Method, device and equipment for testing patterns on display panel

Abstract

The embodiment of the invention provides a method, a device and equipment for testing patterns on a display panel. The method comprises the steps that an area where a current display panel to be tested belongs is determined, and the test sequence of the current display panel to be tested is larger than or equal to 2; and updating the initial gamma value of the area to which the current display panel to be detected belongs according to a target gamma value corresponding to the area to which the previous display panel to be detected belongs on the basis that the area to which the current display panel to be detected belongs does not have the initial gamma value or the initial gamma value is an initial default value. Wherein the target gamma value corresponding to the area to which the previous display panel to be tested belongs comprises the updated initial gamma value of the area to which the current display panel to be tested belongs. And performing on-panel pattern testing on the current to-be-tested display panel based on the initial gamma value of the area to which the current to-be-tested display panel belongs. The test duration of the pattern test on the panel is shortened, and the test efficiency is improved.

Description

Technical Field

[0001] This application relates to the field of display panel testing, and in particular, to a method, device, and equipment for testing patterns on a display panel. Background Art

[0002] In the production process of a display panel, in order to ensure the quality of the display panel, it is necessary to test the display panel. The on-panel test pattern (OTP) is a very important link. In order to improve production efficiency, it is necessary to further optimize the detection duration of OTP.

[0003] In order to improve production efficiency, the master board mapping algorithm is currently used on the production line to reduce the OTP time. The principle of this algorithm is to partition the master board. Since the display panels (i.e., daughter boards) within the same sub-region of the same master board are close to each other, their gamma values are also similar. Therefore, the target gamma value of the previous test display panel within the same partition of the same master board can be used as the initial value of the target gamma value of the current test display panel. That is, the display panels in the same partition only use the default gamma value as the initial value to debug and detect the gamma value during the first OTP process after the test equipment is powered on, so as to realize the pattern test on the panel. After the first OTP process, the target gamma value of the previous OTP is used as the initial gamma value of the current OTP, thereby shortening the debugging time of the gamma value and ultimately shortening the test time of OTP.

[0004] However, in the actual production process, there are usually dozens of OTP devices and several mapping partitions on a production line. The display panels obtained after the master board is cut will be randomly assigned to each device. This random assignment mechanism will cause the first several display panels received by a certain test device to come from different partitions of the master board respectively. If the gamma initial value of each partition in the subsequent OTP is to be the actual gamma value of the previous OTP, it is necessary for the device to have tested all the display panels in all partitions before the current OTP. Therefore, in the OTP detection, the initial OTP time after the device is powered on is relatively long. Taking 30 partitions and 30 to 50 devices as an example, usually after more than 1000 pieces, each device can start using the actual gamma value of the previous OTP as the starting value, which makes the entire OTP detection cycle relatively long and is not conducive to improving production efficiency. Summary of the Invention

[0005] In view of this, the embodiments of this application provide a method, device, and equipment for testing patterns on a display panel, which is beneficial to shortening the test duration of the pattern test on the panel and improving the test efficiency.

[0006] In a first aspect, an embodiment of the present application provides a method for testing patterns on a display panel, including: Determine the area to which the currently tested display panel belongs, where the test order of the currently tested display panel is greater than or equal to 2.

[0007] Based on the absence of an initial gamma value or the initial gamma value being the initial default value in the area to which the currently tested display panel belongs, update the initial gamma value of the area to which the currently tested display panel belongs according to the target gamma value corresponding to the area to which the previous tested display panel belongs. Wherein, the target gamma value corresponding to the area to which the previous tested display panel belongs includes the updated initial gamma value of the area to which the currently tested display panel belongs.

[0008] Based on the initial gamma value of the area to which the currently tested display panel belongs, perform a pattern-on-panel test on the currently tested display panel.

[0009] In a possible implementation manner of the first aspect, updating the initial gamma value of the area to which the currently tested display panel belongs according to the target gamma value corresponding to the area to which the previous tested display panel belongs includes: Use the target gamma value corresponding to the area to which the previous tested display panel belongs as the initial gamma value of the area to which the currently tested display panel belongs.

[0010] In a possible implementation manner of the first aspect, updating the initial gamma value of the area to which the currently tested display panel belongs according to the target gamma value corresponding to the area to which the previous tested display panel belongs includes: According to the area to which the currently tested display panel belongs, determine a target area in the area to which the previous tested display panel belongs. Among all the areas to which the previous tested display panels belong, the mother board position corresponding to the target area is the closest to the mother board position corresponding to the currently tested display panel.

[0011] Use the target gamma value corresponding to the target area as the initial gamma value of the area to which the currently tested display panel belongs.

[0012] In a possible implementation manner of the first aspect, it further includes: after completing the pattern-on-panel test of the currently tested display panel, save the target gamma value corresponding to the area to which the currently tested display panel belongs.

[0013] In a possible implementation manner of the first aspect, saving the target gamma value corresponding to the area to which the currently tested display panel belongs after completing the pattern-on-panel test of the currently tested display panel includes: After completing the pattern-on-panel test of the currently tested display panel, use the target gamma value corresponding to the area to which the currently tested display panel belongs to overwrite the target gamma value corresponding to the area to which the previous tested display panel belongs that has been saved in the target memory.

