Calibration method of electronic system and related equipment

Abstract

The invention provides a calibration method of an electronic system and related equipment, and the calibration method comprises the steps: adjusting the resistance of a resistor module in response to a calibration instruction; acquiring the real-time measurement voltage of the adjusted resistance module; obtaining a current error coefficient of the detection equipment according to the adjusted resistance, the adjusted real-time measurement voltage and the power supply voltage of the power supply module; and calibrating the detection current of the detection equipment according to the current error coefficient. The method comprises the following steps: adjusting the resistance of a resistance module, obtaining the adjusted real-time measurement voltage of the resistance module, and obtaining the current error coefficient of the detection equipment according to the adjusted resistance, the adjusted real-time measurement voltage and the power supply voltage of a power supply module; the detection current of the detection equipment can be automatically calibrated according to the current error coefficient.

Description

Technical Field

[0001] This application belongs to the technical field of current sampling, and particularly relates to a calibration method for an electronic system and related devices. Background Art

[0002] Before the chip under test leaves the factory, it is necessary to use an electronic system to perform multiple function tests on the chip under test. The detection current in the electronic system will affect the detection accuracy. Therefore, before performing multiple function tests on the chip under test, a method is needed to calibrate the detection current in the electronic system. Summary of the Invention

[0003] In view of this, the embodiments of this application provide a calibration method for an electronic system and related devices, which automatically calibrate the detection current of the detection device by adjusting the size of the resistance module.

[0004] The first aspect of this application provides a calibration method for an electronic system. The electronic system includes a detection device, and the detection device includes a power supply module, a resistance module, and a controller connected in sequence. The calibration method includes: in response to a calibration instruction, adjusting the resistance of the resistance module; obtaining the real-time measured voltage of the adjusted resistance module; obtaining the current error coefficient of the detection device according to the adjusted resistance, the adjusted real-time measured voltage, and the power supply voltage of the power supply module; and calibrating the detection current of the detection device according to the current error coefficient.

[0005] In the above technical solution, after the controller adjusts the resistance of the resistance module and obtains the real-time measured voltage of the adjusted resistance module, the current error coefficient of the detection device can be obtained according to the adjusted resistance, the adjusted real-time measured voltage, and the power supply voltage of the power supply module. Then, the detection current of the detection device can be automatically calibrated according to the current error coefficient, improving the calibration efficiency and saving manpower and material resources.

[0006] In some embodiments of the first aspect, the electronic system further includes an amplifier and an analog-to-digital converter. Obtaining the real-time measured voltage of the resistance module includes: obtaining the initial real-time measured voltage of the adjusted resistance module, controlling the amplifier to amplify the initial real-time measured voltage to obtain a stage real-time measured voltage; and controlling the analog-to-digital converter to convert the stage real-time measured voltage to obtain the real-time measured voltage.

[0007] In some embodiments of the first aspect, the resistance module includes a calibration module and a sampling resistor. One end of the calibration module is connected to the power supply module, the other end is connected to the sampling resistor, and the other end of the sampling resistor is connected to the controller. Adjusting the resistance of the resistance module includes: controlling the sampling resistor to be connected to the first calibration resistor of the calibration module; controlling the sampling resistor to be disconnected from the first calibration resistor and connected to the second calibration resistor of the calibration module.

[0008] In some embodiments of the first aspect, obtaining the real-time measured voltage of the adjusted resistance module includes: after the sampling resistor is connected to the first calibration resistor, obtaining the first measured voltage of the adjusted resistance module; after the sampling resistor is connected to the second calibration resistor, obtaining the second measured voltage of the adjusted resistance module.

[0009] In some embodiments of the first aspect, obtaining the current error coefficient of the detection device based on the adjusted resistance value, the adjusted real-time measured voltage, and the supply voltage of the power supply module includes: obtaining the first cumulative resistance according to the sum of the sampling resistor and the first calibration resistor; obtaining the second cumulative resistance according to the sum of the sampling resistor and the second calibration resistor;

[0010] obtaining the first current according to the first cumulative resistance and the first measured voltage; obtaining the second current according to the first cumulative resistance and the supply voltage; obtaining the third current according to the second cumulative resistance and the second measured voltage; obtaining the fourth current according to the second cumulative resistance and the supply voltage; obtaining the current error coefficient of the detection device according to the first current, the second current, the third current, and the fourth current.

[0011] In some embodiments of the first aspect, calibrating the detected current of the detection device according to the current error coefficient includes: obtaining the calibrated detected current of the detection device according to the current error coefficient, the adjusted resistance value, and the adjusted real-time measured voltage.

