Test system and method for missile intermediate carrier

Abstract

The invention discloses a test system and method for a missile intermediate carrier, and relates to the field of test systems. The system comprises a hardware part and a software part, the hardware part comprises an industrial personal computer, a test case, a universal meter and an interconnection cable, and the software part comprises a test condition setting module, a function test module and a data processing module. The interior of the test case is designed in a modularized mode, a digital I / O card is used for receiving an instruction sent by a software part in an industrial personal computer, an electronic switch in a matrix signal gating board is controlled, and therefore a gyroscope instruction signal board sends a simulated missile-borne gyroscope signal and generates a control instruction; the data acquisition module, the universal meter, the signal conditioning board and the resistance value test module are used for collecting test data of the intermediate and the carrier. Signals of the working state control assembly on the missile are simulated through the gyroscope instruction signal board, so that test data are more reliable, and manual errors are reduced and human resources are saved through an automatic test process.

Description

Technical Field

[0001] The present invention relates to the field of test systems, and particularly to a test system and method for a missile intermediate carrier. Background Art

[0002] During the production and maintenance of missiles, it is crucial to conduct comprehensive and accurate tests on the intermediate carrier. Currently, when the factory carries out missile-related detection and repair tasks, the tests on the intermediate carrier mainly rely on traditional methods. Operators need to use standard instruments such as electric detonator testers, MF35 pointer multimeters, multi-channel regulated power supplies, and oscilloscopes respectively to sequentially complete tests on items such as path resistance, control loop resistance, insulation resistance, and power-on inspection, and manually record the test results.

[0003] There are many drawbacks to this traditional detection method: Firstly, the test process is cumbersome, involving the switching operations of various instruments, resulting in a long test time and seriously affecting production and maintenance efficiency; Secondly, it has extremely high requirements for the professional skills of operators. Operators not only need to be proficient in the use methods of various instruments but also need to have rich test experience to ensure the accuracy of test results, which undoubtedly increases labor costs and test difficulties; Thirdly, manually recording test results is prone to human errors, and the operation process is complex, making it difficult to ensure the consistency and reliability of tests. Therefore, it is urgent to develop an efficient, accurate, and easy-to-operate test method for missile intermediate carriers. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a test system and method with higher efficiency, smaller errors, and stronger reliability.

[0005] To solve the above technical problems, the technical solution adopted by the present invention is:

[0006] A test system for a missile intermediate carrier, wherein the key technology lies in that the system includes a hardware part and a software part. The hardware part includes an industrial control computer, a test chassis, a multimeter, and an interconnecting cable;

[0007] The test chassis includes a matrix signal gating board, a power module, a resistance value test module, an I / O control unit, a data acquisition module, a signal conditioning board, and a gyro command signal board; the test chassis is respectively connected to the industrial control computer, the multimeter, the intermediate to be tested, and the carrier to be tested; inside the test chassis, the signal conditioning board is respectively connected to the data acquisition module, the tissue test module, and the gyro command signal board; the gyro command signal board is connected to the matrix signal gating board; the matrix signal gating board is connected to the I / O control unit; the power module is respectively connected to the matrix signal gating board, the resistance value test module, the I / O control unit, the data acquisition module, the signal conditioning board, and the gyro command signal board;

[0008] The test chassis is respectively connected to an industrial control computer and a multimeter, and is connected to the intermediate product to be tested and the carrier through an interconnection cable;

[0009] The software part includes a test condition setting module, a function test module and a data processing module.

[0010] Preferably, the signal conditioning board includes a tracking circuit, a positive-phase attenuation circuit, and a bright-dark area detection circuit. During the collection of test signals, the signals are attenuated proportionally and are responsible for detecting the bright-dark area voltages of the intermediate body and the carrier to be tested. The bright-dark area detection circuit includes an input terminal W2, and W2 is connected to the 2-port of the relay K20B. The 4-port of the K20B is connected to one end of the sliding rheostat R48. The 3-port of the K20B is connected to one end of the sliding rheostat R47. The other end of the R48 is respectively connected to the other end of the R47 and the 2-port of the relay K21B. The 3-port of the K21B is left floating, and the 4-port is respectively connected to the 2-ports of the relay K1B and the relay K22B. The 3-port of the K1B is left floating, and the 4-port is connected to the resistor R14. The other end of the R14 is respectively connected to the resistor R16 and the 1-pin of the AD626 amplifier N17. The 2- and 3-pins of the N17 are grounded. The 4-pin of the N17 is grounded through the capacitor C12. The other end of the R16 is respectively connected to the 8-pin of the N17 and the resistor R15. The other end of the R15 is connected to the 5-port of the relay K1C. The 6-port of the K1C is left floating, and the 7-port is respectively connected to the 5-port of the relay K21C and the 7-port of the relay K22C. The 6-port of the K21C is left floating, and the 7-port is respectively connected to one end and the sliding end of the sliding rheostat R49 and one end and the sliding end of the sliding rheostat R46. The other end of the R49 is connected to the 5-port of the relay K20C. The other end of the R46 is connected to the 6-port of the K20C. The 7-port of the K20C is grounded. The 6-pin of the N17 is respectively connected to the 5V power supply and the capacitor C14. The other end of the C14 is grounded. The 7-pin of the N17 is left floating. The 5-pin of the N17 is respectively connected to the capacitor C33 and the non-inverting input terminal of the OP07 operational amplifier N16. The other end of the C33 is grounded. The positive power supply pin of the N16 is connected to the 15V power supply. The negative power supply pin of the N16 is connected to the -15V voltage. The output terminal of the N16 is respectively connected to the capacitor C30 and the inverting input terminal of the N16 and serves as the output terminal to output the dark area voltage. The other end of the C30 is grounded;The 3 - port of K22B is floating, and the 4 - port is connected to resistor R51. The other end of R51 is respectively connected to resistor R53 and the 1 - pin of AD626 amplifier N18. The 6 - pin of K22C is floating, and the 5 - pin is connected to resistor R52. The other end of R52 is respectively connected to the other end of R53 and the 8 - pin of N18. The 2 - pin and 3 - pin of N18 are grounded. The 4 - pin of N18 is grounded through capacitor C13. The 7 - pin of N18 is floating. The 6 - pin of N18 is respectively connected to the 5V power supply and capacitor C15. The other end of C15 is grounded. The 5 - pin of N18 is respectively connected to capacitor C34 and the non - inverting input terminal of OP07 operational amplifier N15. The other end of C34 is grounded. The positive power supply pin of N15 is connected to the 15V power supply, the negative power supply pin of N15 is connected to the - 15V voltage. The output terminal of N15 is respectively connected to capacitor C31 and the inverting input terminal of N15 and serves as the output terminal to output the dark - area voltage. The other end of C31 is grounded.;

