Radio frequency device test system, method, device and equipment

Abstract

The invention relates to the technical field of communication testing, and discloses a radio frequency device testing system, method, device and equipment, and the system comprises a digital module, a radio frequency module and a switch module. A port of the digital module is electrically connected with a state pin of the tested piece; the digital module is used for controlling the working state of the tested piece; the radio frequency module comprises a vector network analyzer and a vector signal transceiver; the vector network analyzer is used for testing the radio frequency performance of the tested piece; the vector signal transceiver is used for testing the signal quality of the tested piece; a first port of the switch module is electrically connected with a port of the vector network analyzer; a second port of the switch module is electrically connected with a port of the vector signal transceiver; a third port of the switch module is electrically connected with a radio frequency port of the tested piece; the switch module is used for switching the test access to the corresponding radio frequency module according to the test requirement. According to the invention, the comprehensiveness and efficiency of radio frequency device testing are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of communication testing, and particularly relates to a radio frequency device testing system, method, device and equipment. Background Art

[0002] With the development of wireless communication technology, the importance of radio frequency modules in mobile communication devices has become increasingly prominent. As the core module of the signal transceiver system, there are various types of radio frequency devices, and the development trend is more towards miniaturization, integration and modularization, and the corresponding functional and performance requirements are also getting higher and higher.

[0003] Testing, as an important process step in the design and production of radio frequency devices, puts forward higher requirements for testing efficiency and testing dimensions. The traditional radio frequency device testing has low efficiency and single testing functions. For example, when testing a radio frequency module, it is necessary to manually adjust the signal source parameters output by a vector network analyzer, so as to use a known signal source to excite the radio frequency device, and then measure the amplitude and phase of the reflected and transmitted signals; or manually operate a vector signal transceiver to generate various complex modulated signals according to preset testing requirements, so as to test the modulation signals, power, spectrum, communication performance, etc. of the radio frequency device. Therefore, both the vector network analyzer and the vector signal transceiver need to be manually controlled separately, which cannot meet the rapid detection requirements in the large-scale production process and the requirements for the diverse functions and performances of radio frequency chips. Summary of the Invention

[0004] In view of this, the present invention provides a radio frequency device testing system, method, device and equipment to improve the comprehensiveness and efficiency of radio frequency device testing.

[0005] In a first aspect, the present invention provides a radio frequency device testing system, which includes a digital module, a radio frequency module and a switch module; the port of the digital module is electrically connected to the status pin of the device under test; the digital module is used to control the working state of the device under test; the radio frequency module includes a vector network analyzer and a vector signal transceiver; the vector network analyzer is used to test the radio frequency performance of the device under test; the vector signal transceiver is used to test the signal quality of the device under test; the first port of the switch module is electrically connected to the port of the vector network analyzer; the second port of the switch module is electrically connected to the port of the vector signal transceiver; the third port of the switch module is electrically connected to the radio frequency port of the device under test; the switch module is used to switch the test path to the corresponding radio frequency module according to the test requirements.

[0006] In an optional implementation manner, the system further includes a power supply module; the port of the power supply module is electrically connected to the power supply pin of the device under test; the power supply module is used to supply power to the device under test and collect the corresponding electrical feedback.

[0007] In an alternative embodiment, the system further includes a communication module; the communication module is communicatively connected to external devices, and the external devices include a sorter and a probe station; The communication module is further configured to monitor the physical connection status of the device under test and perform data transmission with the RF module, the switch module, the digital module, and the power supply module.

[0008] In an alternative embodiment, the RF performance includes at least one of scattering parameters, gain, insertion loss, and isolation; the signal quality includes at least one of power, harmonics, noise figure, and switching time.

[0009] In a second aspect, the present invention provides a method for testing an RF device. The method is applied to the above-mentioned RF device testing system and includes: controlling the digital module to control the state of the device under test based on a preset program requirement, so that the device under test is in a first state; controlling the switch module to switch the test path to a vector network analyzer to test the RF performance; controlling the switch module to switch the test path to a vector signal transceiver to test the signal quality; and determining the performance of the device under test in the first state based on the RF performance and the signal quality.

[0010] In an alternative embodiment, the method further includes: driving the power supply module to output a preset voltage source to the power supply pin of the device under test; collecting the feedback current of the device under test under the voltage source; driving the power supply module to output a preset current source to the power supply pin of the device under test; collecting the feedback voltage of the device under test under the current source; and determining the structural integrity and DC performance parameters of the device under test based on the feedback current and the feedback voltage.

