Label for measuring resistance and display device including same

Abstract

A tag for measuring resistance and a display device including the same are provided. The tag for measuring resistance includes: a substrate; an auxiliary electrode on the substrate and having two portions spaced apart from each other with an opening therebetween; and a second electrode located in the opening, in which the auxiliary electrode includes a first layer and a second layer, the second layer is located between the first layer and the substrate, the auxiliary electrode has an undercut structure and some areas of the first layer do not overlap a top surface of the second layer, and the second electrode is in contact with the auxiliary electrode from a side surface of the auxiliary electrode.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims the priority of Korean Patent Application No. 10-2023-0165607 filed in the Korean Intellectual Property Office on November 24, 2023, the entire contents of which are incorporated herein by reference. Technical Field

[0003] The present invention relates to a tag for measuring resistance and a display device including the tag for measuring resistance. Background Art

[0004] As multimedia develops, the importance of display devices is gradually increasing. For example, various display devices such as liquid crystal display (LCD) devices and light emitting diode (LED) display devices for visualizing multimedia information are being developed.

[0005] Among display devices, light-emitting display devices include light-emitting devices that are self-luminous devices. Self-luminous devices do not require additional external light sources, so that brightness and color can be independently controlled for each pixel, thereby achieving infinite contrast and being able to produce true black and more vivid colors.

[0006] The light emitting device may include two opposing electrodes and a light emitting layer interposed therebetween. Electrons and holes respectively provided from the two opposing electrodes are recombined in the light emitting layer to generate excitons, and the generated excitons transition from an excited state to a ground state to emit light.

[0007] Since these light-emitting display devices do not require a separate light source, they not only consume less power and can be configured to be lightweight and thin, but also have high-quality characteristics such as a wide viewing angle, high brightness and contrast, and a fast response speed, and thus have attracted a lot of attention as next-generation display devices. Summary of the invention

[0008] The embodiment provides a resistance measuring tag that can measure the resistance between a second electrode (cathode) and an auxiliary electrode, and a display device including the resistance measuring tag.

[0009] A label for measuring resistance according to an embodiment of the present invention includes: a substrate; an auxiliary electrode, which is located on the substrate and has two parts spaced apart from each other, with an opening between the two parts; and a second electrode, which is located in the above-mentioned opening, wherein the auxiliary electrode includes a first layer and a second layer, the second layer is located between the first layer and the substrate, the auxiliary electrode has an undercut structure and some areas of the first layer do not overlap with the top surface of the second layer, and the second electrode contacts the auxiliary electrode from the side of the auxiliary electrode.

[0010] Two portions of the auxiliary electrode spaced apart from each other may be electrically connected through the second electrode.

[0011] The tag for measuring resistance may further include a partition wall located on the substrate, wherein the partition wall may include an opening, and the second electrode may be located within the opening of the partition wall.

[0012] The partition wall may include a first layer and a second layer, the first layer of the partition wall may be located between the second layer of the partition wall and the substrate, and a portion of the first layer of the partition wall may not overlap with the second layer of the partition wall.

[0013] The tag for measuring resistance may further include a light emitting layer between the substrate and the second electrode.

[0014] The tag for measuring resistance may further include a first electrode between the substrate and the light emitting layer.

[0015] The second electrode may not contact the first layer of the auxiliary electrode.

[0016] The contact resistance between the second electrode and the auxiliary electrode may be measured on the upper surface of the auxiliary electrode.

[0017] A display device according to an embodiment of the present invention includes: a substrate including a display area and a non-display area; and a resistance measuring tag located in the display area or the non-display area, wherein the resistance measuring tag includes: a first auxiliary electrode located on the substrate and having two parts spaced apart from each other, wherein an opening is interposed between the two parts; and a first second electrode located in the above-mentioned opening, wherein the first auxiliary electrode includes a first layer and a second layer, the second layer is located between the first layer and the substrate, the first auxiliary electrode has an undercut structure and some areas of the first layer do not overlap with a top surface of the second layer, and the first second electrode contacts the first auxiliary electrode from a side of the first auxiliary electrode.

