ABS (anti-lock brake system) anti-lock sensor performance test system

Abstract

The invention relates to the technical field of anti-lock brake sensor performance testing, in particular to an ABS anti-lock brake sensor performance testing system which comprises a server, a data acquisition module, a response test analysis module, an anti-interference test analysis module, a durability test analysis module, a test comprehensive analysis module and a display terminal. According to the method, the response state, the anti-interference state and the durability state corresponding to the anti-lock sensor are respectively tested and analyzed under different test condition levels, the response state evaluation value, the anti-interference state evaluation value and the durability state evaluation value are obtained and are comprehensively analyzed, the comprehensive evaluation value is calculated and tested, and the anti-lock sensor is determined according to the test result. And a test passing or not passing signal is output, so that comprehensive evaluation of key performance indexes of the anti-lock sensor is realized, the system is suitable for performance test in batch production, and a scientific basis is provided for quality control.

Description

Technical Field

[0001] The present invention relates to the technical field of anti-lock sensor performance testing, and particularly to an ABS anti-lock sensor performance testing system. Background Art

[0002] The anti-lock braking system (ABS) of an automobile dynamically adjusts the braking system by detecting the wheel speed in real time and combining with an electronic control unit (ECU), preventing the wheels from locking during braking, thereby improving the safety and handling performance of the vehicle. As the core component of the ABS system, the performance of the anti-lock sensor directly affects the working reliability of the system. Therefore, the quality of the anti-lock sensor before leaving the factory is crucial; Currently, the testing of the performance of anti-lock sensors mainly has the following problems and deficiencies: 1. Limitations of on-vehicle testing: Existing methods usually test by installing sensors on real vehicles. Although it can simulate actual working conditions, the testing process is time-consuming, laborious, and costly, and it is difficult to meet the requirements of mass production of sensors for efficiency and accuracy. In addition, on-vehicle testing has certain limitations in high-precision performance evaluation; 2. Insufficiency of single-environment testing: Existing methods mostly rely on specific testing tools to simply test the basic performance parameters (such as resistance, voltage) of sensors in a single environment. Although this method can complete preliminary screening, it cannot cover complex application scenarios and ignores the comprehensive requirements of anti-lock sensors for response performance, anti-interference ability, and durability in actual applications; Due to the above defects, the existing testing methods fail to comprehensively and accurately evaluate the overall performance of anti-lock sensors, restricting their reliability and stability in actual applications; To solve the above defects, a technical solution is provided now. Summary of the Invention

[0003] The purpose of the present invention is to solve the problem that the existing anti-lock sensor performance testing methods cannot efficiently and accurately evaluate the key performance indicators of sensors under complex environmental conditions, and to propose an ABS anti-lock sensor performance testing system.

[0004] The purpose of the present invention can be achieved by the following technical solutions: An ABS anti-lock sensor performance testing system, comprising: A response test analysis module, configured to parse the video of the response test process at each test vehicle speed level, extract the image set of the simulated wheels, analyze and process the image set to determine the brake braking moment, and simultaneously obtain the response moment of the anti-lock sensor, calculate the time difference between the response moment of the anti-lock sensor and the brake braking moment to obtain a delay duration value, and thereby determine a response state evaluation value; An anti-interference test analysis module, which is used to analyze the output signals of the anti-lock sensor before and after applying interference waves at each test interference wave intensity level, obtain the signal change value, and thereby determine the anti-interference state evaluation value; A durability test analysis module, which is used to analyze the output resistance value and output current value of the anti-lock sensor at each time point within a set time period at each test temperature level, obtain the output resistance stability evaluation index and the output current stability evaluation index, and thereby determine the durability state evaluation value; A test comprehensive analysis module, which is used to extract the numerical values of the response state evaluation value, the anti-interference state evaluation value, and the durability state evaluation value for normalization processing, obtain the test comprehensive evaluation value, and thereby generate a test failure signal or a test pass signal.

[0005] Furthermore, the specific process of determining the braking moment is as follows: Divide the images of each complete rotation of the simulated wheel into a group, calculate the time span duration corresponding to each group of images, thereby obtain the time span durations corresponding to each group of images, arrange the time span durations corresponding to each group of images in ascending order to obtain a time span duration sequence, and use the time span duration corresponding to the mode in the time span duration sequence as the reference time span duration; Compare and analyze the time span durations corresponding to each group of images with the reference time span duration. If the time span duration corresponding to a certain group of images is greater than the reference time span duration, then determine that group of images as the braking state, and at the same time extract the time point corresponding to the initial image in that group of images as the braking moment.

