Method and device for determining optical path parameters of speckle autocorrelation imaging experiment system

Abstract

The invention discloses a method and a device for determining optical path parameters of a speckle autocorrelation imaging experiment system. According to the light path parameter determination method of the speckle autocorrelation imaging experiment system, the diagonal length of an object to be imaged and the memory effect range field angle of a scattering medium are measured; determining a first distance between the to-be-imaged object and the scattering medium according to the diagonal length and the memory effect range field angle; acquiring the pixel size and the pixel number of the sampling surface and the central wavelength of the light source; determining a second distance between the sampling surface and the scattering medium according to the pixel size, the pixel number, the diagonal length and the first distance; and determining the diameter of the diaphragm according to the central wavelength, the pixel size and the second distance.

Description

Technical Field

[0001] This specification relates to the field of autocorrelation imaging technology, and particularly to a method and device for determining the optical path parameters of a speckle autocorrelation imaging experimental system. Background Art

[0002] Since a scattering medium disturbs the wavefront of light, it is difficult to clearly obtain an image of an object hidden behind the scattering medium by traditional imaging methods. Imaging techniques involving the speckle autocorrelation method use the power spectrum of the detected light intensity and phase retrieval algorithms to calculate the intensity map of the target structure, without the need to penetrate inside the scattering system, and have better environmental adaptability and higher robustness.

[0003] However, in the experimental verification stage of imaging techniques involving the speckle autocorrelation method, due to insufficient detailed system data provided in the early stage, sometimes experimenters may need to grope and adjust the position distances of various components many times to verify the effectiveness of the method. Even it is difficult to distinguish whether a wrong result is caused by the deviation of the optical path setup in the verification process or the actual principle problem, which greatly increases the time cost of experiments and scientific research.

[0004] Therefore, how to quickly and stably build the optical path of a speckle self-imaging experimental system through a more perfect method is an urgent problem to be solved. Summary of the Invention

[0005] This specification provides a method, device, storage medium and electronic device for determining the optical path parameters of a speckle autocorrelation imaging experimental system to at least partially solve the above problems existing in the prior art.

[0006] This specification adopts the following technical solutions: This specification provides a method for determining the optical path parameters of a speckle autocorrelation imaging experimental system, where the speckle autocorrelation imaging experimental system at least includes a light source, an object to be imaged, a scattering medium, a diaphragm, and a sampling surface. The method includes: Measuring the diagonal length of the object to be imaged and the angular spread of the memory effect range of the scattering medium; Determining a first distance between the object to be imaged and the scattering medium according to the diagonal length and the angular spread of the memory effect range; Obtaining the pixel size and the number of pixels of the sampling surface, and the central wavelength of the light source; Determining a second distance between the sampling surface and the scattering medium according to the pixel size, the number of pixels, the diagonal length and the first distance; Determining the diameter of the diaphragm according to the central wavelength, the pixel size and the second distance.

[0007] Optionally, determining a first distance between the object to be imaged and the scattering medium according to the diagonal length and the included angle of the memory effect range specifically includes: Determining the memory effect range of the scattering medium according to the included angle of the memory effect range of the scattering medium; Determining the first distance between the object to be imaged and the scattering medium with the condition that the object to be imaged is within the memory effect range.

[0008] Optionally, the pixel size includes a horizontal pixel size and a vertical pixel size, and the number of pixels includes a horizontal number of pixels and a vertical number of pixels; Determining a second distance between the sampling plane and the scattering medium according to the pixel size, the number of pixels, the diagonal length, and the first distance, specifically including: Determining the second distance between the sampling plane and the scattering medium, where the product of the horizontal pixel size and the horizontal number of pixels, and the product of the vertical pixel size and the vertical number of pixels are both greater than the product of the quotient of the second distance and the first distance and the diagonal length.

[0009] Optionally, determining the diameter of the aperture specifically includes: Determining the diameter of the aperture on the condition of satisfying the Wiener - Khintchine theorem.

[0010] Optionally, the light emitted from any point on the object to be imaged can cover the light - passing area of the aperture.

[0011] Optionally, the method further includes: Constructing the optical path of the speckle self - correlation imaging experimental system according to the first distance, the second distance, and the diameter.