[0014] In a possible implementation of the first aspect, it further includes: after completing the pattern test on the surface of the current display panel to be tested, updating the initial gamma value of the area where the current display panel to be tested is located to the target gamma value corresponding to the area where the current display panel to be tested is located.

[0015] In a possible implementation of the first aspect, determining the area where the current display panel to be tested is located includes: Based on the ID information of the current display panel to be tested, obtaining the area where the current display panel to be tested is located.

[0016] In a possible implementation of the first aspect, before determining the area where the current display panel to be tested is located, it further includes: When the display panel to be tested is the first display panel to be tested after the test device is started, determining the area where the first display panel to be tested is located and using the initial default value as the initial gamma value corresponding to the area where the first display panel to be tested is located.

[0017] Based on the initial gamma value corresponding to the area where the first display panel to be tested is located, performing a pattern test on the surface of the first display panel to be tested.

[0018] After the first display panel to be tested completes the pattern test on the surface of the panel, saving the target gamma value corresponding to the area where the first display panel to be tested is located.

[0019] In a possible implementation of the first aspect, before performing the first test display panel, it further includes: In response to the start of the test device, initializing the target gamma values of all areas.

[0020] In a second aspect, an embodiment of the present application provides a device for testing patterns on the surface of a display panel, including: A determination unit, configured to determine the area where the current display panel to be tested is located, where the test order of the current display panel to be tested is greater than or equal to 2.

[0021] A processing unit, configured to update the initial gamma value of the area where the current display panel to be tested is located according to the target gamma value corresponding to the area where the previous display panel to be tested is located based on the absence of an initial gamma value or the initial gamma value being the initial default value in the area where the current display panel to be tested is located. Wherein, the target gamma value corresponding to the area where the previous display panel to be tested is located includes the updated initial gamma value of the area where the current display panel to be tested is located.

[0022] The processing unit is further configured to perform a pattern test on the surface of the current display panel based on the initial gamma value of the area where the current display panel to be tested is located.

[0023] In a third aspect, an embodiment of the present application provides a device for testing a pattern on a display panel, including a memory for storing computer program instructions and a processor for executing the program instructions. When the computer program instructions are executed by the processor, the device is triggered to execute the method provided in the first aspect.

[0024] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, which includes a stored program. When the program runs, it controls the device where the computer-readable storage medium is located to execute the method provided in the first aspect.

[0025] In a fifth aspect, an embodiment of the present application provides a computer program product, which contains executable instructions. When the executable instructions are executed on a computer, the computer is caused to execute the method provided in the first aspect.

[0026] The method provided by the embodiment of the present application can shorten the time for adjusting the initial gamma value to the target gamma value during the test, thereby shortening the overall duration of the test method and improving the test efficiency of the pattern test on the panel. Description of the Drawings

[0027] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0028] Figure 1 It is a schematic diagram of a motherboard provided by an embodiment of the present application; Figure 2 It is a flowchart of a method for testing a pattern on a display panel provided by an embodiment of the present application; Figure 3 It is a flowchart of a method for testing a pattern on a display panel provided by an embodiment of the present application; Figure 4 It is a flowchart of a method for updating the initial gamma value of the area where the current display panel to be tested is located according to the target gamma value corresponding to the area where the previous display panel to be tested is located provided by an embodiment of the present application; Figure 5 It is a schematic diagram of the principle of a method for testing a pattern on a display panel provided by an embodiment of the present application; Figure 6 It is a flowchart of a method for testing a pattern on a display panel provided by an embodiment of the present application; Figure 7 It is a flowchart of a method for saving the target gamma value corresponding to the area of the first display panel to be tested provided by an embodiment of the present application; Figure 8 Schematic diagram of a first test device for a display panel to be tested provided by an embodiment of the present application; Figure 9 Schematic diagram of a pattern test device on a panel of a display panel provided by an embodiment of the present application. Detailed implementation manners

[0029] In order to better understand the technical solution of the present application, the embodiments of the present application will be described in detail below with reference to the accompanying drawings.

[0030] It should be clear that the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present application without creative efforts belong to the scope of protection of the present application.

[0031] The terms used in the embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to limit the present application. The singular forms of "a", "the" and "said" used in the embodiments of the present application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise.

[0032] It should be understood that the term " / and / " used herein is only a description of the association relationship of associated objects, indicating that three relationships may exist. For example, a and / or b may represent: a exists alone, a and b exist simultaneously, and b exists alone. In addition, the character " / " herein generally represents an "or" relationship between the associated objects before and after.

[0033] As Figure 1 shown, in the related art, after the device is started and the received display panel is received, the partition to which the display panel belongs is first determined, and then it is determined whether the initial gamma value of the partition (i.e., the actual gamma value of the previous OTP) is stored on the device. If the initial gamma value is stored, the gamma value is adjusted with the initial gamma value as the initial value until the corresponding target gamma value is adjusted, and the OTP test is completed. If the initial gamma value of the partition does not exist, the system default gamma value is used as the initial gamma value for gamma value adjustment until the corresponding target gamma value is adjusted, and the OTP test is completed. However, in this method, the time required to adjust from the system default gamma value to the corresponding target gamma value is relatively long, resulting in a relatively long OTP test time at the initial stage of device startup.