[0006] Furthermore, the specific process of determining the response state evaluation value is as follows: Let the delay duration value ycs of the anti-lock sensor d be compared and analyzed with the preset delay duration threshold yyq d , where d represents the label of the test vehicle speed level; When the delay duration value ycs of the anti-lock sensor d is greater than the preset delay duration threshold yyq d , then the calculation formula one of the delay evaluation index is matched; When the delay duration value ycs of the anti-lock sensor d is equal to the preset delay duration threshold yyq d , then the calculation formula two of the delay evaluation index is matched; When the delay duration value ycs of the anti-lock sensor d is less than the preset delay duration threshold yyq d , then the calculation formula three of the delay evaluation index is matched; The calculation formula for setting the delay evaluation index is as follows: , in the above formula, both π and e represent set mathematical constants, da1, da2, and da3 all represent set influence coefficients, and da1 > da2 > da3. The setting of specific influence coefficients is reasonably set by those skilled in the art according to the actual situation; According to the formula: , the response status evaluation value YXP is obtained, where n represents the total number of test vehicle speed level labels, and β1 represents the set correction coefficient.

[0007] Furthermore, the specific process for solving the signal change value is as follows: By respectively obtaining the output signals of the anti-lock sensor corresponding to before and after applying the interference wavefront, and taking the output signal of the anti-lock sensor corresponding to before applying the interference wave as the reference signal S 前 k ; Taking the output signal of the anti-lock sensor corresponding to after applying the interference wave as the change signal S 后 k ; where k represents the label of the test interference wave intensity level; According to the formula: , the signal distortion rate DR is obtained k , where represents the energy deviation value of the signal after being interfered, represents the second norm of the signal (i.e., the energy of the signal), represents the energy of the reference signal; Obtaining the output signal S of the anti-lock sensor corresponding to each time point t after applying the interference wave 后（t） k , and calculating the average value of the output signal ; According to the formula: , the signal stability value SC is obtained k , where T represents the signal sampling period; Extracting the numerical values of the signal distortion rate and the signal stability value for normalization processing to obtain the signal change value.

[0008] Furthermore, the specific process for determining the anti-interference state evaluation value is as follows: Taking the interference wave intensity level as the abscissa and the signal change value as the ordinate, a two-dimensional signal change dynamic coordinate system is constructed accordingly, and the signal change values corresponding to each interference wave intensity level are plotted on the signal change dynamic coordinate system by point plotting, thereby obtaining a signal change broken line graph; Draw a signal change reference line parallel to the abscissa in the signal change line graph, obtain the peak inflection points and valley inflection points in the signal change line graph, and draw perpendicular lines from the peak inflection points and valley inflection points in the signal change line graph to the signal change reference line respectively, thereby obtaining the peak perpendicular points and valley perpendicular points. Connect the peak inflection points with the valley perpendicular points and the valley inflection points with the peak perpendicular points through line segments to obtain the signal change graph, extract the area of the signal change graph as the signal change fluctuation value, and label it as XH m , where m represents the number of the signal change graph, and m = 1, 2, 3... z, and z represents the total number of signal change graph numbers; According to the formula: , obtain the anti-interference state evaluation value CGR, where XH m-1 represents the signal change fluctuation value corresponding to the (m - 1)th signal change graph, and XH * represents the set reference signal change fluctuation value, and β2 and β3 respectively represent the set correction coefficients.

[0009] Furthermore, the specific process of solving the output resistance stability evaluation index is as follows: Obtain the output resistance values of the anti-lock sensor at each time point within the set time period at each test temperature level; Extract the output resistance value at the initial time point from the output resistance values of the anti-lock sensor at each time point within the set time period at each test temperature level; According to the output resistance values at each time point and the output resistance value at the initial time point, obtain the output resistance stability evaluation index RW f , where f represents the label of the test temperature level.

[0010] Furthermore, the specific process of solving the output current stability evaluation index is as follows: Obtain the output current values of the anti-lock sensor at each time point within the set time period at each test temperature level, and at the same time perform mean value calculation on them to obtain the average output current value of the anti-lock sensor at each time point within the set time period at each test temperature level; Select the lowest output current value and the highest output current value from the output current values of the anti-lock sensor at each time point within the set time period at each test temperature level as the output low current value and output high current value of the anti-lock sensor at each time point within the set time period at each test temperature level; According to the output current values at each time point, the average output current value, the output low current value, and the output high current value, thereby obtain the output current stability evaluation index IW f .

