V2X module automatic test system for simulating external GNSS signal and working method

Abstract

The invention discloses a V2X module automatic test system simulating an external GNSS signal and a working method. The system comprises a power supply unit, a control unit, a test unit and a connection unit. The power supply unit is connected with the control unit; the control unit is connected with the test unit; the test unit is connected with the DUT module to be tested through the connection unit; wherein the test unit comprises a basic function test unit, a wired communication test unit and a wireless communication test unit; the basic function test unit is used for testing whether the voltage, current, working state and working mode of the DUT module to be tested meet requirements or not; the wired communication test unit verifies whether the return data of the DUT module to be tested is correct or not; the wireless communication test unit detects the V2X function of the DUT module to be tested. By implementing the system provided by the invention, the V2X module can be comprehensively evaluated and detected from a bottom layer, and the function suitability, stability and product verification of the module are effectively ensured, so that the development risk is reduced, and the research and development efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of V2X modules, and particularly to an automated test system and working method for a V2X module that simulates external GNSS signals. Background Art

[0003] Currently, V2X (Vehicle-to-Everything) devices are mainly composed of V2X chips or V2X modules. V2X chips usually require developers to complete baseband development by themselves, which will increase time consumption and costs, and due to their limited adaptability to different manufacturers, they often cannot meet the needs of all manufacturers. In contrast, as a solution, V2X modules can greatly shorten the product R & D time and reduce development costs, and are a more suitable choice. However, if the functions and performance of the module are not fully evaluated and tested in the early stage, it may bring huge product risks, even lead to the abortion of the project, or cause the product to fail to be launched on time. The existing module testing means mainly focus on the confirmation of radio frequency parameters, but these tests cannot comprehensively cover all functions and performance of the module. Therefore, development manufacturers must conduct a comprehensive multi-functional evaluation, testing, and functional loop testing on the module to ensure its adaptability and stability.

[0004] Currently, most V2X simulation test solutions on the market are mainly for product-level testing, lacking a comprehensive evaluation and testing of the module level. These test solutions usually only perform software simulation for specific application scenarios and fail to fundamentally avoid some potential serious problems.

[0005] Therefore, it is necessary to design a new system to comprehensively evaluate and detect V2X modules from the bottom layer, effectively ensure the functional adaptability, stability, and product verification of the modules, thereby reducing development risks and improving R & D efficiency. Summary of the Invention

[0007] The purpose of the present invention is to overcome the defects of the prior art and provide an automated test system and working method for a V2X module that simulates external GNSS signals.

[0008] To solve the above technical problems, the purpose of the present invention is achieved through the following technical solutions: providing an automated test system for a V2X module that simulates external GNSS signals, including: a power supply unit, a control unit, a test unit, and a connection unit; the power supply unit is connected to the control unit; the control unit is connected to the test unit; the test unit is connected to the DUT module to be tested through the connection unit; wherein, the test unit includes a basic function test unit, a wired communication test unit, and a wireless communication test unit; The basic function test unit is used to test whether the voltage, current, working state, and working mode of the DUT module under test meet the requirements; The wired communication test unit is used to send data packets through various communication buses to verify whether the data returned by the DUT module under test is correct; The wireless communication test unit is used to detect the V2X function of the DUT module under test and simulate and verify the wireless communication ability of the DUT module under test through 1PPS signals and NMEA data.

[0009] A further technical solution thereof is that the control unit includes an action generation unit and a main control unit. The action generation unit is used to trigger a test operation and issue an operation command; the main control unit is used to receive the operation command issued by the action generation unit and execute the test to drive the test unit to perform corresponding tests on the DUT module under test and collect test results.

[0010] A further technical solution thereof is that the main control unit includes a control chip U1, and the model of the control chip U1 is STM32F103RC.

[0011] A further technical solution thereof is that it further includes an interaction unit, and the interaction unit is connected to the main control unit.

[0012] A further technical solution thereof is that the interaction unit includes an Android APP interaction unit, a TTS prompt tone interaction unit, and an indicator light interaction unit; The Android APP interaction unit is used to provide remote configuration and test status viewing through WIFI connection; The TTS prompt tone interaction unit is used to announce various statuses during the test process through voice; The indicator light interaction unit is used to display different test types and statuses through LED lights.

[0013] A further technical solution thereof is that it further includes an ADC sampling unit, and the ADC sampling unit is connected to the basic function test unit.

[0014] A further technical solution thereof is that the main control unit is further connected to an analog circuit, and the analog circuit is connected to the test unit.

[0015] A further technical solution thereof is that the basic function test unit includes a current and voltage test chip U2, and the ADC sampling unit is connected to the current and voltage test chip U2.

[0016] Its further technical solution is as follows: The connection structure includes a pressing block, a probe, a lower needle board, an upper needle board, a floating board, and an upper cover. The pressing block is connected to the upper cover. The probe is connected to the test unit. The probe is located inside the lower needle board. The upper needle board is located above the lower needle board, and the floating board is located above the upper needle board. The upper needle board and the floating board are respectively provided with holes for the probe to pass through. The pressing block is located above the floating board. The DTU module to be tested is located inside the floating board.

[0017] In addition, in order to overcome the defects of the prior art, the present invention also provides a working method of an automated test system for a V2X module using the above-mentioned simulated external GNSS signal, including: Physically connect the DUT module to be tested with the test unit through the connection unit; Drive the test unit through the control unit to test the voltage, current, and basic working state of the DUT module to be tested to ensure that they meet the requirements; verify the wired communication function of the DUT module to be tested through various communication buses to ensure normal data transmission; simulate V2X signals and verify the wireless communication function of the DUT module to be tested; Collect the test results by the control unit and feedback them to the interaction system for result presentation.

