Multifunctional test control method and device, terminal equipment and storage medium

Abstract

The invention discloses a multifunctional test control method and apparatus, a terminal device and a storage medium. The method comprises the steps of obtaining a test item of a tested device; determining a target test switch position according to the test item; in a preset total test loop, closing a test switch corresponding to the position of the target test switch to obtain a test loop; and testing the test item on the tested equipment based on the test loop. According to the invention, the switching automation of different test items is realized by controlling the switching-off and switching-on of the test switch of the test main loop, so that the efficiency of the multifunctional test is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of automobile wind resistance optimization, and in particular to a multifunctional test control method, device, terminal equipment and storage medium. Background Art

[0002] With the continuous expansion of the scale of the power grid, the number of primary substation equipment is increasing day by day, while the number of personnel has basically remained zero in recent years. As a result, the workload of power equipment testing has exceeded the current saturation value of the total workload of test professionals. Improving test efficiency under existing conditions is an effective means to solve the shortage of manpower. Traditional test instruments and equipment are highly dependent on people, with low levels of automation and digitization. They require manpower to constantly change lines, manually record data, and manually enter test data into the system, which is extremely cumbersome. Therefore, traditional tests require multiple test devices, and rewiring is required when replacing devices. The time required for wiring in large-scale equipment tests is much longer than the test itself, and repeated wiring and disconnection seriously affects the test efficiency.

[0003] In summary, a multifunctional test control strategy is urgently needed to solve the problem of low efficiency of multifunctional tests. Summary of the invention

[0004] The embodiments of the present invention provide a multifunctional test control method, apparatus, terminal equipment and storage medium to solve the problem of low efficiency of multifunctional tests.

[0005] In order to solve the above problems, an embodiment of the present invention provides a multifunctional test control method, including:

[0006] Obtain the test items of the equipment under test;

[0007] According to the test items, determining a target test switch position;

[0008] In a preset total test loop, closing a test switch corresponding to a target test switch position to obtain a test loop;

[0009] Based on the test loop, the test item is tested on the device under test.

[0010] As an improvement of the above scheme, the test total loop includes: a device under test, a power supply, a capacitor, an A / D converter, a plurality of resistors, a plurality of voltmeters, and a plurality of test switches; wherein the resistors include: a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, an eighth resistor, and a ninth resistor; the voltmeters include: a first voltmeter, a second voltmeter, a third voltmeter, and a fourth voltmeter; the test switches include: a first switch, a second switch, a third switch, a fourth switch, a fifth switch, a sixth switch, a seventh switch, an eighth switch, a ninth switch, and a tenth switch;

[0011] The negative pole of the power supply is respectively connected to the first end of the tenth switch, the first end of the second resistor, the first end of the third resistor, the first end of the sixth resistor, the first end of the seventh resistor, the first end of the second voltmeter, the first end of the third voltmeter, and the first end of the A / D converter; the positive pole of the power supply is respectively connected to the first end of the ninth resistor, the first end of the second switch, the first end of the first switch, and the first end of the fourth voltmeter; the second end of the tenth switch is connected to the first end of the eighth resistor; the second end of the eighth resistor is respectively connected to the second end of the ninth resistor and the second end of the fourth voltmeter; the second end of the seventh resistor is respectively connected to the first end of the ninth switch and the second end of the third voltmeter;

[0012] The first end of the first resistor is connected to the second end of the second switch; the second end of the first resistor is respectively connected to the second end of the first switch, the first end of the third switch, the first end of the fourth switch, and the first end of the device under test; the second end of the device under test is respectively connected to the first end of the first voltmeter, the first end of the fifth switch, the first end of the sixth switch, and the second end of the ninth switch; the second end of the fourth switch is connected to the second end of the first voltmeter; the second end of the third switch is connected to the first end of the capacitor;

[0013] The second end of the A / D converter is respectively connected to the second end of the capacitor and the second end of the second resistor; the third end of the A / D converter is respectively connected to the second end of the fifth switch and the second end of the third resistor;

