Hot plug test device for memory bank maintenance
By designing gears, racks and gear rails in the memory stick test device, and moving the L-shaped lifting arm upwards by moving the downwards of the movable plate, the complex memory stick pulling operation in the prior art is solved, and the simple memory stick pulling operation is realized, which improves the reliability and service life of the equipment.
Patent Information
- Application Number
- CN202510057427.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-13
- Publication Date
- 2025-05-16
AI Technical Summary
The existing memory stick test device operates complex when unplugging the memory stick, which increases operational difficulty and time cost, and may cause physical damage to the memory stick and slots.
A hot-swap test device for memory stick maintenance is designed, using gears, racks and gear rails to use the combination of gears, racks and gear rails. The L-shaped lifting arm is stuck in the groove and moved upward through the downward movement of the movable plate, thereby exerting a lifting effect on both sides of the memory stick and simplifying the pull-out operation.
It realizes simple unplugging of memory sticks, reduces operation difficulty and time cost, and reduces physical damage to memory sticks and slots, improving the reliability and service life of the equipment.
Smart Images

Figure CN120011155A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of memory bar testing, in particular to a hot plug testing device for repairing a memory bar. Background Art
[0002] The Chinese patent with the publication number CN115376605A discloses an easy-to-plug test device for memory stick processing, including a bottom plate, a side plate, a detection circuit board body and a mounting plate; two side plates are provided, and the two side plates are respectively provided on the lateral sides of the bottom plate, and the upper ends of the side plates are located above the bottom plate; the detection circuit board body is provided on the bottom plate and between the two side plates, and a memory stick socket for inserting the memory stick to be tested is provided on the detection circuit board body. The invention can avoid damage to the memory stick and reduce damage to the equipment. However, in the existing device, there are significant deficiencies in the operation process. Specifically, when the memory stick needs to be pulled out from the slot, the traditional method relies on the operator to directly pinch the middle part of the memory stick by hand to pull it out. However, in actual operation, the memory stick is often tightly installed in the slot, making the pulling process extremely difficult. In order to overcome this problem, the operator usually needs to try to pull one side of the memory stick upward first, and then turn to the other side to pull it out, and repeatedly adjust the angle and strength until the memory stick is finally completely pulled out. This operation process is not only cumbersome and complicated, but also greatly increases the difficulty and time cost of the operation. It may also cause unnecessary physical damage to the memory stick and its slot, reducing the reliability and service life of the equipment. Summary of the invention
[0003] The present invention aims to solve the technical problems existing in the prior art; to this end, the present invention provides a hot-swap test device for repairing a memory bar.
[0004] The purpose of the present invention can be achieved through the following technical solutions:
[0005] A hot-swap test device for repairing a memory stick comprises a test machine body, the test machine body is provided with a slot for detecting the memory stick, both sides of the memory stick are provided with grooves, and the test machine body is provided with a fixing plate.
[0006] The fixing plate is provided with two L-shaped lifting arms capable of moving horizontally and vertically. The L-shaped lifting arms cooperate with the grooves to pull the memory stick out of the slots. One end of the L-shaped lifting arms is provided with an inclined surface.
[0007] The dustproof mechanism is arranged at the outside of the slot, and the dustproof mechanism prevents dust from falling into the slot.
[0008] The ejection mechanism is arranged on the fixing plate and is used for pushing the pulled-out memory stick off the L-shaped lifting arm.
[0009] As a further solution of the present invention: two support plates are fixedly connected to the fixed plate, and gears are rotatably connected between the two support plates. A limit assembly for limiting the L-shaped lifting arm is arranged above the fixed plate, and the L-shaped lifting arm can be reset on the limit assembly, and the limit assembly is provided with a rack meshing with the gear.
[0010] As a further solution of the present invention: a resettable movable plate is arranged above the fixed plate, a rack matching the gear is arranged on the side of the movable plate close to the gear, an inclined surface is arranged on the side of the movable plate close to the L-shaped lifting arm, and the fixed plate is attached to the testing machine body.
