Full-automatic test system of coin identification equipment

Abstract

The invention relates to the technical field of automatic test of equipment, in particular to a full-automatic test system of coin identification equipment, which comprises the steps of calculating a fault influence value of each real-time analysis item through effective operation time and fault maintenance time, comparing the fault influence values, determining an item data set of the real-time analysis items according to a comparison result, and determining a full-automatic test result of the coin identification equipment according to the item data set. Processing the test data to obtain a single-phase evaluation score of the real-time analysis project, determining the test state of the real-time analysis project based on the single-phase evaluation score, obtaining a project data set, arranging the test state according to the position in the project data set to obtain a state array, and processing the state data to obtain a state data set; obtaining a comprehensive risk score of the target equipment, and then determining a test signal based on the comprehensive risk score; according to the method, the weight position of the real-time test item can be dynamically adjusted according to the equipment maintenance information, so that the test result is deeply analyzed, and comprehensive support is provided for risk prediction of the test result.

Description

Technical Field

[0001] The invention relates to the technical field of automatic testing equipment, and in particular to a full-automatic testing system for coin identification equipment. Background Art

[0002] A coin sorting machine is a sorting machine that integrates counterfeit detection, sorting and counting. During the sorting process, it can calculate the total amount, total quantity, number of foreign currencies, and the quantity and amount of each type of coin.

[0003] However, when performing automatic testing, coin identification equipment can only complete fixed test tasks and cannot conduct in-depth analysis and evaluation of the test results, nor can it provide comprehensive support for the comprehensive performance evaluation and risk prediction of the equipment. Summary of the invention

[0004] The purpose of the present invention is to solve the problems in the background technology and to propose a fully automatic testing system for coin identification equipment.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions:

[0006] A fully automatic testing system for coin identification equipment, comprising:

[0007] The external connection terminal is physically connected to the target device by setting the E1 interface;

[0008] The device test end is used to determine the device model and test items to be tested according to the automatic test program, and then automatically test the target device based on the automatic test program and obtain the test results;

[0009] The test item analysis terminal is used to extract the corresponding real-time analysis items from the historical test information according to the device model and test items;

[0010] Obtain the fault occurrence time of the real-time analysis project and determine the effective operation time. Based on the effective operation time and the fault maintenance time, calculate the fault impact value of each real-time analysis project, then compare the fault impact values, and determine the project data group of the real-time analysis project according to the comparison result;

[0011] The test evaluation end is used to process the test data, obtain the single-phase evaluation score of the real-time analysis project, determine the test status of the real-time analysis project based on the single-phase evaluation score, obtain the project data group, arrange the test status according to the position in the project data group, obtain the status array, process the status data, obtain the comprehensive risk score of the target device, and then determine the test signal based on the comprehensive risk score;

[0012] The result response end is used to convert the test signal into an audio-visual reminder signal and give a reminder.

[0013] As a further solution of the present invention, after the target device is physically connected, the test firmware identified as ALMEX GmbH#64322PRX_PCBFAT_DiBox is loaded into the device, and the test firmware communicates with the host PC or the test system through simple ASCII commands. The host PC or the test system sends a test instruction, and the test firmware performs corresponding processing after receiving the instruction, and returns the test result to the host PC or the test system in the form of ASCII characters.

[0014] As a further solution of the present invention, before the device testing end automatically tests the coin identification device, it first identifies the test program to determine the device model and test items to be tested, and then automatically searches the serial port and configures relevant parameters through connection instructions. When the parameters are set, the test instructions are automatically sent according to the test program and automatic testing is performed, and test data is obtained at the same time.

