Distributed system-oriented test station model generation method

Abstract

The invention discloses a distributed system-oriented test station model generation method, relates to the technical field of automatic testing, and aims to solve the problem that a single test station cannot meet the test requirement along with the increase of the size of a test object and the increase of complexity in the conventional test station model generation method. Therefore, a distributed test system needs to be applied to test a large-scale and complex system, a test station modeling method of the distributed system needs to be designed, and research on the aspect in the industry is few. According to the test station model generation method oriented to the distributed system, an automatic generation algorithm is achieved, the generation efficiency and accuracy of the test station can be greatly improved, and the development efficiency of an automatic test system is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of automated testing, and particularly to a method for generating a test station model for a distributed system. Background Art

[0002] In recent years, the ATML standard released by the Institute of Electrical and Electronics Engineers (IEEE) has standardized the description of test stations. However, the current existing general test system development platforms still mainly target individual test stations in terms of test station modeling.

[0003] Among the existing test station model generation methods, the Beijing Great Wall Aeronautical Measurement and Control Technology Research Institute of the Aviation Industry Corporation of China has developed a visual test software integration environment GTest. Its test station modeling is based on the underlying resource board model and is finally manually combined by designers without designing the generation method. Sun Baojiang et al. from Beihang University proposed a test system architecture. Instrument selection is carried out according to the analysis of alternative instruments, switch libraries, and UUT measurement points, and finally the instrument models required for the test system are formed. However, it does not finally form a test station model, but only a virtual concept of a set of instrument models that meet the test requirements, and the corresponding relationship with the real test station is not clear. The Chinese invention patent with the application number: 201410729744.7, an automated test system graphical modeling device and method, proposed the test station model modeling process, mainly configuring instrument models through the electrical interface types and indicators of the product under test, but only outlined the principle without proposing an automated generation method. The Chinese invention patent with the application number: 202111335892.7, a lightweight test process modeling for military aircraft, mentioned the test station model and introduced the elements of the test station model, but did not technically describe the automatic generation of the test station model. Summary of the Invention

[0004] The purpose of the present invention is to solve the problem that as the volume and complexity of the test object increase, a single test station cannot meet the test requirements, and it is necessary to design a test station modeling method for a distributed system and apply a distributed test system to implement the test of large and complex systems. The present invention provides a method for generating a test station model for a distributed system.

[0005] To achieve the above purpose, the technical solution adopted by the present invention is as follows:

[0006] A method for generating a test station model for a distributed system, characterized by including the following steps:

[0007] Step s1: Sort out the signal types of the test requirements of the product under test and count the signal types;

[0008] Step s2: sorting the signal types counted in step s1, with the first priority being that the signal types with high performance index requirements are placed at the front; the second priority being that the signal types with more channels are placed at the front if the performance index is at a normal level;

[0009] Step s3: Use the basic information of the test station to establish a test station model and select free slots that meet the test requirements;

[0010] Step s4: Establish a resource board model using the basic information of the resource board; select the test resource board according to the signal type, resource board performance, and channel number;

[0011] Step s5: Use the resource boards selected in step s4 to match the free slots that meet the test requirements in step s3, and complete the establishment and recording of the test station model.

[0012] The signals in step s1 include: directional analog signals, discrete signals, and pulse signals; the same signal type but different performance index requirements are recognized as different types of signals.

[0013] The number of channels of the pth signal in step s1 is C P , the performance parameter requirements are set XN P , p∈[1,M], M represents the total number of signal types of the object under test.

[0014] In step s2, the performance index is at a normal level, the channel with the largest number of channels is ranked second in priority, and the number of test stations is T.

[0015] The basic information of the test station in step s3 includes: the test station number is i∈[1,T], the number of test stations is T; the number of resource board slots S of the i-th test station i ; Backplane bus type TB for the jth slot of the i-th test station ij , One or more of the following; The size of the resource board that can be plugged into the i-th test station The resource board number Y placed in the jth slot of the i-th test station ij =k.

[0016] The slot status Y of the test station initialized in step s3 ij =0, starting from the first slot of the test station numbered 1 to the last slot of the last test station, sequentially screen whether there is an idle slot that meets the test requirements. If there is, record the current test station number i and slot j. If not, add a new test station.

[0017] The basic information of the resource board in step s4 includes: the resource board number k∈[1,Z], where Z is the total number of resources and M represents the total number of signal types of the measured object; the backplane bus type one of; size Signal type; number of channels ZC k = {ZC k1 , ZC k2 , ···, ZC kM}; set of performance indicators ZX k = {{ZX k1}, {ZX k2}, ···, {ZX kM}}; mark the occupancy of a certain test station, Flagk ∈ [1, T].

