Voltage sinusoidal waveform differential sampling method and device based on PJVS, terminal equipment and storage medium

Abstract

The invention discloses a PJVS-based voltage sinusoidal waveform differential sampling method and device, terminal equipment and a storage medium. The method comprises the following steps: acquiring a sinusoidal voltage signal to be measured and a sinusoidal step wave quantum voltage signal; the sine step wave quantum voltage signal is generated based on PJVS; obtaining a difference value data array by subtracting adjacent sampling data of a sampling data array obtained by superposing the sinusoidal voltage signal to be measured and the sinusoidal step wave quantum voltage signal; according to the difference value data array, judging the first switching moment and the initial quantum voltage step number of the quantum voltage step of the sine type step wave quantum voltage signal; and according to the first switching moment of the quantum voltage step and the number of the initial quantum voltage step, performing subtraction operation on a design level value corresponding to the sine type step wave quantum voltage signal to obtain target sine voltage waveform data, and fitting to obtain a finally calibrated sine voltage signal. According to the invention, the accuracy of voltage waveform calibration is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of high-frequency signal processing and sampling, and particularly to a differential sub-sampling method, device, terminal device and storage medium for voltage sine waveform based on PJVS. Background Art

[0002] The programmable Josephson voltage standard (PJVS) can output a sufficiently precise quantized stepped-wave AC voltage signal waveform according to the shape of the AC voltage waveform to be measured or calibrated, which can be a sine voltage signal or other periodic AC voltage signals. However, due to the influence of the transient process and Gibbs effect, there are fluctuations at the beginning and end of each quantum voltage step in the stepped-wave quantum voltage signal output by PJVS, and it no longer has quantum precision. Therefore, PJVS is only applicable to the measurement and calibration of low-frequency AC voltage signals. To measure and calibrate high-frequency AC voltage signals using PJVS, currently, the high-frequency sine voltage signal to be measured is superimposed on the low-frequency stepped-wave quantum voltage standard signal output by PJVS, and data sampling is performed on the superimposed signal at a specified moment. Currently, in the specific implementation of this method, the precise trigger acquisition moment for collecting the superimposed voltage signal using a digital-to-analog converter needs to be known. The prior art relies on the ideal trigger moment, but there is a lack of precise quantization means for the sampling moment in engineering implementation, resulting in limited high-frequency calibration accuracy. Summary of the Invention

[0003] Embodiments of the present invention provide a differential sub-sampling method, device, terminal device and storage medium for voltage sine waveform based on PJVS, which can effectively solve the problem that the prior art needs to know the acquisition moment of the superimposed voltage signal and cannot automatically measure and calibrate the voltage signal.

[0004] An embodiment of the present invention provides a differential sub-sampling method for voltage sine waveform based on PJVS, including:

[0005] Obtain a sine voltage signal to be measured and a sine-type stepped-wave quantum voltage signal; wherein, the sine-type stepped-wave quantum voltage signal is generated based on PJVS;

[0006] Superimpose the sine voltage signal to be measured and the sine-type stepped-wave quantum voltage signal to obtain a sampling data array;

[0007] Calculate the difference between two adjacent sampling data in the sampling data array to obtain a difference data array;

[0008] Judge the first switching moment of the quantum voltage step of the sine-type stepped-wave quantum voltage signal and the starting quantum voltage step number according to the difference data array;

[0009] Perform a subtraction operation on the designed level value corresponding to the sinusoidal stepped-wave quantum voltage signal according to the first switching moment of the quantum voltage step and the starting quantum voltage step number to obtain the target sinusoidal voltage waveform data after preliminary calibration;

[0010] According to the phase relationship of the target sinusoidal voltage waveform data, fit the target sinusoidal voltage waveform data to obtain the sinusoidal voltage signal after final calibration.

[0011] Further, the ratio of the frequency of the sinusoidal voltage signal to be measured to the frequency of the sinusoidal stepped-wave quantum voltage signal is a positive integer; the amplitude of the sinusoidal voltage signal to be measured is the same as the amplitude of the sinusoidal stepped-wave quantum voltage signal.

[0012] Further, superimpose the sinusoidal voltage signal to be measured and the sinusoidal stepped-wave quantum voltage signal to obtain a sampling data array, including:

[0013] Superimpose the sinusoidal voltage signal to be measured and the sinusoidal stepped-wave quantum voltage signal to obtain a superimposed signal;

[0014] According to the preset sampling frequency and the preset total number of acquisition samples, collect the superimposed signal to obtain a sampling data array.