[0015] As a further solution of the present invention, a method for determining the effective running time includes:

[0016] S1: Mark the coin identification device to be tested as a target device, obtain the device model of the target device, and based on the device model, obtain historical test information and device maintenance information corresponding to the device model, wherein the historical test information includes test items;

[0017] S2: first extract the test items in the historical test information, and at the same time obtain the test items of the current target device, compare the test items in the historical test information with the test items of the current target device, select the same item type as the test items of the current target device from the test items in the historical test information, and mark the selected test items as real-time analysis items;

[0018] S3: randomly select a real-time analysis item and mark it as a designated test item, and extract the maintenance record associated with the designated test item from the equipment maintenance information, wherein the maintenance record includes the fault occurrence time and the fault maintenance time;

[0019] Arrange the fault occurrence time in chronological order to obtain a fault sequence table, and then mark the faults in the fault sequence table in order according to their positions to obtain the fault i, where i∈[1,n], indicating that there are n faults in the fault sequence table;

[0020] Starting from the first fault in the fault sequence table, the fault occurrence time of fault i is obtained in turn, and the fault occurrence time of fault (i-1) is subtracted from the fault occurrence time of fault i, and the difference result is marked as the effective operating time Ti of fault i, where when i takes the value of 1, i-1=0, and fault 0 refers to the first operating time of the equipment.

[0021] As a further solution of the present invention, a method for calculating the fault impact value includes:

[0022] The effective running time of n faults is averaged to obtain the mean fault time Tp, and then the fault maintenance time of all faults is obtained and the mean fault maintenance time of n faults is averaged, and the result is marked as the mean maintenance time Wp;

[0023] Using the formula Get the fault impact value GY, a1 is the base threshold, and a1>1,

[0024] The greater the fault impact value of a specified test item, the greater the impact of the fault corresponding to the specified test item on the operation of the coin identification equipment. Conversely, the smaller the fault impact value, the smaller the impact of the fault corresponding to the specified test item on the operation of the coin identification equipment.

[0025] As a further solution of the present invention, a method for determining a project data group includes:

[0026] Obtaining the fault impact values ​​GY of all real-time analysis items, and comparing the fault impact values ​​GY with each other, and arranging the fault impact values ​​GY in descending order according to the comparison result, to obtain an impact sequence list of the real-time analysis items;

[0027] According to the position of the fault impact value in the impact sequence table, first identify the real-time analysis project corresponding to the fault impact value at each position, then mark the position of the fault impact value as the weight position of the real-time analysis project, and then arrange the real-time analysis projects in sequence according to the corresponding weight positions, and mark the position sequence table obtained after the arrangement is completed as a project data group.

[0028] As a further solution of the present invention, a method for obtaining a state array includes:

[0029] SS1: Get the test data of the target device real-time analysis project and use the formula The single-phase evaluation score DF of the real-time analysis project is obtained, where |*| represents an absolute value, j represents different real-time analysis projects, βj represents the proportional coefficient corresponding to the real-time analysis project j, CSj represents the test data of the real-time analysis project j, and Cbj represents the standard data of the real-time analysis project j;

[0030] SS2: Compare the single-phase evaluation score DF of each real-time analysis item with the score cutoff value Fy in turn. If DF≥Fy, the test status of the corresponding real-time analysis item is marked as 0. Otherwise, if DF<Fy, the test status of the corresponding real-time analysis item is marked as 1.

[0031] SS3: Get the project data group, and arrange the test status of the real-time analysis project according to the corresponding weight position according to the weight position of the real-time analysis project in the project data group to obtain a status array.

[0032] As a further solution of the present invention, the test signal includes a test pass signal and a test warning signal, and the method for determining the test signal includes:

[0033] The state array is regarded as a binary value, and then the binary value is converted to decimal, and the result of the conversion is marked as RS;

[0034] Using the formula ZH=RS+b1 m Get the comprehensive risk score ZH, where m represents the total number of test states 1 in the state array, and b1 is the base constant;

[0035] The comprehensive risk score ZH of the target device is compared with the score threshold X1. If ZH≥X1, a test warning signal is generated. Otherwise, if ZH<X1, a test pass signal is generated.

[0036] As a further solution of the present invention, the test signal also includes an abnormal alarm signal, and the method for generating the abnormal alarm signal includes:

[0037] When the test evaluation end obtains real-time test data, it first compares the real-time test data with the corresponding normal operating range. If the real-time test data is in the corresponding normal operating range, the operating status of the corresponding real-time analysis project is marked as normal. Otherwise, if the test data is not in the normal operating range, the operating status of the corresponding real-time analysis project is marked as abnormal. If an abnormal state is detected in the operating status of the real-time analysis project of the target device, an abnormal alarm signal is directly generated and transmitted to the result response end. Otherwise, when the operating status of the real-time analysis project is normal, the comprehensive risk score of the target device is calculated again.

