Solid particle size and gradation nondestructive measurement device and measurement method

Abstract

The invention discloses a solid particle size and gradation nondestructive measurement device and method, and the device comprises a vibration dispersion device which is used for carrying out the vibration dispersion of a solid particle sample, and outputting the solid particle sample; the material receiving device sequentially comprises a guide part and a detection part in the vertical direction, and the material receiving device is used for receiving the solid particle samples output by the vibration dispersion device and guiding the fixed particle samples to freely fall within a preset range to pass through the detection part through the guide part; the light source system is used for outputting straight light rays to the first side of the detection part of the material receiving device in the preset direction; and the image acquisition device is used for being arranged outside the second side of the material receiving device in the preset direction so as to perform image acquisition on the detection part. When the measuring device is used for measuring the particle size and the particle gradation of particles, the particles are dispersed and output only through vibration and then freely fall, the particles and solid particle samples are measured in a non-contact mode in the measuring process, the samples are not damaged after measurement, the particles can still be recycled, and compared with an existing measuring mode, the measuring device can complete measurement more efficiently and more precisely.

Description

Technical Field

[0001] The present invention relates to the technical field of particle size measurement, and in particular, to a non-destructive measurement device for solid particle size and gradation. In addition, the present invention also relates to a measurement method including the non-destructive measurement device for solid particle size and gradation. Background Art

[0002] Solid particle size and gradation detection are widely used in daily life and production in various fields. For example, edible salt, sugar, plastic particles, feed, etc. need to detect their particle size during the production process. In addition, in the production process of solid tablets in the pharmaceutical industry or in the production of construction sand in the construction industry, it is necessary not only to detect the particle size but also to monitor the particle gradation, so as to control the production process, adjust the front-end production process, and ensure product quality. In different application fields, the requirements for particle characteristics are different. Among all the indicators that reflect the characteristics of solid particles, particle size and particle size distribution are the most concerned indicators in all application fields. Therefore, it is very important to objectively and truly measure the particle size and particle size distribution of solid particles.

[0003] At present, the main methods for measuring particle size and gradation are vibration screening method and light scattering method. Among them, vibration screening method is the most widely used method in relevant industry standards and national standards. It uses sieves with different apertures to screen the powder. The operation is relatively complicated and time-consuming. At the same time, the screening method has poor repeatability, and the information obtained is single and has large errors. It can only obtain the average particle size of the particles, and cannot obtain information such as the shape of the particles. For example, the technical solution with publication number CN110455691A discloses a dust particle size measurement system and its use method, which uses a vibration device to disperse the dust particles, and then uses a scanning device to scan the dust particles to calculate the particle size. The dispersed particles enter the scanning area field of view too dispersed, and the scanning device is difficult to ensure the accuracy of the depth of field range measurement. The light source is front lighting, and the scanned particles are projected on the background board as non-real projections, which will inevitably have large errors.

[0004] The microscope image method or three-dimensional modeling image method in the light scattering method uses an optical or electron microscope to directly observe the shape and size of particles. The measurement process is cumbersome, slow, and requires professional operation. At the same time, this method lacks an effective particle dispersion method and is difficult to handle mixed particles.

[0005] In summary, in view of the above problems faced by the measurement methods of particle size and gradation, it is very necessary to study a method that can quickly and accurately measure the particle size and gradation of each particle in a mixed particle. Summary of the invention

[0006] The present invention provides a nondestructive measurement device and method for solid particle size and gradation, so as to solve the technical problems of small particle size detection variation range, low detection precision and low particle gradation accuracy in the prior art of nondestructive detection of solid particle size.

[0007] According to one aspect of the present invention, there is provided a non-destructive measuring device for solid particle size and gradation, comprising:

[0008] A vibration dispersion device, used to disperse and output the solid particle sample by vibration;

[0009] A material receiving device, which includes a guide part and a detection part in sequence along the vertical direction, wherein the material receiving device is used to receive the solid particle sample output by the vibration dispersion device and guide the fixed particle sample to freely fall through the detection part within a preset range by the guide part;

[0010] A light source system, used for outputting straight light along a preset direction to a first side of the detection portion of the material receiving device;

[0011] An image acquisition device is arranged outside the second side of the material receiving device along a preset direction to acquire an image of the detection part.