[0011] In an alternative embodiment, testing the RF performance includes: controlling the vector network analyzer to transmit a first test signal to the device under test; obtaining a first feedback signal of the device under test; and comparing the first test signal and the first feedback signal to determine the RF performance test result.

[0012] In an alternative embodiment, testing the signal quality includes: controlling the vector signal transceiver to transmit a second test signal to the device under test; obtaining a second feedback signal of the device under test; and comparing the second test signal and the second feedback signal to determine the signal quality test result.

[0013] In a third aspect, the present invention provides an RF device testing apparatus, which includes: a state control module for controlling the digital module to control the state of the device under test based on a preset program requirement, so that the device under test is in a first state; an RF performance testing module for controlling the switch module to switch the test path to a vector network analyzer to test the RF performance; a signal quality testing module for controlling the switch module to switch the test path to a vector signal transceiver to test the signal quality; and a performance determination module for determining the performance of the device under test in the first state based on the RF performance and the signal quality.

[0014] Fourthly, the present invention provides a computer device, comprising: a memory and a processor, which are communicatively connected to each other. The memory stores computer instructions, and the processor executes the computer instructions to perform the radio frequency device testing method according to the first aspect or any corresponding embodiment thereof.

[0015] Fifthly, the present invention provides a computer-readable storage medium, on which computer instructions are stored, and the computer instructions are used to cause a computer to perform the radio frequency device testing method according to the first aspect or any corresponding embodiment thereof.

[0016] Sixthly, the present invention provides a computer program product, comprising computer instructions, and the computer instructions are used to cause a computer to perform the radio frequency device testing method according to the first aspect or any corresponding embodiment thereof.

[0017] The technical solution provided by this application may include the following beneficial effects: In the radio frequency device testing system provided by this application, the radio frequency module tests the radio frequency performance and signal quality of the device under test, meeting diverse testing requirements. The switch module realizes the automatic switching of the test path, and according to the testing requirements, switches the test path to the corresponding radio frequency module, flexibly switching the path to a vector network analyzer or a vector signal transceiver, improving the testing efficiency. The digital module can comprehensively control the working state of the device under test, providing conditions for the testing of radio frequency performance and signal quality, and completing the performance testing of the device under test in different states. Through the collaborative work of each module, the above solution can meet the diverse testing requirements of radio frequency devices, efficiently complete multiple tests of radio frequency devices in various states, and improve the comprehensiveness and efficiency of radio frequency device testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0019] Figure 1 is a block diagram of the radio frequency device testing system shown according to an exemplary embodiment; Figure 2 is a block diagram of the radio frequency device testing system architecture shown according to an exemplary embodiment; Figure 3 is a schematic diagram of a two-station synchronous series testing link shown according to an exemplary embodiment; Figure 4It is a flowchart of a radio frequency device testing method according to an embodiment of the present invention; Figure 5 It is a structural block diagram of a radio frequency device testing apparatus according to an embodiment of the present invention; Figure 6 It is a schematic diagram of the hardware structure of a computer device according to an embodiment of the present invention. Detailed implementation manners

[0020] To make the objectives, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Apparently, the described embodiments are some but not all of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0021] In the description of the embodiments of the present application, the term "corresponding" may indicate a direct or indirect corresponding relationship between two parties, may also indicate an associated relationship between two parties, or may be a relationship such as indication and being indicated, configuration and being configured, etc.

[0022] Figure 1 It is a structural block diagram of a radio frequency device testing system shown according to an exemplary embodiment. As Figure 1 shown, the system includes a digital module, a radio frequency module and a switch module; The port of the digital module is electrically connected to the status pin of the device under test; the digital module is used to control the working status of the device under test.

