A radio frequency test apparatus that is easily adjusted

Abstract

The application relates to the technical field of chip radio frequency test, and discloses a radio frequency test equipment convenient to adjust, which comprises a test table, a threaded rod one is rotationally connected in the test table, a lifting plate is screw-connected to the outer wall of the threaded rod one, a bevel gear one is fixedly connected to the outer wall of the threaded rod one, a test box is fixedly connected to the upper surface of the lifting plate, a display screen is arranged on the upper surface of the test box, a microscopic camera is arranged on the lower surface of the display screen, a radio frequency interface is fixedly connected to the outer wall of the test box, one end of a cable is fixedly connected to the inside of the radio frequency interface, and the other end of the cable is fixedly connected with a radio frequency test probe. The synchronous rotation of the threaded rods one on the two sides of the lifting plate can ensure that the movement of the two sides is consistent, thereby ensuring the vertical movement of the radio frequency test probe, helping to improve the test precision, and avoiding test errors or poor contact between the radio frequency test probe and test points caused by asymmetric movement.

Description

Technical Field

[0001] This invention relates to the field of chip radio frequency testing technology, specifically to an easily adjustable radio frequency testing device. Background Technology

[0002] Radio frequency (RF) test equipment has wide applications in wireless communication, electronic product design, broadcasting, radar technology, medical devices, and scientific research. These devices ensure the performance and reliability of RF systems by providing precise frequency and signal testing.

[0003] In the existing technology, it is necessary to manually adjust the lifting screws on both sides of the equipment to raise and lower them synchronously so that the RF test probe can move downward. It is difficult to manually adjust the lifting screws on both sides to raise and lower them completely synchronously. Even a slight asynchrony may cause uneven force on the RF test probe, which may affect the contact effect between the probe and the chip under test, making the contact unstable and resulting in inaccurate test data. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this invention provides an easily adjustable radio frequency (RF) test device. It solves the problem that manually adjusting the lifting screws on both sides to achieve fully synchronized lifting is difficult, leading to uneven force on the RF test probes, which may affect the contact effect between the probes and the chip under test, resulting in unstable contact and inaccurate test data.

[0005] To achieve the above objectives, the present invention provides the following technical solution: an easily adjustable radio frequency (RF) test device, comprising a test platform, a threaded rod rotatably connected inside the test platform, a lifting plate threadedly connected to the outer wall of the threaded rod, a bevel gear fixedly connected to the outer wall of the threaded rod, a test chamber fixedly connected to the upper surface of the lifting plate, a display screen mounted on the upper surface of the test chamber, a microscope camera mounted on the lower surface of the display screen, an RF interface fixedly connected to the outer wall of the test chamber, one end of a cable fixedly connected inside the RF interface, an RF test probe fixedly connected to the other end of the cable, the outer wall of the RF test probe fixedly connected to the inside of the test chamber, a moving mechanism mounted on the upper surface of the test platform, a chip carrier mounted on the upper surface of the moving mechanism, a rotating mechanism mounted on the upper surface of the lifting plate, and an adjusting mechanism mounted on the upper surface of the lifting plate.

[0006] Preferably, the adjusting mechanism includes a support frame, the lower surface of which is fixedly connected to the upper surface of the lifting plate. An inclined groove is formed on the outer wall of the support frame. A sliding rod is slidably connected inside the support frame. A rack is fixedly connected to the outer wall of the sliding rod. A spur gear is meshed with the tooth end of the rack. A rotating column is fixedly connected inside the spur gear. The outer wall of the rotating column is rotatably connected to the inside of the support frame. A bevel gear is fixedly connected to the outer wall of the rotating column. The outer wall of the bevel gear meshes with the outer wall of the bevel gear. A moving plate is fixedly connected to the outer wall of the sliding rod.

[0007] Preferably, the moving mechanism further includes a slide bar II, the outer wall of which is slidably connected to the inside of the support frame, a rack II is fixedly connected to the outer wall of the slide bar II, the outer wall of the rack II meshes with the outer wall of the spur gear, and a moving plate II is fixedly connected to the outer wall of the slide bar II.