[0034] In view of this, the embodiments of the present application provide a method, device and equipment for testing patterns on a panel of a display panel to improve the problem of relatively long OTP test time at the initial stage of startup of the test equipment.

[0035] As Figure 2As shown in the figure, a method for testing patterns on a display panel provided by an embodiment of the present application includes: S100. Determine the area to which the currently tested display panel belongs, where the test order of the currently tested display panel is greater than or equal to 2.

[0036] Using the master board mapping algorithm to reduce the OTP time will divide the master board into areas. After the master board is divided into areas, the display panels included in each area are determined. Therefore, the identification information of the display panels included in each area is also determined. For example, as Figure 1 shown, after the master board is divided into areas, the display panels included in area A11 are display panels a to display panel i. In a possible implementation, the master board splitting device can establish a corresponding relationship based on the area and the identification information of the display panels it contains, and transmit the corresponding relationship to the pattern testing device on the panel. Therefore, after the testing machine receives the currently tested display panel, the pattern testing device on the display panel can determine the area to which the currently tested panel belongs through its identification information. In a possible implementation, the identification information is unique, that is, one identification information corresponds to and only corresponds to one display panel.

[0037] In this embodiment, the test order of the currently tested display panel refers to the sorting of the tests of the currently tested display panel, where the first tested display panel refers to the display panel that is tested for the first time after the pattern testing machine on the surface is powered on or restarted. After the first test is completed, the subsequent test orders increase in sequence, such as: the second time, the third time, and so on. The currently tested display panel in step S100 provided by the embodiment of the present application is applicable to the display panels that are tested for the second time and later after the pattern testing machine on the surface is powered on or restarted.

[0038] In a possible implementation, the identification information can be ID (Identity document) information. For example, the ID information is at least one of product number information, two-dimensional code information, and bar code information. Therefore, determining the area to which the currently tested display panel belongs includes: S110. Based on the ID information of the currently tested display panel, obtain the area to which the currently tested display panel belongs.

[0039] According to the corresponding relationship between the ID information and the area, the area to which the currently tested display panel belongs can be obtained through the ID information of the currently tested display panel. In a possible implementation, based on the ID information of the currently tested display panel, obtaining the area to which the currently tested display panel belongs includes: S111. Obtain the ID information of the currently tested display panel.

[0040] In a possible implementation, the ID information of the currently to-be-tested display panel can be obtained through means such as identification information scanning (e.g., barcode, QR code scanning, etc.), RFID (Radio Frequency Identification), image acquisition and recognition, etc.

[0041] S112. Obtain the area to which the currently to-be-tested display panel belongs according to the correspondence between the area and the identification information of the display panel, and the ID information of the currently to-be-tested display panel.

[0042] In a possible implementation, after obtaining the ID information of the currently to-be-tested display panel, by looking up the correspondence between the area and the identification information of the currently to-be-tested display panel, the area to which the currently to-be-tested display panel belongs can be obtained. Among them, the correspondence between the area and the identification information of the display panel can be stored in the memory in the form of a table, an array, or a graph. Among them, the array can be a two-dimensional array.

[0043] In a possible implementation, during the cutting process of the mother board, the area information of the display panel can be directly marked. This marked information is the identification information of the display panel. Therefore, multiple display panels can share one identification information. The area information of the display panel can be marked in the form of a barcode, a QR code, an area number, a preset pattern, etc. Using the area information as the identification information can save the confirmation time of step S100. For example, the area information of the currently to-be-tested display panel can be directly obtained through means such as identification information scanning (e.g., barcode, QR code scanning, etc.), RFID, image acquisition and recognition, etc. Figure 1 For example, during the cutting process of the mother board, the area information A11 to which display panels a - h belong is directly marked in the preset area of the display panel (e.g., marked in the border area, the back, etc.). After the panel pattern testing device receives the to-be-tested display panel, it directly obtains the area to which the display panel belongs through means such as identification information scanning, RFID, image acquisition and recognition, etc.

[0044] As Figure 3 shown, in a possible implementation, after step S100, it further includes: S101. Determine whether there is an initial gamma value in the area to which the currently to-be-tested display panel belongs, or determine whether the initial gamma value of the area to which the currently to-be-tested display panel belongs is the initial default value. Among them, the initial default value is the default gamma value when the surface pattern testing machine is powered on or restarted. In the embodiments of the present application, when the surface pattern testing machine is powered on, the gamma values of all areas are initialized.

[0045] In a possible implementation, initializing the gamma values of all regions includes: clearing the gamma values of all regions; or assigning the gamma values of all regions to the initial default values. Among them, clearing the gamma values of all regions means that the initial gamma values of these regions have not been assigned yet. Assigning the gamma values of all regions to the initial default values means setting the initial gamma values of these regions to the initial default values.