[0023] The digital module establishes an electrical connection with the status pin of the device under test through its port, so that the digital module can send a control signal to the status pin of the device under test, thereby controlling the status of the device under test. For example, in radio frequency performance testing, the digital module can set the device under test to different statuses according to the test requirements through the status pin, so as to comprehensively test the performance of the device under test in various statuses. Different test chips will have different chip statuses. The digital module can apply specific signals required, such as DC or low-frequency signals, etc., to the chip, and the working status of the chip will change. The tester can then test the response of the chip to such signals to determine whether it meets the chip design standard. As Figure 1 shown, the port of the power supply module is electrically connected to the power supply pin of the device under test Figure 2 It is a structural block diagram of a radio frequency device testing system shown according to an exemplary embodiment. The system includes a switch module, a power supply module, a digital module, a radio frequency module and a communication module. Among them, the switch module, the power supply module, the digital module and the radio frequency module are respectively connected to the device under test through power supply, digital and radio frequency interfaces. Specifically, as Figure 2As shown, the digital module controls the state of the device under test through multiple interface protocols, including TTL (Transistor-Transistor Logic), SPI (Serial Peripheral Interface), MIPI (Mobile Industry Processor Interface), and dynamic custom protocols. Specifically, TTL is a digital logic level standard commonly used for simple signal transmission and control. SPI is a synchronous serial communication interface commonly used for high-speed data transmission and device control. The internal registers of the DUT are read and written through the SPI interface to control its state and functions. MIPI is suitable for high-speed communication scenarios, and specific commands are sent through the MIPI interface to control the state of the chip. The dynamic custom protocol flexibly adjusts the communication method according to the specific device requirements, covering different protocol needs. According to the preset program or instruction, the digital module selects a protocol to communicate with the device under test to achieve state control. Each protocol has its specific application scenario and control method, adapting to different device characteristics and meeting various test requirements.

[0024] The RF module includes a vector network analyzer and a vector signal transceiver; the vector network analyzer is used to test the RF performance of the device under test; the vector signal transceiver is used to test the signal quality of the device under test.

[0025] The RF performance includes at least one of scattering parameters, gain, insertion loss, and isolation; the signal quality includes at least one of power, harmonics, noise figure, and switching time.

[0026] The RF module of the embodiment of the present application is used to test the RF performance and signal quality of the device under test in various states.

[0027] Optionally, the RF performance includes at least one of scattering parameters, gain, insertion loss, and isolation.

[0028] Among them, the scattering parameters characterize the signal reflection and transmission characteristics between the ports of the RF device; the gain characterizes the amplification ability of the RF device for signals; the insertion loss mainly characterizes the degree of power loss of the signal after passing through the device; the isolation characterizes the degree of mutual interference between different ports of the device under test. The vector network analyzer emits a preset signal required for testing to the device under test and receives the signal fed back by the device under test, analyzes the feedback signal, and calculates the above RF performance indicators. The ports of the vector network analyzer can be used as both the transmitting end and the receiving end.

[0029] Optionally, the signal quality includes at least one of power, harmonics, noise figure, and switching time.

[0030] Among them, power characterizes the power of the output signal of the device under test in different operating states; harmonics characterize whether there are unwanted harmonic components in the output signal of the device under test; noise figure characterizes the amount of noise introduced by the device when receiving weak signals; switching time characterizes the time required to switch between different operating modes during the radio frequency period. The vector signal transceiver transmits a preset signal required for testing to the device under test, receives the signal fed back by the device under test, analyzes the feedback signal, and calculates the above signal quality. The receiving port and transmitting port of the vector signal transceiver are ports with separate functions and cannot be used interchangeably.

[0031] Specifically, a vector network analyzer is mainly used to measure the scattering parameters, insertion loss, etc. of the device under test. The transmitted signal is generally a continuous wave signal of a single frequency. By measuring the amplitude and phase information of the reflected and transmitted signals. The vector network analyzer has single-port, dual-port, multi-port, etc. Each port can transmit signals and also receive signals. The signals transmitted by the vector network transceiver are mainly relatively complex modulated signals, which can measure the EVM, phase noise, etc. of the device under test.

[0032] Optionally, the radio frequency device test system of the embodiment of the present application adopts a wide-bandwidth vector signal transceiver, which can collect and display the waveforms of 5 channels at one time, improving the test rate while avoiding the errors caused by signal acquisition at different times and improving the test accuracy.

[0033] As Figure 1 shown, the first port of the switch module is electrically connected to the port of the vector network analyzer; the second port of the switch module is electrically connected to the port of the vector signal transceiver; the third port of the switch module is electrically connected to the radio frequency port of the device under test; the switch module is used to switch the test path to the corresponding radio frequency module according to the test requirements.

