Heliostat light spot forming inspection method and heliostat light spot forming inspection system

Abstract

The invention provides a heliostat light spot forming inspection method. The heliostat light spot forming inspection method comprises the steps that a to-be-measured heliostat is installed on a placing platform located in a darkroom; the light source equipment is started, the light source equipment projects light rays to the heliostat to be measured, and the heliostat to be measured reflects the light rays to the light spot target located in the darkroom; the acquisition device detects and acquires light spot data on the light spot target and transmits the light spot data to the analysis device; the analysis device analyzes the forming state of the light spots and compares the light spot forming state obtained through analysis with the simulated light spot form obtained through simulation so as to check the light spot coincidence degree. The invention further provides a heliostat light spot forming inspection system. The heliostat light spot forming inspection system comprises a darkroom, a placement platform, light source equipment, a light spot target, an acquisition device and an analysis device. According to the invention, the detection is carried out within the hint, the to-be-detected heliostat is in the installation state in the light spot forming detection process, the attitude of the heliostat in the state accords with the installation attitude in an actual application scene, the forming state of the light spot better accords with reality, and errors are reduced.

Description

Technical Field

[0001] The present application belongs to the field of heliostats, and in particular, relates to a heliostat light spot forming inspection method and a heliostat light spot forming inspection system. Background Art

[0002] With the rapid development of science and technology, the demand for solar thermal power generation has increased significantly. Heliostats are key components of tower solar thermal power stations, which are used to reflect and focus sunlight onto the heat-absorbing tower installed in the center of the mirror field, thereby heating the heat-conducting medium, converting solar energy into thermal energy for storage, and finally converting it into electrical energy through heat exchange. At the same time, the production and assembly accuracy of heliostats is one of the factors affecting the efficiency of solar thermal power generation. However, after the heliostat products are produced and assembled according to the designed dimensions, due to certain errors in the production and assembly process, the accuracy of the heliostat products and the forming state of the light spot cannot be guaranteed to be consistent with the designed dimensions and theoretical light spot.

[0003] The related technology uses a point sampling and simulation method. The heliostat is placed on a tooling on a mounting platform. The height differences at different positions of the mirror are measured, and the height difference data are input into a computer for light spot simulation analysis. The final forming state of the light spot is calculated using a formula to check the degree of compliance of the light spot. This method has a large measurement error. Summary of the invention

[0004] This application aims to solve at least one of the technical problems in the related art to a certain extent. To this end, the main technical solutions adopted in this application include:

[0005] In a first aspect, the present application provides a method for inspecting a heliostat spot formation, comprising:

[0006] The heliostat to be measured is installed on a placement platform in a dark room;

[0007] The light source device is started, and the light source device projects light onto the heliostat to be measured, and the heliostat to be measured reflects the light onto the light spot target located in the dark room;

[0008] The acquisition device detects and acquires the light spot data on the light spot target surface, and transmits the light spot data to the analysis device;

[0009] The analyzing device analyzes the forming state of the light spot, and compares the formed state of the light spot obtained by the analysis with the simulated light spot shape obtained by simulation to check the conformity of the light spot.

[0010] The heliostat light spot formation inspection method provided in the present application performs the inspection in a hint, and the heliostat to be measured is in an installation state during the light spot formation inspection process. In this state, the posture of the heliostat conforms to the installation posture in the actual application scenario, and the light spot formation state is more in line with reality, reducing errors.

[0011] In a second aspect, the present application provides a heliostat spot forming inspection system, comprising a darkroom, a placement platform, a light source device, a spot target, a collection device and an analysis device, wherein the placement platform, the light source device, the spot target and the collection device are all located in the darkroom, the placement platform is used to fix the heliostat to be measured, the light source device is used to project light to the heliostat to be measured, and the collection device is used to collect spot data reflected from the heliostat to be measured to the spot target and transmit it to the analysis device.

[0012] The heliostat light spot formation inspection system provided in the present application also uses a darkroom to inspect the heliostat in an installed state, so that the formation state of the light spot is more in line with reality. In addition, the data is collected and analyzed by a collection device and an analysis device, which further reduces the error. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative labor.

[0014] Figure 1 A structural diagram of a heliostat spot forming inspection system provided in an embodiment of the present application;

[0015] Figure 2 A front view of a heliostat spot forming inspection system provided in an embodiment of the present application;

[0016] Figure 3 A structural diagram of a placement platform provided in an embodiment of the present application;

[0017] Figure 4 This is a rear view of the heliostat spot formation inspection system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0018] In order to better understand the technical solution of the present application, the embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0019] It should be clear that the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present application.