[0018] The beneficial effects of the present invention compared with the prior art are as follows: Through the collaborative work of the power supply unit, the control unit, the test unit, and the connection unit, the present invention comprehensively evaluates and detects the functions and performance of the V2X module from the bottom layer. The power supply unit provides power support for the entire system. The control unit is responsible for coordinating the work of each module. The test unit conducts multi-dimensional verification on the DUT module to be tested through basic function tests and communication tests. The basic function test unit checks the voltage, current, working state, and mode. The wired communication test unit sends data packets through the communication bus and verifies the correctness of the returned data. The wireless communication test unit detects the V2X wireless communication ability of the DUT module through the simulation of 1PPS signals and NMEA data. Such comprehensive test means effectively ensure the function adaptability, stability, and product verification of the V2X module, thereby reducing the development risk and improving the R & D efficiency.

[0019] The following further describes the present invention in conjunction with the accompanying drawings and specific embodiments. Description of the Drawings

[0021] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following will briefly introduce the accompanying drawings required for the description of the embodiments. Obviously, the accompanying drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can also be obtained based on these drawings.

[0022] Figure 1 Schematic block diagram of a V2X module automated test system for simulating external GNSS signals provided by an embodiment of the present invention; Figure 2 Specific circuit schematic diagram of the action generation unit provided by an embodiment of the present invention; Figure 3 Specific circuit schematic diagram of the main control unit provided by an embodiment of the present invention; Figure 4 Specific circuit schematic diagram of the TTS prompt sound interaction unit provided by an embodiment of the present invention; Figure 5 Specific circuit schematic diagram of the indicator light interaction unit provided by an embodiment of the present invention; Figure 6 Specific circuit schematic diagram of the basic function test unit provided by an embodiment of the present invention; Figure 7 Specific circuit schematic diagram of the power supply unit provided by an embodiment of the present invention; Figure 8 Schematic three-dimensional structure diagram of the connection unit provided by an embodiment of the present invention; Figure 9 Schematic cross-sectional structure diagram of the connection unit provided by an embodiment of the present invention; Figure 10 Interface schematic of the Android APP interaction unit provided by an embodiment of the present invention Figure 1 ; Figure 11 Interface schematic of the Android APP interaction unit provided by an embodiment of the present invention Figure 2 ; Figure 12 Interface schematic of the Android APP interaction unit provided by an embodiment of the present invention Figure 3 ; Explanation of the markings in the figure: 10. Power supply unit; 20. Control unit; 30. Test unit; 40. Connection unit; 41. Screw cap; 42. Hand grip; 43. Screw rod; 44. Upper cover; 45. Floating plate; 46. Upper needle board; 47. Lower needle board; 48. Probe; 49. Pressing block; 50. Interaction unit; 60. DUT module to be tested. Specific embodiments

[0024] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0025] It should be understood that when used in this specification and the appended claims, the terms "comprising" and "including" indicate the presence of the described features, wholes, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, wholes, steps, operations, elements, components, and / or their combinations.

[0026] It should also be understood that the terms used in this specification of the present invention are merely for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in this specification of the present invention and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" are intended to include the plural forms.

[0027] It should be further understood that the term "and / or" used in this specification of the present invention and the appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0028] Currently, V2X devices are mainly composed of V2X chips or modules. Although modules can significantly shorten the R & D time and reduce costs, if sufficient function and performance tests are not carried out, it may bring product risks. Most of the existing test schemes focus on the confirmation of radio frequency parameters and cannot comprehensively evaluate the adaptability and stability of the modules. Therefore, the development manufacturers must conduct comprehensive multi-functional evaluations and loopback tests to ensure the reliability and market adaptability of the modules.

[0029] For this reason, the embodiments of the present invention provide an automated test system for V2X modules that simulates external GNSS signals, realizing comprehensive evaluation and detection of V2X modules from the bottom layer, effectively ensuring the functional adaptability, stability, and product verification of the modules, thereby reducing development risks and improving R & D efficiency.

[0030] Specifically, the automated test system for V2X modules that simulates external GNSS signals comprehensively evaluates and detects various functions of the V2X modules through multi-level test units 30. The system includes power supply, control, test, and connection units 40. Combining basic function tests, wired and wireless communication test units, it can verify the electrical characteristics, communication backhaul data, and wireless communication capabilities of the modules. Coordinating tests through the main control unit and supplemented by interactive means such as Android APP, TTS prompt sounds, and LED indicator lights, it ensures the transparency and efficiency of the test process. In addition, the integration of ADC sampling and analog circuits further improves the accuracy. The test results help reduce development risks, improve R & D efficiency, and ensure the adaptability and stability of V2X modules.

[0031] In order to better understand the above technical solutions, the above technical solutions will be described in detail below in conjunction with the accompanying drawings of the specification and specific embodiments.