[0015] Further, judging the first switching moment of the quantum voltage step of the sinusoidal stepped-wave quantum voltage signal according to the difference data array includes:

[0016] Calculate the standard deviation according to the difference data in the difference data array;

[0017] Set a judgment threshold according to the standard deviation;

[0018] Traverse the difference data array, take the difference data greater than the judgment threshold in the difference data array as the target difference, and form a first array according to the target difference;

[0019] Perform a modulo operation according to each target difference in the first array and the preset total number of quantum voltage step samplings to obtain a number of remainders, and form a second array according to the number of remainders;

[0020] Calculate the average value according to the remainders in the second array, and use the average value as the sampling data number corresponding to the first switching moment of the quantum voltage step;

[0021] According to the sampling data number and the preset sampling frequency, calculate the first switching moment of the quantum voltage step.

[0022] Further, determining the starting quantum voltage step number of the sinusoidal stepped-wave quantum voltage signal according to the difference data array includes:

[0023] Calculating an approximate value of the quantum voltage step level according to the difference data array and the amplitude of the sinusoidal voltage signal to be measured;

[0024] Taking the designed level values of all quantum voltage steps within the fundamental period corresponding to the sinusoidal stepped-wave quantum voltage signal as a third array;

[0025] Comparing the approximate value of the quantum voltage step level with the designed level values in the third array to determine the starting quantum voltage step number.

[0026] Further, performing a subtraction operation on the designed level values corresponding to the sinusoidal stepped-wave quantum voltage signal according to the first switching moment of the quantum voltage step and the starting quantum voltage step number to obtain the target sinusoidal voltage waveform data after preliminary calibration, including:

[0027] Determining the amplitude of the level change when adjacent quantum voltage steps are switched according to the first switching moment of the quantum voltage step and the starting quantum voltage step number;

[0028] Filtering the sampling data in the sampling data array according to the amplitude of the level change to obtain the sampling data in the stable region corresponding to the quantum voltage step;

[0029] Subtracting the designed level values corresponding to the sinusoidal stepped-wave quantum voltage signal from the sampling data in the stable region corresponding to the quantum voltage step to obtain the target sinusoidal voltage waveform data after preliminary calibration.

[0030] Further, fitting the target sinusoidal voltage waveform data according to the phase relationship of the target sinusoidal voltage waveform data to obtain the finally calibrated sinusoidal voltage signal, including:

[0031] Stitching the target sinusoidal voltage waveform data according to the phase relationship of the target sinusoidal voltage waveform data to obtain the stitched sinusoidal voltage signal;

[0032] Fitting the stitched sinusoidal voltage signal to obtain the finally calibrated sinusoidal voltage signal.

[0033] As an improvement of the above solution, another embodiment of the present invention correspondingly provides a voltage sinusoidal waveform differential sub-sampling device based on PJVS, including:

[0034] A signal acquisition module, configured to acquire the sinusoidal voltage signal to be measured and the sinusoidal stepped-wave quantum voltage signal; wherein, the sinusoidal stepped-wave quantum voltage signal is generated based on PJVS;

[0035] A signal superposition module, configured to superpose the sinusoidal voltage signal to be measured and the sinusoidal stepped-wave quantum voltage signal to obtain a sampling data array;

[0036] A difference data determination module, configured to subtract two adjacent sampling data in the sampling data array to obtain a difference data array;

[0037] A quantum voltage step determination module, configured to determine the first switching moment of the quantum voltage step of the sinusoidal stepped-wave quantum voltage signal and the starting quantum voltage step number according to the difference data array;

[0038] A preliminary calibration module, configured to perform a subtraction operation on the designed level value corresponding to the sinusoidal stepped-wave quantum voltage signal according to the first switching moment of the quantum voltage step and the starting quantum voltage step number to obtain the target sinusoidal voltage waveform data after preliminary calibration;

[0039] A fitting calibration module, configured to fit the target sinusoidal voltage waveform data according to the phase relationship of the target sinusoidal voltage waveform data to obtain the finally calibrated sinusoidal voltage signal.

[0040] Another embodiment of the present invention provides a terminal device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor. When the processor executes the computer program, it implements a voltage sinusoidal waveform differential sub-sampling method based on PJVS as described in the above embodiment.

[0041] Another embodiment of the present invention provides a computer-readable storage medium. The computer-readable storage medium includes a stored computer program. When the computer program runs, it controls the device where the computer-readable storage medium is located to execute a voltage sinusoidal waveform differential sub-sampling method based on PJVS as described in the above embodiment.