[0011] Preferably, the gyro command signal board includes an on - missile gyro simulation generation circuit and a control command circuit. The on - missile gyro simulation generation circuit includes an NE555N chip U1. The 1 - pin of U1 is grounded, the 8 - pin is connected to the 5V power supply, the 4 - pin is respectively connected to the 5V power supply and the sliding end of potentiometer VR1. The other end of VR1 is connected to the sliding end of potentiometer VR2. The 2 - pin is respectively connected to one end of capacitors C2 and C3. The other ends of C2 and C3 are grounded. The 5 - pin is connected to one end of capacitor C1. The other end of C1 is grounded. The 6 - pin is respectively connected to the 2 - pin and the negative electrode of diode V1. The positive electrode of V1 is respectively connected to the 7 - pin and the sliding end of VR2. The other end of VR2 is connected to the negative electrode of diode V2. The positive electrode of V2 is connected to the 2 - pin. The 3 - pin is connected to the base of triode Q1 through resistor R1. The emitter of Q1 is grounded. The collector is connected to the negative electrode of the diode in optocoupler T1 through resistor R2. The positive electrode of the diode in T1 is connected to the 5V power supply. The collector of the triode in T1 is connected to the - 32V power supply. The emitter is respectively connected to R3 and R4 and serves as the output terminal to output the on - missile gyro signal. The other ends of R3 and R4 are connected to the - 32V power supply. Both VR1 and VR2 are in a current - limiting connection method;

[0012] The control instruction circuit includes three NE555N chips, namely U2, U3, and U4. The 5-pin of U2 is grounded through capacitor C4. The 8-pin of U2 is connected to the 15V power supply. The 4-pin of U2 is connected to the 15V power supply, the 8-pin of U2, and one end of resistor R5 respectively. The other end of R5 is connected to one end of potentiometer VR3. The other end of VR3 is connected to the sliding end of VR3, the 6-pin of U2, the 7-pin of U2, and capacitor C6 respectively. The other end of C6 is connected to the 1-pin of U2 and capacitor C5 and grounded. The other end of C5 is connected to the 15V power supply. The 3-pin of U2 is connected to the anode of diode V3, resistor R6, and the 2-pin of U3 through capacitor C7 respectively. The cathode of V3 and the other end of R6 are connected and grounded. The 5-pin of U3 is grounded through capacitor C8. The 4-pin of U3 is connected to resistor R7, the 8-pin of U3, and the 15V power supply respectively. The other end of R7 is connected to one end of potentiometer VR4. The other end of VR4 is connected to the sliding end of VR4, the 6-pin of U3, the 7-pin of U3, and capacitor C10 respectively. The other end of C10 is connected to the 1-pin of U3 and capacitor C9 and grounded. The other end of C9 is connected to the 15V power supply. The 3-pin of U3 is connected to resistor R9 and capacitor C11 respectively. The other end of C11 is connected to the anode of diode V4, resistor R8, and the 2-pin of U4 respectively. The cathode of V4 is connected to the other end of resistor R8 and grounded. The other end of R9 is connected to resistor R10 and the base of transistor Q2 respectively. The other end of R10 is connected to the -15V power supply. The emitter of Q2 is grounded. The collector is connected to resistor R11 and R12 respectively. The other end of R11 is connected to the 20V power supply and the emitter of transistor Q3 respectively. The other end of R12 is connected to the base of Q3.

[0013] The 5-pin of U4 is grounded through capacitor C12. The 4-pin of U4 is connected to the 8-pin of U4 and resistor R13 and grounded respectively. The other end of R13 is connected to one end of potentiometer VR5. The other end of VR5 is connected to the sliding end of VR5, capacitor C14, the 6-pin of U4, and the 7-pin of U4 respectively. The other end of C14 is connected to the 1-pin of U4, capacitor C13, and the -15V power supply respectively. The other end of C13 is grounded. The 3-pin of U4 is connected to resistor R14 and R17 respectively. The other end of R14 is connected to resistor R15 and the base of transistor Q4 respectively. The other end of R15 is connected to the emitter of Q4 and the -15V voltage respectively. The other end of R17 is connected to resistor R18 and the base of transistor Q5 respectively. The other end of R18 is connected to the -15V power supply and the emitter of Q5 respectively.

[0014] The 2-pin of the U2 is respectively connected to the resistor R30 and the collector of the triode Q8. The emitter of the Q8 is grounded. The base of the Q8 is connected to the resistor R29. The other end of the R29 is respectively connected to the resistor R31 and the collector of the triode Q7. The other end of the R31 is grounded. The emitter of the Q7 is grounded and connected to the base of the Q7 through the resistor R28. The base of the Q7 is also connected to the resistor R27. The other end of the R27 is respectively connected to the R26 and the output terminal of the LM282AN operational amplifier U5A. The other end of the R26 is connected to the 15V power supply. The negative power supply pin of the U5A is connected to the -15V power supply and grounded through the capacitor C16. The positive power supply pin of the U5A is connected to the 15V power supply and grounded through the capacitor C17. The inverting input terminal of the U5A is respectively connected to the positive electrode of the diode V7, the negative electrode of the diode V6, the resistor R25, and the resistor R24. The other end of the R24 is connected to the R23 and grounded. The non-inverting input terminal of the U5A is respectively connected to the negative electrode of the V7, the positive electrode of the V, the other end of the R23, the collector of the triode Q6, and the positive electrode of the diode V5. The emitter of the Q6 is grounded. The base of the Q6 is connected to the resistor R21. The other end of the R21 is connected to the collector of the Q4 after being paralleled with the resistor R22 and the resistor R16. The other end of the R22 is connected to the 15V power supply. The other end of the R16 is grounded. The negative electrode of the V5 is respectively connected to the capacitor C15 and the resistor R20. The other end of the C15 is grounded. The other end of the R20 is respectively connected to the resistor R19, the collector of the Q5, and the collector of the Q3, and is used as an output terminal to output a control instruction. The other end of the R19 is grounded.

[0015] A test method for a missile intermediate carrier, the key technology of which includes the following steps:

[0016] S1: System self-check. Before product detection, the system is self-checked through the system self-check module of the function test module in the software part.

[0017] S2: Inspection after intermediate body welding. First, the test conditions are set through the test condition setting module in the software part. Then, the line resistance is calibrated. Furthermore, the inspection after intermediate body welding is started through the function test module. Finally, the test data collected is processed by the data acquisition module and the signal conditioning board and sent to the industrial control computer for analysis and processing.

[0018] S3: Inspection before power-on of the non-charged carrier. First, the test conditions are set through the test condition setting module in the software part. Then, the line resistance is calibrated. Furthermore, the inspection before power-on of the non-charged carrier is started through the function test module. Finally, the test data collected is processed by the data acquisition module and the signal conditioning board and sent to the industrial control computer for analysis and processing.