[0034] As Figure 2 shown, the switch module includes a power switch, a matrix switch and a radio frequency switch, which are electrically connected to the radio frequency ports of the vector network analyzer, the vector signal transceiver and the device under test through three ports respectively, so that the switch module can control the on / off of the matrix switch according to different test requirements, switch the test path, and transmit the signal to the corresponding radio frequency module. Among them, the power switch is mainly used to control the on / off of the power supply, and the matrix switch and the radio frequency switch are mainly used for the automatic switching of the radio frequency signal channels. In the embodiment of the present application, the type of the switch can be adaptively selected according to the application scenario.

[0035] Optionally, since both the vector network analyzer and the vector signal transceiver are two-port test instruments and cannot meet the multi-port test requirements of the device under test, in this embodiment, a high-speed matrix switch is used to expand the ports of the vector network analyzer and the vector signal transceiver. The switch module is expanded according to the pin requirements of the RF device. An arbitrarily switchable matrix switch is used to achieve fully automated testing.

[0036] Optionally, this application also supports multi-station synchronous testing, including translation multi-station synchronous parallel testing and turret multi-station synchronous serial testing schemes. Among them, the translation multi-station synchronous parallel testing scheme is to test the same test items of multiple stations. However, since both the vector network analyzer and the vector signal transceiver are two-port test instruments, the synchronous parallel testing scheme has a low utilization rate of test resources. The turret multi-station synchronous serial testing scheme is to test different test items at multiple stations. The vector network analyzer and the vector signal transceiver can be used for testing at the same time, with a high utilization rate of test resources, a fast test rate, and the test data of the same station can be merged after testing, greatly improving the test efficiency.

[0037] Figure 3 It is a schematic diagram of a dual-station synchronous serial testing link shown according to an exemplary embodiment, as Figure 3 shown, the test system shown in the embodiment of this application can test different test items at the same time. Specifically, that is, the vector network analyzer and the vector signal transceiver can be used for testing at the same time.

[0038] In the embodiment of this application, if there are several chips to be tested in the test system, the vector network analyzer can be connected to the RF ports of several chips to be tested through the switch module respectively; similarly, the vector signal transceiver can also be connected to the RF ports of several chips to be tested through the switch module respectively. At this time, the switch module can control the connection between the vector network analyzer and the vector signal transceiver and any chip to be tested, so as to control the test process between the vector network analyzer or the vector signal transceiver and any chip to be tested.

[0039] In the embodiment of this application, the vector network analyzer and the vector signal transceiver can work simultaneously. In a possible implementation manner, as Figure 3 shown, the vector network analyzer is connected to the device under test 1 through the switch module (for example, the device under test 1 can be chip A), and the vector signal transceiver can be connected to the device under test 2 through the switch module (for example, the device under test 2 can be chip B). At this time, if it is necessary to test chip A and chip B at the same time, the switch module can be controlled. First step, the vector network analyzer is used to test the S parameters of chip A and chip B at the same time. Second step, the vector signal transceiver is used to test the EVM of chip A and chip B, and so on.

[0040] In another possible implementation, the chip under test includes chip A, chip B, and chip C at the same time. At this time, through the switch module, the system can first use a vector network analyzer to test the S parameters of chip A, use a vector signal transceiver to test the EVM of chip B, and chip C waits; then test the S parameters of chip B and the EVM of chip C, and so on. After the test is completed, the test software can splice the various performance test results of A, B, and C respectively.

[0041] As can be seen from the above examples, the test system involved in the embodiments of the present application can test different items at the same time, greatly improving the test efficiency under multiple devices under test and multiple test items.

[0042] Optionally, as Figure 2 shown, the system further includes a power supply module and a communication module; The port of the power supply module is electrically connected to the power pin of the device under test; the power supply module is used to supply power to the device under test and collect the corresponding electrical feedback. The power supply module may include a high-power power supply and a source measurement unit. The high-power power supply is used to supply power to the entire radio frequency signal tester, and the source measurement unit is used to measure data such as voltage and current.

[0043] In an alternative embodiment, the system further includes a communication module; the communication module is communicatively connected to an external device, and the external device includes a sorter and a probe station; The communication module is further used to monitor the physical connection status of the device under test and perform data transmission with the radio frequency module, the switch module, the digital module, and the power supply module. Specifically, the communication module can support TTL communication, GPIB (General Purpose Interface Bus Communication), STDF (Standard Test Data Format Communication) file communication, and CSV (Comma-Separated Values File Communication) file communication.

