Device abnormality detection sensor

Abstract

The present specification discloses a device abnormality detection sensor for detecting an abnormality of a device. In a device abnormality detection sensor according to the present invention, an elastic plate changes as a device changes, and a detection unit recognizes an abnormality signal drawn on a detection circuit of the elastic plate. Therefore, the present invention can quickly detect fine changes in the device.

Description

Technical Field

[0001] The present invention relates to a device abnormality detection sensor.

[0002] In particular, it relates to a device abnormality detection sensor that can detect problems caused by deformation of a device in advance. Background Art

[0003] Over time, a device gradually deteriorates. In particular, even without being subjected to external force, as long as time passes, the device will deteriorate, and thus continuous inspection and repair are required.

[0004] However, continuously inspecting a device is a very difficult task. Inspecting a device requires a worker or a device to approach the device to check visually or with other means whether the device is abnormal.

[0005] This requires the time and effort of a worker.

[0006] Moreover, although it is easy to grasp abnormalities that can be visually grasped by a worker, it is difficult to grasp parts that are difficult to visually grasp, such as loosening of bolts and nuts.

[0007] To solve such problems, various methods are being used. As an example, a method of generating sound in a device by a striking mechanism to detect the loosening of bolts and nuts is used, but this requires a high level of proficiency of a worker, reduces accuracy, and it is not easy to grasp the location where an abnormality occurs. Summary of the Invention

[0008] One embodiment of the present invention is for solving the foregoing problems, and an object thereof is to provide a device abnormality detection sensor that can accurately detect abnormalities of a device in real time.

[0009] One embodiment of the device abnormality detection sensor may include: an elastic plate connected to the device, having a detection circuit printed on one surface thereof, and deforming as the device deforms; and a detection unit that detects an abnormality of the detection circuit as the elastic plate deforms, thereby detecting an abnormality of the device.

[0010] The present invention is characterized in that a plurality of the detection circuits are provided and located on one surface of the elastic plate.

[0011] The present invention is characterized in that the detection circuit may be composed of a first detection circuit, a second detection circuit, and a third detection circuit, and the thickness of each detection circuit may be different.

[0012] The present invention is characterized in that at least one of each detection circuit is at least in a non-linear shape.

[0013] The feature of the present invention is that a substrate portion capable of applying a current to the detection circuit is connected to the detection circuit on one side of the elastic plate.

[0014] The feature of the present invention is that the detection unit detects an abnormal signal of the detection circuit at a set period.

[0015] In an embodiment of the present invention, the elastic plate can contract and relax as the device moves. Thereby, it is possible to detect a change in the current intensity of the detection circuit printed on the elastic plate, and thus it is possible to accurately detect an abnormality of the device in real time. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is an operation diagram of a device abnormality detection sensor according to an embodiment of the present invention.

[0017] Figure 2 It shows a device abnormality detection system according to an embodiment of the present invention.

[0018] Figure 3 The elastic plate of the device abnormality detection system according to an embodiment of the present invention is shown enlarged.

[0019] Figure 4 It shows a device abnormality detection sensor according to another embodiment of the present invention.

[0020] Figure 5 The elastic plate of the device abnormality detection sensor according to still another embodiment of the present invention is shown enlarged.

[0021] Figure 6 It is an exploded view of the detection unit of the device abnormality detection sensor according to an embodiment of the present invention. DETAILED DESCRIPTION

[0022] Hereinafter, an embodiment of the present invention will be described in detail with reference to exemplary drawings. However, this does not limit the scope of the present invention.

[0023] It should be noted that when assigning reference numerals to the structural elements of each drawing, even if they are shown on different drawings, the same reference numerals should be assigned to the same structural elements as much as possible. And, in the process of describing the present invention, when it is judged that a detailed description of a related well-known structure or function may obscure the gist of the present invention, the detailed description thereof will be omitted.

[0024] Moreover, the size or shape of the structural elements shown in the drawings may be exaggerated for the sake of clarity and convenience of explanation. And, terms specifically defined in consideration of the structure and operation of the present invention are only used to explain the embodiments of the present invention and do not limit the scope of the present invention.

[0025] Figure 1 The operation diagram of the device abnormality detection sensor of the present invention as an embodiment.

[0026] The device abnormality detection sensor 10 of the present invention as an embodiment may include an elastic plate 100 and a detection unit 200.

[0027] The elastic plate 100 may be printed with a detection circuit 110 on one side and formed of a flexible material. The elastic plate 100 is connected to the device. The elastic plate 100 may be connected to the device, and its shape may be deformed as the device moves.

[0028] As an example, as Figure 1 shown, in the case of a bolt loosening, the elastic plate 100 may be elongated as the bolt moves. As the elastic plate 100 is deformed, the interval or thickness of the detection circuit 110 may be deformed. Therefore, the resistance value of the detection circuit 110 may be different from before, and thus, the current value flowing in the detection circuit 110 is also different from the current value flowing before.

