Data processing method for aircraft ground test, electronic equipment and storage medium

Abstract

The invention provides a data processing method for an aircraft ground test, electronic equipment and a storage medium, and the method comprises the steps: presetting a plurality of preset test schemes, and rapidly determining a target preset test scheme from the plurality of preset test schemes through a first operation of a user when the aircraft ground test is carried out; according to the target preset test scheme, the first target test data is accurately acquired from the test data generated by the ground test of the aircraft, and the test instructions included in the target preset test scheme are executed according to the first target test data, so that the automation degree of the ground test of the aircraft is improved, and meanwhile, the test efficiency is improved. On the premise of ensuring the ground test efficiency of the aircraft, the timeliness among the parameters and the accuracy of the control logic are ensured.

Description

Technical Field

[0001] This application belongs to the field of aircraft ground tests, and particularly relates to a data processing method, an electronic device, and a storage medium for aircraft ground tests. Background Art

[0002] An aircraft ground test is a test conducted on the ground during the R & D process of an aircraft. This test process requires a large number of test equipment and test systems to operate together to carry out the test. Currently, the software for existing ground tests generally uses manual control, and each test equipment and test system in the test is independent of each other. The test personnel need to operate the respective system software and manually give various control parameters and states.

[0003] However, through manual control of aircraft ground tests, the test personnel need to manually input control parameters in sequence to control the parameters or states of each test system and test equipment. The operation is complex, the workload of repeated tests under different working conditions is large, and the timeliness between parameters and the control logic under high-speed conditions cannot be guaranteed. Summary of the Invention

[0004] The embodiments of this application provide a data processing method, an electronic device, and a storage medium for aircraft ground tests, which can improve the efficiency of aircraft ground tests and the accuracy of control logic.

[0005] In a first aspect, the embodiments of this application provide a data processing method for aircraft ground tests, and the method includes:

[0006] Display a plurality of preset test schemes corresponding to the aircraft ground test; the preset test scheme includes at least one test instruction;

[0007] In response to a first operation in which a user selects a target preset test scheme from the plurality of preset test schemes, determine the target preset test scheme from the plurality of preset test schemes;

[0008] Execute each test instruction included in the target preset test scheme.

[0009] In a second aspect, the embodiments of this application provide a data processing device for aircraft ground tests, and the device includes:

[0010] A display module that displays a plurality of preset test schemes corresponding to the aircraft ground test; the preset test scheme includes at least one test instruction;

[0011] A determination module that, in response to a first operation in which a user selects a target preset test scheme from the plurality of preset test schemes, determines the target preset test scheme from the plurality of preset test schemes;

[0012] An execution module that executes each test instruction included in the target preset test scheme.

[0013] In a third aspect, an embodiment of the present application provides an electronic device, which includes: a processor and a memory storing computer program instructions; when the processor executes the computer program instructions, it implements the data processing method for the aircraft ground test as described in the first aspect.

[0014] In a fourth aspect, an embodiment of the present application provides a computer storage medium, on which computer program instructions are stored, and when the computer program instructions are executed by a processor, they implement the data processing method for the aircraft ground test as described in the first aspect.

[0015] In a fifth aspect, an embodiment of the present application provides a computer program product, and when the instructions in the computer program product are executed by the processor of the electronic device, the electronic device is caused to execute the data processing method for the aircraft ground test as described in the first aspect.

[0016] For the data processing method, device, equipment and storage medium of the aircraft ground test in the embodiment of the present application, a plurality of preset test schemes are preset in advance. When conducting the aircraft ground test, the target preset test scheme can be quickly determined from the plurality of preset test schemes through the first operation of the user. Then, each test instruction included in the target preset test scheme is executed, which improves the automation degree of the aircraft ground test. At the same time, on the premise of ensuring the efficiency of the aircraft ground test, the timeliness between various parameters and the accuracy of the control logic are ensured. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required to be used in the embodiments of the present application. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings without creative efforts.

[0018] Figure 1 is a flowchart of a data processing method for an aircraft ground test provided by an embodiment of the present application;

[0019] Figure 2 is a structural diagram of an interactive data platform provided by an embodiment of the present application;

[0020] Figure 3 is a flowchart of executing each test instruction included in the target preset test scheme provided by an embodiment of the present application;

[0021] Figure 4 is a schematic diagram of displaying the interpretation result provided by an embodiment of the present application;

[0022] Figure 5It is a schematic structural diagram of a test data storage provided by an embodiment of the present application;

[0023] Figure 6 It is a schematic structural diagram of a data processing device for an aircraft ground test provided by an embodiment of the present application;

[0024] Figure 7 It is a schematic structural diagram of an electronic device provided by an embodiment of the present application. Detailed implementation manners

[0025] The features and exemplary embodiments of various aspects of the present application will be described in detail below. In order to make the objectives, technical solutions and advantages of the present application more clear and understandable, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only intended to explain the present application, rather than limiting the present application. For those skilled in the art, the present application can be implemented without some of these specific details. The following description of the embodiments is only intended to provide a better understanding of the present application by showing examples of the present application.