[0019] S4: Vibration test of the non - charged carrier. First, complete the test condition setting through the test condition setting module in the software part, then perform line resistance calibration, and then start the vibration test of the non - charged carrier through the function test module. Finally, the data acquisition module and the signal conditioning board process and collect the test data and send it to the industrial control computer for analysis and processing;

[0020] S5: System calibration: Start the system metering module through the industrial control computer. The system metering module controls and activates the system metering operation to measure the power supply voltage, excitation signal, and resistance of the system.

[0021] Preferably, the system self - inspection in step S1 includes power supply voltage self - inspection and relay self - inspection.

[0022] Preferably, the post - welding inspection of the intermediate body in step S2 includes line - to - line resistance inspection, path resistance inspection, and power - on inspection of the intermediate body.

[0023] Preferably, the pre - power - on inspection of the non - charged carrier in step S3 includes path resistance inspection of the No. 6 socket, insulation resistance inspection of the No. 6 socket, path resistance inspection of the No. 7 socket, and insulation resistance inspection of the No. 7 socket of the carrier.

[0024] Preferably, in step S4, power - on inspection, insulation resistance inspection, control loop inspection, ignition circuit inspection, and pull - off switch inspection are performed on the carrier.

[0025] Preferably, the system calibration in step S5 includes the following steps:

[0026] 1) Measure the power supply voltage: The system automatically detects its working voltage, and manually test the system working voltage using a standard multimeter, with the error accuracy meeting the requirements;

[0027] 2) Measure the excitation signal: The system outputs an excitation signal, and monitor the voltage and period of the excitation signal using an oscilloscope to meet the requirements;

[0028] 3) Measure the resistance: Manually connect a standard resistance to the system resistance test terminal, and use the system to collect data, with the resistance test accuracy meeting the relevant requirements.

[0029] The beneficial effects of adopting the above - mentioned technical solutions are as follows:

[0030] The present invention realizes an automated test process by controlling the test chassis through the software part, reduces manual operation and instrument switching time, improves the test efficiency while reducing the influence of human factors, saves human resources, and improves the accuracy and reliability of the test results.

[0031] The present invention simulates the gyro generating circuit and control instruction circuit on the missile, which can not only simulate a negative gyro pulse signal generated when the gyro optoelectronic component is in the bright area, but also simulate the control instruction signal generated by the ground control box, so as to more realistically simulate the working state of the control component on the missile and ensure the reliability of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The present invention will be further described in detail below in conjunction with the drawings and specific embodiments.

[0033] Figure 1 is a schematic structural diagram of a test system for a missile intermediate carrier proposed by the present invention;

[0034] Figure 2 is a schematic functional diagram of a test system for a missile intermediate carrier proposed by the present invention;

[0035] Figure 3 is a schematic diagram of the inspection process for the intermediate body after welding in a test system for a missile intermediate carrier proposed by the present invention;

[0036] Figure 4 is a schematic diagram of the inspection interface for the intermediate body after welding in an embodiment of the present invention;

[0037] Figure 5 is a schematic diagram of the inspection process before energizing the non-charged carrier in a test system for a missile intermediate carrier proposed by the present invention;

[0038] Figure 6 is a schematic diagram of the inspection interface before energizing the charged carrier in an embodiment of the present invention;

[0039] Figure 7 is a schematic diagram of the vibration test process for the non-charged carrier in a test system for a missile intermediate carrier proposed by the present invention;

[0040] Figure 8 is a schematic diagram of the vibration test interface for the non-charged carrier in an embodiment of the present invention;

[0041] Figure 9 is a schematic diagram of the system self-check process in a test system for a missile intermediate carrier proposed by the present invention;

[0042] Figure 10 is a schematic diagram of the system calibration process in a test system for a missile intermediate carrier proposed by the present invention;

[0043] Figure 11 is a schematic diagram of the bright and dark area detection circuit proposed by the present invention;

[0044] Figure 12 is a schematic diagram of the simulated gyro generating circuit on the missile proposed by the present invention;

[0045] Figure 13 It is a schematic diagram of the control instruction circuit proposed by the present invention. Specific embodiments

[0046] To make the above objects, features, and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings and specific embodiments in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0047] A test system for a missile intermediate carrier, which includes a hardware part and a software part, as Figure 1 The hardware part includes an industrial control computer, a test chassis, a multimeter, and an interconnecting cable;

[0048] The industrial control computer is the control core of this system and the operation terminal for the staff, carrying the software part of the test system.

[0049] The test chassis is the test core of this system, including a matrix signal gating board, a power supply module, a resistance value test module, an I / O control unit, a data acquisition module, a signal conditioning board, and a gyro command signal board.

[0050] The power supply module is the power supply unit of the test system, responsible for converting the external AC220(±10%50Hz) AC power into the DC power required by the system. In the embodiment, a Chaoyang linear power supply can be selected, with an output ripple ≤10mV and low high-frequency interference; the power supply module provides +5V, +20V, ±15V, +32V DC power for the system. +5V powers the matrix signal gating board, ±15V and +20V are the working power supplies for the command board, and +32V is the on-board working power supply.

[0051] The matrix signal gating board is controlled by the industrial control computer and communicates with the digital I / O card to complete the gating input and output of the control signal. In actual use, its accessibility, standardization, and interchangeability are fully considered. It is installed, fixed, and connected through a standard socket, with anti-error and identification marks, and can quickly locate faults and be repaired in the first time.

[0052] The resistance value test module is responsible for two functions. One is to test the small resistance and path resistance of the intermediate body and the carrier, and the other is to test the insulation resistance of the intermediate body and the carrier. In the embodiment, a USB-4065DMM digital multimeter is selected, with a basic 6 1 / 2-channel MDD measurement function; 7 built-in measurements: AC / DC voltage measurement, AC / DC current measurement, 2-wire and 4-wire resistance measurement, and diode measurement; ±300 VDC / Vrms isolation; 4 1 / 2-channel with a reading speed of up to 3,000 times per second, which can meet the resistance measurement requirements of this test system.

[0053] The I / O control unit is the control unit within the test system. In the test system, the I / O control unit is mainly used to output digital voltage signals to drive the matrix signal gating board to work. The test software sends control instructions to the I / O control unit according to the test requirements. The I / O control unit sets the level status of the corresponding channels according to the instructions and outputs digital voltage signals.

[0054] The data acquisition module is used to collect analog gyro command signals and voltage signals and perform AD conversion. In actual use, a 16-bit multifunctional data acquisition card NI USB-6216 is selected. This module converts external analog signals into digital signals for subsequent processing and analysis.

