Method for inspecting label quality, computer-readable recording medium storing same, and visual inspection apparatus

Abstract

A method for inspecting the quality of a label, a computer-readable recording medium storing the same, and a visual inspection apparatus are provided. The method includes: receiving, by an imaging unit, an image including a tag; extracting, by an inspection unit, a data matrix region of the tag from the image; extracting, by an inspection unit, at least one fixed pattern region from the data matrix region; and determining, by an inspection unit, an abnormality in the quality of the label based on the extracted fixed pattern region.

Description

Technical Field

[0001] Aspects of embodiments of the present disclosure relate to methods and apparatuses for inspecting label quality. Background Art

[0002] Unlike primary batteries that are not designed to be (re)charged, secondary (or rechargeable) batteries are designed to be discharged and recharged. Low-capacity secondary batteries are used in portable small electronic devices such as smart phones, feature phones, laptop computers, digital cameras, and camcorders, while high-capacity secondary batteries are widely used as power sources for driving motors in hybrid and electric vehicles and as power sources for storing electricity (e.g., home and / or utility-scale power storage). A secondary battery generally includes an electrode assembly composed of a positive electrode and a negative electrode, a case accommodating the electrode assembly, and electrode terminals connected to the electrode assembly.

[0003] During the production of secondary batteries, a label containing information related to the secondary battery can be attached to the secondary battery. Conventional techniques determine the printing quality of such labels by evaluating whether the labels are recognized by a barcode reader. However, these barcode readers cannot selectively inspect specific elements, and there are problems in ensuring the quality of labels based on a consistent standard due to performance differences between different models of barcode readers.

[0004] The above information disclosed in this background art section is for enhancing the understanding of the background of the present disclosure. Therefore, it may include information that does not constitute related (or prior) art. Summary of the Invention

[0005] Embodiments of the present disclosure provide a method and an apparatus for inspecting label quality.

[0006] These and other aspects and features of the present disclosure will be described in the following description of embodiments of the present disclosure or will be apparent from the following description of embodiments of the present disclosure.

[0007] According to an aspect of the present disclosure, there is provided a method for inspecting the quality of a label, the method including: receiving an image including the label from an imaging unit; extracting a data matrix region of the label from the image using an inspection unit; extracting at least one fixed pattern region from the data matrix region using the inspection unit; and determining an abnormality in the quality of the label based on the at least one extracted fixed pattern region using the inspection unit.

[0008] According to one embodiment, the at least one fixed pattern region may include a line region and a point region.

[0009] According to one embodiment, the step of determining an abnormality in the quality of the label may be based on the number of points included in the point region.

[0010] According to one embodiment, the step of extracting at least one fixed pattern area from the data matrix area may include: binarizing the data matrix area; and extracting at least one fixed pattern area from the binarized data matrix area.

[0011] According to one embodiment, the step of determining an abnormality in the quality of the label may be based on the number of pixels of at least one fixed pattern area extracted from the binarized data matrix area.

[0012] According to one embodiment, the pixel may be a white pixel included in at least one fixed pattern area.

[0013] According to one embodiment, the step of extracting at least one fixed pattern area from the data matrix area may include: binarizing the data matrix area; inverting the binarized data matrix area; and extracting at least one fixed pattern area from the binarized and inverted data matrix area.

[0014] According to one embodiment, the step of determining an abnormality in the quality of the label may be based on the number of pixels of at least one fixed pattern area extracted from the binarized and inverted data matrix area.

[0015] According to one embodiment, the step of determining an abnormality in the quality of the label may include: adjusting the inspection area based on the area of at least one fixed pattern area; and determining an abnormality in the quality of the label based on the adjusted inspection area.

[0016] According to one embodiment, the above method may further include sending information associated with the label to an external device when it is determined that there is an abnormality in the quality of the label.

[0017] According to one embodiment, the label is attached to a secondary battery.

[0018] According to another aspect of the present disclosure, there is provided a non-transitory computer-readable recording medium storing instructions for performing the above method on a computer.

[0019] According to still another aspect of the present disclosure, there is provided a vision inspection device including: at least one processor configured to read and execute instructions stored in at least one memory, so that the vision inspection device serves as: an imaging unit configured to capture an image including a label; and an inspection unit configured to determine an abnormality in the quality of the label. The inspection unit may extract a data matrix area of the label from an image including the label captured by the imaging unit, extract at least one fixed pattern area from the data matrix area, and determine an abnormality in the quality of the label based on the extracted at least one fixed pattern area.

[0020] According to one embodiment, at least one fixed pattern area may include a line area and a dot area.

[0021] According to one embodiment, the inspection unit may determine an abnormality in the quality of the label based on the number of dots included in the dot area.