[0026] It should be noted that, in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprises", "comprising" or any other variant thereof is intended to cover a non-exclusive inclusion, such that a process, method, article or device comprising a series of elements includes not only those elements, but also other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, the elements defined by the statement "comprising..." do not exclude the presence of additional identical elements in the process, method, article or device comprising the said elements.

[0027] During the process of an aircraft's ground test, a large number of test equipment and test systems need to run together to conduct the test. In the current related technologies, aircraft ground tests generally adopt manual control, and each test equipment and test system in the test is independent of each other. The test personnel need to operate their respective system software and manually give various control parameters and states. This leads to complex operations, a large amount of repetitive test work under different working conditions, and it is impossible to ensure the timeliness between parameters and the control logic under high-speed conditions.

[0028] In addition, some aircraft ground test software in the current related technologies are independent of each other. Each test equipment or test system has its own independent control software. Multiple software need to be manipulated simultaneously to complete the test cooperatively. The operation is complex, and the test personnel need to master each software and their relationships with each other, and the test difficulty is relatively high.

[0029] To solve the problems of the prior art, the embodiments of the present application provide a data processing method, device, electronic device, computer storage medium, and computer program product for aircraft ground tests, so as to achieve fully automated operations from test control to data processing and achieve one-key testing. First, the data processing method for aircraft ground tests provided by the embodiments of the present application will be introduced below.

[0030] Figure 1 FIG. 5 shows a schematic flowchart of a first data processing method for aircraft ground tests provided by an embodiment of the present application. As Figure 1 shown, the method includes the following steps:

[0031] S101, display a plurality of preset test schemes corresponding to the aircraft ground test; the preset test scheme includes at least one test instruction.

[0032] Specifically, the data processing method for aircraft ground tests of the present application can be applied to a terminal device or a server. When running on the server, data input and display can be performed through a terminal device connected to the server. To facilitate the user to quickly determine the target preset test scheme required currently from a plurality of preset test schemes, a plurality of preset test schemes corresponding to the aircraft ground test can be displayed through the terminal device. It should be noted that the preset test scheme is a test scheme that the user has completed writing in advance according to needs. Generally, this test scheme includes one or more test instructions, and each test instruction corresponds to a test. By setting a plurality of preset test schemes in advance, it can help the user quickly determine the test scheme to be performed currently and avoid complex operations when the user executes the test scheme through manual operations.

[0033] In some embodiments, when setting the preset test scheme, the aircraft ground test outline can be set first, and then the preset test scheme can be written according to this outline. In one example, the preset test scheme can include information such as which instructions need to be issued, the preconditions for issuing instructions, the way of issuing instructions, etc. The written preset test scheme can be saved in the form of a file. Refer to Table 1 for a certain preset test scheme. Among them, the second column represents the trigger conditions, including but not limited to equality, greater than, less than, within a range, waiting time, etc. The third column is the parameter variable for condition judgment. The fourth and fifth columns are the condition values. For example, for the greater than condition, specifically, it needs to be greater than what value. The sixth is the instruction issuance variable, and the seventh column is the value of the issued instruction. The test scheme is executed sequentially from top to bottom. Multiple scheduling schemes can be written and loaded and executed using multiple threads. When the conditions on the left are met, the system will sequentially read the conditions or instructions downward and continue to execute.

[0034]

[0035]

[0036] Table 1

[0037] In some embodiments, to facilitate the acquisition and obtaining of various data for the ground tests of the aircraft, a data interaction network may be set up. Refer to Figure 2 , the data interaction network 201 includes a variety of data units, such as reflective memory data units, 1394 bus data units, 429 bus data units, analog data units, digital data units, 422 / 485 data units, etc. The data interaction network 201 is respectively connected to each test system 202, each airborne finished product 203, and each test device 204. Among them, the data interaction network 201 is connected to each test system 202 through a reflective memory switch 210.

[0038] In some embodiments, each data unit has an independent storage space and configuration parameters. The configuration parameters guide the data unit to obtain which data through what kind of hardware interface or board. The configuration parameters include the sampling speed of the collected data, communication cycle, communication parameters, decoding rules, etc. After being configured, the data unit will call the corresponding bus communication or hardwired IO driver according to this rule, and can independently complete the input and output of this part of the data. This includes collecting feedback data from airborne finished products, test systems, and test devices, and sending control instructions to the above objects.

[0039] Each data unit works independently, but all data units synchronize the interaction data to the interaction data platform for part of the programs of automatic scheduling (executing the target preset test plan) and data interpretation (executing the target preset interpretation plan) to call. This includes synchronizing the collected data to the interaction data platform, or obtaining instruction data from the interaction data platform and synchronizing it to the local data unit as control parameters to be issued.

[0040] The data interaction between the data unit and the interaction network is realized through the computer memory. By reading and writing the specified memory address, the data interaction is realized.

[0041] In view of the complexity and diversity of the number and types of test systems, test devices, and airborne finished products included in the ground tests of the aircraft, this part of the function collects the data acquisition / control of all devices in one software, which is convenient for the test personnel to operate and also provides a data IO basis for the functions of automatic scheduling and data interpretation.