[0020] Heliostats are key components of tower solar thermal power stations. They are used to reflect and focus sunlight onto a heat-absorbing tower installed in the center of the mirror field, thereby heating the heat-conducting medium, converting solar energy into thermal energy for storage, and finally converting it into electrical energy through heat exchange. With the rapid development of science and technology, the demand for solar thermal power generation has increased significantly, and power generation efficiency has become a problem that needs to be solved at present. To increase power generation efficiency, it is necessary to increase the focusing performance of the heliostat. The production and assembly accuracy of the heliostat is one of the factors that affect the focusing performance of the heliostat. However, after the heliostat products are produced and assembled according to the designed dimensions, due to certain errors in the production and assembly process, the accuracy of the heliostat products and the forming state of the light spot cannot be guaranteed to be consistent with the designed dimensions and theoretical light spot. Therefore, it is necessary to inspect the light spot forming condition of the heliostat products after assembly.

[0021] In the related technology, the method of point sampling plus simulation is adopted. The heliostat is on the tooling of the installation platform. By measuring the height difference of different positions of the mirror surface, these height difference data are input into the computer of the light spot simulation analysis, and the final forming state of the light spot is calculated by the formula to check the degree of conformity of the light spot. Since the data collection is carried out by manual / automatic point sampling, certain errors will inevitably occur in the collection process, which will affect the final analysis results of the software; and it is an indirect measurement method, and the forming state of the light spot cannot be observed intuitively; in addition, the column of the heliostat has not been installed when the point is collected, so it is measured on the tooling of the installation platform, and the self-weight deformation state caused by the installation of the column cannot be taken into account when measuring the point, which will cause the light spot analyzed by the point sampling to be inconsistent with the actual light spot of the mirror field. Therefore, it is necessary to propose an inspection system to check whether the light spot forming condition of the assembled heliostat product meets the design size and theoretical light spot shape.

[0022] To do this, see Figures 1 to 4 The present embodiment provides a heliostat spot forming inspection system, comprising a darkroom 1, a placement platform 2, a light source device 3, a spot target 4, a collection device 5 and an analysis device 6, wherein the placement platform 2, the light source device 3, the spot target 4 and the collection device 5 are all located in the darkroom 1, the placement platform 2 is used to fix the heliostat to be measured, the light source device 3 is used to project light to the heliostat to be measured, and the collection device 5 is used to collect spot data reflected by the heliostat to be measured to the spot target 4 and transmit it to the analysis device 6.

[0023] The heliostat spot forming inspection system of this embodiment is tested by placing the heliostat to be measured in a dark room 1. The heliostat to be measured is in an installed state during the spot forming inspection process. The posture of the heliostat in this state is the same as the installation posture in the actual application scenario. The forming state of the spot is more in line with reality. Compared with point measurement on the installation platform, there is no need to consider the self-weight deformation caused by the installation of the column. In addition, the spot is collected in the dark room through the light source device 3, the collection device 5 and the analysis device 6, which reduces the error caused by human measurement, and the measurement result is more in line with reality; compared with the actual measurement in the mirror field, the test cost is greatly reduced.

[0024] In this embodiment, the environment requirements in the darkroom 1 are different from the external environment, and the darkroom illumination is required to be stable. Therefore, the darkroom 1 adopts the Nissan darkroom standard, wherein the wall reflectivity is ≤60%; the ground reflectivity is ≤20%, to prevent inconsistent test results in different time periods due to changes in relative position. In this embodiment, the skeleton structure of the darkroom 1 is not specifically limited, and can be a reinforced concrete structure or a steel structure.