[0022] According to one embodiment, the inspection unit may convert the data matrix area into a binary form and extract at least one fixed pattern area from the binarized data matrix area.

[0023] According to one embodiment, the inspection unit may determine an abnormality in the quality of the label based on the number of pixels of at least one fixed pattern area extracted from the binarized data matrix area.

[0024] According to one embodiment, the pixel may be a white pixel included in at least one fixed pattern area.

[0025] According to one embodiment, the inspection unit may convert the data matrix area into a binary form, perform image inversion on the binarized data matrix area, and extract at least one fixed pattern area from the binarized and inverted data matrix area.

[0026] According to one embodiment, the inspection unit may determine an abnormality in the quality of the label based on the number of pixels of at least one fixed pattern area extracted from the binarized and inverted data matrix area.

[0027] According to one embodiment, the inspection unit may adjust the inspection area based on the area of at least one fixed pattern area and determine an abnormality in the quality of the label based on the adjusted inspection area.

[0028] According to some embodiments of the present disclosure, the vision inspection device may only select and inspect the fixed pattern areas with invariant shapes among the components of the label attached to the secondary battery. Therefore, even by using a vision inspection device that inspects the fixed pattern areas according to a predetermined rule, the over-inspection rate in the label quality inspection can be reduced.

[0029] According to some embodiments of the present disclosure, quality inspection may be performed based on at least one of the line area and the dot area among the fixed pattern areas. Therefore, by selectively inspecting at least some of the fixed pattern areas of the label, the accuracy of the label quality inspection can be improved, and the over-inspection rate can be reduced.

[0030] According to some embodiments of the present disclosure, by adjusting the inspection area within the fixed pattern area of the label to reduce the over-inspection rate caused by the vision inspection device, an abnormality in the label quality can be determined with a higher level of accuracy. In addition, by minimizing the physical factors affecting the label over-inspection rate, an abnormality in the label quality can be determined more accurately.

[0031] However, aspects and features of the present disclosure are not limited to the above aspects and features, and other aspects and features not mentioned will be clearly understood by those skilled in the art from the detailed description described below. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The following drawings attached to this specification illustrate embodiments of the present disclosure and further describe aspects and features of the present disclosure together with the detailed description of the present disclosure. Therefore, the present disclosure should not be construed as being limited to the drawings.

[0033] Figure 1 is a diagram showing an example in which a label is attached to a secondary battery according to an embodiment of the present disclosure.

[0034] Figure 2 is a diagram showing an example of a label according to an embodiment of the present disclosure.

[0035] Figure 3 is a diagram showing an example of preprocessing a data matrix region according to an embodiment of the present disclosure.

[0036] Figure 4 is a diagram showing an example of inspecting the quality of a line region among fixed pattern regions according to an embodiment of the present disclosure.

[0037] Figure 5 is a diagram showing an example of adjusting an inspection region according to an embodiment of the present disclosure.

[0038] Figure 6 is a diagram showing an example of a graph representing the number of detected pixels according to an embodiment of the present disclosure.

[0039] Figure 7 is a diagram showing an example of inspecting the quality of a dot region among fixed pattern regions according to an embodiment of the present disclosure.

[0040] Figure 8 is a flowchart showing an example of a method for inspecting label quality according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0041] Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings. Terms or words used in this specification and claims should not be construed as being limited to the ordinary or dictionary meanings, but should be interpreted as meanings and concepts consistent with the technical idea of the present disclosure based on the principle that the inventor can appropriately define terms as his / her own lexicographer so as to best explain his / her invention.

[0042] The embodiments described in this specification and the configurations (arrangements) shown in the accompanying drawings are merely some embodiments of the present disclosure and do not represent all the technical ideas, aspects, and features of the present disclosure. Therefore, it should be understood that various equivalents and modifications may exist at the time of filing this application, which may replace or modify the embodiments described herein.

[0043] It will be understood that when a layer or element is referred to as being "between" two layers, it can be the only layer between the two layers, or one or more intermediate layers may also exist. It will be understood that when an element or layer is referred to as being "on", "connected to", or "coupled to" another element or layer, it can be directly on, directly connected, or directly coupled to the other element or layer, or one or more intermediate elements or layers may also exist. When an element or layer is referred to as being "directly on", "directly connected to", or "directly coupled to" another element or layer, there are no intermediate elements or layers. For example, when a first element is described as being "coupled" or "connected" to a second element, the first element can be directly coupled or directly connected to the second element, or the first element can be indirectly coupled or indirectly connected to the second element via one or more intermediate elements.