[0018] In step s4, the steps of screening test resource boards according to signal type, performance, and number of channels are as follows:

[0019] Step s4.1: Query the occupancy of resource boards and initialize the occupancy of resource boards so that all test resource boards are available;

[0020] Step s4.2: Find resource boards that meet the signal test requirements.

[0021] In step s4.1, when initializing the occupancy of resource boards Flag k = 0, then all test resource boards are available.

[0022] In step s4.2, if the total number of channels ZCT for the p-th signal test requirement p is not less than the total number of channels C required by the product under test p , then match the next signal type. If the current signal is the last signal type to be matched, then complete and exit; if the total number of channels ZCT for the p-th signal test requirement p is less than the total number of channels C required by the product under test p , then determine whether there are any remaining resource boards. If not, new resource boards need to be added; if so, determine whether there is a resource board among the remaining resource boards that meets the test capabilities of the p-th signal. If so, record the resource board number k. If not, determine whether the un-covered channels need to be measured simultaneously. If not, use switch multiplexing. If so, add new resource boards and repeat step s4.2 for the new resource boards.

[0023] In step s5, use the resource boards screened in step s4 to match the idle slots that meet the test requirements in s3, that is, complete the establishment of the test station model; and record that the resource board numbered k is occupied, record that the j-th slot of test station i is occupied by the resource board numbered k, update the number of resource boards that have been matched, and update the total number of channels of the matched resource boards that meet the test requirements of the p-th signal type.

[0024] The test station model established in step S5 is the test station number i determined in steps S1 to S5; the number S of resource board card slots available in test station i determined by the initialization of test station in step S3 i and the backplane bus type TB of the j-th slot in the i-th test station ij ; the size TSize of the resource card that can be inserted into the i-th test station screened in step S3 i ; the resource board card number Y placed in the j-th slot of the i-th test station calculated in step S4 ij , and the four parts are combined to form a test station model.

[0025] The advantages of adopting the present invention are as follows:

[0026] 1. Compared with the existing single test station, the test station automatic generation process of the present invention can generate a test station that can meet the test volume for a system with a large test volume and high complexity.

[0027] 2. Compared with the traditional method, the present invention designs a test station generation method for a distributed test system. Based on this method, an automatic generation algorithm is implemented, which can greatly improve the generation efficiency and accuracy of the test station and improve the development efficiency of the automatic test system.

[0028] 3. Aiming at the problems of low efficiency of manual modeling and non-standard design of test stations in a distributed test system, the present invention proposes a method for generating multiple test station models, which improves the modeling efficiency and accuracy of test stations. Description of the Drawings

[0029] Figure 1 It is a flowchart for automatic generation of a test station model. Detailed Embodiments

[0030] Embodiment 1

[0031] A method for generating a test station model for a distributed system includes the following steps:

[0032] Step S1: Sort out the signal types of the test requirements of the product to be tested and count the signal types;

[0033] Step S2: Sort the signal types counted in step S1. The sorting method is that the signal types with higher performance index requirements are ranked first in the first priority; in the second priority, if the performance index is at a conventional level, the ones with more channel numbers are ranked first;

[0034] Step S3: Use the basic information of the test station to establish a test station model and screen the idle slots that meet the test requirements;

[0035] Step S4: Use the basic information of the resource board card to establish a resource board card model; screen the test resource board cards according to the sorted signal types, resource board card performance, and number of channels;

[0036] Step s5: Match the resource boards screened in step s4 with the idle slots that meet the test requirements in s3, complete the establishment of the test station model, and record it.

[0037] The signals in step s1 include: directional analog signals, discrete signals, and pulse signals; for the same signal type, different performance index requirements are recognized as different types of signals.

[0038] The number of channels of the p-th type of signal in step s1 is C P , and the performance parameter requirements are the set XN P , where p ∈ [1, M], and M represents the total number of signal types of the DUT.

[0039] In step s2, the performance index is at the conventional level, the one with more channels is ranked second in priority, and the number of test stations is T.

[0040] The basic information of the test station in step s3 includes: the test station number is i ∈ [1, T], and the number of test stations is T; the number of slots of the resource board of the i-th test station is S i ; the backplane bus type TB of the j-th slot of the i-th test station ij , one or more of; the size of the resource board that can be inserted into the i-th test station The resource board number Y placed in the j-th slot of the i-th test station ij = k.