[0025] Please refer again Figure 3 The placement platform 2 includes a platform substrate 21, a linear slide 22, a sliding platform 23 and an electric device 24. The linear slide 22 connects the platform substrate 21 and the sliding platform 23. The sliding platform 23 is used for installing and fixing the heliostat to be measured. The electric device 24 is installed on the platform substrate 21 and connected to the sliding platform 23. The electric device 24 can drive the sliding platform 23 to move along the running direction of the linear slide 22. In this embodiment, the platform substrate 21 is fixed to the bottom plate of the darkroom, the linear slide 22 adopts a heavy-load linear slide, which is installed on the platform substrate 21, and the sliding platform 23 is installed on the linear slide 22. During the inspection process, the heliostat to be measured is installed and fixed on the sliding platform 23. The sliding platform 23 is provided with a positioning installation hole for fixing the heliostat to be measured. The electric device 24 adopts a motor screw driving device, which drives the screw through the motor to drive the sliding platform 23 to make a forward and backward linear motion along the linear slide 22, thereby achieving the purpose of adjusting the position of the heliostat to be measured through the placement platform 2. In this embodiment, the platform base plate 21 and the sliding platform 23 are both made of thickened steel plates to increase the bearing strength of the placement platform 2, thereby improving the installation stability of the heliostat to be measured. Among them, the motor of the electric device 24 is a stepper motor.

[0026] Please refer again Figure 2, the light source device 3 includes a xenon lamp light source 31 and a suspension device 32. The suspension device 32 is installed on the top of the darkroom 1 and is used to install the xenon lamp light source 31. The suspension device 32 can adjust the position and angle of the xenon lamp light source 31. In this embodiment, the light source of the light source device 3 is a xenon lamp. The xenon lamp is a high-brightness light source, and its brightness can reach the daylight level. In particular, its spectral curve is very close to the spectrum of sunlight in nature, and its spectrum is very wide, covering the entire visible spectrum range, making the light it emits closer to natural light, which is very suitable for applications with high color reproduction and color saturation. Compared with other light sources, the xenon lamp has a long lifespan, generally reaching more than thousands of hours, reducing the maintenance cost. In addition, the startup speed of the xenon lamp is very fast, and it can reach the maximum brightness in only a few seconds, and the brightness remains basically unchanged during the entire use process. Compared with traditional bulbs, the xenon lamp is more energy-saving and environmentally friendly. In addition, the xenon lamp has a certain dimming property and can control the brightness by adjusting the current or voltage to adapt to different lighting requirements. In this embodiment, the number of xenon lamp light sources 31 is not specifically limited and is selected according to actual needs. In this embodiment, the illumination surface of the light source device 3 can cover the reflecting mirror surface of the heliostat 100 to be measured, that is, it is required that the illumination surface of the xenon lamp light source 31 can cover the reflecting mirror surface of the heliostat 100 to be measured.

[0027] In this embodiment, the suspension device 32 includes a hoisting frame, a pulley mounting frame and an angle adjuster. The angle adjuster is connected to the hoisting frame through the pulley mounting frame. The hoisting frame is fixed to the top of the darkroom 1. The pulley mounting frame and the hoisting frame adopt a pulley and slide rail cooperation method. The pulley mounting frame can move relative to the hoisting frame to adjust the position of the xenon lamp light source 31, and the angle adjuster can adjust the irradiation angle of the xenon lamp light source 31, which can meet the light source illumination requirements of heliostat products at different angles.

[0028] In this embodiment, the acquisition device 5 is used for the acquisition of light spots, providing a basis for subsequent processing work. The acquisition device 5 uses a digital camera, which is a CCD camera. It can acquire 20 frames of images per second, with a resolution of up to 2 million pixels. Its AVD quantization level is 8 bit. The resolution of the images acquired by the camera is 1626×1236. The lens of the digital camera selects a zoom lens with a focal length of 12mm to 120mm, and in this embodiment, a mounting bracket 51 is provided for the acquisition device 5.

[0029] In this embodiment, the heliostat spot forming inspection system further includes an electric control box 7, which is arranged outside the darkroom 1, and is electrically connected to the light source device 3, the collection device 5 and the analysis device 6. The electric control box 7 provides a stable power supply for the light source device 3, the collection device 5 and the analysis device 6. In addition, the heliostat spot forming inspection system further includes a ventilation device 8, which can connect the inside and outside of the darkroom 1, and the ventilation device 8 is located above the light source device 3. More specifically, the ventilation device 8 is directly opposite to the light source device 3, and can be located above the light source device 3, or on the side wall of the darkroom 1 beside the light source device 3. When it is necessary to cool down and dissipate the heat of the light source device 3, the ventilation device 8 can be started to cool down and dissipate the heat of the light source device 3, and the darkroom 1 can be cooled at the same time. In this embodiment, the analysis device 6 can be arranged in the darkroom 1 or outside the darkroom 1, and it can be selected according to actual needs.

