Frost test system, method and equipment

Abstract

The invention provides a frost test system, method and equipment, and relates to the field of test equipment, the system comprises a damp-heat test box, the damp-heat test box is provided with a first working cavity, and the damp-heat test box is used for controlling the temperature and humidity in the first working cavity; the temperature test box is arranged in the first working cavity, is provided with a second working cavity, and is used for controlling the temperature in the second working cavity; the temperature test box further comprises a box door, and the box door is used for communicating or separating the first working cavity and the second working cavity. One end of the connecting sleeve is communicated with the second working cavity, and the other end of the connecting sleeve is communicated with the external environment, so that the test control equipment can be connected with the to-be-tested device in the second working cavity through a connecting wire penetrating through the connecting sleeve; according to the system provided by the invention, the temperature test box is nested in the damp heat test box, rapid switching of different test environments is realized through opening and closing of the box door, a sample does not need to be manually moved, and the test efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of test equipment, and in particular to a frost test system, method and equipment. Background Art

[0002] As an environmental testing method, frost test is widely used in various fields. For example, in the field of electronic equipment, the operating reliability of some parts and electrical components is verified through frost test. When conducting frost test, the test samples are required to switch between low temperature environment and high temperature and humid heat environment, and the switching time needs to be within the standard time range. In the existing technology, when conducting frost test, a low temperature box and a high temperature and humid heat box are set up at the same time, and the test environment is quickly switched by manually moving the samples. However, there are problems such as cumbersome operation and low test efficiency. Summary of the Invention

[0003] In view of this, the embodiments of the present application propose a frost test system, method and equipment, which, through a nested installation method, can achieve rapid switching between low-temperature and high-temperature humid and hot environments without manually moving samples, thereby improving test efficiency.

[0004] The embodiments of the present application are implemented using the following technical solutions:

[0005] In the first aspect, an embodiment of the present application provides a frost test system, comprising: a damp heat test chamber, the damp heat test chamber having a first working chamber, the damp heat test chamber being used to control the temperature in the first working chamber within a first temperature range, and to control the humidity in the first working chamber within a preset humidity range; a temperature test chamber, the temperature test chamber being arranged in the first working chamber of the damp heat test chamber, the temperature test chamber having a second working chamber, the temperature test chamber being used to control the temperature in the second working chamber within a second temperature range; the temperature test chamber also comprising a chamber door, the chamber door being used to connect or disconnect the first working chamber and the second working chamber; a connecting sleeve, one end of the connecting sleeve being connected to the second working chamber, and the other end passing through the damp heat test chamber to connect to the external environment, so that the test control equipment can be connected to the device under test in the second working chamber through a connecting line passing through the connecting sleeve to perform a frost test.

[0006] In some embodiments, the frost test system further includes a switching control device, which is used to control the opening or closing of the box door so that the first working chamber and the second working chamber are connected when the box door is opened, and the first working chamber and the second working chamber are isolated when the box door is closed.

[0007] In some embodiments, the damp heat test chamber is further provided with a height-adjustable test bracket, the temperature test chamber is provided on the test bracket, and the switching control device is further used to control the height adjustment of the test bracket according to the type of the device under test.

[0008] In some embodiments, the switching control setting is further used to control the operation or sleep of the damp heat test chamber and the temperature test chamber.

[0009] In some embodiments, the temperature test chamber is further provided with a temperature detection device, which is located in the second working chamber and is used to detect the temperature in the second working chamber and the temperature of the device to be tested in the second working chamber.

[0010] In a second aspect, an embodiment of the present application provides a frost test system control method, which is applied to a test control device, wherein the test control device is respectively connected to a damp heat test chamber and a temperature test chamber in the frost test system. The method includes: obtaining a real-time temperature in the second working chamber; if the real-time temperature in the second working chamber is within the second temperature range, and the duration during which the real-time temperature in the second working chamber is within the second temperature range reaches a first preset duration, sending a first signal to the temperature test chamber and starting a timer, so that the temperature test chamber opens the door in response to the first signal to connect the first working chamber and the second working chamber, and stops temperature control in response to the first signal; when the timer reaches a second preset duration, sending a second signal to the temperature test chamber, so that the temperature test chamber closes the door in response to the second signal to isolate the first working chamber and the second working chamber, and resumes temperature control in response to the second signal; and when the number of the first signal and the number of the second signal both reach a preset number threshold, sending a third signal to the temperature test chamber and the damp heat test chamber, wherein the third signal is used to put the temperature test chamber and the damp heat test chamber into hibernation.