[0012] Optionally, constructing the optical path of the speckle self - correlation imaging experimental system according to the first distance, the second distance, and the diameter specifically includes: Constructing the optical path of the speckle self - correlation imaging experimental system in the order of light source, object to be imaged, scattering medium, aperture, sampling plane, where the distance between the object to be imaged and the scattering medium is the first distance, the distance between the scattering medium and the sampling plane is the second distance, and the aperture is in contact with the scattering medium.

[0013] An optical path parameter determination device for a speckle self - correlation imaging experimental system provided in this specification, the speckle self - correlation imaging experimental system at least includes a light source, an object to be imaged, a scattering medium, an aperture, a sampling plane, and the device includes: A measurement module, configured to measure the diagonal length of the object to be imaged and the included angle of the memory effect range of the scattering medium; A first determination module, configured to determine a first distance between the object to be imaged and the scattering medium according to the diagonal length and the angular spread of the memory effect range. An acquisition module, configured to acquire the pixel size and the number of pixels of the sampling surface, and the central wavelength of the light source. A second determination module, configured to determine a second distance between the sampling surface and the scattering medium according to the pixel size, the number of pixels, the diagonal length, and the first distance. A third determination module, configured to determine the diameter of the aperture according to the central wavelength, the pixel size, and the second distance.

[0014] This specification provides a computer-readable storage medium storing a computer program, which when executed by a processor implements the method for determining the optical path parameters of the above-mentioned speckle autocorrelation imaging experimental system.

[0015] This specification provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor implements the method for determining the optical path parameters of the above-mentioned speckle autocorrelation imaging experimental system when executing the program.

[0016] At least one of the above technical solutions adopted in this specification can achieve the following beneficial effects: In the method for determining the optical path parameters of the speckle autocorrelation imaging experimental system provided in this specification, the diagonal length of the object to be imaged and the angular spread of the memory effect range of the scattering medium are measured; according to the diagonal length and the angular spread of the memory effect range, a first distance between the object to be imaged and the scattering medium is determined; the pixel size and the number of pixels of the sampling surface, and the central wavelength of the light source are acquired; according to the pixel size, the number of pixels, the diagonal length, and the first distance, a second distance between the sampling surface and the scattering medium is determined; according to the central wavelength, the pixel size, and the second distance, the diameter of the aperture is determined.

[0017] When adopting this method, parameters such as the first distance, the second distance, and the diameter of the aperture required in the speckle autocorrelation imaging experimental system can be quickly and effectively determined, and the optical path can be built based on the determined parameters subsequently. Using this method can avoid misjudging the effectiveness of the technical means to be verified due to deviations in experimental parameters and save more experimental time. At the same time, this method can further help improve the imaging quality and has great application prospects in underwater target positioning, fog-penetrating imaging, etc. Description of the Drawings

[0018] The accompanying drawings described herein are used to provide a further understanding of the present specification, and constitute a part of the present specification. The schematic embodiments of the present specification and their descriptions are used to explain the present specification, and do not constitute an improper limitation of the present specification. In the drawings: Figure 1 is a schematic flow chart of a method for determining the optical path parameters of a speckle autocorrelation imaging experimental system in the present specification; Figure 2 is a schematic structural diagram of a common speckle autocorrelation imaging experimental system provided in the present specification; Figure 3 is a schematic structural diagram of a speckle autocorrelation imaging experimental system achieved by reflection provided in the present specification; Figure 4 is a schematic diagram of a device for determining the optical path parameters of a speckle autocorrelation imaging experimental system provided in the present specification; Figure 5 corresponds to that provided in the present specification Figure 1 schematic diagram of an electronic device. Specific embodiments

[0019] Theoretically, in the speckle autocorrelation imaging technology, the distance from the sampling plane to the rear surface of the scattering medium can be adjusted within a relatively large range, but this is based on the premise of ideal signal-to-noise ratio and an unlimited sampling plane. In the actual experimental process, the signal-to-noise ratio will decay with the transmission distance, and there are also size limitations for the sampling plane and pixel size. There is an obvious constraint among various system parameters. According to the object size, the distance from the object to the scattering medium, and the requirements of the phase retrieval algorithm for the sample ratio, etc., sampling parameters such as the collaborative detection distance and the sampling plane can be adjusted to quickly build a reasonable experimental optical path.

[0020] To make the purpose, technical solutions, and advantages of the present specification clearer, the technical solutions of the present specification will be clearly and completely described below in conjunction with specific embodiments of the present specification and the corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of the present specification, rather than all the embodiments. Based on the embodiments in the present specification, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of this application.

