FTA failure quantitative analysis method and device, medium and product
By constructing the FTA failure quantification analysis method, using the failure library events and logic gate conversion rules to generate a fault tree, calculate the unreliability, solving the problem of time-consuming and inefficient traditional FTA methods, and achieving efficient and accurate failure analysis.
Patent Information
- Application Number
- CN202510399986.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-31
- Publication Date
- 2025-07-18
AI Technical Summary
Traditional FTA methods take time and are inefficient in analyzing complex systems, and the analysis results are prone to deviations and omissions, making it difficult to fully cover the failure risk of key components in a short development cycle.
By obtaining the events corresponding to the FTA number from the failure library, building top events, intermediate events and basic events, generating initial fault trees, and using logic gate conversion rules and Boolean algebra methods to generate specifications and simplifying fault trees, calculating unreliability, and generating FTA qualitative reports.
It improves the efficiency and accuracy of FTA failure analysis, ensures that key components are not missed, and the analysis results are more standardized and reliable.
Smart Images
Figure CN120337537A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of FTA reliability analysis, and particularly to a method, device, medium, and product for FTA failure quantification analysis. Background Art
[0002] In current engineering applications, traditional FTA methods are mostly used to strictly enumerate failure modes and their impact consequences layer by layer from bottom to top for specific product objects, aiming to comprehensively sort out potential weak risk points and failure correlation characteristics at the device level, circuit level, module level, equipment level, and up to the system level. However, this method has a large workload and long duration, and the exhaustive analysis method cannot cover the typical failure risks and user concerns during a short development cycle; in the personalized analysis mode, there are subjective differences in the failure judgment criteria and their understanding among reliability personnel, and the analysis results of products with the same function but different hardware diverge, and it is very easy to have deviations, omissions, or even errors in the sorting of failure modes, resulting in poor analysis efficiency, standardization, and accuracy; the sorting of data streams related to function decomposition and failure transmission depends on physical hardware, and the related design and analysis are relatively lagging, making it difficult for fault detection and testability design to intervene in a timely manner.
[0003] As can be seen from the above, when the system is extremely large and complex, its analysis consumes a lot of manpower and financial resources, and the analysis cycle is relatively long, which seriously affects the product development cycle. At the same time, during the analysis, the analysis of key components will be missed, which will affect the analysis results. Summary of the Invention
[0004] The purpose of this application is to provide a method, device, medium, and product for FTA failure quantification analysis, which can improve the efficiency and accuracy of failure analysis.
[0005] To achieve the above purpose, this application provides the following solutions:
[0006] In the first aspect, this application provides a method for FTA failure quantification analysis, and the FTA failure quantification analysis method includes:
[0007] Determine the object to be analyzed;
[0008] According to the object to be analyzed, obtain the event corresponding to the FTA number from the failure library and use it as the top event;
[0009] Determine intermediate events and basic events in sequence according to the top event;
[0010] Determine the initial fault tree according to the top event, intermediate events, and basic events;
[0011] Determine the unavailability according to the failure rate and working time of the initial fault tree;
[0012] Generate an FTA qualitative report according to the unavailability.
[0013] Optionally, determining intermediate events and basic events in sequence according to the top event specifically includes:
[0014] According to the top event, obtain the event corresponding to the FTA number from the failure library and determine the failure category as the intermediate event;
[0015] According to the intermediate event, obtain the event corresponding to the FTA number from the failure library and determine the failure category as the basic event.
[0016] Optionally, before determining the initial fault tree according to the top event, intermediate events and basic events, it further includes:
[0017] Associate transfer events according to the top event or intermediate event;
[0018] Obtain the initial fault tree of the transfer event according to the FTA number of the associated transfer event.
[0019] Optionally, after determining the initial fault tree according to the top event, intermediate events and basic events, it further includes:
[0020] Conduct FMEA analysis on the initial fault tree, determine the measures corresponding to the failures, and display them on the initial fault tree;
[0021] Determine the fault causes according to empirical knowledge and display the fault causes on the initial fault tree.