[0046] S102. When there is no initial gamma value in the region to which the current display panel under test belongs or the initial gamma value of the region to which the current display panel under test belongs is the initial default value, execute step S200, and execute step S300 after step 200.

[0047] S103. When there is an initial gamma value in the region to which the current display panel under test belongs and the initial gamma value of the region to which the current display panel under test belongs is different from the initial default value, skip step S200 and directly execute step S300.

[0048] S200. Based on the fact that there is no initial gamma value or the initial gamma value is the initial default value in the region to which the current display panel under test belongs, update the initial gamma value of the region to which the current display panel under test belongs according to the target gamma value corresponding to the region to which the previous display panel under test belongs. Among them, the target gamma value corresponding to the region to which the previous display panel under test belongs includes the updated initial gamma value of the region to which the current display panel under test belongs.

[0049] In step S200, update the initial gamma value of the region to which the current display panel under test belongs to the target gamma value corresponding to the region to which the previous display panel under test belongs. The initial gamma value of the region to which the current display panel under test belongs is the initial gamma value when the test pattern device on the panel tests the current display panel under test.

[0050] The experimental verification results show that, compared with using the initial default value as the initial gamma value of the region to which the current display panel under test belongs, in step S200, assigning the initial gamma value of the region to which the current display panel under test belongs according to the target gamma value corresponding to the region to which the previous display panel under test belongs, the time taken to adjust to its own corresponding target gamma value is significantly shorter than the time taken for the initial default value to adjust to its own corresponding target gamma value. Therefore, step S200 can effectively shorten the time taken for the initial gamma value of the region to which the current display panel under test belongs to adjust to its own corresponding target gamma value.

[0051] In a possible implementation, updating the initial gamma value of the region to which the current display panel under test belongs according to the target gamma value corresponding to the region to which the previous display panel under test belongs includes: S201. Take the target gamma value corresponding to the region to which the previous display panel under test belongs as the initial gamma value of the region to which the current display panel under test belongs.

[0052] The previous display panel to be measured in step S201 refers to the display panel that needs to be tested in the previous test by the pattern test device on the panel. Taking the test order of the current display panel to be measured as N for example, in step S201, the target gamma value corresponding to the area of the display panel in the (N - 1)-th test is used as the initial gamma value of the area of the current display panel to be measured.

[0053] In a possible implementation manner, the target gamma value corresponding to the area of the previous display panel to be measured is the gamma value finally adjusted during the process of testing the previous display panel. Using this gamma value as the initial gamma value corresponding to the area of the current display panel to be measured saves the time from adjusting the initial default value to the initial gamma value corresponding to the area of the current display panel to be measured, thereby shortening the overall test time and improving the test efficiency.

[0054] In step S201, using the target gamma value corresponding to the area of the previous display panel to be measured as the initial gamma value of the area of the current display panel to be measured can help simplify the method process and improve the efficiency.

[0055] As Figure 4 shown, in a possible implementation manner, updating the initial gamma value of the area of the current display panel to be measured according to the target gamma value corresponding to the area of the previous display panel to be measured includes: S210. Determine a target area in the area of the previous display panel to be measured according to the area of the current display panel to be measured. Among them, in all areas of the previous display panel to be measured, the mother board position corresponding to the target area is the closest to the mother board position corresponding to the current display panel to be measured.

[0056] In step S210, after obtaining the area of the current display panel to be measured, by comparing the distance between the area of the current display panel to be measured and the area of the previous display panel to be measured on the mother board, and selecting the one with the closest mother board position corresponding to it in the area of the previous display panel to be measured as the target area. Taking Figure 1 as an example, and taking the area of the previous display panel to be measured including area A21, area A22, A1n, and Amn, and the current display panel to be measured is display panel a for illustration: the area of the current display panel to be measured is display panel a and its area is A11, the area of the previous display panel to be measured includes area A21, area A22, A1n, and Amn. It can be clearly known from Figure 1 that area A21 is the closest to area A11. Therefore, area A21 is the target area.

[0057] In a possible implementation, the distance between the motherboard position corresponding to the target area and the motherboard position corresponding to the current display panel to be tested refers to the distance between their central positions; where the central position is the central position of its shape. For example, if the shape of the area is a rectangle, the central position is the intersection point of the two diagonals. If the shape of the area is a circle, the central position is the center of the circle.

[0058] In a possible implementation, among all the areas to which the previous display panels to be tested belong, there are at least two areas that are the closest to the motherboard position corresponding to the current display panel to be tested. Any one of these areas can be randomly selected as the target area. For example, the current display panel to be tested is display panel a, and the area to which display panel a belongs is A11. The areas to which the previous display panels to be tested belong include areas A12, A21, A22, A1n, and Amn. Among them, areas A12 and A21 are the closest to area A11 and both are adjacent to area A11. Therefore, either area A12 or area A21 can be randomly selected as the target area.

