Switching system and method for realizing multi-probe random switching through multiple power supplies

Abstract

The invention discloses a switching system and method for realizing multi-probe random switching of multiple power supplies, and the system comprises an upper computer, a detection unit, an isolation unit, and a plurality of power supply single-double switching units, and the upper computer is disposed at a remote end; and the plurality of power supply single-double switching units are used for switching signals according to the isolated single-double probe modes and realizing any combination connection between the plurality of groups of power supplies and the plurality of probes, and each group of power supplies is connected with two probe switching circuits through a first relay, so that one power supply drives the two probes to work in a single-probe mode or a double-probe mode. According to the invention, a plurality of power supplies can be switched to be directly paired with a plurality of probes at will through remote control, and the power supplies can work in a single-probe mode or a double-probe mode without manual switching. The operability of random switching between a plurality of power supplies and a plurality of probes is greatly improved, meanwhile, the problem that on-site switching cannot be achieved manually is solved, and the state and the service life times of a relay can be monitored.

Description

Technical Field

[0001] The present invention relates to the technical field of tokamaks and probe systems, and particularly to a switching system and method for realizing arbitrary switching of multiple probes by multiple power supplies. Background Art

[0002] "Fusion energy" is considered to be the world's future clean energy. There are three technical implementation paths for the research of fusion energy in the world today: "gravitational confinement, inertial confinement, and magnetic confinement". After decades of exploration by multiple countries, the tokamak magnetic confinement control of plasma is considered to be the most likely technical path to achieve the development of nuclear fusion energy first. On the HL-3 tokamak fusion physics experimental device platform, many physical parameters are obtained through various detectors. The probe system is one of the important means for studying high-temperature plasma. In order to calculate more and more accurate physical parameters, different power supplies are required to drive different probes to scan in different working modes of single probe and double probe.

[0003] The traditional probe array needs to be manually switched to form a double probe between different power supplies driving different probes. However, this method is very clumsy and not suitable for human operation in the future HL-3 experiments. Therefore, there is an urgent need for a set of systems that can be remotely switched to realize the switching of single and double probe working modes between different power supplies and different probes. Summary of the Invention

[0004] The purpose of the present invention is to provide a switching system and method for realizing arbitrary switching of multiple probes by multiple power supplies, which realizes that multiple power supplies and multiple probes can be directly arbitrarily paired and work in single probe mode or double probe mode by remote control, without manual switching, greatly improving the operability of arbitrary switching between multiple power supplies and multiple probes, and at the same time solving the problem of inability to manually reach the site for switching. It is especially suitable for detecting a large number of physical parameters on the HL-3 tokamak fusion physics experimental device platform; it can also monitor the relay status and service life times.

[0005] The present invention is realized through the following technical solutions:

[0006] In the first aspect, the present invention provides a switching system for realizing arbitrary switching of multiple probes by multiple power supplies, and the switching system includes:

[0007] A host computer, which is set at the remote end and is used for sending a single / double probe mode switching signal to the detection unit and receiving the relay status signal and relay life warning signal returned by the detection unit;

[0008] A detection unit, which is used for communication filtering and anti-collision of the single / double probe mode switching signal, and for collecting the relay status signal and detecting the relay life warning signal of the probe switching circuit;

[0009] An isolation unit for optically coupling and isolating the logic level of the single / double probe mode switching signal to drive the probe switching circuit of each power supply, so as to achieve the isolation of logic and control power supplies;

[0010] A number of power supply single / double switching units for realizing any combination connection between multiple groups of power supplies and multiple probes according to the isolated single / double probe mode switching signal, including: each group of power supplies is connected to two probe switching circuits through a first relay, so as to realize that one power supply drives two probes to work in the single probe mode or the double probe mode, that is, to realize the switching between the single probe mode and the double probe mode.

[0011] Further, the probe switching circuit is arranged and combined through a number of second relays to realize the connection between the power supply and the probe.

[0012] Further, the switching system realizes any combination connection between eight groups of power supplies and sixteen probes.

