize fast switching of 124 groups of signals and has the advantages of automation, modularization, and easy combination.

[0046] The multi-channel fast-switching matrix board is powered by 12V, transmits commands via Ethernet, controls the switching of 124 groups of signals, and can realize time-sharing acquisition of 124 DA signals.

[0047] The following is a detailed description of each module of the multi-channel fast switching matrix board: like Figure 4 As shown, the Ethernet circuit is implemented by the high-performance Ethernet transceiver LAN8720A, which is a single-power-supply 10Base-T / 100Base-TX physical layer transceiver with a voltage range of +1.6V to +3.6V.

[0048] Power supply circuit: The multi-channel fast-switching matrix board is powered by 12V, and a domestic four-channel DC / DC regulator is used to convert +5V and +3.3V power supplies. The chip can operate in an input voltage range of 4V to 14V, and each channel can provide up to 4A of continuous output current, and only requires very few external input and output capacitors. The two channels are connected in parallel to achieve a load capacity of 8A for +5V and +3.3V outputs respectively.

[0049] Control circuit: The core of the control circuit is the STM32 series 32-bit processor STM32F407VET6 based on ARM Cortex-M. The device has the characteristics of high performance, low power consumption, low voltage, etc. The main frequency can reach 168MHz, which can provide fast processing capabilities, built-in 512KB flash memory, and the power supply voltage is 1.8V-3.6V. The device integrates an Ethernet controller to realize command transmission together with the Ethernet circuit. The design uses two groups of I / O of the processor to realize the control of positive and negative signals. Each group of signals includes a drive enable signal (EN), a 6-bit data signal (DO: D5), and high and low control signals (P64_EN and P124_EN), a total of 9 I / Os.

[0050] Driving circuit: The I / O signal of the processor is 3.3V level, which is converted into 5V signal by the 164245 driving circuit. By setting the direction control terminal (DIR) and enable control terminal (OE) of 164245, the control data is sent from A bus to B bus, or from B bus to A bus. The output load current is 24mA.

[0051] like Figure 5 As shown, the 3-8 decoder circuit uses the 3-8 decoder 54HCT138 to realize the expansion of the control signal. The device has three address input signals A0, A1 and A2; three enable control terminals E1, E2 and E3; a total of eight output signals O0~O7 are provided; when the control terminals E1 and E2 are low and the control terminal E3 is high, the decoder is in working state; otherwise, the decoder is disabled and all output terminals are locked at high levels.

[0052] like Figure 6 As shown in the figure, the signals output by the decoder control the relays of the corresponding channels to turn on and off. The relays are APY212G2EH from Southern Advanced. The maximum load voltage and current of this device are 60V and 2A respectively. The on-current IF is 10mA. When powered on, all relays are in the off state, and only one can be closed at the same time. After closing, the measured signal is switched to the digital multimeter for collection.

[0053] For D-type connectors, the multi-channel fast-switch matrix board uses 4 DB series 62-core rectangular connectors HD-62 as external connectors. This series of connectors has the characteristics of low cost and high reliability.

[0054] Furthermore, the most important thing for the program control of the digital multimeter is to develop general software for the digital multimeter KEYSIGHT34461A. This patent has developed a standard software library that can realize the automatic acquisition and measurement of voltage, resistance, diode, period (frequency), and conductivity through the program. The specific interface is shown in Table 1 Digital multimeter program control standard software library: Table 1

[0055] Furthermore, for the present invention, taking a certain model as an example, product testing requires two people to operate: one post sets up the instrument and interprets the data; the other post records the data. It takes 60 minutes to test a product. There are about 150 products in each batch of this model. Two performance tests are required in the entire production process, which requires two people to take 300 hours, a total of 600 testing hours, and the efficiency is very low. After applying the performance testing platform, testing a product only requires one person, and the test time for each unit is shortened to 15 minutes. Testing a batch of products only requires 75 testing hours, and the efficiency is improved by 800%.

[0056] Although the preferred embodiments of the present invention have been described, those skilled in the art may make other changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0057] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A method for testing the performance of aerospace-specific computers, characterized in that: The following steps are involved: Get test cases; Switch the digital multimeter to the voltage range corresponding to the test case; Importing the test case from the test module to the processor; The processor controls the matrix board to switch to a conduction state corresponding to the test case; The digital multimeter obtains the voltage information of the product under test through the matrix board; The test module analyzes the voltage information to obtain corresponding analysis results; After all the test cases are tested, the final analysis results are generated.

2. The method for testing the DA performance of aerospace-specific computers according to claim 1, characterized in that: The specific method of switching the digital multimeter to the voltage range corresponding to the test case is as follows: The test module automatically analyzes the voltage theoretical value of the test case, and the digital multimeter selects a voltage gear that matches the voltage theoretical value.

3. The method for testing the DA performance of aerospace-specific computers according to claim 1, characterized in that: The processor generates a corresponding driving signal based on the test case analysis, and the matrix board responds to the driving signal to turn on and off the matrix board.

4. A method for testing the performance of aerospace-specific computers according to claim 3, characterized in that: After the processor generates the driving signal, the 3-8 decoder circuit decodes the driving signal to generate a corresponding control signal, and the control signal controls the conduction and disconnection of the matrix board.

5. The method for testing the DA performance of aerospace-specific computers according to claim 1, characterized in that: When the digital multimeter obtains the voltage information of the product under test through the matrix board, the digital multimeter will collect the voltage information of the product under test multiple times according to the test case.

6. The method for testing the performance of aerospace-specific computers according to claim 1, characterized in that: When analyzing the voltage information, the test module calculates the maximum error value between the set standard voltage value and the maximum measured value in the voltage information, and determines the test result of the voltage information according to the maximum error value.

7. A method for testing the performance of aerospace-specific computers according to claim 6, characterized in that: When the maximum error value is less than or equal to the error requirement, the test result is a correct test; when the maximum error value is greater than the error requirement, the test result is a test error.

8. The method for testing the performance of aerospace-specific computers according to claim 1, characterized in that: When the test module completes the analysis of one test case, it performs the analysis of the next test case in the test sequence until all the test cases are analyzed.

9. A DA performance test platform for aerospace-specific computers, characterized in that: The platform applies a method for testing the DA performance of a space-specific computer as described in any one of claims 1 to 8, and the platform includes a test module, a processor, a digital multimeter and a matrix board; The test module is used to import test cases into the digital multimeter and the processor; The digital multimeter is switched to the voltage range corresponding to the test case, and the voltage information of the product under test is obtained through the matrix board; The processor is used to control the matrix board to switch to a conduction state corresponding to the test case; The test module is also used to analyze the voltage information to obtain corresponding analysis results; After all the test cases are tested, the test module generates a final analysis result.

10. The aerospace-specific computer DA performance test platform according to claim 9, characterized in that: The platform also includes a matrix board driving circuit. The processor generates corresponding driving instructions after analyzing the test case. The matrix board driving circuit generates corresponding driving signals according to the driving instructions. The driving signals are used to switch the matrix board to a conductive state corresponding to the test case.

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