[0011] As a further solution of the present invention: the length of the rack track is greater than the length of the rack, and the lowest point of the rack track is located above the gear.
[0012] As a further solution of the present invention: the limiting assembly includes two support rods fixedly connected to a fixed plate, a fixing frame is slidably connected between the two support rods, a support block is fixedly connected to the support rods, a support sleeve is fixedly connected to the fixing frame, and the support sleeve is slidably connected to the L-shaped lifting arm.
[0013] As a further solution of the present invention: the top of the fixed plate is fixedly connected to a vertical plate, the top of the vertical plate is fixedly connected to an iron plate, a movable groove is opened inside the movable plate, the iron plate and the movable groove are slidingly connected, and a spring 2 is fixedly connected between the iron plate and the movable groove.
[0014] As a further solution of the present invention: the movable groove is narrow at the top and wide at the bottom, a magnetic block is fixedly connected in the movable groove, the vertical plate is slidably connected to the movable plate, and the top of the vertical plate is located in the movable groove.
[0015] As a further solution of the present invention: the dustproof mechanism includes a partition detachably connected to the testing machine body, the partition is rotatably connected to a dust cover, the partition is fixedly connected to a folding plate, the folding plate is fitted with the dust cover, and the partition is fixedly connected to the fixed plate.
[0016] As a further solution of the present invention: the ejection mechanism includes a fixed seat and a spring three fixedly connected to the fixed plate, the fixed seat is provided with a resettable inclined plane block one, the inclined plane block one is fixedly connected with a folding rod, the spring three is fixedly connected with an inclined plane block two, and the inclined plane block two is fixedly connected with a downward pressure rod.
[0017] As a further solution of the present invention: a limiting groove is provided on a side of the movable plate away from the gear, both sides of the limiting groove cavity are opened, and the limiting groove is slidably connected to the lower pressure rod.
[0018] Compared with the prior art, the present invention has the following beneficial effects:
[0019] 1. The present application uses a gear, a rack and a rack rail in coordination. By moving the movable plate downward, the L-shaped lifting arm is stuck in the groove and moves upward. By applying a lifting action on both sides of the memory stick at the same time, the memory stick can be pulled out of the slot. The operation is simple and convenient to use.
[0020] 2. The present application sets up a dustproof mechanism, which can be used to block the outside of the slot. In this way, when the test machine is not in use, dust can be prevented from falling into the slot, avoiding poor contact during subsequent tests.
[0021] 3. The present application sets up a push-out mechanism. After the memory stick is pulled out of the slot, the circular plate is pressed on the downward pressure rod. With the cooperation of the inclined block 2, the spring 4 and the inclined block 1, the folding rod will push the memory stick off the L-shaped lifting arm, thereby achieving automatic detachment. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] Figure 1 A perspective view of the present invention;
[0023] Figure 2 It is a partial three-dimensional cross-sectional view of the present invention;
[0024] Figure 3 For the present invention Figure 2 A partial enlarged view of the middle A;
[0025] Figure 4 A three-dimensional diagram of the memory bar, L-shaped lifting arm, ejection mechanism and limit assembly of the present invention;
[0026] Figure 5 A three-dimensional diagram of the L-shaped lifting arm, the ejection mechanism and the limit assembly of the present invention;
[0027] Figure 6 A three-dimensional diagram of the ejection mechanism and the movable plate of the present invention;
[0028] Figure 7 is a three-dimensional cross-sectional view of the movable panel of the present invention;
[0029] Figure 8 A three-dimensional diagram of the limit assembly and the L-shaped lifting arm of the present invention;
[0030] Fig. 9 It is a front view of the gear, rack and rack rail of the present invention;
[0031] Fig.10 It is a three-dimensional diagram of the dust-proof mechanism of the present invention.