[0011] In some embodiments, before obtaining the real-time temperature in the second working chamber, the method includes: sending a first start signal to the wet heat test chamber in response to a test start signal, and sending a second start signal to the temperature test chamber, wherein the first start signal includes a preset humidity and a first temperature, and the second start signal includes a second temperature.

[0012] In some embodiments, the method further includes: acquiring a real-time working status of the device under test in the second working chamber; and generating a frost test report based on the real-time working status of the device under test in the second working chamber.

[0013] In a third aspect, an embodiment of the present application provides an electronic device, including: one or more processors; a memory; one or more programs, where one or more programs are stored in the memory and configured to be executed by one or more processors, and the one or more programs are configured to execute the above method.

[0014] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, characterized by including: the computer-readable storage medium stores program codes, and the program codes can be called by a processor to execute the above method.

[0015] A frost test system, method and device provided by an embodiment of the present application. The system includes a damp heat test chamber, which has a first working chamber, and the damp heat test chamber is used to control the temperature in the first working chamber within a first temperature range and the humidity within a preset humidity range; a temperature test chamber disposed in the first working chamber, which has a second working chamber, and the temperature test chamber is used to control the temperature in the second working chamber within a second temperature range; the temperature test chamber further includes a chamber door, and the chamber door is used to connect or isolate the first working chamber and the second working chamber; a connecting sleeve, one end of the connecting sleeve is communicated with the second working chamber, and the other end passes through the damp heat test chamber and is communicated with the external environment, so that a test control device can be connected to a device under test in the second working chamber through a connecting wire passing through the connecting sleeve to perform a frost test; through the frost test system provided by the present application, different test environments are respectively provided by the temperature test chamber and the damp heat test chamber, and the temperature test chamber is nested in the damp heat test chamber, and the opening and closing of the chamber door are used to control the connection or isolation of the first working chamber and the second working chamber, thereby realizing the rapid switching of the two test environments, improving the switching efficiency, and not requiring manual movement of samples, reducing the labor intensity of experimental personnel; at the same time, an external test control device can be connected to the device under test through the connecting sleeve, so that a series of operations such as state control, continuous power supply, and continuous detection of the device under test can be realized, further improving the flexibility of the test.

[0016] These aspects or other aspects of the present application will be more clearly understood in the following description of the embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those skilled in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0018] Figure 1 Shows a schematic structural diagram of a frost test system provided by an embodiment of the present application.

[0019] Figure 2 The figure shows a schematic diagram of the scenario involved in the embodiments of the present application.

[0020] Figure 3 The figure shows a schematic diagram of the control method for the frost test system provided by the embodiments of the present application.

[0021] Figure 4 The figure shows a test flow chart involved in the embodiments of the present application.

[0022] Figure 5 The figure shows a schematic diagram of the electronic device provided by the embodiments of the present application. Detailed implementation manners

[0023] The following details the implementation manners of the present application. The examples of the implementation manners are shown in the accompanying drawings, where the same or similar reference numerals represent the same or similar elements or elements with the same or similar functions throughout. The implementation manners described below by referring to the accompanying drawings are exemplary and are only used to explain the present application, and should not be construed as a limitation to the present application.

[0024] To enable those skilled in the art of the present technology to better understand the solutions of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts fall within the scope of protection of the present application.

[0025] In the following description, the terms "first / second", etc. involved are only used to distinguish similar objects and do not represent a specific order for the objects. It can be understood that "first / second" can be interchanged with a specific order or sequence when allowed, so that the embodiments of the present application described here can be implemented in an order other than that illustrated or described here.

[0026] As used herein, "a plurality of" means two or more. "And / or" describes the association relationship of associated objects and indicates that three relationships may exist. For example, A and / or B may represent: A exists alone, A and B exist simultaneously, and B exists alone. The character " / " generally represents an "or" relationship between the associated objects before and after.

