A method and system for detecting aging of LED modules

Abstract

The present invention relates to the technical field of LED module aging detection and testing, and specifically discloses an LED module aging detection and testing method and a detection system thereof, comprising analyzing the luminous flux of the LED module to obtain a luminous flux characterization value, making an abnormality judgment on the LED module based on the luminous flux characterization value, analyzing the number of abnormal signals based on abnormal signals, judging the batch qualification of the luminous flux of the LED module, and analyzing the production time of the LED module that generates the abnormal signal based on the unqualified luminous flux batch of the LED module, obtaining a periodic judgment result of the production time interval when the LED module generates the abnormal signal, and analyzing and obtaining an optimal time interval based on the periodic judgment result. The present invention obtains an optimal time interval by analyzing the production time interval corresponding to the generation of the abnormal signal of the LED module, which is beneficial for detection personnel to optimize the detection time interval of the LED module, thereby improving the detection accuracy of the LED module.

Description

Technical Field

[0001] The present invention relates to the technical field of LED module aging detection, and in particular to an LED module aging detection method and a detection system thereof. Background Art

[0002] As a core component of modern lighting and display technology, LED (light-emitting diode) has the advantages of high efficiency, long life, environmental protection and energy saving. LED module is a product composed of a certain number of light-emitting diodes arranged together in a regular pattern and then packaged and waterproofed. In today's increasingly competitive market, product quality and reliability are the key to winning the market. For LED modules, their quality and reliability are directly related to the performance of the entire lighting or display system and user satisfaction.

[0003] However, in order to ensure that LED modules can maintain stable performance and extend their service life in actual applications, it is generally necessary to conduct random inspections and aging tests on LED modules after production. This inspection method can easily lead to the omission of unqualified LED modules, affecting product quality.

[0004] To this end, we propose an LED module aging detection method and detection system. Summary of the Invention

[0005] The object of the present invention is to provide an LED module aging detection method and a detection system thereof to solve the technical problems in the above background.

[0006] The purpose of the present invention can be achieved through the following technical solutions:

[0007] In a first aspect, the present invention provides a method for testing LED module aging, comprising: step 1: analyzing the luminous flux of the LED module to obtain a luminous flux characterization value, and performing an abnormality judgment on the LED module based on the luminous flux characterization value, wherein the judgment result includes an abnormal signal and a normal signal;

[0008] Step 2: Based on the abnormal signal, analyze the number of times the abnormal signal is generated to obtain the abnormal number ratio, and judge the luminous flux batch qualification of the LED module based on the abnormal number ratio;

[0009] Step 3: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain a period performance value ZB. Based on the period performance value ZB, the production time interval when the LED module generates the abnormal signal is periodic. The judgment result includes periodic signals and non-periodic signals.

[0010] Step 4: Based on the periodicity judgment result of the production time interval when the LED module generates an abnormal signal, an optimal time interval is analyzed and obtained, and the LED module detection time interval is optimized based on the optimal time interval.

[0011] As a further solution of the present invention: the luminous flux characterization value is obtained as follows:

[0012] Construct a luminous flux variation curve and analyze the ratio of the number of abnormal sub-curves and the slope deviation degree;

[0013] The luminous flux characterization value is obtained by weighting the proportion of abnormal sub-curves and the slope deviation ratio.

[0014] As a further solution of the present invention, the ratio of the number of abnormal sub-curves is obtained as follows:

[0015] During the detection period, the luminous flux of the LED module is obtained. With time as the X-axis and luminous flux as the Y-axis, an XY two-dimensional coordinate system is constructed. The luminous flux corresponding to the time node is marked in the XY coordinate system to obtain a luminous flux change curve.

