Power supply test system and electronic equipment

Abstract

The invention discloses a power supply test system and electronic equipment, the power supply test system comprises a server and test equipment which are in communication connection, and the server responds to a test application of a tested power supply and determines a test demand of the tested power supply and at least two test items corresponding to the test demand; the server determines a test equipment set and a test equipment sequence corresponding to the tested power supply according to the item type of the test item; for each test device in the test device sequence, the server sends a control instruction to the test device according to the drive program corresponding to the test device; the test device responds to the control instruction sent by the server to test the corresponding test items of the tested power supply to obtain a test result corresponding to each test item, and sends the test results to the server; and the server receives the test result sent by each test device, and generates a test report according to each test result. Based on the system, power supply testing can be automatically realized, and power supply testing efficiency can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of power supply testing, and in particular to a power supply testing system and electronic equipment. Background Art

[0002] In order to ensure the compliance of the power supply, it is usually necessary to test the power supply. The existing power supply testing method is that the relevant testers manually perform various types of tests on the power supply to obtain the test results, and then the relevant testers manually organize the test results of various types of tests to obtain the final test results of the power supply. The above-mentioned method of manually testing the power supply will reduce the efficiency of the power supply test. Summary of the invention

[0003] The embodiments of the present application provide a power supply testing system and an electronic device, which can improve the power supply testing efficiency.

[0004] In a first aspect, an embodiment of the present application provides a power supply testing system, the power supply testing system comprising: a server and a testing device, wherein:

[0005] The server determines, in response to a test application of the power supply under test, a test requirement of the power supply under test and at least two test items corresponding to the test requirement;

[0006] The server determines the test equipment set and the test equipment sequence corresponding to the tested power supply according to the project type of the test project;

[0007] The server sends a control instruction to each test device in the test device sequence according to a driver corresponding to the test device;

[0008] The testing device tests the test items corresponding to the tested power supply in response to the control instruction sent by the server, obtains the test results corresponding to each of the test items, and sends the test results to the server;

[0009] The server receives the test result sent by each of the test devices, and generates a test report according to each of the test results.

[0010] Optionally, the server determines, according to the project type of the test project, a test equipment set and a test equipment sequence corresponding to the tested power supply, including:

[0011] The server determines a set of test equipment corresponding to the tested power supply according to the project type of the test project and a preset mapping relationship between the project type and the test equipment;

[0012] The server obtains, according to the model information of the tested power supply, the historical test data of each test device in the test device set for the power supply of the model information;

[0013] The server sorts the test device set according to the historical test data corresponding to each test device to obtain a test device sequence.

[0014] Optionally, the server sends a control instruction to each test device in the test device sequence according to a driver corresponding to the test device, including:

[0015] The server selects one test device in the test device sequence in turn, and determines a corresponding driver according to the test device; the driver includes a test item sequence corresponding to the test device.

[0016] The server sends a control instruction to the test device according to the driver program, and controls the test device to execute each test item in the test item sequence in sequence.

[0017] Optionally, before the server sequentially selects a test device from the test device sequence and determines a corresponding driver according to the test device, the server further includes:

[0018] The server determines, for each of the test devices, a set of test items for the tested power supply by the test device;

[0019] The server determines the importance of each test item in the test item set according to the historical test data of the test device for each test item;

[0020] The server determines the degree of correlation between each of the test items according to the correlation factor corresponding to each of the test items; the correlation factor includes at least one of functional relevance, physical characteristics and standard specifications;

[0021] The server generates a test item sequence according to the importance of each test item and the correlation between each test item;

[0022] The server generates a corresponding driver for the test device based on the test item sequence.

[0023] Optionally, the server generates a corresponding driver for the test device based on the test item sequence, including:

[0024] The server determines the test parameters and test conditions of the tested power supply for the test device according to the tested power supply and the test requirements; the test parameters include at least one of a test mode, a measurement range, a data acquisition accuracy and a test duration; and the test conditions include at least one of temperature, humidity, electromagnetic interference and mechanical vibration;

[0025] The server adjusts the initialization settings in the driver template corresponding to each of the test devices according to the test parameters to obtain a first reference driver template corresponding to each of the test devices;

[0026] The server adds an error handling mechanism to the first reference driver template according to the test condition to obtain a second reference driver template corresponding to the test device;

[0027] The server generates a driver corresponding to the test device according to the second reference driver template and the test item sequence.

[0028] Optionally, before the server sends a control instruction to the test device according to the driver to control the test device to sequentially execute each test item in the test item sequence, the server further includes:

[0029] The server receives the connection status of the tested power source sent by the test device;

[0030] If the connection status of the tested power supply is normal, the server executes the steps of: sending a control instruction to the test device according to the driver program, and controlling the test device to execute each test item in the test item sequence in sequence.

[0031] Optionally, the test device tests the test items corresponding to the tested power supply in response to the control instruction sent by the server, and after obtaining the test result corresponding to each of the test items, further comprises:

[0032] If the test result is that the test fails, the test device determines the target test item corresponding to the test result and issues an alarm;

[0033] When receiving the retest instruction, the testing device retests the target test item on the power supply under test;

[0034] When the test result of the target test item is passed, the test device determines a test item after the target test item in the test item sequence in the driver as a starting test item;

[0035] The testing device continues to test the power supply under test based on the initial test item and the driver.

[0036] Optionally, after the server receives the test result sent by each of the test devices and generates a test report according to each of the test results, the server further includes:

[0037] If it is determined according to the test report that the tested power supply is a defective product, the server obtains the defective data in the test report;

[0038] The server determines the original parameters corresponding to the bad registers in the tested power supply based on the bad data, and calculates the target parameters corresponding to the bad registers according to the bad data and the original parameters;

[0039] The server replaces the original parameters with the target parameters to repair the bad register.