[0018] The display device further includes a plurality of pixels located in the display area, wherein a second electrode can be provided for each of the plurality of pixels, and two of the second electrodes respectively located in two adjacent pixels of the plurality of pixels can be electrically connected to each other via a second auxiliary electrode.

[0019] In a plurality of pixels located in the display area, each of the second second electrodes may contact the second auxiliary electrode from a side of the second auxiliary electrode.

[0020] In the display area, the second auxiliary electrode may include a first layer and a second layer, the second layer may be located between the first layer and the substrate, the second auxiliary electrode may have an undercut structure, and some areas of the first layer may not overlap with a top surface of the second layer.

[0021] Among the plurality of pixels located in the display area, for each of the plurality of pixels, the second auxiliary electrode may include an opening, and for each of the plurality of pixels, each of the second electrodes may be located within the opening.

[0022] Each of the plurality of pixels located in the display area may further include an encapsulation layer covering the opening of the second auxiliary electrode, and each of the encapsulation layers may be individually positioned for each of the plurality of pixels.

[0023] Two portions of the first auxiliary electrode of the resistance-measuring tag that are spaced apart from each other may be electrically connected through the first and second electrodes.

[0024] The resistance measuring tag may further include a partition wall located on the substrate, the partition wall may include an opening, and the first and second electrodes may be located within the opening of the partition wall.

[0025] The partition wall of the resistance measuring tag may include a first layer and a second layer, the first layer may be located between the second layer and the substrate, and a portion of the first layer may not overlap with the second layer.

[0026] The resistance measuring tag may further include a light emitting layer between the substrate and the first and second electrodes.

[0027] The resistance-measuring tag may further include a first electrode between the substrate and the light-emitting layer.

[0028] The first and second electrodes of the resistance-measuring tag may not contact the first layer of the first auxiliary electrode.

[0029] According to an embodiment of the present invention, there are provided a resistance measuring tag capable of measuring the resistance between a second electrode (cathode) and an auxiliary electrode, and a display device including the resistance measuring tag. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Embodiments of the present invention will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings, in which:

[0031] Figure 1 A display device according to an embodiment of the present invention is shown;

[0032] Figure 2 Shown is located Figure 1 A plan view of pixels in a display area DA;

[0033] Figure 3 It is along Figure 2 A cross-sectional view taken along line II';

[0034] Figure 4 shows a planar shape of a tag for measuring resistance according to an embodiment of the present invention;

[0035] Figure 5 It is along Figure 4 A cross-sectional view taken along line AB;

[0036] Figure 6 A cross-sectional view of a tag for measuring resistance according to an embodiment of the present invention is shown;

[0037] Figure 7 A cross-sectional view of a tag for measuring resistance according to an embodiment of the present invention is shown;

[0038] Figure 8 A method for measuring contact resistance using a tag for measuring resistance according to an embodiment of the present invention is shown;

[0039] Figures 9 to 11 Each shows a planar shape of a tag for measuring resistance according to an embodiment of the present invention; and

[0040] Figures 12 to 23 A method of manufacturing a tag for measuring resistance according to an embodiment of the present invention is shown.

[0041] because Figures 1 to 23 The drawings in the drawings are intended for illustrative purposes, and thus the elements in the drawings are not necessarily drawn to scale. For example, some of the elements may be enlarged or exaggerated for clarity. DETAILED DESCRIPTION

[0042] Hereinafter, various embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily implement the present invention.

[0043] The present invention may be embodied in many different forms and is not limited to the embodiments described herein.

[0044] In order to clearly explain the present invention, parts irrelevant to the description are omitted, and the same or similar components are assigned the same reference numerals throughout the specification.

[0045] When a part of a layer, film, region, or plate is referred to as being “on” or “on” another part, this includes not only the case where the part is “directly on” the other part but also the case where there are intervening parts therebetween.

[0046] In contrast, when a part is referred to as being "directly on top of" another part, this means there are no other parts therebetween.

[0047] It will be understood that "above" or "on" a reference portion means above or below the reference portion, and not necessarily in a direction opposite to gravity. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures.