[0021] The following will describe in detail the technical solutions provided by each embodiment of the present specification with reference to the accompanying drawings.

[0022] Figure 1 is a schematic flow chart of a method for determining the optical path parameters of a speckle autocorrelation imaging experimental system in the present specification. The speckle autocorrelation imaging experimental system at least includes a light source, an object to be imaged, a scattering medium, a diaphragm, and a sampling plane. The method specifically includes the following steps: S100: Measure the diagonal length of the object to be imaged and the angular spread of the memory effect range of the scattering medium.

[0023] All steps in the method for determining the optical path parameters of the speckle autocorrelation imaging experimental system provided in this specification can be implemented by any electronic device with computing capabilities, such as terminals, servers, etc.

[0024] This method is mainly used to determine the parameters of the optical path in the speckle autocorrelation imaging experimental system and subsequently build the optical path according to the parameters. Speckle autocorrelation imaging is an imaging technique based on speckle patterns and autocorrelation algorithms, mainly used to obtain clear images of hidden objects through a scattering medium. Its core principle is to use the autocorrelation characteristics of the speckle pattern to reconstruct the information of the target object.

[0025] Figure 2 It is a schematic structural diagram of a common speckle autocorrelation imaging experimental system provided in this specification. As Figure 2 shown, the speckle autocorrelation imaging experimental system usually includes a light source, an object to be imaged, a scattering medium, a diaphragm, and a sampling surface. Among them, the sampling surface can be implemented as Figure 2 shown, using the photosensitive surface of the detector, or can be implemented in other ways, and this specification does not make specific limitations on this. When using the photosensitive surface of an electronic device such as a detector as the sampling surface, the detector can be additionally connected to any terminal device with computing capabilities to transmit the collected data to the terminal device, and the terminal device can implement processes such as data processing and image reconstruction.

[0026] Based on the above-mentioned speckle autocorrelation imaging experimental system, in this method, the diagonal length of the object to be imaged and the angular spread of the memory effect range of the scattering medium can be measured first for use in subsequent steps.

[0027] The line segment between any two non-adjacent vertices of the object to be imaged can be regarded as a diagonal. In this method, measuring the diagonal length of the object to be imaged can specifically be to measure the length of each diagonal of the object to be imaged and take the length of the longest diagonal as the final obtained diagonal length of the object to be imaged.

[0028] The memory effect of the scattering medium refers to that when light passes through the scattering medium, a small angular change in the incident light will cause a corresponding linear translation of the outgoing light field, while the spatial distribution of the light field remains basically unchanged. This phenomenon indicates that the scattering medium has a certain memory ability for the direction change of the incident light within a certain angular range, and the angular range that can maintain this memory ability is the angular spread of the memory effect range of the scattering medium.

[0029] S102: Determine a first distance between the object to be imaged and the scattering medium according to the diagonal length and the angular spread of the memory effect range.

[0030] Using the diagonal length of the object to be imaged measured in step S100 and the angular spread range of the memory effect of the scattering medium, a reasonable distance between the object to be imaged and the scattering medium during the setup of the optical path can be determined in this step, which is the first distance in this method.

[0031] Specifically, the memory effect range of the scattering medium can be determined according to the angular spread of the memory effect range of the scattering medium; with the constraint that the object to be imaged is within the memory effect range, the first distance between the object to be imaged and the scattering medium is determined.

[0032] According to the angular spread range of the memory effect of the scattering medium, the memory effect range of the scattering medium in the speckle autocorrelation imaging experimental system can be determined. According to the principle of the speckle autocorrelation imaging technique, the object to be imaged needs to be within the memory effect range of the scattering medium. Therefore, with this condition as a constraint, the first distance between the object to be imaged and the scattering medium can be determined. Specifically, it can be expressed by the following formula:

[0033] where \(l\) represents the diagonal length of the object to be imaged, \(\theta\) represents the angular spread range of the memory effect of the scattering medium, and \(Z\) O represents the first distance. It can be seen that the first distance between the object to be imaged and the scattering medium is not a fixed value, but a range of values. Under the condition of satisfying the above formula, the first distance can take any value and can meet the experimental conditions of the speckle autocorrelation imaging technique.