[0040] Optionally, after the server replaces the original parameter with the target parameter to repair the bad register, the method further includes:

[0041] The server obtains the failed test items in the test report;

[0042] The server retests the power supply under test for a preset number of times for the failed test items, and counts the number of times the test passes;

[0043] The server calculates the test pass rate based on the number of test passes and the preset number of times;

[0044] If the test pass rate is greater than a preset pass rate, the server determines that the tested power supply is a retested good product.

[0045] In a second aspect, an embodiment of the present application further provides an electronic device, including a power supply testing system; the power supply testing system is used to perform any power supply testing steps provided in the embodiment of the present application.

[0046] The scheme of the embodiment of the present application, the power supply test system includes: a server and a test device, wherein: the server responds to the test application of the power supply under test, determines the test requirements of the power supply under test, and at least two test items corresponding to the test requirements; the server determines the test equipment set and the test equipment sequence corresponding to the power supply under test according to the project type of the test item; the server sends a control instruction to the test equipment according to the driver corresponding to the test equipment for each test equipment in the test equipment sequence; the test equipment responds to the control instruction sent by the server to test the test items corresponding to the power supply under test, obtains the test results corresponding to each test item, and sends the test results to the server; the server receives the test results sent by each test equipment, and generates a test report according to each test result. The power supply test system controls the test equipment to test the power supply under test through the interaction between the server and the test equipment, and can automatically realize the power supply test, avoiding the need for the relevant test personnel to manually perform various types of tests on the power supply to obtain the test results, and can improve the efficiency of the power supply test. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0048] Figure 1 It is a flowchart of a first embodiment of a power supply testing system provided by the present application;

[0049] Figure 2 It is a flow chart of a second embodiment of the power supply testing system provided by the present application;

[0050] Figure 3 It is a flowchart of a third embodiment of the power supply testing system provided by the present application;

[0051] Figure 4 is a schematic flow chart of a fourth embodiment of a power supply testing system provided by the present application;

[0052] Figure 5 is a schematic flow chart of a fifth embodiment of a power supply testing system provided by the present application;

[0053] Figure 6 is a flowchart of a sixth embodiment of the power supply testing system provided by the present application;

[0054] Figure 7 It is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0055] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of the present application. At the same time, in the description of the embodiments of the present application, the terms "first", "second", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more features. In the description of the embodiments of the present application, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0056] Embodiments of the present application provide a power supply testing system and an electronic device.

[0057] Specifically, the embodiments of the present application are described from the perspective of a power supply testing system, that is, the embodiments of the present application can be executed by a server and a testing device in a power supply testing system; the server can be a smart terminal, a PC terminal, a mobile terminal, and other devices.

[0058] The following is a detailed description of the embodiments in conjunction with the accompanying drawings. It should be noted that the description order of the following embodiments is not intended to limit the preferred order of the embodiments. Although the logical order is shown in the flow chart, in some cases, the steps shown or described may be performed in an order different from that shown in the accompanying drawings.

[0059] Please refer to Figure 1 , a first embodiment of the power supply test system is proposed, wherein the power supply test system in the first embodiment comprises: a server and a test device connected in communication, wherein:

[0060] In response to a test application of the power supply under test, the server determines a test requirement of the power supply under test and at least two test items corresponding to the test requirement.

[0061] Specifically, the server responds to the test application for the power supply under test input by the relevant test personnel, obtains the power supply model and application scenario corresponding to the power supply under test, and determines at least two test items corresponding to the power supply under test and the test conditions corresponding to each test item according to the power supply model and application scenario of the power supply under test. It can be understood that different models of power supplies under test correspond to different test items, and the test items corresponding to the power supplies under test in different application scenarios are also different. Therefore, according to the power supply model and application scenario of the power supply under test, the test items of the power supply under test can be determined, which can improve the accuracy of the determination of the test items.

[0062] It should be noted that the application scenario refers to the equipment and instruments to which the power supply under test is applied. The equipment and instruments may include consumer electronics, high-power industrial equipment, communication equipment, and automotive electronics.

[0063] As an embodiment, the server determines that the power supply under test is applied to a consumer electronic product. According to the preset association between the consumer electronic product and the test items, the test items corresponding to the power supply under test may include output voltage and current accuracy test, load regulation rate test, no-load regulation rate test, ripple test, noise test, temperature coefficient test, protection function test, etc.

[0064] As an embodiment, the server determines that the power supply under test is applied to high-power industrial equipment. According to the preset association between the high-power industrial equipment and the test items, the test items allocated to the target power supply may include transient response test, efficiency test, load effect test, long-term stability test, frequency response test, parallel stability test, load balancing test, mutual interference test, parallel switch characteristic test, etc.

[0065] As an embodiment, the server determines that the power supply under test is applied to the communication equipment, and according to the preset association relationship between the communication equipment and the test items, the test items determined to be allocated to the target power supply may include power switching noise and interference test, power stability and overload protection test, power supply and protocol compatibility test, power efficiency test, power transient response test, power electromagnetic compatibility (EMC) test, power noise and ripple test, power anti-interference capability test, load sharing test, fault isolation capability test, parallel power supply efficiency test, parallel power supply and communication equipment compatibility test, etc.

[0066] As an embodiment, the server determines that the power supply under test is applied to automotive electronics. According to the preset association between automotive electronics and test items, the test items determined to be allocated to the target power supply may include vibration test, temperature test, electromagnetic interference (EMI) test, starting current test, voltage stability test, overload protection test, reverse connection protection test, high current test, high power supply test, redundant power supply switching test, power supply parallel operation test, power supply load distribution test, charging system coordination test, etc.