[0012] As a further improvement of the above technical solution, the vibration dispersion device includes a feed hopper, a feeding trough and a vibration motor. The feed hopper is arranged at the first end of the feeding trough, and the second end of the feeding trough is located above the material receiving device. The vibration motor is used to apply vibration to the feeding trough to disperse the solid particle sample and move it from the first end of the feeding trough to the second end.

[0013] As a further improvement of the above technical solution, the light source system includes a mounting bracket, an LED chips group arranged on the mounting bracket, a light-evening structure arranged on the mounting bracket and located outside the output end of the LED chips group, and a lens group arranged between the LED chips group and the detection unit.

[0014] As a further improvement of the above technical solution, the light-evening structure includes a light-evening cap covering the output end of the LED chipset and a light-evening film arranged between the inner side of the light-evening cap and the output end of the LED chipset.

[0015] As a further improvement of the above technical solution, the image acquisition device includes a spectroscopic module, a first camera and a second camera. The spectroscopic module is used to guide the light passing through the detection part to the first camera according to a first preset ratio and to guide it to the second camera according to a second preset ratio. Alternatively, the spectroscopic module is used to guide the light passing through the detection part to the first camera and the second camera respectively. The first camera is provided with a first lens having a first preset magnification, and the second camera is provided with a second lens having a second preset magnification.

[0016] As a further improvement of the above technical solution, the spectroscopic module includes a first spectroscopic prism arranged between the detection unit and the first camera and a second spectroscopic prism arranged outside the refractive end of the first spectroscopic prism, and the second camera is arranged outside the refractive end of the second spectroscopic prism.

[0017] As a further improvement of the above technical solution, the image acquisition device includes a calibration plate for being arranged on the detection part, and the calibration plate is used for calibrating the image acquisition device.

[0018] According to another aspect of the present invention, there is also provided a measurement method, which is applied to any of the above-mentioned non-destructive measurement devices for solid particle size and gradation, and the measurement method comprises:

[0019] S1. Image acquisition device calibration;

[0020] S2. Start measuring and put the solid particle sample into the vibration dispersion device;

[0021] S3. The image acquisition device acquires the image and the light source system is turned on;

[0022] S4. The image acquisition system transmits the acquired image data to the processing system for analysis and processing;

[0023] S5. The processing system calculates the particle size and particle grading through correction, modeling analysis.

[0024] As a further improvement of the above technical solution, step S3 includes: instructing the light source system to turn on under the condition that the image acquisition device is exposed and turned on, and the light source system is turned on for 1 us.

[0025] As a further improvement of the above technical solution, when calculating the particle gradation, step S5 includes: performing field correction, correcting the statistical data of the detection area of ​​the detection unit; performing distribution correction, correcting based on the particle distribution curve and the screening statistical results.

[0026] The present invention has the following beneficial effects:

[0027] The measuring device uses a vibration dispersion device to vibrate and disperse the solid particle sample and outputs it under vibration conditions so that it falls into the receiving device. The solid particle sample falls freely in the receiving device, and is guided and limited by the guide part to limit the falling range of the solid sample particles, so that the dispersed solid sample particles are evenly distributed and effectively gathered to pass through the detection part, thereby ensuring the number of sample detection; the light source system outputs straight light to the first side of the detection part of the receiving device in a preset direction, so that the projection size and the actual size of the particles are consistent and the detection part area is evenly illuminated, so that the image acquisition device obtains a clearer image and improves the detection accuracy; the light source system controls the illumination time by stroboscopic frequency, reduces the displacement of solid particles during the exposure time, obtains a more precise image, and makes the measurement result more accurate; the image acquisition system outputs a .... The images are collected from both sides. After the images are collected at an extremely short exposure time, the computer system processes and analyzes the images and calculates the particle size and particle gradation. By using the measuring device to measure the particle size and particle gradation, the particles only fall freely after vibration dispersion output. The measurement process is non-contact with the solid particle sample, so the sample is intact after measurement, and the particles can still be recycled. At the same time, the measuring device can not only obtain the particle size and particle size distribution through image acquisition, but also obtain a more realistic particle size based on the straight light output by the light source system compared to the existing measurement method, and complete the measurement of solid particles more efficiently, with high precision and low error, and can adapt to the measurement and processing of mixed particles. At the same time, the particle shape information can also be obtained, which can further carry out multi-faceted and multi-dimensional measurement and analysis.