[0034] Furthermore, in order to obtain better experimental results, when determining the first distance, the constraint condition can be further limited to that the object to be imaged is within the memory effect range of the scattering medium and at the same time less than half of the memory effect range. Corresponding to the formula, it can be expressed as follows:

[0035] Under the above more stringent conditions, the point spread functions corresponding to different points on the object to be imaged have better translational invariance, which can improve the similarity between the reconstructed image and the target image to a certain extent.

[0036] According to the above method, one of the parameters to be determined in this method, that is, the first distance between the object to be imaged and the scattering medium, can be obtained.

[0037] S104: Obtain the pixel size and the number of pixels of the sampling surface, and the central wavelength of the light source.

[0038] After determining the first distance in step S102, the pixel size and the number of pixels of the sampling surface can be obtained in this step, and at the same time, the central wavelength of the light source can be obtained for use in determining other parameters in subsequent steps.

[0039] Among them, the pixel size of the sampling surface can include the lengths of the sides of each pixel point in the sampling surface in each direction, and the number of pixels can include the number of pixel points existing in the sampling surface in each direction. Usually, the pixel size can include the horizontal pixel size and the vertical pixel size, and the number of pixels can include the horizontal number of pixels and the vertical number of pixels. Among them, the horizontal pixel size characterizes the length of a pixel in the horizontal direction, and the vertical pixel size characterizes the length of a pixel in the vertical direction; the horizontal number of pixels characterizes the number of pixel points included in the sampling surface in the horizontal direction, and the vertical number of pixels characterizes the number of pixel points included in the sampling surface in the vertical direction.

[0040] The central wavelength of the light source is the wavelength with the highest intensity in the spectrum emitted by the light source. At the same time, those skilled in the art understand that usually, the light source required for the speckle autocorrelation imaging technique is a narrowband incoherent light source. The narrowband incoherent light source can include a narrowband LED, or a pseudo-thermal light source composed of a laser and a rotating ground glass, or a combination of a thermal light source and a narrowband filter, etc., and this specification does not make specific limitations on this.

[0041] S106: Determine a second distance between the sampling surface and the scattering medium according to the pixel size, the number of pixels, the diagonal length, and the first distance.

[0042] According to the diagonal length measured in step S100, the first distance determined in step S102, and the pixel size and the number of pixels of the sampling surface obtained in step S104, another parameter, that is, the second distance between the sampling surface and the scattering medium, can be further determined in this step.

[0043] Still taking the rectangular sampling surface as an example, when determining the second distance, specifically, the second distance between the sampling surface and the scattering medium can be determined, where the product of the horizontal pixel size and the horizontal number of pixels, and the product of the vertical pixel size and the vertical number of pixels are both greater than the product of the quotient of the second distance and the first distance and the diagonal length.

[0044] The above method can be expressed by the following formula:

[0045] Among them, x p represents the horizontal pixel size, y p represents the vertical pixel size; m represents the horizontal number of pixels of the sampling surface, n represents the vertical number of pixels of the sampling surface; l represents the diagonal length of the object to be imaged; Z ORepresents the first distance, Z D Represents the second distance.

[0046] The second distance determined in the above manner can ensure that the sampling surface captures a complete image of the object to be imaged. Similarly, the second distance is not a fixed value, and it can take any value as long as the above formula is satisfied.

[0047] Furthermore, in order to obtain better experimental results, the method for determining the second distance can be further restricted. Specifically, it can be expressed by the following formula:

[0048] The second distance determined under further restrictions can ensure the sample ratio in single-frame sampling, facilitating the direct reconstruction of the object using the single-frame sampling image.

[0049] According to the above method, one of the parameters that need to be determined in this method can be obtained, that is, the second distance between the scattering medium and the sampling surface.

[0050] S108: Determine the diameter of the aperture according to the central wavelength, the pixel size, and the second distance.

[0051] Finally, in this step, according to the central wavelength of the light source obtained in step S104, the pixel size of the sampling surface, and the second distance determined in step S106, another parameter that needs to be obtained in this method can be determined, that is, the diameter of the aperture.

[0052] An aperture is a physical structure used to control the size, shape, or direction of a light beam. It is usually a circular opening or hole and can be used to adjust the light flux, improve the imaging quality, or control the optical performance. As Figure 2 shown, it is located behind the scattering medium and is connected to it in the optical path of the speckle autocorrelation imaging experimental system. Placing an aperture on the rear surface of the scattering medium restricts the size of the outgoing light spot, which is used to control the average speckle grain size, that is, the theoretical image plane resolution size, and is also used to limit the contrast of the sampling image.