[0032] In the figure: 1. test machine body; 2. memory stick; 3. slot; 4. groove; 5. fixed plate; 6. L-shaped lifting arm; 7. dustproof mechanism; 71. partition; 72. dust cover; 73. folding plate; 8. ejection mechanism; 81. fixed seat; 82. spring three; 83. inclined block one; 84. pressing rod; 85. folding rod; 86. inclined block two; 9. support plate; 10. gear; 11. limit assembly; 111. support rod; 112. fixed frame; 113. support block; 114. support sleeve; 12. rack; 13. movable plate; 14. rack; 15. first connecting plate; 16. second connecting plate; 17. spring one; 18. vertical plate; 19. iron plate; 20. movable groove; 21. magnetic block; 22. spring two; 23. round plate; 24. slide bar; 25. spring four; 26. limit groove. DETAILED DESCRIPTION
[0033] The technical solution of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0034] Embodiment 1
[0035] See also Figure 1-Figure 9 As shown, the present application provides a hot-swap test device for repairing a memory stick, comprising a test machine body 1, on which a slot 3 for detecting a memory stick 2 is provided, grooves 4 are provided on both sides of the memory stick 2, and a fixing plate 5 is provided on the test machine body 1;
[0036] The fixing plate 5 is provided with two L-shaped lifting arms 6 capable of horizontal and vertical movement. The L-shaped lifting arms 6 cooperate with the groove 4 to be used for pulling the memory stick 2 out of the slot 3. One end of the L-shaped lifting arm 6 is provided with an inclined surface.
[0037] A dustproof mechanism 7 is arranged outside the slot 3, and the dustproof mechanism 7 prevents dust from falling into the slot 3;
[0038] The ejection mechanism 8 is disposed on the fixing plate 5 , and is used to push the pulled-out memory stick 2 off the L-shaped lifting arm 6 .
[0039] Two support plates 9 are fixedly connected to the fixed plate 5, and a gear 10 is rotatably connected between the two support plates 9. A limit assembly 11 for limiting the L-shaped lifting arm 6 is arranged above the fixed plate 5, and the L-shaped lifting arm 6 can be reset on the limit assembly 11. The limit assembly 11 is provided with a rack 12 meshing with the gear 10.
[0040] A repositionable movable plate 13 is arranged above the fixed plate 5, and a rack 14 matching the gear 10 is arranged on the side of the movable plate 13 close to the gear 10, and an inclined surface is arranged on the side of the movable plate 13 close to the L-shaped lifting arm 6, and the fixed plate 5 is attached to the testing machine body 1. After the test, the circular plate 23 is pressed, so that the circular plate 23 drives the movable plate 13 to descend, and the inclined surface between the L-shaped lifting arm 6 and the movable plate 13 and the spring 17 in tension are used to slide the L-shaped lifting arm 6 on the support sleeve 114, and finally get stuck in the groove 4. As the movable plate 13 continues to descend, the rack 14 gradually meshes with the gear 10, thereby driving the rack 12 to rise, and then driving the L-shaped lifting arm 6 to rise through the limit assembly 11, so that the memory stick 2 is pulled out of the slot 3 by the two L-shaped lifting arms 6.
[0041] The length of the rack rail 14 is greater than that of the rack 12 , and the lowest point of the rack rail 14 is located above the gear 10 .
[0042] The limiting assembly 11 includes two support rods 111 fixedly connected to the fixed plate 5, a fixing frame 112 is slidably connected between the two support rods 111, a support block 113 is fixedly connected to the support rods 111, a support sleeve 114 is fixedly connected to the fixing frame 112, and the support sleeve 114 is slidably connected to the L-shaped lifting arm 6.
[0043] The L-shaped lifting arm 6 is fixedly connected with a first connecting plate 15 , the supporting sleeve 114 is fixedly connected with a second connecting plate 16 , and a spring 17 is fixedly connected between the first connecting plate 15 and the second connecting plate 16 , and the spring 17 is in a stretched state.