[0032] Please refer to Figure 1 , the above V2X module automated test system for simulating external GNSS signals includes: a power supply unit 10, a control unit 20, a test unit 30, and a connection unit 40; the power supply unit 10 is connected to the control unit 20; the control unit 20 is connected to the test unit 30; the test unit 30 is connected to the DUT module 60 to be tested through the connection unit 40; wherein, the test unit 30 includes a basic function test unit, a wired communication test unit, and a wireless communication test unit; The basic function test unit is used to test whether the voltage, current, working state, and working mode of the DUT module 60 to be tested meet the requirements; The wired communication test unit is used to send data packets through various communication buses to verify whether the feedback data of the DUT module 60 to be tested is correct; The wireless communication test unit is used to detect the V2X function of the DUT module 60 to be tested, and simulate and verify the wireless communication ability of the DUT module 60 to be tested through 1PPS signals and NMEA data.

[0033] In this embodiment, as Figure 7 shown, the power supply unit 10 provides power support for the entire system, including the power supply of the control unit 20, the test unit 30, and the DUT module 60 to be tested. This unit provides an adapted voltage according to the power requirements of the DUT module 60 to be tested, including four common power domains of 5V, 3.8V, 3.3V, and 1.8V, and has sufficient load capacity. In addition, this unit also provides docking jumper pins to facilitate manual selection of the appropriate power domain, thereby enhancing the compatibility and applicability of the system.

[0034] The control unit 20 consists of an action generation unit and a main control unit: the action generation unit consists of 5 control switches, which respectively control basic function tests, wireless communication tests, and wired communication tests. The main control unit is responsible for receiving the commands of the action generation unit, triggering the test program, and directing the peripherals to execute the corresponding function commands. Collect and judge the feedback information during the test process, and finally transmit the test results to the interaction system.

[0035] The test unit 30 is divided into three main parts: a basic function test unit, a wired communication test unit, and a wireless communication test unit.

[0036] The basic function test unit is responsible for testing whether the voltage, current, working state, and working mode of the DUT module 60 to be tested meet the predetermined standards. The specific tests include collecting the input voltage (such as 3.8V, 5V) and output voltage (such as 1.8V, 3V) through a 12-bit ADC, comparing with the set values, and judging whether they meet the requirements. In addition, the current of each power supply domain is also tested through an ammeter to ensure that the deviation is within the tolerance range.

[0037] The wired communication test unit conducts data interaction with the DUT module 60 to be tested through SD bus, SPI bus, I2C bus, UART bus, USB bus, etc. The MCU sends specific data packets, and the DUT module returns data. The system compares the returned data with the set value to ensure correct communication.

[0038] The wireless communication test unit is mainly used to detect V2X functions, simulate 1PPS signals and NMEA data, and verify the wireless communication capabilities of the DUT module 60 to be tested in a wireless manner. By testing the wireless communication performance of the DUT module, it is ensured that it complies with the V2X standard.

[0039] The connection unit 40 is mainly responsible for the physical connection between the DUT module and the test unit 30. The connection with the DUT is quickly achieved by crimping the thimble, without the need for soldering, greatly reducing the time and trial - and - error costs. This design improves the scalability and flexibility of the system.

[0040] The interaction system provides real - time feedback to users through the Android APP, TTS prompt sounds, and indicator lights.

[0041] Android APP interaction unit: Connects to the Android device via WIFI. Users can configure and interact through the APP, view the test status, and trigger relevant test scenarios.

[0042] TTS prompt sound interaction unit: Provides voice prompts for the test progress through the voice module, including the start of functional testing, test results (success or failure), specific reasons for failure, etc.

[0043] Indicator light interaction unit: Displays different test statuses, test types, and test results through LED indicator lights. The color change of the indicator lights helps users quickly identify the current test status.

[0044] The system simulates 1PPS signals and GNSS NMEA data through the MCU. By simulating different scenarios (such as open - sky static, open - sky dynamic, etc.), the system verifies the functions of the V2X module. The system also provides control signals and communication signals related to the V2X module (such as SPI, I2C, UART, etc.) to ensure the normal operation of each function of the module.

[0045] The working process of the test system is clear and precise. Users can trigger the system to start or stop the test with one key. After the test is completed, the system will automatically generate a detailed test data report, including detailed information on each test item and failure points. By connecting the PC to the MCU, users can extract and view the detailed test data document.

[0046] In summary, this V2X module automated test system provides comprehensive and automated test functions through fine hardware design and system division of labor, and can efficiently complete various performance verifications of the DUT module.

[0047] In this embodiment, the DUT module 60 to be tested is actually a V2X module to be tested.

[0048] In one embodiment, please refer to Figure 2 and Figure 3 , the control unit 20 includes an action generation unit and a main control unit. The action generation unit is used to trigger test operations and issue operation commands. The main control unit is used to receive the operation commands issued by the action generation unit, execute tests, drive the test unit 30 to perform corresponding tests on the DUT module 60 to be tested, and collect test results.

[0049] In this embodiment, the action generation unit consists of 5 control switches, which are respectively used to control basic function tests, wireless communication tests, and wired communication tests. Each switch is connected to the VCC_3V3_MCU power supply through a connector with a 2.54mm pitch, and is connected to the TESTSWITCH signal through a 10kΩ / 1% precision resistor (R83, R84, R85, R86, R87).

[0050] The action generation unit includes: Basic function test control switch (TESTSWITCH0); Switch name: SW3; Connector pitch: 2.54mm; Power connection: VCC_3V3_MCU; Current-limiting resistor: R83 (10kΩ, 1%); Signal output: TESTSWITCH0; When SW3 is closed, VCC_3V3_MCU provides a high-level signal for TESTSWITCH0 through R83, indicating the start of the basic function test; when SW3 is open, TESTSWITCH0 is at a low level, indicating the end of the basic function test.