[0059] In a possible implementation, among all the areas to which the previous display panels to be tested belong, there are at least two areas that are the closest to the motherboard position corresponding to the current display panel to be tested. The area with the center position closer to the center position of the current display panel to be tested can be selected as the target area. If there are at least two areas with the center position closer to the center position of the current display panel to be tested, any one of these areas can be randomly selected as the target area. In a possible implementation, the center position of the display panel is the center point of its shape. For example, if the shape of the display panel is a rectangle, its center position is the intersection position of the two diagonals. If the display panel is a circle, its center position is the center of the circle. For example, the current display panel to be tested is display panel g, and the area to which display panel g belongs is A11. The areas to which the previous display panels to be tested belong include areas A12, A21, A22, A1n, and Amn. Among them, areas A12 and A21 are the closest to area A11 and both are adjacent to area A11. However, area A21 is closer to the center position x of display panel g, so area A21 is selected as the target area. Another example, the current display panel to be tested is display panel h, and the area to which display panel h belongs is A11. The areas to which the previous display panels to be tested belong include areas A12, A21, A22, A1n, and Amn. Among them, areas A12 and A21 are the closest to area A11 and both are adjacent to area A11. However, the distances from areas A21 and A12 to the center position y of display panel h are equal, so either area A21 or area A12 can be randomly selected as the target area.

[0060] In a possible implementation, the position of the mother board corresponding to the target area is the distance between the center position of the display panel to be measured corresponding to the target area and the center position of the current display panel to be measured from the position of the mother board corresponding to the current display panel to be measured. Among them, the display panel to be measured corresponding to the target area refers to the display panel characterized by the target gamma value of this area as of the current moment, for example, the display panel of the last test in this area. For example, the current display panel to be measured is display panel h, the area to which display panel h belongs is A11, the areas to which the previous display panels to be measured belong include area A12, area A21, area A22, A1n, and Amn. Among them, the display panel of the last test in area A12 is display panel j, the display panel of the last test in area A21 is display panel k, and the distance d1 between the center position s of display panel j and the center position y of display panel h is less than the distance d2 between the center position s of display panel k and the center position y of display panel h, then area A12 is selected as the target area. In this implementation, the position of the mother board corresponding to the target area is the distance between the center position of the display panel to be measured corresponding to the target area and the center position of the current display panel to be measured, which can make the process corresponding to the target area closer to the process corresponding to the current display panel to be measured, thereby making the initial gamma value corresponding to the current display panel to be measured more reasonable.

[0061] S220. Use the target gamma value corresponding to the target area as the initial gamma value of the area to which the current display panel to be measured belongs.

[0062] The target area is close to the current display panel to be tested, which means that the process difference between the display panels in the target area and the current display panel to be measured is small, so that the target gamma values corresponding to the two are relatively close. Therefore, using the target gamma value corresponding to the target area as the initial gamma value of the area to which the current display panel to be measured belongs can further optimize the adjustment time of the gamma value of the area to which the display panel to be measured belongs, thereby facilitating the shortening of the test time and improving the test efficiency.

[0063] S300. Based on the initial gamma value of the area to which the current display panel to be measured belongs, perform a pattern test on the current display panel on the panel.

[0064] In step S300, starting from the initial gamma value of the area to which the current display panel to be measured belongs, perform a pattern test on the current display panel on the panel, and during the test, adjust the gamma value of the area to which the current display panel to be measured belongs until the gamma value of the area to which the display panel to be measured belongs meets the test requirements for performing a pattern test on the display panel on the panel. At this time, the gamma value of the area to which the display panel belongs is its target gamma value.

[0065] Combined with Figure 5 and Figure 6, an embodiment of the present application further provides a method for testing patterns on a display panel, including: 010. In response to the startup of the test device, initialize the target gamma value of all regions.

[0066] In a possible implementation, initializing the gamma value of all regions includes: clearing the gamma value of all regions; or assigning the gamma value of all regions to the initial default value. Here, clearing the gamma value of all regions means that the initial gamma value of this region has not been assigned yet. Assigning the gamma value of all regions to the initial default value means setting the initial gamma value of this region to the initial default value.

[0067] S020. When the display panel to be tested is the first display panel to be tested after the startup of the test device, determine the region to which the first display panel to be tested belongs, and use the initial default value as the initial gamma value corresponding to the region to which the first display panel to be tested belongs. Based on the initial gamma value corresponding to the region to which the first display panel to be tested belongs, perform a pattern test on the first display panel. After the first display panel to be tested completes the pattern test on the panel, save the target gamma value corresponding to the region to which the first display panel to be tested belongs.

[0068] After step S020 is executed, jump to step S050. As Figure 7 shown, after the first display panel to be tested completes the pattern test on the panel, saving the target gamma value corresponding to the region to which the first display panel to be tested belongs includes: 021. After completing the pattern test on the surface of the first display panel to be tested, save the target gamma value corresponding to the region to which the first display panel to be tested belongs to the target memory.

[0069] In step S021, the target gamma value corresponding to the region to which the first tested display panel to be tested belongs is stored in the target memory. For easy distinction, the target memory used to store the target gamma value corresponding to the region to which the last tested display panel to be tested belongs can be the first memory.