[0067] The server determines a test equipment set and a test equipment sequence corresponding to the tested power supply according to the project type of the test project.

[0068] Specifically, the server determines the test equipment set and test equipment sequence corresponding to the tested power supply according to the project type of the test project. Specifically, each project type corresponds to one test equipment, or multiple project types correspond to one test equipment. The server determines the test equipment set corresponding to the tested power supply according to the correspondence between the project type and the test equipment.

[0069] Optionally, the server obtains the same test device set in the historical data, obtains a historical test device sequence corresponding to the test device set, and determines the historical test device sequence as the test device sequence of the test device set corresponding to the tested power supply.

[0070] Optionally, the server obtains the historical test data corresponding to each test device in the test device set, and then counts the test pass rate corresponding to each test device, and then sorts all the test devices in the test device set according to the test pass rate corresponding to each test device to obtain a test device sequence. By setting the test device sequence, the test process can be carried out step by step according to the sequence, avoiding the relevant personnel from arbitrarily selecting test devices to perform tests, which can improve the test efficiency.

[0071] The server sends a control instruction to each test device in the test device sequence according to a driver corresponding to the test device.

[0072] Specifically, after determining the test device sequence of the test device set corresponding to the power supply under test, the server obtains the model and current test item of the test device for each test device in the test device sequence, determines the target driver, and then sends corresponding control instructions to the test device in turn according to the target driver to control the test device to execute the current test item.

[0073] It should be noted that the server stores in advance the driver for each test item corresponding to each test device. After determining the model of the test device and the current test item, the driver corresponding to the test device can be obtained from all the drivers stored in advance.

[0074] The testing device tests the test items corresponding to the tested power supply in response to the control instruction sent by the server, obtains the test results corresponding to each of the test items, and sends the test results to the server.

[0075] Specifically, the test device responds to the control instruction issued by the server based on the driver, tests the test items corresponding to the power supply under test, and obtains the test results corresponding to the test items; after obtaining the test results, the test device sends the test results to the server.

[0076] The server receives the test result sent by each of the test devices, and generates a test report according to each of the test results.

[0077] Specifically, the test device tests the test items corresponding to the tested power supply, obtains the test results corresponding to the test items, and then sends the test results to the server. The server receives the test results sent by each test device, and determines a test report according to each test result.

[0078] It can be understood that the server determines the test device currently performing the test according to the test device sequence in sequence, and then controls the test device currently performing the test to perform the test items based on the corresponding driver. The test device currently performing the test sends the test result to the server before completing a test item, until all test devices complete the test of the power supply under test. The server obtains the test results corresponding to all test items, and then determines the test report based on each test result.

[0079] The power supply test system of this embodiment includes: a server and a test device connected in communication, the server responds to the test application of the power supply under test, determines the test requirements of the power supply under test, and at least two test items corresponding to the test requirements; the server determines the test equipment set and the test equipment sequence corresponding to the power supply under test according to the project type of the test item; the server sends a control instruction to the test equipment according to the driver corresponding to the test equipment for each test equipment in the test equipment sequence; the test equipment responds to the control instruction sent by the server to test the test items corresponding to the power supply under test, obtains the test results corresponding to each test item, and sends the test results to the server; the server receives the test results sent by each test equipment, and generates a test report according to each test result. The power supply test system controls the test equipment to test the power supply under test through the interaction between the server and the test equipment, and can automatically realize the power supply test, avoiding the need for the relevant test personnel to manually perform various types of tests on the power supply to obtain the test results, and can improve the power supply test efficiency.

[0080] Please refer to Figure 2 , a second embodiment of the power supply test system is proposed. The difference between the second embodiment and the first embodiment is that the server determines the test equipment set and the test equipment sequence corresponding to the tested power supply according to the project type of the test project, including:

[0081] Step 201: The server determines a set of test equipment corresponding to the tested power supply according to the project type of the test project and a preset mapping relationship between the project type and the test equipment.

[0082] In this step, the server determines the set of test equipment corresponding to the power supply under test based on the project type of the test project and the preset mapping relationship between the project type and the test equipment. Specifically, each project type corresponds to one test equipment, or multiple project types correspond to one test equipment. The server determines the set of test equipment corresponding to the power supply under test based on the corresponding relationship between the project type and the test equipment.

[0083] Step 202: The server obtains, according to the model information of the tested power supply, historical test data of each test device in the test device set for the power supply with the model information.

[0084] Step 203: The server sorts the test device set according to the historical test data corresponding to each test device to obtain a test device sequence.

[0085] In step 202 to step 203, the server obtains the model information of the power supply under test, obtains the historical test data of the power supply of the model information for each test device in the test device set, and then counts the test pass rate corresponding to each test device, and then sorts all the test devices in the test device set according to the test pass rate corresponding to each test device to obtain a test device sequence.

[0086] Furthermore, the server sorts all the test devices in the test device set according to the test pass rate corresponding to each test device, and after obtaining the test device sequence, obtains the current usage status and usage waiting status corresponding to each test device in the test device set, and adjusts the test device sequence according to the current usage status and usage waiting status, so that the test devices whose current usage status is idle or whose usage waiting status is a shorter waiting queue will test the power supply under test first, and obtain the final test device sequence.