[0022] Optionally, after determining the initial fault tree according to the top event, intermediate events and basic events, it further includes:
[0023] Generate a standard fault tree from the initial fault tree using transformation rules; the transformation rules include: logic gate transformation rules;
[0024] Generate a simplified fault tree from the standard fault tree using simplification rules; the simplification rules include: Boolean algebra method.
[0025] Optionally, determining the unavailability according to the failure rate and working time of the initial fault tree specifically includes:
[0026] F(t) = 1 - e -λt ;
[0027] where F(t) is the unavailability, λ is the failure rate, t is the working time, and e is the natural logarithm.
[0028] In a second aspect, the present application provides an FTA failure quantification analysis device, and the FTA failure quantification analysis device includes:
[0029] An object-to-be-analyzed determination module, configured to determine an object to be analyzed;
[0030] The top event determination module is used to obtain the event corresponding to the FTA number from the failure library according to the object to be analyzed, and use it as the top event;
[0031] The intermediate event and basic event determination module is used to sequentially determine intermediate events and basic events according to the top event;
[0032] The initial fault tree determination module is used to determine the initial fault tree according to the top event, intermediate events and basic events;
[0033] The unavailability determination module is used to determine the unavailability according to the failure rate and working time of the initial fault tree;
[0034] The FTA qualitative report generation module is used to generate an FTA qualitative report according to the unavailability.
[0035] Thirdly, the present application provides a computer device, including: a memory, a processor, and a computer program stored on the memory and executable on the processor, and the processor executes the computer program to implement the FTA failure quantification analysis method.
[0036] Fourthly, the present application provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the FTA failure quantification analysis method is implemented.
[0037] Fifthly, the present application provides a computer program product, including a computer program, and when the computer program is executed by a processor, the FTA failure quantification analysis method is implemented.
[0038] According to the specific embodiments provided by the present application, the following technical effects are disclosed in the present application:
[0039] The present application provides an FTA failure quantification analysis method, device, medium and product. By obtaining the event corresponding to the FTA number from the failure library and using it as the top event, and sequentially creating intermediate events and basic events, and then determining the unavailability according to the initial fault tree determined by the top event, intermediate events and basic events, the FTA failure quantification analysis is realized; furthermore, an FTA qualitative report is generated according to the unavailability, so that the analysis of key components will not be missed during the analysis, and the efficiency and accuracy of failure analysis can be improved. Description of the Drawings
[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.
[0041] Figure 1 It is a schematic flow chart of an FTA failure quantification analysis method provided by an embodiment of the present application;
[0042] Figure 2 It is a schematic diagram of a top event;
[0043] Figure 3 It is a schematic diagram of an intermediate event;
[0044] Figure 4 It is a schematic diagram of a basic event;
[0045] Figure 5 It is a schematic diagram of an intermediate event when the logical relationship is a voting gate;
[0046] Figure 6 It is a schematic diagram of an associated transfer event;
[0047] Figure 7 It is a schematic diagram for showing failure causes;
[0048] Figure 8 It is a schematic diagram of a standard fault tree;
[0049] Figure 9 It is a schematic diagram of a simplified fault tree;
[0050] Figure 10 It is a schematic diagram of a simplified fault tree generated from basic events. Specific embodiments
[0051] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.
[0052] To make the above objects, features, and advantages of the present application more obvious and understandable, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0053] In an exemplary embodiment, as Figure 1 shown, an FTA failure quantification analysis method is provided. This method is executed by a computer device, and specifically, it can be executed alone by a computer device such as a terminal or a server, or jointly executed by a terminal and a server. In the embodiments of the present application, this method includes the following S101 to S106. Among them:
[0054] S101, determine the object to be analyzed; the name of the part / product corresponding to the object to be analyzed can be selected from the product library or a new product can be directly created.