[0044] In the drawings, for clarity of illustration, the dimensions of various elements, layers, etc. may be exaggerated. The same reference numerals denote the same elements. As used herein, the term "and / or" includes any combination and all combinations of one or more of the related listed items. Further, when using "may" in describing the embodiments of the present disclosure, it relates to "one or more embodiments of the present disclosure". Expressions such as "at least one of..." and "any one of..." when following a list of elements modify the entire list of elements, rather than a single element in the list. When phrases such as "at least one of (a / kind / type) A, B, and C", "at least one of (a / kind / type) A, B, or C", "at least one of (a / kind / type) selected from the group consisting of A, B, and C", or "at least one of (a / kind / type) selected from among A, B, and C" are used to specify a list of elements A, B, and C, the phrase can refer to any and all suitable combinations or subsets of A, B, and C, such as A, B, C, A and B, A and C, B and C, or A, B, and C. As used herein, the terms "use" and its variants can be considered to be synonymous with the terms "utilize" and its variants, respectively. As used herein, the terms "substantially", "about", and similar terms are used as approximate terms and not as terms of degree, and are intended to account for the inherent variations in measured or calculated values that would be recognized by a person of ordinary skill in the art.

[0045] It will be understood that although the terms first, second, third, etc. may be used herein to describe various elements, components, regions, layers and / or sections, these elements, components, regions, layers and / or sections should not be limited by these terms. These terms are used to distinguish one element, component, region, layer or section from another element, component, region, layer or section. Thus, the first element, first component, first region, first layer or first section discussed below may be referred to as a second element, second component, second region, second layer or second section without departing from the teachings of the exemplary embodiments.

[0046] For ease of description, spatial relative terms such as "under", "below", "lower", "above", "upper", etc. may be used herein to describe the relationship of one element or feature to another (other) element or feature as shown in the figures. It will be understood that the spatial relative terms are intended to cover different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, an element described as "under" or "below" other elements or features will then be oriented "above" or "over" the said other elements or features. Thus, the term "under" can cover both the above and below orientations. The device may be otherwise oriented (rotated 90 degrees or at other orientations), and the spatial relative descriptors used herein should be interpreted accordingly.

[0047] The terms used herein are for the purpose of describing embodiments of the present disclosure and are not intended to limit the present disclosure. As used herein, unless the context clearly dictates otherwise, the singular forms "a" and "an" are also intended to include the plural forms. It will also be understood that when the terms "comprises", "comprising" and / or their variants are used in this specification, it is stated that there are the stated features, integers, steps, operations, elements and / or components, but does not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or their groups.

[0048] In addition, any numerical range disclosed and / or recited herein is intended to include all sub-ranges of the same numerical precision contained within the recited range. For example, the range "1.0 to 10.0" is intended to include all sub-ranges between the recited minimum value of 1.0 and the recited maximum value of 10.0 (and including these two values), i.e., having a minimum value equal to or greater than 1.0 and a maximum value equal to or less than 10.0, such as, for example, 2.4 to 7.6. Any maximum numerical limitation recited herein is intended to include all lesser numerical limitations contained therein, and any minimum numerical limitation recited in this specification is intended to include all greater numerical limitations contained therein. Accordingly, the applicant reserves the right to amend this specification and the claims to expressly recite any sub-ranges contained within the ranges expressly recited herein. All such ranges are intended to be inherently described in this specification such that an amendment to expressly recite any such sub-ranges will comply with the requirements of local patent law.

[0049] When two elements, features, etc. being compared are referred to as "the same", it may mean that they are "substantially the same". Thus, the phrase "substantially the same" may include cases having a deviation that is considered low in the art (e.g., a deviation of 5% or less). In addition, when a certain parameter is said to be uniform within a given region, this may mean that it is uniform in terms of the average value.

[0050] Throughout the specification, unless otherwise specified, each element may be singular or plural.

[0051] Arranging any element "above (or below)" or "on (or under)" another element may mean that the any element may be arranged to be in contact with the upper (or lower) surface of the another element, and yet another element may also be inserted between the another element and the any element arranged on (or under) the another element.

[0052] In addition, it will be understood that when a component is referred to as being "linked", "coupled" or "connected" to another component, these components may be "coupled", "linked" or "connected" directly to each other, or another component may be "disposed" between these components.

[0053] Throughout the specification, when stating "A and / or B", unless otherwise specified, it means A, B, or A and B. That is, "and / or" includes any combination or all combinations of the recited multiple items. When stating "C to D", unless otherwise specified, it means C or greater and D or less.

[0054] As used herein, the terms "module" or "unit" refer to software or hardware components, and the "module" or "unit" performs a specific function. However, the meaning of "module" or "unit" is not limited to software or hardware. The "module" or "unit" may be configured in an addressable storage medium or configured to reproduce one or more processors. Thus, by way of example, the "module" or "unit" may include components such as software components, object-oriented software components, class components, and task components, as well as at least one of procedures, functions, attributes, steps, subroutines, program code segments, drivers, firmware, microcode, circuits, data, databases, data structures, tables, arrays, and variables. In addition, the functions provided in the components and the "module" or "unit" may be combined into a smaller number of components and the "module" or "unit", or further divided into additional components and the "module" or "unit".