[0028] In addition to the above-described purposes, features and advantages, the present invention has other purposes, features and advantages. The present invention will be further described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The drawings constituting a part of this application are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0030] Figure 1 is a schematic structural diagram of a nondestructive measuring device for solid particle size and gradation according to a preferred embodiment of the present invention;

[0031] Figure 2 2 is a schematic structural diagram of a nondestructive measuring device for solid particle size and gradation according to a preferred embodiment of the present invention;

[0032] Figure 3 is a simplified structural diagram of a light source system according to a preferred embodiment of the present invention;

[0033] Figure 4 is a schematic structural diagram of a vibration dispersion device according to a preferred embodiment of the present invention;

[0034] Figure 5 It is a structural schematic diagram of a material receiving device according to a preferred embodiment of the present invention;

[0035] Figure 6 It is a schematic diagram of the partial structure of the disassembled material receiving device of the preferred embodiment of the present invention;

[0036] Figure 7 is a front view of a light source system according to a preferred embodiment of the present invention;

[0037] Figure 8 is a side view of a light source system according to a preferred embodiment of the present invention;

[0038] Fig. 9 is an image analysis diagram acquired by an image acquisition device in a specific embodiment;

[0039] Fig.10 is a calibration plate particle image in a specific embodiment;

[0040] Fig.11 It is the main interface of the processing system in a specific embodiment;

[0041] Fig.12 It is an analysis interface of a processing system in a specific embodiment.

[0042] Legend:

[0043] 1. Vibration dispersion device; 101. Feed hopper; 102. Feed trough; 103. Vibration motor; 104.; 2. Solid particle sample; 3. Material receiving device; 301. Material receiving funnel; 302. Detection unit; 4. First detection area; 5. Second detection area; 6. Light source system; 7. Convex lens; 8. First dichroic prism; 9. Second dichroic prism; 10. First lens; 11. Second lens; 12. First camera; 13. Second camera; 14. Mounting bracket; 15. LED chipset; 16. Light-distributing cap; 17. Light-distributing film; 18. Slide; 19. First mounting seat; 20. Second mounting seat; 21. Lifting mechanism; 22. Fixed bracket. DETAILED DESCRIPTION

[0044] The embodiments of the present invention are described in detail below with reference to the accompanying drawings. However, the present invention can be implemented in many different ways as defined and covered below.

[0045] Figure 1 is a schematic structural diagram of a nondestructive measuring device for solid particle size and gradation according to a preferred embodiment of the present invention; Figure 2 2 is a schematic structural diagram of a nondestructive measuring device for solid particle size and gradation according to a preferred embodiment of the present invention; Figure 3 is a simplified structural diagram of a light source system according to a preferred embodiment of the present invention; Figure 4 is a schematic structural diagram of a vibration dispersion device according to a preferred embodiment of the present invention; Figure 5 It is a structural schematic diagram of a material receiving device according to a preferred embodiment of the present invention; Figure 6 It is a schematic diagram of the partial structure of the disassembled material receiving device of the preferred embodiment of the present invention; Figure 7 is a front view of a light source system according to a preferred embodiment of the present invention; Figure 8 is a side view of a light source system according to a preferred embodiment of the present invention; Fig. 9 is an image analysis diagram collected by an image collection device in a specific embodiment; Fig.10 is a calibration plate particle image in a specific embodiment; Fig.11 It is the main interface of the processing system in a specific embodiment; Fig.12 It is an analysis interface of a processing system in a specific embodiment.

[0046] like Figures 1 to 8 As shown, the non-destructive measuring device for solid particle size and gradation of this embodiment includes:

[0047] A vibration dispersion device 1, used for vibrating and dispersing a solid particle sample 2 and outputting it;

[0048] The receiving device 3 includes a guide part and a detection part 302 in sequence along the vertical direction. The receiving device 3 is used to receive the solid particle sample 2 output by the vibration dispersion device 1 and guide the fixed particle sample to freely fall through the detection part 302 within a preset range by the guide part;

[0049] The light source system 6 is used to output straight light to the first side of the detection part 302 of the butt-joining device 3 along a preset direction;

[0050] The image acquisition device is arranged outside the second side of the material receiving device 3 along a preset direction to acquire an image of the detection portion 302 .