[0070] The target gamma value corresponding to the region to which the first tested display panel to be tested belongs can be used as the initial gamma value of the next tested display panel, thereby shortening the debugging time of the gamma value during the next test.

[0071] 022. After completing the pattern test on the surface of the first display panel to be tested, update the initial gamma value of the region to which the first display panel to be tested belongs to the target gamma value corresponding to the region to which the first display panel to be tested belongs.

[0072] In step 022, the initial gamma value of the area to which the display panel to be tested for the first time belongs is assigned the target gamma value corresponding to the area to which the display panel to be tested for the first time belongs. Therefore, in step S022, the re - assignment of the initial gamma value of the area to which the display panel to be tested for the first time belongs is realized, facilitating the subsequent gamma value debugging after testing.

[0073] It should be noted that there is no order of execution between step S021 and step S022. For example, as Figure 7 shown, step S021 can be executed first and then step S022. Or, in a possible implementation, step S021 and step S022 can be executed in parallel.

[0074] 030. Determine the area to which the current display panel to be tested belongs, where the test order of the current display panel to be tested is greater than or equal to 2.

[0075] For the specific implementation process of step 030, reference can be made to step S100, which will not be elaborated here.

[0076] In a possible implementation, after step S010, it further includes: S031. Determine whether there is an initial gamma value in the area to which the current display panel to be tested belongs, or determine whether the initial gamma value of the area to which the current display panel to be tested belongs is the initial default value.

[0077] For the specific implementation process of step S031, reference can be made to step S101, which will not be elaborated here.

[0078] S032. When there is no initial gamma value in the area to which the current display panel to be tested belongs or the initial gamma value of the area to which the current display panel to be tested belongs is the initial default value, execute step S040, and after step 040, execute step S050 and the steps after step S050.

[0079] S033. When there is an initial gamma value in the area to which the current display panel to be tested belongs and the initial gamma value of the area to which the current display panel to be tested belongs is different from the initial default value, skip step S040, directly execute step S050, and after executing step S050, execute the steps after S050.

[0080] 040. Based on the fact that there is no initial gamma value or the initial gamma value is the initial default value in the area to which the current display panel to be tested belongs, update the initial gamma value of the area to which the current display panel to be tested belongs according to the target gamma value corresponding to the area to which the previous display panel to be tested belongs; where the target gamma value corresponding to the area to which the previous display panel to be tested belongs includes the updated initial gamma value of the area to which the current display panel to be tested belongs.

[0081] The specific implementation process of step 040 can refer to step S200, which will not be elaborated here.

[0082] 050. Perform a pattern test on the current display panel to be tested based on the initial gamma value of the area to which the current display panel to be tested belongs.

[0083] The specific implementation process of step 050 can refer to step S300, which will not be elaborated here.

[0084] 060. After completing the pattern test on the surface of the current display panel to be tested, save the target gamma value corresponding to the area to which the current display panel to be tested belongs.

[0085] For the convenience of the next test, after the current test is completed, it is necessary to save the target gamma value corresponding to the area to which the current display panel to be tested belongs. The target gamma value corresponding to the area to which the current display panel to be tested belongs can provide a data basis for the next test, so as to shorten the overall time of the pattern test on the panel.

[0086] In a possible implementation manner, after completing the pattern test on the surface of the current display panel to be tested, saving the target gamma value corresponding to the area to which the current display panel to be tested belongs includes: S061. After completing the pattern test on the surface of the current display panel to be tested, use the target gamma value corresponding to the area to which the current display panel to be tested belongs to overwrite the target gamma value corresponding to the area of the previous display panel to be tested that has been saved in the target memory.

[0087] In step S061, the target storage is the first memory provided in the foregoing embodiment. The first memory stores the target gamma value corresponding to the area of the display panel to be tested in the last test.

[0088] The target gamma value corresponding to the area to which the current display panel to be tested belongs can be the initial gamma value of the display panel to be tested in the next test, thereby shortening the debugging time of the gamma value in the next test process.

[0089] 062. After completing the pattern test on the surface of the current display panel to be tested, update the initial gamma value of the area to which the current display panel to be tested belongs to the target gamma value corresponding to the area to which the current display panel to be tested belongs.

[0090] In step 062, the initial gamma value of the area to which the current display panel to be tested belongs is assigned the target gamma value corresponding to the area to which the current display panel to be tested belongs. Therefore, in step S062, the initial assignment or re-update assignment of the initial gamma value of the area to which the current display panel to be tested belongs is realized, which is convenient for the gamma value debugging after subsequent tests.

[0091] It should be noted that there is no sequence requirement for the execution of step S061 and step S062. For example, in a possible implementation, step S061 and step S062 can be executed in parallel.