[0055] The "module" or "unit" may be implemented as a processor and a memory. The "processor" should be broadly interpreted to include general-purpose processors, central processing units (CPUs), microprocessors, digital signal processors (DSPs), controllers, microcontrollers, state machines, and the like. In some cases, the "processor" may refer to an application-specific integrated circuit (ASIC), a programmable logic device (PLD), a field-programmable gate array (FPGA), etc. The "processor" may refer to a combination of processing devices, for example, a combination of a DSP and a microprocessor, a combination of multiple microprocessors, a combination of one or more combined microprocessors in combination with a DSP core, or any other combination of such configurations. In addition, the "memory" should be broadly interpreted to include any electronic component capable of storing electronic information. The "memory" may refer to various types of processor-readable media, such as random access memory (RAM), read-only memory (ROM), non-volatile random access memory (NVRAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable PROM (EEPROM), flash memory, magnetic or optical data storage, registers, and the like. If a processor can read information from and / or write information to the memory, the memory is said to be in electronic communication with the processor. A memory integrated with a processor is in electronic communication with the processor.

[0056] Figure 1 FIG. is a diagram showing a label 110 attached to a secondary battery 100 according to an embodiment of the present disclosure. Figure 2A diagram showing an example of the tag 110 according to an embodiment of the present disclosure. In one embodiment, the tag 110 may be attached to a part of the top surface of the secondary battery or a part of other surfaces (e.g., the bottom surface or the side surface). Such a tag 110 may include a data matrix area 210 and a text area 220 to indicate information related to the secondary battery 100. Here, the information related to the secondary battery 100 may include the model name, capacitance, charge state, material, or chemical composition of the secondary battery.

[0057] To inspect the quality of the tag 110 attached to the secondary battery 100, a vision inspection device having an imaging unit such as a camera may inspect the attachment position of the tag 110 on the secondary battery 100. However, the vision inspection device generally performs inspections based on predetermined rules. Therefore, it may be difficult to detect printing defects (e.g., poor printing) of a tag including, for example, the text area 220 and the data matrix area 210 (in this embodiment, the data matrix area 210 includes one or more fixed pattern areas 212, 214 combined with a random pattern area 216). The present disclosure provides a tag quality inspection method in which a vision inspection device is used to selectively inspect the fixed pattern area of the tag 110 attached to the secondary battery 100, thereby detecting quality problems such as printing defects of the tag with high accuracy and minimizing the over-inspection rate in tag quality inspection.

[0058] In one embodiment, the imaging unit of the vision inspection device may capture an image including the tag 110. Based on the image including the tag 110, the vision inspection device can not only inspect the printing defects of the tag 110 and the position where the tag 110 is attached to the secondary battery 100, but also inspect the quality of the fixed pattern area in the data matrix area 210.

[0059] In one embodiment, the inspection unit of the vision inspection device may extract the data matrix area 210 of the tag 110 from the image including the tag 110. Here, the data matrix area 210 may include a fixed pattern area including a line area 212 and a dot area 214 and a random pattern area 216. The random pattern area 216 may include different shapes and information according to the product information or characteristics of the secondary battery to which the tag is attached. Therefore, the quality of the tag 110 can be inspected using the fixed pattern area instead of the random pattern area 216 based on a consistent standard.

[0060] In one embodiment, the inspection unit may determine whether the label 110 is of poor quality based on the fixed pattern area extracted from the data matrix area 210. Specifically, the inspection unit may determine whether the label 110 is of poor quality based on, for example, the number of pixels in each of the fixed pattern areas and / or the number of dots included in the dot area. If the inspection unit determines that the quality of the label 110 is abnormal, the inspection unit may send the information associated with the label 110 to an external device. Here, the information associated with the label 110 may include the identifier of the label 110, the identifier of the secondary battery 100 to which the label 110 is attached, and the like.

[0061] Although Figure 2 an example is shown in which the line area 212 is located at the upper left corner of the data matrix area 210 and the dot area 214 is located at the lower right corner of the data matrix area 210, the present disclosure is not limited thereto. In other words, the visual inspection device may selectively detect the fixed pattern areas located at various positions within the data matrix area 210 of the label 110, and the visual inspection device may determine the abnormality of the label quality based on the detected fixed pattern areas.

[0062] In this configuration, the visual inspection device may only select and inspect the fixed pattern areas with invariant shapes among the components of the label attached to the secondary battery. Therefore, even when using a visual inspection device that inspects the fixed pattern areas according to a predetermined rule, the over-inspection rate in the label quality inspection can be reduced.