[0008] Preferably, the adjusting mechanism includes a fixed plate, the lower surface of which is fixedly connected to the upper surface of the lifting plate, the fixed plate has an adjusting thread connected to its internal thread, a handwheel is fixedly connected to the outer wall of the adjusting thread, and the outer wall of the adjusting thread is threadedly connected to the interior of the moving plate.

[0009] Preferably, the adjustment mechanism further includes a limiting rod, the outer wall of which is fixedly connected to the inside of the fixed plate, and the outer wall of which is slidably connected to the inside of the moving plate.

[0010] Preferably, the moving mechanism includes a support platform, the outer wall of which is fixedly connected to the outer wall of the test platform. A slide rail is fixedly connected to the upper surface of the support platform, and a moving plate is slidably connected to the outer wall of the slide rail. A fixing block is fixedly connected to the upper surface of the support platform, and a motor is fixedly connected to the outer wall of the fixing block. The output end of the motor is rotatably connected to the inside of the fixing block and fixedly connected to a threaded rod. The outer wall of the threaded rod is rotatably connected to the inside of the fixing block, and the outer wall of the threaded rod is threadedly connected to the inside of the moving plate.

[0011] Preferably, the moving mechanism further includes a slide rail two, the lower surface of which is fixedly connected to the upper surface of the moving plate three, the outer wall of which is slidably connected to the inner wall of the chip stage, a fixing block two is fixedly connected to the upper surface of the moving plate three, a motor two is fixedly connected to the outer wall of the fixing block two, the output end of the motor two is rotatably connected to the inside of the fixing block two and fixedly connected to a threaded rod three, the outer wall of the threaded rod three is rotatably connected to the inside of the fixing block two, and the outer wall of the threaded rod three is threadedly connected to the inside of the chip stage.

[0012] Preferably, a movable block is fixedly connected to the outer wall of the sliding rod, and a sliding strip is slidably connected inside the movable block.

[0013] Preferably, a round pin is fixedly connected to the outer wall of the sliding strip, and the outer wall of the round pin is slidably connected to the inner wall of the inclined groove.

[0014] Preferably, an L-shaped connecting frame is fixedly connected to the outer wall of the sliding strip, and a light-shielding plate is fixedly connected to the outer wall of the L-shaped connecting frame.

[0015] Working Principle: During use, the handwheel rotates the adjusting screw, causing the second moving plate to move. The movement of the second moving plate drives the second sliding rod to move, which in turn drives the second rack to move. The movement of the second rack causes the sprocket to rotate, which in turn drives the rotating column to rotate inside the support frame, driving the second bevel gear to rotate. When the second bevel gear rotates, it drives the first threaded rod to rotate inside the lifting plate and the test stage via the first bevel gear. During the rotation of the first threaded rod, the first threaded rod moves the test box downward through the lifting plate, which in turn moves the RF test probe downward to contact the chip placed on the chip carrier. During the downward movement of the lifting plate, the first threaded rods on both sides of the lifting plate rotate synchronously, which ensures that the movement on both sides is consistent, thereby ensuring the vertical movement of the RF test probe, which helps to improve the test accuracy and avoid test errors or poor contact between the RF test probe and the test point caused by asymmetrical movement.

[0016] During the rotation of the spur gear, the rack moves passively, causing the sliding rod to slide inside the support frame. As the sliding rod moves, it moves the moving block, which in turn causes the pin to slide along the inner wall of the inclined groove on the outer wall of the support frame via the sliding bar. This causes the pin to pull the sliding bar downwards, sliding inside the moving block. As the sliding bar moves downwards and inwards, the L-shaped connecting frame causes the light-shielding plate to move downwards and inwards, forming a certain degree of enclosure around the chip detection area. This effectively isolates unnecessary light sources, thereby reducing or eliminating light interference and ensuring the accuracy of the test results.