[0042] By implementing the present invention, at least the following beneficial effects are achieved:

[0043] The present invention provides a differential sub-sampling method, device, terminal device and storage medium for voltage sine waveform based on PJVS. The method can superimpose a sine voltage signal to be measured and a sine-type stepped wave quantum voltage signal generated based on PJVS. By analyzing the subsequent difference data array, the first switching moment of the quantum voltage step and the starting quantum voltage step number can be accurately judged. On this basis, subtraction operations are performed on the designed level values corresponding to the sine-type stepped wave quantum voltage signal, which can effectively eliminate systematic errors such as fixed deviation and noise interference in the measurement. The fitting based on the phase relationship can better capture the characteristics of the signal and reduce measurement errors caused by factors such as signal distortion and noise, thereby achieving high-precision measurement and calibration. Without the need to know the precise ADC sampling trigger moment conditions, the number of the starting quantum voltage step and the first switching moment of the quantum voltage step can be automatically and accurately determined, and then the measurement and calibration of high-frequency sine voltage signals can be effectively completed and realized, and the sampling of sine voltage signals can be completed with improved high-frequency calibration accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 is a schematic flowchart of a differential sub-sampling method for voltage sine waveform based on PJVS provided by an embodiment of the present invention;

[0045] Figure 2 is a flowchart of adaptive differential sub-sampling of high-frequency sine voltage waveform provided by an embodiment of the present invention;

[0046] Figure 3 is a schematic diagram of a superimposed signal provided by an embodiment of the present invention;

[0047] Figure 4 is a waveform schematic diagram of the difference result of adjacent sampling numbers in a sampling data array provided by an embodiment of the present invention;

[0048] Figure 5 is a schematic diagram of the high-frequency sine voltage waveform after final calibration provided by an embodiment of the present invention;

[0049] Figure 6 is a schematic structural diagram of a differential sub-sampling device for voltage sine waveform based on PJVS provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0050] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0051] SeeFigure 1 , which is a schematic flowchart of a voltage sine waveform differential sub-sampling method based on PJVS provided by an embodiment of the present invention, including:

[0052] S1. Obtain the sine voltage signal to be measured and the sine-type stepped wave quantum voltage signal; wherein, the sine-type stepped wave quantum voltage signal is generated based on PJVS;

[0053] Specifically, the ratio of the frequency of the sine voltage signal to be measured to the frequency of the sine-type stepped wave quantum voltage signal is a positive integer; the amplitude of the sine voltage signal to be measured is the same as the amplitude of the sine-type stepped wave quantum voltage signal.

[0054] In a preferred embodiment of the present invention, the sine voltage signal to be measured is a high-frequency sine voltage signal with an amplitude of V p and a frequency of f sine ; the amplitude of the sine-type stepped wave quantum voltage signal output by PJVS is V p and a frequency of f PJVS . The ratio of the frequency f sine to the frequency f PJVS should be a positive integer. Essentially, there is a multiple relationship between the frequencies of the two signals, which is to enable the high-frequency sine voltage signal to repeat continuously within one cycle of PJVS.

[0055] S2. Superimpose the sine voltage signal to be measured and the sine-type stepped wave quantum voltage signal to obtain a sampling data array;

[0056] Specifically, superimposing the sine voltage signal to be measured and the sine-type stepped wave quantum voltage signal to obtain a sampling data array includes:

[0057] Superimpose the sine voltage signal to be measured and the sine-type stepped wave quantum voltage signal to obtain a superimposed signal;

[0058] Collect the superimposed signal according to the preset sampling frequency and the preset total number of collected samples to obtain a sampling data array.

[0059] In a preferred embodiment of the present invention, a high-frequency sine voltage signal (sine voltage signal to be measured) with an amplitude of V p and a frequency of f sine output by PJVS is superimposed and synthesized with a sine-type stepped wave quantum voltage signal with an amplitude of V p and a frequency of f PJVS to obtain a superimposed signal; set the sampling frequency f s (preset sampling frequency) and the preset total number of collected samples N of the analog-to-digital converter, and perform data collection on the above superimposed signal to obtain a sampling data array U.

[0060] S3. Calculate the difference between two adjacent sampling data in the sampling data array to obtain a difference data array;

[0061] In a preferred embodiment of the present invention, based on the sampling data array U of the superimposed signal, calculate the difference between two adjacent sampling data in this array, i.e., U, to obtain the corresponding difference data array D.

[0062] S4. Determine the first switching moment of the quantum voltage step of the sinusoidal stepped-wave quantum voltage signal and the starting quantum voltage step number according to the difference data array;

[0063] Specifically, determining the first switching moment of the quantum voltage step of the sinusoidal stepped-wave quantum voltage signal according to the difference data array includes:

[0064] Calculate the standard deviation based on the difference data in the difference data array;

[0065] Set a judgment threshold according to the standard deviation;

[0066] Traverse the difference data array, take the difference data greater than the judgment threshold in the difference data array as the target difference, and form a first array according to the target difference;

[0067] Perform a modulo operation according to each target difference in the first array and the preset total number of samples of the quantum voltage step to obtain several remainders, and form a second array according to the several remainders;

[0068] Calculate the average value according to the remainders in the second array, and use the average value as the sampling data number corresponding to the first switching moment of the quantum voltage step;

[0069] Calculate the first switching moment of the quantum voltage step according to the sampling data number and the preset sampling frequency.