[0014] The second end of the second voltmeter is respectively connected to the second end of the sixth switch, the first end of the fourth resistor, and the first end of the seventh switch; the first end of the fifth resistor is respectively connected to the second end of the fourth resistor, the second end of the seventh switch, and the first end of the eighth switch; the second end of the sixth resistor is respectively connected to the second end of the fifth resistor and the second end of the eighth switch;

[0015] Wherein, the negative pole of the power supply, the first end of the tenth switch, the first end of the second resistor, the first end of the third resistor, the first end of the sixth resistor, the first end of the seventh resistor, the first end of the second voltmeter, the first end of the third voltmeter, and the first end of the A / D converter are all grounded.

[0016] As an improvement of the above solution, the determining the target test switch position according to the test item includes:

[0017] Judging the test item; wherein, the test item includes one of a direct current resistance measurement item, a loop resistance measurement item, an insulation resistance measurement item, a leakage current measurement item, a dielectric loss measurement item, and a capacitance measurement item;

[0018] If the test item is a DC resistance measurement item or a loop resistance measurement item, the target test switch positions are the first switch, the fourth switch, and the ninth switch;

[0019] If the test item is an insulation resistance measurement item or a leakage current measurement item, the target test switch positions are the second switch, the sixth switch, the seventh switch, the eighth switch, and the tenth switch;

[0020] If the test item is a dielectric loss measurement item or a capacitance measurement item, the target test switch positions are the first switch, the third switch, and the fifth switch.

[0021] As an improvement to the above solution, the test circuit includes: a loop resistance and DC resistance test circuit, an insulation resistance and leakage current test circuit, and a dielectric loss and capacitance test circuit; closing the test switches corresponding to the target test switch positions to obtain the test circuit includes:

[0022] When the first switch, the fourth switch, and the ninth switch are closed, a loop resistance and DC resistance test circuit is obtained;

[0023] When the second switch, the sixth switch, the seventh switch, the eighth switch, and the tenth switch are closed, an insulation resistance and leakage current test circuit is obtained;

[0024] When the first switch, the third switch, and the fifth switch are closed, a dielectric loss and capacitance test circuit is obtained.

[0025] As an improvement to the above solution, before obtaining the loop resistance and DC resistance test circuit, it further includes:

[0026] Closing the first switch and the ninth switch, and obtaining the first voltage value collected by the third voltmeter;

[0027] If the first voltage value is within the voltage threshold range, close the fourth switch to obtain the loop resistance and DC resistance test circuit;

[0028] If the first voltage value is not within the voltage threshold range, repair the device under test.

[0029] As an improvement to the above solution, the insulation resistance and leakage current test circuit includes: an insulation resistance and leakage current first test circuit, an insulation resistance and leakage current second test circuit, an insulation resistance and leakage current third test circuit, and an insulation resistance and leakage current fourth test circuit; before obtaining the insulation resistance and leakage current test circuit, it further includes:

[0030] Closing the seventh switch and the eighth switch, and obtaining the second voltage value of the second voltmeter;

[0031] If the second voltage value is within the first voltage range, when the seventh switch and the eighth switch are closed, a first test circuit for insulation resistance and leakage current is obtained;

[0032] If the second voltage value is within the first voltage range, the seventh switch is opened to obtain a second test circuit for insulation resistance and leakage current;

[0033] If the second voltage value is within the second voltage range, the eighth switch is opened to obtain a third test circuit for insulation resistance and leakage current;

[0034] If the second voltage value is within the third voltage range, the seventh switch and the eighth switch are opened simultaneously to obtain a fourth test circuit for insulation resistance and leakage current.

[0035] As an improvement of the above solution, in the loop resistance and DC resistance test circuit, the power supply is a programmable DC current source, and the first resistor is a sampling resistor; in the insulation resistance and leakage current test circuit, the power supply is a programmable DC voltage source, and the first resistor is a protection resistor; in the dielectric loss and capacitance test circuit, the power supply is a programmable AC voltage source.