[0055] The signal conditioning board includes a tracking circuit and a positive-phase attenuation circuit composed of the operational amplifier TL074, which are used to preprocess the test signals during the process of collecting test signals to meet the input requirements of the data acquisition module. Preprocessing refers to proportionally attenuating the test signals, and the signals are restored by subsequent software processing; among them, there is also a bright and dark area test circuit for detecting whether the control loops of the gyro optoelectronic components and the on-board circuit components are normal. The bright area and dark area voltages refer to the voltages between the command loops of the gyro optoelectronic components under illuminated and non-illuminated conditions; such as Figure 11This circuit includes an input terminal W2, which is connected to port 2 of relay K20B. Port 4 of K20B is connected to one end of a sliding rheostat R48, and port 3 of K20B is connected to one end of a sliding rheostat R47. The other end of R48 is connected to the other end of R47 and port 2 of relay K21B. Port 3 of K21B is left floating, and port 4 is connected to port 2 of relay K1B and relay K22B respectively. Port 3 of K1B is left floating, and port 4 is connected to resistor R14. The other end of R14 is connected to resistor R16 and pin 1 of AD626 amplifier N17 respectively. Pins 2 and 3 of N17 are grounded, and pin 4 of N17 is grounded through capacitor C12. The other end of R16 is connected to pin 8 of N17 and resistor R15 respectively. The other end of R15 is connected to port 5 of relay K1C. Port 6 of K1C is left floating, and port 7 is connected to port 5 of relay K21C and port 7 of relay K22C respectively. Port 6 of K21C is left floating, and port 7 is connected to one end and the sliding end of a sliding rheostat R49 and one end and the sliding end of a sliding rheostat R46 respectively. The other end of R49 is connected to port 5 of relay K20C, and the other end of R46 is connected to port 6 of K20C. Port 7 of K20C is grounded; Pin 6 of N17 is connected to a 5V power supply and capacitor C14 respectively, and the other end of C14 is grounded; Pin 7 of N17 is left floating, and pin 5 of N17 is connected to capacitor C33 and the non-inverting input terminal of OP07 operational amplifier N16 respectively. The other end of C33 is grounded. The positive power supply pin of N16 is connected to a 15V power supply, the negative power supply pin of N16 is connected to a -15V voltage, and the output terminal of N16 is connected to capacitor C30 and the inverting input terminal of N16 respectively and serves as an output terminal to output the dark area voltage. The other end of C30 is grounded; Port 3 of K22B is left floating, and port 4 is connected to resistor R51. The other end of R51 is connected to resistor R53 and pin 1 of AD626 amplifier N18 respectively. Pin 6 of K22C is left floating, and pin 5 is connected to resistor R52. The other end of R52 is connected to the other end of R53 and pin 8 of N18 respectively. Pins 2 and 3 of N18 are grounded, pin 4 of N18 is grounded through capacitor C13, pin 7 of N18 is left floating, pin 6 of N18 is connected to a 5V power supply and capacitor C15 respectively, and the other end of C15 is grounded. Pin 5 of N18 is connected to capacitor C34 and the non-inverting input terminal of OP07 operational amplifier N15 respectively. The other end of C34 is grounded. The positive power supply pin of N15 is connected to a 15V power supply, the negative power supply pin of N15 is connected to a -15V voltage, and the output terminal of N15 is connected to capacitor C31 and the inverting input terminal of N15 respectively and serves as an output terminal to output the dark area voltage. The other end of C31 is grounded.

[0056] The gyro command signal board is responsible for simulating the working signals of the gyro on the missile and generating control commands. It is used in the power-on inspection operation of the intermediate carrier. The board includes a circuit for simulating the generation of the gyro on the missile and a control command circuit. It can not only simulate a negative gyro pulse signal generated when the gyro optoelectronic component is in the bright area, but also simulate the control command signal generated by the ground control box and transmit it through the guidance wire to the missile circuit for power amplification to drive the servo to work. In actual use, the gyro command signal board generates the simulated gyro signal on the missile. This signal simulates various state information generated by the gyroscope during the flight of the missile and generates corresponding control commands to drive the servo to work, so as to test whether the control components on the missile are working properly.

[0057] Simulating the signals under the actual working conditions of the missile through the gyro command signal board is a key point of this test system. The gyro command signal board simulates the circuit for generating the gyro on the missile and the control command circuit; such as Figure 12 , the circuit for simulating the generation of the gyro on the missile includes an NE555N chip U1. The 1 pin of U1 is grounded, the 8 pin is connected to the 5V power supply, the 4 pin is respectively connected to the 5V power supply and the sliding end of the potentiometer VR1. The other end of VR1 is connected to the sliding end of the potentiometer VR2. The 2 pin is respectively connected to one end of the capacitors C2 and C3. The other ends of C2 and C3 are grounded. The 5 pin is connected to one end of the capacitor C1. The other end of C1 is grounded. The 6 pin is respectively connected to the 2 pin and the negative pole of the diode V1. The positive pole of V1 is respectively connected to the 7 pin and the sliding end of VR2. The other end of VR2 is connected to the negative pole of the diode V2. The positive pole of V2 is connected to the 2 pin. The 3 pin is connected to the base of the triode Q1 through the resistor R1. The emitter of Q1 is grounded. The collector is connected to the negative pole of the diode in the optocoupler T1 through the resistor R2. The positive pole of the diode in T1 is connected to the 5V power supply. The collector of the triode in T1 is connected to the -32V power supply. The emitter is respectively connected to R3 and R4 and outputs the gyro signal on the missile as the output terminal. The other ends of R3 and R4 are connected to the -32V power supply; both VR1 and VR2 are connected in a current-limiting manner; the left side of this circuit is a timing square wave circuit composed of the NE555N chip. By adjusting the resistance values of the potentiometers VR1 and VR2, the period and duty cycle of the generated square wave can be adjusted. The right side is an opto-isolation circuit, which realizes the conversion of the 5V signal to the 32V signal through the triode and the optocoupler.