[0044] The top of the fixed plate 5 is fixedly connected to a vertical plate 18, the top of the vertical plate 18 is fixedly connected to an iron plate 19, a movable groove 20 is opened inside the movable plate 13, the iron plate 19 and the movable groove 20 are slidably connected, a spring 22 is fixedly connected between the iron plate 19 and the movable groove 20, and the top of the movable plate 13 is fixedly connected to a circular plate 23.
[0045] The movable groove 20 is narrow at the top and wide at the bottom. A magnetic block 21 is fixedly connected in the movable groove 20. The vertical plate 18 is slidably connected to the movable plate 13, and the top of the vertical plate 18 is located in the movable groove 20. By providing the magnetic block 21 and the iron plate 19, when the spring 22 is compressed and restored to its original state, the magnetic block 21 is used to absorb the iron plate 19, so that the movable plate 13 can be directly fixed to prevent the movable plate 13 from moving with the spring 22, thereby preventing the L-shaped lifting arm 6 from moving, so that the L-shaped lifting arm 6 will not hinder people from inserting the memory stick 2 into the slot 3.
[0046] Embodiment 2
[0047] Based on Example 1, see Figure 1 , Figure 2 , Figure 3 and Fig.10 shown.
[0048] The dustproof mechanism 7 includes a partition 71 detachably connected to the test machine body 1, a dust cover 72 is rotatably connected to the partition 71, a folding plate 73 is fixedly connected to the partition 71, the folding plate 73 is fitted with the dust cover 72, and the partition 71 is fixedly connected to the fixed plate 5. Before testing the memory stick 2, the dust cover 72 is turned over on the partition 71 to expose the slot 3 and its adjacent components. After that, the memory stick 2 is inserted into the slot 3, and the memory stick 2 is tested using the test machine body 1. At this time, the L-shaped lifting arm 6 and the groove 4 are on the same horizontal line. By setting up the dustproof mechanism 7, the dustproof mechanism 7 can be used to block the outside of the slot 3, so that when the test machine is not in use, dust can be prevented from falling into the slot 3, thereby avoiding poor contact during subsequent testing.
[0049] Embodiment 3
[0050] Based on Example 1, see Figure 1 , Figure 4 , Figure 5 and Figure 6 shown.
[0051] The ejection mechanism 8 includes a fixed seat 81 and a spring three 82 fixedly connected to the fixed plate 5, the fixed seat 81 is provided with a resettable inclined plane block 1 83, the inclined plane block 1 83 is fixedly connected with a folding rod 85, the spring three 82 is fixedly connected with an inclined plane block 2 86, and the inclined plane block 2 86 is fixedly connected with a pressing rod 84. When the memory stick 2 is completely pulled out of the slot 3, the rack 12 moves to the highest point, and the movable plate 13 continues to descend. As the movable plate 13 continues to descend (as the gear 10 rotates, the gear 10 will reciprocately contact and disengage from part of the rack 12, thereby causing the rack 12 to reciprocate up and down within a very small range), the circular plate 23 will contact the down-pressing rod 84 and press down the down-pressing rod 84, thereby causing the down-pressing rod 84 to drive the inclined plane block 2 86 to descend and compress the spring 3 82. By utilizing the interaction between the inclined plane block 2 86 and the inclined plane block 1 83, and the action of the compressed spring 4 25, the inclined plane block 1 83 will drive the folding rod 85 to move and push the memory stick 2, thereby pushing the memory stick 2 off the L-shaped lifting arm 6, thereby causing the memory stick 2 to automatically detach. At this time, people can just hold the memory stick 2 with their hands.
[0052] A slide rod 24 is slidably connected to the fixed seat 81, and the slide rod 24 is fixedly connected to the inclined surface block 83. A spring 25 is sleeved on the outer surface of the slide rod 24, and the spring 25 is in a compressed state. The spring 25 is fixedly connected to the inclined surface block 83 and the fixed seat 81 respectively.