[0042] S102, in response to a first operation by the user to select a target preset test plan from the multiple preset test plans, determine the target preset test plan from the multiple preset test plans.

[0043] In specific implementation, after displaying multiple preset test scenarios corresponding to the ground test of the aircraft, the user can determine the target preset test scenario through a first operation of selecting the target preset test scenario from the multiple preset test scenarios. In some embodiments, the above first operation may be a touch operation directly on the interface displaying the multiple preset test scenarios, or an operation executed through a physical button, or an operation issued through a voice command, and this is not limited.

[0044] Considering that the multiple preset test scenarios set in advance cannot cover all test scenarios, and in order to quickly help the user obtain a preset test scenario that was not pre-generated before, in some embodiments, before determining the target preset test scenario from the multiple preset test scenarios, the method further includes:

[0045] In response to determining that the target preset test scenario is not included in the multiple preset test scenarios, determining an alternative preset scenario from the multiple preset test scenarios that has the most overlapping test instructions with the target preset test scenario;

[0046] Displaying multiple preset test instructions;

[0047] In response to a second operation for selecting a target test instruction from the multiple preset test instructions, determining the target test instruction from the multiple preset test instructions; the target preset instruction is a test instruction required by the target preset test scenario and not included in the alternative preset scenario;

[0048] Generating the target preset test scenario based on the target preset instruction and the alternative preset scenario, and adding the target preset test scenario to the multiple preset test scenarios.

[0049] In specific implementation, when determining whether the target preset test scenario is included in the multiple preset test scenarios, it can be determined by the user's input operation whether the target preset test scenario is included in the multiple preset test scenarios. For example, when displaying the multiple preset test scenarios corresponding to the ground test of the aircraft, a virtual control indicating that the current all preset test scenarios do not include the target preset test can be displayed. When the user selects this virtual control, it is determined that the target preset test scenario is not included in the multiple preset test scenarios. Alternatively, the user can directly input the name or label of the target preset test scenario, and then the system automatically performs matching, and determines whether the target preset test scenario is included in the multiple preset test scenarios based on the matching result. When it is determined that the target preset test scenario is not included in the multiple preset test scenarios, an alternative preset scenario from the multiple preset test scenarios that has the most overlapping test instructions with the target preset test scenario is determined.

[0050] In some embodiments, the alternative preset scheme can be determined by a fourth operation in which the user determines, from multiple preset test schemes, the alternative preset scheme that has the most overlapping test instructions with the test instructions of the target preset test scheme. In some embodiments, the alternative preset scheme can also be determined based on the name of the target preset test scheme and the names of each preset test scheme. Specifically, the similarity between the two names can be used as the basis for determining the alternative preset scheme.

[0051] After obtaining the alternative preset scheme that has the most overlapping test instructions with the test instructions of the target preset test scheme, in order to further improve the efficiency of generating the target preset test scheme, multiple preset test instructions can be set in advance. Specifically, the preset test instructions can be set according to needs and are not limited in this regard. In some embodiments, the test instructions commonly used in aircraft ground tests can be set as preset test instructions. After setting multiple preset test instructions, when it is determined that the multiple preset test schemes do not include the target preset test scheme, multiple preset test instructions can be displayed. Then, the user can, through a second operation, determine the target test instruction from the multiple preset test instructions. This target test instruction is the test instruction that the target preset test scheme requires and the alternative preset scheme does not include. After obtaining the target test instruction, the target preset test scheme can be generated based on this target test instruction and the alternative preset scheme, and the target preset test scheme can be added to the multiple preset test schemes.

[0052] In order to accurately generate the target preset test scheme, in some embodiments, generating the target preset test scheme based on the target preset instruction and the alternative preset scheme specifically includes:

[0053] Determine the test instructions to be deleted included in the alternative preset scheme; the test instructions to be deleted are the test instructions that the target preset test scheme does not require;

[0054] Generate the target preset test scheme based on the test instructions to be deleted, the target test instruction, and the alternative preset scheme.

[0055] In specific implementation, the fifth operation instruction for the user to determine the test instruction to be deleted can be determined from each test instruction included in the alternative preset scheme, and the test instruction to be deleted can be determined. Alternatively, considering that in a preset test scheme, generally only one of multiple test instructions of the same type is selected, therefore, the test instruction to be deleted can be determined from each test instruction included in the alternative preset scheme according to the target test instruction. Specifically, an exclusive test instruction set corresponding to each preset test instruction can be set, and then the test instruction to be deleted can be determined from each test instruction included in the alternative preset scheme according to the exclusive test instruction set. Alternatively, the target test type of the target preset instruction can be obtained first, and then the test instruction belonging to the target test type can be determined from each test instruction included in the alternative preset scheme, and the test instruction can be determined as the test instruction to be deleted. After determining the test instruction to be deleted and the target test instruction, the test instruction to be deleted in the alternative preset scheme can be deleted, and the target preset instruction can be added to obtain the target preset scheme.

[0056] It should be noted that both the above-mentioned target preset instruction and the above-mentioned test instruction to be deleted can be one or more, and there is no limit to this.