[0011] Furthermore, the specific process of determining the durability state evaluation value is as follows: According to the formula: , the durability state evaluation value NJX is obtained, where y represents the total number of test temperature level labels, and β4 and β5 respectively represent the set correction coefficients.

[0012] Furthermore, the specific process of generating a test failure signal or a test pass signal is as follows: The comprehensive test evaluation value is compared and analyzed with a preset reference comparison interval. If the comprehensive test evaluation value is within the preset reference comparison interval, the anti-lock sensor is determined to be normal in the test; otherwise, the anti-lock sensor is determined to be abnormal in the test. The proportion of the number of anti-lock sensors determined to be abnormal in the test is counted and recorded as the test feedback value. The test feedback value is compared and analyzed with a preset test feedback threshold. If the test feedback value is greater than or equal to the preset test feedback threshold, a test failure signal is generated; if the test feedback value is less than the preset test feedback threshold, a test pass signal is generated.

[0013] The technical solution provided by the present invention has the following beneficial effects compared with the known prior art: 1. By using a wheel simulator and an intelligent camera, combining video analysis and image processing technologies, the present invention efficiently extracts an image set, calculates the time span, accurately determines the braking moment and the delay duration value, and dynamically matches the evaluation formula by comparing the delay duration with the corresponding threshold, thereby realizing a scientific and reasonable evaluation of different delay situations, significantly improving the test efficiency and the accurate test of the response performance of the anti-lock sensor.

[0014] 2. Based on the output signal changes of the anti-lock sensor under different interference wave intensity levels, the present invention constructs a multi-level analysis system to clearly present the dynamic influence of the interference wave on the output signal. By extracting the signal change fluctuation value from the signal change line graph, the anti-interference state evaluation value is calculated, thereby realizing providing a quantitative basis for the anti-interference performance of the anti-lock sensor and providing comprehensive data support for the overall performance evaluation.

[0015] 3. By comprehensively evaluating the stability and durability of the resistance and current characteristics of the anti-lock sensor under different temperature levels, the present invention quantitatively describes its performance stability, and quantifies the durability state through multi-dimensional analysis, thereby realizing accurately reflecting the overall performance of the sensor under multiple temperature conditions and providing key data support for the comprehensive performance evaluation.

[0016] 4. In the present invention, by extracting the response status evaluation value, anti-interference status evaluation value, and durability status evaluation value, normalizing them, calculating the comprehensive test evaluation value, and determining whether the sensor is normal according to a preset reference comparison interval. At the same time, by counting the proportion of abnormal sensors and comparing it with the test feedback threshold, the overall pass or fail status of this batch of sensors is determined, thereby providing a scientific and reliable basis for the quality control and performance guarantee of anti-lock sensors. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present invention, and those of ordinary skill in the art can obtain other drawings based on these drawings without creative efforts.

[0018] Figure 1 It is the overall module block diagram of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0019] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts fall within the scope of protection of the present invention.