[0051] Wireless communication test control switch (TESTSWITCH1); Switch name: SW4; Connector pitch: 2.54mm; Power connection: VCC_3V3_MCU; Current-limiting resistor: R84 (10kΩ, 1%); Signal output: TESTSWITCH1; When SW4 is closed, VCC_3V3_MCU provides a high-level signal to TESTSWITCH1 through R84, indicating the start of wireless communication testing; when SW4 is open, TESTSWITCH1 is at a low level, indicating the end of wireless communication testing.

[0052] Wired communication test control switch (TESTSWITCH2); Switch name: SW5; Connector pitch: 2.54 mm; Power connection: VCC_3V3_MCU; Current-limiting resistor: R85 (10 kΩ, 1%); Signal output: TESTSWITCH2; When SW5 is closed, VCC_3V3_MCU provides a high-level signal to TESTSWITCH2 through R85, indicating the start of wired communication testing; when SW5 is open, TESTSWITCH2 is at a low level, indicating the end of wired communication testing.

[0053] Other control switches (TESTSWITCH3 and TESTSWITCH4); Switch names: SW6 and SW7; Connector pitch: 2.54 mm; Power connection: VCC_3V3_MCU; Current-limiting resistors: R86 and R87 (10 kΩ, 1%); Signal outputs: TESTSWITCH3 and TESTSWITCH4; When SW6 or SW7 is closed, the corresponding TESTSWITCH signal becomes high level; when SW6 or SW7 is open, the corresponding TESTSWITCH signal becomes low level.

[0054] These five control switches achieve the control of different test modes through a simple hardware design. Each switch pulls up the corresponding TESTSWITCH signal when closed, thus triggering the corresponding test process; when open, it pulls down the signal, indicating the end of the test. This design is simple and reliable and is suitable for scenarios that require manual control of the test process.

[0055] In one embodiment, please refer to Figure 3 , the above-mentioned main control unit includes a control chip U1, and the model of the control chip U1 is STM32F103RC.

[0056] In this embodiment, the functions of each pin of the control chip U1 are as follows: PC0 - PC4: Connected to TESTSWITCH0 - TESTSWITCH4 signals.

[0057] PA13 / USB_DP: USB interface.

[0058] PA14 / USB_DM: USB interface.

[0059] PA15 / TMS: Debug interface.

[0060] PB12 / NRST: Reset signal.

[0061] PB13 / OSC_IN / PD0: Crystal oscillator input.

[0062] PB14 / OSC_OUT / PD1: Crystal oscillator output.

[0063] PB15 / BOOT0: Boot mode selection.

[0064] PC13 / LED: LED indicator.

[0065] When the user operates a certain switch (such as SW3), the control chip U1 detects a high - level signal through the corresponding GPIO pin (such as PC0). The control chip U1 identifies the command type corresponding to the signal (for example, basic function test). The control chip U1 identifies the specific command type (basic function test, wireless communication test, wired communication test, etc.) according to the states of different GPIO pins.

[0066] According to the identified command type, the control chip U1 triggers the corresponding internal test program. The test program outputs function commands by controlling the corresponding peripherals.

[0067] The control chip U1 controls the peripherals through interfaces such as SPI, I2C, or UART to output corresponding function commands. For example, send instructions to the wireless module through the UART interface for wireless communication test.

[0068] After the peripherals execute the corresponding function commands, they return the feedback results to the control chip U1 through the corresponding interfaces. The control chip U1 collects the feedback results through ADC or other sensors.

[0069] The control chip U1 judges the feedback results according to the preset standard values. If the feedback results are within the tolerance range, it is judged as passed; otherwise, it is judged as failed.

[0070] The control chip U1 generates corresponding information about the test results (passed or failed). Transmit the test results to the interaction system through the USB interface or other communication methods for display and recording.

[0071] The control chip U1 monitors the status of the control switch through multiple GPIO pins, identifies the command type, triggers the internal test program, and outputs the corresponding function commands through the peripherals. After the test is completed, the main control unit collects the feedback results and makes a judgment, and finally transmits the test results to the interaction system for display and recording. And it is responsible for generating the PWM waveform of 1PPS. At the same time, it transmits the simulated NMEA data through UARTS1_TX, and this data is stored in the SPI_FLASH.

[0072] In one embodiment, please refer to Figure 1 , the above V2X module automated test system for simulating external GNSS signals further includes an interaction unit 50, and the interaction unit 50 is connected to the main control unit.

[0073] In one embodiment, please refer to Figure 4 and Figure 5 、 Figures 10 to 12 , the interaction unit 50 includes an Android APP interaction unit, a TTS prompt tone interaction unit, and an indicator light interaction unit; The Android APP interaction unit is used to provide remote configuration and test status viewing through WIFI connection; specifically, as Figures 10 to 12 shown, the Android APP interaction unit is connected to the Android device through WIFI, and users can configure and interact on the APP interface. Through the APP, users can not only view the simulation status of the system in real time, but also trigger some basic V2X scenarios for testing. This interaction unit 50 provides a convenient operation interface for users, making the test process more intuitive and flexible.

[0074] The TTS prompt tone interaction unit is used to announce various statuses during the test process through voice; please refer to Figure 4 , the TTS (Text-to-Speech) prompt tone interaction unit is used to announce various statuses during the test process through voice. This unit is mainly composed of a TTS chip U34 and related peripheral circuits, including crystal oscillators, capacitors, power management, etc.