[0044] According to an embodiment of the present invention, an embodiment of a radio frequency device test method is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, and although the logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in a different order than here.

[0045] In this embodiment, a radio frequency device test method is provided, which can be used in the above radio frequency device test system. Figure 4 is a flowchart of the radio frequency device test method according to an embodiment of the present invention, asFigure 3 As shown, the process includes the following steps: Step S401: Control the digital module to control the state of the device under test based on preset program requirements, so that the device under test is in the first state.

[0046] Before the test starts, through a preset initialization program, the digital module can detect the state of the device under test to ensure that all connections and interfaces are working properly. According to the test requirements, the digital module issues instructions to the device under test in a predefined manner. The setting of each state can include multiple parameter settings, such as voltage, current, clock frequency, etc.

[0047] Optionally, when testing the device under test through a vector network analyzer and a vector signal transceiver, the first state of the device under test may be different. That is to say, when testing different chip performances, the chip can be set to different states to accurately test the performance data of the chip.

[0048] Step S402: Control the switch module to switch the test path to the vector network analyzer to test the RF performance.

[0049] Step S403: Control the switch module to switch the test path to the vector signal transceiver to test the signal quality.

[0050] Step S404: Determine the performance of the device under test in the first state based on the RF performance and the signal quality.

[0051] Specifically, the above step S402 includes the following steps: Step S4021: Control the vector network analyzer to transmit the first test signal to the device under test.

[0052] Step S4022: Obtain the first feedback signal of the device under test.

[0053] Step S4023: Compare the first test signal and the first feedback signal to determine the RF performance test result.

[0054] When testing the RF performance, compare the collected feedback signal with the transmitted test signal, mainly calculate indicators such as scattering parameters (S-parameters), insertion loss, reflection loss, and isolation, and combine information such as signal amplitude and phase. Use a dedicated algorithm to determine whether the RF performance of the device under test meets the design requirements, and record the test results in the database for subsequent trend analysis and anomaly warning.

[0055] Specifically, the above step S403 includes the following steps: Step S4031: Control the vector signal transceiver to transmit the second test signal to the device under test.

[0056] Step S4032: Obtain the second feedback signal of the device under test.

[0057] Step S4033: Compare the second test signal and the second feedback signal to determine the signal quality test result.

[0058] When testing the signal quality, the second test signal can be compared with the feedback signal, and the signal distortion degree can be determined by calculating the Error Vector Magnitude (EVM). Specifically, key indicators such as the power, harmonic content, noise figure, and switching time of the signal can be analyzed to evaluate the signal quality of the device under test under different working conditions. Then, according to the preset threshold and algorithm model, it is judged whether the test result is within the allowable range; if it exceeds the standard, the abnormal situation is recorded and fed back to the host computer for alarm or retest processing.

[0059] After obtaining the above-mentioned radio frequency performance test result and signal quality test result, the performance of the device under test is determined based on the two. Specifically, the test software pre-defines the limits of various test parameters of the device under test, such as the S21 parameter is required to be between 24 and 28 dB, or the specific ranges of other parameters (such as voltage, current, power, frequency, etc.).

[0060] After obtaining the test results of radio frequency performance and signal quality in steps S402 and S403 respectively, the test software summarizes all parameters. For each parameter, the software compares the actually measured test value collected with the preset limit. For example: for a chip in a certain state, if its S21 parameter is within 24 - 28 dB, it is determined as pass; if it exceeds this range, it is determined as fail.

[0061] According to the test results of each parameter, if all parameters meet the limit requirements, the comprehensive test result of the chip is pass; if any one parameter exceeds the preset limit, the chip is determined as fail, and it is classified according to the specific parameter situation that exceeds the limit (BIN, Binary Classification). In semiconductor testing, BIN classification is to classify devices with different fail reasons or fail types into different BINs for subsequent identification and processing.

[0062] For example, for a chip in a specific state, the voltage of each pin, the input signal power, and the input signal frequency have been preset. At this time, the measured S21 parameter is 25 dB, then the chip passes this test; if the S21 test result is 23 dB or 29 dB, which exceeds the limit of 24 - 28 dB, it will be determined that this test fails and is classified into the corresponding BIN according to the fail situation.