[0053] When determining the diameter of the aperture, specifically, the diameter of the aperture can be determined under the condition of satisfying the Wiener-Khinchin theorem. Among them, the Wiener-Khinchin theorem can be specifically embodied by the following formula:

[0054] Among them, λ represents the central wavelength of the light source, Z D represents the second distance between the scattering medium and the sampling surface; x p represents the lateral pixel size, y p represents the longitudinal pixel size; d A represents the diameter of the aperture.

[0055] In the above manner, the diameter of the diaphragm that meets the conditions can be determined.

[0056] Furthermore, when determining the diameter of the diaphragm, the diameter of the diaphragm and the position of the diaphragm should also satisfy that the light emitted from any point on the object to be imaged can cover the light-transmitting area of the diaphragm, so as to achieve the optimal imaging effect.

[0057] Additionally, in addition to the diaphragm, other components, such as beam shaping lenses, can be used to replace the diaphragm and achieve the same effect as the diaphragm. At this time, the determined diameter of the diaphragm can also be used for other components. For example, when using a beam shaping lens, the diameter of the outgoing light spot on the back surface of the scattering medium can be controlled to be the same as the size of the diaphragm determined by the above method.

[0058] Further, after determining parameters such as the first distance between the object to be imaged and the scattering medium, the second distance between the scattering medium and the sampling surface, and the diameter of the diaphragm, an optical path of a speckle autocorrelation imaging experimental system can be built based on the determined parameters. Specifically, the optical path of the speckle autocorrelation imaging experimental system can be built in the order of the light source, the object to be imaged, the scattering medium, the diaphragm, and the sampling surface. Among them, the distance between the object to be imaged and the scattering medium is the first distance, the distance between the scattering medium and the sampling surface is the second distance, and the diaphragm is in contact with the scattering medium.

[0059] Still taking Figure 2 as an example, in Figure 2 , the optical path of the speckle autocorrelation imaging experimental system is built in a straight line in the order of the light source, the object to be imaged, the scattering medium, the diaphragm, and the sampling surface from left to right. Among them, the distance between the object to be imaged and the scattering medium is the first distance determined by this method, the distance between the scattering medium and the sampling surface is the second distance determined by this method, and the diameter of the diaphragm is the diameter of the diaphragm determined by this application.

[0060] Additionally, in addition to performing the speckle autocorrelation imaging experiment in a transmission manner, the speckle autocorrelation imaging experiment can also be performed in a reflection manner. Figure 3 This is a schematic structural diagram of a speckle autocorrelation imaging experimental system implemented by reflection provided in this specification. As Figure 3 shown, at this time, the light source, the object to be imaged, and the sampling surface are on the same side of the scattering medium.

[0061] At this time, parameters such as the first distance, the second distance, and the diameter of the aperture can still be determined according to the method provided in this specification. That is, the distance between the object to be imaged and the scattering medium can be the first distance determined by this method, the distance between the scattering medium and the sampling surface can be the second distance determined by this method, and the diameter size of the aperture can be the diameter of the aperture determined by this method. At the same time, the incident angle and the reflection angle of the light can be made as the same as possible, that is, the angle between the light source and the normal of the scattering medium is the same as the angle between the sampling surface and the normal of the scattering medium, so as to achieve the optimal experimental effect.

[0062] It should be noted that whether it is Figure 2 the transmission mode shown or Figure 3 the reflection mode shown, when the sampling surface is the photosensitive surface of the detector, the computing device connected to the detector can be in any position, not limited by the position shown in the schematic diagram.

[0063] When adopting this method, the first distance, the second distance, and the diameter of the aperture required in the speckle autocorrelation imaging experimental system can be quickly and effectively determined, and the optical path can be built based on the determined parameters subsequently. Adopting this method can avoid misjudging the effectiveness of the technical means to be verified due to the deviation of experimental parameters and save more experimental time. At the same time, this method can further help improve the imaging quality and has great application prospects in underwater target positioning, fog-penetrating imaging, etc.

[0064] The above is the method for determining the optical path parameters of the speckle autocorrelation imaging experimental system provided in this specification. Based on the same idea, this specification also provides a corresponding device for determining the optical path parameters of the speckle autocorrelation imaging experimental system, as Figure 4 shown.