[0012] In some embodiments of the first aspect, after obtaining the calibrated detected current of the detection device, the calibration method further includes: determining whether the difference between the calibrated detected current and the preset current is within a preset range; if the difference is within the preset range, determining that the detection device is a normal device; if the difference is not within the preset range, determining that the detection device is an abnormal device.

[0013] In some embodiments of the first aspect, the electronic system further includes other detection devices. After obtaining the current error coefficient of the detection device, the calibration method further includes: sending the current error coefficient to the controller of the other detection devices, so that the controller of the other detection devices calibrates the detected current according to the current error coefficient.

[0014] A second aspect of the present application provides an electronic system. The electronic system includes a detection device. The detection device includes a power supply module, a resistance module, and a controller. The controller is configured to: in response to a calibration instruction, adjust the resistance value of the resistance module; obtain the real-time measured voltage of the adjusted resistance module; obtain the current error coefficient of the detection device according to the adjusted resistance value, the adjusted real-time measured voltage, and the supply voltage of the power supply module; calibrate the detected current of the detection device according to the current error coefficient.

[0015] A third aspect of the present application provides a controller, including: a processor, adapted to execute a computer program; a computer-readable storage medium, in which a computer program is stored, and when the computer program is executed by the processor, the above-mentioned calibration method is executed. Description of the Drawings

[0016] Figure 1 FIG. 1 is a schematic structural diagram of an electronic system according to an embodiment of the present application.

[0017] Figure 2 FIG. 2 is another schematic structural diagram of an electronic system according to an embodiment of the present application.

[0018] Figure 3 FIG. 3 Figure 2 is a schematic structural diagram of a detection device of the electronic system shown in FIG. 3.

[0019] Figure 4 FIG. 4 Figure 2 is a schematic flowchart of a calibration method of the electronic system shown in FIG. 4.

[0020] Figure 5 FIG. 5 Figure 2 is another schematic flowchart of a calibration method of the electronic system shown in FIG. 5.

[0021] Figure 6 FIG. 6 Figure 2 is a schematic structural diagram of a controller of the electronic system shown in FIG. 6. Detailed Embodiments

[0022] In the present application, the term "multiple" refers to two or more. In addition, it should be understood that in the description of the present application, terms such as "first" and "second" are only used for the purpose of distinguishing descriptions, and cannot be understood as indicating or implying relative importance, nor can they be understood as indicating or implying an order.

[0023] The following briefly describes the related art:

[0024] Before the chip to be tested leaves the factory, it is necessary to use an electronic system to perform multiple function tests on the chip to be tested. The detection current in the electronic system will affect the detection accuracy. Therefore, before performing multiple function tests on the chip to be tested, a method is needed to calibrate the detection current in the electronic system.

[0025] In one scenario, as shown in Figure 1 FIG. 1, the electronic system 100 includes a computer device 10 and multiple detection devices 11. The multiple detection devices 11 are respectively connected to the computer device 10. The computer device 10 is configured to generate corresponding control instructions according to the information sent or received by the detection devices 11 to control the multiple detection devices 11 to perform calibration of the detection current.

[0026] Each detection device 11 includes a power supply module 12, an interface module 13, and a controller 14. The interface module 13 is connected between the power supply module 12 and the controller 14. The interface module 13 includes a plurality of analog load interface modules 131 connected in series.

[0027] It can be understood that the detection device 11 further includes a chip-under-test access module (not shown in the figure). The chip-under-test access module can be connected between the power supply module 12 and the interface module 13 to connect the chip under test between the power supply module 12 and the interface module 13. After the chip under test is accessed, the detection device 11 starts to detect the chip under test.

[0028] The power supply module 12 is used to provide power for the detection device 11. The analog load interface module 131 is used to plug in an analog load to enable the analog load to enter the detection device 11. An analog load refers to a device with the same package size as the chip under test and a preset resistance value inside.

[0029] The calibration method of the electronic system 100 includes the following steps:

[0030] Step (a): Calibrate the first detection device 11; specifically, step (a) includes the following steps:

[0031] Step (a1): The operator prepares 4 analog loads for the microampere (μA) current range. First, plug 2 analog loads into the analog load interface module 131 so that the resistances of the 2 analog loads are connected in series into the detection device 11.

[0032] It can be understood that due to different functional detection items, the detection device 11 has different current ranges, and the detection current under each current range needs to be calibrated separately. The current ranges include the microampere (μA) current range, the milliampere (mA) current range, and the ampere (A) current range, etc.

[0033] Step (a2): After the controller 14 receives the calibration instruction from the operator, it controls the power supply module 12 to provide power for the detection device 11.