[0027] As an environmental test method, the frost test needs to be carried out according to the test parameters and test procedures specified in the general engineering test standards. For example, according to the general specifications for electrical functional components, the frost test of electrical functional components mainly includes three stages: first, place the device under test (DUT) in a temperature environment of 0 to 2 °C and keep it for 2 h (component operating state 2.1, i.e., the sleep state), and the relative humidity is not required; within 3 minutes, transfer the DUT to an environment of (40 ± 3) °C and a relative humidity of 98% to 100% and keep it for 22 h (component operating state 3.2, i.e., the normal working state). Repeat the above cycle, and the number of cycles and the content of the cycle are determined according to the specification or drawing of the corresponding DUT.

[0028] Among them, the content of the cycle refers to turning on and off the external load according to the designed rule. The external load is also the accompanying test product of the DUT during the frost test, such as indicator lights, motors, electric heaters, etc. Therefore, the true load environment of the DUT is simulated through the accompanying test product to improve the test accuracy. The accompanying test product does not need to enter the test environment, but it needs to maintain the true connection relationship with the DUT.

[0029] In the prior art, when performing the above-mentioned frost test, the DUT needs to be switched between a low-temperature environment and a high-temperature and humid environment multiple times. In order to ensure that the time for environmental switching meets the test requirements, usually a high-temperature and humid test chamber and a low-temperature test chamber are respectively set up, and the DUT is manually transferred to achieve a rapid switching of the test environment, resulting in a low test efficiency; especially for DUTs with a large volume or those that need to be continuously powered on, not only is the manual transfer process more difficult, but also the circuit needs to be disconnected and reconnected each time, greatly affecting the test efficiency.

[0030] To solve the above problems, the present application proposes a frost test system, method and device. The frost test system includes a humid and heat test chamber, which has a first working chamber. The humid and heat test chamber is used to control the temperature in the first working chamber within a first temperature range and control the humidity in the first working chamber within a preset humidity range; a temperature test chamber, which is arranged in the first working chamber of the humid and heat test chamber. The temperature test chamber has a second working chamber, and the temperature test chamber is used to control the temperature in the second working chamber within a second temperature range; the temperature test chamber also includes a chamber door, which is used to connect or separate the first working chamber and the second working chamber; a connecting sleeve, one end of the connecting sleeve is connected to the second working chamber, and the other end passes through the humid and heat test chamber and communicates with the external environment, so that the test control device can be connected to the DUT in the second working chamber through the connecting wire passing through the connecting sleeve to perform the frost test.

[0031] Through the frost test system provided by this application, different test environments are provided by a temperature test chamber and a damp heat test chamber respectively, and the temperature test chamber is nested inside the damp heat test chamber. The opening and closing of the chamber door are used to control the connection or separation of the first working chamber and the second working chamber, thereby realizing the rapid switching of the two test environments, improving the switching efficiency, and eliminating the need for manual sample movement, reducing the labor intensity of the experimental personnel. At the same time, the external test control device can be connected to the device under test through a connecting sleeve, so that a series of operations such as state control, continuous power supply, and continuous detection of the device under test can be realized, further improving the flexibility of the test.

[0032] For ease of understanding, the embodiments provided by this application will be described below in conjunction with the accompanying drawings.

[0033] Please refer to Figure 1 , Figure 1 which shows a schematic structural diagram of the frost test system provided by this application. The frost test system includes a damp heat test chamber 10, a temperature test chamber 20, and a connecting sleeve 30. The device under test DUT is located in the second working chamber of the temperature test chamber 20, and the temperature and humidity test chamber 20 is located in the first working chamber of the damp heat test chamber 10. One end of the connecting sleeve 30 is communicated with the second working chamber of the temperature test chamber 20, and the other end passes through the damp heat test chamber 10 and communicates with the external environment. The connecting wire of the test control device (not shown in the figure) can pass through the connecting sleeve and access the second working chamber, so as to be connected to the device under test, facilitating the test control device to supply power to the device under test or control the working state of the device under test through the connecting wire. At the same time, the test control device can also supply power to the accompanying samples in the external environment.

[0034] Among them, the damp heat test chamber, also called the high and low temperature damp heat test chamber, is a test device used to simulate high humidity and high temperature environments, mainly applied in the fields of aviation, automobiles, household appliances, scientific research, etc., for testing and determining the parameters and performance of electrical, electronic and other products and materials after temperature environment changes in high temperature, low temperature, damp heat or constant tests. The damp heat test chamber mainly consists of a box body structure, a temperature adjustment system, and a humidification system.