[0065] Figure 4 FIG. is a schematic diagram of a device for determining the optical path parameters of a speckle autocorrelation imaging experimental system provided in this specification. The speckle autocorrelation imaging experimental system at least includes a light source, an object to be imaged, a scattering medium, an aperture, and a sampling surface. The device includes: A measurement module 200 for measuring the diagonal length of the object to be imaged and the opening angle of the memory effect range of the scattering medium; A first determination module 202 for determining the first distance between the object to be imaged and the scattering medium according to the diagonal length and the opening angle of the memory effect range; An acquisition module 204 for acquiring the pixel size and the number of pixels of the sampling surface, and the central wavelength of the light source; A second determination module 206 for determining the second distance between the sampling surface and the scattering medium according to the pixel size, the number of pixels, the diagonal length, and the first distance; A third determination module 208, configured to determine the diameter of the aperture according to the central wavelength, the pixel size, and the second distance.

[0066] Optionally, the first determination module 202 is specifically configured to determine the memory effect range of the scattering medium according to the angular spread of the memory effect range of the scattering medium; and determine the first distance between the object to be imaged and the scattering medium with the object to be imaged within the memory effect range as a constraint.

[0067] Optionally, the pixel size includes a horizontal pixel size and a vertical pixel size, and the number of pixels includes a horizontal number of pixels and a vertical number of pixels; The second determination module 206 is specifically configured to determine the second distance between the sampling surface and the scattering medium, where the product of the horizontal pixel size and the horizontal number of pixels, and the product of the vertical pixel size and the vertical number of pixels are both greater than the product of the quotient of the second distance and the first distance and the diagonal length.

[0068] Optionally, the third determination module 208 is specifically configured to determine the diameter of the aperture on the condition of satisfying the Wiener-Khinchin theorem.

[0069] Optionally, the light emitted from any point on the object to be imaged can cover the light-transmitting area of the aperture.

[0070] Optionally, the apparatus further includes a building module 210, specifically configured to build the optical path of the speckle autocorrelation imaging experimental system according to the first distance, the second distance, and the diameter.

[0071] Optionally, the building module 210 is specifically configured to build the optical path of the speckle autocorrelation imaging experimental system in the order of a light source, an object to be imaged, a scattering medium, an aperture, and a sampling surface, where the distance between the object to be imaged and the scattering medium is the first distance, the distance between the scattering medium and the sampling surface is the second distance, and the aperture is in contact with the scattering medium.

[0072] This specification also provides a computer-readable storage medium storing a computer program that can be used to execute the above Figure 1 Method for determining the optical path parameters of the speckle autocorrelation imaging experimental system provided.

[0073] This specification also provides Figure 5 A schematic structural diagram of the electronic device shown. As Figure 5As described above, at the hardware level, the electronic device includes a processor, an internal bus, a network interface, a memory, and a non-volatile memory. Of course, it may also include other hardware required for other services. The processor reads the corresponding computer program from the non-volatile memory into the memory and then runs it to implement the above Figure 1 Method for determining the optical path parameters of the speckle self-correlation imaging experimental system described above. Of course, in addition to the software implementation method, this specification does not exclude other implementation methods, such as logic devices or a combination of software and hardware, etc. That is to say, the execution subject of the following processing flow is not limited to each logic unit, and can also be hardware or a logic device.

[0074] The improvement of a technology can be clearly distinguished as either a hardware improvement (e.g., the improvement of circuit structures such as diodes, transistors, switches, etc.) or a software improvement (the improvement of method flows). However, with the development of technology, many improvements in method flows today can be regarded as direct improvements in hardware circuit structures. Almost all designers obtain the corresponding hardware circuit structure by programming the improved method flow into the hardware circuit. Therefore, it cannot be said that an improvement in a method flow cannot be implemented with a hardware entity module. For example, a programmable logic device (PLD) (such as a field programmable gate array (FPGA)) is such an integrated circuit whose logical function is determined by the user's programming of the device. The designer can program by himself to "integrate" a digital system on a single PLD, without having to ask a chip manufacturer to design and fabricate a dedicated integrated circuit chip. Moreover, nowadays, instead of manually fabricating integrated circuit chips, this programming is mostly implemented using "logic compiler" software, which is similar to the software compiler used in program development and writing. The original code before compilation also has to be written in a specific programming language, which is called a hardware description language (HDL), and there is not only one kind of HDL, but many kinds, such as ABEL (Advanced Boolean Expression Language), AHDL (Altera Hardware Description Language), Confluence, CUPL (Cornell University Programming Language), HDCal, JHDL (Java Hardware Description Language), Lava, Lola, MyHDL, PALASM, RHDL (Ruby Hardware Description Language), etc. The most commonly used ones currently are VHDL (Very-High-Speed Integrated Circuit Hardware Description Language) and Verilog. Those skilled in the art should also be aware that by simply performing a little logical programming on the method flow with the above-mentioned several hardware description languages and programming it into the integrated circuit, it is easy to obtain the hardware circuit that implements the logical method flow.