[0070] In a preferred embodiment of the present invention, the first array represents an array composed of difference data greater than the judgment threshold in the difference data array; the second array represents an array composed of the remainders of the target difference in the first array and the total number of samples of the quantum voltage step. The preset total number of samples of the quantum voltage step N step refers to the total number of sampling data on one quantum voltage step, and its calculation formula is: where T PJVS refers to the fundamental period of the PJVS output sinusoidal stepped-wave quantum voltage signal; M is the number of quantum voltage steps in one period of the PJVS output sinusoidal stepped-wave quantum voltage signal. The first switching moment t of the quantum voltage step j, which refers to the first switching moment of the quantum voltage steps in the sinusoidal stepped-wave quantum voltage signal after the data acquisition of the superimposed signal starts. Perform a difference operation on adjacent data in the sampling data array U of the superimposed signal to obtain a difference data array D (the array length is N - 1), calculate the standard deviation based on the difference data in the difference data array, and then set a judgment threshold D according to the standard deviation up . Traverse the difference data array D, regard the difference data in the difference data array that is greater than the judgment threshold as the target difference, and form a first array according to the target difference, that is, filter out the difference sampling data that exceeds the judgment threshold as the target difference to form a first array D over ; then according to the first array D over and the preset total number of quantum voltage step samplings N step , perform a modulo operation to obtain a number of remainders, and form a second array X according to the number of remainders, that is, the second array X: X(i) = mod(D over (i), N step ). The meaning of this formula is: divide each element in D over by N step , take the remainder and assign it to X(i). Calculate the average value X according to the remainders in the second array X j , and use the average value X j as the sampling data number corresponding to the first switching moment of the quantum voltage step. The mathematical relationship between X j and the first switching moment t of the quantum voltage step j is: Then, according to the sampling data number and the preset sampling frequency f s , calculate the first switching moment t of the quantum voltage step j .

[0071] Preferably, determining the starting quantum voltage step number of the sinusoidal stepped-wave quantum voltage signal according to the difference data array includes:

[0072] Calculate the approximate value of the quantum voltage step level according to the difference data array and the amplitude of the sinusoidal voltage signal to be measured;

[0073] Take the designed level values of all quantum voltage steps within the fundamental wave period corresponding to the sinusoidal stepped-wave quantum voltage signal as the third array;

[0074] Compare the approximate value of the quantum voltage step level with the designed level values in the third array to determine the starting quantum voltage step number.

[0075] In a preferred embodiment of the present invention, the third array represents a set of designed level values of all quantum voltage steps within the fundamental period corresponding to the sinusoidal stepped-wave quantum voltage signal. The starting quantum voltage step number refers to the number j of the starting quantum voltage step corresponding to the moment when the trigger for the analog-to-digital converter to perform sampling is determined. First, according to the difference data array and the amplitude of the sinusoidal voltage signal to be measured, the approximate value V1 of the (j + 1)-th quantum voltage step level and the approximate value V2 of the (j + 2)-th quantum voltage step level are calculated, that is where max(U) represents taking the maximum value of the array U; V p is the amplitude of the high-frequency sinusoidal voltage signal (the sinusoidal voltage signal to be measured). Then, all the designed level values of the quantum voltage steps within one fundamental period of the PJVS output sinusoidal stepped-wave quantum voltage signal are used to form the third array V. Next, by comparing V1 and V2 with the elements in the third array V of the set quantum voltage step level values, as shown in the following formula, finally, the starting quantum voltage step number j can be locked:

[0076] S5. Perform a subtraction operation on the designed level values corresponding to the sinusoidal stepped-wave quantum voltage signal according to the first switching moment of the quantum voltage step and the starting quantum voltage step number to obtain the target sinusoidal voltage waveform data after preliminary calibration;

[0077] Specifically, performing a subtraction operation on the designed level values corresponding to the sinusoidal stepped-wave quantum voltage signal according to the first switching moment of the quantum voltage step and the starting quantum voltage step number to obtain the target sinusoidal voltage waveform data after preliminary calibration includes:

[0078] Determine the amplitude of the level change when switching between adjacent quantum voltage steps according to the first switching moment of the quantum voltage step and the starting quantum voltage step number;

[0079] Screen the sampling data in the sampling data array according to the amplitude of the level change to obtain the sampling data in the stable region corresponding to the quantum voltage step;

[0080] Subtract the designed level values corresponding to the sinusoidal stepped-wave quantum voltage signal from the sampling data in the stable region corresponding to the quantum voltage step to obtain the target sinusoidal voltage waveform data after preliminary calibration.