[0020] As Figure 1 shown, an ABS anti-lock sensor performance test system includes: a server, which is communicatively connected to a data acquisition module, a response test analysis module, an anti-interference test analysis module, a durability test analysis module, a test comprehensive analysis module, and a display terminal; The data acquisition module is used to collect the response parameter data, anti-interference parameter data, and durability parameter data corresponding to the anti-lock sensor, and send each type of information to the response test analysis module, the anti-interference test analysis module, and the durability test analysis module respectively through server communication; The response test analysis module is used to monitor the response parameter data corresponding to the anti-lock sensor, thereby testing and analyzing the response status corresponding to the anti-lock sensor. The specific analysis process is as follows: Install the anti-lock sensor on the wheel simulator and perform a response test according to the set test vehicle speed level d (such as a gradient classification from low speed to high speed); By using an intelligent camera to record the entire video of the response test process for each test vehicle speed level, parsing the collected video at the same time, and extracting the images of the imitation wheel, an image set of the imitation wheel is obtained. The images when the imitation wheel rotates one complete circle each time are divided into a group, and the time span duration corresponding to each group of images is calculated (that is, the duration between the time frame corresponding to the initial image and the time frame corresponding to the final image in each group of images, as the time span duration corresponding to each group of images). Thus, the time span durations corresponding to each group of images are obtained, and the time span durations corresponding to each group of images are arranged in ascending order to obtain a time span duration sequence, and the time span duration corresponding to the mode in the time span duration sequence is used as the reference time span duration; Compare and analyze the time span durations corresponding to each group of images with the reference time span duration. If the time span duration corresponding to a certain group of images is greater than the reference time span duration, then determine that group of images as the braking state, and extract the time point corresponding to the initial image in that group of images as the braking moment; It should be noted that the braking state refers to the stage where the rotation of the imitation wheel is significantly slowed down or even stopped. Specifically, when the time span duration of a certain group of images is greater than the reference time span duration, this indicates that the rotation speed of the imitation wheel recorded in that group of images has significantly decreased, reflecting that the effect of braking has taken effect; Obtain the response moment of the anti-lock sensor, calculate the time difference between the response moment of the anti-lock sensor and the braking moment to obtain a delay duration value, and mark it as ycs d ; The delay duration value ycs of the anti-lock sensor d is compared and analyzed with the preset delay duration threshold yyq d ; When the delay duration value ycs of the anti-lock sensor d is greater than the preset delay duration threshold yyq d , then the calculation formula one of the delay evaluation index is matched; When the delay duration value ycs of the anti-lock sensor d is equal to the preset delay duration threshold yyq d , then the calculation formula two of the delay evaluation index is matched; When the delay duration value ycs of the anti-lock sensor d is less than the preset delay duration threshold yyq d , then the calculation formula three of the delay evaluation index is matched; Set the calculation formula of the delay evaluation index as: , in the above formula, both π and e represent set mathematical constants, and da1, da2, and da3 all represent set influence coefficients, and da1 > da2 > da3. The setting of specific influence coefficients is reasonably set by those skilled in the art according to the actual situation; According to the formula: , the response status evaluation value YXP is obtained, where n represents the total number of test vehicle speed grade labels, and β1 represents a set correction coefficient; Send the obtained response status evaluation value to the test comprehensive analysis module; As a further improvement of the present invention, by using a wheel simulator and an intelligent camera, combined with advanced video analysis and image processing technologies, the present invention can efficiently extract an image set, calculate the time span, accurately determine the brake braking moment and the delay duration value, and then introduce a delay duration threshold as a comparison benchmark, and use the delay duration value to make multiple comparisons with the preset delay duration threshold, and dynamically match different delay evaluation index calculation formulas, thereby scientifically and reasonably evaluating different delay situations, thus significantly improving the test efficiency and accuracy, and realizing the precise test of the anti-lock sensor response performance.