[0053] A limiting groove 26 is formed on one side of the movable plate 13 away from the gear 10 . Both sides of the limiting groove 26 are open. The limiting groove 26 is slidably connected to the pressing rod 84 .
[0054] Embodiment 4
[0055] In combination with Embodiment 1, Embodiment 2 and Embodiment 3, see Figure 1 and Figure 2 shown.
[0056] By using the gear 10, the rack 12 and the rack rail 14 in coordination, and by moving the movable plate 13 downward, the L-shaped lifting arm 6 is stuck in the groove 4 and moves upward. By applying a lifting action on both sides of the memory stick 2 at the same time, the memory stick 2 can be pulled out of the slot 3. The operation is simple and convenient to use.
[0057] The working principle of the present invention is as follows: before testing the memory stick 2, the dust cover 72 is turned over on the partition 71, so that the slot 3 and its adjacent components are exposed. After that, the memory stick 2 is inserted into the slot 3, and the memory stick 2 is tested using the test machine body 1. At this time, the L-shaped lifting arm 6 and the groove 4 are on the same horizontal line. After the test, the circular plate 23 is pressed, so that the circular plate 23 drives the movable plate 13 to descend, and the inclined surface between the L-shaped lifting arm 6 and the movable plate 13 and the spring 17 in tension are used to slide the L-shaped lifting arm 6 on the support sleeve 114, and finally get stuck in the groove 4. As the movable plate 13 continues to descend, the rack 14 gradually meshes with the gear 10, thereby driving the rack 12 to rise, and then driving the L-shaped lifting arm 6 to rise through the limit assembly 11, so that the memory stick 2 is pulled out of the slot 3 using the two L-shaped lifting arms 6. When the memory stick 2 is completely pulled out of the slot 3, the rack 12 moves to the highest point, and the movable plate 13 continues to descend. As the movable plate 13 continues to descend (as the gear 10 rotates, the gear 10 will reciprocately contact and disengage from part of the rack 12, thereby causing the rack 12 to reciprocate up and down within a very small range), the circular plate 23 will contact the down-pressing rod 84 and press down the down-pressing rod 84, thereby causing the down-pressing rod 84 to drive the inclined plane block 2 86 to descend and compress the spring 3 82. By utilizing the interaction between the inclined plane block 2 86 and the inclined plane block 1 83, and the action of the compressed spring 4 25, the inclined plane block 1 83 will drive the folding rod 85 to move and push the memory stick 2, thereby pushing the memory stick 2 off the L-shaped lifting arm 6, thereby causing the memory stick 2 to automatically detach. At this time, people can just hold the memory stick 2 with their hands. When the movable plate 13 is lowered, the spring 22 is forced into a compressed state, and the iron plate 19 is separated from the magnetic block 21. After a memory bar 2 is pulled out, the spring 22 will recover, and the iron plate 19 and the magnetic block 21 will fit each other. After a memory bar 2 is pushed down from the L-shaped lifting arm 6, the movable plate 13 recovers, and the L-shaped lifting arm 6 recovers under the interaction between the L-shaped lifting arm 6 and the movable plate 13, as well as the action of the spring 1 17. After a memory bar 2 is pushed down from the L-shaped lifting arm 6, the spring 3 82 recovers, thereby driving the inclined plane block 2 86 to recover, and then using the interaction between the inclined plane block 2 86 and the inclined plane block 1 83, the spring 4 25 is forced into a compressed state, and the folding rod 85 recovers.
[0058] The above embodiments are only used to illustrate the technical method of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical method of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical method of the present invention.
Claims
1. A hot-swap test device for repairing a memory stick, comprising a test machine body (1), the test machine body (1) being provided with a slot (3) for testing a memory stick (2), both sides of the memory stick (2) being provided with grooves (4), characterized in that: A fixing plate (5) is provided on the testing machine body (1); The fixing plate (5) is provided with two L-shaped lifting arms (6) capable of moving horizontally and vertically. The L-shaped lifting arms (6) cooperate with the groove (4) to pull the memory stick (2) out of the slot (3). One end of the L-shaped lifting arm (6) is provided with an inclined surface. A dustproof mechanism (7) is arranged outside the slot (3), and the dustproof mechanism (7) prevents dust from falling into the slot (3); The ejection mechanism (8) is arranged on the fixing plate (5), and the ejection mechanism (8) is used to push the pulled-out memory stick (2) off the L-shaped lifting arm (6).