[0048] Throughout the specification, when a part is referred to as “comprising” a certain element, it means that the part can further include other elements, rather than excluding the other elements, unless there is a specific description contrary thereto.

[0049] Throughout the specification, when “on a plane” is mentioned, this means when the target portion is viewed from above, and when “in a cross section” is mentioned, this means when the cross section of the target portion is cut vertically and viewed from the side.

[0050] Now, a tag for measuring resistance and a display device including the tag for measuring resistance according to embodiments of the present invention will be described below with reference to the accompanying drawings.

[0051] Figure 1 A display device according to an embodiment of the present invention is shown.

[0052] refer to Figure 1 , the display device according to the embodiment of the present invention may include a display area DA and a non-display area NDA.

[0053] like Figure 1 As shown in FIG. 1 , the resistance measuring tag 300 , which is also referred to as the tag 300 for measuring resistance, may be located in the non-display area NDA. However, this is an example, and the tag 300 for measuring resistance may be located in the display area DA.

[0054] The present invention relates to a resistance measurement tag 300 for measuring the contact resistance between the second electrode (cathode) and the auxiliary electrode of a pixel located in the display area DA. The resistance measurement tag 300 may also include at least the second electrode and the auxiliary electrode and may be located in the non-display area NDA or the display area DA.

[0055] Figure 2 Shown is located Figure 1 A plan view of pixels in the display area DA.

[0056] Figure 3 It is along Figure 2 A cross-sectional view taken along line II'.

[0057] refer to Figure 2 and Figure 3, the display device according to the embodiment of the present invention includes a substrate SUB, a first electrode 191 on the substrate SUB, and a partition wall 350 on the first electrode 191. Similar to the display device, the substrate SUB may include a display area DA and a non-display area NDA.

[0058] The first electrode 191 may be electrically connected to a transistor (not shown) positioned on the substrate SUB. The transistor may be a driving transistor for driving a light emitting device LED which will be described.

[0059] refer to Figure 3 , the light-emitting layer EML may be located in the opening 355 of the partition wall 350. The light-emitting layer EML may include an organic light-emitting material or an inorganic light-emitting material. For example, the light-emitting layer EML may include a fluorescent material or a phosphorescent material. The light-emitting layer EML may also include quantum dots or quantum rods as a light-emitting material. In addition, the light-emitting layer EML may include an inorganic light-emitting material that may include a crystalline semiconductor material such as, for example, gallium nitride (GaN), indium phosphide (InP), etc.

[0060] Figure 2 and Figure 3 Each shows a red pixel PXR, a green pixel PXG, and a blue pixel PXB, and Figure 2 and Figure 3 As shown in FIG, the red light emitting layer EMLR may provide red light in the red pixel PXR, the green light emitting layer EMLG may provide green light in the green pixel PXG, and the blue light emitting layer EMLB may provide blue light in the blue pixel PXB. However, this is only an example, and the present invention is not limited thereto.

[0061] refer to Figure 3 , the auxiliary electrode SW may be positioned to overlap with the partition wall 350 .

[0062] The auxiliary electrode SW may include a first layer SW1 and a second layer SW2, and may have an opening OP overlapping the opening 355 of the partition wall 350. The second layer SW2 may be located between the first layer SW1 and the partition wall 350. For example, the second layer SW2 may be located between the first layer SW1 and the substrate SUB.

[0063] like Figure 3 As shown in , the auxiliary electrode SW may have an undercut structure in the opening OP, and the edge of the first layer SW1 may protrude more than the edge of the second layer SW2 at the opening OP of the auxiliary electrode SW. For example, some areas of the first layer SW1 may not overlap with the top surface of the second layer SW2.

[0064] This will be explained separately later, but this is a structure for forming the second electrode 270 within the opening OP of the auxiliary electrode SW.

[0065] refer to Figure 3 , the second electrode 270 is located in the opening OP of the auxiliary electrode SW.

[0066] The second electrode 270 may be located within each of the openings OP of the auxiliary electrode SW. For example, the second electrode 270 may be formed in each of the openings formed in the red pixel PXR, the green pixel PXG, and the blue pixel PXB.