[0057] In some embodiments, when obtaining the alternative preset scheme with the most overlapping test instructions with the target preset test scheme, the user can also directly perform a modification operation on the alternative preset scheme to directly obtain the target preset scheme.

[0058] S103, execute each test instruction included in the target preset test scheme.

[0059] In specific implementation, after determining the target preset test scheme, each test instruction included in the target preset test scheme can be executed in a preset order. In some embodiments, each test instruction included in the target preset test scheme can also be executed in parallel by multiple threads.

[0060] In order to better execute each test instruction, in some embodiments, executing each test instruction included in the target preset test scheme specifically includes:

[0061] For each test instruction included in the target preset test scheme, determine the instruction type of the test instruction; the instruction type includes the first type, the second type or the third type;

[0062] In response to determining that the instruction type is the first type, execute the test instruction after the timing is completed;

[0063] Alternatively, in response to determining that the instruction type is the second type, obtain the judgment condition corresponding to the test instruction, obtain the first target test data corresponding to the judgment condition from the historical test data, and when it is determined that the test instruction meets the judgment condition based on the judgment condition and the first target test data, execute the test instruction; the historical test data is generated when each test instruction included in the target preset test scenario is executed;

[0064] Alternatively, in response to determining that the instruction type is the third type, execute the test instruction.

[0065] Specifically in implementation, in order to better execute different test instructions, the instruction types of the test instructions are classified. In some embodiments, the instruction types of the test instructions may include the first type, the second type, or the third type. Among them, the first type is the timing type. At this time, the test instruction is executed after timing is completed. For example, test instructions 12 and 13 in Table 1 above. The second type is the additional judgment condition type. At this time, it is necessary to first obtain the judgment condition corresponding to the test instruction, then obtain the first target test data corresponding to the judgment condition from the historical test data, and when it is determined that the test instruction meets the judgment condition based on the judgment condition and the first target test data, execute the test instruction. Referring to test instructions 3-7 in Table 1 above, they are all test instructions of the second type. The third type is the ordinary type, that is, a test instruction that can be directly executed. For example, test instructions 1 and 2 in Table 1 above.

[0066] Reference Figure 3 , is a schematic flowchart of a process for executing each test instruction included in the target preset test scenario provided by an embodiment of the present application. The process for executing each test instruction included in the target preset test scenario includes the following steps:

[0067] S1031, obtain the current test instruction.

[0068] S1032, determine whether the current test instruction is a first-type instruction; if so, execute step S1033; if not, execute step S1035.

[0069] S1033, clock timing.

[0070] S1034, determine whether the timing is completed; if so, execute step S1035; if not, execute step S1033, that is, continue clock timing.

[0071] S1035, determine whether the current test instruction is a second-type instruction; if so, execute step S1036; if not, execute step S1038.

[0072] S1036, obtain the judgment condition corresponding to the current test instruction.

[0073] S1037, determine whether the judgment condition is satisfied; if so, execute step S1038; if not, execute step S1036, that is, continue to obtain the judgment condition corresponding to the current test instruction.

[0074] S1038, execute the current test instruction.

[0075] It should be noted that in this embodiment, for the current test instruction, it will be judged whether it is a first type instruction and a second type instruction in sequence. If it does not belong to the first type instruction and the second type instruction, the current test instruction can be directly executed. If the current test instruction is a first type instruction, it can be executed after the clock timing is completed. If the current test instruction is a second type instruction, it can be executed when the judgment condition corresponding to the current test instruction is satisfied.

[0076] In order to improve the reading and writing speed of common test data, in some embodiments, the historical data includes multiple test data, and each test data includes multiple test values; each test data has a preset number of test values stored in the local memory, and the test values stored in the local memory are the latest generated multiple test values.

[0077] It should be noted that the above preset number can be set as needed, and there is no limit to this. In some embodiments, the proportion of the local memory used to store the preset number of test values can be determined first. For example, in one example, the proportion is 30%, and 30% of the memory can be evenly distributed to each test data, and the maximum number of test values that each test data can store can be determined, and this maximum number is the preset number. In addition, when the number of generated test values is greater than the preset number, considering the execution habits of each test instruction included in the preset test plan, generally the latest generated multiple test values are preferentially stored, that is, when new test values are generated, the earliest generated test value corresponding in the local memory is replaced with the new test value.

[0078] In order to ensure the test safety when executing each test instruction, in some embodiments, executing each test instruction included in the target preset test plan specifically includes:

[0079] For each test instruction included in the target preset test plan, determine whether a safety warning condition is triggered during the execution of the test instruction;

[0080] In response to triggering the safety warning condition, determine the risk level corresponding to the triggered safety warning condition;

[0081] Generate a safety protection instruction based on the risk level and output the safety prevention and control instruction; the safety protection instruction includes one or more of an alarm prompt and forcibly issuing safety protection parameters.

[0082] In specific implementation, when it is determined that a safety warning condition is triggered during the execution of a certain test instruction, first determine the risk level corresponding to the triggered safety warning condition, then generate a safety protection instruction based on the risk level, and output the safety prevention and control instruction. It should be noted that the safety protection instruction includes one or more of an alarm prompt and forcibly issuing safety protection parameters. Generally, when the risk level is relatively low, only an alarm prompt may be issued. When the risk level is relatively high, while issuing an alarm prompt, safety protection parameters may be forcibly issued. The above safety warning conditions can be set as needed and are not limited herein.