[0016] Divide the luminous flux variation curve into several sub-curves at equal time intervals, obtain the slope value of the sub-curve, perform subtraction between the slope of the sub-curve and the standard slope, and take the absolute value to obtain the slope deviation;

[0017] Compare the slope deviation to the slope deviation threshold:

[0018] If the slope deviation is greater than or equal to the slope deviation threshold, the corresponding sub-curve is marked as an abnormal sub-curve;

[0019] If the slope deviation is less than the slope deviation threshold, the corresponding sub-curve is marked as a normal sub-curve;

[0020] Count the number of abnormal sub-curve segments and compare it with the total number of sub-curves to obtain the proportion of abnormal sub-curves.

[0021] As a further solution of the present invention: the slope deviation ratio is obtained as follows:

[0022] Obtain the slope deviation of the abnormal sub-curve, perform subtraction processing on it and the slope deviation threshold to obtain the slope relative deviation of the abnormal sub-curve, sum and average all the slope relative deviations to obtain the mean of the slope relative deviations, and compare the mean of the slope relative deviations with the slope deviation threshold to obtain the slope deviation degree ratio.

[0023] As a further solution of the present invention: the method for obtaining the abnormality ratio is:

[0024] The number of times normal signals and abnormal signals are generated is counted and summed to obtain the total number of signals. The number of times abnormal signals are generated is compared with the total number of signals to obtain the proportion of abnormal times.

[0025] As a further solution of the present invention: the period performance value ZB is obtained as follows:

[0026] Obtain the production time of the LED module that generates the abnormal signal, and analyze to obtain the acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC;

[0027] The acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC are processed and the formula is used: The period performance value ZB is calculated, wherein a1 and a2 are both preset proportional coefficients, and both a1 and a2 are greater than 0.

[0028] As a further solution of the present invention: the method for obtaining the percentage of the number of acceptable time intervals KS is as follows:

[0029] Obtain the production time of the LED module that generates the abnormal signal, calculate the difference in the production time of adjacent LED modules that generate the abnormal signal, mark it as the time interval, sum and average all the time intervals to obtain the time interval mean, perform difference processing on all the time intervals and the time interval mean, and take the absolute value of the difference to obtain the time interval deviation value;

[0030] Compare the time interval deviation value to the time interval deviation threshold:

[0031] If the time interval deviation value is less than or equal to the time interval deviation threshold, it means that the time interval value is slightly different from the time interval mean, and the corresponding time interval is marked as an acceptable time interval;

[0032] If the time interval deviation value is greater than the time interval deviation threshold, it means that the time interval value is significantly different from the time interval mean, and the corresponding time interval is marked as an unacceptable time interval;

[0033] The number of acceptable time intervals and the number of unacceptable time intervals are counted and summed to obtain the total number of time intervals. The number of acceptable time intervals is processed with the total number of time intervals and the retrograde ratio to obtain the proportion of acceptable time intervals KS.

[0034] As a further solution of the present invention: the acceptable time interval relative deviation ratio KC is obtained as follows:

[0035] Obtain the time interval deviation value of the acceptable time interval, perform subtraction processing on it and the time interval deviation threshold to obtain the interval relative deviation value, sum and average all the interval relative deviation values ​​to obtain the interval relative deviation mean, perform ratio processing on the interval relative deviation mean and the time interval deviation threshold to obtain the acceptable time interval relative deviation degree ratio KC.

[0036] As a further solution of the present invention: the preferred method for obtaining the detection time interval is:

[0037] Based on the periodic signal, it is likely that the cause of the abnormal LED module aging test is periodic. The average time interval when the periodic signal is generated is obtained and used as the preferred detection time interval.

[0038] Based on the non-periodic signal, it means that the cause of the abnormal aging test of the LED module is less likely to be periodic. The time interval for generating the non-periodic signal is obtained, all time intervals are sorted from small to large, and the minimum time interval is used as the preferred interval.