[0021] The anti-interference test analysis module is used to monitor the anti-interference parameter data corresponding to the anti-lock sensor, and thus test and analyze the anti-interference state corresponding to the anti-lock sensor. The specific analysis process is as follows: Perform an anti-interference test on the anti-lock sensor according to the set test interference wave intensity level k (such as a gradient classification from low intensity to high intensity); By respectively obtaining the output signals of the anti-lock sensor before and after applying the interference wave, and using the output signal of the anti-lock sensor before applying the interference wave as the reference signal S 前 k ; Use the output signal of the anti-lock sensor after applying the interference wave as the changed signal S 后 k ; According to the formula: , the signal distortion rate DR is obtained k , the signal distortion rate DR k The lower it is, the less sensitive the anti-lock sensor is to the influence of the interference wave, and the better the anti-interference performance. Among them, represents the energy deviation value of the signal after being interfered, represents the two-norm of the signal (i.e., the energy of the signal), represents the energy of the reference signal; Obtain the output signal S of the anti-lock sensor corresponding to each time point t after applying the interference wave 后（t） k , and calculate the average value of the output signal. The specific calculation formula is: ; According to the formula: , the signal stability value SC is obtained k , the signal stability value SC k The lower the value, the smaller the fluctuation degree of the signal affected by the interference wave, and the more stable the signal. Among them, T represents the signal sampling period; Extract the signal distortion rate DK k and the value of the signal stability value SC k are normalized. According to the formula: , the signal change value XB is obtained k , where η1 and η2 respectively represent the weight coefficients of the signal distortion rate and the signal stability value; Taking the interference wave intensity level as the abscissa and the signal change value as the ordinate, a two-dimensional signal change dynamic coordinate system is constructed. The signal change values corresponding to each interference wave intensity level are plotted on the signal change dynamic coordinate system by point plotting, and each plotted point is connected by a line segment to obtain a signal change broken line graph; Draw a signal change reference line parallel to the abscissa in the signal change broken line graph, obtain the peak inflection point and the valley inflection point in the signal change broken line graph, and draw perpendicular lines from the peak inflection point and the valley inflection point in the signal change broken line graph to the signal change reference line respectively to obtain the peak perpendicular point and the valley perpendicular point. Connect the peak inflection point with the valley perpendicular point and the valley inflection point with the peak perpendicular point by line segments to obtain a signal change graph, and extract the area of the signal change graph as the signal change fluctuation value, denoted as XH m , where m represents the number of the signal change graph, and m = 1, 2, 3... z, and z represents the total number of signal change graph numbers; According to the formula: , the anti-interference state evaluation value CGR is obtained, where XH m-1 represents the signal change fluctuation value corresponding to the (m - 1)th signal change graph, and XH * represents the set reference signal change fluctuation value, and β2 and β3 respectively represent the set correction coefficients; Send the obtained anti-interference state evaluation value to the test comprehensive analysis module; As a further improvement of the present invention, based on the variation of the output signal of the anti-lock sensor under different interference wave intensity levels, the present invention constructs a multi-level analysis from the signal distortion rate, signal stability value to signal change value, and clearly presents the dynamic influence of the interference wave on the output signal of the anti-lock sensor according to the signal change dynamic coordinate system and the signal change broken line graph. Then, the area of the signal change graph is extracted from the signal change broken line graph as the signal change fluctuation value, and the anti-interference state evaluation value is calculated in combination with the set reference signal change fluctuation value, thereby providing a quantifiable determination basis for the anti-interference performance of the anti-lock sensor and providing comprehensive data support for the overall performance evaluation of the anti-lock sensor.

[0022] The durability test analysis module is used to monitor the durability parameter data corresponding to the anti-lock sensor, and thus test and analyze the durability state corresponding to the anti-lock sensor. The specific analysis process is as follows: Perform a durability test on the anti-lock sensor according to the set test temperature level f (such as a gradient grading from low temperature to high temperature); By obtaining the output resistance values of the anti-lock sensor at each time point within the set time period at each test temperature level, and marking them as RZ i f , where i represents the number of each time point, and i = 1, 2, 3... g, and g takes a positive integer, representing the total number of time point numbers; Extract the output resistance value of the initial time point from the output resistance values of the anti-lock sensor at each time point within the set time period at each test temperature level, and mark it as RZ0 f ; According to the formula: , obtain the output resistance stability evaluation index RW f , where RZ i-1 f represents the output resistance value of the anti-lock sensor at the (i - 1)th time point within the set time period at each test temperature level, and q1 and q2 respectively represent preset weight factors; By obtaining the output current values of the anti-lock sensor at each time point within the set time period at each test temperature level, and marking them as IZ i f ; at the same time, perform a mean value solution on it to obtain the average output current value of the anti-lock sensor within the set time period at each test temperature level, and mark it as ; Screen out the lowest output current value and the highest output current value from the output current values of the anti-lock sensor within the set time period at each test temperature level as the output low current value and output high current value of the anti-lock sensor within the set time period at each test temperature level, and mark them as IZ minf and IZ max f ; According to the formula: , the output current stability evaluation index IW is obtained f , where q3, q4, and q5 respectively represent preset weight factors; According to the formula: , the durability state evaluation value NJX is obtained, where y represents the total number of test temperature levels, and β4 and β5 respectively represent set correction coefficients; Send the obtained durability state evaluation value to the test comprehensive analysis module; As a further improvement of the present invention, the present invention conducts multi-level and multi-dimensional analysis based on the resistance and current characteristic changes of the anti-lock sensor at different temperature levels, specifically including output resistance stability evaluation, output current stability evaluation, and comprehensive durability state evaluation, to quantitatively describe the performance change stability of the anti-lock sensor under set temperature conditions, which can effectively reflect the overall durability performance of the anti-lock sensor under multi-temperature level test conditions. Thus, while realizing the quantitative analysis of the durability state of the anti-lock sensor, the accuracy and adaptability of the test analysis are enhanced, providing important data support for the comprehensive performance evaluation of the anti-lock sensor.