[0058] Such as Figure 13, the control instruction circuit includes three NE555N chips, namely U2, U3, and U4; the 5-pin of U2 is grounded through capacitor C4, the 8-pin of U2 is connected to the 15V power supply, the 4-pin of U2 is connected to the 15V power supply, the 8-pin of U2, and one end of resistor R5 respectively. The other end of R5 is connected to one end of potentiometer VR3. The other end of VR3 is connected to the slider of VR3, the 6-pin of U2, the 7-pin of U2, and capacitor C6 respectively. The other end of C6 is connected to the 1-pin of U2 and capacitor C5 and grounded. The other end of C5 is connected to the 15V power supply. The 3-pin of U2 is connected to the anode of diode V3, resistor R6, and the 2-pin of U3 through capacitor C7 respectively; the cathode of V3 and the other end of R6 are connected and grounded; the 5-pin of U3 is grounded through capacitor C8, the 4-pin of U3 is connected to resistor R7, the 8-pin of U3, and the 15V power supply respectively. The other end of R7 is connected to one end of potentiometer VR4. The other end of VR4 is connected to the slider of VR4, the 6-pin of U3, the 7-pin of U3, and capacitor C10 respectively. The other end of C10 is connected to the 1-pin of U3 and capacitor C9 and grounded. The other end of C9 is connected to the 15V power supply. The 3-pin of U3 is connected to resistor R9 and capacitor C11 respectively. The other end of C11 is connected to the anode of diode V4, resistor R8, and the 2-pin of U4 respectively. The cathode of V4 is connected to the other end of resistor R8 and grounded; the other end of R9 is connected to resistor R10 and the base of transistor Q2 respectively. The other end of R10 is connected to the -15V power supply. The emitter of Q2 is grounded, and the collector is connected to resistor R11 and R12 respectively. The other end of R11 is connected to the 20V power supply and the emitter of transistor Q3 respectively. The other end of R12 is connected to the base of Q3; the 5-pin of U4 is grounded through capacitor C12, the 4-pin of U4 is connected to the 8-pin of U4 and resistor R13 and grounded respectively. The other end of R13 is connected to one end of potentiometer VR5. The other end of VR5 is connected to the slider of VR5, capacitor C14, the 6-pin of U4, and the 7-pin of U4 respectively. The other end of C14 is connected to the 1-pin of U4, capacitor C13, and the -15V power supply respectively. The other end of C13 is grounded. The 3-pin of U4 is connected to resistor R14 and R17 respectively. The other end of R14 is connected to resistor R15 and the base of transistor Q4 respectively. The other end of R15 is connected to the emitter of Q4 and the -15V voltage respectively. The other end of R17 is connected to resistor R18 and the base of transistor Q5 respectively. The other end of R18 is connected to the -15V power supply and the emitter of Q5 respectively;Pin 2 of U2 is respectively connected to resistor R30 and the collector of transistor Q8. The emitter of Q8 is grounded. The base of Q8 is connected to resistor R29. The other end of R29 is respectively connected to resistor R31 and the collector of transistor Q7. The other end of R31 is grounded. The emitter of Q7 is grounded and connected to the base of Q7 through resistor R28. The base of Q7 is also connected to resistor R27. The other end of R27 is respectively connected to R26 and the output terminal of operational amplifier U5A (LM282AN). The other end of R26 is connected to the 15V power supply. The negative power supply pin of U5A is connected to the -15V power supply and grounded through capacitor C16. The positive power supply pin of U5A is connected to the 15V power supply and grounded through capacitor C17. The inverting input terminal of U5A is respectively connected to the positive electrode of diode V7, the negative electrode of diode V6, resistor R25, and resistor R24. The other end of R24 is connected to R23 and grounded. The non-inverting input terminal of U5A is respectively connected to the negative electrode of V7, the positive electrode of V, the other end of R23, the collector of transistor Q6, and the positive electrode of diode V5. The emitter of Q6 is grounded. The base of Q6 is connected to resistor R21. The other end of R21 is connected to the collector of Q4 after being paralleled with resistor R22 and R16. The other end of R22 is connected to the 15V power supply. The other end of R16 is grounded. The negative electrode of V5 is respectively connected to capacitor C15 and resistor R20. The other end of C15 is grounded. The other end of R20 is respectively connected to resistor R19, the collector of Q5, and the collector of Q3, and serves as the output terminal to output the control instruction. The other end of R19 is grounded. There are 3 555 timers in the control instruction circuit. U2 is configured as a stable multivibrator to generate an accurate square wave signal. By adjusting the external resistor VR3, different frequency oscillation outputs can be achieved. U3 is configured as a monostable multivibrator, working in the monostable mode to generate a single pulse signal after a period of delay. By adjusting the value of the external resistor VR4, the width and delay time of the output pulse can be controlled. U4 is configured as a Schmitt trigger. When the input signal exceeds the rising threshold, the output of the trigger flips to a high level. When the input signal is lower than the falling threshold, the output of the trigger flips to a low level. When the input signal is between the two thresholds, the output remains unchanged. The signal is amplified by a transistor and compared by operational amplifier LM393 comparator. A fixed reference voltage is connected to the inverting input terminal, and the voltage signal to be compared is connected to the non-inverting input terminal. When the input signal voltage is higher than the reference voltage, the comparator outputs a high level. When the input signal voltage is lower than the reference voltage, the comparator outputs a low level. In this way, the judgment and detection of whether the input signal voltage exceeds a specific threshold (i.e., the reference voltage) are realized, and the final control signal is finally output through W1.

[0059] The power supply module is connected to the matrix signal gating board, the resistance value testing module, the I / O control unit, the data acquisition module, the signal conditioning board, and the gyro command signal board through power lines; the I / O card control unit is connected to the matrix signal gating board. By outputting digital voltage signals, it controls the actions of the electronic switches in the matrix signal gating board, thereby realizing the gating and switching of test signals; the resistance value testing module is connected to the intermediate body and the carrier of the missile to be tested through an interconnection cable, and is used to test the path resistance, insulation resistance, etc. At the same time, the resistance value testing module is connected to the signal conditioning board, and is used to upload the measured data to the industrial control computer; the data acquisition module is connected to the signal conditioning board. The signal conditioning board preprocesses the received signal by proportional attenuation and then transmits it to the data acquisition module. After the data acquisition module converts this analog signal into a digital signal, it uploads it to the industrial control computer; the gyro command signal board is respectively connected to the matrix signal gating board and the signal conditioning board.

[0060] The software part includes a test condition setting module, a function test module, and a data processing module. Among them, the test condition setting module is used to complete the setting of test conditions such as the numbers of the intermediate body and the carrier, test temperature, humidity, and test personnel; the function test module is used for the automatic test, manual test, and self-check and metrology of the intermediate body and the carrier parameter test items; the data processing module is used for the storage, calling, and reading of the detection data.

[0061] Such as Figure 2 , the functions that the test system can achieve include: system self-check, post-welding inspection of the intermediate body, pre-power-on inspection of the non-charged carrier, vibration test of the non-charged carrier, and system calibration; the system self-check must be carried out before each product detection to ensure the normal operation of the test system. Before multiple consecutive monitors, only the self-check needs to be carried out before the first detection. In specific implementation, the staff starts the system self-check module in the function test module through the industrial control computer to perform power supply voltage self-check and relay self-check on the system, and detect the output voltage of the power supply module and the relay function.