[0034] Step (a3): The controller 14 obtains the first voltage of the interface module 13 and the second voltage of the power supply module 12.

[0035] Step (a4): The controller 14 determines the sum of the resistances of the interface module 13. It can be understood that the sum of the resistances of the interface module 13 is the sum of the resistances of the 2 analog loads.

[0036] Step (a5): The controller 14 determines the first calculated current and the second calculated current based on the following formulas (1) and (2).

[0037]

[0038] Among them, M 1 represents the first calculated current, V 1 represents the first calculated voltage, R 1 represents the sum of the resistances of the interface module 13 in step (a4).

[0039]

[0040] Among them, M 2 represents the second calculated current, V 2 represents the second calculated voltage, R 1 represents the sum of the resistances of the interface module 13 in step (a4).

[0041] Step (a6): The operator pulls out 2 analog loads from the analog load interface module 131, and then connects the resistances of the other 2 analog loads in series into the detection device 11. Then, the controller 14 executes steps (a2) to (a5) again to obtain the first calculated current calculated according to formula (1) and the second calculated current calculated according to formula (2).

[0042] Step (a7): Based on the following formula (3), the first calculated current and the second calculated current obtained in step (a5), and the first calculated current and the second calculated current obtained in step (a6), the controller 14 determines the current error coefficient of the detection current of the first detection device 11.

[0043] Among them, the detection current refers to the current used by the detection device 11 to detect the chip under test.

[0044] M 2 = kM 1 + b (3)

[0045] Among them, K and b represent the current error coefficients.

[0046] It can be understood that after obtaining the current error coefficient of the detection current, the detection current can be corrected according to the error coefficient. When the first detection device 11 detects the chip under test, using the calibrated detection current can make the functional detection of the chip under test more accurate.

[0047] Among them, the current error coefficients obtained in steps (a1) to (a7) are applicable to the detection of the chip under test by the detection device 11 in the μA current range.

[0048] It can be understood that after obtaining the error coefficient, the first current can be further used to verify whether the current error coefficient is correct. Specifically, see steps (a8) and (a9).

[0049] Step (a8): After the controller 14 obtains the first calculated voltage of the interface module 13, determines the sum of the resistances of the interface module 13, and obtains the first calculated current according to formula (1), it calculates the calibrated detected current according to the first calculated current, the current error coefficient, and formula (4).

[0050] M re = kM 1 + b (4)

[0051] Where M re represents the calibrated detected current.

[0052] Step (a9): Repeat steps (a1) to (a8), except that the operator replaces the analog load applicable to the microampere (μA) current range with an analog load applicable to the milliampere (mA) current range. It can be understood that the current error coefficient obtained in step (a8) is applicable to the detection of the chip under test by the detection device 11 in the mA current range.

[0053] Step (b): Calibrate the other detection devices 11 except the first detection device 11. It can be understood that since the multiple detection devices 11 of the electronic system 100 use the same packaging technology, after obtaining the current error coefficient of the detected current of the first detection device, the error coefficient can also be applicable to the other detection devices 11. In order to verify whether this current error coefficient is applicable to the other detection devices 11, the other detection devices 11 perform step (b). Specifically, step (b) includes the following steps:

[0054] Step (b1): The operator inserts 1 analog load belonging to the measurement range of the microampere (μA) current range into the analog load interface module 131 of each of the other detection devices 11.

[0055] Step (b2): The controller 14 of the other detection devices 11 obtains the first voltage of the interface module 13, determines the sum of the resistances of the interface module 13, and calculates the first calculated current according to formula (1). It can be understood that the sum of the resistances of the interface module 13 is the resistance value of 1 analog load.

[0056] Step (b3): Perform step (a8) to obtain the calibrated detected current, except that the sum of the resistances of the interface module 13 in step (b3) is the resistance value of 1 analog load.

[0057] Step (b4): Determine the difference between the calibrated detected current and the preset current. If the difference is within the preset range, determine that the detection device 11 is a normal device; if the difference is not within the preset range, determine that the detection device 11 is an abnormal device.

[0058] Step (b5): Perform steps (b1) to (b4), except that the operator replaces 1 analog load within the measurement range of the microampere (μA) current range with 1 analog load within the measurement range of the milliampere (mA) current range. And so on until the detection currents of all current ranges are calibrated.

[0059] It can be understood that for the above technical solution, the operator needs to continuously plug and unplug the analog load, which is likely to cause calibration failure due to human error. When calibrating the detection currents of multiple detection devices 20, the calibration efficiency is low. At the same time, the cost of the analog load is high, consuming a large amount of manpower and material resources.