[0081] In a preferred embodiment of the present invention, the amplitude of the level change ΔV(m) characterizes the amplitude of the level change when switching from the m-th quantum voltage step to the (m + 1)-th quantum voltage step. Take the amplitude of the level change as the voltage limit V limit Screen the sampling data in the sampling data array, V limit (m) = ΔV(m)

[0082] Among them, V limit (m) represents the limit range corresponding to the m-th quantum voltage step. The sampled data in the steady-state region on the quantum voltage step refers to the remaining sampled data after removing the sampled data affected by the transient process and Gibbs effect on each quantum voltage step. Subtracting the sampled data in the steady-state region on the corresponding quantum voltage step from the designed level value of the corresponding quantum voltage step in the sinusoidal stepped-wave quantum voltage signal, the target sinusoidal voltage waveform data after preliminary calibration is obtained, that is, the high-frequency sinusoidal voltage waveform data with PJVS calibration marks.

[0083] S6. According to the phase relationship of the target sinusoidal voltage waveform data, fit the target sinusoidal voltage waveform data to obtain the finally calibrated sinusoidal voltage signal.

[0084] Preferably, according to the phase relationship of the target sinusoidal voltage waveform data, fitting the target sinusoidal voltage waveform data to obtain the finally calibrated sinusoidal voltage signal includes:

[0085] According to the phase relationship of the target sinusoidal voltage waveform data, splice the target sinusoidal voltage waveform data to obtain the spliced sinusoidal voltage signal;

[0086] Fit the spliced sinusoidal voltage signal to obtain the finally calibrated sinusoidal voltage signal.

[0087] In a preferred embodiment of the present invention, by splicing according to the phase relationship, the sinusoidal voltage waveform data of different parts can be accurately connected, avoiding waveform interruption or discontinuity, thereby improving the integrity and continuity of the signal, making the spliced sinusoidal voltage signal closer to the true sine wave. Fitting the spliced signal can further optimize the shape of the signal and reduce errors and fluctuations caused by data acquisition, transmission, or other factors. The fitting process can find the ideal sine curve that best represents these data according to certain algorithms and criteria, thereby improving the accuracy and stability of the signal. After splicing and fitting processing, the finally calibrated sinusoidal voltage signal is smoother and more regular, and has stronger anti-interference ability compared to the original data that may have noise or interference.

[0088] In another preferred embodiment of the present invention, as Figure 2 shown, first superimpose the measured high-frequency sinusoidal voltage signal with an amplitude of 0.849107V and a frequency of 100kHz and the sinusoidal stepped-wave quantum voltage signal with an amplitude of 0.849107V and a frequency of 1kHz output by PJVS to obtain a superimposed signal, and then set the sampling frequency of the digital-to-analog converter to 4MH Z, 40000 sample data are collected. The sampling point number corresponding to the trigger moment is defined as 156. Based on the collected sampling data U (with a length of 4000), the first switching moment of the quantum voltage step is determined to be 11.5 μs, and its actual quantum step number is 2. Then, the array U is screened to obtain the sampling data in the stable region on the corresponding quantum voltage step, and the array U is obtained. f， Then subtract the designed level value of the corresponding quantum voltage step to obtain the high-frequency sine voltage waveform data with PJVS calibration traces, and splice them according to the phase relationship to finally complete the measurement and calibration of the measured signal. The superimposed signal of the measured high-frequency sine voltage signal with an amplitude of 0.849107 V and a frequency of 100 kHz and the sine-type stepped wave quantum voltage signal with an amplitude of 0.849107 V and a frequency of 1 kHz output by PJVS is as Figure 3 (a) shown, and the detailed diagram of the superimposed signal is as Figure 3 (b) shown, where black represents the sine-type stepped wave quantum voltage signal output by PJVS, the red line represents the high-frequency sine wave, and the green line represents the synthesized waveform, that is, the superimposed signal waveform. When the sampling data number is set to 156, the waveform plotted from the difference between adjacent sampling data in the superimposed voltage signal sampling data array obtained under the trigger acquisition condition is as Figure 4 (a) shown, and the detailed diagram is as Figure 4 (b) shown. Figure 4 The first glitch in (a) corresponds to the first switching of the quantum voltage step. Figure 5 (a) is the high-frequency sine voltage waveform with PJVS calibration traces obtained by splicing and fitting according to the phase relationship of the measured high-frequency sine voltage. Figure 5 (b) is the waveform of the corresponding fitting residual.