[0035] Among them, the first working chamber of the damp heat test chamber is also the space of the damp heat test chamber for providing a test environment. The damp heat test chamber adjusts the temperature in the first working chamber through the temperature adjustment system and adjusts the humidity in the first working chamber through the humidification system, thereby constructing a high temperature and damp heat environment that meets the test requirements.

[0036] In some embodiments, the damp heat test chamber is a walk-in high and low temperature damp heat test chamber, which is convenient for experimental personnel to enter the damp heat test chamber for installation and adjustment.

[0037] It is worth mentioning that although the high and low temperature humidity test chamber can also achieve a low temperature environment itself, the time it takes to change from a low temperature environment to a high temperature and humid environment is relatively long, which cannot meet the switching time requirements of the frost test. Therefore, the frost test cannot be completed solely relying on the high and low temperature humidity test chamber.

[0038] The temperature test chamber, also known as the low temperature test chamber, is an essential test equipment in the fields of aviation, automobiles, household appliances, scientific research, etc. It is used to test and determine the parameters and performance of electrical, electronic and other products and materials after temperature environment changes in high temperature, low temperature, or constant tests. The low temperature range can be from 0 degrees to -80 degrees.

[0039] It is worth mentioning that in some embodiments, to ensure better temperature test results, when selecting the size of the temperature test chamber, it can be determined based on the size of the device under test and the preset selection criteria; among them, the selection criteria can be the distance between the device under test and the chamber wall of the temperature test chamber, the volume of the temperature test chamber occupied by the device under test, etc.

[0040] Among them, the temperature test chamber is provided with a chamber door, and the setting method of the chamber door can be selected according to actual needs. For example, the chamber door can be set to rotate, slide, flip, etc.; further, the opening and closing of the chamber door can be manually controlled by the experimenter or can be rotationally controlled by other devices, and specific limitations are not made here.

[0041] It can be understood that since the second working chamber is much smaller than the first working chamber, when the chamber door is opened, the first working chamber and the second working chamber are connected. At this time, the high temperature and humid air in the first working chamber can quickly fill the second working chamber (considering resource conservation and improving the environmental switching speed, the temperature test chamber can stop temperature control at this time); when the chamber door is closed again, the first working chamber and the second working chamber are separated, and the temperature test chamber can quickly re-regulate the temperature in the second working chamber, thus realizing a rapid switching of the test environment.

[0042] It is worth mentioning that since the connecting sleeve passes through the chamber walls of the humidity test chamber and the temperature test chamber respectively, in order to ensure the partition effect between the first working chamber and the second working chamber, sealing treatment is required at the connection between the connecting sleeve and the humidity test chamber, as well as at the connection between the connecting sleeve and the temperature test chamber; further, in order to reduce the influence of the external environment on the second working chamber through the connecting sleeve, a corresponding closing structure can also be set at the port of the connecting sleeve, such as closing with an elastic material, so that after the connecting wire passes through the connecting sleeve, the connecting sleeve makes the port relatively airtight through the closing structure.

[0043] When conducting a frost test using the frost test system provided by this application, a low-temperature test environment is provided by a temperature test chamber, and a high-temperature and humid test environment is provided by a damp heat test chamber. The temperature test chamber is nested inside the damp heat test chamber, and the device under test is placed in the second working chamber of the temperature test chamber. The connecting wires of the test control device pass through the connecting sleeve and are connected to the device under test to supply power to the device under test. When the device under test has been tested for a set duration in the low-temperature test environment, the chamber door is opened to allow the high-temperature and humid air in the first working chamber to quickly fill the second working chamber, thereby realizing the switching of the device under test from the low-temperature test environment to the high-temperature and humid test environment, and thus completing the frost test. During the above test process, there is no need for personnel to manually move the device under test, so there is no need to repeatedly disassemble and install the connection lines of the device under test, reducing the test operation steps and the switching time of the test environment, and greatly improving the test efficiency.

[0044] In some embodiments, the frost test system further includes a switching control device for controlling the opening or closing of the chamber door, so that when the chamber door is opened, the first working chamber and the second working chamber are connected, and when the chamber door is closed, the first working chamber and the second working chamber are separated.

[0045] Among them, the switching control device can be control components such as an electronic switch, a relay, a PLC controller, etc. The switching control device controls the opening or closing of the chamber door by controlling the corresponding driving device (such as a motor, a cylinder, etc.) of the chamber door.