[0041] In step s3, initialize the slot status Y of the test station ij = 0, starting from the first slot of the test station numbered 1, sequentially screen whether there are idle slots that meet the test requirements up to the last slot of the last test station. If there are, record the current test station number i and slot number j. If not, add a new test station.

[0042] The basic information of the resource board in step s4 includes: the resource board number k ∈ [1, Z], where Z is the total number of resources, and M represents the total number of signal types of the DUT; the backplane bus type one of; the size signal type; the number of channels ZC k = {ZC k1 , ZC k2 , ···, ZC kM}; the performance index set ZX k = {{ZX k1}, {ZX k2}, ···, {ZX kM}}; mark the occupancy situation by a certain test station, Flagk ∈ [1, T].

[0043] In step S4, the steps of screening test resource boards according to signal type, performance, and number of channels are as follows:

[0044] Step S4.1: Query the occupancy status of resource boards and initialize the occupancy status of resource boards so that all test resource boards are available;

[0045] Step S4.2: Find resource boards that meet the signal test requirements.

[0046] In step S4.1, initialize the occupancy status flag of resource boards k = 0, then all test resource boards are available.

[0047] In step S4.2, if the total number of channels ZCT for the p-th signal test requirement p is not less than the total number of channels C required by the product under test p , then match the next signal type. If the current signal is the last signal type to be matched, then complete and exit. If the total number of channels ZCT for the p-th signal test requirement p is less than the total number of channels C required by the product under test p , then determine whether there are any remaining resource boards. If not, new resource boards need to be added. If there are, then determine whether there is a resource board among the remaining resource boards that meets the test capabilities for the p-th signal. If there is, record the resource board number k. If not, then determine whether the un-covered channels need to be measured simultaneously. If not, then use switch multiplexing. If so, then add new resource boards. Repeat step S4.2 for the newly added resource boards.

[0048] In step S5, use the resource boards screened in step S4 to match the idle slots that meet the test requirements in S3, that is, complete the establishment of the test station model; and record that the resource board numbered k is occupied, record that the j-th slot of test station i is occupied by the resource board numbered k, update the number of resource boards that have been matched, and update the total number of channels of the matched resource boards that meet the test requirements for the p-th signal type.

[0049] The test station model established in step S5 is the test station number i determined in steps S1 to S5; the number of slots S in test station i determined by the initialization of test station in step S3 i and the backplane bus type TB of the j-th slot of the i-th test station ij ; the size TSize of the resource card that can be inserted into the i-th test station screened in step S3 i ; the resource board number Y placed in the j-th slot of the i-th test station calculated in step S4 ij , which is formed by combining four parts.

[0050] Embodiment 2

[0051] Step s1: Sort out the signal types required for the test of the product under test and count a total of M types of signals.

[0052] Furthermore, analog, discrete, and pulse signals with directionality have different types in different directions, and different performance index requirements for the same signal type are all considered to be different types of signals.

[0053] The number of channels of the pth signal is C P , the performance parameter requirements are set XN P , p∈[1,M].

[0054] When counting the total number of signals of the tested product, M=5, the signal type, number of channels, and performance indicators are shown in Table 1.

[0055] Table 1 Summary of test requirements for tested products

[0056] Serial number p Signal type Direction <![CDATA[Number of channels C p > <![CDATA[Performance Index XN p > 1 Analog signal Acquisition 2 12-bit, 1 Mbps, 0 - 28 V 2 Analog signal Acquisition 1 14-bit, 4 Mbps, 0 - 28 V 3 Discrete signal Excitation 10 28 V, 0 V 4 RS422 / 12 115200 bps 5 CAN / 2 500 kbps

[0057] Step s2: Sort the statistical signal types.

[0058] Furthermore, the first priority is the performance index, that is, the signal types with high performance index requirements are placed first;

[0059] Furthermore, the second priority is the number of channels, that is, if the performance indicator is at a normal level, the number of channels is higher.

[0060] Update Table 1 to get Table 2

[0061] Table 2 Sorted signal properties

[0062]

[0063] Step s3: Use the basic information of the test station to establish a test station model and select free slots that meet the test requirements.

[0064] The basic information of the test station shall include at least:

[0065] 1. The test station number is i∈[1,T], and the number of test stations is T;

[0066] 2. Number of resource board slots S at the i-th test station i ;

[0067] 3. Backplane bus type TB for the jth slot of the i-th test station ij , One or more of the following;

[0068] 4) Size of resource boards that can be plugged into the i-th test station

[0069] 5) The resource board number Y placed in the jth slot of the i-th test stationij = k.