2. A hot-swap test device for repairing a memory stick according to claim 1, characterized in that: Two support plates (9) are fixedly connected to the fixed plate (5), and a gear (10) is rotatably connected between the two support plates (9). A limit assembly (11) for limiting the L-shaped lifting arm (6) is arranged above the fixed plate (5), and the L-shaped lifting arm (6) can be reset on the limit assembly (11). The limit assembly (11) is provided with a rack (12) meshing with the gear (10).
3. A hot-swap test device for repairing a memory stick according to claim 2, characterized in that: A repositionable movable plate (13) is arranged above the fixed plate (5); a gear rail (14) adapted to the gear (10) is arranged on the side of the movable plate (13) close to the gear (10); an inclined surface is arranged on the side of the movable plate (13) close to the L-shaped lifting arm (6); and the fixed plate (5) is attached to the testing machine body (1).
4. A hot-swap test device for repairing a memory stick according to claim 3, characterized in that: The length of the rack track (14) is greater than the length of the rack (12), and the lowest point of the rack track (14) is located above the gear (10).
5. The hot-swap test device for repairing a memory stick according to claim 2, characterized in that: The limiting assembly (11) comprises two support rods (111) fixedly connected to a fixed plate (5); a fixing frame (112) is slidably connected between the two support rods (111); a support block (113) is fixedly connected to the support rods (111); a support sleeve (114) is fixedly connected to the fixing frame (112); and the support sleeve (114) is slidably connected to the L-shaped lifting arm (6).
6. The hot-swap test device for repairing a memory stick according to claim 3, characterized in that: The top of the fixed plate (5) is fixedly connected to a vertical plate (18), the top of the vertical plate (18) is fixedly connected to an iron plate (19), a movable groove (20) is provided inside the movable plate (13), the iron plate (19) and the movable groove (20) are slidably connected, and a second spring (22) is fixedly connected between the iron plate (19) and the movable groove (20).
7. A hot-swap test device for repairing a memory stick according to claim 6, characterized in that: The movable groove (20) is narrow at the top and wide at the bottom. A magnetic block (21) is fixedly connected in the movable groove (20). The vertical plate (18) is slidably connected to the movable plate (13), and the top of the vertical plate (18) is located in the movable groove (20).
8. The hot-swap test device for repairing a memory stick according to claim 1, characterized in that: The dustproof mechanism (7) comprises a partition (71) detachably connected to the testing machine body (1); a dust cover (72) is rotatably connected to the partition (71); a folding plate (73) is fixedly connected to the partition (71); the folding plate (73) is fitted with the dust cover (72); and the partition (71) is fixedly connected to the fixed plate (5).
9. The hot-swap test device for repairing a memory stick according to claim 1, characterized in that: The ejection mechanism (8) comprises a fixed seat (81) and a spring three (82) fixedly connected to the fixed plate (5); a resettable inclined plane block one (83) is arranged on the fixed seat (81); a folding rod (85) is fixedly connected to the inclined plane block one (83); a inclined plane block two (86) is fixedly connected to the spring three (82); and a downward pressing rod (84) is fixedly connected to the inclined plane block two (86).
10. The hot-swap test device for repairing a memory stick according to claim 3, characterized in that: A limiting groove (26) is provided on a side of the movable plate (13) away from the gear (10), both sides of the groove cavity of the limiting groove (26) are open, and the limiting groove (26) is slidably connected to the lower pressing rod (84).
Citation Information
Patent Citations
Easily-pluggable testing device for memory bank processing
CN115376605A