[0067] like Figure 3 As shown in , the first electrode 191, the light-emitting layer EML and the second electrode 270 can form a light-emitting device LED. In addition, the light-emitting device LED may further include a hole transport region arranged between the first electrode 191 and the light-emitting layer EML and an electron transport region arranged between the light-emitting layer EML and the second electrode 270. The hole transport region may include at least one of a hole injection layer, a hole transport layer and an electron blocking layer. The electron transport region may include at least one of an electron injection layer, an electron transport layer and a hole blocking layer. However, the present invention is not limited thereto,

[0068] The second electrode 270 contacts the auxiliary electrode SW from the side. For example, the second electrode 270 contacts the side surface of the auxiliary electrode SW exposed to the opening OP of the auxiliary electrode SW. For example, a plurality of second electrodes 270 respectively located in a plurality of pixels are connected as one through the auxiliary electrode SW.

[0069] In an embodiment of the present invention, shapes of the second electrodes 270 respectively used for the red pixel PXR, the green pixel PXG, and the blue pixel PXB may be different from each other in a plan view.

[0070] In a typical display device, the second electrode 270 is positioned as a single plate throughout a plurality of pixels, but in a display device according to an embodiment of the present invention, the second electrode 270 is provided individually for each pixel, and the display device has a structure in which two second electrodes 270 are connected as one body through the auxiliary electrode SW. For example, two second electrodes 270 respectively located in two adjacent pixels in a pixel are electrically connected to each other through the auxiliary electrode SW.

[0071] Therefore, the second electrode 270 of each pixel receives the driving voltage through the auxiliary electrode SW, and the contact resistance between the second electrode 270 and the auxiliary electrode SW directly affects the brightness of the light emitting device LED.

[0072] Therefore, in the Figure 2 and Figure 3In the display device of the structure shown in , it may be necessary to measure the contact resistance between the second electrode 270 and the auxiliary electrode SW. However, due to the structure of the display device according to the embodiment of the present invention, it is not easy to measure the contact resistance between the second electrode 270 and the auxiliary electrode SW.

[0073] Reference again Figure 3 , the encapsulation layer TFE is located on the second electrode 270. For example, the encapsulation layer TFE may be located throughout the second electrode 270 and the auxiliary electrode SW. The encapsulation layer TFE may cover the light emitting device LED to prevent the light emitting device LED from being damaged or deteriorated by external impurities.

[0074] The encapsulation layer TFE includes a second encapsulation layer TFE2 and a third encapsulation layer TFE3 located on the front side of the display device, and a first encapsulation layer TFE1 covering the opening OP of the auxiliary electrode SW in each pixel.

[0075] like Figure 3 As shown in , in order to form the light emitting layer EML of each pixel, the first encapsulation layer TFE1 covers the opening OP of the auxiliary electrode SW, and therefore it is not easy to measure the contact resistance between the second electrode 270 and the auxiliary electrode SW. The contact resistance between the auxiliary electrode SW and the second electrode 270 can be measured on the two upper surfaces of the two parts of the auxiliary electrode SW separated from each other. When the upper surface of the auxiliary electrode SW is covered by the encapsulation layer TFE, it may be difficult to measure the contact resistance between the second electrode 270 and the auxiliary electrode SW. However, the display device according to an embodiment of the present invention forms a separate resistance measurement tag for measuring the contact resistance between the second electrode 270 and the auxiliary electrode SW.

[0076] Figure 4 FIG. 2 shows a planar shape of a tag 300 for measuring resistance according to an embodiment of the present invention, and FIG. Figure 5 It is along Figure 4 A cross-sectional view taken along line AB.

[0077] refer to Figure 4 and Figure 5 , a partition wall 350 including an opening 355 is located on the substrate SUB.

[0078] The partition wall 350 may include a first layer 351 and a second layer 352. The first layer 351 may be located between the second layer 352 and the substrate SUB.

[0079] The second layer 352 may have a planar area smaller than that of the first layer 351, and as Figure 5 As shown in , a portion of the first layer 351 may not overlap with the second layer 352 and the first layer 351 and the second layer 352 may have a stepped structure.