[0063] Figure 3 FIG. is a diagram showing an example of preprocessing a data matrix area according to an embodiment of the present disclosure. The first image 310 represents an example of a data matrix area extracted from an image including a label captured by an imaging unit of a visual inspection device. When a camera is used to capture an image, the clarity of the label image may be reduced due to various external factors such as light spots, camera noise, ambient light noise, label printing ink dispersion, inspection device vibration, etc. Therefore, if the visual inspection device adopts an image of the data matrix area (e.g., the first image 310) extracted from a label image with reduced clarity, over-inspection may occur during the inspection of the label.

[0064] The second image 320 represents an example of the data matrix area after binarization processing derived from the first image 310 (i.e., the second image 320 is a binarized processed image obtained after converting the first image 310 into a binarized form). By applying binarization processing to the first image 310, the contrast between the printed portion represented in black and the unprinted portion represented in white can be increased. Therefore, the inspection unit of the visual inspection device can inspect the quality of the label with higher accuracy by using the binarized second image 320.

[0065] In addition, the third image 330 represents an example of a data matrix region after an inversion process derived from the second image 320 (i.e., the third image 330 is an inverted processed image obtained by inverting the binarized second image 320). By inverting the data matrix region, the clarity of the printed portion and the unprinted portion can be further improved. Therefore, the inspection unit of the visual inspection device can inspect the quality of the label with a higher level of accuracy by using the binarized and inverted third image 330.

[0066] Figure 4 is a diagram showing an example of inspecting the quality of the line region 412 among the inspection fixed pattern regions according to an embodiment of the present disclosure. In one embodiment, the inspection unit of the visual inspection device can extract the fixed pattern region from the data matrix region 410. Here, the data matrix region 410 may be a region included in a binarized image (such as Figure 3 the second image 320). In addition, the inspection unit can extract the line region 412 from among the fixed pattern regions, and the line region 412 includes a horizontal line located on the upper side of the data matrix region 410 and a vertical line located on the left side of the data matrix region 410.

[0067] In one embodiment, the inspection unit can determine an abnormality in the label quality based on the number of pixels in the line region 412. For example, the line region 412 may include a plurality of points 414, and each point 414 represents the smallest size unit for displaying information in the data matrix region 410. For example, each point 414 may be composed of 16 pixels in both width (w) and height (h). In other words, if each of the horizontal line and the vertical line in the line region 412 includes 18 points 414, then each of the horizontal line and the vertical line in the line region 412 may be composed of 4608 pixels (16 pixels in width per point × 16 pixels in height per point × 18 points). Therefore, the inspection unit can detect the number of pixels in the horizontal line and / or the vertical line of the line region 412, and if there is a difference greater than a threshold value (for example, 461 pixels, which is 10% of the reference value of 4608 pixels), it is determined as a printing defect.

[0068] In one embodiment, the inspection unit may determine a defect in the label quality based on the number of white pixels in the line region 412. Since the line region 412 is composed of black pixels, the line region 412 may include white pixels that appear as white regions due to external factors such as printing noise, light reflection, etc. The number of such white pixels or the ratio of such white pixels to black pixels affects the label quality inspection. The number of such white pixels or the ratio of such white pixels to black pixels affects the label quality inspection. Therefore, by detecting the white pixels included in the line region 412, the inspection unit can more accurately inspect the quality of the label while minimizing the influence of external factors that occur when capturing an image of the label.

[0069] In Figure 4 , the use of the binarized data matrix region 410 is shown, but the present disclosure is not limited thereto. For example, a fixed pattern region may be extracted from a binarized and inverted data matrix region (such as Figure 3 the third image 330), and an abnormality in the label quality may be determined based on the number of black pixels in the line region among the fixed pattern regions.

[0070] With such a configuration, the vision inspection device can perform a quality inspection based on the line region among the fixed pattern regions. Therefore, by effectively selecting and inspecting at least some of the fixed pattern regions of the label, the accuracy of the label quality inspection can be improved, and the over-inspection rate can be reduced.

[0071] Figure 5 is a diagram illustrating an example of adjusting an inspection region according to an embodiment of the present disclosure, Figure 6 is a diagram illustrating an example of a diagram representing the number of pixels inspected according to an embodiment of the present disclosure. The first image 510 represents an example of a data matrix region skewed due to physical factors (such as printing dispersion) during the labeling process, and the first graph 610 shows an example of a graph displaying the number of pixels in the first inspection region 512 detected from multiple rounds of vision inspection. In one embodiment, due to physical factors, an image of the label may be captured at an inclined position. In this case, the first inspection region 512 corresponding to the horizontal line of the fixed pattern region may be wider than the original inspection region, or may include some pixels from an adjacent random pattern region next to a predetermined fixed pattern region. Therefore, referring to the first graph 610, each time vision inspection is performed, a different number of pixels are detected in the first inspection region 512, which results in an increase in the over-inspection rate. Here, the horizontal axis of the first graph 610 represents the number of times of attempting to detect pixels in the inspection region during vision inspection, and the vertical axis of the first graph 610 represents the number of pixels detected within the inspection region.