[0017] When adjusting the position of the chip placed inside the chip stage, the horizontal position of the chip stage can be adjusted by starting motor one to rotate the threaded rod two inside the moving plate three. The vertical position of the chip stage can be adjusted by starting motor two to rotate the adjusting thread inside the chip stage. By combining the horizontal and vertical position adjustments of the chip stage, the operating efficiency is improved, human error is reduced, and more accurate contact between the chip and the RF test probe can be ensured.

[0018] This invention provides an easily adjustable radio frequency test device. It has the following advantages:

[0019] 1. In this invention, during the downward movement of the lifting plate, the threaded rods on both sides of the lifting plate rotate synchronously, which can ensure that the movement on both sides is consistent, thereby ensuring the vertical movement of the RF test probe, which helps to improve the test accuracy and avoid test errors or poor contact between the RF test probe and the test point caused by asymmetrical movement.

[0020] 2. In this invention, as the sliding bar moves downward and inward, the L-shaped connecting frame drives the light-shielding plate to move downward and inward, forming a certain degree of enclosure of the chip detection area. This effectively isolates unnecessary light sources, thereby reducing or eliminating light interference and ensuring the accuracy of the test results.

[0021] 3. By combining the lateral and longitudinal position adjustments of the chip stage in this invention, the operating efficiency is improved, human error is reduced, and more precise contact between the chip and the RF test probe can be ensured. Attached Figure Description

[0022] Figure 1 This is a perspective view of the present invention;

[0023] Figure 2 This is a partial structural diagram of the lifting plate of the present invention;

[0024] Figure 3 for Figure 2 Enlarged view of point A in the middle;

[0025] Figure 4 This is a partial structural diagram of the test bench of the present invention;

[0026] Figure 5 for Figure 4 Enlarged view of point B in the middle;

[0027] Figure 6 This is a partial structural diagram of the support platform of the present invention;

[0028] Figure 7 This is a partial structural diagram of the movable block of the present invention;

[0029] Figure 8 This is a partial structural diagram of the movable plate of the present invention.

[0030] The components include: 1. Test platform; 2. Light shield; 3. Lifting plate; 4. Threaded rod one; 5. Bevel gear one; 6. Test box; 7. Display screen; 8. Microscope camera; 9. RF interface; 10. Cable; 11. RF test probe; 12. L-shaped connecting frame; 13. Chip stage; 14. Support frame; 15. Sliding rod one; 16. Rack one; 17. Circular gear; 18. Rotating column; 19. Bevel gear two; 20. Rack two; 21. 21. Slide rod 2; 22. Moving plate 1; 23. Moving plate 2; 24. Fixed plate; 25. Adjusting thread; 26. Handwheel; 27. Limiting rod; 28. Support platform; 29. ​​Slide rail 1; 30. Fixed block 1; 31. Motor 1; 32. Threaded rod 2; 33. Fixed block 2; 34. Motor 2; 35. Threaded rod 3; 36. Slide rail 2; 37. Moving plate 3; 38. Inclined groove; 39. Moving block; 40. Round pin; 41. Sliding bar. Detailed Implementation

[0031] The technical solution of the present invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0032] Please see the appendix Figure 1 - Appendix Figure 5 This invention provides an easily adjustable radio frequency (RF) testing device, including a test platform 1. A threaded rod 4 is rotatably connected inside the test platform 1. A lifting plate 3 is threadedly connected to the outer wall of the threaded rod 4. A bevel gear 5 is fixedly connected to the outer wall of the threaded rod 4. A test chamber 6 is fixedly connected to the upper surface of the lifting plate 3. A display screen 7 is mounted on the upper surface of the test chamber 6. A microscope camera 8 is mounted on the lower surface of the display screen 7. An RF interface 9 is fixedly connected to the outer wall of the test chamber 6. One end of a cable 10 is fixedly connected inside the RF interface 9. The other end of the cable 10 is fixedly connected to an RF test probe 11. The outer wall of the RF test probe 11 is fixedly connected inside the test chamber 6. A moving mechanism is provided on the upper surface of the test platform 1. A chip carrier 13 is provided on the upper surface of the moving mechanism. A rotating mechanism and an adjusting mechanism are provided on the upper surface of the lifting plate 3.