[0060] In view of this, the embodiments of the present application provide a calibration method for an electronic system and related devices, which adjust the size of the resistance module to calibrate the detection current of the electronic system, automatically calibrate the detection current of the detection device, and improve the calibration efficiency and save manpower and material resources.

[0061] Please refer to Figure 2 , which is a schematic diagram of an electronic system 200 provided by an embodiment of the present application. The electronic system 200 includes a computer device 20 and multiple detection devices 21. The multiple detection devices 21 are respectively connected to the computer device 20. The computer device 20 is used to generate corresponding control instructions according to the information sent or received by the detection device 21 to control the multiple detection devices 21 to perform calibration of the detection current.

[0062] Each detection device 21 includes a power supply module 22, a resistance module 23, and a controller 24. The resistance module 23 is connected between the power supply module 22 and the controller 24.

[0063] It can be understood that the detection device 21 further includes an interface module for the chip under test (not shown in the figure). The interface module for the chip under test can be connected between the power supply module 22 and the resistance module 23 for connecting the chip under test to the detection device 21. After the chip under test is connected to the detection device 21, the detection device 21 starts to detect the chip under test. The power supply module 22 is used to provide power for the detection device 21. As some optional implementation manners, the power supply module 22 can be a storage battery, a dry battery, a DC power supply, an AC power supply, or a frequency converter power supply, etc. The resistance module 23 is used to adjust the resistance of the detection device 21. The controller 24 is used to control each module and each device on the detection device 21 to implement the calibration method of the electronic system 200 in this embodiment.

[0064] Please refer to Figure 3 , which is a schematic diagram of an electronic system 200 provided by another embodiment of the present application. The difference from the embodiment shown in Figure 2 is that in this embodiment, as shown in Figure 3As shown, the detection device 21 further includes an amplifier 25 and an analog-to-digital converter 26. One end of the amplifier 25 is connected to the resistor module 23, and the other end is connected to the analog-to-digital converter 26. The other end of the analog-to-digital converter 26 is connected to the controller 24. The amplifier 25 is used to amplify the voltage of the resistor module 23, and the analog-to-digital converter 25 is used to convert the amplified voltage into a digital signal for the controller 24 to process.

[0065] Please refer to Figure 4 , Figure 4 FIG. is a schematic flowchart of a calibration method for the electronic system 200. The calibration method can be implemented by the electronic system 200. Specifically, the calibration method can be implemented by the controller 24 of the electronic system 200. The calibration method of the electronic system 200 includes the following steps:

[0066] Step S101: In response to a calibration instruction, adjust the resistance value of the resistor module.

[0067] Taking the Figure 2 illustrated embodiment as an example, the resistor module 23 includes a plurality of resistors, and the resistance value of each resistor is different. The controller 24 controls a specified resistor in the resistor module 23 to conduct in the detection device 21 through the GPIO pin (General-purpose input / output, GPIO) to adjust the resistance value of the resistor module 23. The specified resistor can be one, two, three or more series-connected resistors. It can be understood that the resistance value of the resistor module 23 can be the sum of the resistance values of the specified resistors. For example, if the specified resistor is two resistors, the resistance value of the resistor module 23 is the sum of the resistance values of the two resistors.

[0068] Step S102: Obtain the real-time measured voltage of the adjusted resistor module.

[0069] After the controller 24 responds to the calibration instruction, it controls the power supply module 22 to provide power for the detection device 21. The current output by the power supply module 22 passes through the resistor module 23 and then is transmitted to the controller 24. At the same time, the controller 24 can directly obtain the power supply voltage of the power supply module 22. When the current flows through the resistor module 23, a potential difference will be generated at both ends of the resistor module 23, that is, the initial real-time measured voltage.

[0070] In some embodiments, obtaining the real-time measured voltage of the adjusted resistor module includes the following steps:

[0071] S1021: Obtain the initial real-time measured voltage of the adjusted resistor module, and control the amplifier to amplify the initial real-time measured voltage to obtain the stage real-time measured voltage.

[0072] S1022: Control the analog-to-digital converter to convert the stage real-time measured voltage to obtain the real-time measured voltage.

[0073] Taking Figure 3

[0073]

[0074] It can be understood that through the amplifier 25 and the analog-to-digital converter 26, the controller 24 can measure the tiny potential difference generated by the resistance module 23. That is, when the potential difference generated by the resistance module 23 is very small, the controller 24 can still measure it using the amplifier 25 and the analog-to-digital converter 26.