[0039] In a second aspect, the present invention provides an LED module aging detection system, comprising:

[0040] Abnormality judgment module: Analyzes the luminous flux of the LED module to obtain the luminous flux characterization value, and judges the abnormality of the LED module based on the luminous flux characterization value. The judgment result includes abnormal signals and normal signals;

[0041] Qualification judgment module: Based on the abnormal signal, the number of abnormal signals generated is analyzed to obtain the abnormal number ratio. Based on the abnormal number ratio, the qualification of the LED module luminous flux batch is judged;

[0042] Periodicity determination module: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain the period performance value ZB. Based on the period performance value ZB, the production time interval when the LED module generates the abnormal signal is periodicly determined. The determination results include periodic signals and non-periodic signals.

[0043] Optimal detection time interval determination module: Based on the periodic judgment result of the production time interval when the LED module generates an abnormal signal, the optimal time interval is analyzed and optimized based on the optimal time interval.

[0044] Beneficial effects of the present invention:

[0045] (1) The present invention analyzes the luminous flux of the LED module to obtain a luminous flux characterization value, and performs abnormal judgment on the LED module based on the luminous flux characterization value. The judgment result includes an abnormal signal and a normal signal. Based on the abnormal signal, the number of times the abnormal signal is generated is analyzed to obtain the abnormal number ratio. Based on the abnormal number ratio, the luminous flux batch qualification of the LED module is judged. By analyzing the luminous flux of the LED module, the present invention helps to judge the luminous flux batch qualification of the LED module, thereby facilitating further control of the luminous flux qualification of the LED module;

[0046] (2) Based on the unqualified batch of luminous flux of LED modules, the present invention analyzes the production time of LED modules that generate abnormal signals, obtains the periodic judgment result of the production time interval when the LED modules generate abnormal signals, analyzes and obtains the optimal time interval based on the periodic judgment result of the production time interval when the LED modules generate abnormal signals, and optimizes the detection time interval of the LED modules based on the optimal time interval. The present invention obtains the optimal time interval by analyzing the production time interval corresponding to the generation of abnormal signals of LED modules, which is beneficial for detection personnel to optimize the detection time interval of LED modules, thereby improving the detection accuracy of LED modules. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] The present invention will be further described below with reference to the accompanying drawings.

[0048] Figure 1 This is a flowchart of a method for detecting aging of an LED module according to an embodiment of the present invention;

[0049] Figure 2 This is a system block diagram of an LED module aging detection system according to an embodiment of the present invention. DETAILED DESCRIPTION

[0050] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0051] Example 1:

[0052] See also Figure 1 As shown, an LED module aging detection method according to an embodiment of the present invention includes the following steps:

[0053] Step 1: Place the LED module in an aging test chamber and obtain monitoring parameters of the LED module in real time, where the monitoring parameters include luminous flux. Analyze the monitoring parameters of the LED module to obtain a luminous flux characterization value. Based on the luminous flux characterization value, perform an abnormality judgment on the LED module. The judgment result includes an abnormal signal and a normal signal.

[0054] During the detection period, the luminous flux of the LED module is obtained. With time as the X-axis and luminous flux as the Y-axis, an XY two-dimensional coordinate system is constructed. The luminous flux corresponding to the time node is marked in the XY coordinate system to obtain a luminous flux change curve.

[0055] Divide the luminous flux variation curve into several sub-curves at equal time intervals, obtain the slope value of the sub-curve, perform subtraction between the slope of the sub-curve and the standard slope, and take the absolute value to obtain the slope deviation;

[0056] It should be noted that the standard slope is set by those skilled in the art based on the actual requirements of the luminous flux of the previous LED module;

[0057] Compare the slope deviation to the slope deviation threshold:

[0058] If the slope deviation is greater than or equal to the slope deviation threshold, the corresponding sub-curve is marked as an abnormal sub-curve;

[0059] If the slope deviation is less than the slope deviation threshold, the corresponding sub-curve is marked as a normal sub-curve;

[0060] Count the number of abnormal sub-curve segments and compare it with the total number of sub-curves to obtain the proportion of abnormal sub-curves.