[0063] The test software sends the judgment result and BIN information to the sorter through the communication module. The sorter physically moves the corresponding DUT to the specified position according to the received BIN information to complete automatic sorting. At the same time, the test software will count the entire test process, including the total number of tests, the number of fails, the fail statistics for each BIN, etc., for subsequent quality analysis and data recording.

[0064] In an alternative embodiment of the present application, a power supply test method for radio frequency devices is provided. The power supply test is performed before step S401. The method flow includes the following steps: Step a11, drive the power supply module to output a preset voltage source to the power supply pin of the DUT.

[0065] Before the test, the power supply test module presets one or more voltage values (such as 3.3V, 5V or other operating voltages) in the software according to the test requirements and the specifications of the DUT. The power supply module applies a constant voltage to the DUT through the interface connected to the power supply pin of the DUT according to the preset voltage source configuration.

[0066] Step a12, collect the feedback current of the DUT under the voltage source.

[0067] When the DUT starts to work under the preset voltage, the power supply module monitors the feedback current in real time through the built-in current acquisition unit.

[0068] Step a13, drive the power supply module to output a preset current source to the power supply pin of the DUT.

[0069] Specifically, according to the design requirements and test standards of the DUT, one or more constant current values (such as 10mA, 20mA, etc.) are set in the test software. The power supply module applies a preset current to the power supply pin of the DUT by configuring the constant current source output to simulate the load conditions under different operating states.

[0070] Step a14, collect the feedback voltage of the DUT under the current source.

[0071] In the case of constant current source output, the system monitors the voltage feedback from the DUT through the voltage acquisition unit. When measuring the feedback voltage, the acquisition circuit needs to have high resolution and low noise characteristics to ensure that it can accurately reflect the matching situation between the power supply and the internal impedance of the DUT.

[0072] Step a15, determine the structural integrity and DC performance parameters of the DUT based on the feedback current and feedback voltage.

[0073] The test software compares the collected feedback current and feedback voltage data, and calculates key parameters such as the internal resistance and power consumption of the device under test based on Ohm's law and other DC performance models. If the feedback data deviates from the expected range, it indicates problems such as short circuits, open circuits, or component aging inside the device. The software judges these deviations through a set algorithm to determine whether the device meets the structural integrity requirements. In addition to the internal resistance, the DC performance indicators such as the current stability and voltage fluctuation of the device can be further evaluated, providing a basis for subsequent device classification and defect analysis. Finally, the test software outputs a test result by synthesizing the power supply test data, records it in the system, and provides a reference for subsequent comprehensive evaluation with other test data such as RF performance and signal quality.

[0074] In this embodiment, a radio frequency device test apparatus is further provided. This apparatus is used to implement the above-mentioned embodiments and preferred implementation manners, and those that have been described will not be repeated. As used hereinafter, the term "module" can be a combination of software and / or hardware that realizes a predetermined function. Although the apparatuses described in the following embodiments are preferably implemented in software, implementation in hardware, or a combination of software and hardware is also possible and contemplated.

[0075] This embodiment provides a radio frequency device test apparatus, as Figure 5 shown, including: A status control module 501, configured to control the digital module to control the status of the device under test based on preset program requirements, so that the device under test is in the first state.

[0076] An RF performance test module 502, configured to control the switch module to switch the test path to a vector network analyzer to test the RF performance.

[0077] A signal quality test module 503, configured to control the switch module to switch the test path to a vector signal transceiver to test the signal quality.

[0078] A performance determination module 504, configured to determine the performance of the device under test in the first state based on the RF performance and the signal quality.

[0079] In an alternative embodiment, the apparatus further includes a power supply test module, and this module includes: A voltage source output unit, configured to drive the power supply module to output a preset voltage source to the power supply pin of the device under test.

[0080] A current acquisition unit, configured to acquire the feedback current of the device under test under the voltage source.

[0081] A current source output unit, configured to drive the power supply module to output a preset current source to the power supply pin of the device under test.

[0082] A voltage acquisition unit, configured to acquire the feedback voltage of the device under test under the current source.

[0083] A power supply test unit for determining the structural integrity and DC performance parameters of a device under test based on feedback current and feedback voltage.

[0084] In an alternative embodiment, the above-mentioned RF performance test module includes: A first RF performance test unit for controlling a vector network analyzer to transmit a first test signal to the device under test.

[0085] A second RF performance test unit for obtaining a first feedback signal from the device under test.

[0086] A third RF performance test unit for comparing the first test signal and the first feedback signal to determine the RF performance test result.