[0051] It should be understood that the measuring device is connected to a computer or the like so as to analyze and process the image through the computer system, perform operations such as correction and modeling analysis to calculate the particle size and particle gradation;

[0052] It can be understood that the measuring device vibrates and disperses the solid particle sample 2 through the vibration dispersion device 1 and outputs it under vibration so that it falls into the receiving device 3. The solid particle sample 2 falls freely in the receiving device 3, and is guided by the guide part and limits the falling range of the solid sample particles, so that the dispersed solid sample particles are evenly distributed and effectively gathered to pass through the detection part 302, thereby ensuring the number of sample detection; the light source system 6 outputs straight light along a preset direction to the first side of the detection part 302 of the receiving device 3, so that the projection size and the actual size of the particles are consistent and the detection part 302 area is evenly illuminated, so that the image acquisition device obtains a clearer image and improves the detection accuracy; the light source system 6 controls the illumination time through stroboscopic control, reduces the displacement of solid particles during the exposure time, obtains a more precise image, and makes the measurement result more accurate; image The acquisition system acquires images on the second side of the detection unit 302. After acquiring the images at an extremely short exposure time, the computer system processes and analyzes the images and calculates the particle size and particle grading. By using the present measuring device to measure the particle size and particle grading, the particles only fall freely after being vibrated and dispersed. During the measurement process, there is no contact with the solid particle sample 2, so that the sample is intact after measurement, and the particles can still be recycled. At the same time, the present measuring device can not only obtain the particle size and particle size distribution through image acquisition, but also obtain a more realistic particle size based on the straight light output by the light source system. Compared with the existing measurement methods, it can complete the measurement of solid particles more efficiently, with high precision and low error, and can adapt to the measurement and processing of mixed particles. At the same time, it can also obtain particle shape information, and can further perform multi-faceted and multi-dimensional measurement and analysis.

[0053] In some embodiments, the vibration dispersion device 1 includes a feed hopper 101, a feed trough 102 and a vibration motor 103. The feed hopper 101 is arranged at the first end of the feed trough 102, and the second end of the feed trough 102 is located above the material receiving device 3. The vibration motor 103 is used to apply vibration to the feed trough 102 to disperse the solid particle sample 2 and move it from the first end of the feed trough 102 to the second end. The feed hopper 101 is a funnel-shaped structure, which is convenient for putting in the solid particle sample 2 and guiding the solid particle sample 2 to fall into the feed trough 102. The feed trough 102 has a certain length, and the vibration motor 103 applies vibration to it so that the solid particle sample 2 can be fully dispersed by vibration. In order to prevent the solid particle sample 2 from scattering, an output pipe 104 is vertically arranged at the bottom of the second end of the feeding trough 102 to be connected to the inside of the feeding trough 102. The solid particle sample 2 is dispersed and transported to the second end of the feeding trough 102 under vibration, and then falls from the output pipe 104; the structure is simple, compact, and low-cost to achieve the dispersion and transportation of the solid particle sample 2, so that it is more in line with the measurement requirements of image acquisition and improves the measurement accuracy; it should be noted that by adjusting the vibration frequency of the vibration motor 103, the flow rate (output speed) of the sample can be adjusted, and then it can be matched according to the measurement requirements.

[0054] In some embodiments, a connecting structure is provided on the guide portion of the material receiving device 3 for connecting the material receiving funnel 301. The height position of the material receiving funnel 301 after installation matches the height position of the outlet end of the output pipe 104. The guiding portion is located at the upper portion of the material receiving device 3 and has a vertically extending channel. The solid particle sample 2 falls from the output pipe 104 to the material receiving funnel 301 and passes through the channel. It continues to fall from the channel and passes through the detection portion 302. The detection portion 302 has a detection area. The width of the connection position between the detection area and the channel gradually increases from top to bottom, so that the particle size is evenly dispersed during the falling process and remains in the detection area to effectively gather in the focusing area of ​​the image acquisition device, thereby facilitating image acquisition, acquiring images with a sufficient number of effective particles, and fully improving the measurement accuracy.