[0013] Further, the probe switching circuit includes the first relay S1, the second relay S2, the third relay S3, the fourth relay S4, the fifth relay S5, the sixth relay S6, the seventh relay S7, the eighth relay S8 and the ninth relay S9;

[0014] The first relay S1 is connected to the power supply input. Based on the switching enable signal SW-EN, the probe access is realized through the on / off combination of the second relay S2, the third relay S3, the fourth relay S4, the fifth relay S5, the sixth relay S6, the seventh relay S7, the eighth relay S8 and the ninth relay S9.

[0015] Further, both the first relay and the second relay are double-pole double-throw switches.

[0016] Further, the connection between the power supply and the probe includes:

[0017] When the single / double probe mode switching signal is 0, that is, in the double probe mode, the positive terminal of each group of power supplies is connected to one of the probes through the first switching circuit, and the negative terminal of the power supply is connected to the other probe through the second switching circuit, so as to realize that one power supply drives two probes to work in the double probe mode;

[0018] When the single / double probe mode switching signal is 1, that is, in the single probe mode, the negative terminal of each group of power supplies is connected to the external reference ground of the vacuum chamber of the Tokamak fusion physics experimental device, and the positive terminal of the power supply is connected to the two probes through the first switching circuit and the second switching circuit, so as to realize that one power supply drives two probes to work in the single probe mode.

[0019] In a second aspect, the present invention further provides a switching method for realizing arbitrary switching of multiple probes with multiple power supplies. The switching method includes:

[0020] Obtaining a single / double probe mode switching signal sent from a remote end;

[0021] Performing communication filtering for anti-collision and opto-coupler isolation processing on the single / double probe mode switching signal to obtain a processed single / double probe mode switching signal;

[0022] According to the processed single / double probe mode switching signal, each group of power supplies is connected to two probe switching circuits through a first relay, so that one power supply drives two probes to work in a single probe mode or a double probe mode; the probe switching circuits are arranged and combined through a plurality of second relays to realize the connection between the power supply and the probes.

[0023] Further, the connection between the power supply and the probes includes:

[0024] When the single / double probe mode switching signal is 0, that is, in the double probe mode, the positive terminal of each group of power supplies is connected to one of the probes through a first switching circuit, and the negative terminal of the power supply is connected to the other probe through a second switching circuit, so that one power supply drives two probes to work in the double probe mode;

[0025] When the single / double probe mode switching signal is 1, that is, in the single probe mode, the negative terminal of each group of power supplies is connected to the external reference ground of the vacuum chamber of the tokamak fusion physics experimental device, and the positive terminal of the power supply is connected to the two probes through a first switching circuit and a second switching circuit, so that one power supply drives two probes to work in the single probe mode.

[0026] Further, the switching method further includes:

[0027] Collecting the relay status signal of the probe switching circuit of the power supply and detecting the relay life warning signal, and returning the relay status signal and the relay life warning signal to the remote end.

[0028] Further, in the double probe mode, the working processes of the first switching circuit, the second switching circuit and the power supply are as follows:

[0029] When the address coding ADD0-ADD3 of the negative terminal of the power supply connected to the first switching circuit is 0000 and the switching enable signal SW-EN is 1, it means that the negative terminal of the power supply is sequentially connected to the upper contact of the relay S1 of the first switching circuit, the upper contact of the relay S2, the upper contact of the relay S3, the upper contact of the relay S4, the upper contact of the relay S6, and connected to the probe numbered TP1;

[0030] When the address codes ADD0 - ADD3 of the first two - way switching circuit connected to the positive terminal of the power supply are 0001 and the switching enable signal SW - EN is 1, it means that the positive terminal of the power supply is successively connected to the upper contact of relay S1 of the first two - way switching circuit, the upper contact of relay S2, the upper contact of relay S3, the upper contact of electrical appliance S4, the lower contact of relay S6, and the probe numbered TP2;

[0031] At this time, the power supply works in the dual - probe mode and is equipped with TP1 probe and TP2 probe.