[0083] In some embodiments, Table 2 is a specific safety warning condition. Among them, the first column is the name of the alarm item for interface alarm, the second column is the monitored trigger condition variable, the third column is what kind of judgment the condition variable performs, and the fourth and fifth columns are the judgment bases, such as what value it is specifically greater than when greater; the sixth and seventh columns are at which stage of the scheduling plan this alarm signal takes effect. For example, starting position 1 and ending position 15, then during the execution of items 1 - 15 in Table 1 above, this protection alarm takes effect, performs the judgment, and monitors whether the alarm is triggered. When it comes to step 16, this alarm condition is no longer monitored. The eighth and ninth columns are the protection parameters and parameter values forcibly issued when the alarm condition is triggered.

[0084] In some embodiments, assume that during the execution of test instructions 1 - 23 in a certain target preset test plan, safety warning monitoring is carried out on whether the DC voltage - acquisition is greater than 40. When this warning monitoring condition (safety warning condition) is triggered, the current user interface will give a safety warning, display the alarm content, and forcibly issue a protection instruction to set the DC power switch instruction value to 0. The way this value is issued is the same as the way the test instruction is issued.

[0085]

[0086] Table 2

[0087] Considering that in the current related technologies, the ground tests of general aircraft obtain test results in a storage form, which leads to the necessity that after the storage stops, the test personnel can draw test conclusions only through the overall comparison and analysis of the stored data. If some test data is unqualified during the test process, especially when the judgment rules for multiple test variables related to each other (for example, there are sequential or numerical logical relationships among 50 variables collected in a short time) are unqualified, it will be very difficult to be discovered, resulting in the invalidation of the subsequent work of this test. To solve this technical problem, in some embodiments, after executing each test instruction included in the target preset test plan, the method further includes:

[0088] Displaying a plurality of preset judgment plans; the preset judgment plans include at least one judgment instruction;

[0089] In response to a third operation in which a user selects a target preset judgment plan from the plurality of preset judgment plans, determining the target preset judgment plan from the plurality of preset judgment plans;

[0090] Obtaining second target test data from historical test data based on the target preset judgment plan; the historical test data is generated when each test instruction included in the target preset test plan is executed;

[0091] Executing each judgment instruction included in the target preset judgment plan based on the second target test data;

[0092] Generating a judgment result based on the execution results of the respective judgment instructions and displaying the judgment result.

[0093] It should be noted that, in order to perform the judgment of the preset test plan in a timely manner, in this embodiment, after executing each test instruction included in the target preset test plan, it does not mean that all the test instructions included in the target preset test plan have been executed, but after starting to execute each test instruction included in the target preset test plan.

[0094] In some embodiments, in order to help the user quickly determine the target preset judgment plan, a plurality of preset judgment plans will be displayed first, and each preset judgment plan includes at least one judgment instruction. It should be noted that the plurality of preset judgment plans can be set in advance as needed. In some embodiments, each sub-judgment item can be listed in the preset judgment plan, and each judgment item indicates the variables involved and the judgment logical relationship, including conventional restrictions such as greater than, less than, equal to, range, etc., conventional calculations such as mean, variance, root mean square, etc., trigger restrictions such as upper and lower edges, falling edges, mutations, fluctuations, etc., and complex analysis and calculations of the mutual relationships of multiple data, etc. In one example, the preset judgment plan can be saved in a file for convenient subsequent invocation.

[0095] In some embodiments, referring to Table 3 below, there is a preset interpretation scheme. Among them, the first column is the interpretation serial number, the second column is the name of the interpretation item for display; the third column is the interpretation variable monitored during interpretation; the 4th - 6th columns are sub - interpretation item 1, where the fourth column is the interpretation condition, and the fifth and sixth columns are the interpretation condition values; the 7th - 9th columns are sub - interpretation item 2, and so on. Several sub - interpretation items can be added to each interpretation item. When all sub - interpretation items are satisfied, it is considered that the interpretation item passes, and multiple interpretation items can be executed in parallel. During specific interpretation, serial number 1 means that when the DC voltage - acquisition value is equal to 28, the power - on normal interpretation item passes; serial number 2 means that the rising edge of pressure sensor 2 starting from 0 is the same as that of ball valve 1, and the falling edge from the value to 0 is the same as that of ball valve 1. When both are satisfied, the pressure normal interpretation item passes; serial number 3 means that when the DC power switch value is 1, start recording the value of temperature sensor 4, and end when the DC power switch value is 0. After that, calculate the average value during this period. If it is between 26 - 30, the temperature normal interpretation passes.

[0096] In some embodiments, the specific operation forms of the above - mentioned second operation, third operation, fourth operation, and fifth operation can all be set as needed. For the specific implementation method, reference can be made to the embodiments described above for the first operation, and details will not be elaborated here.