[0080] The light emitting layer EML and the second electrode 270 are located within the opening 355 of the partition wall 350 .

[0081] The auxiliary electrode SW is positioned to overlap the partition wall 350 and includes a first layer SW1 and a second layer SW2. The second layer SW2 may be located between the first layer SW1 and the partition wall 350. For example, the second layer SW2 may be located between the first layer SW1 and the substrate SUB.

[0082] The second electrode 270 is located in the opening OP of the auxiliary electrode SW and contacts the auxiliary electrode SW from the side. For example, the second electrode 270 contacts the side surface of the auxiliary electrode SW (eg, the second layer SW2 ) exposed to the opening OP of the auxiliary electrode SW.

[0083] In the embodiment of the present invention, the second electrode 270 of the resistance measuring tag 300 does not contact the first layer SW1 of the auxiliary electrode SW.

[0084] The auxiliary electrode SW may have an undercut structure, and an edge of the first layer SW1 may protrude more than an edge of the second layer SW2 at the opening OP of the auxiliary electrode SW.

[0085] refer to Figure 4 and Figure 5 , the tag 300 for measuring resistance according to the embodiment of the present invention has a structure in which two parts of the auxiliary electrode SW are separated from each other by the opening OP and connected to each other by the second electrode 270 .

[0086] Therefore, when the resistance is measured on both upper surfaces of two portions of the auxiliary electrode SW that are separated from each other, the contact resistance between the auxiliary electrode SW and the second electrode 270 may be measured.

[0087] like Figure 5 As shown in FIG. 1 , the resistance measuring tag 300 according to an embodiment of the present invention may not include the first electrode. This is because the resistance measuring tag 300 is not a pixel that emits light, so the first electrode is unnecessary.

[0088] However, in order to measure resistance in a structure similar to that of an actual pixel, the resistance-measuring tag 300 may include a first electrode.

[0089] Figure 6 A cross-sectional view of a tag for measuring resistance according to an embodiment of the present invention is shown.

[0090] refer to Figure 6 , except that the tag for measuring resistance according to the embodiment of the present invention further includes a first electrode 191, which Figure 5The labels for measuring resistance of the embodiments are the same. Detailed description of the same components is omitted. Figure 6 As shown in FIG. 1 , a tag for measuring resistance according to an embodiment of the present invention may include a Figure 3 The structure of the light emitting device LED shown in FIG. 1 is similar to the structure of the first electrode 191 , the light emitting layer EML, and the second electrode 270 of the light emitting device LED.

[0091] Figure 6 The resistance measurement tag in FIG. 2 has a stack structure similar to that of an actual pixel, and can more accurately measure the contact resistance between the second electrode 270 and the auxiliary electrode SW.

[0092] Figure 7 A cross-sectional view of a tag for measuring resistance according to an embodiment of the present invention is shown.

[0093] refer to Figure 7 , except that the tag for measuring resistance according to the embodiment of the present invention does not include the emission layer EML, which is the same as Figure 5 The labels for measuring resistance of the embodiments are the same. Detailed description of the same components is omitted.

[0094] exist Figure 7 In the case of FIG. 2 , since the tag for measuring resistance includes only the second electrode 270 and the auxiliary electrode SW, it can be manufactured with a simple structure.

[0095] Since the tag for measuring resistance is not the area where light emission occurs, it does not need to include the first electrode and the light-emitting layer, and the contact resistance between the second electrode and the auxiliary electrode can be measured. In other words, for the tag for measuring resistance according to an embodiment of the present invention, components or layers other than the second electrode and the auxiliary electrode can be selectively removed. However, the present invention is not limited to this. For example, in addition to the second electrode and the auxiliary electrode, other components or layers that do not interfere with the measurement of the contact resistance between the second electrode and the auxiliary electrode can be added to the structure of the tag for measuring resistance.

[0096] Figure 8 A method of measuring contact resistance using a tag for measuring resistance according to an embodiment of the present invention is shown.