[0061] Obtain the slope deviation of the abnormal sub-curve, perform subtraction processing on it and the slope deviation threshold to obtain the slope relative deviation of the abnormal sub-curve, sum and average all the slope relative deviations to obtain the slope relative deviation mean, and compare the slope relative deviation mean with the slope deviation threshold to obtain the slope deviation degree ratio;

[0062] The ratio of the number of abnormal sub-curves and the slope deviation ratio are weighted to obtain the luminous flux representation value;

[0063] Compare the luminous flux characterization value to the luminous flux characterization threshold:

[0064] If the luminous flux characterization value is greater than or equal to the luminous flux characterization threshold, it means that the luminous flux of the current LED module is unqualified and an abnormal signal is generated;

[0065] If the luminous flux characterization value is less than the luminous flux characterization threshold, it means that the luminous flux of the current LED module is qualified and a normal signal is generated;

[0066] Step 2: Based on the abnormal signal, analyze the number of times the abnormal signal is generated to obtain the abnormal number ratio, and judge the luminous flux batch qualification of the LED module based on the abnormal number ratio;

[0067] Count the number of normal signals and the number of abnormal signals, and sum them to get the total number of signals. Ratio the number of abnormal signals to the total number of signals to get the abnormal number ratio.

[0068] Compare the anomaly percentage to the anomaly percentage threshold:

[0069] If the abnormality ratio is greater than or equal to the abnormality ratio threshold, it means that the luminous flux of the LED modules in this batch is unqualified;

[0070] If the abnormality ratio is less than the abnormality ratio threshold, it means that the luminous flux of the LED modules in this batch is qualified;

[0071] The technical solution of the embodiment of the present invention is mainly as follows: analyzing the luminous flux of the LED module to obtain a luminous flux characterization value, and making an abnormal judgment on the LED module based on the luminous flux characterization value. The judgment result includes an abnormal signal and a normal signal. Based on the abnormal signal, the number of times the abnormal signal is generated is analyzed to obtain the proportion of abnormal times. Based on the proportion of abnormal times, the batch qualification of the luminous flux of the LED module is judged. By analyzing the luminous flux of the LED module, the present invention helps to judge the batch qualification of the luminous flux of the LED module, thereby facilitating further control of the luminous flux qualification of the LED module.

[0072] Example 2:

[0073] Based on Example 1, please refer to Figure 1 As shown, the LED module aging detection method according to the embodiment of the present invention further includes the following steps:

[0074] Step 3: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain a period performance value ZB. Based on the period performance value ZB, the production time interval when the LED module generates the abnormal signal is periodic. The judgment result includes periodic signals and non-periodic signals.

[0075] Obtain the production time of the LED module that generates the abnormal signal, calculate the difference in the production time of adjacent LED modules that generate the abnormal signal, mark it as the time interval, sum and average all the time intervals to obtain the time interval mean, perform difference processing on all the time intervals and the time interval mean, and take the absolute value of the difference to obtain the time interval deviation value;

[0076] Compare the time interval deviation value to the time interval deviation threshold:

[0077] If the time interval deviation value is less than or equal to the time interval deviation threshold, it means that the time interval value is slightly different from the time interval mean, and the corresponding time interval is marked as an acceptable time interval;

[0078] If the time interval deviation value is greater than the time interval deviation threshold, it means that the time interval value is significantly different from the time interval mean, and the corresponding time interval is marked as an unacceptable time interval;

[0079] Count the number of acceptable time intervals and the number of unacceptable time intervals, and sum them up to get the total number of time intervals. Then, process the number of acceptable time intervals with the total number of time intervals and the retrograde ratio to get the percentage of acceptable time intervals KS.