[0032] Furthermore, in the single - probe mode, the working process of the second one - way switching circuit, the second two - way switching circuit and the power supply is as follows:

[0033] When the address codes ADD0 - ADD3 of the second one - way switching circuit connected to the positive terminal of the power supply are 0000 and the switching enable signal SW - EN is 1, it means that the positive terminal of the power supply is successively connected to the upper contact of relay S1 of the second one - way switching circuit, the upper contact of relay S2, the upper contact of relay S3, the upper contact of relay S4, the upper contact of relay S6, and the probe numbered TP1;

[0034] When the address codes ADD0 - ADD3 of the second two - way switching circuit connected to the positive terminal of the power supply are 0001 and the switching enable signal SW - EN is 1, it means that the positive terminal of the power supply is successively connected to the upper contact of relay S1 of the second two - way switching circuit, the upper contact of relay S2, the upper contact of relay S3, the upper contact of relay S4, the lower contact of relay S6, and the probe numbered TP2;

[0035] At this time, the power supply works in the single - probe mode and is equipped with TP1 probe and TP2 probe.

[0036] Compared with the prior art, the present invention has the following advantages and beneficial effects:

[0037] The switching system and method for realizing arbitrary switching of multiple probes by multiple power supplies of the present invention realizes that multiple power supplies and multiple probes can be directly and arbitrarily paired by remote control and work in the single - probe mode or the dual - probe mode. There is no need for manual switching, which greatly improves the operability of arbitrary switching between multiple power supplies and multiple probes and also solves the problem of inability to manually reach the site for switching. It is especially suitable for a large number of physical parameter detections on the HL - 3 tokamak fusion physics experimental device platform; it can also monitor the relay status and service life times. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] The accompanying drawings described herein are used to provide a further understanding of the embodiments of the present invention, form a part of this application, and do not limit the embodiments of the present invention. In the drawings:

[0039] Figure 1 It is a schematic structural diagram of a switching system for realizing arbitrary switching of multiple probes with multiple power supplies according to the present invention;

[0040] Figure 2 It is a schematic top-level switching diagram in the dual-probe mode according to the present invention;

[0041] Figure 3 It is a schematic diagram of the probe switching circuit according to the present invention, that is, a schematic diagram of address coding and probe connection;

[0042] Figure 4 It is a schematic top-level switching diagram in the single-probe mode according to the present invention;

[0043] Figure 5 It is a flowchart of a switching method for realizing arbitrary switching of multiple probes with multiple power supplies according to the present invention. Detailed implementation manners

[0044] In the following, the term "comprise" or "may comprise" that may be used in various embodiments of the present invention indicates the presence of the functions, operations, or elements of the present invention, and does not limit the addition of one or more functions, operations, or elements. In addition, as used in various embodiments of the present invention, the terms "comprise", "have" and their cognates are only intended to indicate the presence of specific features, numbers, steps, operations, elements, components, or combinations of the foregoing items, and should not be construed as precluding the presence or possibility of adding one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing items.

[0045] In various embodiments of the present invention, the expression "or" or "at least one of A or / and B" includes any combination or all combinations of the recited words. For example, the expression "A or B" or "at least one of A or / and B" may include A, may include B, or may include both A and B.

[0046] Expressions (such as "first", "second", etc.) used in various embodiments of the present invention may modify various components in various embodiments, but do not limit the corresponding components. For example, the above expressions do not limit the order and / or importance of the components. The above expressions are only used for the purpose of distinguishing one element from other elements. For example, the first user device and the second user device indicate different user devices, although both are user devices. For example, without departing from the scope of various embodiments of the present invention, the first element may be referred to as the second element, and similarly, the second element may also be referred to as the first element.

[0047] It should be noted that: If a description "connects" one component to another component, the first component can be directly connected to the second component, and a third component can be "connected" between the first component and the second component. Conversely, when a component is "directly connected" to another component, it can be understood that there is no third component between the first component and the second component.