[0055] In some embodiments, the light source system 6 includes a mounting bracket 14, an LED chipset arranged on the mounting bracket 14, a light-homogenizing structure arranged on the mounting bracket 14 and located outside the output end of the LED chipset, and a lens group arranged between the LED chipset and the detection unit 302; the lens group takes a convex lens 7 as an example; by setting the convex lens 7, the multi-angle divergent and scattered light output by the LED chipset is converted into straight light passing through the detection unit 302, so that the size of the projected solid particles is closer to the actual size; the light-homogenizing structure is further set so that the detection area can be evenly illuminated, the image obtained by the image acquisition device is clearer, and the measurement and detection accuracy is improved; wherein, the light-homogenizing structure includes a light-homogenizing cap 16 covering the output end of the LED chipset and a light-homogenizing film 17 arranged between the inner side of the light-homogenizing cap 16 and the output end of the LED chipset, and the two work together to ensure the uniformity of light output, improve image clarity, and improve measurement accuracy.

[0056] In some embodiments, the image acquisition device includes a spectroscopic module, a first camera 12 and a second camera 13. The spectroscopic module is used to guide the light passing through the detection unit 302 to the first camera 12 and the second camera 13 respectively. The first camera 12 is provided with a first lens 10 with a first preset magnification, and the second camera 13 is provided with a second lens 11 with a second preset magnification. A lens with a larger magnification corresponds to a smaller detection area, that is, the first camera 12 and the second camera 13 are respectively used to collect particles in different particle size ranges. The large magnification camera system detects small particles, and the small magnification camera system detects large particles, which effectively increases the detection range of solid particles and covers a larger particle size detection range. On the other hand, the detection unit 302 can be divided into two detection areas along a preset direction, corresponding to different focusing positions of the first camera 12 and the second camera 13, so as to realize the measurement of particles in different particle size ranges in different detection areas during measurement.

[0057] It should be understood that in other embodiments, the image acquisition device may also include a spectroscopic module, a first camera 12 and a second camera 13, and the spectroscopic module is used to guide the light passing through the detection unit 302 to the first camera 12 according to a first preset ratio and to guide the light to the second camera 13 according to a second preset ratio, thereby achieving the same effect as the above-mentioned scheme.

[0058] In some embodiments, the spectroscopic module includes a first spectroscopic prism 8 disposed between the detection unit 302 and the first camera 12 and a second spectroscopic prism 9 disposed outside the refractive end of the first spectroscopic prism 8, and the second camera 13 is disposed outside the refractive end of the second spectroscopic prism 9; the first spectroscopic prism 8 divides the light into two parts, part of which passes through it and enters the first camera 12, and part of which is reflected to the second spectroscopic prism 9, and is reflected again by the second spectroscopic prism 9 to enter the second camera 13. Under different magnification detection modes, particles of different particle size ranges in different detection areas can be measured, and the overall structure is compact and the layout is reasonable; wherein, the reflection ratio of the first spectroscopic prism 8 is set according to the camera system matching. Generally speaking, a camera with a larger magnification requires more light.

[0059] It should be noted that the first camera 12 and the second camera 13 are exposed at the same time, and the light source system 6 is triggered during exposure to light up the LED chipset. The shortest lighting time of the light source is 1us. The extremely short exposure time shortens the moving distance of the solid particles during the exposure time, so that the measurement result is more accurate. In order to make the field of view bright enough and meet the extremely short exposure time, the brightness of the LED light source must be high enough. Based on this, in order to reduce interference and improve the collimation of light, the LED light source uses monochromatic narrow wavelength radiation light.

[0060] In some embodiments, the image acquisition device includes a calibration plate for being set in the detection part 302, and the calibration plate is used for calibration of the image acquisition device; the calibration plate is inserted into the blanking position, and automatically calibrated through a computer calibration program, and measurement can be started after calibration. The calibration process enables the camera to obtain a more accurate size of the solid particle sample 2 during measurement.

[0061] The measuring device comprises a frame, a feed hopper 101 and a feeding trough 102 are arranged on the frame and close to the first end thereof, a light source system 6 is arranged in the frame and below the feeding trough 102, a material receiving device 3 is arranged in the frame and below the second end of the feeding trough 102, and an image acquisition system is arranged in the frame and close to the second end of the frame. The overall structure is simple and compact.