[0080] Obtain the time interval deviation value of the acceptable time interval, perform subtraction processing on it and the time interval deviation threshold to obtain the interval relative deviation value, sum and average all the interval relative deviation values ​​to obtain the interval relative deviation mean, perform ratio processing on the interval relative deviation mean and the time interval deviation threshold to obtain the acceptable time interval relative deviation degree ratio KC;

[0081] The acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC are processed and the formula is used: The period performance value ZB is calculated, where a1 and a2 are both preset proportional coefficients, and both a1 and a2 are greater than 0;

[0082] It should be noted that the cycle performance value ZB is obtained by processing the acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC. The cycle performance value ZB reflects whether the production time interval when the LED module generates abnormal signals is periodic. The acceptable time interval ratio KS reflects the number of acceptable time intervals with a small difference between the time interval value and the time interval mean. The greater the number of acceptable time intervals, the greater the possibility of periodicity. The acceptable time interval relative deviation ratio KC reflects the difference between the time interval value and the time interval mean. The smaller the difference, the greater the possibility of periodicity.

[0083] Compare the period performance value ZB with the period performance threshold:

[0084] If the period performance value ZB is greater than or equal to the period performance threshold, a periodic signal is generated;

[0085] If the periodic performance value ZB is less than the periodic performance threshold, a non-periodic signal is generated;

[0086] Step 4: Based on the periodicity judgment result of the production time interval when the LED module generates an abnormal signal, an optimal time interval is analyzed and obtained, and the LED module detection time interval is optimized based on the optimal time interval;

[0087] Based on the periodic signal, it is likely that the cause of the abnormal LED module aging test is periodic. The average time interval when the periodic signal is generated is obtained and used as the preferred detection time interval.

[0088] Based on the non-periodic signal, it is less likely that the cause of the abnormal LED module aging test is periodic. The time interval for generating the non-periodic signal is obtained, and all time intervals are sorted from small to large, and the minimum time interval is selected as the preferred time interval.

[0089] The technical solution of the embodiment of the present invention is mainly as follows: based on the unqualified batch of luminous flux of the LED module, the production time of the LED module that generates the abnormal signal is analyzed to obtain the periodic performance value ZB; based on the periodic performance value ZB, the production time interval when the LED module generates the abnormal signal is periodically judged, and the judgment result includes a periodic signal and a non-periodic signal; based on the periodic judgment result of the production time interval when the LED module generates the abnormal signal, the optimal time interval is analyzed to obtain the optimal time interval; based on the optimal time interval, the detection time interval of the LED module is optimized; the present invention obtains the optimal time interval by analyzing the production time interval corresponding to the generation of the abnormal signal of the LED module, which is beneficial for the detection personnel to optimize the detection time interval of the LED module, thereby improving the detection accuracy of the LED module.

[0090] Example 3:

[0091] Based on Example 1 and Example 2, please refer to Figure 1 、 Figure 2 As shown, an LED module aging detection system according to an embodiment of the present invention includes:

[0092] Abnormality judgment module: Analyzes the luminous flux of the LED module to obtain the luminous flux characterization value, and judges the abnormality of the LED module based on the luminous flux characterization value. The judgment result includes abnormal signals and normal signals;

[0093] Qualification judgment module: Based on the abnormal signal, the number of abnormal signals generated is analyzed to obtain the abnormal number ratio. Based on the abnormal number ratio, the qualification of the LED module luminous flux batch is judged;

[0094] Periodicity determination module: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain the period performance value ZB. Based on the period performance value ZB, the production time interval when the LED module generates the abnormal signal is periodicly determined. The determination results include periodic signals and non-periodic signals.

[0095] Optimal detection time interval determination module: Based on the periodic judgment result of the production time interval when the LED module generates an abnormal signal, the optimal time interval is analyzed and optimized based on the optimal time interval.

[0096] The basic principles, main features, and advantages of the present invention are shown and described above. Those skilled in the art should understand that the present invention is not limited to the foregoing embodiments. The foregoing embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and modifications may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and modifications are intended to fall within the scope of the present invention. The scope of protection claimed in the present invention is defined by the appended claims and their equivalents.