[0046] In some embodiments, considering that the closer to the chamber wall, the greater the possibility that its temperature and humidity are affected by other factors (such as the thermal conductivity of the chamber wall, the fluidity of the air, etc.) and the lower the accuracy. To ensure that the atmosphere around the device under test can meet the environmental conditions specified in the test specification, the damp heat test chamber is also provided with a test bracket with adjustable height. The temperature test chamber is arranged on the test bracket, and the switching control device is also used to control the height adjustment of the test bracket according to the type of the device under test.

[0047] Among them, there are various ways to adjust the height of the test bracket, such as hydraulic adjustment, motor adjustment, etc., which are not specifically limited here as long as the lifting of the test bracket can be realized and the load-bearing requirements are met.

[0048] It can be understood that when facing devices under test of different sizes, temperature test chambers of different sizes may be required. By using a test bracket with adjustable height, it can be ensured that temperature test chambers of different sizes can be located at the center position of the first working chamber, so that when the chamber door is opened, the environmental conditions around the device under test can meet the environmental conditions specified in the test specification.

[0049] Of course, a height-adjustable carrier platform can also be provided in the second working chamber of the temperature test chamber. The device under test is placed on the carrier platform so that the device under test can always be located at the center of the second working chamber.

[0050] Furthermore, in order to adapt to test brackets of different heights, the connecting sleeve can be an adjustable connecting sleeve such as a telescopic sleeve or an elastic flexible sleeve; in order to adapt to the switching of different temperature test chambers, the connecting sleeve and the temperature test chamber can be detachably connected, such as by screw connection, snap connection, etc.

[0051] Among them, the way the switching control device controls the height adjustment of the test bracket is similar to the way the switching control device controls the opening and closing of the cabinet door in the foregoing embodiment, that is, the switching control device controls the lifting of the test bracket by controlling the corresponding driving device (such as a motor, a cylinder, etc.) of the test bracket; furthermore, the switching control device controls the height adjustment of the test bracket according to the type of the device under test. It can be to set the control duration of the switching control device corresponding to different types of devices under test. For example, taking the switching control device as an electronic switch, for type A devices under test, the control duration of the switching control device is 10 s, that is, the electronic switch is connected for 10 s. For type B devices under test, the control duration of the switching control device is 5 s, that is, the electronic switch is connected for 5 s; furthermore, the type of the device under test can be determined manually by the experimenter or obtained after being collected and identified by an image acquisition device. The specific method is not limited here.

[0052] In some embodiments, in order to facilitate the control of the humidity and temperature test chambers, the switching control setting can also be used to control the operation or dormancy of the humidity and temperature test chambers; among them, operation means starting temperature control or humidity control; dormancy means stopping temperature control or humidity control.

[0053] In some embodiments, the temperature test chamber is also provided with a temperature detection device. The temperature detection device is located in the second working chamber and is used to detect the temperature in the second working chamber and the temperature of the device under test in the second working chamber.

[0054] Exemplarily, considering the accuracy of temperature detection, the multi-point measurement method is often used for temperature detection. Therefore, the temperature detection device can be a combination of a temperature patrol instrument and multiple temperature sensors. Each sensor measures one measurement point, and the temperature patrol instrument patrols the temperature of each measurement point, so as to realize the temperature detection of each measurement point.

[0055] For easy understanding, please refer to Figure 2 , Figure 2The schematic diagram of the scenario involved in the embodiments of the present application is given, including: a frost test system 40 and a host computer 50. Among them, the frost test system 40 includes a walk-in damp heat test chamber, a low temperature test chamber and a connecting sleeve. The device under test (DUT) is located in the second working chamber of the temperature test chamber and on the bearing platform. The temperature and humidity chamber is located on the test bracket in the first working chamber of the damp heat test chamber. One end of the connecting sleeve is communicated with the second working chamber of the temperature test chamber, and the other end passes through the damp heat test chamber and is communicated with the external environment. The host computer 50 (i.e., the test control device) is connected to the device under test through the connecting sleeve; during the test, the host computer 50 continuously supplies power to the device under test and monitors the real-time status of the device under test.