[0030] Furthermore, the heliostat spot forming inspection system also includes a protection device (not shown in the figure), which is electrically connected to the electric control box 7. The protection device includes an emergency stop button, an alarm and a temperature detector. The temperature detector is arranged in the darkroom 1, and is used to detect the ambient temperature in the darkroom 1. The critical temperature can be set. When the temperature detected by the temperature detector is greater than the set critical temperature, the alarm sounds, and the electric control box 7 automatically controls to cut off the power supply of the xenon light source 31 and enters the equilibrium state to cool. In addition, an emergency stop button is also provided, and the power supply of the xenon light source 31 can be cut off by the emergency stop button. In this embodiment, the safety of the heliostat 100 test product to be measured and the darkroom itself is ensured by the establishment of the protection device 9.

[0031] In this embodiment, the formation state of the light spot of the heliostat 100 is detected in the darkroom 1, which reduces the testing cost in the actual collector tower mirror field. In addition, the adjustable design of the placement platform 2 and the light source device 3 can test the light spot effects of the heliostat in more different forms. In addition, the heliostat is tested in the column installation state, which is consistent with the actual installation state of the mirror field, reducing errors and thus improving the accuracy of the detection.

[0032] In this embodiment, a heliostat spot forming inspection method is also proposed, including:

[0033] The heliostat 100 to be measured is installed on a placement platform 2 located in a dark room 1;

[0034] The light source device 3 is started, and the light source device 3 projects light onto the heliostat 100 to be measured, and the heliostat 100 to be measured reflects the light onto the light spot target 4 located in the darkroom 1;

[0035] The acquisition device 5 detects and acquires the light spot data on the target surface of the light spot target 4, and transmits the light spot data to the analysis device 6;

[0036] The analyzing device 6 analyzes the forming state of the light spot, and compares the formed state of the light spot obtained by the analysis with the simulated light spot shape obtained by simulation to check the conformity of the light spot.

[0037] This embodiment uses a darkroom detection method to inspect the light spot forming state of the heliostat. The heliostat 100 to be measured is installed on the placement platform 2 in the darkroom 1 and fixed. During the inspection process, the heliostat 100 to be measured reflects the light projected by the light source device 3 to the light spot target 4, and the light spot image is collected by the acquisition device 5, and the light spot data is analyzed and compared by the analysis device 6, so as to know whether the light spot forming state of the test product, the heliostat 100 to be measured, meets the requirements. In this embodiment, the conformity of the obtained light spot forming state and the simulated light spot morphology obtained by simulation can be set according to actual requirements, for example, the conformity threshold is set to 60%. When the conformity of the obtained light spot forming state and the simulated light spot morphology obtained by simulation is greater than or equal to 60%, the light spot forming state of the heliostat 100 to be measured meets the requirements. If the conformity is less than 60%, it means that the light spot forming state of the heliostat 100 to be measured does not meet the requirements, and the heliostat 100 to be measured needs to be readjusted and calibrated. The degree of conformity in this embodiment is not specifically limited, and may be 65%, 70%, 80%, 90%, 95%, etc. This embodiment adopts a darkroom detection method, and the heliostat is detected in a column-mounted state, which is consistent with the actual installation state of the mirror field, reduces errors, thereby improving the accuracy of detection, and reduces the actual testing cost in the collector tower mirror field.

[0038] In this embodiment, before the acquisition device 5 detects and acquires the spot data on the target surface of the spot target 4, the heliostat 100 to be measured is first adjusted to a suitable distance through the placement platform 2, and the light source device 3 and the heliostat 100 to be measured are adjusted to suitable positions, so that the center of the spot formed by the heliostat 100 to be measured reflected on the spot target 4 is located at the center of the target surface of the spot target 4. The placement platform 2 is adjusted to a suitable distance, and the heliostat 100 to be measured can adjust its pitch angle and azimuth angle to reflect the light to the center of the target surface of the spot target 4, so that the subsequent acquisition device 5 and the analysis device 6 can collect and analyze the spot image.

[0039] Specifically, the method for determining the target surface center of the spot target 4 is as follows: the image of the target surface of the spot target 4 is collected by the acquisition device 5, and the acquisition device 5 transmits the image information to the analysis device 6, and the analysis device 6 extracts and identifies the four corners of the target surface image, and establishes a Cartesian plane coordinate system with the plane where the target surface is located, and the coordinate origin (0,0) is the center of the target surface. In this embodiment, the center point (0,0) of the target surface is used as the target aiming point of the heliostat to be measured to reflect the focusing spot of the heliostat to the specified position of the target surface, so as to facilitate the subsequent acquisition of the target surface image and processing and analysis.