[0087] After the power supply test system of this embodiment determines the test equipment set corresponding to the tested power supply through the server, it calculates the test pass rate corresponding to each test equipment according to the historical test data of the power supply with model information of each test equipment in the test equipment set, and then sorts all the test equipment in the test equipment set according to the test pass rate corresponding to each test equipment to obtain a test equipment sequence, which can determine which test equipment has a low test pass rate for the model information corresponding to the tested power supply, and sorts them to the front, so that the power supply can be tested as soon as possible, which can improve the power supply test efficiency. Furthermore, the server adjusts the test equipment sequence according to the current usage and usage waiting status corresponding to each test equipment in the test equipment set, and obtains the final test equipment sequence, so that the test equipment with the current usage status of idle or the usage waiting status of the short waiting queue will give priority to testing the tested power supply, avoiding long waiting time for using the test equipment, and further improving the power supply test efficiency.

[0088] Please refer to Figure 3 , a third embodiment of the power supply test system is proposed. The difference between the third embodiment and the first embodiment and the second embodiment is that the server sends a control instruction to each test device in the test device sequence according to a driver corresponding to the test device, including:

[0089] Step 301: the server selects a test device in the test device sequence in turn, and determines a corresponding driver according to the test device; the driver includes a test item sequence corresponding to the test device.

[0090] In this step, after determining the test device sequence corresponding to the power supply under test, the server selects a test device in the test device sequence in turn, and determines the corresponding driver according to the test device; wherein the driver corresponding to each test device includes a test item sequence corresponding to the test item set that the test device needs to test on the power supply under test. The test item sequence is determined by the server based on the historical test data of each test item in the test item set and the correlation factor corresponding to each test item.

[0091] Step 302: The server sends a control instruction to the test device according to the driver program, and controls the test device to execute each test item in the test item sequence in sequence.

[0092] In this step, after selecting a test device, the server sends a control instruction to the test device according to the driver corresponding to the test device, so as to control the test device to execute each test item in the test item sequence in sequence to test the power supply under test.

[0093] Exemplarily, the server selects a parallel test device based on the test device sequence, and the test items that the parallel test device needs to test on the power supply under test include parallel stability test, load balancing test, mutual interference test, and parallel switch characteristic test; the test item sequence in the driver program corresponding to the parallel test device is to first perform a parallel switch characteristic test, then a parallel stability test, then a load balancing test, and finally a mutual interference test; according to the test item sequence in the driver program corresponding to the parallel test device, the server first sends a parallel switch characteristic test control instruction to the parallel test device to control the parallel test device to perform a parallel switch characteristic test on the power supply under test, then sends a parallel stability test control instruction to the parallel test device to control the parallel test device to perform a parallel stability test on the power supply under test, then sends a load balancing test control instruction to the parallel test device to control the parallel test device to perform a load balancing test on the power supply under test, and finally sends a mutual interference test control instruction to the parallel test device to control the parallel test device to perform a mutual interference test on the power supply under test.

[0094] In one embodiment, before step 302, steps a to b may be included, specifically:

[0095] Step a: The server receives the connection status of the tested power source sent by the test device.

[0096] Step b: if the connection status of the power supply under test is normal, the server executes the steps of: sending a control instruction to the test device according to the driver program, and controlling the test device to execute each test item in the test item sequence in sequence.

[0097] In step a to step b, before controlling the test device to sequentially execute each test item in the test item sequence, the server first controls the test device to connect with the power supply under test, and the test device sends the connection status of the power supply under test to the server in real time. When the server determines that the connection status of the power supply under test is abnormal, it continues to receive the connection status of the power supply under test sent by the test device until the server determines that the connection status of the power supply under test is normal, and then sends a control instruction to the test device according to the driver program to control the test device to sequentially execute each test item in the test item sequence. It can be understood that by monitoring whether the connection between the test device and the power supply under test is normal, it can avoid starting the test when the connection between the monitoring test device and the power supply under test is abnormal, which can improve the accuracy of the test.

[0098] The power supply test system of this embodiment selects a test device in the test device sequence in turn, and determines the corresponding driver according to the test device; the driver includes a test item sequence corresponding to the test device. According to the driver, the test device is controlled to execute each test item in the test item sequence in turn. By testing the power supply under test based on the test item sequence, random testing is avoided to affect the test efficiency, thereby improving the efficiency of the power supply test.

[0099] Please refer to Figure 4 , a fourth embodiment of the power supply test system is proposed. The difference between the fourth embodiment and the first to third embodiments is that before the server sequentially selects a test device from the test device sequence and determines the corresponding driver according to the test device, it also includes:

[0100] Step 401: The server determines, for each of the test devices, a set of test items that the test device performs on the power supply under test.

[0101] In this step, the server determines all test items of the power supply under test according to the power supply model and application scenario of the power supply under test, and for each test device, the server determines the test item set of the test device for the power supply under test from all test items. Exemplarily, for the comprehensive test device, the server determines the transient response test, efficiency test, load effect test, long-term stability test, and frequency response test as the test item set for the power supply under test in the test item set.

[0102] Step 402, the server determines the importance of each test item in the test item set according to the historical test data of the test device for each test item;

[0103] In this step, the server obtains the historical test data of the test device for each test item in the test item set, and based on the historical test data of each test item, calculates the probability of each test item failing the test, and then determines the importance of each test item based on the probability of test failure, wherein the greater the probability of test failure, the greater the importance.

[0104] Furthermore, the server obtains preset test item importance regulations in the test request input by the relevant tester, and determines the importance of each test item based on the preset test item importance regulations and the probability of each test item failing the test.

[0105] Step 403: The server determines the degree of correlation between each of the test items according to the correlation factors corresponding to each of the test items; the correlation factors include at least one of functional relevance, physical characteristics and standard specifications.

[0106] In this step, the server determines the degree of correlation between each test item according to the correlation factor corresponding to each test item; wherein the correlation factor includes at least one of functional correlation, physical characteristics and standard specifications. Functional correlation: whether the same test item targets the same function or performance indicator.