[0092] In the method provided by the embodiment of the present application, when the initial gamma value of the area where the current display panel to be tested is located exists and is not the initial default value, and at this time, the initial gamma value of the area where the current display panel to be tested is located is the target gamma value of the last test in its area. Since the target gamma values corresponding to the display panels in the same area are not very different, therefore, using the target gamma value of the last test in the area where the current display panel to be tested is located as the initial gamma value of the display panel to be tested in the current test can effectively shorten the debugging time of the gamma value, thereby saving the test time. When the initial gamma value of the area where the current display panel to be tested is located does not exist or the initial gamma value is the initial default value, the target gamma value of the area of the previous display panel to be tested is used as the initial gamma value of the area where the current display panel to be tested is located. The experimental results show that the distance between the target gamma value of the area of the previous display panel to be tested and the target gamma value is less than the distance between the initial default value and the target gamma value. Therefore, using the target gamma value of the area of the previous display panel to be tested as the initial gamma value of the area where the current display panel to be tested is located can help shorten the debugging time of the gamma value, thereby improving the test efficiency.

[0093] In summary, as Figure 5 shown, in the method provided by the embodiment of the present application, only the initial default value is used as the gamma initial value for the first time. During the subsequent test process, the target gamma value corresponding to the last tested display panel is used as the initial gamma value, or the target gamma value corresponding to the last tested display panel in the area where the current display panel to be tested is located is used as the initial value. The distances between these two initial gamma values and their corresponding target gamma values are both less than the distance between the initial default value and the target gamma value, thereby being able to shorten the test time and improve the test efficiency.

[0094] As Figure 8As shown in the figure, an on-panel pattern testing device 100 for a display panel provided by an embodiment of the present application includes a determination unit 101 and a processing unit 102. Among them, the determination unit 101 is configured to determine the area to which the currently tested display panel belongs, where the test order of the currently tested display panel is greater than or equal to 2. The processing unit 102 is configured to update the initial gamma value of the area to which the currently tested display panel belongs based on the non-existence of the initial gamma value or the initial gamma value being the initial default value in the area to which the currently tested display panel belongs, according to the target gamma value corresponding to the area to which the previously tested display panel belongs. Among them, the target gamma value corresponding to the area to which the previously tested display panel belongs includes the updated initial gamma value of the area to which the currently tested display panel belongs. The processing unit 103 is further configured to perform on-panel pattern testing on the currently tested display panel based on the initial gamma value of the area to which the currently tested display panel belongs.

[0095] The on-panel pattern testing device provided by the embodiment of the present application can shorten the time for adjusting the initial gamma value to the target gamma value during the test, thereby shortening the overall duration of the test method and improving the test efficiency of on-panel pattern testing.

[0096] In a possible implementation manner, the determination unit 101 is further configured to implement the steps S110, S111, S112, S101, and S031 mentioned in the foregoing embodiments.

[0097] In a possible implementation manner, the processing unit 102 is further configured to implement the steps S102, S103, S210, S021, S022, S32, S033, S050, S060, S061, and S062 mentioned in the foregoing embodiments.

[0098] An embodiment of the present application further provides an on-panel pattern testing device for a display panel, including a memory for storing computer program instructions and a processor for executing the program instructions. Among them, when the computer program instructions are executed by the processor, the device is triggered to execute the on-panel pattern testing method for a display panel provided in any of the foregoing embodiments.

[0099] As Figure 9 shown, in a possible implementation manner, an on-panel pattern testing device 200 for a display panel may include a processor 201, a memory 202, and a communication unit 203. These components communicate through one or more buses. Those skilled in the art can understand that the structure of the server shown in the figure does not constitute a limitation on the embodiments of the present invention. It can be a bus structure, a star structure, and can also include more or fewer components than shown in the figure, or combine certain components, or have different component arrangements.

[0100] Among them, the communication unit 203 is used to establish a communication channel, so that the storage device can communicate with other devices. It receives user data sent by other devices or sends user data to other devices.

[0101] The processor 201 is the control center of the storage device. It connects various parts of the entire electronic device through various interfaces and circuits. By running or executing software programs and / or modules stored in the memory 202, and by calling the data stored in the memory, it executes various functions of the electronic device and / or processes data. The processor can be composed of an integrated circuit (IC). For example, it can be composed of a single packaged IC, or can be composed of multiple packaged ICs with the same or different functions connected together. For example, the processor 201 may only include a central processing unit (CPU). In the embodiments of the present invention, the CPU can be a single arithmetic core or can include multiple arithmetic cores.

[0102] The memory 202 is used to store the execution instructions of the processor 201. The memory 202 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0103] When the execution instructions in the memory 202 are executed by the processor 201, the embedded device 200 is enabled to execute Figure 6 Some or all of the steps in the illustrated embodiments.

[0104] This application also provides a computer storage medium. Among them, this computer storage medium can store a program, and when the program is executed, it can include some or all of the steps in the embodiments of the pattern testing method for the display panel provided by this application. The storage medium can be a magnetic disk, an optical disk, a read-only memory (ROM), a random access memory (RAM), etc.

[0105] Those skilled in the art can clearly understand that the technology in the embodiments of the present invention can be implemented by means of software plus a necessary general hardware platform. Based on such an understanding, the technical solutions in the embodiments of the present invention, in essence, or the part that contributes to the prior art can be embodied in the form of a software product. This computer software product can be stored in a storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in various embodiments or some parts of the embodiments of the present invention.