[0038] Compared with the prior art, the advantages of the present invention are:

[0039] The present invention uses a device with an E1 interface to transmit programming data, performs initial program loading and configuration on the device, and can stably and efficiently transmit programming data to the device to achieve program loading and configuration on the device. At the same time, the communication method in the present invention does not use a wide character set, and only uses ASCII characters to transmit and interact with information. This communication protocol has a simple feature, is easy to operate in the implementation and analysis links, has significant advantages, can effectively reduce communication costs and complexity, and improve communication efficiency and stability;

[0040] The present invention determines the weight position of the real-time analysis project by analyzing the equipment maintenance information, sets the project data group based on the weight position, and then analyzes and processes the test data to obtain the test status of each real-time analysis project, arranges the test status according to the position in the project data group to obtain a state array, and then processes the state data to obtain a comprehensive risk score of the target equipment, and then determines the test signal based on the comprehensive risk score. The present invention can dynamically adjust the weight position of the real-time test project according to the equipment maintenance information, and then conduct an in-depth analysis of the test results, providing comprehensive support for the risk prediction of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] Figure 1 It is a schematic diagram of the system structure of the present invention. DETAILED DESCRIPTION

[0042] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0043] Reference Figure 1 ,A coin identification equipment fully automatic test system, including, an external connection terminal, an equipment test terminal, a test item analysis terminal, a test evaluation terminal and a result response terminal;

[0044] The external connection terminal is used to transmit the automatic test program of the coin identification device to the device test terminal;

[0045] It should be further explained that the device is physically connected to the external connection terminal, wherein the external connection terminal is set as an E1 interface or a device with similar functions and characteristics in this embodiment, and the programming data is transmitted through the interface to perform initial program loading and configuration on the device, which can stably and efficiently transmit the programming data to the device to realize program loading and configuration on the device;

[0046] After connecting the device to the system, load the test firmware identified as ALMEX GmbH#64322PRX_PCBFAT_DiBox into the device. The test firmware communicates with the host PC or test system through simple ASCII commands. The host PC or test system sends a test instruction, and the test firmware performs corresponding processing after receiving the instruction, and returns the test result to the host PC or test system in the form of ASCII characters. The test firmware uses simple ASCII commands to communicate with the host PC or test system. This communication method does not use a wide character set, and only uses ASCII characters to transmit and interact with information. This communication protocol has a simple feature, is easy to operate in the implementation and analysis links, has significant advantages, can effectively reduce communication costs and complexity, and improve communication efficiency and stability;

[0047] After the above FAT is completed, the RX CCTalkBootloader of ALMEX GmbH #64355 must be programmed using the E1 interface;

[0048] The device test terminal is used to automatically test the coin identification device according to the automatic test program. During the test, when the physical connection is completed, the serial port is automatically searched and related parameters are configured through the connection instruction. When the parameter setting is completed, the test instruction is automatically sent according to the test program.

[0049] When the automatic test is completed, the device test end then transmits the test data to the test evaluation end;

[0050] It should be further explained that before the device testing end automatically tests the coin identification device, it is necessary to identify the test program, determine the device model and test items to be tested, and then the device testing end transmits the device model and test items to the test item analysis end;

[0051] The test item analysis terminal is used to receive the device model and test items to be tested, and to set the weight position for the test items based on the basic device information and real-time test information. At the same time, all the test items are integrated according to the weight position to obtain the project data group of the test items. The specific setting method of the weight position of the test items includes:

[0052] S1: Mark the coin identification device to be tested as a target device, obtain the device model of the target device, and based on the device model, obtain historical test information and device maintenance information corresponding to the device model, wherein the historical test information includes test items;

[0053] S2: first extract the test items in the historical test information, and at the same time obtain the test items of the current target device, compare the test items in the historical test information with the test items of the current target device, select the same item type as the test items of the current target device from the test items in the historical test information, and mark the selected test items as real-time analysis items;