[0089] By implementing this embodiment, the sinusoidal voltage signal to be measured is superimposed on the sinusoidal stepped-wave quantum voltage signal generated based on PJVS. Through subsequent analysis of the difference data array, the first switching moment of the quantum voltage step and the starting quantum voltage step number can be accurately judged. On this basis, subtraction operations are performed on the designed level values corresponding to the sinusoidal stepped-wave quantum voltage signal, which can effectively eliminate systematic errors such as fixed bias and noise interference in the measurement. The fitting based on the phase relationship can better capture the characteristics of the signal, reduce measurement errors caused by factors such as signal distortion and noise, thereby achieving high-precision measurement and calibration. Without the need to know the precise analog-to-digital converter (ADC) sampling trigger moment conditions, the number of the starting quantum voltage step and the first switching moment of the quantum voltage step can be automatically and accurately determined, and then the measurement and calibration of the high-frequency sinusoidal voltage signal can be effectively completed and achieved. Under the condition of improved high-frequency calibration accuracy, the sampling of the sinusoidal voltage signal is completed. The sinusoidal stepped-wave voltage signal output by PJVS is superimposed on the high-frequency sinusoidal voltage signal to be measured, and then the obtained superimposed signal is sampled at equal intervals at any moment; based on the sampling data, the first switching moment of the quantum voltage step and the number of the starting quantum voltage step are determined; next, the voltage limit value and the sampling data in the stable region on the quantum voltage step are determined to complete the accurate screening of the valid data in the sampling data array of the superimposed signal; then, the sampling data corresponding to the stable region on each quantum voltage step that meets the voltage limit value is subtracted from the designed level value of the corresponding quantum voltage step to restore the waveform data of the high-frequency sinusoidal signal, and these data are spliced and fitted according to the phase relationship of the high-frequency sinusoidal voltage waveform, so as to realize the measurement and calibration of the high-frequency sinusoidal voltage signal based on PJVS. The results of simulation tests and physical experiments both show that this embodiment can automatically and accurately determine the number of the starting quantum voltage step and the first switching moment of the quantum voltage step without the need to know the precise analog-to-digital converter (ADC) sampling trigger moment conditions, and then the measurement and calibration of the high-frequency sinusoidal voltage signal can be effectively completed and achieved.

[0090] See Figure 6 , which is a schematic structural diagram of a voltage sine waveform differential sampling device based on PJVS provided by an embodiment of the present invention, includes:

[0091] A signal acquisition module for acquiring the sinusoidal voltage signal to be measured and the sinusoidal stepped-wave quantum voltage signal; wherein, the sinusoidal stepped-wave quantum voltage signal is generated based on PJVS;

[0092] A signal superimposing module for superimposing the sinusoidal voltage signal to be measured and the sinusoidal stepped-wave quantum voltage signal to obtain a sampling data array;

[0093] A difference data determination module, configured to obtain a difference data array by taking the difference between two adjacent sampling data in the sampling data array;

[0094] A quantum voltage step determination module, configured to determine the first switching moment of the quantum voltage step of the sinusoidal stepped wave quantum voltage signal and the starting quantum voltage step number according to the difference data array;

[0095] A preliminary calibration module, configured to perform a subtraction operation on the designed level value corresponding to the sinusoidal stepped wave quantum voltage signal according to the first switching moment of the quantum voltage step and the starting quantum voltage step number, to obtain the target sinusoidal voltage waveform data after preliminary calibration;

[0096] A fitting calibration module, configured to fit the target sinusoidal voltage waveform data according to the phase relationship of the target sinusoidal voltage waveform data, to obtain the finally calibrated sinusoidal voltage signal.

[0097] The present invention provides a voltage sine waveform differential sub-sampling device based on PJVS. According to the signal acquisition module, a sine voltage signal to be measured and a sine-type stepped wave quantum voltage signal are acquired; wherein, the sine-type stepped wave quantum voltage signal is generated based on PJVS; through the signal superposition module, the sine voltage signal to be measured and the sine-type stepped wave quantum voltage signal are superposed to obtain a sampling data array; in the difference data determination module, the difference between two adjacent sampling data in the sampling data array is calculated to obtain a difference data array; in the quantum voltage step determination module, according to the difference data array, the first switching moment of the quantum voltage step of the sine-type stepped wave quantum voltage signal and the starting quantum voltage step number are judged; then in the preliminary calibration module, according to the first switching moment of the quantum voltage step and the starting quantum voltage step number, a subtraction operation is performed on the designed level value corresponding to the sine-type stepped wave quantum voltage signal to obtain the target sine voltage waveform data after preliminary calibration; finally in the fitting calibration module, according to the phase relationship of the target sine voltage waveform data, the target sine voltage waveform data is fitted to obtain the finally calibrated sine voltage signal. By superposing the sine voltage signal to be measured and the sine-type stepped wave quantum voltage signal generated based on PJVS, and through subsequent analysis of the difference data array, the first switching moment of the quantum voltage step and the starting quantum voltage step number can be accurately judged. On this basis, a subtraction operation is performed on the designed level value corresponding to the sine-type stepped wave quantum voltage signal, which can effectively eliminate systematic errors such as fixed bias and noise interference in the measurement. The fitting based on the phase relationship can better capture the characteristics of the signal and reduce the measurement errors caused by factors such as signal distortion and noise, thereby realizing high-precision measurement and calibration. Without the need to know the precise ADC sampling trigger moment conditions, the starting quantum voltage step number and the first switching moment of the quantum voltage step can be automatically and accurately determined, and then the measurement and calibration of the high-frequency sine voltage signal can be effectively completed and realized. Under the condition of improving the high-frequency calibration accuracy, the sampling of the sine voltage signal is completed.