[0087] In an alternative embodiment, the above-mentioned signal quality test module includes: A first signal quality test unit for controlling a vector signal transceiver to transmit a second test signal to the device under test.

[0088] A second signal quality test unit for obtaining a second feedback signal from the device under test.

[0089] A third signal quality test unit for comparing the second test signal and the second feedback signal to determine the signal quality test result.

[0090] The further function descriptions of the above-mentioned modules and units are the same as those in the corresponding embodiments above, and will not be elaborated here.

[0091] The RF device test apparatus in this embodiment is presented in the form of functional units. Here, the unit refers to an ASIC (Application Specific Integrated Circuit) circuit, a processor and a memory that execute one or more software or fixed programs, and / or other devices that can provide the above functions.

[0092] This embodiment of the present invention also provides a computer device having the above-mentioned Figure 5 shown RF device test apparatus.

[0093] Please refer to Figure 6 , Figure 6 which is a schematic structural diagram of a computer device provided by an alternative embodiment of the present invention. As shown in Figure 6As shown, the computer device includes: one or more processors 10, a memory 20, and interfaces for connecting the components, including a high-speed interface and a low-speed interface. Each component communicates with each other using different buses and can be installed on a common motherboard or in other ways as needed. The processor can process instructions executed within the computer device, including instructions stored in the memory or on the memory to display graphical information of the GUI on an external input / output device (such as a display device coupled to the interface). In an alternative embodiment, if needed, multiple processors and / or multiple buses can be used together with multiple memories. Similarly, multiple computer devices can be connected, and each device provides part of the necessary operations (for example, as a server array, a set of blade servers, or a multi-processor system). Figure 6 Taking one processor 10 as an example in

[0094] The processor 10 can be a central processing unit, a network processor, or a combination thereof. Among them, the processor 10 can further include a hardware chip. The above-mentioned hardware chip can be an application-specific integrated circuit, a programmable logic device, or a combination thereof. The above-mentioned programmable logic device can be a complex programmable logic device, a field-programmable gate array, a generic array logic, or any combination thereof.

[0095] Among them, the memory 20 stores instructions executable by at least one processor 10, so that at least one processor 10 executes the method shown in the above embodiments.

[0096] The memory 20 can include a program storage area and a data storage area. Among them, the program storage area can store an operating system and application programs required for at least one function; the data storage area can store data created according to the use of the computer device, etc. In addition, the memory 20 can include a high-speed random access memory, and can also include a non-transitory memory, such as at least one disk storage device, a flash memory device, or other non-transitory solid-state storage devices. In an alternative embodiment, the memory 20 can optionally include a memory remotely set relative to the processor 10, and these remote memories can be connected to the computer device through a network. Examples of the above network include but are not limited to the Internet, an enterprise intranet, a local area network, a mobile communication network, and combinations thereof.

[0097] The memory 20 can include a volatile memory, such as a random access memory; the memory can also include a non-volatile memory, such as a flash memory, a hard disk, or a solid-state drive; the memory 20 can also include a combination of the above types of memories.

[0098] The computer device further includes an input device 30 and an output device 40. The processor 10, the memory 20, the input device 30, and the output device 40 can be connected through a bus or other means,Figure 6 Take the bus connection as an example.

[0099] The input device 30 can receive input digital or character information, and generate key signal inputs related to the user settings and function controls of the computer device, such as touch screens, keypads, mice, trackpads, touchpads, pointing sticks, one or more mouse buttons, trackballs, joysticks, etc. The output device 40 may include display devices, auxiliary lighting devices (e.g., LEDs), and tactile feedback devices (e.g., vibration motors), etc. The above display devices include, but are not limited to, liquid crystal displays, light-emitting diodes, displays, and plasma displays. In an alternative embodiment, the display device may be a touch screen.

[0100] The embodiments of the present invention also provide a computer-readable storage medium. The methods according to the embodiments of the present invention can be implemented in hardware, firmware, or be implemented as computer code that can be recorded on a storage medium, or be implemented as computer code that is originally stored in a remote storage medium or a non-transitory machine-readable storage medium and downloaded through a network and will be stored in a local storage medium, so that the methods described herein can be stored in such software processes on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only memory, a random access memory, a flash memory, a hard disk, or a solid-state drive, etc.; further, the storage medium can also include a combination of the above types of memories. It can be understood that a computer, a processor, a microprocessor controller, or programmable hardware includes a storage component that can store or receive software or computer code, and when the software or computer code is accessed and executed by the computer, the processor, or the hardware, the methods shown in the above embodiments are implemented.