[0075] Specifically, the model of the TTS chip U34 is T718.

[0076] Pin functions: VDD_TTS_3V3, VDDIO_TTS, AVDD_TTS: Power input.

[0077] TTS_POP_EN_7: Pop-up enable signal.

[0078] AP_TTS_RST_3V3: Reset signal.

[0079] AP_TTS_WK_3V3: Wake-up signal.

[0080] BAUD0, BAUD1: Baud rate selection signals.

[0081] TTS_RB: Read / write signal.

[0082] PA_MUTE: Mute control signal.

[0083] AP_UART0_TX_3V3, AP_UART0_RX_3V3: UART communication interfaces.

[0084] AO: Audio output.

[0085] The first and second pins of the crystal oscillator circuit (XTAL24M) are respectively connected to the XTAL24MI and XTAL24MO pins of the TTS chip.

[0086] A 1μF / 16V capacitor (C129) is connected in parallel between the first and second pins.

[0087] A 12pF / 25V capacitor (C128) is connected in series between the first pin and ground.

[0088] A 12pF / 25V capacitor (C130) is connected in series between the second pin and ground.

[0089] The audio output circuit outputs the audio signal to the subsequent audio processing circuit or speaker through a coupling capacitor (C142).

[0090] The input of the power management circuit is VDD_PA_5V; the 5V power supply is converted to 3.3V power supply through the XPT4890 chip to power the TTS chip. Power filtering is performed through multiple capacitors (such as C138, C820, C141, etc.) to ensure power stability.

[0091] Basic function test: The main control unit sends a text command of "Basic function test start" to the TTS chip through the UART interface. If the test fails, the main control unit sends a text command of "Basic function test failed" and broadcasts it through the TTS chip. If the test is successful, the main control unit sends a text command of "Basic function test successful" and broadcasts it through the TTS chip.

[0092] Wired communication test: The main control unit sends a text command of "Wired communication test start" to the TTS chip through the UART interface. If the test fails, the main control unit sends a text command of "Wired communication test failed, the failed item is SPI / SD / USB / I2C" and broadcasts the specific failed item through the TTS chip. If the test is successful, the main control unit sends a text command of "Wired communication test successful" and broadcasts it through the TTS chip.

[0093] Wireless communication test: The main control unit sends a text command of "Wireless communication test start" to the TTS chip through the UART interface. If the test fails, the main control unit sends a text command of "Wireless communication test failed, the failure item is WIFI / 4G / V2X" and broadcasts the specific failure item through the TTS chip. If the test is successful, the main control unit sends a text command of "Wireless communication test successful" and broadcasts it through the TTS chip.

[0094] Overall test: The main control unit sends a text command of "Overall test start" to the TTS chip through the UART interface. If the test fails, the main control unit sends a text command of "Overall test failed, the overall test failure item is XXX" and broadcasts the specific failure item through the TTS chip. If the test is successful, the main control unit sends a text command of "Overall test successful" and broadcasts it through the TTS chip.

[0095] The TTS prompt sound interaction unit realizes the function of converting text commands into voices through the TTS chip and related peripheral circuits. The main control unit sends text commands to the TTS chip through the UART interface, and the TTS chip generates corresponding voice data and outputs it through the AO pin. Users can hear the content of the voice broadcast through the speaker, so as to understand various states during the test.

[0096] The indicator light interaction unit is used to display different test types and states through LED lights. Please refer to Figure 5 , the above-mentioned indicator light interaction unit displays different test types and states through LED lights. This unit is mainly composed of multiple LED lights and related control circuits.

[0097] The LED lights LED1, LED2, and LED3 are usually red, green, or yellow; LED1 is connected to the second pin of J6.

[0098] LED2 is connected to the third pin of J6.

[0099] LED3 is connected to the fourth pin of J6.

[0100] The current-limiting resistors R60, R61, and R62 limit the current flowing through the LED to prevent the LED from being damaged.

[0101] R60 is connected between VCC_3V3_MCU and LED1.

[0102] R61 is connected between VCC_3V3_MCU and LED2.

[0103] R62 is connected between VCC_3V3_MCU and LED3.

[0104] Pin 2 of the control interface J6 controls LED1. Pin 3 controls LED2. Pin 4 controls LED3.

[0105] After power-on, the main control unit initializes the state of the LED lights through the corresponding pins of the control interface J6. The main control unit controls the on and off of the LED lights through the corresponding pins of the control interface J6.

[0106] When a certain pin outputs a high level, the corresponding LED light is lit.

[0107] When a certain pin outputs a low level, the corresponding LED light is turned off.

[0108] According to different test types and states, the main control unit controls the on and off of the corresponding LED lights.

[0109] Basic function test starts: Turn on LED1.

[0110] Basic function test fails: Flash LED1.

[0111] Basic function test succeeds: Keep LED1 on constantly.

[0112] Wired communication test starts: Turn on LED2.

[0113] Wired communication test fails: Flash LED2.

[0114] Wired communication test succeeds: Keep LED2 on constantly.

[0115] Wireless communication test starts: Turn on LED3.

[0116] Wireless communication test fails: Flash LED3.

[0117] Wireless communication test succeeds: Keep LED3 on constantly.

[0118] Overall test starts: Turn on LED1, LED2, and LED3 simultaneously.

[0119] Overall test fails: Flash LED1, LED2, and LED3 simultaneously.

[0120] Overall test succeeds: Keep LED1, LED2, and LED3 on constantly simultaneously.