[0054] S3: randomly select a real-time analysis item and mark it as a designated test item, then extract the maintenance record associated with the designated test item from the equipment maintenance information, wherein the maintenance record includes the fault occurrence time and the fault maintenance time;

[0055] Arrange the fault occurrence time in chronological order to obtain a fault sequence table, and then mark the faults in the fault sequence table in order according to their positions to obtain the fault i, where i∈[1,n], indicating that there are n faults in the fault sequence table;

[0056] Starting from the first fault in the fault sequence table, the fault occurrence time of fault i is obtained in sequence, and the fault occurrence time of fault (i-1) is subtracted from the fault occurrence time of fault i, and the difference result is marked as the effective operation time Ti of fault i. It should be further explained that when i takes the value of 1, i-1=0, and fault 0 refers to the first operation time of the equipment;

[0057] S4: average the effective running time of n faults to obtain the mean fault time Tp, then obtain the fault maintenance time of all faults, average the fault maintenance time of n faults, and mark the result as the mean maintenance time Wp;

[0058] Using the formula The fault impact value GY is obtained, a1 is the base threshold, and a1>1. It should be further explained that when the fault impact value of the specified test item is larger, it means that the fault corresponding to the specified test item has a greater impact on the operation of the coin identification device. Conversely, when the fault impact value is smaller, it means that the fault corresponding to the specified test item has a smaller impact on the operation of the coin identification device.

[0059] S5: taking the remaining real-time analysis items as designated analysis items in turn, and processing them according to the methods in steps S3 to S4 above, to obtain the fault impact value GY of each real-time analysis item;

[0060] Then, the fault impact values ​​GY of all real-time analysis items are obtained, and the fault impact values ​​GY are compared with each other. According to the comparison result, the fault impact values ​​GY are arranged in descending order to obtain an impact sequence list of the real-time analysis items;

[0061] According to the position of the fault impact value in the impact sequence table, first identify the real-time analysis project corresponding to the fault impact value at each position, then mark the position where the fault impact value is located as the weight position of the real-time analysis project, and then arrange the real-time analysis projects in sequence according to the corresponding weight positions, and mark the position sequence table obtained after the arrangement as a project data group;

[0062] Then the test project analysis end transmits the project data group of the real-time analysis project to the test evaluation end;

[0063] The test evaluation end is used to receive the project data group of the real-time analysis project and the real-time test data of the target device, and determine the comprehensive risk score of the target device based on the project data group and the test data. The specific method for determining the comprehensive risk score of the target device includes:

[0064] SS1: Get the test data of the target device real-time analysis project and use the formula The single-phase evaluation score DF of the real-time analysis project is obtained, wherein |*| represents an absolute value, j represents a different real-time analysis project, βj represents a proportional coefficient corresponding to the real-time analysis project j, CSj represents the test data of the real-time analysis project j, and Cbj represents the standard data of the real-time analysis project j. Furthermore, the specific value of the proportional coefficient βj of each real-time analysis project j is obtained by a person skilled in the art after big data calculation, and the standard data of the real-time analysis project j is set by a person skilled in the art according to the factory parameters of the target device;

[0065] SS2: Compare the single-phase evaluation score DF of each real-time analysis item with the score cutoff value Fy in turn. If DF≥Fy, the test status of the corresponding real-time analysis item is marked as 0. Otherwise, if DF<Fy, the test status of the corresponding real-time analysis item is marked as 1. The specific value of the score cutoff value Fy is obtained by technicians in this field after big data calculation.

[0066] SS3: Obtain the project data group, and arrange the test status of the real-time analysis project according to the corresponding weight position according to the weight position of the real-time analysis project in the project data group to obtain a status array;

[0067] Treat the state array as a binary value, then convert the binary value into decimal, and mark the result of the conversion as RS. For example, there is a state array of 011001. After converting the state array into decimal, RS = 49;

[0068] Then use the formula ZH=RS+b1 m A comprehensive risk score ZH is obtained, wherein m represents the total number of test states 1 in the state array, b1 is a base constant, and the specific value of b1 is obtained by a person skilled in the art after big data calculation;

[0069] SS4: Compare the comprehensive risk score ZH of the target device with the score threshold X1. If ZH≥X1, a test warning signal is generated, indicating that the risk probability of the target device in this test result is higher. Conversely, if ZH<X1, a test pass signal is generated, indicating that the risk probability of the target device in this test result is lower. The specific value of the score threshold X1 is obtained by technicians in this field after big data calculation.