[0062] Such as Figure 3 , the post-welding inspection of the intermediate body is responsible for the line-to-line resistance inspection, path resistance inspection, and power-on inspection of the intermediate body. Before the inspection, line group calibration is required. Subsequently, the staff first sets conditions such as the intermediate body number, test temperature, humidity, test personnel, and date through the test condition setting module using the industrial control computer. Then, through the post-welding inspection module of the intermediate body, an automatic test is carried out on the intermediate body to be tested. The software part issues a test instruction, and after the resistance value testing module receives the instruction, it starts to work to check the line-to-line resistance and path resistance of the intermediate body. Such as Figure 4, during the actual inspection of the resistance between lines, measure the resistance of the 13 lead-out wires connected together to the shell. In actual use, its resistance generally needs to be greater than 2 MΩ to ensure good insulation performance; at the same time, measure the resistance between lines such as 7 (black test lead) - 6, 10 short-circuited (red test lead), 1 - 14, etc. The resistance values should respectively meet the standard of being greater than 1 MΩ. Values lower than the standard indicate abnormal line connection or insulation damage; in specific implementation, the on-resistance inspection measures the key parts such as the battery pack igniter resistance, gyroscope igniter resistance, and the current-limiting resistance of various ignition circuits, which is 4.8 Ω - 5.4 Ω, the resistance of the endurance ignition circuit is 6 Ω - 7.4 Ω, and the current-limiting resistance of the fuse ignition circuit, etc. If the resistance deviation exceeds the allowable range, further investigation is required; then conduct a power-on inspection. The system provides a stable working voltage of 32 V ± 1 V for the intermediate body. The gyro command signal board simulates the working signal of the gyroscope during missile flight and generates control commands to drive the servo to work. Observe whether the secondary rudder can smoothly retract and reach the position at the start of power-on, and whether the primary and secondary rudders can alternately work normally in the predetermined order after receiving the command, so as to judge the operating condition of the on-board control components.

[0063] The data acquisition module continuously acquires analog signals during the test. After being preprocessed by the signal conditioning board, they are transmitted to the data acquisition module, converted into digital signals, and uploaded to the industrial control computer. The data processing module compares the test data with the standard values and automatically judges the test results. If there are unqualified items, the software interface will flash and display in red font, and record the data and relevant information in detail. At the same time, the data processing module stores the test data for convenient subsequent calling and in-depth analysis, providing strong support for quality improvement.

[0064] Such as Figure 5 , before power-on inspection of the non-charged carrier device Before power-on inspection of the non-charged carrier device, mainly conduct electrical performance detection on the carrier to ensure that all parts of its circuit are in a normal state before power-on, including: on-resistance inspection of the No. 6 socket, insulation resistance inspection of the No. 6 socket, on-resistance inspection of the No. 7 socket, and insulation resistance inspection of the No. 7 socket, to avoid failures during subsequent power-on tests. First, the staff inputs the carrier number, test environment parameters (temperature, humidity, etc.), test personnel information, etc. through the test condition setting module of the industrial control computer. After the setting is completed, start the before power-on inspection module of the non-charged carrier device. Subsequently, the software part issues a test command. After receiving the command, the resistance value test module tests the on-resistance of the No. 6 socket of the carrier, the insulation resistance of the No. 6 socket, the on-resistance of the No. 7 socket, and the insulation resistance of the No. 7 socket. The data acquisition module real-time acquires various signals during the test process and converts the analog signals into digital signals and uploads them to the industrial control computer. Such as Figure 6, the data processing module in the industrial control computer analyzes and processes this data, compares it with the preset standard values, and determines whether the test results of each item are qualified. If an abnormality is found, the software interface will highlight the unqualified items to remind the staff to conduct inspections and handling.

[0065] For example Figure 7 , the vibration test of the non-charged carrier device aims to simulate the vibration environment that the carrier may encounter during actual use, and detect the performance stability of each component and the reliability of electrical connections under vibration conditions. Before the test, the staff still sets the carrier number, test environment parameters, tester information, etc. through the test condition setting module of the industrial control computer. After starting the vibration test module of the non-charged carrier device, the software part controls the test system to provide a working voltage of 32V±1V for the carrier, and conducts power-on inspection, insulation resistance inspection, control loop inspection, ignition circuit inspection, and pull-off switch inspection on the non-charged carrier respectively; the gyro command signal board simulates and generates gyro pulse signals to detect whether the bright area amplitude and dark area amplitude meet the standards. For example Figure 8 , during the vibration process, observe whether the rudder blade can normally retract in place when there is no command during power-on, and whether the main and auxiliary rudders can alternately work normally when a command is added. Use the resistance value test module and data acquisition module to monitor the insulation resistance of the shell part and the resistance change of components such as the on-board battery, gyroscope, and radiator in real time. Since the control loop is not a pure resistive load, the resistance inspection of the control loop is carried out through an MF35 pointer multimeter. Once it is found that the resistance value exceeds the specified range or other test parameters are abnormal, the system immediately records the relevant data and displays the fault information on the software interface so that the staff can take measures in time.

[0066] For example Figure 10 , system calibration is an important link to ensure the accuracy and reliability of the test system. This test system is equipped with a metering interface, and the metering center calibrates the system by connecting to this interface. Start the system metering module through the industrial control computer, and the system metering module controls the opening of the system metering action.

[0067] For the power supply voltage, use a high-precision voltage measuring instrument to measure the +5V, +20V, ±15V, +32V DC power supplies output by the test system, and detect whether the output voltage is within the specified accuracy range. If there is a deviation, adjust or calibrate the power supply module to ensure that it can stably output an accurate voltage value. When detecting the excitation signal, the system outputs the excitation signal, and use an oscilloscope to monitor parameters such as the voltage and period of the excitation signal, and compare them with the standard values to ensure that the quality of the excitation signal meets the test requirements. For the calibration of the resistance measurement function, manually connect a standard resistor with a known resistance value to the resistance test terminal of the system, and use the resistance value test module of the system to collect and measure. Compare the measurement result with the standard resistance value, calculate the measurement error, and if the error exceeds the allowable range, calibrate or adjust the resistance value test module to ensure that the resistance test accuracy meets the relevant requirements. After calibration is completed, generate a calibration report, record in detail various data and results during the calibration process, and archive and save them. In subsequent test work, perform system calibration regularly to ensure that the test system is always in the best working state, providing reliable guarantee for the test of the missile intermediate carrier.

[0068] As Figure 9 , the on-resistance detection adopts a four-wire resistance measurement method. The test current flows out from HO, returns to LO through the measured resistor Rx, generates a voltage drop Vx on the measured resistor Rx, Vx is input to HI and LI, and after amplification measurement, the value of the measured resistor Rx is calculated according to Rx = Vx / I. To reduce the influence of the measurement leads on the DUT, the measurement interface consists of 4 pins. It is necessary to connect LO and LI to the same end of the measured resistor, and HI and HO to the same end of the measured resistor to ensure the test accuracy of small resistors.