[0023] The test comprehensive analysis module is used to receive the response state evaluation value YXP, the anti-interference state evaluation value CGR, and the durability state evaluation value NJX, and thus conduct test comprehensive analysis. The specific analysis process is as follows: By extracting the numerical values of the response state evaluation value YXP, the anti-interference state evaluation value CGR, and the durability state evaluation value NJX corresponding to the anti-lock sensor for normalization processing, according to the formula: , the test comprehensive evaluation value ZPP is obtained, where μ1, μ2, and μ3 respectively represent the weight coefficients of the response state evaluation value, the anti-interference state evaluation value, and the durability state evaluation value, and μ1 > μ2 > μ3; Compare and analyze the test comprehensive evaluation value with a preset reference comparison interval. If the test comprehensive evaluation value is within the preset reference comparison interval, then determine that the anti-lock sensor is normal in the test. If the test comprehensive evaluation value is outside the preset reference comparison interval, then determine that the anti-lock sensor is abnormal in the test; Statistically calculate the proportion of the number of anti-lock sensors determined to be test anomalies, and record it as the test feedback value. Compare and analyze the test feedback value with a preset test feedback threshold. If the test feedback value is greater than or equal to the preset test feedback threshold, a test failure signal is generated, indicating that the test of this batch of anti-lock sensors fails. If the test feedback value is less than the preset test feedback threshold, a test pass signal is generated, indicating that the test of this batch of anti-lock sensors passes; And display and explain the output test failure signal or test pass signal through a display terminal.

[0024] The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the present invention to only the specific implementation manners. Obviously, many modifications and variations can be made according to the content of this specification. These embodiments are selected and specifically described in this specification to better explain the principle and practical application of the present invention, so that those skilled in the art can well understand and utilize the present invention. The present invention is only limited by the claims and their full scope and equivalents.

Claims

1. An ABS anti-lock sensor performance testing system, characterized in that Including: A response test analysis module, which is used to parse the response test process videos at each test vehicle speed level, extract the image set of the imitation wheels, analyze and process the image set to determine the brake moment, and at the same time obtain the response moment of the anti-lock sensor, calculate the time difference between the response moment of the anti-lock sensor and the brake moment to obtain the delay duration value, and thus determine the response status evaluation value; An anti-interference test analysis module, which is used to analyze the output signals of the anti-lock sensor before and after applying the interference wave at each test interference wave intensity level to obtain the signal change value, and thus determine the anti-interference status evaluation value; A durability test analysis module, which is used to analyze the output resistance value and output current value of the anti-lock sensor at each time point within the corresponding set time period at each test temperature level to obtain the output resistance stability evaluation index and output current stability evaluation index, and thus determine the durability status evaluation value; A test comprehensive analysis module, which is used to extract the numerical values of the response status evaluation value, anti-interference status evaluation value and durability status evaluation value for normalization processing to obtain the test comprehensive evaluation value, and thus generate a test failure signal or a test pass signal.

2. The performance testing system for an ABS anti-lock sensor according to claim 1, characterized in that, The specific process of determining the brake moment is as follows: Divide the images of each complete rotation of the imitation wheel into a group, calculate the time span duration corresponding to each group of images, and thus obtain the time span durations corresponding to each group of images. Arrange the time span durations corresponding to each group of images in ascending order to obtain a time span duration sequence, and use the time span duration corresponding to the mode in the time span duration sequence as the reference time span duration; Compare and analyze the time span durations corresponding to each group of images with the reference time span duration. If the time span duration corresponding to a certain group of images is greater than the reference time span duration, then determine that group of images as the brake state, and at the same time extract the time point corresponding to the initial image in that group of images as the brake moment.

3. The performance testing system for an ABS anti-lock sensor according to claim 1, characterized in that The specific process of determining the response status evaluation value is as follows: Compare and analyze the delay duration value of the anti-lock sensor with a preset delay duration threshold, and match the corresponding calculated delay evaluation index θ according to the comparison result d ; Where d represents the label of the test vehicle speed level; According to the formula: , the response status evaluation value YXP is obtained, where n represents the total number of test vehicle speed grade labels, and β1 represents the set correction coefficient.