[0029] The detection unit 200 may detect a change in the detection circuit 110 to detect an abnormality of the device. As an example, the detection unit 200 may detect a change in the current value to detect an abnormality of the device. In this way, the present invention can accurately and real-time grasp the abnormality of the device.

[0030] And, as an example, the detection unit 200 may be located on one side of the elastic plate 100 to perform solar power generation, thereby generating energy and applying current to the detection circuit 110.

[0031] And, among them, the detection unit 200 may apply current to the detection circuit 110 at a set period to detect an abnormality of the detection circuit 110. That is, the detection unit 200 may apply current at a set period and judge the change in the current value of the detection circuit 110 at a set period.

[0032] Therefore, the present invention can effectively use energy.

[0033] Figure 2 The device abnormality detection system of the present invention as an embodiment is shown.

[0034] The device abnormality detection system of the present invention as an embodiment may include the aforementioned device abnormality detection sensor 10, a short-range communication unit 300, and a monitoring unit 400.

[0035] That is, the detection unit 200 may send the detected information to the monitoring unit 400 through the communication unit 300.

[0036] Among them, the communication unit 300 may include: a short-range communication unit 310 capable of performing short-range communication; and a server system unit 320 capable of transmitting and receiving information received through the short-range communication unit 310. That is, the detection unit 200 may send information related to whether the device is abnormal through the short-range communication unit 310, and the short-range communication unit 310 may send the received information to the server system unit 320.

[0037] The monitoring unit 400 may be connected to the server system unit 320 to check the information sent to the server system unit 320 in real time, so as to confirm the abnormality of the device in real time.

[0038] Figure 3 An enlarged view shows the flexible plate of the device abnormality detection system of the present invention as an embodiment.

[0039] In one embodiment of the present invention, a plurality of detection circuits 110 may be printed on the flexible plate 100.

[0040] As an example, the detection circuit 110 may be composed of a first detection circuit 111, a second detection circuit 112, and a third detection circuit 113.

[0041] The first detection circuit 111, the second detection circuit 112, and the third detection circuit 113 may be spaced apart on the flexible plate 100. That is, the second detection circuit 112 may be provided between the first detection circuit 111 and the third detection circuit 113. In this way, in the present invention, a plurality of detection circuits 110 may be located at different positions on the flexible plate 100, so that even a slight deformation of the device can be detected.

[0042] Among them, each detection circuit 110 may be formed using silver / epoxy paste as a raw material.

[0043] Figure 4 An illustration shows the device abnormality detection sensor of the present invention as another embodiment.

[0044] In the device abnormality detection sensor 10 of another embodiment of the present invention, the thicknesses of the first detection circuit 111, the second detection circuit 112, and the third detection circuit 113 may be different. That is, since the thicknesses of the first detection circuit 111 and the second detection circuit 112, the third detection circuit 113 are different, the third detection circuit 113 may be thicker than the first detection circuit 111, and the second detection circuit 112 may be thicker than the first detection circuit 111 and the third detection circuit 113.

[0045] Therefore, in the present invention of one embodiment, the current value of the detection circuit 110 caused by the abnormality of the device can send a greater change. Therefore, when the elastic part of the present invention deforms with the slight change of the device, the resistance value changes greatly, so that the current value can change very greatly.

[0046] Therefore, the present invention of one embodiment can check the abnormality of the device more accurately.

[0047] Figure 5 An enlarged view shows the elastic plate of the device abnormality detection sensor of the present invention as another embodiment.

[0048] In the case of another embodiment, the detection circuit 110 having a non-linear shape can be printed in the present invention.

[0049] As an example, as Figure 5 shown, in the elastic plate 100 of the present invention, the first detection circuit 111 can be formed in a curved shape.

[0050] In this way, the first detection circuit 111 can be formed in a curved shape, and the second detection circuit 112 and the third detection circuit 113 can be formed in linear shapes respectively.

[0051] Therefore, in the present invention, even if a slight change occurs in the device, the resistance value of the curved first detection circuit 111 having a large resistance value also changes greatly, so that the abnormality of the device can be detected.

[0052] However, among them, the widths of the first detection circuit 111 and the second detection circuit 112 can be similar. As an example, the widths of the first detection circuit 111 and the second detection circuit 112 can be formed to be 2 mm. However, the width of the third detection circuit 113 located outside the elastic plate 100 can be smaller than the widths of the first detection circuit 111 and the second detection circuit 112. As an example, the width of the third detection circuit 113 can be 1 mm. Therefore, in the present invention, the second detection circuit 112 can maintain a stable resistance value, but the resistance values of the first detection circuit 111 and the third detection circuit 113 can change greatly with the deformation of each device.