[0070] Table 3 Test Station Model

[0071]

[0072] Initialize the slot status Y of the test station ij = 0. Starting from the first slot of test station number 1, sequentially screen whether there is an idle slot that meets the test requirements from the first slot of test station number 1 to the last slot of the last test station. If there is, record the current test station number i and slot j. If not, add a new test station.

[0073] Step s4: Establish a resource board model using the basic information of the resource board; screen the test resource boards according to the signal type, resource board performance, and number of channels.

[0074] The attributes of the resource board include:

[0075] 1) Resource board number k ∈ [1, Z], where Z is the total number of resources;

[0076] 2) Backplane bus type One of;

[0077] 3) Size

[0078] 4) Signal type

[0079] 5) Number of channels ZC k = {ZC k1 , ZC k2 , ···, ZC k(M+N)};

[0080] 6) Set of performance indicators ZX k = { {ZX k1}, {ZX k2}, ···, {ZX k(M+N)}};

[0081] 7) Mark whether it has been occupied by a certain test station, Flag k ∈ [1, T];

[0082] When the number of test stations is T = 2, the test station model is shown in Table 3, and the number of resource boards is Z = 5. The resource board model is shown in Table 4.

[0083] Table 4 Resource Board Model

[0084]

[0085] Screen the test resource boards according to the signal type, performance, and number of channels

[0086] Step s4.1: Query the occupancy status of the current status query resource board, and initialize the occupancy status of the resource board to make all test resource boards available;

[0087] Step s4.2: Find the remaining resource boards that meet the test requirements. For the p-th type of signal, by traversing the performance indicators of the resource boards and the performance indicators of the test requirements, that is, the requirement {ZX kp} satisfies the set XN P .

[0088] As Figure 1 shown is a design method for multiple test stations in a distributed test system.

[0089] Step s4.1: The signal type pointer is p, initialize p = 1 starting from the first one; initialize the slot status Y ij = 0, that is, all test station slots are available; initialize the occupancy status Flag k = 0, that is, all test resource boards are available; initialize the number of used resource boards kc = 0.

[0090] Step s4.2: Judge whether the total number of channels ZCT p of the already matched resource boards that meet the test requirements of the current p-th type of signal, if it is not less than the total number of channels required by the product under test, that is, ZCT p ≥ Cp, then match the next signal type p = p + 1. If the current signal is the last signal type to be matched, that is, p > M (M is the total number of signal types of the product under test), then complete and exit.

[0091] If the total number of channels ZCT p of the currently matched resource boards that meet the test requirements of the p-th type of signal is less than the number of channels C p required by the product under test, that is, ZCT p < C p , then determine whether there are any remaining resource boards. If not, new resource boards need to be added. If there are, judge whether there is a resource board that meets the test ability of the p-th type of signal among the remaining resource boards. If there is, record the resource board number k. If not, judge whether the uncovered channels need to be measured simultaneously. If not, use switch multiplexing. If so, add new resource boards, and repeat step s4.2 for the newly added resource boards.

[0092] Step s5: Match the resource boards that meet the signal test requirements found in step s4 with the idle slots that meet the tests found in step s3, that is, complete the establishment of the test station model; and record that the resource board numbered k is occupied, record that the j-th slot of test station i is occupied by the resource board numbered k, update the number of already matched resource boards, and update the total number of channels of the already matched resource boards that meet the test requirements of the p-th type of signal.

[0093] As shown in Table 5:

[0094] Table 5 Final Test Station Model

[0095]

[0096] The finally generated test station model is as follows:

[0097] 1. The test station number i determined in steps s1 - s5.

[0098] 2. The number of resource board card slots S that can be placed in test station i determined during the initialization of the test station in step s3 i .

[0099] 3. The backplane bus type TB of the j-th slot of the i-th test station determined during the initialization of the test station in step s3 ij .

[0100] 4. The size TSize of the resource card that can be inserted into the i-th test station determined during the initialization of the test station in step s3 i .

[0101] 5. The resource board card number Y placed in the j-th slot of the i-th test station determined in step s4 ij .