[0048] The terms used in the various embodiments of the present invention are for the purpose of describing specific embodiments only and are not intended to limit the various embodiments of the present invention. As used herein, the singular forms are also intended to include the plural forms unless the context clearly indicates otherwise. Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the various embodiments of the present invention pertain. The terms (such as those defined in a commonly used dictionary) will be interpreted as having the same meaning as the contextual meaning in the relevant technical field and will not be interpreted as having an idealized meaning or an overly formal meaning unless clearly defined in the various embodiments of the present invention.

[0049] To make the objectives, technical solutions and advantages of the present invention clearer and more understandable, the present invention will be further described in detail below in conjunction with embodiments and drawings. The illustrative embodiments of the present invention and their descriptions are only used to explain the present invention and do not serve as a limitation to the present invention.

[0050] Based on the traditional probe array, manual switching is required to form a dual probe between different probes driven by different power supplies. However, this method is very clumsy and not suitable for human operation in the face of future HL-3 experiments. The present invention designs a set that can be remotely switched to achieve the switching of the single and dual probe working modes between different power supplies and different probes.

[0051] The core of the single- and dual-probe mode switching of the present invention is the probe switching circuit and the recording of the switching, etc. The core component of the switching is a relay. A DC relay is used to prevent the variable magnetic field generated by an AC-driven relay from affecting the subsequent analog conditioning. The switching system includes a host computer, a detection unit, an isolation unit, and several probe switching circuits. The communication filtering and anti-collision in the detection unit is used to prevent data error codes received during switching from causing different power supplies to be connected in parallel and collide with fire or high voltage in series, resulting in incorrect switching of the system. The relay status signal acquisition in the detection unit is responsible for detecting whether the execution signal is correct after the probe switching circuit executes the switching coding signal actually sent. If it is correct, it forwards the correct execution status to the host computer. If it is incorrect, it returns the error of this execution to the host computer. The relay life warning signal detection in the detection unit records the service life times of the relay by detecting the execution status. When it reaches 80% of the rated switching life, it alarms the host computer. It also includes an isolation unit, which is used to isolate the logic level of the single- and dual-probe mode switching signal through optocoupler isolation to drive the probe switching circuit of each power supply, so as to achieve the isolation of logic and control power supplies. Most importantly, through several probe switching circuits, any combination connection between multiple groups of power supplies and multiple probes is realized, and the single- and dual-probe working mode switching between different power supplies and different probes is realized.

[0052] Embodiment

[0053] As Figure 1 shown, a switching system for realizing arbitrary switching of multiple probes by multiple power supplies according to the present invention includes:

[0054] A host computer, set at a remote end, for sending a single- and dual-probe mode switching signal to the detection unit and receiving the relay status signal and the relay life warning signal returned by the detection unit;

[0055] A detection unit, used for performing communication filtering and anti-collision on the single- and dual-probe mode switching signal, and for acquiring the relay status signal and detecting the relay life warning signal of the probe switching circuit;

[0056] An isolation unit, used for isolating the logic level of the single- and dual-probe mode switching signal through optocoupler isolation to drive the probe switching circuit of each power supply, so as to achieve the isolation of logic and control power supplies;

[0057] Several power supply single- and dual-switching units, used for realizing arbitrary combination connection between multiple groups of power supplies and multiple probes according to the isolated single- and dual-probe mode switching signal, including: each group of power supplies is connected to two probe switching circuits through a first relay to realize one power supply driving two probes to work in the single-probe mode or the dual-probe mode, that is, realizing the switching between the single-probe mode and the dual-probe mode. Among them, the probe switching circuit is arranged and combined through several second relays to realize the connection between the power supply and the probe.

[0058] In this embodiment, the above-mentioned first relay and second relay are both double-pole double-throw switches.

[0059] Specifically, in practice, a cabinet of the present invention is generally equipped with 8 groups of power supplies and 16 probes. This kind of switching can realize that each group of power supplies (8 groups of power supplies in a single control cabinet: power supply 1 to power supply 8) in a control cabinet can be arbitrarily connected to each probe (16 probes in a single control cabinet) and the reference ground (single-probe mode) in single-probe mode and double-probe mode.