[0107] For example, output voltage and output current tests are usually related because they affect power output together. Physical characteristics: whether the test items are based on the same physical principles or characteristics; for example, the effect of temperature on power supply efficiency can be reflected by the relationship between efficiency test and temperature rise test. Standard specification: Industry standards may stipulate that certain test items should be performed at the same time, or the results of certain items must meet specific conditions before subsequent tests can be performed.

[0108] Exemplarily, the server evaluates the correlation between each test item based on functional relevance, physical characteristics, and standard specifications, and uses a matrix to represent the degree of correlation between different test items. The target device sets evaluation criteria for each test item, using a quantitative or qualitative scoring system. For example, a score of 1 to 5 can be used to represent the degree of correlation, with 1 representing low correlation and 5 representing high correlation.

[0109] Step 404: The server generates a test item sequence according to the importance of each test item and the correlation between each test item.

[0110] In this step, the server generates a test item sequence according to the importance of each test item and the correlation between each test item; specifically, using the idea of ​​normalization, the importance score is calculated according to the importance of each test item and the preset importance weight, and the correlation score is calculated according to the correlation of each test item and the preset correlation weight. The importance score and the correlation score are added together to obtain a ranking score, and then each test item is sorted from large to small according to the ranking score to obtain a test item sequence.

[0111] Step 405: The server generates a driver corresponding to the test device based on the test item sequence.

[0112] In this step, the server generates a driver corresponding to the test device based on the test item sequence and a preset driver template corresponding to the test device.

[0113] In one embodiment, step 405 may include steps 4051 to 4054, specifically:

[0114] Step 4051, the server determines the test parameters and test conditions of the power supply under test for the test equipment according to the power supply under test and the test requirements; the test parameters include at least one of a test mode, a measurement range, a data acquisition accuracy and a test duration; the test conditions include at least one of temperature, humidity, electromagnetic interference and mechanical vibration.

[0115] In this step, the server determines the test parameters and test conditions of the power supply under test for the test equipment according to the power supply under test and the test requirements corresponding to the power supply under test; wherein the test parameters include at least one of the test mode, measurement range, data acquisition accuracy and test duration, and the test conditions include at least one of temperature, humidity, electromagnetic interference and mechanical vibration.

[0116] Step 4052: The server adjusts the initialization settings in the driver template corresponding to each of the test devices according to the test parameters to obtain a first reference driver template corresponding to each of the test devices.

[0117] In this step, the server adjusts the initialization settings in the driver template corresponding to each test device according to the test parameters to obtain the first reference driver template corresponding to each test device. Specifically, the server adds parameters such as test mode, measurement range, data acquisition accuracy, and test duration to the driver template to adjust the initialization settings in the driver template corresponding to each test device to obtain the first reference driver template corresponding to each test device.

[0118] Step 4053: The server adds an error handling mechanism to the first reference driver template according to the test condition to obtain a second reference driver template corresponding to the test device.

[0119] In this step, the server adds an error handling mechanism to the first reference driver template according to the test conditions to obtain a second reference driver template corresponding to the test device. Specifically, the server adds an error handling mechanism to the first reference driver template according to the test conditions such as temperature, humidity, electromagnetic interference and mechanical vibration. The error handling mechanism can automatically recover when a program error occurs during the test to ensure the robustness of the driver.

[0120] Step 4054: The server generates a driver corresponding to the test device according to the second reference driver template and the test item sequence.

[0121] In this step, the server adds the test item sequence to the second reference driver template, and the test item sequence is used as the execution logic of the driver, thereby generating a driver corresponding to the test device.

[0122] The power supply test system of this embodiment determines the importance of each test item based on the historical test data of each test item, determines the correlation between each test item based on the correlation factor corresponding to each test item, and sorts the test items according to the importance and correlation to obtain a test item sequence. By sorting the test items, test items with high importance can be tested in advance, and test items with high correlation can be tested in a concentrated manner, avoiding random testing that affects test efficiency, thereby improving the efficiency of power supply testing.

[0123] Please refer to Figure 5 , a fifth embodiment of the power supply test system is proposed. The difference between the fifth embodiment and the first to fourth embodiments is that the test device responds to the control instruction sent by the server to test the test items corresponding to the power supply under test, and after obtaining the test results corresponding to each of the test items, it also includes:

[0124] Step 501: If the test result is that the test fails, the server determines the target test item corresponding to the test result and issues an alarm.

[0125] In this step, when the server receives the test result sent by the test device, it compares the test data in the test result with the corresponding preset standard test data. According to the comparison result, if it is determined that the test result is a test failure, the target test item corresponding to the test result is determined and an alarm is issued. In response to the alarm, the server repairs the power supply under test, or the relevant personnel can repair the power supply under test when receiving the alarm.

[0126] Step 502: When receiving the retest instruction, the server retests the target test item on the power supply under test.

[0127] In this step, after the relevant personnel complete the maintenance of the power supply under test, the server receives a retest instruction and re-controls the test equipment to perform the target test item test on the power supply under test. Exemplarily, the server determines that the target test item that fails the test is the transient response test, and after the power supply under test is repaired for the transient response test, the server re-controls the test equipment to perform the transient response test on the power supply under test.

[0128] Step 503: until the test result of the target test item is that the test is passed, the server determines the next test item after the target test item in the test item sequence in the driver as the starting test item.

[0129] Step 504: The server continues to test the power supply under test based on the initial test item and the driver.

[0130] In step 503 to step 504, the server re-tests the target test item for a preset number of times on the power supply under test, and calculates the test pass rate. When the test pass rate is greater than a threshold, the test result of the target test item is determined to be a test pass, and the next test item of the target test item in the test item sequence in the driver is determined as the starting test item. Based on the starting test item and the driver, the server continues to control the test device to test the power supply under test.