[0033] Specifically, the display screen 7 is used to observe the contact between the RF test probe 11 and the chip via the microscope camera 8. The RF interface 9 is connected to the RF test probe 11 via the cable 10. When testing the chip, the microscope camera 8 provides a light source to accurately observe the contact between the RF test probe 11 and the chip. The contact between the RF test probe 11 and the chip is transmitted via the cable 10 and the RF interface 9, and the detection signal is output. The moving mechanism is used to test different areas of the chip by adjusting the position of the chip stage 13. By adjusting the mechanism and rotating structure, the lifting plate 3 can drive the test box 6 to move up and down, thereby enabling the RF test probe 11 to contact the chip and achieve detection.

[0034] Please see the appendix Figure 4 - Appendix Figure 5 The adjustment mechanism includes a support frame 14, the lower surface of which is fixedly connected to the upper surface of the lifting plate 3. The outer wall of the support frame 14 has an inclined groove 38. A sliding rod 15 is slidably connected inside the support frame 14. A rack 16 is fixedly connected to the outer wall of the sliding rod 15. A spur gear 17 is meshed with the tooth end of the rack 16. A rotating column 18 is fixedly connected inside the spur gear 17. The outer wall of the rotating column 18 is rotatably connected inside the support frame 14. A bevel gear 19 is fixedly connected to the outer wall of the rotating column 18. The outer wall of the bevel gear 19 meshes with the outer wall of the bevel gear 15. A moving plate 22 is fixedly connected to the outer wall of the sliding rod 15. The moving mechanism also includes a sliding rod 21, the outer wall of which is slidably connected inside the support frame 14. A rack 20 is fixedly connected to the outer wall of the sliding rod 21. The outer wall of the rack 20 meshes with the outer wall of the spur gear 17. A moving plate 23 is fixedly connected to the outer wall of the sliding rod 21.

[0035] Specifically, when sliding rod 15 moves, it slides inside the support frame 14, which supports the movement of sliding rod 15. Similarly, when sliding rod 21 moves, it slides inside the support frame 14, which also supports the movement of sliding rod 21. When sliding rod 21 moves rack 20, rack 20 causes sprocket 17 to move, which in turn causes sprocket 17 to rotate rotating column 18 inside the support frame 14. The rotation of sprocket 17, through bevel gear 5, drives threaded rod 4 to rotate inside lifting plate 3. The interaction between bevel gear 29 and bevel gear 5 converts the rotational motion of rotating column 18 into the rotational motion of threaded rod 4.

[0036] Please see the appendix Figure 1 and attached Figure 5The adjustment mechanism includes a fixed plate 24, the lower surface of which is fixedly connected to the upper surface of the lifting plate 3. The fixed plate 24 has an adjusting thread 25 threadedly connected to its interior. A handwheel 26 is fixedly connected to the outer wall of the adjusting thread 25. The outer wall of the adjusting thread 25 is threadedly connected to the interior of the moving plate 23. The adjustment mechanism also includes a limiting rod 27, the outer wall of which is fixedly connected to the interior of the fixed plate 24. The outer wall of the limiting rod 27 is slidably connected to the interior of the moving plate 23.

[0037] Specifically, the function of the adjusting mechanism is to move the second movable plate 23. Specifically, rotating the handwheel 26 drives the adjusting thread 25 to rotate inside the second movable plate 23 and the fixed plate 24. During the rotation of the adjusting thread 25 inside the second movable plate 23, the second movable plate 23 moves and slides against the outer wall of the limiting rod 27. The limiting rod 27 serves to limit the movement of the second movable plate 23.