[0060] In this embodiment, the probe switching circuit includes the first relay S1, the second relay S2, the third relay S3, the fourth relay S4, the fifth relay S5, the sixth relay S6, the seventh relay S7, the eighth relay S8, and the ninth relay S9;

[0061] The first relay S1 is connected to the power input. Based on the switching enable signal SW-EN, the connection of the probes is realized through the on-off combinations of the second relay S2, the third relay S3, the fourth relay S4, the fifth relay S5, the sixth relay S6, the seventh relay S7, the eighth relay S8, and the ninth relay S9.

[0062] First, the top-level principle of double-probe switching in double-probe mode is as Figure 2 shown: The probe power supply numbers (power supply 01 to power supply 08), each power supply has two terminals, a positive terminal V+ and a negative terminal V-; the positive terminal V+ and the negative terminal V- of each power supply can be separately connected to any one of the 16 probes TP1 - TP16. DT_EN is the single / double-probe mode switching signal.

[0063] Figure 2 In, power supply 01 is connected to the first switching circuit ( Figure 2 switching circuit 1 in Figure 2 ) and the second switching circuit (

[0064] ) through the first relay S_1; Figure 2 and so on, power supply 08 is connected to the fifteenth switching circuit ( Figure 2 switching circuit 15 in

[0065] ) and the sixteenth switching circuit ( Figure 3 ) through the first relay S_8.

[0066] Each terminal of each group of power supplies is determined which probe to connect to through the address coding ADD0 - ADD3 and the switching enable signal SW-EN. The principle of the address coding and probe connection is as Figure 3 shown.

[0066] The logic table is shown in Table 1:

[0067] Table 1 Logic Table

[0068]

[0069]

[0070] When the single / double probe mode switching signal DT_EN = 0, that is, in the double probe mode, the positive terminal of each group of power supplies is connected to one of the probes through the first switching circuit, and the negative terminal of the power supply is connected to the other probe through the second switching circuit, enabling one power supply to drive two probes to work in the double probe mode; among them, both the first switching circuit and the second switching circuit are probe switching circuits.

[0071] Second, the principle of the single probe switching top layer in the single probe mode is as Figure 4 shown, Figure 4 in which, the power supply 01 is connected to the second switching circuit ( Figure 4 switching circuit 1 in it) and the second two switching circuits ( Figure 4 switching circuit 2 in it) through the first relay S_1;

[0072] And so on, the power supply 08 is connected to the twenty-fifth switching circuit ( Figure 4 switching circuit 15 in it) and the twenty-sixth switching circuit ( Figure 4 switching circuit 16 in it) through the first relay S_8. Among them, each switching circuit is as shown in Figure 3 shown.

[0073] When the single / double probe mode switching signal is 1, that is, in the single probe mode, the negative terminal of each group of power supplies is connected to the external reference ground of the vacuum chamber of the tokamak fusion physics experimental device, and the positive terminal of the power supply is connected to the two probes through the second switching circuit and the second two switching circuits, enabling one power supply to drive two probes to work in the single probe mode; among them, both the second switching circuit and the second two switching circuits are probe switching circuits.

[0074] It should be noted that:

[0075] 1) The switching circuit coding signals of the positive terminal V+ and the negative terminal V- of the same power supply must be mutually exclusive, otherwise the two probe selection units connected to the positive terminal V+ of the power supply will be the same needle.

[0076] 2) The switching circuit coding signals of the positive terminal V+ and the negative terminal V- of different power supplies must be mutually exclusive, otherwise the phenomenon of power supply parallel connection will occur.

[0077] 3) The relay of the switching circuit of the positive terminal V+ and the negative terminal V- must be operated when the power supply has no output, otherwise a short circuit may occur between the positive terminal V+ and the negative terminal V- of the power supply at the moment of just switching.