[0069] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be obvious to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to these embodiments shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A missile intermediate carrier test system, characterized in that: The system includes a hardware part and a software part, wherein the hardware part includes an industrial computer, a test chassis, a multimeter and interconnecting cables; The test chassis comprises a matrix signal gating board, a power module, a resistance test module, an I / O control unit, a data acquisition module, a signal conditioning board and a gyro command signal board; the test chassis is respectively connected to an industrial computer, a multimeter, an intermediate to be tested and a carrier to be tested; inside the test chassis, the signal conditioning board is respectively connected to the data acquisition module, the tissue test module and the gyro command signal board; the gyro command signal board is connected to the matrix signal gating board; the matrix signal gating board is connected to the I / O control unit; the power module is respectively connected to the matrix signal gating board, the resistance test module, the I / O control unit, the data acquisition module, the signal conditioning board and the gyro command signal board; The test chassis is connected to the industrial control computer and the multimeter respectively, and is connected to the intermediate to be tested and the carrier through interconnecting cables; The software part includes a test condition setting module, a function test module and a data processing module.

2. A missile intermediate carrier test system according to claim 1, characterized in that: The signal conditioning board includes a tracking circuit, a positive phase attenuation circuit and a light and dark area detection circuit. During the test signal collection process, the signal is proportionally attenuated and is responsible for detecting the light and dark area voltage of the intermediate and carrier to be tested; the light and dark area detection circuit includes an input terminal W2, W2 is connected to the 2-port of the relay K20B, the 4-port of the K20B is connected to one end of the sliding rheostat R48, the 3-port of the K20B is connected to one end of the sliding rheostat R47, and the other end of R48 is respectively connected to the other end of R47. The 3rd and 4th ends of the relay K21B are connected to the 2nd and 3rd ends of the relay K21B, the 3rd and 4th ends of the relay K21B are suspended, and the 4th ends are connected to the 2nd and 2nd ends of the relay K1B and the relay K22B, respectively, the 3rd and 4th ends of the relay K1B are suspended, and the 4th ends are connected to the resistor R14, the other end of the resistor R14 is connected to the resistor R16 and the 1st pin of the AD626 amplifier N17, the 2nd and 3rd pins of the N17 are grounded, the 4th pin of the N17 is grounded via the capacitor C12, the other end of the R16 is connected to the 8th pin of the N17 and the resistor R15, respectively, the R15 The other end of is connected to the 5-port of relay K1C, the 6-port of K1C is suspended, and the 7-port is respectively connected to the 5-port of relay K21C and the 7-port of relay K22C, the 6-port of K21C is suspended, and the 7-port is respectively connected to one end and a sliding end of a sliding rheostat R49 and one end and a sliding end of a sliding rheostat R46, the other end of R49 is connected to the 5-port of relay K20C, the other end of R46 is connected to the 6-port of K20C, and the 7-port of K20C is grounded; the N Pin 6 of N17 is connected to a 5V power supply and a capacitor C14 respectively, and the other end of C14 is grounded; Pin 7 of N17 is suspended, and pin 5 of N17 is connected to a capacitor C33 and a non-inverting input end of an OP07 operational amplifier N16 respectively, and the other end of C33 is grounded, the positive power supply pin of N16 is connected to a 15V power supply, and the negative power supply pin of N16 is connected to a -15V voltage, and the output end of N16 is connected to the capacitor C30 and the inverting input end of N16 respectively and outputs a dark area voltage as an output end, and the other end of C30 is grounded;The 3rd port of K22B is suspended, the 4th port is connected to the resistor R51, the other end of R51 is respectively connected to the resistor R53 and the 1st pin of the AD626 amplifier N18, the 6th pin of K22C is suspended, the 5th pin is connected to the resistor R52, the other end of R52 is respectively connected to the other end of R53 and the 8th pin of N18, the 2nd and 3rd pins of N18 are grounded, the 4th pin of N18 is grounded via the capacitor C13, the 7th pin of N18 is suspended, the 6th pin of N18 is The pins are connected to the 5V power supply and the capacitor C15 respectively, and the other end of C15 is grounded. The 5 pins of N18 are connected to the capacitor C34 and the non-inverting input end of the OP07 op amp N15 respectively, and the other end of C34 is grounded. The positive power supply pin of N15 is connected to the 15V power supply, and the negative power supply pin of N15 is connected to the -15V voltage. The output end of N15 is connected to the capacitor C31 and the inverting input end of N15 respectively and outputs the dark area voltage as the output end. The other end of C31 is grounded. ; 3. A missile intermediate carrier test system according to claim 1, characterized in that: The gyro command signal board includes a gyro generation circuit for simulating a missile and a control command circuit; the gyro generation circuit for simulating a missile includes a NE555N chip U1, wherein pin 1 of the U1 is grounded, pin 8 is connected to a 5V power supply, pin 4 is respectively connected to a 5V power supply and a sliding end of a sliding variable resistor VR1, the other end of the VR1 is connected to a sliding end of a sliding variable resistor VR2, pin 2 is respectively connected to one end of capacitors C2 and C3, the other ends of C2 and C3 are grounded, pin 5 is connected to one end of a capacitor C1, the other end of C1 is grounded, pin 6 is respectively connected to pin 2 and the negative electrode of a diode V1, and the V The positive electrode of 1 is connected to the 7 pin and the sliding end of VR2 respectively, the other end of VR2 is connected to the negative electrode of diode V2, the positive electrode of V2 is connected to the 2 pin, the 3 pin is connected to the base of transistor Q1 through resistor R1, the emitter of Q1 is grounded, the collector is connected to the negative electrode of the diode in the photocoupler T1 through resistor R2, the positive electrode of the diode in T1 is connected to a 5V power supply, the collector of the transistor in T1 is connected to a -32V power supply, the emitter is connected to R3 and R4 respectively and serves as an output end to output the gyro signal on the missile, and the other ends of R3 and R4 are connected to a -32V power supply; VR1 and VR2 are both current-limiting connections; The control instruction circuit includes three NE555N chips, namely U2, U3 and U4; Pin 5 of U2 is grounded through capacitor C4, Pin 8 of U2 is connected to a 15V power supply, Pin 4 of U2 is respectively connected to a 15V power supply, Pin 8 of U2 and one end of a resistor R5, the other end of R5 is connected to one end of a sliding rheostat VR3, the other end of VR3 is respectively connected to a sliding end of VR3, Pin 6 of U2, Pin 7 of U2 and capacitor C6, the other end of C6 is respectively connected to Pin 1 of U2 and capacitor C5 and grounded, the other end of C5 is connected to a 15V power supply, Pin 3 of U2 is respectively connected to a positive pole of a diode V3, a resistor R6 and Pin 2 of U3 through a capacitor C7; the negative pole of V3 is connected to the other end of R6 and grounded; Pin 5 of U3 is grounded through a capacitor C8, Pin 4 of U3 is respectively connected to a resistor R7, Pin 8 of U3 and a 15V power supply, the R7 The other end of is connected to one end of the sliding rheostat VR4, the other end of VR4 is respectively connected to the sliding end of VR4, the 6th pin of U3, the 7th pin of U3 and the capacitor C10, the other end of C10 is respectively connected to the 1st pin of U3 and the capacitor C9 and grounded, the other end of C9 is connected to a 15V power supply, the 3rd pin of U3 is respectively connected to the resistor R9 and the capacitor C11, the other end of C11 is respectively connected to the positive electrode of the diode V4, the resistor R8 and the 2nd pin of U4, the negative electrode of V4 is connected to the other end of the resistor R8 and grounded; the other end of R9 is respectively connected to the resistor R10 and the base of the transistor Q2, the other end of R10 is connected to a -15 power supply, the emitter of Q2 is grounded, the collector is respectively connected to the resistors R11 and R12, the other end of R11 is respectively connected to the 20V power supply and the emitter of the transistor Q3, the other end of R12 is connected to the base of Q3; Pin 5 of U4 is grounded through capacitor C12, pin 4 of U4 is respectively connected to pin 8 of U4 and resistor R13 and grounded, the other end of R13 is connected to one end of sliding rheostat VR5, the other end of VR5 is respectively connected to the sliding end of VR5, capacitor C14, pin 6 of U4 and pin 7 of U4, the other end of C14 is respectively connected to pin 1 of U4, capacitor C13 and -15V power supply, the other end of C13 is grounded, pin 3 of U4 is respectively connected to resistors R14 and R17, the other end of R14 is respectively connected to resistor R15 and the base of transistor Q4, the other end of R15 is respectively connected to the emitter of Q4 and -15V voltage, the other end of R17 is respectively connected to resistor R18 and the base of transistor Q5, the other end of R18 is respectively connected to the -15V power supply and the emitter of Q5; The 2 pins of U2 are respectively connected to the resistor R30 and the collector of the transistor Q8, the emitter of Q8 is grounded, the base of Q8 is connected to the resistor R29, the other end of R29 is respectively connected to the resistor R31 and the collector of the transistor Q7, the other end of R31 is grounded, the emitter of Q7 is grounded and connected to the base of Q7 through the resistor R28, the base of Q7 is also connected to the resistor R27, the other end of R27 is respectively connected to R26 and the output end of the LM282AN operational amplifier U5A, the other end of R26 is connected to a 15V power supply, the negative power supply pin of U5A is connected to a -15V power supply and is grounded through a capacitor C16, the positive power supply pin of U5A is connected to a 15V power supply and is grounded through a capacitor C17, the inverting input end of U5A is respectively connected to the positive and negative ends of the diode V7 The cathode of V5 is connected to the cathode of V7, the cathode of V6, the resistor R25 and the resistor R24, the other end of R24 is connected to R23 and grounded, the in-phase input end of U5A is respectively connected to the cathode of V7, the cathode of V, the other end of R23, the collector of transistor Q6 and the anode of diode V5, the emitter of Q6 is grounded, the base of Q6 is connected to resistor R21, the other end of R21 is connected to the collector of Q4 after being connected in parallel with resistors R22 and R16, the other end of R22 is connected to a 15V power supply, and the other end of R16 is grounded; the cathode of V5 is respectively connected to capacitor C15 and resistor R20, the other end of C15 is grounded, the other end of R20 is respectively connected to resistor R19, the collector of Q5 and the collector of Q3, and serves as an output end to output control instructions, and the other end of R19 is grounded.