[0038] Please see the appendix Figure 1 and attached Figure 6 The moving mechanism includes a support platform 28, the outer wall of which is fixedly connected to the outer wall of the test platform 1. A slide rail 29 is fixedly connected to the upper surface of the support platform 28. A moving plate 37 is slidably connected to the outer wall of the slide rail 29. A fixing block 30 is fixedly connected to the upper surface of the support platform 28. A motor 31 is fixedly connected to the outer wall of the fixing block 30. The output end of the motor 31 is rotatably connected to the inside of the fixing block 30 and fixedly connected to a threaded rod 32. The outer wall of the threaded rod 32 is rotatably connected to the inside of the fixing block 30, and the outer wall of the threaded rod 32 is threadedly connected to the moving plate 37. The moving mechanism also includes a slide rail 2 36, the lower surface of which is fixedly connected to the upper surface of the moving plate 37. The outer wall of the slide rail 2 36 is slidably connected to the inner wall of the chip stage 13. A fixing block 2 33 is fixedly connected to the upper surface of the moving plate 37. A motor 2 34 is fixedly connected to the outer wall of the fixing block 2 33. The output end of the motor 2 34 is rotatably connected to the inside of the fixing block 2 33 and is fixedly connected to a threaded rod 35. The outer wall of the threaded rod 35 is rotatably connected to the inside of the fixing block 2 33 and is threadedly connected to the inside of the chip stage 13.

[0039] Specifically, the moving mechanism adjusts the position of the chip stage 13, thereby adjusting the position of the chips within the chip stage 13 to achieve multi-chip, multi-range detection. During the start-up of motor 31, the output end of motor 31 rotates and connects to the inside of fixed block 30, causing threaded rod 32 to rotate within fixed block 30. During the rotation of threaded rod 32, it rotates within moving plate 37, causing moving plate 37 to move laterally and slide against the outer wall of slide rail 29. Slide rail 29 serves to limit and guide moving plate 37, ensuring it maintains horizontal linear movement during its movement. Start-up of motor 34 causes its output end to rotate within fixed block 33, driving threaded rod 35 to rotate. When threaded rod 35 rotates, it moves within chip stage 13, causing chip stage 13 to slide against the outer wall of slide rail 36 and move longitudinally. Slide rail 36 serves to limit and guide chip stage 13. The longitudinal and lateral positions of the chip can be adjusted by moving the chip stage 13 longitudinally and laterally.

[0040] Please see the appendix Figure 1 Appendix Figure 7 and attached Figure 8 A movable block 39 is fixedly connected to the outer wall of the sliding rod 15, and a sliding strip 41 is slidably connected inside the movable block 39; a round pin 40 is fixedly connected to the outer wall of the sliding strip 41, and the outer wall of the round pin 40 is slidably connected to the inner wall of the inclined groove 38; an L-shaped connecting frame 12 is fixedly connected to the outer wall of the sliding strip 41, and a light shield 2 is fixedly connected to the outer wall of the L-shaped connecting frame 12.

[0041] Specifically, during the movement of the sliding rod 15, the movement of the sliding rod 15 will drive the sliding bar 41 to move through the moving block 39. When the sliding bar 41 moves, it slides on the inner wall of the inclined groove 38 opened on the outer wall of the support frame 14 through the round pin 40, thereby causing the round pin 40 to move downward. When the round pin 40 moves downward, it pulls the sliding bar 41 to move downward and slide inside the moving block 39, thereby causing the sliding bar 41 to drive the light shield 2 to move downward and inward through the L-shaped connecting frame 12 to form a certain degree of light shielding for the detection.