[0131] Exemplarily, the sequence of test items is: transient response test, efficiency test, load effect test, long-term stability test, and frequency response test; after the server re-performs the transient response test on the power supply under test and the test passes, the efficiency test is used as the starting test item, and based on the efficiency test and the driver, the test equipment continues to be controlled to test the power supply under test.

[0132] The power supply test system of this embodiment, when determining that the test result of a certain target test item of the tested power supply fails, issues an alarm and repairs the tested power supply, retests the target test item after the repair, and when the test passes, determines the next test item of the target test item in the test item sequence as the starting test item, and continues to test the tested power supply based on the starting test item and the driver. When the test result fails, the subsequent test items can be continued after the retest is completed, and there is no need to retest from the beginning, thereby improving the test efficiency.

[0133] Please refer to Figure 6, a sixth embodiment of the power supply test system is proposed. The difference between the sixth embodiment and the first to fifth embodiments is that after the server receives the test result sent by each of the test devices and generates a test report according to each of the test results, it also includes:

[0134] Step 601: If it is determined according to the test report that the tested power supply is defective, the server obtains defect data in the test report.

[0135] In this step, after the server obtains the test results sent by all the test devices and generates a test report, if it is determined according to the test report that the tested power supply is defective, the server obtains the defect data corresponding to the test report.

[0136] Step 602: The server determines original parameters corresponding to the bad registers in the tested power supply based on the bad data, and calculates target parameters corresponding to the bad registers according to the bad data and the original parameters.

[0137] In this step, the server determines the bad registers in the target power supply and the original parameters corresponding to the bad registers based on the bad data. The bad registers are registers that output bad data during the test. The server obtains the original parameters in the bad registers and calculates the target parameters corresponding to the bad registers based on the bad data and the original coefficients.

[0138] Specifically, the power supply under test includes a variety of registers, such as a voltage register, a current register, a power consumption register, etc., and each register is correspondingly set with original parameters.

[0139] For example, if the bad data acquired by the target device are load voltage and power supply voltage, the target register is determined to be a voltage register, and the target device calculates the target coefficient corresponding to the voltage register according to a preset formula, wherein the preset formula is: target coefficient = (load voltage - power supply voltage) * 100 + original coefficient.

[0140] For example, if the bad data acquired by the target device are load current and power supply current, the target register is determined to be a current register, and the target device calculates the target coefficient corresponding to the current register according to a preset formula. The preset formula is: target coefficient = (load current - power supply current) * 100 + original coefficient.

[0141] For example, if the bad data acquired by the target device is load power consumption and power supply power consumption, the target register is determined to be a power consumption register, and the target device calculates the target coefficient corresponding to the power consumption register according to a preset formula. The preset formula is: target coefficient = (load power consumption - power supply power consumption) * 100 + original coefficient.

[0142] Step 603: The server replaces the original parameter with the target parameter to repair the bad register.

[0143] In this step, the server replaces the original parameters in the bad registers with the target parameters to repair the bad registers in the power supply under test.

[0144] Further, after replacing the original parameter with the target parameter to repair the bad register, the method further comprises:

[0145] Step 604: The server obtains the failed test items in the test report.

[0146] In this step, after determining the bad register, the server determines the failed test items based on the bad register; specifically, the server determines that the bad register is a voltage register, and the corresponding failed test items are load voltage and power supply voltage tests; the server determines that the bad register is a current register, and the corresponding failed test items are load current and power supply current tests; the server determines that the bad register is a power consumption register, and the corresponding failed test items are load power consumption and power supply power consumption tests.

[0147] Step 605: the server retests the power supply under test a preset number of times for the test items that failed, and counts the number of times the test passed.

[0148] Step 606: The server calculates the test pass rate according to the number of test passes and the preset number of times.

[0149] Step 607: If the test pass rate is greater than a preset pass rate, the server determines that the tested power supply is a retested good product.

[0150] In step 605 to step 607, the server tests the bad registers a preset number of times based on the failed test items, and counts the number of times the test passes; the test pass rate is calculated based on the number of times the test passes and the preset number of times; if the test pass rate is greater than the preset pass rate, it is determined that the power supply under test is a retested good product.

[0151] For example, the preset number of times is 100 times, the preset pass rate is 90%, the server tests the target register 100 times based on the target test item, and the number of test passes is 95 times, then the test pass rate is determined to be 95%, and the test pass rate is greater than the preset pass rate, then the register test result is determined to be a test pass. If the number of test passes is 80 times, then the test pass rate is determined to be 80%, and the test pass rate is not greater than the preset pass rate, then the register test result is determined to be a test failure.

[0152] It is understandable that by testing the target register based on the target test items multiple times, calculating the test pass rate, and then judging whether the test is passed based on the test pass rate, the randomness of the test can be avoided, thereby improving the accuracy of the test.

[0153] The power supply test system of this embodiment, if the target power supply is determined to be a defective product according to the test report, obtains the defective data corresponding to the test report; calculates the target coefficient corresponding to the defective register based on the defective data and the original parameters corresponding to the defective register in the tested power supply; replaces the original coefficient in the defective register with the target coefficient to repair the defective register. When the power supply is determined to be a defective product, the defective register can be quickly located and then repaired, thereby improving the efficiency of repairing the defective register.

[0154] Accordingly, the present application also provides an electronic device, such as Figure 7 As shown, Figure 7 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. The electronic device 1100 includes a processor 1101 having one or more processing cores, a memory 1102 having one or more computer-readable storage media, and a computer program stored in the memory 1102 and executable on the processor. The processor 1101 is electrically connected to the memory 1102. It will be understood by those skilled in the art that the electronic device structure shown in the figure does not constitute a limitation on the electronic device, and may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently.