[0055] S102. Obtain the event corresponding to the FTA number from the failure library based on the object to be analyzed, and use it as the top event, as shown in Figure 2 the following;
[0056] S103. Determine the intermediate events and basic events in sequence according to the top event. Both the intermediate events and the basic events include information such as event number, event description, logic gate, and event type. The logical relationships between the intermediate events include, but are not limited to: AND gate, OR gate, inhibit gate, exclusive OR gate, sequential AND gate, and voting gate;
[0057] As shown in Figure 5 the following, when the logical relationship is a voting gate, determine the number of events (r) that occur simultaneously in the voting gate. Definition of the voting gate: The output event occurs only when r or more than r of the n input events occur. The OR gate and the AND gate are special cases of the voting gate. The OR gate is a voting gate with r = 1, and the AND gate is a voting gate with r = n.
[0058] When the logical relationship is an inhibit gate or a sequential AND gate, select or create a failure from the failure library as a conditional event.
[0059] S103 specifically includes:
[0060] According to the top event, obtain the event corresponding to the FTA number from the failure library, and determine the failure category as an intermediate event, as shown in Figure 3 the following;
[0061] According to the intermediate event, obtain the event corresponding to the FTA number from the failure library, and determine the failure category as a basic event, as shown in Figure 4 the following.
[0062] S104. Determine the initial fault tree according to the top event, intermediate events, and basic events;
[0063] Before S104, it also includes:
[0064] Associate transfer events according to the top event or intermediate event;
[0065] Obtain the initial fault tree of the transfer event according to the FTA number of the associated transfer event, as shown in Figure 6 the following.
[0066] After S104, it also includes:
[0067] Perform FMEA analysis on the initial fault tree, determine the corresponding measures for failures, and display them on the initial fault tree; FMEA analysis is divided into DFMEA analysis and PFMEA analysis; there are product nodes with failure nets in DFMEA and PFMEA. Expand the product nodes, and according to the determined failures and associated lower-level failures, they will be displayed in the current event and lower-level events of the initial fault tree, and the measures corresponding to the failures in FMEA are displayed in the current measures or optimized measures of FTA.
[0068] As Figure 7 shown, determine the fault causes according to empirical knowledge (manufacturing reasons or design reasons), and display the fault causes on the initial fault tree.
[0069] As Figure 8 shown, generate a standardized fault tree from the initial fault tree using transformation rules; the transformation rules include: logic gate transformation rules; for example, the logic gate transformation rule is to transform special logic gates in the initial fault tree into AND gates and OR gates according to the rules; the NOT gate indicates that the output event is the opposite event of the input event; the sequence AND gate indicates that the output event occurs only when the input events occur in the specified order; when selecting the sequence AND gate, the sequence condition event and the failure rate need to be input, and the sequence condition becomes a bottom event when transforming the standardized fault tree; the exclusive OR gate indicates that the output event occurs only when a single input event occurs; the exclusive OR gate transformation principle: the original output event (A) remains unchanged, the exclusive OR gate becomes an OR gate, the OR gate is connected to two intermediate events (A1 / A2) below, the two intermediate events are connected to AND gates below, and each AND gate is respectively connected to an original input event (B / C) and a NOT gate below, and the NOT gate is connected to another original input event (C / B) below; the inhibit gate indicates that the occurrence of the input event causes the occurrence of the output event only when the condition event occurs; the inhibit gate transformation principle: the original output event (A) remains unchanged, the inhibit gate is transformed into an AND gate, and there are two inputs below the AND gate, one is the original input event (B), and the other is the inhibit gate condition event (C); the voting gate indicates that the output event occurs only when r or more than r events occur among n input events. The OR gate and the AND gate are special cases of the voting gate, the OR gate is a voting gate with r = 1, and the AND gate is a voting gate with r = n; the voting gate transformation principle: for an r / n voting gate, the original output event is connected to an OR gate below, and there are C_n^r input events below the OR gate, and each input event is connected to an AND gate below, and each AND gate has r original input events below.