[0075] The controller can be implemented in any suitable manner. For example, the controller can take the form of, for example, a microprocessor or a processor and a computer-readable medium storing computer-readable program code (such as software or firmware) executable by the (micro)processor, logic gates, switches, an application specific integrated circuit (ASIC), a programmable logic controller, and an embedded microcontroller. Examples of the controller include, but are not limited to, the following microcontrollers: ARC 625D, Atmel AT91SAM, Microchip PIC18F26K20, and Silicone Labs C8051F320. The memory controller can also be implemented as part of the control logic of the memory. Those skilled in the art also know that, in addition to implementing the controller in the form of pure computer-readable program code, it is entirely possible to make the controller implement the same function in the form of logic gates, switches, application specific integrated circuits, programmable logic controllers, and embedded microcontrollers by logically programming the method steps. Therefore, such a controller can be considered a hardware component, and the devices included therein for implementing various functions can also be regarded as the structures within the hardware component. Or even, the devices for implementing various functions can be regarded as either software modules for implementing the method or structures within the hardware component.

[0076] The systems, devices, modules, or units illustrated in the above embodiments can be specifically implemented by computer chips or entities, or by products with certain functions. A typical implementation device is a computer. Specifically, the computer can be, for example, a personal computer, a laptop computer, a cellular phone, a camera phone, a smart phone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.

[0077] For the convenience of description, the above devices are described by dividing them into various units according to functions. Of course, when implementing this specification, the functions of each unit can be implemented in the same or multiple software and / or hardware.

[0078] Those skilled in the art should understand that the embodiments of the present application can be provided as a method, a system, or a computer program product. Therefore, the present application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk memories, CD-ROMs, optical memories, etc.) containing computer-usable program code.

[0079] This application is described with reference to the flowcharts and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the present application. It should be understood that each flow and / or block in the flowchart and / or block diagram, and combinations of flows and / or blocks in the flowchart and / or block diagram can be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing device to generate a machine, such that the instructions executed by the processor of the computer or other programmable data processing device produce a means for implementing the specified functions in the process Figure 1 one process or multiple processes and / or blocks Figure 1 or a means for implementing the functions specified in multiple blocks.

[0080] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to work in a specific manner, such that the instructions stored in the computer-readable memory produce a manufactured article including an instruction means that implements the specified functions in the process Figure 1 one process or multiple processes and / or blocks Figure 1 or a means for implementing the functions specified in multiple blocks.

[0081] These computer program instructions can also be loaded onto a computer or other programmable data processing device, such that a series of operation steps are executed on the computer or other programmable device to generate a computer-implemented process, so that the instructions executed on the computer or other programmable device provide steps for implementing the specified functions in the process Figure 1 one process or multiple processes and / or blocks Figure 1 or a means for implementing the functions specified in multiple blocks.

[0082] In a typical configuration, a computing device includes one or more processors (CPUs), an input / output interface, a network interface, and memory.

[0083] The memory may include non-permanent memory in the form of computer-readable media, random access memory (RAM), and / or non-volatile memory, such as read-only memory (ROM) or flash memory (flash RAM). The memory is an example of computer-readable media.

[0084] Computer readable media include permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology to store information. Information can be computer readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer readable media does not include temporary computer readable media (transitory media), such as modulated data signals and carrier waves.

[0085] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0086] It should be understood by those skilled in the art that the embodiments of this specification may be provided as methods, systems or computer program products. Therefore, this specification may take the form of a complete hardware embodiment, a complete software embodiment or an embodiment combining software and hardware. Moreover, this specification may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0087] This specification may be described in the general context of computer-executable instructions executed by a computer, such as program modules. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform specific tasks or implement specific abstract data types. This specification may also be practiced in distributed computing environments where tasks are performed by remote processing devices connected through a communication network. In a distributed computing environment, program modules may be located in local and remote computer storage media, including storage devices.