[0078] The total number of relays of the present invention includes 8 first relays (S_1 to S_8) and 9*16 second relays. The overall relay resource consumption is calculated as follows: 9*16+8=152 relays, and the volume of each relay is: L*W*H=30mm*20mm*20mm.

[0079] Example 2

[0080] like Figure 5 As shown, the difference between this embodiment and embodiment 1 is that this embodiment provides a switching method for realizing arbitrary switching of multiple probes by using multiple power supplies, and the switching method is a switching system for realizing arbitrary switching of multiple probes by using multiple power supplies based on embodiment 1; the switching method includes:

[0081] Get the single-double probe mode switching signal sent by the remote end;

[0082] The single-double probe mode switching signal is subjected to communication filtering anti-collision and optical coupling isolation processing to obtain the processed single-double probe mode switching signal;

[0083] According to the processed single-double probe mode switching signal, each power supply is connected to two probe switching circuits through the first relay, so that one power supply drives two probes to work in single probe mode or double probe mode; the probe switching circuit is arranged and combined through a plurality of second relays to realize the connection between the power supply and the probes.

[0084] In this embodiment, the connection between the power supply and the probe includes:

[0085] When the single-double probe mode switching signal is 0, that is, the double probe mode, the positive terminal of each power supply group is connected to one of the probes through the first-one switching circuit, and the negative terminal of the power supply is connected to another probe through the first-two switching circuit, so that one power supply drives two probes to work in the double probe mode; wherein the first-one switching circuit and the first-two switching circuit are both probe switching circuits;

[0086] When the single-double probe mode switching signal is 1, that is, single probe mode, the negative end of each power supply group is connected to the external reference ground of the vacuum chamber of the tokamak fusion physics experimental device, and the positive end of the power supply is connected to the two probes through the second-first switching circuit and the second-second switching circuit, so that one power supply drives the two probes to work in the single probe mode; wherein the second-first switching circuit and the second-second switching circuit are both probe switching circuits.

[0087] In this embodiment, the switching method further includes:

[0088] The probe switching circuit of the power supply performs relay status signal collection and relay life alarm signal detection, and returns the relay status signal and relay life alarm signal to the remote end.

[0089] In specific implementation, based on Embodiment 1, generally, one cabinet of the present invention is equipped with 8 groups of power supplies and 16 probes. This switching can achieve arbitrary connection of each group of power supplies (8 groups of power supplies in a single control cabinet: Power Supply 1 to Power Supply 8) in a single control cabinet to each probe (16 probes in a single control cabinet) and the reference ground (single probe mode) in both single-probe mode and dual-probe mode.

[0090] The following takes Power Supply 1 as an example for illustration:

[0091] Taking Power Supply 1 as an example, when DT_EN is 0, it indicates that the system is in dual-probe mode, and the connection diagram is as Figure 2 , at this time, the negative terminal V- of Power Supply 1 is connected to Switching Circuit 1, and the positive terminal V+ of Power Supply 1 is connected to Switching Circuit 2. As Figure 3 shown, the specific implementation of the switching circuit is as follows: (1) When the address code ADD0-ADD3 of the negative terminal V- of Power Supply 1 connected to Switching Circuit 1 is 0000 and the switching enable signal SW-EN is 1, it means that the negative terminal V- of Power Supply 1 is connected to the upper contact of Relay S1 of Switching Circuit 1, then connected to the upper contact of Relay S2, then connected to the upper contact of Relay S3, then connected to the upper contact of Relay S4, then connected to the upper contact of Relay S6, and then connected to the probe numbered TP1; (2) When the address code ADD0-ADD3 of the positive terminal V+ of the power supply connected to Switching Circuit 2 is 0001 and the switching enable signal SW-EN is 1, it means that the positive terminal V+ of Power Supply 1 is connected to the upper contact of Relay S1 of Switching Circuit 2, then connected to the upper contact of Relay S2, then connected to the upper contact of Relay S3, then connected to the upper contact of Relay S4, then connected to the lower contact of Relay S6, and then connected to the probe numbered TP2. At this time, Power Supply 1 works in dual-probe mode and drives TP1 probe and TP2 probe.