Claims

1. A test station model generation method for a distributed system, characterized in that: The following steps are involved: Step s1: sort out the signal types required for the product under test and count the signal types; Step s2: sorting the signal types counted in step s1, with the first priority being that the signal types with high performance index requirements are placed at the front; the second priority being that the signal types with more channels are placed at the front if the performance index is at a normal level; Step s3: Use the basic information of the test station to establish a test station model and select free slots that meet the test requirements; Step s4: Establish a resource board model using the basic information of the resource board; select the test resource board according to the sorted signal type, resource board performance, and channel number; Step s5: Use the resource boards selected in step s4 to match the free slots that meet the test requirements in step s3, and complete the establishment and recording of the test station model.

2. The method for generating a test station model for a distributed system according to claim 1, characterized in that: The signals in step s1 include: directional analog signals, discrete signals, and pulse signals; the same signal type but different performance index requirements are recognized as different types of signals.

3. The method for generating a test station model for a distributed system according to claim 1, characterized in that: The number of channels of the pth signal in step s1 is C P , the performance parameter requirements are set XN P , p∈[1,M], M represents the total number of signal types of the object under test.

4. The method for generating a test station model for a distributed system according to claim 1, characterized in that: In step s2, the performance index is at a normal level, the channel with the largest number of channels is ranked second in priority, and the number of test stations is T.

5. The method for generating a test station model for a distributed system according to claim 1, characterized in that: The basic information of the test station in step s3 includes: the test station number is i∈[1,T], the number of test stations is T; the number of resource board slots S of the i-th test station i ; Backplane bus type TB for the jth slot of the i-th test station ij , One or more of the following; The size of the resource board that can be plugged into the i-th test station The resource board number Y placed in the jth slot of the i-th test station ij =k.

6. The method for generating a test station model for a distributed system according to claim 1, characterized in that: The slot status Y of the test station initialized in step s3 ij =0, starting from the first slot of the test station numbered 1 to the last slot of the last test station, sequentially screen whether there is an idle slot that meets the test requirements. If there is, record the current test station number i and slot j. If not, add a new test station.

7. The method for generating a test station model for a distributed system according to claim 1, characterized in that: The basic information of the resource board in step s4 includes: the resource board number k∈[1,Z], where Z is the total number of resources and M represents the total number of signal types of the measured object; the backplane bus type one of; size Signal type; Channel number ZC k ={ZC k1 ,ZC k2 ,···,ZC kM }; Performance indicator set ZX k ={{ZX k1 },{ZX k2 },···,{ZX kM }}; Mark the occupancy of a test station, Flagk∈[1,T].

8. The method for generating a test station model for a distributed system according to claim 1, characterized in that: The steps of screening the test resource boards according to the signal type, performance and number of channels in step s4 are as follows: Step s4.1: Query the resource board occupancy status and initialize the resource board occupancy status to make all resource boards available; Step s4.2: Find a resource board that meets the signal test requirements.

9. The method for generating a test station model for a distributed system according to claim 8, characterized in that: In step s4.1, the resource board occupancy flag is initialized. k =0, all test resource boards are available.

10. The method for generating a test station model for a distributed system according to claim 8, characterized in that: In step s4.2, if the total number of channels ZCT required for the p-th signal test is p Not less than the total number of channels required by the product under test C p , then match the next signal type. If the current signal is the last signal type to be matched, exit. If the total number of channels required by the pth signal test is ZCT p Less than the total number of channels required by the product under test C p , then determine whether there are any remaining resource boards. If not, add a new resource board; if yes, determine whether there are any remaining resource boards that meet the test capability of the pth signal. If yes, record the resource board number k. If not, determine whether the uncovered channels need to be measured simultaneously. If not, use switch multiplexing. If necessary, add a new resource board. Repeat step s4.2 with the added resource board.

11. The method for generating a test station model for a distributed system according to claim 1, characterized in that: The corresponding step s5 uses the resource boards screened in step s4 to match the free slots that meet the test requirements in s3, thereby completing the establishment of the test station model; and records that the resource board numbered k is occupied, records that the j slot of the test station i is occupied by the resource board numbered k, updates the number of matched resource boards to, and updates the total number of channels of the matched resource boards that meet the test requirements of the pth signal type.

12. The method for generating a test station model for a distributed system according to claim 1, characterized in that: The test station model established in step s5 is the test station number i determined in steps s1 to s5; the number of resource board slots S in the test station i determined by the test station initialization in step s3 i and the jth slot backplane bus type TB of the i-th test station ij ; Step s3 screened the size of the pluggable resource card of the i-th test station TSize i Step s4 calculates the resource board number Y of the jth slot of the i-th test station ij , the test station model is formed by combining four parts.

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