[0098] It should be noted that the device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. In addition, in the drawings of the device embodiments provided by the present invention, the connection relationship between the modules indicates that they have a communication connection, which can be specifically realized as one or more communication buses or signal lines. Those of ordinary skill in the art can understand and implement without creative efforts.

[0099] Those skilled in the art can clearly understand that for the sake of convenience and brevity, the specific working process of the above-described device can refer to the corresponding process in the foregoing method embodiment, and will not be elaborated herein.

[0100] Another embodiment of the present invention further provides a terminal device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor. When the processor executes the computer program, it implements a method for differential sub-sampling of voltage sine waveforms based on PJVS as described in the above embodiments. The terminal device can be a computing device such as a desktop computer, a notebook, a palm computer, and a cloud server. The terminal device may include, but is not limited to, a processor and a memory.

[0101] The processor may be a Central Processing Unit (CPU), or may also be other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc. The processor is the control center of the terminal device, connecting various parts of the entire terminal device through various interfaces and lines.

[0102] The memory can be used to store the computer program. The processor realizes various functions of the terminal device by running or executing the computer program stored in the memory and calling the data stored in the memory. The memory may mainly include a program storage area and a data storage area. Among them, the program storage area can store an operating system, application programs required for at least one function, etc.; the data storage area can store data created according to the use of the mobile phone, etc. In addition, the memory may include high-speed random access memory, and may also include non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) card, a Flash Card, at least one magnetic disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0103] Another embodiment of the present invention provides a computer-readable storage medium, which includes a stored computer program. When the computer program runs, it controls the device where the computer-readable storage medium is located to execute a voltage sine waveform differential sub-sampling method based on PJVS described in the above embodiment.

[0104] The storage medium is a computer-readable storage medium, and the computer program is stored in the computer-readable storage medium. When the computer program is executed by a processor, the steps of the above method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, executable file or some intermediate form, etc. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electrical carrier signal, telecommunication signal, and software distribution medium, etc.

[0105] The above is the preferred embodiment of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the principle of the present invention, several improvements and refinements can be made, and these improvements and refinements are also regarded as the protection scope of the present invention.

Claims

1. A voltage sinusoidal waveform differential subsampling method based on PJVS, characterized in that: include: Acquire a sinusoidal voltage signal to be measured and a sinusoidal step wave quantum voltage signal; wherein the sinusoidal step wave quantum voltage signal is generated based on PJVS; Superimposing the sinusoidal voltage signal to be measured and the sinusoidal step wave quantum voltage signal to obtain a sampling data array; Subtracting two adjacent sampling data in the sampling data array to obtain a difference data array; Determine the first switching time of the quantum voltage step of the sinusoidal step wave quantum voltage signal and the starting quantum voltage step number according to the difference data array; According to the first switching moment of the quantum voltage step and the starting quantum voltage step number, a design level value corresponding to the sinusoidal step wave quantum voltage signal is subtracted to obtain target sinusoidal voltage waveform data after preliminary calibration; The target sinusoidal voltage waveform data is fitted according to the phase relationship of the target sinusoidal voltage waveform data to obtain a final calibrated sinusoidal voltage signal.

2. A voltage sinusoidal waveform differential sub-sampling method based on PJVS as claimed in claim 1, characterized in that: The ratio of the frequency of the sinusoidal voltage signal to be measured to the frequency of the sinusoidal step wave quantum voltage signal is a positive integer; the amplitude of the sinusoidal voltage signal to be measured is the same as the amplitude of the sinusoidal step wave quantum voltage signal.