[0042] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An easily adjustable radio frequency test device, comprising a test bench (1), characterized in that, The test bench (1) is internally connected to a threaded rod (4), and the outer wall of the threaded rod (4) is threadedly connected to a lifting plate (3). The outer wall of the threaded rod (4) is fixedly connected to a bevel gear (5). The upper surface of the lifting plate (3) is fixedly connected to a test box (6). The upper surface of the test box (6) is provided with a display screen (7), and the lower surface of the display screen (7) is provided with a microscope camera (8). The outer wall of the test box (6) is fixedly connected to an RF interface (9). One end of a cable (10) is fixedly connected inside the RF interface (9), and the other end of the cable (10) is fixedly connected to an RF test probe (11). The RF test probe (11) The outer wall is fixedly connected to the inside of the test box (6). The upper surface of the test platform (1) is provided with a moving mechanism, and the upper surface of the moving mechanism is provided with a chip carrier (13). The upper surface of the lifting plate (3) is provided with a rotating mechanism, and the upper surface of the lifting plate (3) is provided with an adjusting mechanism. The adjusting mechanism includes a support frame (14). The lower surface of the support frame (14) is fixedly connected to the upper surface of the lifting plate (3). The outer wall of the support frame (14) is provided with a slanted groove (38). The inside of the support frame (14) is slidably connected with a sliding rod (15). The outer wall of the sliding rod (15) is fixedly connected with a rack (16). The tooth ends of the rack (16) are engaged with each other. The system includes a spur gear (17), with a rotating column (18) fixedly connected inside the spur gear (17). The outer wall of the rotating column (18) is rotatably connected to the inside of a support frame (14). A bevel gear (19) is fixedly connected to the outer wall of the rotating column (18), and the outer wall of the bevel gear (19) meshes with the outer wall of the bevel gear (5). A sliding plate (22) is fixedly connected to the outer wall of a sliding rod (15). The moving mechanism also includes a sliding rod (21), the outer wall of which is slidably connected to the inside of the support frame (14). A rack (20) is fixedly connected to the outer wall of the sliding rod (21), and the outer wall of the rack (20) is connected to the spur gear (17). The outer wall of the sliding rod (21) is engaged with the sliding plate (23) fixedly connected to the outer wall of the sliding rod (15). The outer wall of the sliding rod (15) is fixedly connected with the moving block (39). The sliding block (39) is slidably connected with the sliding strip (41). The outer wall of the sliding strip (41) is fixedly connected with the round pin (40). The outer wall of the round pin (40) is slidably connected to the inner wall of the inclined groove (38). The outer wall of the sliding strip (41) is fixedly connected with the L-shaped connecting frame (12). The outer wall of the L-shaped connecting frame (12) is fixedly connected with the light shield (2). When the sliding strip (41) moves downward and inward, the light shield (2) is driven downward and inward through the L-shaped connecting frame (12).

2. The easily adjustable radio frequency test equipment according to claim 1, characterized in that, The adjustment mechanism includes a fixed plate (24), the lower surface of which is fixedly connected to the upper surface of the lifting plate (3), the fixed plate (24) has an adjustment thread (25) internally threaded, the outer wall of which is fixedly connected to a handwheel (26), and the outer wall of which is threadedly connected to the interior of the moving plate (23).

3. The easily adjustable radio frequency test equipment according to claim 2, characterized in that, The adjustment mechanism also includes a limiting rod (27), the outer wall of which is fixedly connected to the inside of the fixed plate (24), and the outer wall of which is slidably connected to the inside of the moving plate (23).

4. The easily adjustable radio frequency test equipment according to claim 1, characterized in that, The moving mechanism includes a support platform (28), the outer wall of which is fixedly connected to the outer wall of the test platform (1). A slide rail (29) is fixedly connected to the upper surface of the support platform (28). A moving plate (37) is slidably connected to the outer wall of the slide rail (29). A fixing block (30) is fixedly connected to the upper surface of the support platform (28). A motor (31) is fixedly connected to the outer wall of the fixing block (30). The output end of the motor (31) is rotatably connected to the inside of the fixing block (30) and fixedly connected to a threaded rod (32). The outer wall of the threaded rod (32) is rotatably connected to the inside of the fixing block (30). The outer wall of the threaded rod (32) is threadedly connected to the inside of the moving plate (37).

5. The easily adjustable radio frequency test equipment according to claim 4, characterized in that, The moving mechanism also includes a slide rail two (36), the lower surface of which is fixedly connected to the upper surface of the moving plate three (37), the outer wall of which is slidably connected to the inner wall of the chip stage (13), the upper surface of the moving plate three (37) is fixedly connected to a fixing block two (33), the outer wall of the fixing block two (33) is fixedly connected to a motor two (34), the output end of the motor two (34) is rotatably connected to the inside of the fixing block two (33) and fixedly connected to a threaded rod three (35), the outer wall of the threaded rod three (35) is rotatably connected to the inside of the fixing block two (33), and the outer wall of the threaded rod three (35) is threadedly connected to the inside of the chip stage (13).

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