[0036] Correspondingly, an embodiment of the present invention further provides a multifunctional test control device, including: a data acquisition module, a position determination module, a loop acquisition module, and a test module;

[0037] The data acquisition module is configured to acquire the test items of the device under test;

[0038] The position determination module is configured to determine the target test switch position according to the test items;

[0039] The loop acquisition module is configured to close the test switch corresponding to the target test switch position in the preset total test loop to obtain a test loop;

[0040] The test module is configured to perform the test of the test items on the device under test based on the test loop.

[0041] Correspondingly, an embodiment of the present invention further provides a computer terminal device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor. When the processor executes the computer program, it implements a multifunctional test control method as described in the present invention.

[0042] Correspondingly, an embodiment of the present invention further provides a computer-readable storage medium. The computer-readable storage medium includes a stored computer program. When the computer program runs, it controls the device where the computer-readable storage medium is located to execute a multifunctional test control method as described in the present invention.

[0043] As can be seen from the above, the present invention has the following beneficial effects:

[0044] The present invention provides a multi-functional test control method, which obtains the test items of the device under test; determines the target test switch position according to the test items; closes the test switch corresponding to the target test switch position in the preset total test loop to obtain a test loop; and tests the device under test for the test items based on the test loop. By controlling the opening and closing of the test switch in the total test loop, the present invention realizes the automation of switching between different test items, thereby improving the efficiency of the multi-functional test. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] Figure 1 is a schematic flowchart of a multi-functional test control method provided by an embodiment of the present invention;

[0046] Figure 2 is a schematic structural diagram of a multi-functional test control device provided by an embodiment of the present invention;

[0047] Figure 3 is a schematic structural diagram of a terminal device provided by an embodiment of the present invention;

[0048] Figure 4 is a schematic structural diagram of a total test loop provided by an embodiment of the present invention;

[0049] Figure 5 is a schematic structural diagram of a loop resistance and direct current resistance test loop provided by an embodiment of the present invention;

[0050] Figure 6 is a schematic structural diagram of an insulation resistance and leakage current test loop provided by an embodiment of the present invention;

[0051] Figure 7 is a schematic structural diagram of a dielectric loss and capacitance test loop provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0052] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0053] Embodiment 1

[0054] Refer to Figure 1 , Figure 1 which is a schematic flowchart of a multi-functional test control method provided by an embodiment of the present invention. As shown in Figure 1As shown, this embodiment includes steps 101 to 104, and the specific steps are as follows:

[0055] Step 101: Obtain the test items of the device under test.

[0056] In this embodiment, the device under test is a device in a substation.

[0057] Step 102: Determine the target test switch position according to the test items.

[0058] In this embodiment, the determining the target test switch position according to the test items includes:

[0059] Judge the test items; among them, the test items include: one of the direct current resistance measurement item, loop resistance measurement item, insulation resistance measurement item, leakage current measurement item, dielectric loss measurement item, and capacitance measurement item;

[0060] If the test item is the direct current resistance measurement item or the loop resistance measurement item, the target test switch positions are the first switch, the fourth switch, and the ninth switch;

[0061] If the test item is the insulation resistance measurement item or the leakage current measurement item, the target test switch positions are the second switch, the sixth switch, the seventh switch, the eighth switch, and the tenth switch;

[0062] If the test item is the dielectric loss measurement item or the capacitance measurement item, the target test switch positions are the first switch, the third switch, and the fifth switch.

[0063] Step 103: In the preset total test loop, close the test switches corresponding to the target test switch positions to obtain a test loop.

[0064] In this embodiment, the total test loop includes: the device under test, a power supply, a capacitor, an A / D converter, several resistors, several voltmeters, and several test switches; among them, the resistors include: the first resistor, the second resistor, the third resistor, the fourth resistor, the fifth resistor, the sixth resistor, the seventh resistor, the eighth resistor, and the ninth resistor; the voltmeters include: the first voltmeter, the second voltmeter, the third voltmeter, and the fourth voltmeter; the test switches include: the first switch, the second switch, the third switch, the fourth switch, the fifth switch, the sixth switch, the seventh switch, the eighth switch, the ninth switch, and the tenth switch;