[0155] The processor 1101 is the control center of the electronic device 1100, and uses various interfaces and lines to connect various parts of the entire electronic device 1100. By running or loading software programs and / or units stored in the memory 1102, and calling data stored in the memory 1102, the processor 1101 executes various functions of the electronic device 1100 and processes data, thereby monitoring the electronic device 1100 as a whole. The processor 1101 can be a processor CPU, a graphics processor GPU, a network processor (Network Processor, NP), etc., and can implement or execute the various methods, steps and logic block diagrams disclosed in the embodiments of the present application.

[0156] In an embodiment of the present application, the processor 1101 in the electronic device 1100 will load the instructions corresponding to the processes of one or more applications into the memory 1102 according to the following steps, and the processor 1101 will run the applications stored in the memory 1102 to implement various functions. The specific implementation can be found in the previous embodiments and will not be repeated here.

[0157] Optional, such as Figure 7As shown, the electronic device 1100 further includes: a touch screen 1103, a radio frequency circuit 1104, an audio circuit 1105, an input unit 1106, and a power supply 1107. The processor 1101 is electrically connected to the touch screen 1103, the radio frequency circuit 1104, the audio circuit 1105, the input unit 1106, and the power supply 1107, respectively. Those skilled in the art can understand that Figure 7 The electronic device structure shown in the figure does not constitute a limitation of the electronic device, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently.

[0158] The touch display screen 1103 can be used to display a graphical user interface and receive operation instructions generated by the user acting on the graphical user interface. The touch display screen 1103 may include a display panel and a touch panel. Among them, the display panel can be used to display information input by the user or information provided to the user and various graphical user interfaces of the electronic device, and these graphical user interfaces can be composed of graphics, text, icons, videos and any combination thereof. Optionally, the display panel can be configured in the form of a liquid crystal display (LCD, Liquid Crystal Display), an organic light-emitting diode (OLED, Organic Light-EmittingDiode) and the like. The touch panel can be used to collect the user's touch operation on or near it (such as the user uses any suitable object or attachment such as a finger, a stylus, etc. on the touch panel or near the touch panel), and generate corresponding operation instructions, and the operation instructions execute corresponding programs. Optionally, the touch panel may include two parts: a touch detection device and a touch controller. Among them, the touch detection device detects the user's touch orientation, detects the signal brought by the touch operation, and transmits the signal to the touch controller; the touch controller receives the touch information from the touch detection device, converts it into the touch point coordinates, and then sends it to the processor 1101, and can receive the command sent by the processor 1101 and execute it. The touch panel can cover the display panel. When the touch panel detects a touch operation on or near it, it is transmitted to the processor 1101 to determine the type of touch event, and then the processor 1101 provides a corresponding visual output on the display panel according to the type of touch event. In an embodiment of the present application, the touch panel and the display panel can be integrated into the touch display screen 1103 to realize the input and output functions. However, in some embodiments, the touch panel and the touch panel can be used as two independent components to realize the input and output functions. That is, the touch display screen 1103 can also be used as a part of the input unit 1106 to realize the input function.

[0159] The radio frequency circuit 1104 may be used to send and receive radio frequency signals, so as to establish wireless communication with a network device or other electronic devices through wireless communication, and to send and receive signals between the network device or other electronic devices.

[0160] The audio circuit 1105 can be used to provide an audio interface between the user and the electronic device through a speaker and a microphone. The audio circuit 1105 can transmit the electrical signal converted from the received audio data to the speaker, which is converted into a sound signal for output; on the other hand, the microphone converts the collected sound signal into an electrical signal, which is received by the audio circuit 1105 and converted into audio data, and then the audio data is output to the processor 1101 for processing, and then sent to another electronic device through the radio frequency circuit 1104, or the audio data is output to the memory 1102 for further processing. The audio circuit 1105 may also include an earplug jack to provide communication between an external headset and an electronic device.

[0161] The input unit 1106 may be used to receive input numbers, character information or user feature information (such as fingerprint, iris, facial information, etc.), and generate keyboard, mouse, joystick, optical or trackball signal input related to user settings and function control.

[0162] The power supply 1107 is used to supply power to various components of the electronic device 1100. Optionally, the power supply 1107 can be logically connected to the processor 1101 through a power management device, so as to manage charging, discharging, and power consumption through the power management device. The power supply 1107 can also include one or more DC or AC power supplies, recharging devices, power failure detection circuits, power converters or inverters, power status indicators, and other arbitrary components.

[0163] although Figure 7 Not shown, the electronic device 1100 may also include a camera, a sensor, a wireless fidelity module, a Bluetooth module, etc., which will not be described in detail here.

[0164] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0165] A person of ordinary skill in the art will appreciate that all or part of the steps in the various methods of the above embodiments may be completed by instructions, or by controlling related hardware through instructions. The instructions may be stored in a computer-readable storage medium and loaded and executed by a processor.

[0166] To this end, an embodiment of the present application provides a computer-readable storage medium, in which a plurality of computer programs are stored, and the computer program can be loaded by a processor to execute any power supply test system provided in the embodiment of the present application. The computer program can execute the power supply test system, and the specific implementation can refer to the previous embodiment, which will not be repeated here.

[0167] The computer-readable storage medium may include: a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

[0168] Since the computer program stored in the computer-readable storage medium can execute any power supply test system provided in the embodiments of the present application, the beneficial effects that can be achieved by any power supply test system provided in the embodiments of the present application can be achieved. Please refer to the previous embodiments for details and will not be repeated here.