[0092] The connection of other power supplies (Power Supply 2 to Power Supply 8) to the probes is the same by analogy and will not be elaborated here one by one.

[0093] Similarly, taking Power Supply 1 as an example, when DT_EN is 1, it indicates that the system is in single-probe mode, and the connection diagram is as Figure 4 , at this time, the negative terminal V- of Power Supply 1 is connected to the external reference ground of the vacuum chamber, and the positive terminal V+ of Power Supply 1 is connected to Switching Circuit 1 and Switching Circuit 2. As Figure 3 ​As shown, the specific implementation of the switching circuit is as follows: (1) When the address codes ADD0 - ADD3 of the switching circuit 1 connected to the positive terminal V+ of power supply 1 are 0000 and the switching enable signal SW-EN is 1, it means that the positive terminal V+ of power supply 1 is connected to the upper contact of relay S1 of the switching circuit 1, then to the upper contact of relay S2, then to the upper contact of relay S3, then to the upper contact of relay S4, then to the upper contact of relay S6, and then to the probe numbered TP1; (2) When the address codes ADD0 - ADD3 of the switching circuit 2 connected to the positive terminal V+ of power supply 1 are 0001 and the switching enable signal SW-EN is 1, it means that the positive terminal V+ of power supply 1 is connected to the upper contact of relay S1 of the switching circuit 2, then to the upper contact of relay S2, then to the upper contact of relay S3, then to the upper contact of relay S4, then to the lower contact of relay S6, and then to the probe numbered TP2. At this time, power supply 1 operates in the single-probe mode and is equipped with TP1 and TP2 probes.

[0094] The connection of other power supplies (power supply 2 to power supply 8) to the probes is the same by analogy and will not be elaborated one by one here.

[0095] The above-described specific implementation manners further elaborate on the purpose, technical solutions, and beneficial effects of the present invention. It should be understood that the above is only the specific implementation manners of the present invention and is not used to limit the protection scope of the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims

1. A switching system for realizing arbitrary switching of multiple probes using multiple power supplies, characterized in that: The switching system includes: The host computer is arranged at the remote end, and is used to send the single-double probe mode switching signal to the detection unit, and receive the relay state signal and the relay life alarm signal returned by the detection unit; A detection unit, used for performing communication filtering and anti-collision on the single-double probe mode switching signal, and performing relay status signal recovery and relay life alarm signal detection on the probe switching circuit; An isolation unit, used to drive the probe switching circuit of each power supply through optical coupling isolation of the logic level of the single and double probe mode switching signal, so as to achieve isolation of logic and control power supply; A plurality of power supply single-double switching units are used to realize any combination connection between multiple power supply groups and multiple probes according to the isolated single-double probe mode switching signal, including: each power supply group is connected to two probe switching circuits through a first relay to realize one power supply driving two probes to work in single probe mode or double probe mode.

2. A switching system for realizing arbitrary switching of multiple probes using multiple power supplies according to claim 1, characterized in that: The probe switching circuit realizes the connection between the power supply and the probe by arranging and combining a plurality of second relays.

3. A switching system for realizing arbitrary switching of multiple probes using multiple power supplies according to claim 2, characterized in that: The switching system enables any combination of connections between eight power supplies and sixteen probes.

4. A switching system for realizing arbitrary switching of multiple probes using multiple power supplies according to claim 2, characterized in that: The probe switching circuit includes a 21st relay S1, a 22nd relay S2, a 23rd relay S3, a 24th relay S4, a 25th relay S5, a 26th relay S6, a 27th relay S7, a 28th relay S8 and a 29th relay S9; The second-first relay S1 is connected to the power input, and based on the switching enable signal SW-EN, probe access is achieved through the on-off combination of the second-second relay S2, the second-third relay S3, the second-fourth relay S4, the second-fifth relay S5, the second-sixth relay S6, the second-seventh relay S7, the second-eighth relay S8 and the second-ninth relay S9.