[0101] A part of the present invention can be applied as a computer program product, such as computer program instructions, which when executed by a computer, can call or provide the methods and / or technical solutions according to the present invention through the operation of the computer. Those skilled in the art should be able to understand that the forms in which computer program instructions exist in a computer-readable medium include, but are not limited to, source files, executable files, installation package files, etc. Correspondingly, the ways in which computer program instructions are executed by a computer include, but are not limited to: the computer directly executes the instruction, or the computer compiles the instruction and then executes the corresponding compiled program, or the computer reads and executes the instruction, or the computer reads and installs the instruction and then executes the corresponding installed program. Here, the computer-readable medium can be any available computer-readable storage medium or communication medium accessible by the computer.

[0102] Although embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations fall within the scope defined by the appended claims.

Claims

1. A radio frequency device testing system, characterized in that: The system includes a digital module, a radio frequency module and a switch module; The port of the digital module is electrically connected to the status pin of the device under test; the digital module is used to control the working status of the device under test; The radio frequency module includes a vector network analyzer and a vector signal transceiver; the vector network analyzer is used to test the radio frequency performance of the device under test; the vector signal transceiver is used to test the signal quality of the device under test; The first port of the switch module is electrically connected to the port of the vector network analyzer; the second port of the switch module is electrically connected to the port of the vector signal transceiver; the third port of the switch module is electrically connected to the RF port of the device under test; the switch module is used to switch the test path to the corresponding RF module according to the test requirements.

2. The system according to claim 1, characterized in that The system also includes a power module; The port of the power module is electrically connected to the power pin of the device under test; the power module is used to provide power to the device under test and collect corresponding electrical feedback.

3. The system according to claim 1, characterized in that The system also includes a communication module; The communication module is connected to the external device for communication; the external device includes a sorting machine and a probe station; The communication module is also used to monitor the physical connection status of the device under test and to transmit data with the radio frequency module, the switch module, the digital module and the power module.

4. The system according to claim 1, characterized in that The radio frequency performance includes at least one of scattering parameters, gain, insertion loss and isolation; the signal quality includes at least one of power, harmonics, noise figure and switching time.

5. A method for testing a radio frequency device, characterized in that: The method is applied to the test system according to any one of claims 1 to 4, and the method comprises: Based on the preset program requirements, the digital module is controlled to control the state of the device under test so that the device under test is in a first state; Control the switch module to switch the test path to the vector network analyzer to test the RF performance; Control the switch module to switch the test path to the vector signal transceiver to test the signal quality; Based on the radio frequency performance and the signal quality, the performance of the device under test in the first state is determined.

6. The method according to claim 5, characterized in that The method further comprises: The driving power supply module outputs a preset voltage source to the power supply pin of the device under test; collecting feedback current of the device under test under the voltage source; The driving power supply module outputs a preset current source to the power supply pin of the device under test; collecting a feedback voltage of the device under test under the current source; Based on the feedback current and feedback voltage, the structural integrity and DC performance parameters of the device under test are determined.

7. The method according to claim 5, characterized in that The test of radio frequency performance includes: Controlling the vector network analyzer to transmit a first test signal to the device under test; Acquire a first feedback signal of the device under test; The first test signal and the first feedback signal are compared to determine a radio frequency performance test result.

8. The method according to claim 5, characterized in that The test signal quality includes: Controlling the vector signal transceiver to transmit a second test signal to the device under test; Acquire a second feedback signal of the device under test; The second test signal and the second feedback signal are compared to determine a signal quality test result.

9. A radio frequency device testing device, characterized in that: The device comprises: A state control module, used to control the digital module to control the state of the device under test based on a preset program requirement, so that the device under test is in a first state; The RF performance test module is used to control the switch module to switch the test path to the vector network analyzer to test the RF performance; A signal quality test module is used to control the switch module to switch the test path to the vector signal transceiver to test the signal quality; The performance determination module is used to determine the performance of the device under test in the first state based on the radio frequency performance and the signal quality.

10. A computer device, characterized in that: include: A memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the RF device testing method according to any one of claims 5 to 8 by executing the computer instructions.

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