[0121] The indicator interaction unit realizes the function of displaying different test types and states through multiple LED lights and related control circuits. The main control unit controls the on and off of the LED lights through the corresponding pins of the control interface J6, thereby intuitively displaying various states during the test.

[0122] In one embodiment, a V2X module automated test system for simulating external GNSS signals further includes an ADC sampling unit, and the ADC sampling unit is connected to the basic function test unit.

[0123] In one embodiment, the main control unit is further connected to an analog circuit, and the analog circuit is connected to the test unit 30.

[0124] In this embodiment, the system mainly supports the normal operation of the V2X module through analog signals to ensure that it obtains necessary information. The V2X module needs to be synchronized through the 1PPS signal and relies on GPS NMEA information for time synchronization. Through the NMEA data, information such as the speed, position, and direction of the vehicle can be obtained to determine the current state of the vehicle.

[0125] Through the PWM output of the MCU, a 1PPS waveform is simulated, and the waveform is a square wave with a duty cycle of 50% and a peak value of 1.8V.

[0126] The FLASH in the system stores GNSS NMEA data in multiple scenarios. The data length is 10 minutes, and it can simulate the V2X states in different scenarios. The user can switch scenarios through the switch button, and the simulated TTS will also perform corresponding voice broadcasts according to the scenarios. The scenario types include: Open sky static; Open sky dynamic; Building sky static; Building sky dynamic; Half sky static; Half sky dynamic; The ADC sampling unit is used to collect the output states of the module, such as the 1.8V and 3V output signals of the module, and the output signals of certain functional pins. By comparing with normal data, it can be determined whether the module is working properly and the state of the V2X antenna can be detected to ensure that it is in a normal working state.

[0127] Control signal: Used to control the working state, programming state, reset, etc. of the V2X module. The MCU issues corresponding control signals as needed to adjust the state of the module.

[0128] Communication signal: Supports multiple bus types to communicate with the V2X module, including SD bus, SPI bus, I2C bus, UART bus, and USB bus, etc., to ensure that each module of the system can be normally connected and communicate.

[0129] The 4G function unit in the system communicates with the DUT module 60 to be tested through the USB bus, provides LTE network support, and ensures that the DUT can interact with the cloud. This is an essential part of performing basic function verification.

[0130] The test unit 30 communicates with the DUT module 60 under test via the WIFI unit using the SDIO bus, supporting the in-line debugging of the DUT and the adaptation of automated test commands. The WIFI function provides the system with the ability of remote control and automated testing.

[0131] In one embodiment, please refer to Figure 6 , the above basic function test unit includes a current-voltage test chip U32, and the ADC sampling unit is connected to the current-voltage test chip U32.

[0132] Specifically, a 12-bit ADC is used to collect the input voltages (3.8V and 5V) and output voltages (1.8V and 3V) of the DUT. U32 and U33 are INA226AQDGSRQ1 chips, which are used to measure voltage and current. U32 is connected to the VCC_3V8_V2X power domain, and U33 is connected to the VCC_5V_V2X power domain.

[0133] Compare the collected voltage values with the set values.

[0134] If the deviation exceeds the tolerance value, it is regarded as a failure, and an interactive explanation is made in the basic function test unit item through the interactive system.

[0135] Use a current meter to measure the currents of the 3.8V and 5V power supply domains of the DUT.

[0136] The INA226AQDGSRQ1 chip has a built-in current detection function, and current sampling is performed through the resistor R2512 (2mΩ).

[0137] Compare the actually measured current values with the set values.

[0138] If the deviation exceeds the tolerance value, it is regarded as a failure, and an interactive explanation is made in the basic function test unit item through the interactive system.

[0139] When testing the V2X_STATUS and SYNC states, collect the high and low states of these working state pins through the ADC sampling signal.

[0140] Compare the collected state values with the set values. If the deviation exceeds the tolerance value, it is regarded as a failure, and an interactive explanation is made in the basic function test unit item through the interactive system.

[0141] Judge the switches for controlling the working modes in various working mode tests and control signals; collect the state of the AP_BOOT_3V3 signal. Compare the collected working mode states with the set values. If the deviation exceeds the tolerance value, it is regarded as a failure, and an interactive explanation is made in the basic function test unit item through the interactive system.

[0142] In one embodiment, the working principle of the wired communication test unit is as follows: The main control unit sends specific data packets to the DUT (Device Under Test) through different communication buses (such as SD bus, SPI bus, I2C bus, UART bus, and USB bus). After receiving the data, the DUT mirrors and sends it back. The main control unit analyzes the returned data packets and compares them with the preset standard values to check whether there are any deviations in the content of the data packets. Through this process, the test system can verify the correctness of data transmission.

[0143] Under different types of communication buses, the test data packets sent by the main control unit will be different, and the DUT will mirror and send them back after receiving the data. Finally, the MCU determines whether the data is correct by comparing the returned data with the set values and displays the test results through the interaction system.

[0144] In this embodiment, the detailed process of the wireless communication test unit (mainly the detection of V2X function) is as follows: First, start the wireless communication function test through the action switch. Specifically, the operator or the system starts the wireless communication function test through the action switch; the system enters the V2X communication test preparation state.

[0145] Next, environmental simulation: 1pps signal: Simulated and provided by the main control unit for synchronizing the time reference.

[0146] GNSS NMEA data: Also simulated and provided by the main control unit for simulating satellite positioning information.