[0075] After each adjustment of the resistance value of the resistance module 23, the real-time measured voltage of the resistance module 23 will also change. That is, each adjusted resistance value has a corresponding adjusted real-time measured voltage.

[0076] Step S103: Obtain the current error coefficient of the detection device according to the adjusted resistance value, the adjusted real-time measured voltage, and the supply voltage of the power supply module.

[0077] After the controller 24 obtains multiple groups of resistance values and the real-time measured voltages corresponding to the resistance values, and then combines with the supply voltage of the power supply module, the current error coefficient of the detection device 21 can be obtained according to Ohm's law and related algorithms such as current error.

[0078] Step S104: Calibrate the detection current of the detection device according to the current error coefficient.

[0079] The detection current refers to the current used by the detection device 21 to detect the chip under test. It can be understood that after obtaining the current error coefficient of the detection current, the detection current can be corrected according to the current error coefficient. The detection device 21 uses the corrected detection current to detect the chip under test, making the functional detection of the chip under test more accurate.

[0080] It can be understood that compared with the first embodiment, in the above technical solution of the second embodiment, the controller 24 can control the resistance value of the resistance module 23, and there is no need for the operator to place a simulated load. When calculating the current error coefficient, the operator does not need to continuously plug and unplug the simulated load. This reduces the calibration failure caused by human error. When calibrating the detection currents of multiple detection devices 21, the calibration efficiency is higher. At the same time, the cost of the resistance module 23 is lower than that of the simulated load, avoiding the waste of manpower and material resources.

[0081] In some embodiments, the resistance value of the adjusted resistance module 23 is suitable for calibrating the detection current of different current ranges of the detection device 21.

[0082] It can be understood that due to different functional detection items of the detection device 21, there will be different current ranges, and the detection current under each current range needs to be calibrated separately. The current ranges include microampere (μA) current range, milliampere (mA) current range, ampere (A) current range, etc. The controller 24 can control the resistance value of the resistance module 23 to be suitable for the current range to be calibrated according to the current range to be calibrated carried in the calibration instruction. For example, when calibrating the μA current range, the resistance value of the adjusted resistance module 23 can be N microohms (μΩ). N is greater than or equal to 1.

[0083] Please refer to Figure 5 , the detection current of each current range needs to be calibrated. In this embodiment, taking the calibration of a certain current range as an example, the description is as follows. Specifically, adjusting the resistance value of the resistance module includes the following steps:

[0084] Step S201: Control the sampling resistor to be connected to the first calibration resistor of the calibration module.

[0085] Step S202: Control the disconnection of the sampling resistor from the first calibration resistor and connect it to the second calibration resistor of the calibration module.

[0086] Please refer to again Figure 3 , the resistance module 23 may include a calibration module 231 and a sampling resistor 232. One end of the calibration module 231 is connected to the power supply module 22, and the other end is connected to the sampling resistor 232. The other end of the sampling resistor 232 is connected to the controller 24 after being connected to the amplifier 25 and the analog-to-digital converter 26 in sequence.

[0087] The calibration module 231 includes multiple calibration resistors. The specified resistor can be the sampling resistor 232 or one of the calibration resistors among the multiple calibration resistors.

[0088] It can be understood that since the detection current of each current range of the detection device 21 needs to be calibrated separately and one or more calibration resistors are required for calibration. Therefore, the calibration resistors can be set corresponding to the current ranges of the detection device 21. For example, set some calibration resistors to calibrate the detection current of the microampere current range, and set some other calibration resistors to calibrate the detection current of the milliampere current range. Among them, the first calibration resistor 1 and the second calibration resistor 2 refer to the calibration resistors used to calibrate a certain current range. The resistance values of the first calibration resistor 1 and the second calibration resistor 2 are different.

[0089] The controller 24 controls the conduction of the current path between the control sampling resistor 232 of the resistor module 23 and the first calibration resistor 1 or the second calibration resistor 2 of the calibration module 231 through the GPIO pin, so that the sampling resistor 232 is connected in series with the first calibration resistor 1 or the second calibration resistor 2 of the calibration module 231. The controller 24 controls the closing of the current path between the sampling resistor 232 and the first calibration resistor 1 of the calibration module 231, so that the sampling resistor 232 is disconnected from the first calibration resistor 1 of the calibration module 231.

[0090] In some embodiments, step S102: obtaining the real-time measured voltage of the adjusted resistor module includes the following steps:

[0091] Step S203: After the sampling resistor is connected to the first calibration resistor, obtain the first measured voltage of the adjusted resistor module.

[0092] Step S204: After the sampling resistor is connected to the second calibration resistor, obtain the second measured voltage of the adjusted resistor module.