3. A voltage sinusoidal waveform differential sub-sampling method based on PJVS as claimed in claim 2, characterized in that: The sinusoidal voltage signal to be measured and the sinusoidal step wave quantum voltage signal are superimposed to obtain a sampling data array, including: Superimposing the sinusoidal voltage signal to be measured and the sinusoidal step wave quantum voltage signal to obtain a superimposed signal; The superimposed signal is sampled according to a preset sampling frequency and a preset total number of sample collections to obtain a sampling data array.

4. A voltage sinusoidal waveform differential sub-sampling method based on PJVS as claimed in claim 3, characterized in that: Determining the first switching time of the quantum voltage step of the sinusoidal step wave quantum voltage signal according to the difference data array includes: Calculate the standard deviation based on the difference data in the difference data array; Setting a judgment threshold according to the standard deviation; Traversing the difference data array, taking the difference data in the difference data array that is greater than the judgment threshold as the target difference, and forming a first array according to the target difference; Performing a modulo operation according to each target difference in the first array and a preset total number of quantum voltage step samples to obtain a number of remainders, and forming a second array according to the number of remainders; An average value is calculated according to the remainders in the second array, and the average value is used as the sampling data number corresponding to the first switching moment of the quantum voltage step; The first switching moment of the quantum voltage step is calculated according to the sampling data number and the preset sampling frequency.

5. A voltage sinusoidal waveform differential sub-sampling method based on PJVS as claimed in claim 4, characterized in that: Determining the starting quantum voltage step number of the sinusoidal step wave quantum voltage signal according to the difference data array includes: According to the difference data array and the amplitude of the sinusoidal voltage signal to be measured, an approximate value of the quantum voltage step level is calculated; Taking the design level values ​​of all quantum voltage steps within the fundamental wave period corresponding to the sinusoidal step wave quantum voltage signal as a third array; The starting quantum voltage step number is determined by comparing the approximate value of the quantum voltage step level with the design level value in the third array.

6. A voltage sinusoidal waveform differential sub-sampling method based on PJVS as claimed in claim 5, characterized in that: According to the first switching moment of the quantum voltage step and the starting quantum voltage step number, a subtraction operation is performed on the design level value corresponding to the sinusoidal step wave quantum voltage signal to obtain the target sinusoidal voltage waveform data after preliminary calibration, including: Determining the level change amplitude when adjacent quantum voltage steps are switched according to the first switching time of the quantum voltage step and the starting quantum voltage step number; The sampled data in the sampled data array are screened according to the level change amplitude to obtain the sampled data of the stable area on the corresponding quantum voltage step; The design level value corresponding to the sinusoidal step wave quantum voltage signal is subtracted from the sampled data of the stable area on the corresponding quantum voltage step to obtain the target sinusoidal voltage waveform data after preliminary calibration.

7. A voltage sinusoidal waveform differential sub-sampling method based on PJVS as claimed in claim 6, characterized in that: According to the phase relationship of the target sinusoidal voltage waveform data, the target sinusoidal voltage waveform data is fitted to obtain a final calibrated sinusoidal voltage signal, including: splicing the target sinusoidal voltage waveform data according to the phase relationship of the target sinusoidal voltage waveform data to obtain a spliced ​​sinusoidal voltage signal; The spliced ​​sinusoidal voltage signal is fitted to obtain the final calibrated sinusoidal voltage signal.

8. A voltage sinusoidal waveform differential sub-sampling device based on PJVS, characterized in that: include: A signal acquisition module, used to acquire a sinusoidal voltage signal to be measured and a sinusoidal step wave quantum voltage signal; wherein the sinusoidal step wave quantum voltage signal is generated based on PJVS; A signal superposition module, used for superimposing the sinusoidal voltage signal to be measured and the sinusoidal step wave quantum voltage signal to obtain a sampling data array; A difference data determination module, used for performing subtraction based on two adjacent sampling data in the sampling data array to obtain a difference data array; A quantum voltage step determination module, used to determine the first switching time of the quantum voltage step of the sinusoidal step wave quantum voltage signal and the starting quantum voltage step number according to the difference data array; A preliminary calibration module, used to perform a subtraction operation on the design level value corresponding to the sinusoidal step wave quantum voltage signal according to the first switching moment of the quantum voltage step and the starting quantum voltage step number, to obtain the target sinusoidal voltage waveform data after preliminary calibration; The fitting and calibration module is used to fit the target sinusoidal voltage waveform data according to the phase relationship of the target sinusoidal voltage waveform data to obtain a final calibrated sinusoidal voltage signal.

9. A terminal device, characterized in that: The method comprises a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein when the processor executes the computer program, a voltage sinusoidal waveform differential sub-sampling method based on PJVS as claimed in any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a stored computer program, wherein when the computer program is executed, the device where the computer-readable storage medium is located is controlled to execute a voltage sinusoidal waveform differential sub-sampling method based on PJVS as claimed in any one of claims 1 to 7.

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