[0147] Confirm DUT settings: Confirm whether the air interface transmission frequency and bandwidth of the DUT (Device Under Test) meet the radio frequency related settings.

[0148] Perform a command operation to send data to the DUT and verify whether it can respond correctly.

[0149] Next, pick up the command packet sent by the DUT's air interface on the V2X module in the test unit 30.

[0150] Compare the data packet sent by the DUT with the parsed data packet to check whether there are any deviations in the content of the data packet.

[0151] Swap the roles of the DUT and the V2X module, that is, the DUT acts as the receiver and the V2X module acts as the sender.

[0152] Perform the data packet comparison again to ensure the accuracy of two-way communication.

[0153] Finally, compare the comparison result with the set value to determine whether there are any deviations in the content of the data packet.

[0154] If a deviation is found, the test item is considered a failure and the failure point is recorded.

[0155] Through the interactive system, an interactive description is carried out in the wireless communication test unit item, and the test results are fed back in real time.

[0156] Each function can be tested separately, such as frequency, bandwidth, data packet content, etc. It can also be tested as a whole through a one-key switch to complete the detection of all items at once.

[0157] When all 10 tests are completed, the system automatically summarizes the test results. The overall wireless communication function test results are output through the interactive system.

[0158] The main control unit can be connected to the PC to extract the detailed test data document (txt format), which contains the detailed information of each test environment and the failure points of the fail items.

[0159] The system displays "Test completed, output result 10", indicating that all test items have been completed. The final results will be comprehensively displayed through the interactive system, including the specific information of the successful and failed items.

[0160] The wireless communication test unit mainly detects the V2X function. Through steps such as simulating the environment, comparing data packets, judging results, and interactive description, it ensures the performance and stability of the DUT in wireless communication. The entire test process supports both sub-item testing and one-key overall testing, and finally outputs detailed test results through the interactive system.

[0161] In one embodiment, please refer to Figure 8 and Figure 9 , the above connection structure includes a pressure block 49, a probe 48, a lower needle plate 47, an upper needle plate 46, a floating plate 45, and an upper cover 44. The pressure block 49 is connected to the upper cover 44, the probe 48 is connected to the test unit 30, the probe 48 is located inside the lower needle plate 47, the upper needle plate 46 is located above the lower needle plate 47, and the floating plate 45 is located above the upper needle plate 46. The upper needle plate 46 and the floating plate 45 are respectively provided with holes for the probe 48 to pass through. The pressure block 49 is located above the floating plate 45, and the DTU module to be tested is located inside the floating plate 45.

[0162] In one embodiment, please refer to Figure 9 , the above connection unit 40 further includes a screw 43, a handgrip 42, and a rotary cover 41. The above screw 43 is located on the pressure block 49, and the handgrip 42 is located on one side of the rotary cover 41. The other side of the rotary cover 41 is rotatably connected to the upper cover 44.

[0163] Specifically, the briquet 49 is located above the floating plate 45 and is used to apply pressure to the DTU module to ensure good contact with the probe 48. In the figure, the briquet 49 realizes the pressing of the chip thickness through the adjustment function of the knob, thereby ensuring that the product to be tested is firmly pressed.

[0164] The probe 48 is connected to the test unit 30 and is used to contact the module pad and the transfer PCB. The probe 48 is located inside the lower needle board 47 and passes through the holes on the upper needle board 46 and the floating plate 45. The function of the probe 48 is to establish an electrical connection to ensure the stability and reliability of signal transmission.

[0165] The lower needle board 47 is located at the bottom, supporting the probe 48 and providing a positioning reference. The lower needle board 47 and the upper needle board 46 together form the channel for the probe 48 to ensure the accurate position of the probe 48.

[0166] The upper needle board 46 is located above the lower needle board 47 and is used in cooperation with the floating plate 45. The upper needle board 46 is provided with holes for the probe 48 to pass through to ensure that the probe 48 can pass through smoothly and contact the product to be tested.

[0167] The floating plate 45 is located above the upper needle board 46 and is used to place the DTU module to be tested. The floating plate 45 has a certain floating space, which can adapt to modules of different thicknesses and improve the flexibility and adaptability of the connection.

[0168] The upper cover 44 is connected to the briquet 49 and plays a role in fixing and protecting. The upper cover 44 tightly connects the whole structure together through the lid fastening and fixing function to prevent loosening.

[0169] The screw 43 is located on the briquet 49 and is used to adjust the position and pressure of the briquet 49. By rotating the screw 43, the pressure of the briquet 49 on the DTU module can be accurately controlled to ensure the reliability and consistency of the connection.

[0170] The hand grip 42 is located on one side of the rotary cover 41, which is convenient for the operator to manually adjust. The design of the hand grip 42 makes the operation more convenient and fast, improving the work efficiency.

[0171] The other side of the rotary cover 41 is rotatably connected to the upper cover 44, and the fine adjustment of the briquet 49 is realized through the adjustment function of the knob. The design of the rotary cover 41 not only increases the stability of the structure but also provides a flexible adjustment function.

[0172] This connection system uses the method of crimping thimble for physical connection and has the following advantages: It is applicable to various non-welded modules, eliminating the need for additional welding operations and simplifying the connection process.

[0173] Through the method of crimping thimble, the connection can be quickly completed, shortening the test preparation time.

[0174] Avoid errors and rework that may occur during the welding process, reducing the trial-and-error cost.