4. An ABS anti-lock sensor performance testing system according to claim 1, characterized in that, The specific process of solving the signal change value is as follows: By separately obtaining the output signals corresponding to the antilock sensor before and after applying the interference wavefront, and taking the output signal corresponding to the antilock sensor before applying the interference wavefront as the reference signal S 前 k ; Take the output signal corresponding to the antilock sensor after applying the interference wave as the change signal S 后 k ; Where k represents the label of the test interference wave intensity level; According to the formula: , the signal distortion rate DR is obtained k , where represents the energy deviation value of the signal after being interfered, represents the second norm of the signal (i.e., the energy of the signal), represents the energy of the reference signal; Obtain the output signal S of the anti-lock sensor corresponding to each time point t after applying the interference wave 后（t） k , and calculate the average value of the output signal ; According to the formula: , the signal stability value SC is obtained k , where T represents the signal sampling period; Extract the numerical values of the signal distortion rate and signal stability value for normalization processing to obtain the signal change value.

5. The performance testing system of an ABS anti-lock sensor according to claim 1, characterized in that, The specific process of determining the anti-interference status evaluation value is as follows: Taking the interference wave intensity level as the abscissa and the signal change value as the ordinate, construct a two-dimensional signal change dynamic coordinate system, and plot the signal change values corresponding to each interference wave intensity level on the signal change dynamic coordinate system by point plotting to obtain a signal change line graph; Draw a signal change reference line parallel to the abscissa in the signal change broken line graph, obtain the peak inflection point and the valley inflection point in the signal change broken line graph, and draw perpendicular lines from the peak inflection point and the valley inflection point in the signal change broken line graph to the signal change reference line respectively, so as to obtain the peak perpendicular point and the valley perpendicular point. Connect the peak inflection point with the valley perpendicular point and the valley inflection point with the peak perpendicular point through line segments to obtain the signal change graph. Extract the area of the signal change graph as the signal change fluctuation value, denoted as XH m , where m represents the number of the signal change graph, and m = 1, 2, 3... z, and z represents the total number of the signal change graph numbers; According to the formula: , the anti-interference state evaluation value CGR is obtained, where XH m-1 represents the signal change fluctuation value corresponding to the (m - 1)-th signal change graph, and XH * represents the set reference signal change fluctuation value, and β2 and β3 respectively represent the set correction coefficients.

6. The performance testing system for an ABS anti-lock sensor according to claim 1, characterized in that, The specific process of solving the output resistance stability evaluation index is as follows: By obtaining the output resistance values of the anti-lock sensor at each time point within the corresponding set time period at each test temperature level; Extract the output resistance value at the initial time point from the output resistance values of the anti-lock sensor at each time point within the corresponding set time period at each test temperature level; Based on the output resistance values at each time point and the output resistance value at the initial time point, an output resistance stability evaluation index RW is obtained. f , where f represents the label of the test temperature level.

7. The performance testing system for an ABS anti-lock sensor according to claim 1, wherein The specific process of solving the output current stability evaluation index is as follows: By obtaining the output current values of the anti-lock sensor at each time point within a corresponding set period at each test temperature level, and simultaneously solving their mean values, the average output current value of the anti-lock sensor within the corresponding set period at each test temperature level is obtained; The lowest output current value and the highest output current value are selected from the corresponding set periods at each test temperature level of the anti-lock sensor, and used as the output low current value and the output high current value of the anti-lock sensor within the corresponding set periods at each test temperature level; Based on the output current values, average output current value, output low current value, and output high current value at each time point, the output current stability evaluation index IW is obtained accordingly. f .

8. The performance testing system for an ABS anti-lock sensor according to claim 1, characterized in that, The specific process for determining the durability status evaluation value is as follows: According to the formula: , the durability state evaluation value NJX is obtained, where y represents the total number of test temperature level labels, and β4 and β5 respectively represent the set correction coefficients.

9. The performance testing system for an ABS anti-lock sensor according to claim 1, characterized in that, The specific process for generating a test failure signal or a test pass signal is as follows: The test comprehensive evaluation value is compared and analyzed with a preset reference comparison interval. If the test comprehensive evaluation value is within the preset reference comparison interval, the anti-lock sensor is determined to be normal in the test; otherwise, the anti-lock sensor is determined to be abnormal in the test; The occupancy ratio of the number of anti-lock sensors determined to be test abnormal is statistically recorded as the test feedback value. The test feedback value is compared and analyzed with a preset test feedback threshold. If the test feedback value is greater than or equal to the preset test feedback threshold, a test failure signal is generated; if the test feedback value is less than the preset test feedback threshold, a test pass signal is generated.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, The computer program, when executed by a processor, implements the system according to any one of claims 1 to 9.

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