[0056] Based on the frost test system provided in the foregoing embodiments, the present application further provides a control method for a frost test system, which is applied to a test control device. The test control device is respectively connected to the damp heat test chamber and the temperature test chamber in the frost test system in the foregoing embodiments (it can be a wired connection or a wireless connection). Please refer to Figure 3 , Figure 3 The schematic diagram of the control method for the frost test system provided in the embodiments of the present application is given. The control method for the frost test system includes steps S110-S140:

[0057] S110. Obtain the real-time temperature in the second working chamber.

[0058] Among them, the real-time temperature can be collected by the temperature detection device in the foregoing embodiments and transmitted to the test control device in a wired or wireless manner.

[0059] S120. If the real-time temperature in the second working chamber is within the second temperature range and the duration for which the real-time temperature in the second working chamber is within the second temperature range reaches the first preset duration, send a first signal to the temperature test chamber and start timing, so that the temperature test chamber responds to the first signal to open the chamber door to communicate the first working chamber and the second working chamber, and cause the temperature test chamber to stop temperature control in response to the first signal.

[0060] Among them, the second temperature range and the first preset duration are both determined in advance based on the test requirements.

[0061] By setting the condition that the duration for which the real-time temperature in the second working chamber is within the second temperature range reaches the first preset duration, the first stage of the frost test is realized, that is, the device under test is placed in a low temperature environment for the first preset duration.

[0062] When the temperature test chamber opens the door in response to the first signal to connect the first working chamber and the second working chamber, and when the temperature test chamber stops temperature control in response to the first signal, the high-temperature and humid gas in the first working chamber quickly fills the second working chamber, thereby realizing the switching from the low-temperature environment to the high-temperature and humid environment.

[0063] It is worth mentioning that when conducting the test, the temperature test chamber and the humidity test chamber need to be started at the same time. The real-time temperature in the second working chamber of the temperature test chamber needs to be gradually changed to the set second temperature range. In order to ensure the stability of the test conditions, the test can only be started after the temperature in the second working chamber is stable; at the same time, when the first signal is sent, since the humidity test chamber has been running for a period of time, the temperature and humidity in the first working chamber have reached and stabilized in the first temperature range and humidity range.

[0064] S130. When the timing reaches a second preset duration, send a second signal to the temperature test box, so that the temperature test box closes the door in response to the second signal to isolate the first working chamber from the second working chamber, and resumes temperature control in response to the second signal.

[0065] It can be understood that when the door is closed, the temperature test chamber resumes temperature control, so that the real-time temperature in the second working chamber returns to the second temperature range, and after the duration of the real-time temperature in the second working chamber being within the second temperature range reaches a first preset duration, a first signal is sent here, that is, steps S120 and S130 are executed cyclically, and steps S120 and S130 form a cycle of the frost test.

[0066] S140: When the number of the first signals and the number of the second signals both reach a preset threshold, send a third signal to the temperature test chamber and the humidity test chamber, where the third signal is used to put the temperature test chamber and the humidity test chamber into hibernation.

[0067] It can be understood that when the number of the first signals and the number of the second signals both reach the preset number threshold, that is, the number of cycles of the frost test reaches the preset cycle number threshold, it means that the frost test has been completed.

[0068] After the third signal is sent, the temperatures of the first working chamber and the second working chamber are continuously detected, and the device under test is taken out after the temperatures drop to room temperature, thereby avoiding burns or frostbite to the experimenter.

[0069] In some embodiments, before step S110, it is also necessary to set the test conditions of the damp heat test chamber and the temperature test chamber respectively. Therefore, the frost test system control method further includes: in response to a test start signal, sending a first start signal to the damp heat test chamber and a second start signal to the temperature test chamber. The first start signal includes a preset humidity and a first temperature, and the second start signal includes a second temperature.

[0070] It is worth mentioning that the preset humidity and the first temperature included in the first start signal, and the second temperature included in the second start signal can be a specific value. However, considering that there will be numerical fluctuations in equipment temperature control and humidity control, and in the actual operation process, an acceptable fluctuation range will also be determined according to the set value, so as to avoid overly stringent test conditions affecting the test progress.

[0071] In some embodiments, the first signal and / or the second signal may further include a temperature change rate.

[0072] In some embodiments, when performing the frost test, the test control device may further obtain the real-time working state of the device under test in the second working chamber. After step S140, the method further includes generating a frost test report based on the real-time working state of the device under test in the second working chamber.