Claims

1. A method for detecting aging of LED modules, characterized in that: include: Step 1: Analyze the luminous flux of the LED module to obtain a luminous flux characterization value. Based on the luminous flux characterization value, perform an abnormality judgment on the LED module. The judgment result includes an abnormal signal and a normal signal. Step 2: Based on the abnormal signal, analyze the number of times the abnormal signal is generated to obtain the abnormal number ratio, and judge the luminous flux batch qualification of the LED module based on the abnormal number ratio; Step 3: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain a period performance value ZB. Based on the period performance value ZB, the production time interval when the LED module generates the abnormal signal is periodic. The judgment result includes periodic signals and non-periodic signals. The period performance value ZB is obtained as follows: Obtain the production time of the LED module that generates the abnormal signal, and analyze to obtain the acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC; The acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC are processed and the formula is used: The period performance value ZB is calculated, where a1 and a2 are both preset proportional coefficients, and both a1 and a2 are greater than 0; The method for obtaining the percentage of the number of acceptable time intervals KS is as follows: Obtain the production time of the LED module that generates the abnormal signal, calculate the difference in the production time of adjacent LED modules that generate the abnormal signal, mark it as the time interval, sum and average all the time intervals to obtain the time interval mean, perform difference processing on all the time intervals and the time interval mean, and take the absolute value of the difference to obtain the time interval deviation value; Compare the time interval deviation value to the time interval deviation threshold: If the time interval deviation value is less than or equal to the time interval deviation threshold, the corresponding time interval is marked as an acceptable time interval; If the time interval deviation value is greater than the time interval deviation threshold, the corresponding time interval is marked as an unacceptable time interval; Count the number of acceptable time intervals and the number of unacceptable time intervals, and sum them to obtain the total number of time intervals. Ratio the number of acceptable time intervals to the total number of time intervals to obtain the percentage of acceptable time intervals KS. The acceptable time interval relative deviation ratio KC is obtained as follows: Obtain the time interval deviation value of the acceptable time interval, perform subtraction processing on it and the time interval deviation threshold to obtain the interval relative deviation value, sum and average all the interval relative deviation values ​​to obtain the interval relative deviation mean, perform ratio processing on the interval relative deviation mean and the time interval deviation threshold to obtain the acceptable time interval relative deviation degree ratio KC; Step 4: Based on the periodicity judgment result of the production time interval when the LED module generates an abnormal signal, an optimal time interval is analyzed and obtained, and the LED module detection time interval is optimized based on the optimal time interval.

2. The LED module aging detection method according to claim 1, characterized in that: The luminous flux characterization value is obtained as follows: Construct a luminous flux variation curve and analyze the ratio of the number of abnormal sub-curves and the slope deviation degree; The luminous flux characterization value is obtained by weighting the proportion of abnormal sub-curves and the slope deviation ratio.

3. The LED module aging detection method according to claim 2, characterized in that: The method for obtaining the ratio of the number of abnormal sub-curves is as follows: During the detection period, the luminous flux of the LED module is obtained. With time as the X-axis and luminous flux as the Y-axis, an XY two-dimensional coordinate system is constructed. The luminous flux corresponding to the time node is marked in the XY coordinate system to obtain a luminous flux change curve. Divide the luminous flux variation curve into several sub-curves at equal time intervals, obtain the slope value of the sub-curve, perform subtraction between the slope of the sub-curve and the standard slope, and take the absolute value to obtain the slope deviation; Compare the slope deviation to the slope deviation threshold: If the slope deviation is greater than or equal to the slope deviation threshold, the corresponding sub-curve is marked as an abnormal sub-curve; If the slope deviation is less than the slope deviation threshold, the corresponding sub-curve is marked as a normal sub-curve; Count the number of abnormal sub-curve segments and compare it with the total number of sub-curves to obtain the proportion of abnormal sub-curves.