[0072] The second image 520 shows an example of a second inspection area 522 set by reducing a first inspection area 512 of the first image 510. In one embodiment, an inspection unit of a visual inspection device may adjust the inspection area based on the area of a fixed pattern area. Specifically, if the fixed pattern area has an area difference equal to or greater than a threshold (e.g., 10% etc.) compared to a reference value, the inspection unit may adjust the inspection area to an area of a predetermined size (e.g., one-third of the size of the fixed pattern area etc.). Here, the predetermined area may be located at approximately the center of the fixed pattern area. By reducing the height of the first inspection area 512 corresponding to the horizontal line of the fixed pattern area to shrink the first inspection area 512 to the second inspection area 522, the possibility that the second inspection area 522 includes some pixels from an adjacent random pattern area in addition to the predetermined fixed pattern area is significantly reduced. Therefore, referring to the second graph 620, the number of pixels in the second inspection area 522 can be detected more consistently each time a visual inspection is performed.

[0073] Although Figure 5 shows a binarized and inverted data matrix area (such as Figure 3 the third image 330), the present disclosure is not limited thereto. For example, even in a binarized data matrix area of a second image 320 such as Figure 3 the inspection area can be adjusted. In addition, although Figure 5 shows a horizontal line area among the fixed pattern areas as an example, the present disclosure is not limited thereto. For example, the inspection area can also be adjusted in a vertical line area among the fixed pattern areas.

[0074] The above configuration allows for a higher level of accuracy in determining an abnormality in label quality by adjusting the inspection area within the fixed pattern area of the label, so as to reduce the over-inspection rate caused by the visual inspection device. In addition, by minimizing physical factors affecting the over-inspection rate of the label, an abnormality in label quality can be determined more accurately.

[0075] Figure 7 is a diagram showing an example of inspecting the quality of a point area 720 among fixed pattern areas according to an embodiment of the present disclosure. In one embodiment, the fixed pattern area of the data matrix area 710 may include a point area 720 and a line area. Here, the point area 720 may include a plurality of points, and each point represents a minimum size unit for displaying information associated with a secondary battery to which a label is attached. As Figure 7 shown, the visual inspection device may extract the point areas 720 respectively located on the lower side and the right side of the data matrix area 710 in which the fixed pattern area is arranged.

[0076] In one embodiment, the inspection unit of the vision inspection device may determine an abnormality in label quality based on the number of points included in the dot region 720. Specifically, the inspection unit may count the number of white dots 722 and / or black dots 724 included in the dot region 720. Further, if the number of points is less than a preset threshold, the inspection unit may determine that at least a part of the label is not printed. Additionally or alternatively, if the number of points is greater than the preset threshold, the inspection unit may determine that at least a part of the label is poorly printed, e.g., due to ink bleeding or the like.

[0077] Although Figure 7 shows a binarized and inverted data matrix region (such as Figure 3 the third image 330), the present disclosure is not limited thereto. Even in the binarized data matrix region of the second image 320 such as Figure 3 the quality of the label can be inspected and verified based on the number of points included in the dot region. Further, the method for inspecting and verifying the quality of the dot region 720 may be performed in parallel with the method for inspecting and verifying the quality of the line region described previously.

[0078] With this configuration, quality inspection can be performed with high accuracy based on the dot region among the fixed pattern regions. Thus, by selectively inspecting at least some of the fixed pattern regions of the label, the vision inspection device can reduce the over-inspection rate.

[0079] Figure 8 is a flowchart showing an example of a method 800 for inspecting label quality according to an embodiment of the present disclosure. In one embodiment, the method 800 may be executed by at least one processor of the vision inspection device. The method 800 may start with the processor receiving an image including a label from the imaging unit (step S810). Further, the processor may extract the data matrix region of the label from the image through the inspection unit (step S820).

[0080] Next, the processor may extract at least one fixed pattern region from the data matrix region through the inspection unit (step S830). In this step, the processor may binarize the data matrix region. Further, the processor may extract the fixed pattern region from the binarized data matrix region.

[0081] Thereafter, the processor may determine an abnormality in label quality based on the fixed pattern region extracted through the inspection unit (step S840). Specifically, the processor may determine an abnormality in label quality based on the number of pixels of the fixed pattern region extracted from the binarized data matrix region. Here, the pixel may be a white pixel included in the fixed pattern region. Further, if the processor determines an abnormality in label quality, the processor may send information associated with the label to an external device.