[0070] As Figure 9 shown, generate a simplified fault tree from the standardized fault tree using simplification rules; the simplification rules include: the Boolean algebra method.
[0071] The structural formula of the standardized fault tree: G001 = M001 + M002 = (B001 + B002) + (B003 * B002); where, the AND gate is connected with a multiplication sign, the OR gate is connected with a plus sign, and it is decomposed from the top event to the basic event;
[0072] The Boolean algebra method is as follows:
[0073] Associative law: (a + b) + c = a + (b + c), (a · b) · c = a · (b · c);
[0074] Commutative law: a + b = b + a, a · b = b · a;
[0075] Distributive law: a · (b + c) = (a · b) + (a · c), (a + b) · c = (a · c) + (b · c);
[0076] Absorption law: a + a · b = a, a · (a + b) = a;
[0077] Idempotent law: a + a = a, a · a = a;
[0078] The structural formula simplified by the Boolean algebra method is:
[0079] (B001 + B002) + (B003 * B002) = B001 + B002;
[0080] The minimal cut sets are (B001), (B002); each item in the minimal cut sets is used as a basic event to generate a simplified fault tree, as Figure 10 shown; if there is a union of multiple events in the minimal cut sets, such as (B001, B002, B003), it is connected by an AND gate and shown in the simplified fault tree.
[0081] S105, determine the unavailability according to the failure rate and working time of the initial fault tree; the unavailability is finally shown on the basic events of the initial fault tree;
[0082] S105 specifically includes:
[0083] F(t) = 1 - e -λt ;
[0084] where F(t) is the unavailability, λ is the failure rate, t is the working time, e is the natural logarithm, ≈2.7182818284590452353602874713526624977572470936999595749669676277240766303535475945713821785251664274.
[0085] Calculate the unavailability of the top event through the unavailability of the basic events and display it in scientific notation.
[0086] The average failure rate of the top event is the quotient of the unavailability of the top event and the working time;
[0087] S106. Generate an FTA qualitative report based on the unreliability.
[0088] Based on the same inventive concept, an embodiment of the present application further provides an FTA failure quantification analysis device for implementing the FTA failure quantification analysis method involved above. The solution provided by this device to solve the problem is similar to the solution recorded in the above method. Therefore, the specific limitations in one or more embodiments of the FTA failure quantification analysis device provided below can refer to the limitations on the FTA failure quantification analysis method in the above text, and will not be elaborated here.
[0089] In an exemplary embodiment, an FTA failure quantification analysis device is provided, including:
[0090] An object-to-be-analyzed determination module, configured to determine the object to be analyzed;
[0091] A top event determination module, configured to obtain the event corresponding to the FTA number from the failure library according to the object to be analyzed, and use it as the top event;
[0092] An intermediate event and basic event determination module, configured to sequentially determine intermediate events and basic events according to the top event;
[0093] An initial fault tree determination module, configured to determine an initial fault tree according to the top event, intermediate events, and basic events;
[0094] An unreliability determination module, configured to determine the unreliability according to the failure rate and working time of the initial fault tree;
[0095] An FTA qualitative report generation module, configured to generate an FTA qualitative report based on the unreliability.
[0096] In an exemplary embodiment, a computer device is provided. The computer device can be a server or a terminal. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O), and a communication interface. Among them, the processor, memory, and input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and computer program in the non-volatile storage medium. The input / output interface of the computer device is used for exchanging information between the processor and external devices. The communication interface of the computer device is used for communicating with an external terminal through a network connection. When the computer program is executed by the processor, it implements an FTA failure quantification analysis method.
[0097] In an exemplary embodiment, a computer-readable storage medium is provided, storing a computer program, which when executed by a processor, implements the steps in the above method embodiments.
[0098] In an exemplary embodiment, a computer program product is provided, including a computer program, which when executed by a processor, implements the steps in the above method embodiments.
[0099] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use, and processing of relevant data need to comply with relevant regulations.