[0097] In some embodiments, the specific process of displaying the interpretation result can be set as needed. For example, each interpretation instruction can be simply indicated whether it passes through an indicator light. Or the specific interpretation result can be displayed through a file description. Refer to Figure 4 , which is a form of displaying the interpretation result in the embodiments of this application. It can be seen that Figure 4 In, each test item corresponds to a judgment instruction, and it is indicated whether each interpretation instruction passes through both text and an indicator light, and the unpassed judgment instructions are described in more detail.

[0098]

[0099] Table 3

[0100] Considering that in some cases, the user may select the wrong preset interpretation scheme due to operation errors. To avoid this situation, in some embodiments, after determining the target preset interpretation scheme from multiple preset interpretation schemes, the method further includes:

[0101] Obtain the default interpretation scheme corresponding to the target preset test scheme;

[0102] In response to determining that the target preset interpretation scheme is different from the default interpretation scheme, send a prompt message indicating that the current target preset interpretation scheme is abnormal.

[0103] In specific implementation, after determining the target preset interpretation scheme from multiple preset interpretation schemes through the user's third operation, the current target preset interpretation scheme can be verified by the default interpretation scheme corresponding to the target preset test scheme. If the two are different, it is very likely that the user has made an operation error. At this time, a prompt message indicating that the current target preset interpretation scheme is abnormal can be issued to remind the user whether the current operation is correct. If the user confirms that there is no operation error at present, the prompt message can be directly ignored, or the third operation can be affirmed through a secondary confirmation operation.

[0104] In order to improve the reading speed of important data during the execution of the interpretation instruction, in some embodiments, the second target test data includes first-type data and second-type data; the first-type data includes multiple test data, and each test data includes multiple test values; each test data has a preset number of test values stored in the local memory, and the test values stored in the local memory are the latest generated multiple test values; the second-type data is stored in the local memory, and when the second-type data is newly generated, the second-type data in the local memory is replaced based on the newly generated second-type data to ensure that the memory usage space is fixed and avoid memory leakage. It should be noted that the first-type data can be ordinary data directly generated by executing the test instruction. The second-type data can be extracted criteria, which are key data for interpretation according to the interpretation rules, such as the rising edge occurrence time, the maximum value occurrence time, etc.

[0105] In some embodiments, referring to Figure 5 , which is a schematic structural diagram of a test data storage provided by an embodiment of the present application. Among them, all data can be obtained through the data exchange platform 301 and read by the interpretation unit 307 after data storage. Figure 5 Each variable in corresponds to a test data. For each test data, the first 4 newly generated data are stored in the first memory 303, and other data can be stored in the database 302, which can be set on the hard disk. In addition, some key data for interpretation are stored in the second memory 306. When executing the interpretation instruction through the data interpretation unit, the acquisition of ordinary data and the extraction of key data can both be directly obtained from the local memory. For example, Figure 5 304 and 305 in respectively represent the latest ordinary data obtained from the first memory 303 and the key data obtained from the second memory 306.

[0106] The data processing method for the aircraft ground test in the embodiments of the present application pre-sets a plurality of preset test schemes. When conducting the aircraft ground test, the target preset test scheme can be quickly determined from the plurality of preset test schemes through the first operation of the user. Then, each test instruction included in the target preset test scheme is executed, which improves the automation degree of the aircraft ground test. At the same time, on the premise of ensuring the efficiency of the aircraft ground test, the timeliness between various parameters and the accuracy of the control logic are ensured.

[0107] Based on the same inventive concept, corresponding to the method in any of the above embodiments, the present application further provides a data processing device for the aircraft ground test.

[0108] Refer to Figure 6 , the data processing device for the aircraft ground test includes:

[0109] A display module 401 that displays a plurality of preset test schemes corresponding to the aircraft ground test; the preset test scheme includes at least one test instruction;

[0110] A determination module 402 that determines the target preset test scheme from the plurality of preset test schemes in response to the first operation of the user to select the target preset test scheme from the plurality of preset test schemes;

[0111] An execution module 403 that executes each test instruction included in the target preset test scheme.

[0112] For the convenience of description, when describing the above device, it is divided into various modules according to functions and described separately. Of course, when implementing the present application, the functions of each module can be implemented in the same or multiple software and / or hardware.

[0113] The data processing device for the aircraft ground test in the above embodiments is used to implement the corresponding data processing method for the aircraft ground test in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiments, which will not be elaborated here.

[0114] Figure 7 The schematic diagram of the hardware structure of the electronic device provided by the embodiments of the present application is shown.

[0115] In some embodiments, the electronic device may include a processor 501 and a memory 502 storing computer program instructions.

[0116] Specifically, the above-mentioned processor 501 may include a central processing unit (CPU), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application.

[0117] The memory 502 may include a mass storage for data or instructions. By way of example and not limitation, the memory 502 may include a hard disk drive (HDD), a floppy disk drive, a flash memory, an optical disk, a magneto-optical disk, a magnetic tape, or a universal serial bus (USB) drive, or a combination of two or more of these. Where appropriate, the memory 502 may include removable or non-removable (or fixed) media. Where appropriate, the memory 502 may be internal or external to the integrated gateway disaster recovery device. In a particular embodiment, the memory 502 is a non-volatile solid-state memory.