[0097] refer to Figure 8 , the contact resistance between the auxiliary electrode SW and the second electrode 270 may be measured by measuring the resistance on the upper surface of each of two portions of the auxiliary electrode SW separated from each other by the opening OP.

[0098] Figure 4The shape of the resistance measuring tag 300 shown in FIG. 2 is only an example, and the present invention is not limited thereto. For example, as long as the two parts of the auxiliary electrode SW are separated from each other by the opening OP and connected by the second electrode 270, the resistance measuring tag 300 according to the embodiment of the present invention may be modified into various shapes.

[0099] Figures 9 to 11 Each shows a planar shape of a tag 300 for measuring resistance according to an embodiment of the present invention.

[0100] like Figures 9 to 11 As shown in , the planar shape of the resistance-measuring tag 300 may be changed.

[0101] In an embodiment of the present invention, the planar shape of the second electrode 270 of the tag 300 for measuring resistance may be different from the planar shapes of the second electrodes 270 of the red pixel PXR, the green pixel PXG, and the blue pixel PXB. However, the present invention is not limited thereto.

[0102] exist Fig. 9 In the embodiment, the second electrode 270 may be disposed diagonally between two portions of the auxiliary electrode SW to connect the two portions of the auxiliary electrode SW that are separated from each other. Fig.10 In the embodiment, the second electrode 270 may be arranged to extend along a vertical axis between two portions of the auxiliary electrode SW on a plane to connect the two portions of the auxiliary electrode SW that are separated from each other. Fig.11 In the embodiment, the second electrode 270 may be arranged to extend along a horizontal axis between two portions of the auxiliary electrode SW on a plane to connect the two portions of the auxiliary electrode SW that are separated from each other.

[0103] As long as the two parts of the auxiliary electrode SW are separated from each other by the opening OP and connected by the second electrode 270, Figures 9 to 11 Structures different from the structure in are also included in the present invention.

[0104] Figures 12 to 23 A method of manufacturing a tag for measuring resistance according to an embodiment of the present invention is shown.

[0105] exist Figures 12 to 23 , the even-numbered drawings show a plan view of a method of manufacturing a tag for measuring resistance, and the odd-numbered drawings show a cross section taken along line AB of the even-numbered drawings.

[0106] refer to Fig.12 and Fig.13 , prepare the SUB substrate.

[0107] Next, refer to Fig.14 and Fig.15, a first layer 351 of partition walls is formed on the substrate SUB.

[0108] Next, refer to Fig.16 and Fig.17 , an opening is formed in the first layer 351 of the partition wall 350, and the second layer 352 is conformally formed on the entire surface. For example, the second layer 352 is conformally formed to cover the top surface of the first layer 351 and the side surface of the first layer 351 exposed by the opening formed in the first layer 351 and the top surface of the substrate SUB exposed by the opening formed in the first layer 351.

[0109] Next, refer to Fig.18 and Fig.19 , forming an auxiliary electrode SW.

[0110] The auxiliary electrode SW includes a first layer SW1 and a second layer SW2.

[0111] The first layer SW1 and the second layer SW2 may include different materials, and the etching rates of the first layer SW1 and the second layer SW2 may be different. For example, the second layer SW2 may have an etching selectivity with respect to the first layer SW1.

[0112] Next, refer to Fig. 20 and Fig.21 , forming an opening OP of the auxiliary electrode SW.

[0113] During this process, the auxiliary electrode SW may be divided into two parts which are not connected to each other.

[0114] During the etching process for forming the opening OP, each layer may have a different etching rate, so the sides of the opening OP do not match and an undercut structure or a step may be formed. For example, the etching rate of the second layer SW2 may be higher than that of the first layer SW1.

[0115] like Fig.21 As shown in , the auxiliary electrode SW may have an undercut structure, and at the opening OP of the auxiliary electrode SW, an edge of the first layer SW1 may protrude more than an edge of the second layer SW2 .

[0116] In addition, a step may be formed between the first layer 351 and the second layer 352 of the partition wall 350. For example, an etching rate of the second layer 352 of the partition wall 350 may be higher than an etching rate of the first layer 351 of the partition wall 350.