[0070] Afterwards, the test evaluation end transmits the generated test warning signal and test pass signal to the result response end;

[0071] It should be further explained that when real-time test data is obtained, the real-time test data is first compared with the corresponding normal operating range. If the real-time test data is in the corresponding normal operating range, the operating state of the corresponding real-time analysis project is marked as a normal state. On the contrary, if the test data is not in the normal operating range, the operating state of the corresponding real-time analysis project is marked as an abnormal state. If an abnormal state is detected in the operating state of the real-time analysis project of the target device, an abnormal alarm signal is directly generated and transmitted to the result response end. On the contrary, when the operating states of the real-time analysis projects are all in a normal state, the comprehensive risk score of the target device is continued to be calculated at this time.

[0072] The result response end is used to receive the test signal from the equipment test end, where the test signal includes a test pass signal, a test warning signal and an abnormal alarm signal. When the test signal is received, the test signal is converted into an audio-visual reminder signal and the relevant management personnel are reminded.

[0073] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A fully automatic testing system for coin identification equipment, characterized in that: include: The external connection terminal is physically connected to the target device by setting the E1 interface; The device test end is used to determine the device model and test items to be tested according to the automatic test program, and then automatically test the target device based on the automatic test program and obtain the test results; The test item analysis terminal is used to extract the corresponding real-time analysis items from the historical test information according to the device model and test items; Obtain the fault occurrence time of the real-time analysis project and determine the effective operation time. Based on the effective operation time and the fault maintenance time, calculate the fault impact value of each real-time analysis project, then compare the fault impact values, and determine the project data group of the real-time analysis project according to the comparison result; The test evaluation end is used to process the test data, obtain the single-phase evaluation score of the real-time analysis project, determine the test status of the real-time analysis project based on the single-phase evaluation score, obtain the project data group, arrange the test status according to the position in the project data group, obtain the status array, process the status data, obtain the comprehensive risk score of the target device, and then determine the test signal based on the comprehensive risk score; The result response end is used to convert the test signal into an audio-visual reminder signal and give a reminder.

2. A fully automatic testing system for coin identification equipment according to claim 1, characterized in that: After physically connecting the target device, the test firmware identified as ALMEX GmbH#64322PRX_PCBFAT_DiBox is loaded into the device. The test firmware communicates with the host PC or test system through simple ASCII commands. The host PC or test system sends test instructions, and the test firmware performs corresponding processing after receiving the instructions, and returns the test results to the host PC or test system in the form of ASCII characters.

3. A fully automatic testing system for coin identification equipment according to claim 1, characterized in that: Before the device test end automatically tests the coin identification device, it first identifies the test program, determines the device model and test items to be tested, and then automatically searches the serial port and configures related parameters through connection instructions. When the parameters are set, it automatically sends test instructions and performs automatic testing according to the test program, and obtains test data at the same time.

4. A fully automatic testing system for coin identification equipment according to claim 1, characterized in that: Methods for determining effective operating time include: S1: Mark the coin identification device to be tested as a target device, obtain the device model of the target device, and based on the device model, obtain historical test information and device maintenance information corresponding to the device model, wherein the historical test information includes test items; S2: first extract the test items in the historical test information, and at the same time obtain the test items of the current target device, compare the test items in the historical test information with the test items of the current target device, select the same item type as the test items of the current target device from the test items in the historical test information, and mark the selected test items as real-time analysis items; S3: randomly select a real-time analysis item and mark it as a designated test item, and extract the maintenance record associated with the designated test item from the equipment maintenance information, wherein the maintenance record includes the fault occurrence time and the fault maintenance time; Arrange the fault occurrence time in chronological order to obtain a fault sequence table, and then mark the faults in the fault sequence table in order according to their positions to obtain the fault i, where i∈[1,n], indicating that there are n faults in the fault sequence table; Starting from the first fault in the fault sequence table, the fault occurrence time of fault i is obtained in turn, and the fault occurrence time of fault (i-1) is subtracted from the fault occurrence time of fault i, and the difference result is marked as the effective operating time Ti of fault i, where when i takes the value of 1, i-1=0, and fault 0 refers to the first operating time of the equipment.