5. A switching system for realizing arbitrary switching of multiple probes using multiple power supplies according to claim 2, characterized in that: The first relay and the second relay are both double-pole double-throw switches.

6. A switching method for realizing arbitrary switching of multiple probes using multiple power supplies, characterized in that: The switching method includes: Get the single-double probe mode switching signal sent by the remote end; Performing communication filtering and anti-collision and optical coupling isolation processing on the single-double probe mode switching signal to obtain a processed single-double probe mode switching signal; According to the processed single-double probe mode switching signal, each power supply group is connected to two probe switching circuits through a first relay, so that one power supply drives two probes to work in single probe mode or double probe mode; the probe switching circuit is arranged and combined through a plurality of second relays to realize the connection between the power supply and the probes.

7. A switching method for realizing arbitrary switching of multiple probes using multiple power supplies according to claim 6, characterized in that: Connections between the power supply and the probe, including: When the single-double probe mode switching signal is 0, that is, the double probe mode, the positive terminal of each power supply is connected to one of the probes through the first-one switching circuit, and the negative terminal of the power supply is connected to another probe through the first-two switching circuit, so that one power supply drives two probes to work in the double probe mode; When the single-double probe mode switching signal is 1, that is, single probe mode, the negative end of each power supply group is connected to the external reference ground of the vacuum chamber of the tokamak fusion physics experimental device, and the positive end of the power supply is connected to the two probes through the second-one switching circuit and the second-two switching circuit, so that one power supply drives two probes to work in single probe mode.

8. The method for switching multiple power supplies to realize arbitrary switching of multiple probes according to claim 6, characterized in that: The switching method further includes: The probe switching circuit of the power supply is subjected to relay status signal collection and relay life alarm signal detection, and the relay status signal and relay life alarm signal are returned to the remote end.

9. A switching method for realizing arbitrary switching of multiple probes using multiple power supplies according to claim 7, characterized in that: In the dual-probe mode, the working process of the first-one switching circuit, the first-two switching circuit and the power supply is: When the address code ADD0-ADD3 of the first switching circuit connected to the negative terminal of the power supply is 0000 and the switching enable signal SW-EN is 1, it means that the negative terminal of the power supply is sequentially connected to the contact on the relay S1 of the first switching circuit, connected to the contact on the relay S2, connected to the contact on the relay S3, connected to the contact on the relay S4, connected to the contact on the relay S6, and connected to the probe numbered TP1; When the address code ADD0-ADD3 of the first or second switching circuit connected to the positive end of the power supply is 0001 and the switching enable signal SW-EN is 1, it means that the positive end of the power supply is connected to the upper contact of relay S1 of the first or second switching circuit in sequence, connected to the upper contact of relay S2, connected to the upper contact of relay S3, connected to the upper contact of electrical appliance S4, connected to the lower contact of relay S6, and connected to the probe numbered TP2.

10. The method for switching multiple power supplies to realize arbitrary switching of multiple probes according to claim 7, characterized in that: In the single probe mode, the working process of the second-first switching circuit, the second-second switching circuit and the power supply is: When the address code ADD0-ADD3 of the second switching circuit connected to the positive terminal of the power supply is 0000 and the switching enable signal SW-EN is 1, it means that the positive terminal of the power supply is sequentially connected to the contact on the relay S1 of the second switching circuit, connected to the contact on the relay S2, connected to the contact on the relay S3, connected to the contact on the relay S4, connected to the contact on the relay S6, and connected to the probe numbered TP1; When the address code ADD0-ADD3 of the second switching circuit connected to the positive end of the power supply is 0001 and the switching enable signal SW-EN is 1, it means that the positive end of the power supply is connected to the upper contact of relay S1 of the second switching circuit, connected to the upper contact of relay S2, connected to the upper contact of relay S3, connected to the upper contact of relay S4, connected to the lower contact of relay S6, and connected to the probe numbered TP2.

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