[0106] The embodiments of the present application also provide a computer program product. The computer program product includes executable instructions. When the executable instructions are executed on a computer, the computer is caused to execute some or all of the steps in the embodiments of the method for testing patterns on the display panel.

[0107] For the same or similar parts among the various embodiments in this specification, reference can be made to each other. In particular, for the device embodiments and the terminal embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and for the relevant parts, reference can be made to the description in the method embodiments.

Claims

1. A method for testing patterns on a display panel, characterized in that, Including: Determine the area to which the current display panel to be tested belongs, where the test order of the current display panel to be tested is greater than or equal to 2; Based on the fact that there is no initial gamma value or the initial gamma value is the initial default value in the area to which the current display panel to be tested belongs, update the initial gamma value of the area to which the current display panel to be tested belongs according to the target gamma value corresponding to the area to which the previous display panel to be tested belongs; among them, the target gamma value corresponding to the area to which the previous display panel to be tested belongs includes the updated initial gamma value of the area to which the current display panel to be tested belongs; Based on the initial gamma value of the area to which the current display panel to be tested belongs, perform a pattern test on the patterns on the current display panel to be tested.

2. The method according to claim 1, characterized in that, The updating the initial gamma value of the area to which the current display panel to be tested belongs according to the target gamma value corresponding to the area to which the previous display panel to be tested belongs includes: Taking the target gamma value corresponding to the area to which the previous display panel to be tested belongs as the initial gamma value of the area to which the current display panel to be tested belongs.

3. The method according to claim 1, wherein The updating the initial gamma value of the area to which the current display panel to be tested belongs according to the target gamma value corresponding to the area to which the previous display panel to be tested belongs includes: According to the area to which the current display panel to be tested belongs, determine a target area in the area to which the previous display panel to be tested belongs; among all the areas to which the previous display panels to be tested belong, the mother board position corresponding to the target area is the closest to the mother board position corresponding to the current display panel to be tested; Taking the target gamma value corresponding to the target area as the initial gamma value of the area to which the current display panel to be tested belongs.

4. The method according to claim 1, wherein Also including: After completing the pattern test on the surface of the current display panel to be tested, save the target gamma value corresponding to the area to which the current display panel to be tested belongs.

5. The method according to claim 4, characterized in that The saving the target gamma value corresponding to the area to which the current display panel to be tested belongs after completing the pattern test on the surface of the current display panel to be tested includes: After completing the pattern test on the surface of the current display panel to be tested, overwrite the target gamma value corresponding to the area to which the previous display panel to be tested saved in the target memory with the target gamma value corresponding to the area to which the current display panel to be tested belongs.

6. The method according to claim 1, characterized in that, Also including: After completing the pattern test on the surface of the current display panel to be tested, update the initial gamma value of the area to which the current display panel to be tested belongs to the target gamma value corresponding to the area to which the current display panel to be tested belongs.

7. The method according to claim 1, characterized in that, Determining the area to which the current display panel to be tested belongs includes: Based on the ID information of the current display panel to be tested, obtain the area to which the current display panel to be tested belongs.

8. The method according to claim 1, characterized in that Before determining the area to which the current display panel to be tested belongs, it also includes: When the display panel to be tested is the first display panel to be tested after the test equipment is started, determine the area to which the first display panel to be tested belongs and take the initial default value as the initial gamma value corresponding to the area to which the first display panel to be tested belongs; Based on the initial gamma value corresponding to the area to which the first display panel to be tested belongs, perform a pattern test on the patterns on the first display panel to be tested; After the first display panel to be tested completes the pattern test on the patterns on the surface, save the target gamma value corresponding to the area to which the first display panel to be tested belongs.

9. The method according to claim 8, wherein Before performing the first test on the display panel, it also includes: In response to the startup of the test device, the target gamma values of all regions are initialized.

10. A pattern testing device on a display panel of a display panel, characterized in that, Including: A determination unit for determining the region to which the currently tested display panel belongs, where the test order of the currently tested display panel is greater than or equal to 2; A processing unit for updating the initial gamma value of the region to which the currently tested display panel belongs based on the absence of an initial gamma value or the initial gamma value being the initial default value in the region to which the currently tested display panel belongs, according to the target gamma value corresponding to the region to which the previously tested display panel belongs; wherein, the target gamma value corresponding to the region to which the previously tested display panel belongs includes the updated initial gamma value of the region to which the currently tested display panel belongs; The processing unit is further configured to perform a pattern test on the panel of the currently tested display panel based on the initial gamma value of the region to which the currently tested display panel belongs.

11. A panel pattern testing device for a display panel, characterized in that, Including a memory for storing computer program instructions and a processor for executing the program instructions, wherein when the computer program instructions are executed by the processor, the device is triggered to execute the method according to any one of claims 1-9.

12. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes a stored program, wherein when the program runs, it controls the device where the computer-readable storage medium is located to execute the method according to any one of claims 1-9.

13. A computer program product, characterized in that, The computer program product contains executable instructions, and when the executable instructions are executed on a computer, the computer is caused to execute the method according to any one of claims 1 to 9.

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