5. A fully automatic testing system for coin identification equipment according to claim 4, characterized in that: The calculation method of the fault impact value includes: The effective running time of n faults is averaged to obtain the mean fault time Tp, and then the fault maintenance time of all faults is obtained and the mean fault maintenance time of n faults is averaged, and the result is marked as the mean maintenance time Wp; Using the formula Get the fault impact value GY, a1 is the base threshold, and a1>1, The greater the fault impact value of a specified test item, the greater the impact of the fault corresponding to the specified test item on the operation of the coin identification equipment. Conversely, the smaller the fault impact value, the smaller the impact of the fault corresponding to the specified test item on the operation of the coin identification equipment.

6. A fully automatic testing system for coin identification equipment according to claim 5, characterized in that: Methods for determining project data groups include: Obtaining the fault impact values ​​GY of all real-time analysis items, and comparing the fault impact values ​​GY with each other, and arranging the fault impact values ​​GY in descending order according to the comparison result, to obtain an impact sequence list of the real-time analysis items; According to the position of the fault impact value in the impact sequence table, first identify the real-time analysis project corresponding to the fault impact value at each position, then mark the position of the fault impact value as the weight position of the real-time analysis project, and then arrange the real-time analysis projects in sequence according to the corresponding weight positions, and mark the position sequence table obtained after the arrangement is completed as a project data group.

7. A fully automatic testing system for coin identification equipment according to claim 1, characterized in that: The methods for obtaining the status array include: SS1: Get the test data of the target device real-time analysis project and use the formula The single-phase evaluation score DF of the real-time analysis project is obtained, where |*| represents an absolute value, j represents different real-time analysis projects, βj represents the proportional coefficient corresponding to the real-time analysis project j, CSj represents the test data of the real-time analysis project j, and Cbj represents the standard data of the real-time analysis project j; SS2: Compare the single-phase evaluation score DF of each real-time analysis item with the score cutoff value Fy in turn. If DF≥Fy, the test status of the corresponding real-time analysis item is marked as 0. Otherwise, if DF<Fy, the test status of the corresponding real-time analysis item is marked as 1. SS3: Get the project data group, and arrange the test status of the real-time analysis project according to the corresponding weight position according to the weight position of the real-time analysis project in the project data group to obtain a status array.

8. A fully automatic testing system for coin identification equipment according to claim 7, characterized in that: The test signal includes a test pass signal and a test warning signal. The method for determining the test signal includes: The state array is regarded as a binary value, and then the binary value is converted to decimal, and the result of the conversion is marked as RS; Using the formula ZH=RS+b1 m Get the comprehensive risk score ZH, where m represents the total number of test states 1 in the state array, and b1 is the base constant; The comprehensive risk score ZH of the target device is compared with the score threshold X1. If ZH≥X1, a test warning signal is generated. Otherwise, if ZH<X1, a test pass signal is generated.

9. A fully automatic testing system for coin identification equipment according to claim 8, characterized in that: The test signal also includes an abnormal alarm signal, and the method for generating the abnormal alarm signal includes: When the test evaluation end obtains real-time test data, it first compares the real-time test data with the corresponding normal operating range. If the real-time test data is in the corresponding normal operating range, the operating status of the corresponding real-time analysis project is marked as normal. Otherwise, if the test data is not in the normal operating range, the operating status of the corresponding real-time analysis project is marked as abnormal. If an abnormal state is detected in the operating status of the real-time analysis project of the target device, an abnormal alarm signal is directly generated and transmitted to the result response end. Otherwise, when the operating status of the real-time analysis project is normal, the comprehensive risk score of the target device is calculated again.

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