[0093] The real-time measured voltage includes the first measured voltage and the second measured voltage. It can be understood that after the sampling resistor 232 is connected to the first calibration resistor 1, the resistance value of the resistor module 23 changes, and the potential difference across the resistor module 23 is the first measured voltage. After the sampling resistor 232 is connected to the second calibration resistor 2, the resistance value of the resistor module 23 continues to change, and the potential difference across the resistor module 23 is the second measured voltage.

[0094] In some embodiments, step S103: obtaining the current error coefficient of the detection device according to the adjusted resistance value, the adjusted real-time measured voltage, and the supply voltage of the power supply module includes the following steps:

[0095] Step 205: Obtain the first cumulative resistance according to the sum of the sampling resistor and the first calibration resistor.

[0096] It can be understood that after the sampling resistor 232 is connected to the first calibration resistor 1, the resistance value of the resistor module 23 is the first cumulative resistance.

[0097] Step S206: Obtain the second cumulative resistance according to the sum of the sampling resistor and the second calibration resistor.

[0098] It can be understood that after the sampling resistor 232 is connected to the second calibration resistor 2, the resistance value of the resistor module 23 is the second cumulative resistance.

[0099] Step S207: Obtain the first current according to the first cumulative resistance and the first measured voltage.

[0100] In one example, the controller 24 obtains the first current according to the following formula (5).

[0101]

[0102] Among them, M adc represents the first current, and V adc represents the first measured voltage. Since the potential difference across the resistor module 23 can reach the controller 24 via the amplifier 25 and the analog-to-digital converter 26, therefore, V adc can refer to the real-time measured voltage obtained by the controller 24 from the analog-to-digital converter 26. R a represents the first cumulative resistance, that is, the sum of the sampling resistance and the second calibration resistance.

[0103] Step S208: Obtain a second current based on the first cumulative resistance and the supply voltage.

[0104] The controller 24 obtains the second current according to the following formula (6).

[0105]

[0106] Among them, M ps represents the second current, and V ps represents the supply voltage, and R a represents the first cumulative resistance, that is, the sum of the sampling resistance and the second calibration resistance.

[0107] Step S209: Obtain a third current based on the second cumulative resistance and the second measured voltage.

[0108] The controller 24 obtains the third current according to formula (5). The difference from step S207 is that M adc represents the third current, and V adc represents the second measured voltage, and R a represents the second cumulative resistance, that is, the sum of the sampling resistance and the second calibration resistance.

[0109] Step S210: Obtain a fourth current based on the second cumulative resistance and the supply voltage.

[0110] The controller 24 obtains the fourth current according to formula (6). The difference from step S208 is that M Ps represents the fourth current, and V ps represents the supply voltage, and R a represents the second cumulative resistance, that is, the sum of the sampling resistance and the second calibration resistance.

[0111] Step S211: Obtain the current error coefficient of the detection device based on the first current, the second current, the third current, and the fourth current.

[0112] It can be understood that at a fixed voltage, after the resistance value of the hardware changes, the error law between the current of the same hardware before and after the resistance change and the theoretical current can be expressed by the current error calculation formula. The current error calculation formula is the following formula (7), and the controller 24 obtains the current error coefficient according to the following formula (7).

[0113] M ps = kM adc + b (7)

[0114] Wherein, k and b represent the current error coefficients. k represents the slope and b represents the intercept. It can be understood that the current error calculation formula (7) is a binary linear equation. After obtaining the second current and the fourth current of M ps and the first current and the third current of M adc , substituting the first current, the second current, the third current and the fourth current into formula (7), the unique determined values of k and b can be obtained.

[0115] It can be understood that the current error coefficients obtained according to the first current, the second current, the third current and the fourth current are applicable to the detection of the chip to be measured under the condition of a certain current range of the detection device.

[0116] In some embodiments, step S104 includes: obtaining the calibrated detection current of the detection device according to the current error coefficient, the adjusted resistance value and the adjusted real-time measured voltage. Specifically, in one example, it includes the following steps:

[0117] Step S212: Control the sampling resistor to be connected to any one of the calibration resistors of the calibration module.

[0118] Any one of the calibration resistors can be the first calibration resistor 1, the second calibration resistor 2 or other calibration resistors applicable to the same current range as the first calibration resistor 1 and the second calibration resistor 2. It can be understood that adjusting the resistance value of the resistance module 23 further includes controlling the sampling resistor 232 to be connected to any one of the calibration resistors of the calibration module 231.

[0119] Step S213: After the sampling resistor is connected to any one of the calibration resistors, obtain the third measured voltage of the resistance module.