[0062] Optionally, the image acquisition device further comprises a slide 18 arranged on the frame, the first camera 12 is mounted on the slide 18 via a first mounting seat 19, and the second camera 13 is mounted on the slide 18 via a second mounting seat 20, and the first mounting seat 19 and the second mounting seat 20 respectively have lifting functions to achieve axial and height adjustment of the first camera 12 and the second camera 13 for calibration; preferably, the slide 18 is an electric slide 18, and the first mounting seat 19 and the second mounting seat 20 are electrically controlled lifting seats, so that automatic calibration can be achieved based on a preset computer program;

[0063] Optionally, a lifting mechanism 21 is provided on the mounting bracket 14 of the light source system 6, which is used to adjust and position the height of the lens group or adjust and position the height of the LED chips group. The LED chips group and the lens group are connected by a fixed bracket 22 so that the two are kept on the same axis. The height of the LED chips group and the height of the lens group can be synchronously adjusted by the lifting mechanism 21; further, the fixed bracket 22 includes a plurality of sliding rods connected to the lens group, and the LED chips group is installed on a fixed plate. The fixed plate is provided with holes for passing the sliding rods, so that the LED chips group can slide along the axis to adjust the distance between it and the lens group, and then can be adjusted according to actual conditions to convert the divergent light into straight light.

[0064] The measurement method of this embodiment is applied to the above-mentioned non-destructive measurement device for solid particle size and gradation, and the measurement method includes:

[0065] S1. Image acquisition device calibration;

[0066] Specifically, the camera of the image acquisition device needs to be calibrated before starting the measurement. By inserting the calibration plate into the blanking position, automatic calibration is performed based on a preset computer calibration program. After the calibration is completed, the measurement can be started. The calibration enables the camera to obtain a more accurate size of the solid particle sample 2 during the actual measurement process.

[0067] S2. Start measuring, and put the solid particle sample into the vibration dispersion device 1;

[0068] Specifically, a solid particle sample is put into the vibration dispersion device 1, and the vibration dispersion device 1 disperses the agglomerated particles. The sample flow rate (output speed) is controlled by adjusting the vibration frequency. The dispersed particles enter the material receiving device 3 and enter the detection part 302 through the guide part, so that the dispersed particles can be gathered in a certain camera focus area, so that the camera can collect a sufficient number of valid sample images;

[0069] S3. The image acquisition device acquires an image, and the light source system 6 is turned on;

[0070] Specifically, the first camera 12 and the second camera 13 start to expose at the same time, and trigger the light source system 6 after the exposure starts. The light source system 6 is instructed to turn on under the condition that the image acquisition device is exposed and turned on. The light source system 6 is turned on for 1us, so that the LED chipset is turned on for a preset time, and the shortest lighting time is 1us. The movement distance of the solid particles during the exposure time is shortened by the extremely short exposure time, so that the measurement result is more accurate. In order to make the field of view bright enough and meet the extremely short exposure time, the brightness of the LED light source must be high enough. Based on this, in order to reduce interference and improve the collimation of light, the LED light source uses monochromatic narrow wavelength radiation light. After the LED chipset is lit, the divergent light is converted into straight light by the convex lens 7, so that the projection size of the particles is close to the actual size. Part of the parallel light passes through the first beam splitter prism 8 and enters the first camera 12, and part of it is reflected by the first beam splitter prism 8 to the second beam splitter prism 9 and reflected again to make the light entering the first camera 12 and the light entering the second camera 13 parallel. The first camera 12 and the second camera 13 have different magnifications. Figure 1 , corresponding to the first detection area 4 and the second detection area 5 respectively, a larger magnification lens corresponds to a smaller detection area;

[0071] S4. The image acquisition system transmits the acquired image data to the processing system for analysis and processing;

[0072] S5. The processing system calculates particle size and particle grading through correction, modeling analysis;

[0073] Specifically, when calculating the particle size, the minimum value of the maximum chord length in each scanning direction, that is, the shortest chord length, is used as the particle size. This value is closer to the screening statistical value than the Feret diameter. When calculating the particle gradation, there are two correction processes. The first is to perform field correction, which is to correct the statistical data of the detection area of ​​the detection unit 302; the second is to perform distribution correction, which is based on the particle distribution curve and the screening statistical results. After the two corrections, the particle gradation curve is closer to the true value.