[0065] The negative electrode of the power supply is respectively connected to the first terminal of the tenth switch, the first terminal of the second resistor, the first terminal of the third resistor, the first terminal of the sixth resistor, the first terminal of the seventh resistor, the first terminal of the second voltmeter, the first terminal of the third voltmeter, and the first terminal of the A / D converter; the positive electrode of the power supply is respectively connected to the first terminal of the ninth resistor, the first terminal of the second switch, the first terminal of the first switch, and the first terminal of the fourth voltmeter; the second terminal of the tenth switch is connected to the first terminal of the eighth resistor; the second terminal of the eighth resistor is respectively connected to the second terminal of the ninth resistor and the second terminal of the fourth voltmeter; the second terminal of the seventh resistor is respectively connected to the first terminal of the ninth switch and the second terminal of the third voltmeter;

[0066] The first terminal of the first resistor is connected to the second terminal of the second switch; the second terminal of the first resistor is respectively connected to the second terminal of the first switch, the first terminal of the third switch, the first terminal of the fourth switch, and the first terminal of the device under test; the second terminal of the device under test is respectively connected to the first terminal of the first voltmeter, the first terminal of the fifth switch, the first terminal of the sixth switch, and the second terminal of the ninth switch; the second terminal of the fourth switch is connected to the second terminal of the first voltmeter; the second terminal of the third switch is connected to the first terminal of the capacitor;

[0067] The second terminal of the A / D converter is respectively connected to the second terminal of the capacitor and the second terminal of the second resistor; the third terminal of the A / D converter is respectively connected to the second terminal of the fifth switch and the second terminal of the third resistor;

[0068] The second terminal of the second voltmeter is respectively connected to the second terminal of the sixth switch, the first terminal of the fourth resistor, and the first terminal of the seventh switch; the first terminal of the fifth resistor is respectively connected to the second terminal of the fourth resistor, the second terminal of the seventh switch, and the first terminal of the eighth switch; the second terminal of the sixth resistor is respectively connected to the second terminal of the fifth resistor and the second terminal of the eighth switch;

[0069] Wherein, the negative electrode of the power supply, the first terminal of the tenth switch, the first terminal of the second resistor, the first terminal of the third resistor, the first terminal of the sixth resistor, the first terminal of the seventh resistor, the first terminal of the second voltmeter, the first terminal of the third voltmeter, and the first terminal of the A / D converter are all grounded.

[0070] In a specific embodiment, the test main circuit is shown in Figure 4, the equipment under test is Zx, a power supply, capacitor Cn, an A / D converter is A / D, several resistors, several voltmeters, and several test switches; among them, the resistors include: the first resistor is R1, the second resistor is R2, the third resistor is R3, the fourth resistor is R4, the fifth resistor is R5, the sixth resistor is R6, the seventh resistor is R7, the eighth resistor is R8, and the ninth resistor is R9; the voltmeters include: the first voltmeter is V1, the second voltmeter is V2, the third voltmeter is V3, and the fourth voltmeter is V4; the test switches include: the first switch is K1, the second switch is K2, the third switch is K3, the fourth switch is K4, the fifth switch is K5, the sixth switch is K6, the seventh switch is K7, the eighth switch is K8, the ninth switch is K9, and the tenth switch is K10.

[0071] In this embodiment, the test circuits include: a loop resistance and DC resistance test circuit, an insulation resistance and leakage current test circuit, and a dielectric loss and capacitance test circuit; closing the test switch corresponding to the target test switch position to obtain the test circuit includes:

[0072] When the first switch, the fourth switch, and the ninth switch are closed, a loop resistance and DC resistance test circuit is obtained;

[0073] When the second switch, the sixth switch, the seventh switch, the eighth switch, and the tenth switch are closed, an insulation resistance and leakage current test circuit is obtained;

[0074] When the first switch, the third switch, and the fifth switch are closed, a dielectric loss and capacitance test circuit is obtained.