[0082] In one embodiment, the at least one fixed pattern area may include a line area and a dot area. In this case, the processor may determine the abnormality of the label quality based on the number of dots included in the dot area.

[0083] In one embodiment, the processor may binarize the data matrix region. Furthermore, the processor may invert the binarized data matrix region. Furthermore, the processor may extract at least one fixed pattern region from the binarized and inverted data matrix region. In this case, the processor may determine an abnormality in label quality based on the number of pixels in the fixed pattern region extracted from the binarized and inverted data matrix region.

[0084] In one embodiment, the processor may adjust the inspection area based on the area of the fixed pattern area. In addition, the processor may determine the abnormality of the label quality based on the inspection area with the adjusted area.

[0085] The above-described method can be configured in the form of a computer program stored in a non-transitory computer-readable medium for execution by various computer devices. Here, the medium can continuously store the computer executable program, or it can temporarily store the computer executable program for execution or downloading. Furthermore, the medium can be various types of recording devices or storage devices in the form of a combination of one or more hardware components. It is not limited to media directly connected to a computer system; the medium can be distributed over a network. Examples of media include magnetic media such as hard disks and floppy disks, and magnetic media such as magnetic tape; optical media such as CD-ROMs and DVDs; magneto-optical media such as optical floppy disks; and hardware devices specifically configured to store program instructions, such as read-only memory (ROM), random access memory (RAM), flash memory, etc. Other examples of media include recording media and storage media managed by app stores that distribute applications, or sites, servers, etc. that provide and distribute various other types of software.

[0086] The methods, operations or techniques of the present disclosure can be implemented by various means. For example, these techniques can be implemented in hardware, firmware, software or a combination thereof. It will be further understood by those skilled in the art that the various illustrative logic blocks, modules, circuits and algorithm steps described in conjunction with the disclosure herein can be implemented in electronic hardware, computer software or a combination thereof. In order to clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits and steps have been generally described above according to their functions. Whether such functions are implemented as hardware or software depends on the design requirements imposed on the specific application and the entire system. Those skilled in the art can implement the described functions in different ways for each specific application, but such implementations should not be interpreted as causing deviations from the scope of the present disclosure.

[0087] In a hardware implementation, the processing units for performing these techniques may be implemented in one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), graphics processing units (GPUs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), processors, controllers, microcontrollers, microprocessors, electronic devices, other electronic units designed to perform the functions described in this disclosure, computers, or combinations thereof.

[0088] Accordingly, the various example logic blocks, modules, and circuits described in connection with this disclosure may be implemented or performed with a general-purpose processor, DSP, ASIC, FPGA, or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any combination designed to perform the functions described herein. A general-purpose processor may be a microprocessor, but in the alternative, the processor may be any conventional processor, controller, microcontroller, or state machine. The processor may also be implemented as a combination of computing devices, e.g., a DSP and a microprocessor, multiple microprocessors, one or more microprocessors associated with a DSP core, or any other combination configured.

[0089] In an implementation using firmware and / or software, these techniques may be implemented with instructions stored on a computer-readable medium such as random access memory (RAM), read-only memory (ROM), non-volatile random access memory (NVRAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable PROM (EEPROM), flash memory, compact disc (CD), magnetic or optical data storage device, etc. The instructions may be executed by one or more processors and may cause the processors to perform certain aspects of the functions described in this disclosure.

[0090] When implemented in software, these techniques may be stored as one or more instructions or code on a computer-readable medium or may be transmitted through a computer-readable medium. The computer-readable medium may include computer storage media and communication media including any medium that facilitates transfer of a computer program from one place to another. The storage media may also be any available media that can be accessed by a computer. By way of non-limiting example, such computer-readable media may include RAM, ROM, EEPROM, CD-ROM or other optical disk storage, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to store or transmit the desired program code in the form of instructions or data structures and that can be accessed by a computer. Additionally, any connection is properly termed a computer-readable medium.

[0091] For example, when software is transmitted from a website, server, or other remote source using coaxial cable, fiber optic cable, twisted pair, digital subscriber line (DSL), or radio technologies such as infrared, wireless, and microwave, the coaxial cable, optical fiber cable, twisted pair, and digital subscriber line or radio technologies such as infrared, wireless, and microwave are included in the definition of the medium. As used herein, magnetic disks and optical disks include CD, laser disk, optical disk, digital versatile disk (DVD), floppy disk, and Blu-ray disk, where magnetic disks typically reproduce data magnetically, while optical disks use lasers to optically reproduce data. Such combinations should also be included within the scope of computer-readable media.