[0175] In summary, through reasonable layout and design, the connection unit 40 realizes reliable connection to the DTU module to be tested, improving the test efficiency and accuracy.

[0176] The above-mentioned V2X module automated test system for simulating external GNSS signals comprehensively evaluates and detects the functions and performance of the V2X module from the bottom layer through the collaborative work of the power supply unit 10, the control unit 20, the test unit 30, and the connection unit 40. The power supply unit 10 provides power support for the entire system, the control unit 20 is responsible for coordinating the work of each module, and the test unit 30 conducts multi-dimensional verification on the DUT module 60 to be tested through basic function tests and communication tests. The basic function test unit checks voltage, current, working status, and mode; the wired communication test unit sends data packets through the communication bus and verifies the correctness of the returned data; the wireless communication test unit detects the V2X wireless communication ability of the DUT module through 1PPS signal and NMEA data simulation. Such comprehensive test means effectively ensure the function adaptability, stability, and product verification of the V2X module, thereby reducing development risks and improving R & D efficiency.

[0177] In one embodiment, a working method of using the above-mentioned V2X module automated test system for simulating external GNSS signals includes: Physically connect the DUT module 60 to be tested with the test unit 30 through the connection unit 40. The control unit 20 drives the test unit 30 to test the voltage, current, and basic working status of the DUT module 60 to be tested to ensure that they meet the requirements; verify the wired communication function of the DUT module 60 to be tested through various communication buses to ensure normal data transmission; simulate V2X signals and verify the wireless communication function of the DUT module 60 to be tested. The control unit 20 collects the test results and feeds them back to the interaction system for result presentation.

[0178] It should be noted that those skilled in the art can clearly understand the specific implementation process of the working method of the above-mentioned V2X module automated test system for simulating external GNSS signals. They can refer to the corresponding descriptions in the foregoing system embodiments. For the sake of convenience and conciseness of description, it will not be repeated here.

[0179] The above is only the specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of various equivalent modifications or substitutions, and these modifications or substitutions should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. A V2X module automated test system for simulating external GNSS signals, characterized in that: include: A power supply unit, a control unit, a test unit and a connection unit; The power supply unit is connected to the control unit; The control unit is connected to the testing unit; The test unit is connected to the DUT module to be tested through the connection unit; wherein the test unit includes a basic function test unit, a wired communication test unit and a wireless communication test unit; The basic function test unit is used to test whether the voltage, current, working state and working mode of the DUT module to be tested meet the requirements; The wired communication test unit is used to send data packets through various communication buses to verify whether the return data of the DUT module to be tested is correct; The wireless communication test unit is used to detect the V2X function of the DUT module to be tested, and to verify the wireless communication capability of the DUT module to be tested through 1PPS signal and NMEA data simulation.

2. The V2X module automatic test system for simulating external GNSS signals according to claim 1, characterized in that: The control unit includes an action generating unit and a main control unit. The action generating unit is used to trigger a test operation and issue an operation command. The main control unit is used to receive the operation command issued by the action generating unit and execute a test to drive the test unit to perform a corresponding test on the DUT module to be tested and collect the test results.

3. The V2X module automatic test system for simulating external GNSS signals according to claim 2, characterized in that: The main control unit includes a control chip U1, and the model of the control chip U1 is STM32F103RC.

4. The V2X module automatic test system for simulating external GNSS signals according to claim 2, characterized in that: It also includes an interaction unit, which is connected to the main control unit.

5. The V2X module automatic test system for simulating external GNSS signals according to claim 4, characterized in that: The interaction unit includes an Android APP interaction unit, a TTS prompt tone interaction unit and an indicator light interaction unit; The Android APP interaction unit is used to provide remote configuration and test status viewing via WIFI connection; The TTS prompt tone interaction unit is used to announce various states during the test process through voice broadcast; The indicator light interaction unit is used to display different test types and states through LED lights.

6. The V2X module automatic test system for simulating external GNSS signals according to claim 2, characterized in that: It also includes an ADC sampling unit, which is connected to the basic function testing unit.

7. The V2X module automatic test system for simulating external GNSS signals according to claim 2, characterized in that: The main control unit is also connected to an analog circuit, and the analog circuit is connected to the test unit.

8. The V2X module automatic test system for simulating external GNSS signals according to claim 6, characterized in that: The basic function test unit includes a current and voltage test chip U32, and the ADC sampling unit is connected to the current and voltage test chip U32.

9. The V2X module automatic test system for simulating external GNSS signals according to claim 1, characterized in that: The connection structure includes a pressing block, a probe, a lower needle plate, an upper needle plate, a floating plate and an upper cover, the pressing block is connected to the upper cover, the probe is connected to the test unit, the probe is located in the lower needle plate, the upper needle plate is located above the lower needle plate, and the floating plate is located above the upper needle plate, the upper needle plate and the floating plate are respectively provided with holes for the probe to pass through, the pressing block is located above the floating plate, and the DTU module to be tested is located in the floating plate.

10. A working method of a V2X module automated testing system using a simulated external GNSS signal as claimed in any one of claims 1 to 9, characterized in that: include: The DUT module to be tested is physically connected to the test unit through the connection unit, and the control unit drives the test unit to test the voltage, current and basic working status of the DUT module to be tested to ensure that it meets the requirements; Verify the wired communication function of the DUT module under test through various communication buses to ensure normal data transmission; Simulate V2X signals and verify the wireless communication function of the DUT module under test. The control unit collects the test results and feeds them back to the interactive system for result presentation.

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