[0075] In this embodiment, before obtaining the loop resistance and DC resistance test circuit, it further includes:

[0076] Closing the first switch and the ninth switch, and obtaining the first voltage value collected by the third voltmeter;

[0077] If the first voltage value is within the voltage threshold range, then close the fourth switch to obtain the loop resistance and DC resistance test circuit;

[0078] If the first voltage value is not within the voltage threshold range, then repair the equipment under test.

[0079] In a specific embodiment, closing the first switch, the fourth switch, and the ninth switch forms a test circuit, as Figure 5 shown. Among them:

[0080] (1) The power supply is a programmable DC current source, which provides 5A, 10A, and 20A DC currents here to test the DC resistance, and provides a maximum of 100A DC current to test the loop resistance.

[0081] (2) Zx is the product under test, such as various switch devices like circuit breakers, disconnectors, knife switches, etc., and transformer coils or various reactance coils.

[0082] (3) R1 is a sampling resistor, whose main function is to obtain voltage information. To facilitate the acquisition of voltage by the acquisition card, the value of this resistor is set to 0.08 Ω so that its voltage value is between 0.4 V and 8 V. Then, by using the resistor series voltage division law in combination with the voltage across the test product, the resistance of the test product can be obtained. It can monitor whether the current value used in the test meets the requirements while eliminating the influence caused by the inaccurate output current of the programmable current source, improving the accuracy of the test.

[0083] Precautions during measurement:

[0084] (1) First, close "K1" and "K9". Wait until the voltage reading collected by R7 is normal before closing "K4". If the voltage reading collected by R7 is abnormal, it indicates that there may be an open circuit or other conditions in the test product Zx. At this time, if "K4" is closed, it may cause a large current in the circuit to directly flow into the acquisition card, resulting in damage to the acquisition card or affecting the test accuracy of the acquisition card.

[0085] In this embodiment, the insulation resistance and leakage current test circuit includes: the first insulation resistance and leakage current test circuit, the second insulation resistance and leakage current test circuit, the third insulation resistance and leakage current test circuit, and the fourth insulation resistance and leakage current test circuit; before obtaining the insulation resistance and leakage current test circuit, it also includes:

[0086] Close the seventh switch and the eighth switch to obtain the second voltage value of the second voltmeter;

[0087] If the second voltage value is within the first voltage range, when the seventh switch and the eighth switch are closed, obtain the first insulation resistance and leakage current test circuit;

[0088] If the second voltage value is within the first voltage range, disconnect the seventh switch to obtain the second insulation resistance and leakage current test circuit;

[0089] If the second voltage value is within the second voltage range, disconnect the eighth switch to obtain the third insulation resistance and leakage current test circuit;

[0090] If the second voltage value is within the third voltage range, disconnect both the seventh switch and the eighth switch simultaneously to obtain the fourth insulation resistance and leakage current test circuit.

[0091] In a specific embodiment, closing the second switch, the sixth switch, the seventh switch, the eighth switch, and the tenth switch can form a test circuit, as Figure 6 shown.

[0092] Among them:

[0093] (1) The power supply is a programmable DC voltage source, which can output voltages of 250V, 500V, 1000V, 2500V, and 5000V respectively. According to national standards, the applied voltage value is related to the rated working voltage of the test sample.

[0094] When the test sample is an insulator, the applied test voltage is 5000V.

[0095] (2) R1 is a protection resistor with a fixed value of 5MΩ, and its function is to prevent excessive current in the circuit.

[0096] (3) R2 and R3 are power supply sampling resistors with fixed values of 100MΩ and 100kΩ respectively. Their function is to accurately obtain the power supply voltage value in order to obtain the voltage value of the test circuit.

[0097] (4) R4, R5, and R6 are range switching resistors. Since the insulation resistance of the test sample has a large span, in rainy days, it can be as low as 0.5MΩ at the lowest, and when the insulation condition is good, it can reach dozens or hundreds of GΩ. If a range switching module is not added, it will lead to a huge voltage span for measurement and difficult acquisition, resulting in a large measurement error.