[0118] In a particular embodiment, the memory 502 includes a read-only memory (ROM). Where appropriate, the ROM may be a mask-programmed ROM, a programmable ROM (PROM), an erasable PROM (EPROM), an electrically erasable PROM (EEPROM), an electrically rewritable ROM (EAROM), or a flash memory, or a combination of two or more of these.

[0119] The memory may include a read-only memory (ROM), a random access memory (RAM), a magnetic disk storage media device, an optical storage media device, a flash memory device, an electrical, optical, or other physical / tangible memory storage device. Thus, generally, the memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software including computer-executable instructions, and when the software is executed (e.g., by one or more processors), it is operable to perform the operations described with reference to the method according to one aspect of the present disclosure.

[0120] The processor 501 reads and executes the computer program instructions stored in the memory 502 to implement the data processing method for any one of the above-described embodiments of the aircraft ground test.

[0121] In one example, the electronic device may further include a communication interface 503 and a bus 510. Among them, as Figure 7 shown, the processor 501, the memory 502, and the communication interface 503 are connected through the bus 510 and complete communication with each other.

[0122] The communication interface 503 is mainly used to implement communication between the various modules, devices, units, and / or devices in the embodiments of the present application.

[0123] The bus 510 includes hardware, software, or both, and couples the components of the online data flow metering device to each other. By way of example and not limitation, the bus may include an Accelerated Graphics Port (AGP) or other graphics bus, an Enhanced Industry Standard Architecture (EISA) bus, a Front Side Bus (FSB), a HyperTransport (HT) interconnect, an Industry Standard Architecture (ISA) bus, an InfiniBand interconnect, a Low Pin Count (LPC) bus, a memory bus, a MicroChannel Architecture (MCA) bus, a Peripheral Component Interconnect (PCI) bus, a PCI-Express (PCI-X) bus, a Serial Advanced Technology Attachment (SATA) bus, a Video Electronics Standards Association Local (VLB) bus, or other suitable buses or a combination of two or more of these. Where appropriate, the bus 510 may include one or more buses. Although the embodiments of the present application describe and illustrate specific buses, the present application contemplates any suitable bus or interconnect.

[0124] The electronic device of the above embodiment is used to implement the data processing method for the corresponding aircraft ground test in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiments, which will not be elaborated herein.

[0125] In addition, in combination with the data processing method for the aircraft ground test in the above embodiments, the embodiments of the present application can provide a computer storage medium to implement. Computer program instructions are stored on the computer storage medium; when the computer program instructions are executed by a processor, the data processing method for any one of the aircraft ground tests in the above embodiments is implemented.

[0126] The computer instructions stored in the storage medium of the above embodiment are used to cause the computer to execute the data processing method for the aircraft ground test as described in any of the foregoing embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be elaborated herein.

[0127] The embodiments of the present application also provide a computer program product, including a computer program, which when executed by a processor implements the data processing method for any one of the aircraft ground tests in the above embodiments.

[0128] In some embodiments, the computer program instructions may be executed by one or more processors of the computer so that the computer and / or the processor execute the data processing method for the aircraft ground test described in the above embodiments. Corresponding to the execution subject of each step in the respective embodiments of the data processing method for the aircraft ground test, the processor executing the corresponding step may belong to the corresponding execution subject.

[0129] The computer program product of the above embodiments is used to cause the computer and / or the processor to execute the data processing method for the ground test of the aircraft as described in any of the above embodiments, and has the beneficial effects of the corresponding method embodiments, which will not be elaborated here.

[0130] It should be clear that the present application is not limited to the specific configurations and processes described above and shown in the figures. For the sake of brevity, the detailed descriptions of known methods are omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of the present application is not limited to the specific steps described and shown. Those skilled in the art can make various changes, modifications, and additions, or change the order between steps after understanding the spirit of the present application.

[0131] The functional blocks shown in the above structural block diagrams can be implemented as hardware, software, firmware, or a combination thereof. When implemented in hardware, it can be, for example, an electronic circuit, an application-specific integrated circuit (ASIC), appropriate firmware, a plug-in, a functional card, etc. When implemented in software, the elements of the present application are programs or code segments used to perform the required tasks. The program or code segment can be stored in a machine-readable medium or transmitted via a data signal carried in a carrier wave over a transmission medium or a communication link. "Machine-readable medium" can include any medium capable of storing or transmitting information. Examples of machine-readable media include electronic circuits, semiconductor memory devices, ROM, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical discs, hard disks, fiber optic media, radio frequency (RF) links, etc. The code segment can be downloaded via a computer network such as the Internet, intranet, etc.

[0132] It should also be noted that the exemplary embodiments mentioned in the present application describe some methods or systems based on a series of steps or devices. However, the present application is not limited to the order of the above steps, that is, the steps can be executed in the order mentioned in the embodiments, or different from the order in the embodiments, or several steps can be executed simultaneously.