4. A method for testing a missile intermediate carrier, characterized in that: The following steps are involved: S1: System self-test. Before product testing, the system is self-tested through the system self-test module of the functional test module in the software part. S2: Post-weld inspection of the intermediate body. First, the test condition setting module of the software part is used to complete the test condition setting, and then the line resistance calibration is performed. Then, the post-weld inspection of the intermediate body is started through the functional test module. Finally, the data acquisition module and the signal conditioning board process and collect the test data and transmit them to the industrial control computer for analysis and processing. S3: Check before power on of the uncharged vehicle. First, the test condition setting module of the software part is used to complete the test condition setting, and then the line resistance calibration is performed. Then, the check before power on of the uncharged vehicle is started through the functional test module. Finally, the data acquisition module and the signal conditioning board process and collect the test data and transmit them to the industrial control computer for analysis and processing. S4: Vibration test of the uncharged vehicle. First, the test condition setting module of the software part is used to complete the test condition setting, and then the line resistance calibration is performed. Then, the vibration test of the uncharged vehicle is started through the functional test module. Finally, the data acquisition module and the signal conditioning board process and collect the test data and transmit them to the industrial control computer for analysis and processing. S5: System calibration: Start the system metering module through the industrial computer. The system metering module controls the start of the system metering action to measure the system's power supply voltage, excitation signal and resistance.

5. The method for testing a missile intermediate carrier according to claim 4, characterized in that: The system self-check in step S1 includes power supply voltage self-check and relay self-check.

6. The method for testing a missile intermediate carrier according to claim 4, characterized in that: The post-welding inspection of the intermediate body in step S2 includes conducting an inter-wire resistance inspection, a path resistance inspection, and a power-on inspection on the intermediate body.

7. The method for testing a missile intermediate carrier according to claim 4, characterized in that: The step S3 is to check the carrier before the non-charged carrier is powered on, and to perform a No. 6 socket path resistance check, a No. 6 socket insulation resistance check, a No. 7 socket path resistance check, and a No. 7 socket insulation resistance check on the carrier.

8. The method for testing a missile intermediate carrier according to claim 4, characterized in that: The step S4 performs a power-on check, an insulation resistance check, a control circuit check, an ignition circuit check, and a disconnect switch check on the vehicle.

9. The method for testing a missile intermediate carrier according to claim 4, characterized in that: The step S5 system calibration includes the following steps: 1) Measuring power supply voltage: The system automatically detects its working voltage, and uses a standard multimeter to manually test the system working voltage, and the error accuracy meets the requirements; 2) Measuring excitation signal: The system outputs an excitation signal, and an oscilloscope is used to monitor the voltage and period of the excitation signal to ensure that they meet the requirements; 3) Measuring resistance: Manually connect the standard resistance to the system resistance test end, use system acquisition, and the resistance test accuracy meets the relevant requirements.

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