[0073] Through the frost test system control method provided by the embodiments of the present application, the test control device is used to realize the automatic control of the opening and closing of the chamber door, as well as the automatic control of the operation and dormancy of the temperature test chamber and the damp heat test chamber, so as to realize the automation of the frost test and further improve the test efficiency of the frost test.

[0074] For ease of understanding, please refer to Figure 4 , Figure 4 The test flow chart involved in the embodiments of the present application is given. The damp heat test chamber adopts an in-line high and low temperature damp heat test chamber, including steps one to five:

[0075] Step one: Place the device under test in the low temperature test chamber, and place the low temperature test chamber on the test bracket in the in-line high and low temperature damp heat test chamber.

[0076] Step two: Connect the power cord and the through-box flexible sleeve of the device under test to the program-controlled power supply outside the box (i.e., the test control device) and the accompanying test sample.

[0077] Among them, step one and step two are the preliminary preparations for the frost test and can be manually performed by the experimenter.

[0078] Step three: Power on the device under test, start the low temperature test chamber and the in-line high and low temperature damp heat test chamber, and set them to 0°C and 40°C / 98%RH respectively.

[0079] Step 4: Use a temperature data logger to monitor the temperature inside the low-temperature chamber and on the surface of the device under test. After the temperature is stably maintained for 2 hours, turn off the low-temperature test chamber and control the door of the low-temperature test chamber to open. After 22 hours, close the door of the low-temperature chamber and restart the low-temperature test chamber. Set the temperature change rate to drop to 0°C within 1 hour. The above is one cycle.

[0080] Step 5: During the test, the host computer continuously monitors the working status of the device under test. After completing the specified number of cycles, restore to normal temperature and take out the sample.

[0081] In some embodiments, based on the frost test system control method provided in the above embodiments, an electronic device provided in an embodiment of the present application is also provided, such as Figure 5 , Figure 5 FIG. shows a block diagram of an electronic device provided in an embodiment of the present application. The electronic device 400 includes one or more processors 410; a memory 420; one or more programs, where one or more programs are stored in the memory 420 and configured to be executed by one or more processors 410, and one or more programs are configured to execute the above method.

[0082] Among them, the electronic device 400 may be a terminal device, and the terminal device may be a computer, a tablet computer, a vehicle-mounted terminal, etc.

[0083] The processor 410 may include one or more processing cores. The processor 410 connects various parts inside the wearable device through various interfaces and lines. By running or executing instructions, programs, code sets, or instruction sets stored in the memory 420, and by calling data stored in the memory 420, the processor 410 executes various functions of the wearable device and processes data. Optionally, the processor 410 may be implemented in at least one hardware form of digital signal processing (DSP), field-programmable gate array (FPGA), and programmable logic array (PLA). The processor 410 may integrate one or a combination of a central processing unit (CPU), a graphics processing unit (GPU), and a modem. Among them, the CPU mainly processes the operating system, user interface, and application programs, etc.; the GPU is responsible for rendering and drawing the content to be displayed; the modem is used to process wireless communication. It can be understood that the above modem may not be integrated into the processor and may be implemented separately by a communication chip.

[0084] The memory 420 may include a Random Access Memory (RAM), or may also include a Read-Only Memory. The memory 420 can be used to store instructions, programs, codes, code sets or instruction sets. The memory 420 may include a program storage area and a data storage area. Among them, the program storage area may store instructions for implementing an operating system, instructions for implementing at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the following various method embodiments, etc. The data storage area may also store data created during the use of the electronic device.

[0085] In some embodiments, the present application also provides a computer-readable storage medium storing program codes that can be called by a processor to execute the above method.

[0086] The computer-readable storage medium may be an electronic memory such as a flash memory, an EEPROM (Electrically Erasable Programmable Read-Only Memory), an EPROM, a hard disk, or a ROM. Optionally, the computer-readable storage medium includes a non-transitory computer-readable storage medium. The computer-readable storage medium has a storage space for program codes for executing any method steps in the above method. These program codes can be read out from or written into one or more computer program products. The program codes can be compressed in an appropriate form.

[0087] In the embodiments of the present application, the term "module" or "unit" refers to a computer program with a predetermined function or a part of a computer program, which works together with other related parts to achieve a predetermined goal, and can be fully or partially implemented by using software, hardware (such as a processing circuit or a memory), or a combination thereof. Similarly, a processor (or multiple processors or memories) can be used to implement one or more modules or units. In addition, each module or unit can be a whole module or a part of the unit of the function of the module or unit.