[0169] According to one aspect of the present application, a computer program product or a computer program is also provided, the computer program product or the computer program including computer instructions, the computer instructions being stored in a computer-readable storage medium. A processor of an electronic device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the electronic device executes the methods provided in various optional implementations of the above embodiments.

[0170] In the above-mentioned vacuum pump parameter transmission device, computer-readable storage medium, electronic device, and computer program product embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments. Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working process and beneficial effects of the above-mentioned vacuum pump parameter transmission device, computer-readable storage medium, computer program product, electronic device and its corresponding units can refer to the description of the power supply test system in the above embodiment, and will not be repeated here.

[0171] The power supply testing system, electronic device and computer program product provided in the embodiments of the present application are introduced in detail above. The principles and implementation methods of the present application are explained in this article using specific examples. The description of the above embodiments is only used to help understand the method of the present application and its core idea. At the same time, for technicians in this field, according to the ideas of the present application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A power supply testing system, characterized in that: The power supply test system comprises: a server and a test device, wherein: The server determines, in response to a test application of the power supply under test, a test requirement of the power supply under test and at least two test items corresponding to the test requirement; The server determines, according to the project type of the test project, a test equipment set and a test equipment sequence corresponding to the tested power supply; The server sends a control instruction to each test device in the test device sequence according to a driver corresponding to the test device; The testing device tests the test items corresponding to the tested power supply in response to the control instruction sent by the server, obtains the test results corresponding to each of the test items, and sends the test results to the server; The server receives the test result sent by each of the test devices, and generates a test report according to each of the test results.

2. The power supply testing system according to claim 1, characterized in that: The server determines, according to the project type of the test project, a test equipment set and a test equipment sequence corresponding to the tested power supply, including: The server determines a set of test equipment corresponding to the tested power supply according to the project type of the test project and a preset mapping relationship between the project type and the test equipment; The server obtains, according to the model information of the tested power supply, historical test data of each test device in the test device set for the power supply of the model information; The server sorts the test device set according to the historical test data corresponding to each test device to obtain a test device sequence.

3. The power supply testing system according to claim 1, characterized in that: The server sends a control instruction to each test device in the test device sequence according to a driver corresponding to the test device, including: The server selects one test device in the test device sequence in turn, and determines a corresponding driver according to the test device; the driver includes a test item sequence corresponding to the test device. The server sends a control instruction to the test device according to the driver program, and controls the test device to execute each test item in the test item sequence in sequence.

4. The power supply testing system according to claim 3, characterized in that: Before the server sequentially selects a test device from the test device sequence and determines a corresponding driver according to the test device, the server further includes: The server determines, for each of the test devices, a set of test items for the tested power supply by the test device; The server determines the importance of each test item in the test item set according to the historical test data of the test device for each test item; The server determines the degree of correlation between each of the test items according to the correlation factor corresponding to each of the test items; the correlation factor includes at least one of functional relevance, physical characteristics and standard specifications; The server generates a test item sequence according to the importance of each test item and the correlation between each test item; The server generates a corresponding driver for the test device based on the test item sequence.

5. The power supply testing system according to claim 4, characterized in that: The server generates a corresponding driver for the test device based on the test item sequence, including: The server determines the test parameters and test conditions of the tested power supply for the test device according to the tested power supply and the test requirements; the test parameters include at least one of a test mode, a measurement range, a data acquisition accuracy and a test duration; and the test conditions include at least one of temperature, humidity, electromagnetic interference and mechanical vibration; The server adjusts the initialization settings in the driver template corresponding to each of the test devices according to the test parameters to obtain a first reference driver template corresponding to each of the test devices; The server adds an error handling mechanism to the first reference driver template according to the test condition to obtain a second reference driver template corresponding to the test device; The server generates a driver corresponding to the test device according to the second reference driver template and the test item sequence.

6. The power supply testing system according to claim 3, characterized in that: Before the server sends a control instruction to the test device according to the driver to control the test device to sequentially execute each test item in the test item sequence, the server further includes: The server receives the connection status of the tested power source sent by the test device; If the connection status of the tested power supply is normal, the server executes the step of sending a control instruction to the test device according to the driver program to control the test device to execute each test item in the test item sequence in sequence.

7. The power supply testing system according to claim 1, characterized in that: After the testing device tests the test items corresponding to the tested power supply in response to the control instruction sent by the server and obtains the test result corresponding to each of the test items, the test device further includes: If the test result is that the test fails, the server determines the target test item corresponding to the test result and issues an alarm; When receiving the retest instruction, the server retests the target test item on the power supply under test; When the test result of the target test item is passed, the server determines a test item following the target test item in the test item sequence in the driver as a starting test item; The server continues to test the power supply under test based on the initial test item and the driver.

8. The power supply testing system according to claim 1, characterized in that: After the server receives the test result sent by each of the test devices and generates a test report according to each of the test results, the server further includes: If it is determined according to the test report that the tested power supply is a defective product, the server obtains the defective data in the test report; The server determines, based on the bad data, original parameters corresponding to the bad registers in the tested power supply, and calculates target parameters corresponding to the bad registers according to the bad data and the original parameters; The server replaces the original parameters with the target parameters to repair the bad register.

9. The power supply testing system according to claim 8, characterized in that: After the server replaces the original parameter with the target parameter to repair the bad register, the method further includes: The server obtains the failed test items in the test report; The server retests the power supply under test for a preset number of times for the failed test items, and counts the number of times the test passes; The server calculates the test pass rate according to the number of test passes and the preset number of times; If the test pass rate is greater than a preset pass rate, the server determines that the tested power supply is a retested good product.

10. An electronic device, characterized in that: It comprises a power supply testing system as described in any one of claims 1 to 9.

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