[0074] In a specific embodiment, reference Fig. 9 and Fig.12 ,in Fig.10 To calibrate the plate particle image, the particle size is the standard real size, the printing method is laser engraving, and the accuracy is ±1um. Based on the above device and method, the particle size detection finally obtained has high accuracy and efficiency, and non-destructive testing is realized, and the sample can still be used.

[0075] In the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "upper", "lower", "front", "rear", etc. are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on the present invention.

[0076] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0077] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A non-destructive measuring device for solid particle size and gradation, characterized in that: include: A vibration dispersion device (1) is used to disperse and output a solid particle sample (2) by vibration; A material receiving device (3) vertically comprises a guide portion and a detection portion (302) in sequence, the material receiving device (3) being used to receive the solid particle sample (2) output by the vibration dispersion device (1) and to guide the fixed particle sample to freely fall within a preset range through the detection portion (302) by the guide portion; A light source system (6) for outputting straight light along a preset direction to a first side of a detection portion (302) of the material receiving device (3); An image acquisition device is arranged outside the second side of the material receiving device (3) along a preset direction to acquire an image of the detection portion (302).

2. The non-destructive measuring device for solid particle size and gradation according to claim 1, characterized in that: The vibration dispersion device (1) comprises a feed hopper (101), a feeding trough (102) and a vibration motor (103); the feed hopper (101) is arranged at the first end of the feeding trough (102); the second end of the feeding trough (102) is located above the material receiving device (3); and the vibration motor (103) is used to apply vibration to the feeding trough (102) so that the solid particle sample (2) is dispersed and moves from the first end of the feeding trough (102) to the second end.

3. The non-destructive measuring device for solid particle size and gradation according to claim 1, characterized in that: The light source system (6) comprises a mounting bracket (14), an LED chip group arranged on the mounting bracket (14), a light-homogenizing structure arranged on the mounting bracket (14) and located outside the output end of the LED chip group, and a lens group arranged between the LED chip group and the detection unit (302).

4. The non-destructive measuring device for solid particle size and gradation according to claim 3, characterized in that: The light-evening structure comprises a light-evening cap (16) covering the output end of the LED chip group and a light-evening film (17) arranged between the inner side of the light-evening cap (16) and the output end of the LED chip group.

5. The non-destructive measuring device for solid particle size and gradation according to claim 1, characterized in that: The image acquisition device comprises a spectroscopic module, a first camera (12) and a second camera (13); the spectroscopic module is used to guide the light passing through the detection unit (302) to the first camera (12) according to a first preset ratio and to guide the light passing through the detection unit (302) to the second camera (13) according to a second preset ratio; or, the spectroscopic module is used to guide the light passing through the detection unit (302) to the first camera (12) and the second camera (13) respectively; the first camera (12) is provided with a first lens (10) having a first preset magnification, and the second camera (13) is provided with a second lens (11) having a second preset magnification.

6. The non-destructive measuring device for solid particle size and gradation according to claim 5, characterized in that: The light splitting module comprises a first light splitting prism (8) arranged between the detection unit (302) and the first camera (12), and a second light splitting prism (9) arranged outside the refractive end of the first light splitting prism (8); the second camera (13) is arranged outside the refractive end of the second light splitting prism (9).

7. The non-destructive measuring device for solid particle size and gradation according to claim 1, characterized in that: The image acquisition device comprises a calibration plate used to be arranged on the detection part (302), and the calibration plate is used for calibrating the image acquisition device.

8. A measurement method, characterized in that: The non-destructive measuring device for solid particle size and gradation according to any one of claims 1 to 7, wherein the measuring method comprises: S1. Image acquisition device calibration; S2. Start measuring, and put the solid particle sample into the vibration dispersion device (1); S3. The image acquisition device acquires an image and the light source system (6) is turned on; S4. The image acquisition system transmits the acquired image data to the processing system for analysis and processing; S5. The processing system calculates the particle size and particle grading through correction, modeling analysis.

9. The measuring method according to claim 8, characterized in that: Step S3 comprises: instructing the light source system (6) to turn on under the condition that the image acquisition device is exposed and turned on, and the light source system (6) is turned on for 1 us.

10. The measuring method according to claim 8, characterized in that: When calculating the particle gradation, step S5 includes: performing field correction, correcting the statistical data of the detection area of ​​the detection unit; performing distribution correction, correcting based on the particle distribution curve and the screening statistical results.

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