[0098] Precautions during measurement:

[0099] (1) "K7" and "K8" are range switching relays. When the test sample is first connected, both relays "K7" and "K8" need to be closed. At this time, only R6 is connected to the circuit. Even if the test sample has serious defects resulting in a very low resistance, it is the protection resistor R1 = 5MΩ that divides the voltage with the sampling resistor, and the voltage collected by the sampling resistor will not exceed the safety voltage at most, so as not to damage the acquisition card. Subsequently, according to the measured information, "K8" is disconnected in sequence or both are disconnected.

[0100] In this embodiment, in the loop resistance and DC resistance test loop, the power supply is a programmable DC current source, and the first resistor is a sampling resistor; in the insulation resistance and leakage current test loop, the power supply is a programmable DC voltage source, and the first resistor is a protection resistor; in the dielectric loss and capacitance test loop, the power supply is a programmable AC voltage source.

[0101] In a specific embodiment, closing the first switch, the third switch, and the fifth switch can form a test loop, as Figure 7 shown.

[0102] Among them:

[0103] (1) The power supply is a programmable AC voltage source.

[0104] (2) Cn is an internal standard capacitor with a fixed value of 100pF. R2 and R3 are both internal sampling resistors with fixed values of 50Ω and 100kΩ respectively.

[0105] The intelligent digital bridge measurement circuit is similar to the Xilin bridge, but the test process does not involve the operation of adjusting the bridge balance. The voltage across R2 and R3 is obtained through A / D sampling and sent to the computer, and the dielectric loss and capacitance of the test product can be further obtained.

[0106] Step 104: Based on the test loop, perform the test item test on the device under test.

[0107] See also Figure 2 , Figure 2 2 is a schematic diagram of a multifunctional test control device provided by an embodiment of the present invention, comprising: a data acquisition module 201, a position determination module 202, a loop acquisition module 203 and a test module 204;

[0108] The data acquisition module is used to obtain test items of the tested device;

[0109] The position determination module is used to determine the target test switch position according to the test item;

[0110] The loop acquisition module is used to close the test switch corresponding to the target test switch position in the preset test total loop to obtain the test loop;

[0111] The test module is used to perform the test item test on the device under test based on the test loop.

[0112] It can be understood that the above-mentioned system item embodiments correspond to the method item embodiments of the present invention, and can implement the multifunctional test control method provided by any one of the above-mentioned method item embodiments of the present invention.

[0113] This embodiment obtains the test items of the device under test; determines the target test switch position according to the test items; closes the test switch corresponding to the target test switch position in the preset test total loop to obtain the test loop; and performs the test item test on the device under test based on the test loop. The present invention realizes the automatic switching of different test items by controlling the opening and closing of the test switch of the test total loop, thereby improving the efficiency of the multi-function test.

[0114] Embodiment 2

[0115] See also Figure 3 , Figure 3 It is a schematic diagram of the structure of a terminal device provided in one embodiment of the present invention.

[0116] A terminal device in this embodiment includes: a processor 301, a memory 302, and a computer program stored in the memory 302 and executable on the processor 301. When the processor 301 executes the computer program, it implements the steps of the above-mentioned various multi-functional test control methods in the embodiment, such as Figure 1 All steps of the multi-functional test control method shown. Alternatively, when the processor executes the computer program, it implements the functions of each module in the above-mentioned device embodiments, such as: Figure 2 All modules of the multi-functional test control device shown.

[0117] In addition, an embodiment of the present invention further provides a computer-readable storage medium, which includes a stored computer program. When the computer program runs, it controls the device where the computer-readable storage medium is located to execute the multi-functional test control method described in any one of the above embodiments.

[0118] Those skilled in the art can understand that the schematic diagram is only an example of the terminal device, which does not constitute a limitation on the terminal device. It may include more or fewer components than shown, or combine some components, or different components. For example, the terminal device may further include input / output devices, network access devices, buses, etc.

[0119] The so-called processor 301 may be a central processing unit (CPU), or may also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc. The processor 301 is the control center of the terminal device, and connects various parts of the entire terminal device through various interfaces and lines.