[0092] Software modules may be stored in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disk, removable disk, CD-ROM, or any other known form of storage medium. Exemplary storage media introductions may be connected to a processor such that the processor can read information from, or write information to, the storage medium. Alternatively, the storage medium may be integrated into the processor. The processor and the storage medium may reside in an ASIC. The ASIC may reside in a user terminal. Alternatively, the processor and the storage medium may exist as separate components in a user terminal.

[0093] Although the above examples have been described as utilizing aspects of the presently disclosed subject matter in one or more independent computer systems, the present disclosure is not limited thereto and may be implemented in conjunction with any computing environment, such as a network or distributed computing environment. Additionally, aspects of the subject matter in the present disclosure may be implemented in multiple processing chips or devices, and storage may be similarly affected on multiple devices. Such devices may include a PC, a network server, and a portable device.

[0094] Although the present disclosure has been described above with respect to embodiments of the present disclosure, the present disclosure is not limited thereto. Within the spirit of the present disclosure and the equivalents of the appended claims, those skilled in the art may make various modifications and variations thereto.

[0095]

Description of Some Reference Signs

Claims

1. A method for inspecting the quality of a label, the method comprising the following steps: Receiving an image including the label from an imaging unit; Using an inspection unit to extract a data matrix area of the label from the image; Using the inspection unit to extract at least one fixed pattern area from the data matrix area; And Using the inspection unit to determine an abnormality in the quality of the label based on the at least one extracted fixed pattern area.

2. The method according to claim 1, wherein The at least one fixed pattern area includes a line area and a point area.

3. The method according to claim 2, wherein The step of determining the abnormality in the quality of the label is based on the number of points included in the point area.

4. The method according to claim 1, wherein, The step of extracting the at least one fixed pattern area from the data matrix area includes: Binarizing the data matrix area; and Extracting the at least one fixed pattern area from the binarized data matrix area.

5. The method according to claim 4, wherein The step of determining the abnormality in the quality of the label is based on the number of pixels of the at least one fixed pattern area extracted from the binarized data matrix area.

6. The method according to claim 5, wherein, The pixels are white pixels included in the at least one fixed pattern area.

7. The method according to claim 1, wherein The step of extracting the at least one fixed pattern area from the data matrix area includes: Binarizing the data matrix area; Inverting the binarized data matrix area; and Extracting the at least one fixed pattern area from the binarized and inverted data matrix area.

8. The method according to claim 7, wherein The step of determining the abnormality in the quality of the label is based on the number of pixels of the at least one fixed pattern area extracted from the binarized and inverted data matrix area.

9. The method according to claim 1, wherein The step of determining the abnormality in the quality of the label includes: Adjusting an inspection area based on the area of the at least one fixed pattern area; and Determining the abnormality in the quality of the label based on the adjusted inspection area.

10. The method according to claim 1, the method further comprising sending information associated with the label to an external device when an abnormality in the quality of the label is determined.

11. The method according to claim 1, wherein, The label is attached to a secondary battery.

12. A non-transitory computer-readable recording medium storing instructions for performing the method according to claim 1 on a computer.

13. A vision inspection device, the vision inspection device comprising: At least one processor configured to read and execute instructions stored in at least one memory, thereby causing the vision inspection device to function as: An imaging unit configured to capture an image including a label; and An inspection unit configured to determine an abnormality in the quality of the label, Wherein the inspection unit (i) extracts a data matrix area of the label from the image captured by the imaging unit, (ii) extracts at least one fixed pattern area from the data matrix area, and (iii) determines an abnormality in the quality of the label based on the at least one extracted fixed pattern area.

14. The visual inspection device according to claim 13, wherein, The at least one fixed pattern area includes a line area and a point area.

15. The visual inspection device according to claim 14, wherein, The inspection unit determines an abnormality in the quality of the label based on the number of points included in the point area.

16. The visual inspection device according to claim 13, wherein, The inspection unit converts the data matrix area into a binarized form and extracts the at least one fixed pattern area from the binarized data matrix area.

17. The visual inspection device according to claim 16, wherein, The inspection unit determines an abnormality in the quality of the label based on the number of pixels of the at least one fixed pattern area extracted from the binarized data matrix area.

18. The visual inspection device according to claim 17, wherein, The pixels are white pixels included in the at least one fixed pattern area.

19. The visual inspection device according to claim 13, wherein, The inspection unit converts the data matrix area into a binarized form, performs image inversion on the binarized data matrix area, and extracts the at least one fixed pattern area from the binarized and inverted data matrix area.

20. The visual inspection device according to claim 19, wherein, The inspection unit determines an abnormality in the quality of the label based on the number of pixels of the at least one fixed pattern area extracted from the binarized and inverted data matrix area.

21. The visual inspection device according to claim 13, wherein, The inspection unit adjusts the inspection area based on the area of the at least one fixed pattern area, and determines an abnormality in the quality of the label based on the adjusted inspection area.

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