[0040] Some technical implementations in the above embodiments may be combined or replaced.

[0041] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0042] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0043] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0044] The technical principles of the present application are described above in combination with specific implementations, but it should be noted that the above descriptions are only for explaining the principles of the present application and cannot be interpreted in any way as a specific limitation on the protection scope of the present application. Based on the explanation here, technicians in this field can think of other specific implementations or equivalent replacements of the present application without creative work, and they will all fall within the protection scope of the present application.

Claims

1. A method for inspecting the formation of a heliostat spot, characterized in that: include The heliostat to be measured is installed on a placement platform in a dark room; The light source device is started, and the light source device projects light onto the heliostat to be measured, and the heliostat to be measured reflects the light onto the light spot target located in the dark room; The acquisition device detects and acquires the light spot data on the light spot target surface, and transmits the light spot data to the analysis device; The analyzing device analyzes the forming state of the light spot, and compares the formed state of the light spot obtained by the analysis with the simulated light spot shape obtained by simulation to check the conformity of the light spot.

2. The heliostat spot forming inspection method according to claim 1, characterized in that: The darkroom adopts the Nissan darkroom standard, wherein the wall reflectivity is ≤60%; the ground reflectivity is ≤20%.

3. The heliostat spot forming inspection method according to claim 1, characterized in that: Before the acquisition device detects and acquires the spot data on the target surface of the spot target, the heliostat to be measured is adjusted to a suitable distance by placing the platform, and the light source device and the heliostat to be measured are adjusted to suitable positions, so that the center of the spot formed by the heliostat to be measured reflected on the spot target is located at the center of the target surface of the spot target.

4. The heliostat spot forming inspection method according to claim 3, characterized in that: The method for determining the target surface center of the spot target is as follows: an acquisition device is used to acquire an image of the target surface of the spot target, the acquisition device transmits the image information to an analysis device, the analysis device extracts and identifies the four corners of the target surface image, and a Cartesian plane coordinate system is established based on the plane where the target surface is located, and the origin of the coordinate is the center of the target surface.

5. The heliostat spot forming inspection method according to any one of claims 1 to 4, characterized in that: The acquisition device adopts a digital camera, and the lens of the digital camera adopts a zoom lens of 12mm-120mm.

6. The heliostat spot forming inspection method according to any one of claims 1 to 4, characterized in that: The illumination surface of the light source device can cover the reflective mirror surface of the heliostat to be measured.

7. A heliostat spot forming inspection system, characterized by: It includes a darkroom, a placement platform, a light source device, a spot target, a collection device and an analysis device. The placement platform, the light source device, the spot target and the collection device are all located in the darkroom. The placement platform is used to fix the heliostat to be measured, the light source device is used to project light to the heliostat to be measured, and the collection device is used to collect the spot data reflected from the heliostat to be measured to the spot target and transmit it to the analysis device.

8. The heliostat spot formation inspection system according to claim 7, characterized in that: The placement platform includes a platform base plate, a linear slide rail, a sliding platform and an electric device. The linear slide rail connects the platform base plate and the sliding platform. The sliding platform is used for installing and fixing the heliostat to be measured. The electric device is installed on the platform base plate and connected to the sliding platform. The electric device can drive the sliding platform to move along the running direction of the linear slide rail.

9. The heliostat spot forming inspection system according to claim 7, characterized in that: The light source equipment includes a xenon light source and a suspension device, wherein the suspension device is installed on the top of the darkroom and is used to install the xenon light source. The suspension device can adjust the position and angle of the xenon light source.

10. The heliostat spot forming inspection system according to any one of claims 7 to 9, characterized in that: The heliostat spot forming inspection system further includes an electric control box, which is arranged outside the darkroom and is electrically connected to the light source device, the collection device and the analysis device; The heliostat spot forming inspection system further includes a ventilation device, which can connect the inside and outside of the darkroom, and the ventilation device is directly opposite to the light source device; The heliostat spot forming inspection system further includes a protection device, which is electrically connected to the electric control box and includes an emergency stop button, an alarm, and a temperature detector.

Images