[0120] The memory 302 can be used to store the computer programs and / or modules. By running or executing the computer programs and / or modules stored in the memory, and by invoking the data stored in the memory 302, the processor 301 realizes various functions of the terminal device. The memory 302 may mainly include a program storage area and a data storage area. Among them, the program storage area may store an operating system, application programs required for at least one function (such as a sound playback function, an image playback function, etc.); the data storage area may store data created according to the use of the mobile phone (such as audio data, phone book, etc.). In addition, the memory may include a high-speed random access memory, and may also include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) card, a Flash Card, at least one magnetic disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0121] Among them, if the modules / units integrated in the terminal device are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on such an understanding, to implement all or part of the processes in the above-mentioned embodiment methods of the present invention, it can also be completed by instructing relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, the steps of the above-mentioned various method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, an executable file, or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a USB flash drive, a mobile hard disk, a magnetic disk, an optical disc, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium, etc.

[0122] It should be noted that the device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. In addition, in the attached drawings of the device embodiments provided by the present invention, the connection relationships between modules indicate that they have communication connections, which can be specifically implemented as one or more communication buses or signal lines. Those of ordinary skill in the art can understand and implement without creative efforts.

[0123] The above is the preferred embodiment of the present invention. It should be pointed out that for those of ordinary skill in the art, without departing from the principle of the present invention, several improvements and refinements can be made, and these improvements and refinements are also regarded as the protection scope of the present invention.

Claims

1. A multifunctional test control method, characterized in that: include: Obtain the test items of the equipment under test; According to the test items, determining a target test switch position; In a preset total test loop, closing a test switch corresponding to a target test switch position to obtain a test loop; Based on the test loop, the test item is tested on the device under test.

2. The multifunctional test control method according to claim 1, characterized in that: The test total loop includes: a device under test, a power supply, a capacitor, an A / D converter, a plurality of resistors, a plurality of voltmeters, and a plurality of test switches; wherein the resistors include: a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, an eighth resistor, and a ninth resistor; the voltmeters include: a first voltmeter, a second voltmeter, a third voltmeter, and a fourth voltmeter; the test switches include: a first switch, a second switch, a third switch, a fourth switch, a fifth switch, a sixth switch, a seventh switch, an eighth switch, a ninth switch, and a tenth switch; The negative electrode of the power supply is respectively connected to the first end of the tenth switch, the first end of the second resistor, the first end of the third resistor, the first end of the sixth resistor, the first end of the seventh resistor, the first end of the second voltmeter, the first end of the third voltmeter, and the first end of the A / D converter; the positive electrode of the power supply is respectively connected to the first end of the ninth resistor, the first end of the second switch, the first end of the first switch, and the first end of the fourth voltmeter; the second end of the tenth switch is connected to the first end of the eighth resistor; the second end of the eighth resistor is respectively connected to the second end of the ninth resistor and the second end of the fourth voltmeter; the second end of the seventh resistor is respectively connected to the first end of the ninth switch and the second end of the third voltmeter; The first end of the first resistor is connected to the second end of the second switch; the second end of the first resistor is respectively connected to the second end of the first switch, the first end of the third switch, the first end of the fourth switch, and the first end of the tested device; the second end of the tested device is respectively connected to the first end of the first voltmeter, the first end of the fifth switch, the first end of the sixth switch, and the second end of the ninth switch; the second end of the fourth switch is connected to the second end of the first voltmeter; the second end of the third switch is connected to the first end of the capacitor; The second end of the A / D converter is respectively connected to the second end of the capacitor and the second end of the second resistor; the third end of the A / D converter is respectively connected to the second end of the fifth switch and the second end of the third resistor; The second end of the second voltmeter is respectively connected to the second end of the sixth switch, the first end of the fourth resistor, and the first end of the seventh switch; the first end of the fifth resistor is respectively connected to the second end of the fourth resistor, the second end of the seventh switch, and the first end of the eighth switch; the second end of the sixth resistor is respectively connected to the second end of the fifth resistor and the second end of the eighth switch; Among them, the negative electrode of the power supply, the first end of the tenth switch, the first end of the second resistor, the first end of the third resistor, the first end of the sixth resistor, the first end of the seventh resistor, the first end of the second voltmeter, the first end of the third voltmeter, and the first end of the A / D converter are all grounded.