[0088] The various embodiments in this specification are described in a progressive manner. For the same or similar parts among the various embodiments, reference can be made to each other. Each embodiment focuses on the differences from other embodiments. In particular, for system embodiments, since they are basically similar to method embodiments, the description is relatively simple, and reference can be made to the corresponding parts of the method embodiments for relevant details.

[0089] The above description is only for the embodiments of this specification and is not intended to limit this specification. For those skilled in the art, various modifications and changes can be made to this specification. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of this specification shall be included within the scope of the claims of this application.

Claims

1. A method for determining optical path parameters of a speckle autocorrelation imaging experimental system, characterized in that: The speckle autocorrelation imaging experimental system at least includes a light source, an object to be imaged, a scattering medium, an aperture, and a sampling surface. The method includes: Measuring the diagonal length of the object to be imaged and the memory effect range angle of the scattering medium; Determining a first distance between the object to be imaged and the scattering medium according to the diagonal length and the memory effect range angle; Obtaining the pixel size and number of pixels of the sampling surface, and the central wavelength of the light source; Determining a second distance between the sampling surface and the scattering medium according to the pixel size, the number of pixels, the diagonal length, and the first distance; The diameter of the aperture is determined according to the central wavelength, the pixel size and the second distance.

2. The method according to claim 1, characterized in that Determining a first distance between the object to be imaged and the scattering medium according to the diagonal length and the memory effect range angle specifically includes: Determining the memory effect range of the scattering medium according to the memory effect range angle of the scattering medium; Taking the object to be imaged as being within the memory effect range as a constraint, a first distance between the object to be imaged and the scattering medium is determined.

3. The method according to claim 1, characterized in that The pixel size includes a horizontal pixel size and a vertical pixel size, and the pixel number includes a horizontal pixel number and a vertical pixel number; Determining a second distance between the sampling surface and the scattering medium according to the pixel size, the number of pixels, the diagonal length, and the first distance specifically includes: A second distance between the sampling surface and the scattering medium is determined, wherein the product of the horizontal pixel size and the horizontal pixel number, and the product of the vertical pixel size and the vertical pixel number are both greater than the product of the quotient of the second distance and the first distance and the diagonal length.

4. The method according to claim 1, characterized in that Determining the diameter of the aperture specifically includes: The diameter of the aperture is determined under the condition of satisfying the Wiener-Khinchin theorem.

5. The method according to claim 1, characterized in that The light emitted from any point on the object to be imaged can cover the light transmission area of ​​the aperture.

6. The method according to claim 1, characterized in that The method further comprises: An optical path of the speckle autocorrelation imaging experimental system is established according to the first distance, the second distance, and the diameter.

7. The method according to claim 6, characterized in that Establishing the optical path of the speckle autocorrelation imaging experimental system according to the first distance, the second distance and the diameter specifically includes: The optical path of the speckle autocorrelation imaging experimental system is constructed in the order of a light source, an object to be imaged, a scattering medium, an aperture, and a sampling surface, wherein the distance between the object to be imaged and the scattering medium is the first distance, the distance between the scattering medium and the sampling surface is the second distance, and the aperture is connected to the scattering medium.

8. An optical path parameter determination device for a speckle autocorrelation imaging experimental system, characterized in that: The speckle autocorrelation imaging experimental system at least includes a light source, an object to be imaged, a scattering medium, an aperture, and a sampling surface. The device includes: A measuring module, used to measure the diagonal length of the object to be imaged and the memory effect range angle of the scattering medium; A first determination module, configured to determine a first distance between the object to be imaged and the scattering medium according to the diagonal length and the memory effect range angle; An acquisition module, used to acquire the pixel size and number of pixels of the sampling surface, and the central wavelength of the light source; A second determination module, configured to determine a second distance between the sampling surface and the scattering medium according to the pixel size, the number of pixels, the diagonal length, and the first distance; The third determination module is used to determine the diameter of the aperture according to the central wavelength, the pixel size and the second distance.

9. A computer-readable storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is executed by a processor, the method described in any one of claims 1 to 7 is implemented.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the program, the method described in any one of claims 1 to 7 is implemented.

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