[0120] It can be understood that the real-time measured voltage further includes the third measured voltage.

[0121] Step S214: Obtain the calibrated detection current of the detection device according to the third cumulative resistance of the sum of the sampling resistor and any one of the calibration resistors, the third measured voltage and the current error coefficient.

[0122] It can be understood that after the sampling resistor 232 is connected to any one of the calibration resistors, the resistance value of the resistance module 23 is the third cumulative resistance.

[0123] After obtaining the current error coefficient of a certain detection device 21, the detection device 21 uses the current error coefficient to calibrate the detected current. The controller 24 obtains the calibrated detected current based on the following current error calculation formula (8).

[0124] M re = kM adc + b (8)

[0125] Wherein, M re represents the calibrated detected current, k and b represent the current error coefficients, which have been calculated according to step S211, and M adc represents the third measured voltage. It can be understood that since the potential difference across the resistor module 23 can reach the controller 24 through the amplifier 25 and the analog-to-digital converter 26, therefore, V adc can refer to the real-time measured voltage obtained by the controller 24 from the analog-to-digital converter 26.

[0126] In some embodiments, after obtaining the calibrated detected current of the detection device, the calibration method further includes:

[0127] Step S301: Determine whether the difference between the calibrated detected current and the preset current is within a preset range.

[0128] The preset current and the preset range are set according to the function detection item corresponding to the chip to be tested. It can be understood that since the function detection items of the chip to be tested are different, the corresponding detection current accuracy requirements are also different.

[0129] Step S302: If the difference is within the preset range, determine that the detection device is a normal device.

[0130] Step S303: If the difference is not within the preset range, determine that the detection device is an abnormal device.

[0131] A normal device refers to the detection device 21 for which the detected current has been calibrated. An abnormal device refers to the detection device 21 for which the detected current has not been calibrated or the detection device 21 that needs to be recalibrated. It can be understood that after obtaining the error coefficient, the calibrated detected current can be further verified with the preset current to determine whether it is accurate.

[0132] Each detection device 21 of the electronic system 200 can obtain the current error coefficient according to the above steps. In the case where there are deviations between the hardware of the detection devices 21, each detection device 21 can obtain its own current error coefficient according to the above steps, so that each detection device 21 can perform production tasks on the production line, thus maximizing the retention of all detection devices 21.

[0133] In some embodiments, after obtaining the current error coefficient of the detection device, the calibration method further includes the following steps:

[0134] Step S401: Send the current error coefficient to the controllers of other detection devices, so that the controllers of other detection devices calibrate the detected current according to the current error coefficient.

[0135] In one example, the detection device 21 that calculates the current error coefficient sends the current error coefficient to the computer device 20. After the computer device 20 generates a new calibration instruction according to the current error coefficient, it sends the new calibration instruction to other detection devices 20. The other detection devices 20 calibrate the detected current of their own devices according to the current error coefficient carried by the new calibration instruction. It can be understood that since multiple detection devices 21 of the electronic system 200 use the same packaging technology, after obtaining the current error coefficient of one detection device 21, this current error coefficient can also be applied to other detection devices 21. Among them, for the specific steps of the controller 24 of other detection devices 21 to calibrate the detected current, refer to steps S212 to S214, and steps S301 to S303.

[0136] Please refer to Figure 6 , Figure 6 which is a schematic structural diagram of a controller 24 provided by an embodiment of the present application. In one embodiment, the controller 24 includes a memory 241 and at least one processor 242. Those skilled in the art should understand that Figure 6 the structure of the controller 24 shown does not constitute a limitation on the embodiments of the present application. The controller 24 may further include more or fewer other hardware or software than shown in the figure, or different component arrangements.

[0137] As an optional embodiment, the controller 24 includes a terminal that can automatically perform numerical calculations and / or information processing according to pre-set or stored instructions, and its hardware includes but is not limited to microprocessors, application specific integrated circuits, programmable gate arrays, digital processors, and embedded devices, etc. As an optional embodiment, the memory 241 is used to store computer programs and various data. The memory 241 may include any other computer-readable medium that can be used to carry or store data, such as a read-only memory (ROM), a random access memory (RAM), or a programmable read-only memory (PROM).

[0138] As an alternative implementation, the at least one processor 242 may include an integrated circuit, which may include a single packaged integrated circuit or multiple packaged integrated circuits with the same or different functions, including a combination of a microprocessor, a digital processing chip, a graphics processor, and various control chips. The at least one processor 242 is the control core (Control Unit) of the controller 24. By running or executing programs or modules stored in the memory 241 and calling data stored in the memory 241, it performs various functions of the controller 24 and processes data. A computer program is stored in the memory 241, and the at least one processor 242 can call the computer program stored in the memory 241 to implement the calibration method of the above-mentioned electronic system.