[0117] Next, refer to Fig. 22 and Fig.23 , the emission layer EML and the second electrode 270 are formed in the opening OP of the auxiliary electrode SW.

[0118] like Fig.23 As shown in FIG. 2 , the second electrode 270 may contact the auxiliary electrode SW from the side. For example, the second electrode 270 contacts the side surface of the auxiliary electrode SW exposed to the opening OP of the auxiliary electrode SW.

[0119] Accordingly, two portions of the auxiliary electrode SW, which are separated from each other in the previous step, may be connected to each other through the second electrode 270 .

[0120] After manufacturing a tag for measuring resistance in this manner, the contact resistance between the auxiliary electrode SW and the second electrode 270 may be measured by measuring the resistance on the upper surfaces of two portions of the auxiliary electrode SW separated from each other.

[0121] As described above, the resistance measuring tag and the display device including the resistance measuring tag according to the embodiment of the present invention have a structure in which the separated portions of the auxiliary electrode are connected through the second electrode, and the contact resistance between the auxiliary electrode and the second electrode can be measured by measuring the resistance on the upper surface of the separated portions of the auxiliary electrode.

[0122] Therefore, in a display device in which second electrodes of pixels are connected to each other through the auxiliary electrode, the contact resistance between the second electrode and the auxiliary electrode can be accurately measured.

[0123] Although the embodiments of the present invention have been described in detail above, the present invention is not limited thereto and various modifications and improvements may be made thereto by those skilled in the art without departing from the spirit and scope of the present invention as defined in the claims.

Claims

1. A tag for measuring resistance, comprising: substrate; an auxiliary electrode located on the substrate and having two portions spaced apart from each other, wherein an opening is interposed between the two portions; a second electrode, located in the opening, Wherein, the auxiliary electrode comprises a first layer and a second layer, The second layer is located between the first layer and the substrate, The auxiliary electrode has an undercut structure and some regions of the first layer do not overlap with a top surface of the second layer, and The second electrode contacts the auxiliary electrode from a side surface of the auxiliary electrode.

2. The tag for measuring resistance according to claim 1, wherein The two portions of the auxiliary electrode that are spaced apart from each other are electrically connected through the second electrode.

3. The tag for measuring resistance according to claim 1, further comprising: a partition wall, located on the substrate, wherein the partition wall comprises an opening, and The second electrode is located in the opening of the partition wall.

4. The tag for measuring resistance according to claim 3, wherein The partition wall comprises a first layer and a second layer, The first layer of the partition wall is located between the second layer of the partition wall and the substrate, and A portion of the first layer of the partition wall does not overlap with the second layer of the partition wall.

5. The tag for measuring resistance according to claim 1, further comprising: The light-emitting layer is located between the substrate and the second electrode.

6. The tag for measuring resistance according to claim 5, further comprising: The first electrode is located between the substrate and the light-emitting layer.

7. The tag for measuring resistance according to claim 1, wherein The second electrode does not contact the first layer of the auxiliary electrode.

8. The tag for measuring resistance according to any one of claims 1 to 7, wherein A contact resistance between the second electrode and the auxiliary electrode is measured on an upper surface of the auxiliary electrode.

9. A display device, comprising: A substrate including a display area and a non-display area; as well as a resistance measurement tag, located in the display area or the non-display area, Wherein, the resistance measurement tag comprises: a first auxiliary electrode located on the substrate and having two portions spaced apart from each other, wherein an opening is interposed between the two portions; and The first and second electrodes are located in the opening, Wherein, the first auxiliary electrode includes a first layer and a second layer, The second layer is located between the first layer and the substrate, The first auxiliary electrode has an undercut structure and some regions of the first layer do not overlap with a top surface of the second layer, and The first second electrode contacts the first auxiliary electrode from a side surface of the first auxiliary electrode.

10. The display device according to claim 9, further comprising: A plurality of pixels are located in the display area. Wherein, a second electrode is provided for each of the plurality of pixels, and Two of the second second electrodes respectively located in two adjacent pixels among the plurality of pixels are electrically connected to each other through the second auxiliary electrode.

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