4. The LED module aging detection method according to claim 3, characterized in that: The slope deviation ratio is obtained as follows: Obtain the slope deviation of the abnormal sub-curve, perform subtraction processing on it and the slope deviation threshold to obtain the slope relative deviation of the abnormal sub-curve, sum and average all the slope relative deviations to obtain the mean of the slope relative deviations, and compare the mean of the slope relative deviations with the slope deviation threshold to obtain the slope deviation degree ratio.

5. The LED module aging detection method according to claim 1, characterized in that: The method for obtaining the abnormality ratio is as follows: The number of times normal signals and abnormal signals are generated is counted and summed to obtain the total number of signals. The number of times abnormal signals are generated is compared with the total number of signals to obtain the proportion of abnormal times.

6. The LED module aging detection method according to claim 1, characterized in that: The preferred time interval is obtained as follows: Based on the periodic signal, it is likely that the cause of the abnormality in the LED module aging test is periodic. The average time interval when the periodic signal is generated is obtained and the average time interval is used as the preferred time interval. Based on the non-periodic signal, it indicates that the cause of the abnormal aging test of the LED module is less likely to be periodic. The time interval for generating the non-periodic signal is obtained, all time intervals are sorted from small to large, and the minimum time interval is taken as the preferred time interval.

7. An LED module aging detection system, characterized in that: The system is used to execute the method according to any one of claims 1 to 6, and the system comprises: Abnormality judgment module: Analyzes the luminous flux of the LED module to obtain the luminous flux characterization value, and judges the abnormality of the LED module based on the luminous flux characterization value. The judgment result includes abnormal signals and normal signals; Qualification judgment module: Based on the abnormal signal, the number of abnormal signals generated is analyzed to obtain the abnormal number ratio. Based on the abnormal number ratio, the qualification of the LED module luminous flux batch is judged; Periodicity determination module: Based on the LED module luminous flux batch failure, the production time of the LED module that generates the abnormal signal is analyzed to obtain the period performance value ZB. Based on the period performance value ZB, the production time interval when the LED module generates the abnormal signal is periodicly determined. The determination results include periodic signals and non-periodic signals. The period performance value ZB is obtained as follows: Obtain the production time of the LED module that generates the abnormal signal, and analyze to obtain the acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC; The acceptable time interval ratio KS and the acceptable time interval relative deviation ratio KC are processed and the formula is used: The period performance value ZB is calculated, where a1 and a2 are both preset proportional coefficients, and both a1 and a2 are greater than 0; The method for obtaining the percentage of the number of acceptable time intervals KS is as follows: Obtain the production time of the LED module that generates the abnormal signal, calculate the difference in the production time of adjacent LED modules that generate the abnormal signal, mark it as the time interval, sum and average all the time intervals to obtain the time interval mean, perform difference processing on all the time intervals and the time interval mean, and take the absolute value of the difference to obtain the time interval deviation value; Compare the time interval deviation value to the time interval deviation threshold: If the time interval deviation value is less than or equal to the time interval deviation threshold, the corresponding time interval is marked as an acceptable time interval; If the time interval deviation value is greater than the time interval deviation threshold, the corresponding time interval is marked as an unacceptable time interval; Count the number of acceptable time intervals and the number of unacceptable time intervals, and sum them to obtain the total number of time intervals. Ratio the number of acceptable time intervals to the total number of time intervals to obtain the percentage of acceptable time intervals KS. The acceptable time interval relative deviation ratio KC is obtained as follows: Obtain the time interval deviation value of the acceptable time interval, perform subtraction processing on it and the time interval deviation threshold to obtain the interval relative deviation value, sum and average all the interval relative deviation values ​​to obtain the interval relative deviation mean, perform ratio processing on the interval relative deviation mean and the time interval deviation threshold to obtain the acceptable time interval relative deviation degree ratio KC; Optimal time interval determination module: Based on the periodic judgment result of the production time interval when the LED module generates an abnormal signal, the optimal time interval is analyzed and the LED module detection time interval is optimized based on the optimal time interval.

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