[0139] An embodiment of the present application also provides a storage medium. Among them, computer instructions are stored in the storage medium, and when the instructions run on a computing device, the computing device can execute the calibration method of the electronic system provided in the foregoing embodiment.

[0140] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and not to limit them. Although the present application has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present application can be modified or equivalently replaced without departing from the spirit and scope of the technical solutions of the present application.

Claims

1. A calibration method for an electronic system, characterized in that, the electronic system includes a detection device, the detection device includes a power supply module, a resistance module and a controller, and the calibration method includes: responding to a calibration instruction to adjust the resistance value of the resistance module; acquiring the real-time measured voltage of the adjusted resistance module; obtaining the current error coefficient of the detection device according to the adjusted resistance value, the adjusted real-time measured voltage and the power supply voltage of the power supply module; calibrating the detection current of the detection device according to the current error coefficient.

2. The calibration method according to claim 1, characterized in that, the electronic system further includes an amplifier and an analog-to-digital converter, and the acquiring the real-time measured voltage of the adjusted resistance module includes: acquiring the initial real-time measured voltage of the adjusted resistance module, and controlling the amplifier to amplify the initial real-time measured voltage to obtain a stage real-time measured voltage; controlling the analog-to-digital converter to convert the stage real-time measured voltage to obtain the real-time measured voltage.

3. The calibration method according to claim 1, characterized in that, the resistance module includes a calibration module and a sampling resistor, one end of the calibration module is connected to the power supply module, the other end is connected to the sampling resistor, and the other end of the sampling resistor is connected to the controller. The adjusting the resistance value of the resistance module includes: controlling the sampling resistor to be connected to the first calibration resistor of the calibration module; controlling the sampling resistor to be disconnected from the first calibration resistor and connected to the second calibration resistor of the calibration module.

4. The calibration method according to claim 3, characterized in that, acquiring the real-time measured voltage of the adjusted resistance module includes: after the sampling resistor is connected to the first calibration resistor, acquiring the first measured voltage of the adjusted resistance module; after the sampling resistor is connected to the second calibration resistor, acquiring the second measured voltage of the adjusted resistance module.

5. The calibration method according to claim 4, characterized in that, the obtaining the current error coefficient of the detection device according to the adjusted resistance value, the adjusted real-time measured voltage and the power supply voltage of the power supply module includes: obtaining a first cumulative resistance according to the sum of the sampling resistor and the first calibration resistor; obtaining a second cumulative resistance according to the sum of the sampling resistor and the second calibration resistor; obtaining a first current according to the first cumulative resistance and the first measured voltage; obtaining a second current according to the first cumulative resistance and the power supply voltage; obtaining a third current according to the second cumulative resistance and the second measured voltage; obtaining a fourth current according to the second cumulative resistance and the power supply voltage; obtaining the current error coefficient of the detection device according to the first current, the second current, the third current and the fourth current.

6. The calibration method according to claim 1, characterized in that, the calibrating the detection current of the detection device according to the current error coefficient includes: Obtain the calibrated detection current of the detection device based on the current error coefficient, the adjusted resistance value, and the adjusted real-time measured voltage.

7. The calibration method according to claim 6, wherein, after obtaining the calibrated detection current of the detection device, the calibration method further includes: determine whether the difference between the calibrated detection current and a preset current is within a preset range; if the difference is within the preset range, determine that the detection device is a normal device; if the difference is not within the preset range, determine that the detection device is an abnormal device.

8. The calibration method according to claim 1, wherein, the electronic system further includes other detection devices, and after obtaining the current error coefficient of the detection device, the calibration method further includes: send the current error coefficient to the controller of the other detection devices, so that the controller of the other detection devices calibrates the detection current according to the current error coefficient.

9. An electronic system, wherein, the electronic system includes a detection device, and the detection device includes a power supply module, a resistance module, and a controller, and the controller is configured to: in response to a calibration instruction, adjust the resistance value of the resistance module; acquire the real-time measured voltage of the adjusted resistance module; obtain the current error coefficient of the detection device according to the adjusted resistance value, the adjusted real-time measured voltage, and the power supply voltage of the power supply module; calibrate the detection current of the detection device according to the current error coefficient.

10. A controller, wherein, comprising: a processor, adapted to execute a computer program; a computer-readable storage medium, in which a computer program is stored, and when the computer program is executed by the processor, it executes the calibration method according to any one of claims 1-8.

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