[0053] In this way, the present invention can easily detect the change even in the slight change of the device due to the unique shape of the detection circuit 110. On the other hand, in Figures 3 to 5 it, although only the device abnormality detection circuit is described, it is also okay even if they are all embodied by the Figure 2 system described.

[0054] Figure 6 It is an exploded view of the detection part of the device abnormality detection sensor of the present invention as one embodiment.

[0055] The detection unit 200 of the present invention as an embodiment may include an upper case 210, a power generation unit 220, a substrate unit 230, an intermediate case 240, and a lower case 250.

[0056] The upper case 210 is located on the upper side of the detection unit 200. The upper case 210 may be formed in a shape that is open at the lower side. The upper case 210 can be formed in a transparent manner. Thus, sunlight can pass through the upper case 210 for projection. Fixing parts formed downward may be formed near the corners of the upper case 210.

[0057] The power generation unit 220 may be configured to be in a form surrounded by the upper case 210. The power generation unit 220 may be configured with monomers on one side, so that energy can be generated as long as sunlight is received. Among them, the power generation unit 220 may be smaller than the size of the upper case 210.

[0058] The substrate unit 230 may be located under the power generation unit 220 and connected to the power generation unit 220. And the substrate unit 230 may be connected to the elastic plate 100. Thus, the substrate unit 230 can apply current to the detection circuit 110 of the elastic plate 100 by using the energy generated by the power generation unit 220. Among them, fixing grooves may be formed at the corner portions of the substrate unit 230 (at positions corresponding to the portions where the fixing parts of the upper case 210 are formed).

[0059] It may be located under the upper case 210, support the power generation unit 220 on the upper side, and have the substrate unit 230 on the lower side. Fixing parts may be provided near the corners of the intermediate case 240, and the fixing parts of the upper case 210 may be introduced and inserted. Thus, the fixing parts of the upper case 210 and the fixing parts of the intermediate case 240 can be engaged with each other for fixation. Thus, the power generation unit 220 can be fixed between the upper case 210 and the intermediate case 240.

[0060] The lower case 250 may be located under the intermediate case 240. In the lower case 250, fixing parts may be formed at positions corresponding to the fixing parts of the intermediate case 240. Thus, the lower case 250 can be located under the intermediate case 240 and combined with each other through the fixing parts. Thus, the substrate unit 230 disposed under the intermediate case 240 can be fixed between the intermediate case 240 and the lower case 250.

[0061] On the other hand, a groove may be formed in the lower case 250 to form a space for the elastic plate 100 connected to the substrate unit 230 to be located outside. More precisely, a surrounding wall facing upward is formed around the lower case 250, and the height of the surrounding wall at the portion where the elastic plate 100 is located may be lower than the height of the other surrounding walls. Thus, the elastic plate 100 can be located outside.

[0062] Although specific embodiments of the present invention have been shown and described, various modifications and changes can be made to the present invention without departing from the technical idea of the present invention provided in the claims, which will be obvious to those of ordinary skill in the art.

[0063] Description of Reference Numerals

[0064] 10: Device Abnormality Detection Sensor

[0065] 100: Elastic Plate

[0066] 110: Detection Circuit

[0067] 111: First Detection Circuit

[0068] 112: Second Detection Circuit

[0069] 113: Third Detection Circuit

[0070] 200: Detection Unit

[0071] 210: Upper Case

[0072] 220: Power Generation Unit

[0073] 230: Substrate Unit

[0074] 240: Intermediate Case

[0075] 250: Lower Case

[0076] 300: Communication Unit

[0077] 310: Short-Range Communication Unit

[0078] 320: Server System Unit

[0079] 400: Monitoring Unit

Claims

1. An apparatus anomaly detection sensor for detecting anomalies of an apparatus, characterized in that, Including: A flexible plate, connected to the device, with a detection circuit printed on one side of the flexible plate and deformed as the device deforms; And A detection unit that detects an abnormality in the detection circuit as the flexible plate deforms, thereby detecting an abnormality in the device.

2. The apparatus anomaly detection sensor according to claim 1, characterized in that, A plurality of the detection circuits are provided on one side of the flexible plate.

3. The apparatus anomaly detection sensor according to claim 2, characterized in that, The detection circuit is composed of a first detection circuit, a second detection circuit, and a third detection circuit, and the thickness of each detection circuit is different.

4. The apparatus anomaly detection sensor according to claim 3, characterized in that, At least one of each detection circuit is at least in a non-linear shape.

5. The apparatus anomaly detection sensor according to claim 1, characterized in that, A substrate portion for applying current to the detection circuit is connected to the detection circuit on one side of the flexible plate.

6. The apparatus anomaly detection sensor according to claim 1, characterized in that, The detection unit detects an abnormal signal of the detection circuit at a set period.

Images