[0133] As described above with reference to the flowcharts and / or block diagrams of methods, apparatuses (systems), and computer program products according to embodiments of the present disclosure. It should be understood that each block in the flowchart and / or block diagram, and the combinations of blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device to produce a machine, such that the instructions executed by the processor of the computer or other programmable data processing device enable the implementation of the functions / actions specified in one or more blocks of the flowchart and / or block diagram. Such a processor can be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor, or a field-programmable logic circuit. It should also be understood that each block in the block diagram and / or flowchart, and the combinations of blocks in the block diagram and / or flowchart, can also be implemented by dedicated hardware that performs the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions.

[0134] As described above, the foregoing is only the specific implementation manner of the present application. Those skilled in the art can clearly understand that for the convenience and brevity of description, the specific working processes of the systems, modules, and units described above can refer to the corresponding processes in the foregoing method embodiments, and will not be described herein again. It should be understood that the protection scope of the present application is not limited thereto. Any person skilled in the art can easily think of various equivalent modifications or substitutions within the technical scope disclosed in the present application, and these modifications or substitutions should all be covered by the protection scope of the present application.

Claims

1. A data processing method for aircraft ground test, characterized in that: include: Display multiple preset test plans corresponding to aircraft ground tests; The preset test plan includes at least one test instruction; In response to a first operation of a user selecting a target preset test scheme from the plurality of preset test schemes, determining the target preset test scheme from the plurality of preset test schemes; Execute each test instruction included in the target preset test plan.

2. The method according to claim 1, characterized in that Execute each test instruction included in the target preset test plan, specifically including: For each test instruction included in the target preset test scheme, determining the instruction type of the test instruction; the instruction type includes a first type, a second type or a third type; In response to determining that the instruction type is the first type, executing the test instruction after the timing is completed; or, in response to determining that the instruction type is the second type, obtaining a judgment condition corresponding to the test instruction, obtaining first target test data corresponding to the judgment condition from historical test data, and executing the test instruction when determining that the test instruction satisfies the judgment condition based on the judgment condition and the first target test data; the historical test data is generated when executing each test instruction included in the target preset test scheme; Or, in response to determining that the instruction type is the third type, executing the test instruction.

3. The method according to claim 2, characterized in that The historical data includes multiple test data, each test data includes multiple test values; each test data has a preset number of test values ​​stored in the local memory, and the test values ​​stored in the local memory are the latest multiple test values.

4. The method according to claim 1, characterized in that Before determining the target preset test scheme from the plurality of preset test schemes, the method further includes: In response to determining that the target preset test scheme is not included in the plurality of preset test schemes, determining an alternative preset test scheme having the most overlaps with the test instructions of the target preset test scheme from the plurality of preset test schemes; Display multiple preset test instructions; In response to a second operation for selecting a target test instruction from the plurality of preset test instructions, determining a target test instruction from the plurality of preset test instructions; the target preset instruction is a test instruction required by the target preset test scheme and not included in the alternative preset scheme; The target preset test solution is generated based on the target preset instruction and the alternative preset solution, and the target preset test solution is added to multiple preset test solutions.

5. The method according to claim 1, characterized in that Execute each test instruction included in the target preset test plan, specifically including: For each test instruction included in the target preset test plan, determining whether a safety warning condition is triggered during the execution of the test instruction; In response to triggering the safety warning condition, determining a danger level corresponding to the triggered safety warning condition; A safety protection instruction is generated based on the danger level, and the safety prevention and control instruction is output; the safety protection instruction includes one or more of an alarm prompt and a mandatory issuance of safety protection parameters.

6. The method according to claim 1, characterized in that After executing each test instruction included in the target preset test scheme, the method further includes: Displaying a plurality of preset interpretation schemes; the preset interpretation schemes include at least one interpretation instruction; In response to a third operation of the user selecting a target preset interpretation scheme from the plurality of preset interpretation schemes, determining the target preset interpretation scheme from the plurality of preset interpretation schemes; Acquire second target test data from historical test data based on the target preset interpretation scheme; the historical test data is generated when each test instruction included in the target preset test scheme is executed; Executing each interpretation instruction included in the target preset interpretation scheme based on the second target test data; A reading result is generated based on the execution result of each reading instruction, and the reading result is displayed.

7. The method according to claim 6, characterized in that After determining a target preset interpretation scheme from a plurality of preset interpretation schemes, the method further includes: Obtaining a default interpretation scheme corresponding to the target preset test scheme; In response to determining that the target preset interpretation scheme is different from the default interpretation scheme, a prompt message indicating that the current target preset interpretation scheme is abnormal is issued.

8. The method according to claim 6, characterized in that The second target test data includes first type data and second type data; the first type data includes multiple test data, each test data includes multiple test values; each test data has a preset number of test values ​​stored in the local memory, and the test values ​​stored in the local memory are the latest multiple test values ​​generated; the second type data is stored in the local memory, and when the second type data is newly generated, the second type data in the local memory is replaced based on the newly generated second type data.

9. An electronic device, characterized in that: The device comprises: a processor and a memory storing computer program instructions; when the processor executes the computer program instructions, the method according to any one of claims 1 to 8 is implemented.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer program instructions, which, when executed by a processor, implement the data processing method for an aircraft ground test as described in any one of claims 1 to 8.

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