3. The multifunctional test control method according to claim 2, characterized in that: Determining the target test switch position according to the test item includes: Determine the test items; wherein the test items include: a DC resistance measurement item, a loop resistance measurement item, an insulation resistance measurement item, a leakage current measurement item, a dielectric loss measurement item, and a capacitance measurement item; If the test item is a DC resistance measurement item or a loop resistance measurement item, the target test switch positions are the first switch, the fourth switch, and the ninth switch; If the test item is an insulation resistance measurement item or a leakage current measurement item, the target test switch positions are the second switch, the sixth switch, the seventh switch, the eighth switch and the tenth switch; If the test item is a dielectric loss measurement item or a capacitance measurement item, the target test switch values ​​are the first switch, the third switch, and the fifth switch.

4. The multifunctional test control method according to claim 3, characterized in that: The test loop includes: a loop resistance and DC resistance test loop, an insulation resistance and leakage current test loop, and a dielectric loss and capacitance test loop; the test switch corresponding to the target test switch position is closed to obtain the test loop, including: When the first switch, the fourth switch and the ninth switch are closed, the loop resistance and the DC resistance test loop are obtained; When the second switch, the sixth switch, the seventh switch, the eighth switch and the tenth switch are closed, an insulation resistance and leakage current test loop is obtained; When the first switch, the third switch and the fifth switch are closed, a dielectric loss and capacitance test loop is obtained.

5. The multifunctional test control method according to claim 4, characterized in that: Before obtaining the loop resistance and the DC resistance test loop, the method further includes: Close the first switch and the ninth switch to obtain a first voltage value collected by the third voltmeter; If the first voltage value is within the voltage threshold range, the fourth switch is closed to obtain the loop resistance and the DC resistance test loop; If the first voltage value is not within the voltage threshold range, the tested device is repaired.

6. The multifunctional test control method according to claim 4, characterized in that: The insulation resistance and leakage current test loop comprises: a first insulation resistance and leakage current test loop, a second insulation resistance and leakage current test loop, a third insulation resistance and leakage current test loop, and a fourth insulation resistance and leakage current test loop; before obtaining the insulation resistance and leakage current test loop, it also comprises: Closing the seventh switch and the eighth switch to obtain a second voltage value of the second voltmeter; If the second voltage value is within the first voltage range, then when the seventh switch and the eighth switch are closed, a first test loop of insulation resistance and leakage current is obtained; If the second voltage value is within the first voltage range, the seventh switch is disconnected to obtain a second test loop of insulation resistance and leakage current; If the second voltage value is within the second voltage range, the eighth switch is disconnected to obtain a third test loop of insulation resistance and leakage current; If the second voltage value is within the third voltage range, the seventh switch and the eighth switch are disconnected simultaneously to obtain a fourth test loop of insulation resistance and leakage current.

7. The multifunctional test control method according to claim 4, characterized in that: In the loop resistance and DC resistance test loop, the power supply is a programmable DC current source and the first resistor is a sampling resistor; in the insulation resistance and leakage current test loop, the power supply is a programmable DC voltage source and the first resistor is a protective resistor; in the dielectric loss and capacitance test loop, the power supply is a programmable AC voltage source.

8. A multifunctional test control device, characterized in that: include: Data acquisition module, location determination module, loop acquisition module and testing module; The data acquisition module is used to obtain test items of the tested device; The position determination module is used to determine the target test switch position according to the test item; The loop acquisition module is used to close the test switch corresponding to the target test switch position in the preset test total loop to obtain the test loop; The test module is used to perform the test item test on the device under test based on the test loop.

9. A computer terminal device, characterized in that: The method comprises a processor, a memory and a computer program stored in the memory and configured to be executed by the processor, wherein when the processor executes the computer program, a multifunctional test control method as claimed in any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a stored computer program, wherein when the computer program is executed, the device where the computer-readable storage medium is located is controlled to execute a multifunctional test control method as described in any one of claims 1 to 7.

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