[0088] The above are only the preferred embodiments of the present application, and do not impose any formal restrictions on the present application. Although the present application has been disclosed above with the preferred embodiments, it is not intended to limit the present application. Any person skilled in the art can make some changes or modifications to equivalent embodiments by using the above-disclosed technical content without departing from the technical solution scope of the present application. However, as long as it does not depart from the content of the technical solution of the present application, any brief modifications, equivalent changes and modifications made to the above embodiments according to the technical essence of the present application still fall within the scope of the technical solution of the present application.

Claims

1. A frost test system, characterized in that, Comprising: A damp heat test chamber having a first working chamber, the damp heat test chamber being configured to control the temperature within the first working chamber within a first temperature range and to control the humidity within the first working chamber within a preset humidity range; A temperature test chamber disposed within the first working chamber of the damp heat test chamber, the temperature test chamber having a second working chamber, the temperature test chamber being configured to control the temperature within the second working chamber within a second temperature range; the temperature test chamber further includes a chamber door for communicating or isolating the first working chamber and the second working chamber; A connecting sleeve, one end of the connecting sleeve communicating with the second working chamber and the other end passing through the damp heat test chamber and communicating with the external environment, so that a test control device can be connected to a device under test within the second working chamber through a connecting wire passing through the connecting sleeve to perform a frost test.

2. The system according to claim 1, wherein The frost test system further includes a switching control device for controlling the opening or closing of the chamber door, so that when the chamber door is open, the first working chamber and the second working chamber are communicated, and when the chamber door is closed, the first working chamber and the second working chamber are isolated.

3. The system according to claim 2, wherein The damp heat test chamber is further provided with a test bracket with adjustable height, the temperature test chamber is disposed on the test bracket, and the switching control device is further configured to control the height adjustment of the test bracket according to the type of the device under test.

4. The system according to claim 2, wherein The switching control setting is further configured to control the operation or dormancy of the damp heat test chamber and the temperature test chamber.

5. The system according to claim 1, wherein The temperature test chamber is further provided with a temperature detection device located within the second working chamber for detecting the temperature within the second working chamber and the temperature of the device under test within the second working chamber.

6. A control method for a frost test system, characterized in that, Applied to a test control device, the test control device is respectively connected to the damp heat test chamber and the temperature test chamber in the frost test system according to any one of claims 1-5, and the method includes: Obtaining the real-time temperature within the second working chamber; If the real-time temperature within the second working chamber is within the second temperature range and the duration of the real-time temperature within the second temperature range reaches a first preset duration, sending a first signal to the temperature test chamber and starting timing, so that the temperature test chamber responds to the first signal to open the chamber door to communicate the first working chamber and the second working chamber, and so that the temperature test chamber responds to the first signal to stop temperature control; When the timing reaches a second preset duration, sending a second signal to the temperature test chamber, so that the temperature test chamber responds to the second signal to close the chamber door to isolate the first working chamber and the second working chamber, and so that the temperature test chamber responds to the second signal to resume temperature control; When the quantities of the first signal and the second signal both reach a preset quantity threshold, sending a third signal to the temperature test chamber and the damp heat test chamber, the third signal being used to put the temperature test chamber and the damp heat test chamber into dormancy.

7. The method according to claim 6, wherein Before obtaining the real-time temperature within the second working chamber, the method includes: In response to the test start signal, send a first start signal to the damp heat test chamber and a second start signal to the temperature test chamber, where the first start signal includes a preset humidity and a first temperature, and the second start signal includes a second temperature.

8. The method according to claim 6, wherein The method further includes: Obtain the real-time working state of the device under test in the second working chamber; After sending a third signal to the temperature test chamber and the damp heat test chamber when the number of the first signals and the number of the second signals respectively reach a preset number threshold, the method further includes: Generate a frost test report based on the real-time working state of the device under test in the second working chamber.

9. An electronic device, characterized in that, Includes: One or more processors; A memory; One or more programs, where one or more programs are stored in the memory and are configured to be executed by one or more processors, and the one or more programs are configured to execute the method according to any one of claims 6-8.

10. A computer-readable storage medium, characterized in that, Includes: The computer-readable storage medium stores program codes, and the program codes can be called by a processor to execute the method according to any one of claims 6-8.

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