[0100] Those of ordinary skill in the art can understand that all or part of the processes in the above method embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the above method embodiments. Among them, any reference to a memory, database, or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memories. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc.
[0101] In each of the embodiments provided in this application, the database involved may include at least one of a relational database and a non-relational database. The non-relational database may include a distributed database based on blockchain, etc., and is not limited thereto. In each of the embodiments provided in this application, the processor involved may be a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., and is not limited thereto.
[0102] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered to be within the scope described in this specification.
[0103] Specific examples are used in this article to elaborate on the principles and implementation manners of this application. The description of the above embodiments is only used to help understand the method and its core idea of this application; at the same time, for those of ordinary skill in the art, according to the idea of this application, there will be changes in the specific implementation manners and application scopes. In summary, the content of this specification should not be construed as a limitation to this application.
Claims
1. A method for quantitative analysis of FTA failure, characterized in that, The FTA failure quantification analysis method includes: Determine the object to be analyzed; According to the object to be analyzed, obtain the event corresponding to the FTA number from the failure library and use it as the top event; Determine the intermediate events and basic events in sequence according to the top event; Determine the initial fault tree according to the top event, intermediate events and basic events; Determine the unreliability according to the failure rate and working time of the initial fault tree; Generate an FTA qualitative report according to the unreliability.
2. The FTA failure quantification analysis method according to claim 1, wherein The step of determining the intermediate events and basic events in sequence according to the top event specifically includes: According to the top event, obtain the event corresponding to the FTA number from the failure library and determine the failure category as the intermediate event; According to the intermediate event, obtain the event corresponding to the FTA number from the failure library and determine the failure category as the basic event.
3. The FTA failure quantification analysis method according to claim 1, wherein Before the step of determining the initial fault tree according to the top event, intermediate events and basic events, it further includes: Associate transfer events according to the top event or intermediate event; Obtain the initial fault tree of the transfer event according to the FTA number of the associated transfer event.
4. The FTA failure quantification analysis method according to claim 1, wherein After the step of determining the initial fault tree according to the top event, intermediate events and basic events, it further includes: Conduct FMEA analysis on the initial fault tree, determine the measures corresponding to the failures and display them on the initial fault tree; Determine the cause of the failure according to the empirical knowledge and display the cause of the failure on the initial fault tree.
5. The FTA failure quantification analysis method according to claim 1, wherein After the step of determining the initial fault tree according to the top event, intermediate events and basic events, it further includes: Generate a standard fault tree from the initial fault tree using transformation rules; the transformation rules include: logic gate transformation rules; Generate a simplified fault tree from the standard fault tree using simplification rules; the simplification rules include: Boolean algebra method.
6. The FTA failure quantification analysis method according to claim 1, wherein The step of determining the unreliability according to the failure rate and working time of the initial fault tree specifically includes: F(t) = 1 - e -λt ; Where F(t) is the unreliability, λ is the failure rate, t is the working time, and e is the natural logarithm.
7. An FTA failure quantification analysis device, characterized in that, The FTA failure quantification analysis device includes: An object-to-be-analyzed determination module for determining the object to be analyzed; A top-event determination module for obtaining the event corresponding to the FTA number from the failure library according to the object to be analyzed and using it as the top event; An intermediate-event and basic-event determination module for determining the intermediate events and basic events in sequence according to the top event; An initial-fault-tree determination module for determining the initial fault tree according to the top event, intermediate events and basic events; An unreliability determination module for determining the unreliability according to the failure rate and working time of the initial fault tree; An FTA qualitative-report generation module for generating an FTA qualitative report according to the unreliability.
8. A computer device, comprising: A memory, a processor, and a computer program stored on the memory and executable on the processor, wherein the processor executes the computer program to implement the FTA failure quantification analysis method according to any one of claims 1-6.
9. A computer-readable storage medium, having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the FTA failure quantification analysis method according to any one of claims 1-6.
10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the FTA failure quantification analysis method according to any one of claims 1-6.